STEP INTO THE WORLD OF JEOL

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1 Product Lineup SMART FLEXIBLE POWERFUL STEP INTO THE WORLD OF JEOL SEM TEM SAMPLE PREP NMR MASS SPEC EPMA LITHOGRAPHY Bell Lab Harvard University Osaka University JEOLUSA.COM

2 CRYO-EM, EPMA, LITHOGRAPHY CRYO ARM JEM-1400FLASH FIELD EMISSION CRYO-EM The CRYO ARM 200, equipped with a Cold Field Emission gun (Cold FEG), an in-column Omega energy filter, a side-entry liquid-nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-em) that enables observation of biomacromolecules at cryo-temperature. The automated specimen exchange system features storing of up to 12 samples. In addition, the system allows for the exchange of an arbitrary one or more samples, thus enabling flexible scheduling. Furthermore, the combined use of a newly-designed in-column Omega energy filter and a Hole-free Phase Plate dramatically enhances the contrast of TEM images of biological specimens. Automated specimen exchange system Cold Field Emission Gun In-column Omega Energy Filter Automated image acquisition software for Single Particle Analysis Optional Hole-free Phase Plate Auto adjustment functions IMAGING AND CRYOMICROSCOPY EXCELLENCE IN A 120KV TEM The JEM-1400Flash is the TEM of choice for those looking for the ultimate in 120kV performance. This compact, versatile, easy-to-use TEM is suitable for biological, polymer, and materials science applications. Equipped with a high-sensitivity scmos camera, the JEM-1400Flash offers new Flash for TEM users via powerful new functions, including an ultra-wide area montage system and an OM (optical microscope) image linkage function. High resolution/high contrast imaging Outstanding S/TEM analytical performance Elemental mapping with the latest large-area SDD detectors Cryomicroscopy, 3D tomography Wide-area montaging - Limitless Panorama OM image linkage (picture overlay) ELECTRON PROBE MICROANALYZER (EPMA) JXA-8530FPlus An In-Lens Schottky field emission electron gun and new software increase throughput while maintaining high stability for a wider range of EPMA applications and higher resolution. The In-Lens Schottky Plus FEG EPMA version, with optimized angular current density, enables analysis with a large probe current of > 2μA. Secondary electron image resolution is improved even under analytical conditions by automatically adjusting for the correct convergence angle. High spatial resolution in X-ray mapping Small spot size at low accelerating voltages and high probe currents (20nm at 10nA and 10kV; 50nm at 100nA and 10kV) Extreme elemental analysis of sub-micron areas Rapid stage mapping for large areas Extreme beam stability for long, unattended operation Extreme crystal sizes for low concentration or low fluorescing samples Optional SXES for collection of very low energy X-rays SOFT X-RAY EMISSION SPECTROMETER FOR FE-SEM AND EPMA The SXES can detect ultra-soft X-rays in the energy range of ev. The high spectral resolution (0.3eV) of the SXES allows for the Nitrogen Kα and Titanium Ll lines to be separated. Ultra-low energy, low-concentration sensitivity enables detection of Li even at low single digit weight percent concentration. The SXES features chemical state analysis capability and detects differences between conduction band and valence band electrons when they emit X-rays, allowing the distinction between bonding and crystal structure in samples containing the same elements. DIRECT WRITE E-BEAM LITHOGRAPHY This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. Maximum scanning speed has been increased to 125 MHz (the world s highest level) for high speed writing applications. JEOL has more than 50 years of dedicated Direct Write EBL experience and the largest service support staff in the industry.

3 HIGH RESOLUTION SEM JSM-7900F SERIES EXTREME RESOLUTION ANALYTICAL FE SEM The JSM-7900F Field Emission SEM is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens. Resolution: 7 1kV, 6 15kV, 6 Å in STEM Superior analytical resolution Probe current >500nA High sensitivity BE detector providing exceptional performance at low accelerating voltages Ultralow kv imaging in-lens detectors In-lens Schottky Plus field emission electron gun and low aberration condenser lens provide higher levels of brightness Super Hybrid Lens (SHL), a combination of electrostatic and electromagnetic lenses, to support ultra high resolution imaging and analysis of various samples ranging from magnetic materials to insulators JSM-7200F SERIES JSM-IT500HR JSM-IT500 ANALYTICAL HIGH RESOLUTION FE SEM The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7200F dramatically increases analytical resolution to the sub 100nm scale. It is ideal for imaging and analysis of non-conductive samples and for enhanced high resolution imaging of nanostructures, specimen surface details, biological specimens, and magnetic samples. The JSM-7200F/LV is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, STEM, BSE, and CL. A new Soft X-ray Emission Spectrometer allows efficient and parallel collection of very low-energy X-rays (WDS) with chemical state analysis. Through-the-lens detectors with energy filter In-lens field emission gun Aperture Angle Control Lens (ACL) for superb resolution at any kv or probe current GENTLEBEAM (GBSH) Mode reduces effects of lens aberrations at the sample (stage bias) Large specimen chamber with multiple ports HIGH RESOLUTION, LARGE CHAMBER SEM The JSM-IT500HR delivers exeptional fidelity at any kv. Equipped with a Thermal Schottky FE gun, this SEM provides expanded performance over traditional W SEMs at a very attractive price. The JSM-IT500HR has a large analytical chamber equipped with several ports to accommodate multiple detectors such as: multiple EDS detectors, WDS, EBSD, CL, etc., creating a nano-lab inside your SEM. Careful design ensures optimized geometry for all detectors. Furthermore, the stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. Low vacuum capability is built in, allowing for imaging and analysis of all types of samples in their native state. Analytical model includes our fully-embedded EDS with live analysis and advanced functions built-in such as: live net maps, montage maps, drift compensation, etc. High resolution SEM with Thermal Schottky FE gun (1.5nm at 30kV, 4nm at 1kV) Fully integrated and automated low vacuum system Zero mag Simplifies navigation and enhances throughput. Seamless transition from optical to SEM image Automated montaging Small footprint and easy maintenance (no cooling water or compressed gas required) VERSATILE RESEARCH SEM The latest innovations for our InTouchScope series SEMs are designed to make SEM accessible to everyone. All controls are at your fingertips with an intuitive software interface. Navigation across the sample is seamless quickly go from an optical image to high resolution SEM imaging and analysis. The high resolution W filament gun (LaB 6 option) offers unsurpassed low kv performance. Embedded EDS brings fast quantitative elemental characterization. We offer high vacuum and low vacuum models with or without our embedded EDS system [JSM-IT500, JSM-IT500A, JSM-IT500LV, JSM-IT500LA]. The large sample chamber features multiple ports optimally positioned for analytical attachments such as EDS, EBSD, CL, WDS, chamberscopes, heating/cooling sub-stages, etc. The specimen stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. High throughput microanalysis with analytical models with full integration of EDS High resolution with unsurpassed low kv performance High vacuum to expanded pressure in low vacuum mode Zero mag Simplifies navigation and enhances throughput. Seamless transition from optical to SEM image Automated montaging

4 HIGH RESOLUTION SEM JSM-IT200 INTOUCHSCOPE COMPACT, VERSATILE, HIGH THROUGHPUT SEM When you need higher resolution, imaging with multiple detectors, elemental analysis, and a range of acceleration voltages at high or low vacuum, all in an easy-to-use SEM, the JSM-200 is a great value with the functionality you d only expect from high end SEMs. Zero-Mag streamlines navigation and throughput, with true integration of optical and SEM imaging Automated montaging Multi-Touch screen control and/or keyboard/mouse Simultaneous multiple live image and movie capture Automatic SEM condition setup based on sample type Live remote viewing full remote control Optional Advanced Functions: Analytical models include fully-embedded EDS with advanced functions (drift compensation, quant map, mapping filter, multi-area, line scan) Low vacuum models include high sensitivity solid state backscatter detector (composition, topgraphic, and variable shadowed images) Low vacuum pressure simplifies imaging of non-conductive, wet, oily or outgassing samples such as drift compensation, quant map, mapping filter, multi-area, line scan BENCHTOP SOLUTIONS NEOSCOPE HIGH PERFORMANCE BENCHTOP SEM A compact benchtop SEM that complements both optical microscopes and traditional SEMs. The NeoScope is as simple to operate as a digital camera, but has the powerful electron optics of an SEM. In addition to secondary electron imaging, it includes high sensitivity solid state backscatter electron detection. For analytical purposes, it can be configured with a full-featured Energy-dispersive X-ray Spectrometer (EDS) with Silicon Drift Detector (SDD) technology. High resolution and large depth of field Secondary electron and backscattered electron imaging Three selectable accelerating voltages plus High and Low Vacuum modes Automatic focus, alignment, contrast, and brightness controls Multi-touch screen and/or keyboard/mouse interface Tilting and rotating motorized holder (optional X-Y motor drive stage) Optional JEOL EDS for elemental analysis SAMPLE PREPARATION CROSS SECTION POLISHER The JEOL Cross Section Polisher utilizes a broad argon ion beam for SEM specimen preparation. The instrument enables preparation of truly representative cross sections of composites of hard and soft materials free of artifacts and distortions. The principle of operation is as follows: a region of the specimen not covered by a masking plate is milled away and polished to a smooth surface finish. A mask-less operation utilizing a rotation holder is also available for flat surface milling preparation of powders, wires, and large metallurgical mounts. Clean polished cross section of hard, soft, and composite materials Clean mirrored surface with minimal strain or distortion Wide area cross sections (up to several mm across) Easy touch panel operation Cooling CP Advantages: Liquid Nitrogen cooling prevents thermal damage to materials with low melting and low glass transition points Air Isolation transfer system protects samples that are sensitive to air exposure SMART COATER This simple-to-use sputter coater features fully-automated vacuum and sputtering. Insert your samples, turn the unit on and select the sputtering time. The chamber will evacuate and sputtering will begin automatically. When the unit is powered down, it vents to atmosphere.

5 NMR AND MASS SPEC JNM-ECZ400S 400 MHZ NMR FOR ROUTINE LIQUIDS The JNM-ECZS series is a next generation 2-channel NMR spectrometer that incorporates ultrahigh accuracy RF circuitry utilizing the latest digital high frequency technology. Designed for routine open access operation, this compact spectrometer is equipped with many functions normally only found on research models and supports many advanced NMR experiments. Coupling the use of advanced software with highly reliable automation, all routine daily measurements can be automated. With the use of the autotune SuperCOOL NMR probe the JNM-ECZ400S NMR Spectrometer realizes outstanding sensitivity for its class. JNM-ECZR SERIES 400 MHZ TO 1 GHZ NMR FOR RESEARCH LIQUIDS AND SOLIDS The JEOL ECZR NMR spectrometer series represents the latest in digital and high frequency NMR technologies. Improved reliability and a more compact size are made possible by incorporating the latest advanced integrated circuits. It supports greater expandability including: multi-channel operation, high-power amplifiers, high-power gradient amplifiers, and other accessories. Advanced software and automation enable highly sophisticated measurements to be carried out while most routine measurement operations can be performed automatically. Many types of NMR probes such as the UltraFast MAS solid state NMR probe and UltraCOOL cryogenic solution NMR probe are available. ACCUTOF -DART 4G TIME-OF-FLIGHT MASS SPECTROMETER WITH DIRECT ANALYSIS IN REAL TIME The AccuTOF-DART 4G is a simple, robust and versatile atmospheric pressure ionization high-resolution time-of-flight mass spectrometer (API-HRTOFMS). When combined with the revolutionary Direct Analysis in Real Time (DART) ion source (patented by JEOL in 2005), the AccuTOF-DART 4G exponentially improves the MS workflow and is a powerful problem-solving tool for a wide range of applications. Open air ionization rapid analysis minus the chromatography No sample preparation no solvents or waste Fast problem-solving Wide analytical range ACCUTOF GCX SPIRALTOF INFITOF TIME-OF-FLIGHT GCXGC The AccuTOF-GCx gas chromatography/time-of-flight mass spectrometer features high resolution, accuracy, and sensitivity. In combination with comprehensive 2D gas chromatography (GCxGC) using the Zoex thermal modulator, the GCx offers powerful chromatographic separation and high-resolution mass spectra. It is ideal for analysis of GCxGC/HRMS data sets from complex mixtures such as crude oil and environmental contaminants. GC separation and high-resolution exact mass analysis High speed data acquisition for GCxGC No source exchange with optimal EI/FI/FD combination ion source CI and direct probe options MALDI IMAGING SPIRALTOF The SpiralTOF is a MALDI-TOFMS incorporating an innovative SpiralTOF ion optical system that increases the ion flight path to 17m in a figure eight trajectory that fits into a small console. The SpiralTOF defines a new standard in MALDI-TOFMS performance and provides state-of-the-art analytical solutions for a wide range of research areas such as functional synthetic polymers, materials science, and biomolecules. MALDI Imaging with perfect focusing ion optics - no loss in ion transmission due to beam divergence High resolution mass spectra are acquired for the entire image High resolution and mass accuracy are not lost for samples that are not perfectly flat High-speed data acquisition reduces imaging time Laser spot size ~ 10 µ to 100 µ No PSD artifacts clean low-mass background TOF/TOF option with high resolution single isotope precursor selection for MS/MS imaging INFITOF PORTABLE GAS ANALYSIS SYSTEM Designed for real time monitoring of directly introduced gas, this high mass-resolution mass spectrometer features stability for real time gas monitoring and elemental composition determination through accurate mass measurement. Applications include analysis of gases used in semiconductor processing, vapor epitaxy and real-time monitoring of gases relevant to catalytic processes, battery technology and advanced materials.

6 ATOMIC RESOLUTION TEM GRAND ARM UNPRECEDENTED ATOMIC RESOLUTION 300KEV TEM Designed to meet the most advanced materials development requirements for atom-by-atom characterization and chemical mapping, the Grand ARM offers the highest level of performance in the JEOL line of atomic resolution microscopes. Extreme resolution of 55pm in STEM mode at 300kV JEOL-proprietary spherical aberration correctors Ultra-stable cold-cathode field emission electron gun features high brightness beam with minimum chromatic aberration. A complete line of signal detectors available, including EDS up to 158mm 2 and EELS, backscattered electron detectors, and up to 4 STEM detectors. The TEM also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image. The vacuum system is specially designed for pre-evacuation and enhanced column evacuation, achieving higher vacuum while minimizing contamination. NEOARM WORLD S LEADING RESEARCH ATOMIC RESOLUTION MICROSCOPE More than 200 of JEOL Atomic Resolution TEMs with Cs corrector are currently used in leading research efforts around the globe. Now the new NEOARM surpasses the renowned capability of the ARM series with JEOL s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR). The ASCOR compensates for higher order aberrations to enable atomic-resolution imaging at not only 200 kv accelerating voltage, but also a low voltage of 30 kv. A new Annular Bright Field STEM detector provides enhanced contrast of light elements. Cs corrector ASCOR (Advanced STEM Corrector) suppresses six-fold astigmatism which limits resolution after Cs correction The combination of ASCOR and a Cold-FEG achieves higher resolution than ever, over high-to-low accelerating voltages Automated aberration correction software JEOL COSMO (Corrector System Module)enables higher-throughput atomic-resolution imaging New ABF (Annular Bright Field) detector system facilitates atomic-level structure observation of materials containing light elements Perfect sight detector enables acquisition of high-contrast and quantitative STEM images, irrespective of accelerating voltage values Viewing Camera system for remote operation MONOCHROMATED TEM Spot-IN and Spot-OUT High Performance Dual Wien-filter Monochromator System True round monochromatic beam Atomic resolution at any energy resolution. JEM-F200 MULTI-FUNCTIONAL NEXT-GENERATION 200KV TEM Designed to meet today s diversified needs. A user-oriented integrated control environment has been developed while maintaining cutting edge imaging and analytical performance. Cold FEG electron source Dual large solid angle EDS available Quad lens condenser system Advanced scanning system, including de-scan PicoStage for precise, high speed sample movement Intuitive user interface Automated specimen holder insertion JEOL USA, Inc. 11 Dearborn Road Peabody, MA Copyright 2018 JEOL USA, INC 07/18