Filter & Spectrometer Electron Optics

Size: px
Start display at page:

Download "Filter & Spectrometer Electron Optics"

Transcription

1 Filter & Spectrometer Electron Optics Parameters Affecting Practical Performance Daniel Moonen & Harold A. Brink

2 Did Something Go Wrong? ev 1

3 Content The Prism Chromatic Aberrations Spectrum Diffraction Mixing The Basics Post Column spectrometers The Slit The Projection System Quadrupoles Distortion Chromatic Aberrations Summary 2

4 The Basics Illumination Energy Dispersion Energy Selection Projection Detection sample ENFINA GIF 3

5 Basics - Post Column TEM provides: Illumination GIF provides: Energy Dispersion Energy Selection Projection Detection 4

6 The Prism Large Energy Dispersion 6.5 mm/ev Optimal energy selection Second Order Corrected Small Chromatic Aberrations Pre-prism multipoles Correct for imperfections 7

7 Prism - Chromatic Aberrations Spectrum mode: Imaging mode: Electron optical energy resolution Non-isochromaticity E 0 + ev E 0 Y ev Spectrum E 0 - ev Imaging Plane X 8

8 Prism - Chromatic Aberrations Spectrum mode: Imaging mode: Electron optical energy resolution Non-isochromaticity Chromatic aberration means: Electrons of the same energy but coming from the specimen with different angles are focused at different positions in the spectrum. Chromatic aberration means: Electrons of the same energy but from different positions in the specimen are focused at different positions in the slit. 9

9 Prism - Chromatic Aberrations GIF Example: Al - 3 wt% Li alloy with Al-Li δ (Al 3 Li) precipitates Al 3 Li precipitates Al matrix Intensity nm Slit Energy-loss [ev] 20 10

10 Prism - Chromatic Aberrations un/mis-corrected filter + 3 ev + 2 ev 13.5eV; 6eV slit + 1 ev Inverted contrast 0 ev -1 ev limited field of view 13.5eV; ~1eV slit 11

11 Prism - Chromatic Aberrations un/mis-corrected filter + 3 ev + 2 ev + 1 ev 0 ev -1 ev Corrected Filter limited field of + 3 view ev + 2 ev + 1 ev 0 ev -1 ev 12

12 Prism - Chromatic Aberrations Corrected Filter + 3 ev + 2 ev 13.5eV; 6eV slit + 1 ev 0 ev -1 ev limited field of view 13.5eV; ~1eV slit 13

13 Prism - Chromatic Aberrations Tuning corrects chromatic aberrations by adjusting the multipoles: ev ev Low energy resolution High energy resolution 14

14 Prism - Spectrum Diffraction Mixing Mechanism: Projection lens cross-over, or diffraction pattern, is not a mathematical point. Prism images the diffraction pattern on the slit plane. A convolution of the diffraction pattern and energy dispersion results. 15

15 Prism - Spectrum Diffraction Mixing Effects depend on: Spectrometer Design TEM Magnification Objective Aperture Small spectra Large spectra diffraction spots diffraction spots 16

16 Prism - Spectrum Diffraction Mixing Consult user manual: 17

17 The Slit Fully computer controlled slit Calibrated in ev Beam trap in spectroscopy mode Zero loss Beam trap 18

18 The Projection System Enfina: Multipole Optics 4 Quadrupoles Wide dispersion range 0.05 ev to 1.5 ev / pixel 75 to 2000 ev range GIF: Multipole Optics 4 Quadrupoles 5 Sextupoles 1 Octupole Low distortions < 1% Low chromatic aberrations < 1 pixel Wide dispersion range 0.05 ev to 1 ev / pixel 50 to 1000 ev range 19

19 Projection System - Quadrupoles Advantages of Quadrupole Optics: Low distortion Much stronger than round lenses Do not rotate the image Allow different magnification in X and Y direction 20

20 Projection System - Distortion Distortion: Causes image deformation Is introduced by round lenses as well as quadrupoles Is correctable with multipoles Is auto-tuned for the GIF 25 Hole Mask Pattern 21

21 Projection System - Distortion Seamless montage of EFTEM images: Distortion 1.5 % Distortion 0.3% 22

22 Projection System - Distortion Fourier Transform of Crystal Lattice: Distortion 2.7 % Distortion 0.5% 23

23 Projection System - Chromatic Aberrations Chromatic aberration means: Electrons from the same position in the specimen but of different energy are focused at different positions in the image. Specimen Detector Electron Optics E = E 0-25 ev E = E 0 E = E ev 24

24 Projection System - Chromatic Aberrations Chromatic aberrations are measured by changing the beam energy and observing the mask pattern. Chromatic aberration tuning is automated for the GIF. E = E 0-25 ev E = E ev 25

25 Projection System - Chromatic Aberrations Example: 50 ev slit & 3.0 mm/ev 50 ev slit & 0.3 mm/ev 26

26 Summary Energy Dispersion Chromatic Aberrations Isochromaticity Energy resolution Spectrum Diffraction Mixing Correction with multipoles The Slit Energy filtering Beam trap The Projection System Quadrupole optics Distortion Chromatic Aberrations Correction with multipoles 27

NanoSpective, Inc Progress Drive Suite 137 Orlando, Florida

NanoSpective, Inc Progress Drive Suite 137 Orlando, Florida TEM Techniques Summary The TEM is an analytical instrument in which a thin membrane (typically < 100nm) is placed in the path of an energetic and highly coherent beam of electrons. Typical operating voltages

More information

Transmission Electron Microscopy 9. The Instrument. Outline

Transmission Electron Microscopy 9. The Instrument. Outline Transmission Electron Microscopy 9. The Instrument EMA 6518 Spring 2009 02/25/09 Outline The Illumination System The Objective Lens and Stage Forming Diffraction Patterns and Images Alignment and Stigmation

More information

STEM Spectrum Imaging Tutorial

STEM Spectrum Imaging Tutorial STEM Spectrum Imaging Tutorial Gatan, Inc. 5933 Coronado Lane, Pleasanton, CA 94588 Tel: (925) 463-0200 Fax: (925) 463-0204 April 2001 Contents 1 Introduction 1.1 What is Spectrum Imaging? 2 Hardware 3

More information

Exam 4. Name: Class: Date: Multiple Choice Identify the choice that best completes the statement or answers the question.

Exam 4. Name: Class: Date: Multiple Choice Identify the choice that best completes the statement or answers the question. Name: Class: Date: Exam 4 Multiple Choice Identify the choice that best completes the statement or answers the question. 1. Mirages are a result of which physical phenomena a. interference c. reflection

More information

WIEN Software for Design of Columns Containing Wien Filters and Multipole Lenses

WIEN Software for Design of Columns Containing Wien Filters and Multipole Lenses WIEN Software for Design of Columns Containing Wien Filters and Multipole Lenses An integrated workplace for analysing and optimising the column optics Base Package (WIEN) Handles round lenses, quadrupoles,

More information

CHAPTER TWO METALLOGRAPHY & MICROSCOPY

CHAPTER TWO METALLOGRAPHY & MICROSCOPY CHAPTER TWO METALLOGRAPHY & MICROSCOPY 1. INTRODUCTION: Materials characterisation has two main aspects: Accurately measuring the physical, mechanical and chemical properties of materials Accurately measuring

More information

Microscope anatomy, image formation and resolution

Microscope anatomy, image formation and resolution Microscope anatomy, image formation and resolution Ian Dobbie Buy this book for your lab: D.B. Murphy, "Fundamentals of light microscopy and electronic imaging", ISBN 0-471-25391-X Visit these websites:

More information

Transmission electron Microscopy

Transmission electron Microscopy Transmission electron Microscopy Image formation of a concave lens in geometrical optics Some basic features of the transmission electron microscope (TEM) can be understood from by analogy with the operation

More information

Indiana University JEM-3200FS

Indiana University JEM-3200FS Indiana University JEM-3200FS Installation Specification Model: JEM 3200FS Serial Number: EM 15000013 Objective Lens Configuration: High Resolution Pole Piece (HRP) JEOL Engineer: Michael P. Van Etten

More information

NANO 703-Notes. Chapter 9-The Instrument

NANO 703-Notes. Chapter 9-The Instrument 1 Chapter 9-The Instrument Illumination (condenser) system Before (above) the sample, the purpose of electron lenses is to form the beam/probe that will illuminate the sample. Our electron source is macroscopic

More information

LEO 912 TEM Short Manual. Prepared/copyrighted by RH Berg Danforth Plant Science Center

LEO 912 TEM Short Manual. Prepared/copyrighted by RH Berg Danforth Plant Science Center LEO 912 TEM Short Manual Prepared/copyrighted by RH Berg Danforth Plant Science Center Specimen holder [1] Never touch the holder (outside of the O-ring, double-headed arrow) because finger oils will contaminate

More information

a) How big will that physical image of the cells be your camera sensor?

a) How big will that physical image of the cells be your camera sensor? 1. Consider a regular wide-field microscope set up with a 60x, NA = 1.4 objective and a monochromatic digital camera with 8 um pixels, properly positioned in the primary image plane. This microscope is

More information

Recent results from the JEOL JEM-3000F FEGTEM in Oxford

Recent results from the JEOL JEM-3000F FEGTEM in Oxford Recent results from the JEOL JEM-3000F FEGTEM in Oxford R.E. Dunin-Borkowski a, J. Sloan b, R.R. Meyer c, A.I. Kirkland c,d and J. L. Hutchison a a b c d Department of Materials, Parks Road, Oxford OX1

More information

FEI Tecnai G 2 F20 Operating Procedures

FEI Tecnai G 2 F20 Operating Procedures FEI Tecnai G 2 F20 Operating Procedures 1. Startup (1) Sign-up in the microscope log-sheet. Please ensure you have written an account number for billing. (2) Log in to the computer: Login to your account

More information

Optical design of a high resolution vision lens

Optical design of a high resolution vision lens Optical design of a high resolution vision lens Paul Claassen, optical designer, paul.claassen@sioux.eu Marnix Tas, optical specialist, marnix.tas@sioux.eu Prof L.Beckmann, l.beckmann@hccnet.nl Summary:

More information

Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7. Chapter 2 CHEM Fall L. Ma

Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7. Chapter 2 CHEM Fall L. Ma Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7 Outline Electron Sources (Electron Guns) Thermionic: LaB 6 or W Field emission gun: cold or Schottky Lenses Focusing Aberration Probe

More information

Electron Sources, Optics and Detectors

Electron Sources, Optics and Detectors Thomas LaGrange, Ph.D. Faculty Lecturer and Senior Staff Scientist Electron Sources, Optics and Detectors TEM Doctoral Course MS-637 April 16 th -18 th, 2018 Summary Electron propagation is only possible

More information

Tecnai on-line help manual --

Tecnai on-line help manual -- Tecnai on-line help Alignments 1 Tecnai on-line help manual -- Alignments Table of Contents 1 Alignments in the Tecnai microscope...5 2 Alignment procedures...6 3 Introduction to electron optics...11 3.1

More information

Point Spread Function. Confocal Laser Scanning Microscopy. Confocal Aperture. Optical aberrations. Alternative Scanning Microscopy

Point Spread Function. Confocal Laser Scanning Microscopy. Confocal Aperture. Optical aberrations. Alternative Scanning Microscopy Bi177 Lecture 5 Adding the Third Dimension Wide-field Imaging Point Spread Function Deconvolution Confocal Laser Scanning Microscopy Confocal Aperture Optical aberrations Alternative Scanning Microscopy

More information

instruments Solar Physics course lecture 3 May 4, 2010 Frans Snik BBL 415 (710)

instruments Solar Physics course lecture 3 May 4, 2010 Frans Snik BBL 415 (710) Solar Physics course lecture 3 May 4, 2010 Frans Snik BBL 415 (710) f.snik@astro.uu.nl www.astro.uu.nl/~snik info from photons spatial (x,y) temporal (t) spectral (λ) polarization ( ) usually photon starved

More information

Design and first applications of a post-column imaging filter

Design and first applications of a post-column imaging filter Microsc. MicroanaL Microstruct.. 187- APRIL/JUNE 1992, PAGE 187 Classification Physics Abstracts - 07.80 82.80 Design and first applications of a post-column imaging filter Ondrej L. Krivanek (1), Alexander

More information

SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS

SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS Robert Edward Lee Electron Microscopy Center Department of Anatomy and Neurobiology Colorado State University P T R Prentice Hall, Englewood Cliffs,

More information

2.Components of an electron microscope. a) vacuum systems, b) electron guns, c) electron optics, d) detectors. Marco Cantoni 021/

2.Components of an electron microscope. a) vacuum systems, b) electron guns, c) electron optics, d) detectors. Marco Cantoni 021/ 2.Components of an electron microscope a) vacuum systems, b) electron guns, c) electron optics, d) detectors, 021/693.48.16 Centre Interdisciplinaire de Microscopie Electronique CIME Summary Electron propagation

More information

R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad.

R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad. R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad. DEPARTMENT OF PHYSICS QUESTION BANK FOR SEMESTER III PAPER III OPTICS UNIT I: 1. MATRIX METHODS IN PARAXIAL OPTICS 2. ABERATIONS UNIT II

More information

--> Buy True-PDF --> Auto-delivered in 0~10 minutes. JY/T

--> Buy True-PDF --> Auto-delivered in 0~10 minutes. JY/T Translated English of Chinese Standard: JY/T011-1996 www.chinesestandard.net Sales@ChineseStandard.net INDUSTRY STANDARD OF THE JY PEOPLE S REPUBLIC OF CHINA General rules for transmission electron microscopy

More information

Optical Design of. Microscopes. George H. Seward. Tutorial Texts in Optical Engineering Volume TT88. SPIE PRESS Bellingham, Washington USA

Optical Design of. Microscopes. George H. Seward. Tutorial Texts in Optical Engineering Volume TT88. SPIE PRESS Bellingham, Washington USA Optical Design of Microscopes George H. Seward Tutorial Texts in Optical Engineering Volume TT88 SPIE PRESS Bellingham, Washington USA Preface xiii Chapter 1 Optical Design Concepts /1 1.1 A Value Proposition

More information

PHYSICS OPTICS. Mr Rishi Gopie

PHYSICS OPTICS. Mr Rishi Gopie OPTICS Mr Rishi Gopie Ray Optics II Images formed by lens maybe real or virtual and may have different characteristics and locations that depend on: i) The type of lens involved, whether converging or

More information

Applied Optics. , Physics Department (Room #36-401) , ,

Applied Optics. , Physics Department (Room #36-401) , , Applied Optics Professor, Physics Department (Room #36-401) 2290-0923, 019-539-0923, shsong@hanyang.ac.kr Office Hours Mondays 15:00-16:30, Wednesdays 15:00-16:30 TA (Ph.D. student, Room #36-415) 2290-0921,

More information

Variable microinspection system. system125

Variable microinspection system. system125 Variable microinspection system system125 Variable micro-inspection system Characteristics Large fields, high NA The variable microinspection system mag.x system125 stands out from conventional LD inspection

More information

LEOK-3 Optics Experiment kit

LEOK-3 Optics Experiment kit LEOK-3 Optics Experiment kit Physical optics, geometrical optics and fourier optics Covering 26 experiments Comprehensive documents Include experiment setups, principles and procedures Cost effective solution

More information

ECEN. Spectroscopy. Lab 8. copy. constituents HOMEWORK PR. Figure. 1. Layout of. of the

ECEN. Spectroscopy. Lab 8. copy. constituents HOMEWORK PR. Figure. 1. Layout of. of the ECEN 4606 Lab 8 Spectroscopy SUMMARY: ROBLEM 1: Pedrotti 3 12-10. In this lab, you will design, build and test an optical spectrum analyzer and use it for both absorption and emission spectroscopy. The

More information

Optical Components for Laser Applications. Günter Toesko - Laserseminar BLZ im Dezember

Optical Components for Laser Applications. Günter Toesko - Laserseminar BLZ im Dezember Günter Toesko - Laserseminar BLZ im Dezember 2009 1 Aberrations An optical aberration is a distortion in the image formed by an optical system compared to the original. It can arise for a number of reasons

More information

ECEN 4606, UNDERGRADUATE OPTICS LAB

ECEN 4606, UNDERGRADUATE OPTICS LAB ECEN 4606, UNDERGRADUATE OPTICS LAB Lab 2: Imaging 1 the Telescope Original Version: Prof. McLeod SUMMARY: In this lab you will become familiar with the use of one or more lenses to create images of distant

More information

A Tutorial on Electron Microscopy

A Tutorial on Electron Microscopy A Tutorial on Electron Microscopy Jian-Min (Jim) Zuo Mat. Sci. Eng. and Seitz-Materials Research Lab., UIUC Outline of This Tutorial I. Science and opportunities of electron microscopy II. The basic TEM,

More information

Design, calibration and assembly of an Offner imaging spectrometer

Design, calibration and assembly of an Offner imaging spectrometer Journal of Physics: Conference Series Design, calibration and assembly of an Offner imaging spectrometer To cite this article: Héctor González-Núñez et al 2011 J. Phys.: Conf. Ser. 274 012106 View the

More information

Very short introduction to light microscopy and digital imaging

Very short introduction to light microscopy and digital imaging Very short introduction to light microscopy and digital imaging Hernan G. Garcia August 1, 2005 1 Light Microscopy Basics In this section we will briefly describe the basic principles of operation and

More information

Heisenberg) relation applied to space and transverse wavevector

Heisenberg) relation applied to space and transverse wavevector 2. Optical Microscopy 2.1 Principles A microscope is in principle nothing else than a simple lens system for magnifying small objects. The first lens, called the objective, has a short focal length (a

More information

Observational Astronomy

Observational Astronomy Observational Astronomy Instruments The telescope- instruments combination forms a tightly coupled system: Telescope = collecting photons and forming an image Instruments = registering and analyzing the

More information

Nanotechnology in Consumer Products

Nanotechnology in Consumer Products Nanotechnology in Consumer Products Advances in Transmission Electron Microscopy Friday, April 21, 2017 October 31, 2014 The webinar will begin at 1pm Eastern Time Click here to watch the webinar recording

More information

Supplementary Materials

Supplementary Materials Supplementary Materials In the supplementary materials of this paper we discuss some practical consideration for alignment of optical components to help unexperienced users to achieve a high performance

More information

Optical Signal Processing

Optical Signal Processing Optical Signal Processing ANTHONY VANDERLUGT North Carolina State University Raleigh, North Carolina A Wiley-Interscience Publication John Wiley & Sons, Inc. New York / Chichester / Brisbane / Toronto

More information

Exam 3--PHYS 102--S10

Exam 3--PHYS 102--S10 ame: Exam 3--PHYS 02--S0 Multiple Choice Identify the choice that best completes the statement or answers the question.. At an intersection of hospital hallways, a convex mirror is mounted high on a wall

More information

2/4/15. Brightfield Microscopy! It s all about Magnification..! or is it?!

2/4/15. Brightfield Microscopy! It s all about Magnification..! or is it?! Brightfield Microscopy It s all about Magnification.. or is it? 1 What actually does go into chosing a microscope Choice depends on what you need the microscope to do. Do you want to magnify stained specimens?

More information

Reflection! Reflection and Virtual Image!

Reflection! Reflection and Virtual Image! 1/30/14 Reflection - wave hits non-absorptive surface surface of a smooth water pool - incident vs. reflected wave law of reflection - concept for all electromagnetic waves - wave theory: reflected back

More information

Introduction to Transmission Electron Microscopy (Physical Sciences)

Introduction to Transmission Electron Microscopy (Physical Sciences) Introduction to Transmission Electron Microscopy (Physical Sciences) Centre for Advanced Microscopy Program 9:30 10:45 Lecture 1 Basics of TEM 10:45 11:00 Morning tea 11:00 12:15 Lecture 2 Diffraction

More information

Optics and Lasers. Matt Young. Including Fibers and Optical Waveguides

Optics and Lasers. Matt Young. Including Fibers and Optical Waveguides Matt Young Optics and Lasers Including Fibers and Optical Waveguides Fourth Revised Edition With 188 Figures Springer-Verlag Berlin Heidelberg New York London Paris Tokyo Hong Kong Barcelona Budapest Contents

More information

Holographic Optical Tweezers and High-speed imaging. Miles Padgett, Department of Physics and Astronomy

Holographic Optical Tweezers and High-speed imaging. Miles Padgett, Department of Physics and Astronomy Holographic Optical Tweezers and High-speed imaging Miles Padgett, Department of Physics and Astronomy High-speed Imaging in Optical Tweezers Holographic Optical Tweezers Tweezers human interface, the

More information

An Indian Journal FULL PAPER. Trade Science Inc. Parameters design of optical system in transmitive star simulator ABSTRACT KEYWORDS

An Indian Journal FULL PAPER. Trade Science Inc. Parameters design of optical system in transmitive star simulator ABSTRACT KEYWORDS [Type text] [Type text] [Type text] ISSN : 0974-7435 Volume 10 Issue 23 BioTechnology 2014 An Indian Journal FULL PAPER BTAIJ, 10(23), 2014 [14257-14264] Parameters design of optical system in transmitive

More information

TSBB09 Image Sensors 2018-HT2. Image Formation Part 1

TSBB09 Image Sensors 2018-HT2. Image Formation Part 1 TSBB09 Image Sensors 2018-HT2 Image Formation Part 1 Basic physics Electromagnetic radiation consists of electromagnetic waves With energy That propagate through space The waves consist of transversal

More information

INTRODUCTION TO ABERRATIONS IN OPTICAL IMAGING SYSTEMS

INTRODUCTION TO ABERRATIONS IN OPTICAL IMAGING SYSTEMS INTRODUCTION TO ABERRATIONS IN OPTICAL IMAGING SYSTEMS JOSE SASIÄN University of Arizona ШШ CAMBRIDGE Щ0 UNIVERSITY PRESS Contents Preface Acknowledgements Harold H. Hopkins Roland V. Shack Symbols 1 Introduction

More information

Improving the Collection Efficiency of Raman Scattering

Improving the Collection Efficiency of Raman Scattering PERFORMANCE Unparalleled signal-to-noise ratio with diffraction-limited spectral and imaging resolution Deep-cooled CCD with excelon sensor technology Aberration-free optical design for uniform high resolution

More information

High Resolution Transmission Electron Microscopy (HRTEM) Summary 4/11/2018. Thomas LaGrange Faculty Lecturer and Senior Staff Scientist

High Resolution Transmission Electron Microscopy (HRTEM) Summary 4/11/2018. Thomas LaGrange Faculty Lecturer and Senior Staff Scientist Thomas LaGrange Faculty Lecturer and Senior Staff Scientist High Resolution Transmission Electron Microscopy (HRTEM) Doctoral Course MS-637 April 16-18th, 2018 Summary Contrast in TEM images results from

More information

VC 11/12 T2 Image Formation

VC 11/12 T2 Image Formation VC 11/12 T2 Image Formation Mestrado em Ciência de Computadores Mestrado Integrado em Engenharia de Redes e Sistemas Informáticos Miguel Tavares Coimbra Outline Computer Vision? The Human Visual System

More information

TECHSPEC COMPACT FIXED FOCAL LENGTH LENS

TECHSPEC COMPACT FIXED FOCAL LENGTH LENS Designed for use in machine vision applications, our TECHSPEC Compact Fixed Focal Length Lenses are ideal for use in factory automation, inspection or qualification. These machine vision lenses have been

More information

2.Components of an electron microscope. a) vacuum systems, b) electron guns, c) electron optics, d) detectors. Marco Cantoni, 021/

2.Components of an electron microscope. a) vacuum systems, b) electron guns, c) electron optics, d) detectors. Marco Cantoni, 021/ 2.Components of an electron microscope a) vacuum systems, b) electron guns, c) electron optics, d) detectors Marco Cantoni, 021/693.48.16 Centre Interdisciplinaire de Microscopie Electronique CIME MSE-603

More information

Be aware that there is no universal notation for the various quantities.

Be aware that there is no universal notation for the various quantities. Fourier Optics v2.4 Ray tracing is limited in its ability to describe optics because it ignores the wave properties of light. Diffraction is needed to explain image spatial resolution and contrast and

More information

Spectroscopy Lab 2. Reading Your text books. Look under spectra, spectrometer, diffraction.

Spectroscopy Lab 2. Reading Your text books. Look under spectra, spectrometer, diffraction. 1 Spectroscopy Lab 2 Reading Your text books. Look under spectra, spectrometer, diffraction. Consult Sargent Welch Spectrum Charts on wall of lab. Note that only the most prominent wavelengths are displayed

More information

The Camera : Computational Photography Alexei Efros, CMU, Fall 2008

The Camera : Computational Photography Alexei Efros, CMU, Fall 2008 The Camera 15-463: Computational Photography Alexei Efros, CMU, Fall 2008 How do we see the world? object film Let s design a camera Idea 1: put a piece of film in front of an object Do we get a reasonable

More information

Handbook of Optical Systems

Handbook of Optical Systems Handbook of Optical Systems Volume 5: Metrology of Optical Components and Systems von Herbert Gross, Bernd Dörband, Henriette Müller 1. Auflage Handbook of Optical Systems Gross / Dörband / Müller schnell

More information

Chemistry 524--"Hour Exam"--Keiderling Mar. 19, pm SES

Chemistry 524--Hour Exam--Keiderling Mar. 19, pm SES Chemistry 524--"Hour Exam"--Keiderling Mar. 19, 2013 -- 2-4 pm -- 170 SES Please answer all questions in the answer book provided. Calculators, rulers, pens and pencils permitted. No open books allowed.

More information

Mirrors and Lenses. Images can be formed by reflection from mirrors. Images can be formed by refraction through lenses.

Mirrors and Lenses. Images can be formed by reflection from mirrors. Images can be formed by refraction through lenses. Mirrors and Lenses Images can be formed by reflection from mirrors. Images can be formed by refraction through lenses. Notation for Mirrors and Lenses The object distance is the distance from the object

More information

Scanning electron microscope

Scanning electron microscope Scanning electron microscope 6 th CEMM workshop Maja Koblar, Sc. Eng. Physics Outline The basic principle? What is an electron? Parts of the SEM Electron gun Electromagnetic lenses Apertures Chamber and

More information

ARTICLE IN PRESS. Energy-filtered transmission electron microscopy: an overview B

ARTICLE IN PRESS. Energy-filtered transmission electron microscopy: an overview B ARTICLE IN PRESS DTD 5 Spectrochimica Acta Part B xx (2004) xxx xxx www.elsevier.com/locate/sab Energy-filtered transmission electron microscopy: an overview B J. Verbeeck*, D. Van Dyck, G. Van Tendeloo

More information

Chapter 3 Op+cal Instrumenta+on

Chapter 3 Op+cal Instrumenta+on Chapter 3 Op+cal Instrumenta+on 3-1 Stops, Pupils, and Windows 3-4 The Camera 3-5 Simple Magnifiers and Eyepieces 3-6 Microscopes 3-7 Telescopes Today (2011-09-22) 1. Magnifiers 2. Camera 3. Resolution

More information

Guide to SPEX Optical Spectrometer

Guide to SPEX Optical Spectrometer Guide to SPEX Optical Spectrometer GENERAL DESCRIPTION A spectrometer is a device for analyzing an input light beam into its constituent wavelengths. The SPEX model 1704 spectrometer covers a range from

More information

MIMS Workshop F. Hillion. MIMS Workshop

MIMS Workshop F. Hillion. MIMS Workshop MIMS Workshop 23 - F. Hillion MIMS Workshop 1/ Practical aspects of N5 Tuning Primary column : small probe, high current, influence of Z. Dynamic Transfer and scanning. Cy and P2/P3. LF4, Q and chromatic

More information

Name. Light Chapter Summary Cont d. Refraction

Name. Light Chapter Summary Cont d. Refraction Page 1 of 17 Physics Week 12(Sem. 2) Name Light Chapter Summary Cont d with a smaller index of refraction to a material with a larger index of refraction, the light refracts towards the normal line. Also,

More information

Modulation Transfer Function

Modulation Transfer Function Modulation Transfer Function The Modulation Transfer Function (MTF) is a useful tool in system evaluation. t describes if, and how well, different spatial frequencies are transferred from object to image.

More information

Testing Aspheric Lenses: New Approaches

Testing Aspheric Lenses: New Approaches Nasrin Ghanbari OPTI 521 - Synopsis of a published Paper November 5, 2012 Testing Aspheric Lenses: New Approaches by W. Osten, B. D orband, E. Garbusi, Ch. Pruss, and L. Seifert Published in 2010 Introduction

More information

CHAPTER 18 REFRACTION & LENSES

CHAPTER 18 REFRACTION & LENSES Physics Approximate Timeline Students are expected to keep up with class work when absent. CHAPTER 18 REFRACTION & LENSES Day Plans for the day Assignments for the day 1 18.1 Refraction of Light o Snell

More information

LASP / University of Colorado

LASP / University of Colorado The SORCE SIM Instrument: Progress Toward Spectral Irradiance Time Series Throughout the 300-3000 nm Region. Jerald Harder, Juan Fontenla, Byron Smiley, Sean Davis, George Lawrence and Gary Rottman LASP

More information

INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY

INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY August 2011 PRELIMINARIES OPERATION 1. Ensure that EMISSION and HT are on: The HT READY and FEG READY lights

More information

PROCEEDINGS OF SPIE. Measuring and teaching light spectrum using Tracker as a spectrometer. M. Rodrigues, M. B. Marques, P.

PROCEEDINGS OF SPIE. Measuring and teaching light spectrum using Tracker as a spectrometer. M. Rodrigues, M. B. Marques, P. PROCEEDINGS OF SPIE SPIEDigitalLibrary.org/conference-proceedings-of-spie Measuring and teaching light spectrum using Tracker as a spectrometer M. Rodrigues, M. B. Marques, P. Simeão Carvalho M. Rodrigues,

More information

BEAM HALO OBSERVATION BY CORONAGRAPH

BEAM HALO OBSERVATION BY CORONAGRAPH BEAM HALO OBSERVATION BY CORONAGRAPH T. Mitsuhashi, KEK, TSUKUBA, Japan Abstract We have developed a coronagraph for the observation of the beam halo surrounding a beam. An opaque disk is set in the beam

More information

Exercise 8: Interference and diffraction

Exercise 8: Interference and diffraction Physics 223 Name: Exercise 8: Interference and diffraction 1. In a two-slit Young s interference experiment, the aperture (the mask with the two slits) to screen distance is 2.0 m, and a red light of wavelength

More information

Microscopy: Fundamental Principles and Practical Approaches

Microscopy: Fundamental Principles and Practical Approaches Microscopy: Fundamental Principles and Practical Approaches Simon Atkinson Online Resource: http://micro.magnet.fsu.edu/primer/index.html Book: Murphy, D.B. Fundamentals of Light Microscopy and Electronic

More information

Measurement of the Modulation Transfer Function (MTF) of a camera lens. Laboratoire d Enseignement Expérimental (LEnsE)

Measurement of the Modulation Transfer Function (MTF) of a camera lens. Laboratoire d Enseignement Expérimental (LEnsE) Measurement of the Modulation Transfer Function (MTF) of a camera lens Aline Vernier, Baptiste Perrin, Thierry Avignon, Jean Augereau, Lionel Jacubowiez Institut d Optique Graduate School Laboratoire d

More information

Two strategies for realistic rendering capture real world data synthesize from bottom up

Two strategies for realistic rendering capture real world data synthesize from bottom up Recap from Wednesday Two strategies for realistic rendering capture real world data synthesize from bottom up Both have existed for 500 years. Both are successful. Attempts to take the best of both world

More information

Applications of Optics

Applications of Optics Nicholas J. Giordano www.cengage.com/physics/giordano Chapter 26 Applications of Optics Marilyn Akins, PhD Broome Community College Applications of Optics Many devices are based on the principles of optics

More information

2 How to operate the microscope/obtain an image

2 How to operate the microscope/obtain an image Morgagni Operating Instructions 50079 010912 2-1 2 ow to operate the microscope/obtain an image 2.1 Starting the microscope 2.1.1 Starting the microscope with several manually-operated steps 1. Turn on

More information

Section A Conceptual and application type questions. 1 Which is more observable diffraction of light or sound? Justify. (1)

Section A Conceptual and application type questions. 1 Which is more observable diffraction of light or sound? Justify. (1) INDIAN SCHOOL MUSCAT Department of Physics Class : XII Physics Worksheet - 6 (2017-2018) Chapter 9 and 10 : Ray Optics and wave Optics Section A Conceptual and application type questions 1 Which is more

More information

Basic spectrometer types

Basic spectrometer types Spectroscopy Basic spectrometer types Differential-refraction-based, in which the variation of refractive index with wavelength of an optical material is used to separate the wavelengths, as in a prism

More information

GEOMETRICAL OPTICS AND OPTICAL DESIGN

GEOMETRICAL OPTICS AND OPTICAL DESIGN GEOMETRICAL OPTICS AND OPTICAL DESIGN Pantazis Mouroulis Associate Professor Center for Imaging Science Rochester Institute of Technology John Macdonald Senior Lecturer Physics Department University of

More information

Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: Signature:

Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: Signature: Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: PID: Signature: CLOSED BOOK. TWO 8 1/2 X 11 SHEET OF NOTES (double sided is allowed), AND SCIENTIFIC POCKET CALCULATOR

More information

Why and How? Daniel Gitler Dept. of Physiology Ben-Gurion University of the Negev. Microscopy course, Michmoret Dec 2005

Why and How? Daniel Gitler Dept. of Physiology Ben-Gurion University of the Negev. Microscopy course, Michmoret Dec 2005 Why and How? Daniel Gitler Dept. of Physiology Ben-Gurion University of the Negev Why use confocal microscopy? Principles of the laser scanning confocal microscope. Image resolution. Manipulating the

More information

Phy Ph s y 102 Lecture Lectur 21 Optical instruments 1

Phy Ph s y 102 Lecture Lectur 21 Optical instruments 1 Phys 102 Lecture 21 Optical instruments 1 Today we will... Learn how combinations of lenses form images Thin lens equation & magnification Learn about the compound microscope Eyepiece & objective Total

More information

GPI INSTRUMENT PAGES

GPI INSTRUMENT PAGES GPI INSTRUMENT PAGES This document presents a snapshot of the GPI Instrument web pages as of the date of the call for letters of intent. Please consult the GPI web pages themselves for up to the minute

More information

Introduction to Electron Microscopy

Introduction to Electron Microscopy Introduction to Electron Microscopy Prof. David Muller, dm24@cornell.edu Rm 274 Clark Hall, 255-4065 Ernst Ruska and Max Knoll built the first electron microscope in 1931 (Nobel Prize to Ruska in 1986)

More information

Xenon-Zirconia 3.3/92

Xenon-Zirconia 3.3/92 This lens with.2x magnification is optimized for the use with 12k (62.5 mm) line scan sensors with 5 µm pixel, but can also be used with 16k (82 mm) lines. It is broadband coated and can be used in the

More information

Average: Standard Deviation: Max: 99 Min: 40

Average: Standard Deviation: Max: 99 Min: 40 1 st Midterm Exam Average: 83.1 Standard Deviation: 12.0 Max: 99 Min: 40 Please contact me to fix an appointment, if you took less than 65. Chapter 33 Lenses and Op/cal Instruments Units of Chapter 33

More information

Systems Biology. Optical Train, Köhler Illumination

Systems Biology. Optical Train, Köhler Illumination McGill University Life Sciences Complex Imaging Facility Systems Biology Microscopy Workshop Tuesday December 7 th, 2010 Simple Lenses, Transmitted Light Optical Train, Köhler Illumination What Does a

More information

J. C. Wyant Fall, 2012 Optics Optical Testing and Testing Instrumentation

J. C. Wyant Fall, 2012 Optics Optical Testing and Testing Instrumentation J. C. Wyant Fall, 2012 Optics 513 - Optical Testing and Testing Instrumentation Introduction 1. Measurement of Paraxial Properties of Optical Systems 1.1 Thin Lenses 1.1.1 Measurements Based on Image Equation

More information

Introduction: Why electrons?

Introduction: Why electrons? Introduction: Why electrons? 1 Radiations Visible light X-rays Electrons Neutrons Advantages Not very damaging Easily focused Eye wonderful detector Small wavelength (Angstroms) Good penetration Small

More information

Image Formation Fundamentals

Image Formation Fundamentals 30/03/2018 Image Formation Fundamentals Optical Engineering Prof. Elias N. Glytsis School of Electrical & Computer Engineering National Technical University of Athens Imaging Conjugate Points Imaging Limitations

More information

Introduction to the operating principles of the HyperFine spectrometer

Introduction to the operating principles of the HyperFine spectrometer Introduction to the operating principles of the HyperFine spectrometer LightMachinery Inc., 80 Colonnade Road North, Ottawa ON Canada A spectrometer is an optical instrument designed to split light into

More information

Diffraction lens in imaging spectrometer

Diffraction lens in imaging spectrometer Diffraction lens in imaging spectrometer Blank V.A., Skidanov R.V. Image Processing Systems Institute, Russian Academy of Sciences, Samara State Aerospace University Abstract. А possibility of using a

More information

Diffraction. Interference with more than 2 beams. Diffraction gratings. Diffraction by an aperture. Diffraction of a laser beam

Diffraction. Interference with more than 2 beams. Diffraction gratings. Diffraction by an aperture. Diffraction of a laser beam Diffraction Interference with more than 2 beams 3, 4, 5 beams Large number of beams Diffraction gratings Equation Uses Diffraction by an aperture Huygen s principle again, Fresnel zones, Arago s spot Qualitative

More information

ADALAM Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing D2.2. Ger Folkersma (Demcon)

ADALAM Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing D2.2. Ger Folkersma (Demcon) D2.2 Automatic adjustable reference path system Document Coordinator: Contributors: Dissemination: Keywords: Ger Folkersma (Demcon) Ger Folkersma, Kevin Voss, Marvin Klein (Demcon) Public Reference path,

More information

Detector Checkout and Optics Commissioning

Detector Checkout and Optics Commissioning Detector Checkout and Optics Commissioning Jure Bericic Brad Sawatzky with SHMS optics working group Hall C Winter Collaboration Meeting January 20, 2017 overview HMS overview SHMS overview commissioning

More information

Cs-corrector. Felix de Haas

Cs-corrector. Felix de Haas Cs-corrector. Felix de Haas Content Non corrector systems Lens aberrations and how to minimize? Corrector systems How is it done? Lens aberrations Spherical aberration Astigmatism Coma Chromatic Quality

More information