A Complete Optical Measurement and Testing System by Optikos

Transcription

1 A Cmplete Optical Measurement and Testing System by Optiks Pwered by OpTest 7 Sftware LensCheck Prduct fr Smaller Lenses OpTest System fr Large Measurements, any Applicatin

2 Understanding Lens and Image Quality Thse invlved in ptical design and fabricatin understand that lens elements and ptical systems are seldm perfect. Despite the presence f the mst sphisticated design and manufacturing techniques, lenses can still vary cnsiderably in quality. Optiks is a leader and pineer in lens and image testing and ur prducts and systems are based n ver thirty years f experience and innvatins in ptical engineering. The result is that ur custmers are able t use the mst advanced metrlgy tls fr perfrming accurate and efficient lens measurements that make a difference in their prduct quality and perfrmance. Our flagship prducts includes the OpTest Lens Measurement System with a cmplete range f hardware ptins, as well as LensCheck, a cmpact versin that is prtable and easy-t-use fr smaller lenses. Bth are pwered by OpTest 7 - Optiks prprietary sftware. OpTest Lens Measurement System: There is a Difference The OpTest Lens Measurement System has been cmpletely redesigned by Optiks engineers t include the latest technlgies and innvatins in ptical and pt-mechanical engineering. Other prducts n the market cmprmise by manufacturing their systems arund general purpse ffthe-shelf lab cmpnents, while every step f an Optiks slutin is a custm ne. OpTest systems are cmprised almst cmpletely f custm ptics, mechanics, and electrnics designed by Optiks engineers slely fr the purpse f lens testing. The result is that ur custmers nw have access t the mst advanced metrlgy tl fr perfrming accurate and time-efficient lens measurements. Distributed Mtin Cntrl OpTest systems incrprate distributed mtin cntrl designed by Optiks engineers - integrating the electrnics within each hardware cmpnent and eliminating the need fr a large electrnics rack. Optiks distributed mtin cntrl saves valuable lab space and greatly reduces the number f cables, and the system includes an intuitive handheld cntrller fr remte peratin. Innvative Cable Management N mre cables dragging while ff-axis measurements are perfrmed. OpTest systems are the nly lens testing systems that eliminate this drag n the system and increase accuracy fr many lens measurements. 2

3 Whatever Yu Design, Yu Can Measure Optiks ffers the mst cmprehensive prduct line fr lens testing. Upgrade paths are available t expand yur testing capabilities with OpTest t include measurements such as transmissin and stray light. There s Mre t Measurement than MTF The OpTest test bench perfrms system tests in situatins similar t actual applicatins. Field angle psitins, cnjugate ratis, spectral regins, and image plane architecture can all be replicated r simulated in the testing f an ptical system. The OpTest measurement system can als prvide great testing versatility. Althugh MTF is a cmmn measurement, ther lens measurements are critical t lens perfrmance. The OpTest system prvides testing capability fr these measurements. Using advanced OpTest 7 Sftware, these measurements include: MTF Thrugh-Fcus MTF Depth f Fcus Blur Spt Size Astigmatism Effective Fcal Length (EFL) Distrtin Field Curvature Chief Ray Angle (Principal Ray Angle) Encircled and Ensquared Energy Axial Clr Lateral Clr Line f Sight (Bresight)* Transmissin* Stray Light* *Additinal equipment is required. 3

4 Custm-Designed t Fit Yur Needs Yur ptical testing system shuld be built frm sub-assemblies and cmpnents that meet yur immediate needs, but als prvide a simple upgrade path as yur needs change. The Optiks apprach prvides yu with a technical as well as ecnmical slutin: ne that desn t becme bslete as yur applicatin r business develps ne that is flexible enugh t meet yur requirements nw and in the future. With the range f prducts available, selecting the cmpnents that best suit yur purpses and give yu maximum flexibility can be a challenge. In the ptical testing sectin that fllws, yu will be intrduced t a range f prducts that will wrk tgether t perfrm the tests that meet yur unique applicatin. Descriptins and illustratins explain hw each prduct may used t create the verall system. OG-1000 Image Analyzer Reflective Cllimatr Image Analyzer Munt LP-1000 Off-Axis Lens Platfrm 4

5 A Buildable Slutin The mdular cmpnents f the OpTest system can be cnfigured t test mst types f lenses. Selecting and cnfiguring mdules apprpriate fr the ptical system under test requires defining hw the system is t be used, in particular: 1. Lcatin f bject and image cnjugates 2. Spectral range 3. Spatial reslutin 4. Image and bject size and system field-f-view 5. Pupil diameters, F/number, and numerical aperture 6. Physical dimensin and system layut 1. Fr lcatin f bject and image cnjugates, mst ptical systems fall int three grups: Infinite cnjugate systems: The bject plane is lcated at infinity. Examples: Camera lenses, eyepieces, infinity-crrect micrscpe bjectives Afcal systems: Bth the bject and image plane are at infinity. Examples: Telescpes, binculars, and beam expanders Finite cnjugate systems: Bth the bject and image planes are lcated at finite distances. Examples: Phtgraphic enlarging lenses, macr lenses, fiber ptic faceplates, image tubes, and phtlithgraphy lenses 5

6 2. The OpTest System supprts image analyzers that can perate ver spectral wavelength frm the UV t the LWIR. 3. All ptical systems are limited in their ability t frm images due t spatial reslutin. One fundamental limitatin stems frm the wave nature f light. In a case where the wave nature f light limits the perfrmance f an ptical system, the system has diffractin limited reslutin. The perfrmance f an ptical system can als be limited by the design f the system r by manufacturing imperfectins. In this case the ptical system is reslutin-limited by aberratins. The residual aberratins f the ptical testing system must be small cmpared t thse f the system under test. The resulting image analyzer f the test system must als have sufficient reslutin t analyze the resulting image frmed by the ptical system under test. Spatial reslutin is specified in line-pairs per millimeter fr infinite and finite cnjugate systems. It is specified in cycles per milliradian fr afcal systems. 4. The test system must be able t cver the field-f-view (FOV) f the system under test in bth bject and image space. Fr infinite cnjugate systems, the test system must cver the angular FOV in bject space and linear dimensin f the full field image height. Fr finite cnjugate testing the translatin stages must be able t cver the full bject and image heights. Fr testing afcal systems, it is necessary t span the angular FOV in bth bject and image space. 5. The test system must be able t fill the entrance pupil f the system under test in bject space and cllect light frm the entire exit pupil. Fr infinite cnjugate and afcal systems under test, the entrance pupil diameter specifies the size f the cllimated beam required in bject space. Image space requirements are specified by the exit pupil diameter f afcal systems, whereas the wrking F/number r numerical aperture is relevant when testing infinite r finite cnjugate systems. 6. The OpTest system needs an ptical table t accmmdate system cmpnents and a flded ptical path. The ptical system under test may be massive r may include flded ptical paths r ther unusual physical characteristics. An ptical table with ¼ -20 n 1 centers r M6 n 25mm centers is required fr OpTest systems. 6

7 OpTest 7 Sftware Optimized fr Perfrmance OpTest 7 is a cmplete new sftware package ptimized nt nly fr MTF measurements, but fr measurements f parameters critical t characterizing lens perfrmance. Tgether with the apprpriate OpTest hardware, the sftware allws fr cmplete cntrl f the ptical testing parameters and crdinates test set-up, data acquisitin, prcessing, lgging, and data reprt generatin. OpTest 7 sftware integrates all cmputer cntrl, image analysis, mtinal cntrl, and signal prcessing int a single package. Features f OpTest 7 Include: A newly-designed, intuitive graphical user interface Multiple user mdes ptimized fr a diverse user base: Prductin Labratry Engineering Easy-t-cnfigure test rutines Rutines set-up by engineers and available t Labratry and Prductin users Faster measuremen time Autmatic reticle sizing fr mre accurate measurements Advanced reprt generatin directly t Micrsft Excel The mst cmprehensive set f lens measurements available: 7

8 Designed fr Vide- and Scanning-Based Image Analyzers OpTest 7 Sftware wrks with bth vide-based and scanning-based image analyzers. Fr videbased sensrs (tw-dimensinal imagers), the VideMTF Image Analysis Mdule is used t prvide real-time measurement f MTF and ther ptical parameters. A VideMTF Image Analysis-based testing system is recmmended fr visible applicatins r fr prductin testing at any wavelength. Vide image analyzers are available in the UV, VIS, SWIR, MWIR, and LWIR. Image scanning is used where vide image acquisitin is impractical. Fr scanning-based sensrs, the EROS Scanning Image Analysis Mdule is used with OpTest mechanical scan hardware and an infrared image analyzer t perfrm the mst flexible and demanding measurements. The EROS scanning mdule enables cntrl f the scan length, number f samples, data averaging, and data filtering. OpTest r LensCheck Hardware fr Yur Applicatin N Matter What Shape r Size The OpTest Lens Measurement System includes a cmplete range f hardware ptins t meet and surpass yur testing requirements. Fr smaller lenses and when space is limited, the LensCheck Prduct, is a cmpact versin that is prtable and easy-t-use. Bth are pwered by OpTest 7 - Optiks prprietary sftware. OpTest System Hardware Optins OG-1000 Surce Easily Switch between Visible and Infrared The OG-1000 series f multispectral Object Generatrs - cmpletely redesigned in uses state-f-the-art light surces, ptics, electrnic cntrls and autmatin. These surces prvide unifrm, high intensity illuminatin frm the visible t lng-wave infrared (0.4 15μm). With the tuch f a buttn, the unit electrnically switches between Visible and Infrared surces, prviding shrter lens set-up times and imprved alignment and thrughput efficiency. High-speed, 16-psitin target wheel with precisin-aligned, laser cut apertures eliminates the need t pause measurements t change targets Tuchscreen display prvides intuitive user interface fr cmputer and mdule cntrl 8

9 New AlignMde substantially speeds up lens set-up and alignment, while a single tuchscreen buttn switches frm yur test cnfiguratin (visible r infrared) t a visible alignment target, and switches back t yur riginal cnfiguratin Redesigned ptics prvide substantially imprved signal Single set-up testing f visible and infrared multispectral ptical systems Other features include: 3000K tungsten halgen emitter (VIS t SWIR) 1000 C Infrared emitter (MWIR t LWIR) Drive electrnics fr target wheel and waveband switching Integrated and autmated chpper wheel Integrated shutter enables autmatic backgrund crrectins Image Analyzers fr Vide and Scanning Applicatins Image Analyzers acquire the image frmed by the ptical system under test, cnverting the ptical image int an electrnic image that is analyzed by OpTest 7 sftware. Optiks uses tw types f image acquisitin methds vide and scanning. The type f system mst apprpriate t a particular applicatin depends n the type f ptical system t be tested and the testing envirnment. A vide image analyzer acquires the image by enlarging (magnifying) it nt an image sensr such as a CCD r micrblmeter array. A scanning system acquires the image infrmatin by measuring (hw?) the variatin in the light level as an edge r slit is translated thrugh the image plane. VideMTF Image Analyzers fur mdels feature varius spectral respnses A fcal plane array r image sensr-based system using the VideMTF Image Analysis Mdule will perfrm the image scanning quickly and allw yu t directly view the image. This speeds up and simplifies the system set-up since bth the image lcatin and the plane f best-fcus can be determined quickly. VI-1000 Visible Image Analyzer ( nm) Spectral respnsivity, nm Switch between electrnic imaging and direct manual viewing f the image spt using integrated flipmirrr assembly Apchrmatic tube lens High-sensitivity FireWire camera, 12-bit vide utput 9

10 VI-2000 SWIR Image Analyzer ( µm) Spectral respnsivity µm 640 x 512 reslutin Switch between electrnic imaging and direct manual viewing f the image spt using integrated flip-mirrr assembly NIR apchrmatic tube lens VI-3000 MWIR Image Analyzer (3 5µm) VI-4000 LWIR Image Analyzer (8 14µm) Uncled Micrblmeter Spectral respnsivity µm 320x240 reslutin Calibrated LWIR Objective Lens 7.5x magnificatin NA 0.70 EROS Image Analyzers tw mdels feature varius spectral respnses A knife-edge scanning system is inherently mre flexible fr testing a wider range f ptical systems. There is a larger variety f single element detectrs available cmpared with array detectrs. Cllectin and relay ptics d nt need t prvide the image quality that is required by vide analysis. With the EROS Image Analyzer, relay ptics cllect light frm the test ptic s image plane and prject it nt the detectr. SD-500 SWIR/MWIR Scanning Image Analyzer (1 5µm) Cmprised f a LWIR detectr, relay ptics, scanning aperture set, and ultra-cmpact, mtrized rtary assembly Unique gemetry enables measurements at image planes recessed up t 56mm with its <19mm diameter prbe Detectr assembly is an LN2-cled HgCdTe detectr (8 12 preamplifier and temperature sensr built int the 8-hur hld time dewar Multi-element relay lens cllects light frm the scanning aperture at an f-number up t 0.7 Scanning aperture set includes a slit and a knife-edge, bth metal film n ZnS substrates. 10

11 SD-600 LWIR Scanning Image Analyzer (8 14µm) Cmprised f a SWIR/MWIR detectr, relay ptics, scanning aperture set, and ultra-cmpact, mtrized rtary assembly Unique gemetry f the SD-500 enables measurements at image planes recessed up t 56mm with its <19mm diameter prbe Detectr assembly is an LN2- and temperature sensr built int the 8-hur hld time dewar Multi-element relay lens cllects light frm scanning aperture at an f-number up t 0.7 S -edge, bth metal film n sapphire substrates. Image Analyzer Munt AM-600 fr accurate psitining f lens under test The AM-600 psitins the image analyzer at the image plane f the lens under test, and defines the fllwing three-axis cnventin in the image space f the lens under test: X adjusts the lateral image height parallel t the ptical table Y adjusts the image height perpendicular t the ptical table Z is the fcus adjustment alng the ptical axis encders: Features include the fllwing translatin and X-Stage (Off-Axis Stage): Mtrized with 50mm translatin munted with 0.1µm reslutin linear encder Y-Stage (Vertical Stage): Mtrized with 50mm translatin munted with 0.1µm reslutin linear encder Z-Stage (Fcus Stage): Mtrized with 50mm translatin munted with 0.1µm reslutin linear encder Cllimatrs fr Basic t Mst Challenging Lens Testing Applicatins Cllimatrs are used t prject a surce at infinity fr infinite cnjugate testing f ptical systems. The prjected beam frm the cllimatr shuld verfill the entrance pupil f the ptical system under test. This means that the clear aperture f the cllimatr shuld be larger than the entrance pupil f the system under test. Reflective cllimatrs are the standard ffered by Optiks. Each cllimatr is an ff-axis parablic mirrr (OAP) with λ/8 surface accuracy guaranteed after munting and a prtected aluminum cating fr plychrmatic testing. Each OAP is ptted in a high-stability munt which has undergne rigrus finite element analysis t ptimize the design. 11

12 Testing Platfrms fr Infinite, Finite and Afcal Testing LP-1000 Off-Axis Heavy Duty Lens Platfrm fr precise rtatin testing Optiks engineers utilized finite element analysis t design structural castings in the LP-1000 that maintain flatness when munted t an ptical table, imprving n traditinal rail systems that munt directly t the ptical table and are vulnerable t bending t the shape f a less-precise ptical table surface. Unique cable management system eliminates cables dragging n ptical table which may intrduce errrs t centrid measurement rutines (EFL, Distrtin, Chief Ray Angle, Lateral Clr, etc.) Main bearing surface is shielded t minimize expsure t cntaminatin a unique level f integratin Mst precise rtary encder n the market, <0.1 arc secnd reslutin fr precise field angle cntrl Incrprates stainless steel linear guides aligned t granite master t ensure straightness Integrated linear encder enables lng flange and back fcal length measurements Industry leading 300 f ttal rtary travel FP-1000 Autmated Finite Cnjugate Platfrm fr precise adjustments in bject space Finite cnjugate platfrms are used t psitin bject generatr assemblies at finite bject distances when testing finite cnjugate ptical systems. The platfrm allws fr precise adjustment f surce distance (Z-axis), lateral bject height (X-axis), and vertical (Y-axis) translatin in bject space. The FPA-1000 prvides autmated mtin f the bject generatr alng the X-axis. The Z-Axis f the FP-1000 remains under manual cntrl. Enables autmated ff-axis testing f finite cnjugate ptics Large frmat tw-axis translating platfrm fr the OG-1110 X-axis mtin (perpendicular t the ptical axis) Cmputer cntrlled mtrized mtin 900mm ttal travel 2 micrn reslutin encder Z-axis mtin (parallel t the ptical axis) Manual adjustment 1200mm ttal travel 12

13 LensCheck Prduct - Prtable, Precise fr Visible and Lng-Wave Infrared Lens Measurements A cst-effective slutin t yur prductin and prttype lens qualificatin needs. Optiks, the leader in image quality test equipment, is pleased t ffer this cmpact, efficient, easy-t-use quality cntrl tl. LensCheck with patented VideMTF image analysis sftware, features real-time MTF testing and analysis that allw manufacturers t qualify incming prducts quickly and reliably, thereby minimizing the risks f sub-standard cmplete assemblies. Features: LensCheck prducts feature patented OpTest 7 Sftware and VideMTF technlgy Patented VideMTF technlgy enables real time MTF measurements Flexible platfrm allws a wide range f measurements (e.g. MTF, EFL, distrtin) Industry leading measurement - accuracy and repeatability Cnfigurable autmated measurement rutines Easily switch between wavebands (VIS/NIR, SWIR, r LWIR) High-reslutin USB mtrized stages Integrated glass scale encders 50mm clear aperture reflective cllimatr Integrated 8-psitin target and filter wheel Self-centering lens hlder 12-bit real-time vide 13

14 Refractive Cllimatr Surce Mdule Image Analyzer Image Analyzer Munt Mtrized Lens Platfrm Measurements VIS LWIR 355mm EFL achrmat 360mm EFL 50mm clear aperture 50mm clear aperture Fiber-ptic light surce: nm Bradband Infrared ( nm als available) Emitter: Integrated 8-psitin manual target micrns and filter wheels 12-psitin highspeed Target Set: 4 pinhles, USAF target, mtrized alignment crsshair target wheel Filter Set: 546nm bandpass, RGB Target Set: slits, set, phtpic, and infrared cutff pinhles, alignment target 8 12 micrn bandpass filter Firewire camera with Sny EXview Uncled HAD CCD Micrblmeter Spectral sensitivity nm 320 x 240 pixel array 12-bit vide utput Spectral sensitivity 7.5 Calibrated 20X 0.40NA achrmatic 15 micrns DIN bjective Calibrated 7.5X 0.70NA Relay Lens Mtrized Z-axis 25mm travel 0.1micrn reslutin Mtrized X-axis 25mm travel with 0.05 micrn reslutin Manual Y-axis 12.5mm travel +/- 100 degree ff-axis rtatin reslutin glass scale encder 0.5m ptical rail Integrated self-centering lens munt MTF n/ff axis MTF n/ff axis Thrugh-Fcus MTF n/ff axis Thrugh-Fcus MTF EFL n/ff axis Astigmatism EFL Field Curvature Astigmatism Distrtin Field Curvature Chief Ray Angle Distrtin Encircled/Ensquared Energy Transmissin* Encircled/Ensquared Relative illuminatin* Energy Stray Light* Line f Sight* Axial Clr Lateral Clr Line f Sight* *Requires accessry 14

15 Get Started with Optiks Optiks ffers a full-line f standard prducts fr testing ptical, imager and camera systems that are apprpriate fr any industry and will design a custm prduct fr yur specific applicatin. Take a lk at ur prducts n cntact us r yur internatinal sales representative t help yu chse the right slutin fr yur testing needs. Optiks Crpratin 107 Audubn Rad, Bldg. 3 Wakefield, MA Phne: sales@ptiks.cm Web: 15