Silicon N-Channel Power MOSFET CS14N25 A0R

Transcription

1 Silicon N-Channel Power MOSFET CS14N25 A0R General Description: CS14N25 A0R, the silicon N-channel Enhanced VDMOSFETs, is obtained by the self-aligned planar Technology which reduce the conduction loss, improve switching V DSS 250 V I D 14 A P D (T C =25 ) 100 W R DS(ON)Typ 0.20 Ω performance and enhance the avalanche energy. The transistor can be used in various power switching circuit for system miniaturization and higher efficiency. The package form is TO-263, which accords with the RoHS standard. Features: Fast Switching Low ON Resistance(Rdson 0.25Ω) Low Gate Charge (Typical Data:22.7nC) Low Reverse transfer capacitances(typical:13pf) 100% Single Pulse avalanche energy Test Applications: Power switch circuit of adaptor and charger. Absolute(T J = 25 unless otherwise specified): Symbol Parameter Rating Units V DSS Drain-to-Source Voltage 250 V I D I DM a1 Continuous Drain Current T C = 25 C 14 A Continuous Drain Current T C = 100 C 8.4 A Pulsed Drain Current T C = 25 C 56 A V GS Gate-to-Source Voltage ±30 V a2 E AS Single Pulse Avalanche Energy 500 mj dv/dt a3 Peak Diode Recovery dv/dt 5.0 V/ns P D Power Dissipation T C = 25 C 100 W Derating Factor above 25 C 0.8 W/ T J,T stg Operating Junction and Storage Temperature Range 150, 55 to 150 WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 1 of V01

2 Electrical Characteristics(T J = 25 unless otherwise specified): OFF Characteristics Symbol Parameter Test Conditions Rating Min. Typ. Max. V DSS Drain to Source Breakdown Voltage V GS=0V, I D=250µA V ΔBV DSS /ΔT J Bvdss Temperature Coefficient ID=250uA,Reference V/ I DSS Drain to Source Leakage Current Unit V DS =250V, V GS= 0V, T J = µa V DS =200V, V GS= 0V, T J = µa I GSS(F) Gate to Source Forward Leakage V GS =+30V na I GSS(R) Gate to Source Reverse Leakage V GS =-30V na ON Characteristics Symbol Parameter Test Conditions Rating Min. Typ. Max. R DS(ON) Drain-to-Source On-Resistance V GS=10V,I D=7A Ω V GS(TH) Gate Threshold Voltage V DS = V GS, I D = 250µA V Pulse width tp 300µs,δ 2% Dynamic Characteristics Symbol Parameter Test Conditions Rating Min. Typ. Max. R g Gate resistance f = 1.0MHz Ω g fs Forward Transconductance V DS=15V, I D =7A S C iss Input Capacitance V GS = 0V V DS = 25V f = 1.0MHz C oss Output Capacitance C rss Reverse Transfer Capacitance Resistive Switching Characteristics Symbol Parameter Test Conditions t d(on) Turn-on Delay Time I D =14A V DD =125V R G =10Ω Rating Min. Typ. Max tr Rise Time t d(off) Turn-Off Delay Time t f Fall Time Q g Total Gate Charge I D =14A V DD =200V V GS = 10V Q gs Gate to Source Charge Q gd Gate to Drain ( Miller )Charge V plateau Gate Plateau Voltage V s Units Units pf Units ns nc WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 2 of V01

3 Source-Drain Diode Characteristics Rating Symbol Parameter Test Conditions Units Min. Typ. Max. I S Continuous Source Current (Body Diode) T C = 25 C A I SM Maximum Pulsed Current (Body Diode) A V SD Diode Forward Voltage I S=14A,V GS=0V V trr Reverse Recovery Time I S=14A,T j = 25 di F/dt=100A/us, V GS=0V ns Qrr Reverse Recovery Charge nc I RRM Reverse Recovery Current A Pulse width tp 300µs,δ 2% Symbol Parameter Max. Units RθJC Junction-to-Case 1.25 /W RθJA Junction-to-Ambient 62.5 /W a1 :Repetitive rating; pulse width limited by maximum junction temperature a2 :L=10mH, I D =10A, Start T J =25 a3 :I SD =14A,di/dt 100A/us,V DD BV DS, Start T J =25 a4 :Recommend soldering temperature defined by IPC/JEDEC J-STD 020 WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 3 of V01

4 Characteristics Curve: Figure 1 Maximum Forward Bias Safe Operating Area Figure 2 Maximum Power dissipation vs Case Temperature Figure 3 Maximum Continuous Drain Current vs Case Temperature Figure 4 Typical Output Characteristics Z θjc,thermal Response[ /W] D= Single Pulse Notes: 1.Duty Cycle,D=t1/t2 2.T JM =P DM *R θjc +T C T, Rectangular Pulse Duration [sec] Figure 5 Effective Thermal Impedance, Junction to Case WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 4 of V01

5 Figure 6 Typical Transfer Characteristics Figure 7 Typical Body Diode Transfer Characteristics Figure 8 Typical Drain to Source ON Resistance vs Drain Current Figure 9 Typical Drian to Source on Resistance vs Junction Temperature WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 5 of V01

6 Figure 10 Typical Theshold Voltage vs Junction Temperature Figure 11 Typical Breakdown Voltage vs Junction Temperature Figure 12 Typical Capacitance vs Drain to Source Voltage Figure 13 Typical Gate Charge vs Gate to Source Voltage WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 6 of V01

7 Test Circuit and Waveform Figure 14. Gate Charge Test Circuit Figure 15. Gate Charge Waveforms Figure 16. Resistive Switching Test Circuit Figure 17. Resistive Switching Waveforms WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 7 of V01

8 Figure 18. Diode Reverse Recovery Test Circuit Figure 19. Diode Reverse Recovery Waveform Figure20.Unclamped Inductive Switching Test Circuit Figure21.Unclamped Inductive Switching Waveform WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 8 of V01

9 Package Information: A C D B N N E F B1 K L1 I HG Q L2 Items MIN Values(mm) MAX A B B C D E F G H K L L I Q 0 8 R 0.4 N TO-263Package WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 9 of V01

10 Limit The name and content of poisonous and harmful material in products Hazardous Substance Pb Hg Cd Cr(VI) PBB PBDE DIBP DEHP DBP BBP 0.1% 0.1% 0.01% 0.1% 0.1% 0.1% 0.1% 0.1% 0.1% 0.1% Lead Frame Molding Chip Wire Bonding Solder Note :Means the hazardous material is under the criterion of 2011/65/EU. :Means the hazardous material exceeds the criterion of 2011/65/EU. The plumbum element of solder exist in products presently, but within the allowed range of Eurogroup s RoHS. Warnings 1. Exceeding the maximum ratings of the device in performance may cause damage to the device, even the permanent failure, which may affect the dependability of the machine. It is suggested to be used under 80 percent of the maximum ratings of the device. 2. When installing the heatsink, please pay attention to the torsional moment and the smoothness of the heatsink. 3. VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect the device from being damaged by the static electricity when using it. 4. This publication is made by Huajing Microelectronics and subject to regular change without notice. WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Add: No.14 Liangxi RD. Wuxi, Jiangsu, China Mail: HTUhttp://www. crhj.com.cnuth Tel: Fax: Marketing Part: Post: Tel: / Fax: / Application and Service:Post: Tel / Fax: / WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD. Page 10 of V01