A 4 A 3 A 2 ROW DECODER 64K x 16 RAM Array I/O 1 I/O X 2048 I/O 9 I/O 16

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1 021 CY7C1021 Features High speed t AA = 12 ns CMOS for optimum speed/power Low active power 1320 mw (max.) Automatic power-down when deselected Independent Control of Upper and Lower bits Available in 44-pin TSOP II and 400-mil SOJ Functional Description The CY7C1021 is a high-performance CMOS static RAM organized as 65,536 words by 16 bits. This device has an automatic power-down feature that significantly reduces power consumption when deselected. Writing to the device is accomplished by taking Chip Enable () and Write Enable () inputs LOW. If Byte Low Enable 64K x 16 Static RAM (BLE) is LOW, then data from I/O pins (I/O 1 through I/O 8 ), is written into the location specified on the address pins (A 0 through A 15 ). If Byte High Enable (BHE) is LOW, then data from I/O pins (I/O 9 through I/O 16 ) is written into the location specified on the address pins (A 0 through A 15 ). Reading from the device is accomplished by taking Chip Enable () and Output Enable (OE) LOW while forcing the write enable () HIGH. If Byte Low Enable (BLE) is LOW, then data from the memory location specified by the address pins will appear on I/O 1 to I/O 8. If Byte High Enable (BHE) is LOW, then data from memory will appear on I/O 9 to I/O 16. See the truth table at the back of this data sheet for a complete description of read and write modes. The input/output pins (I/O 1 through I/O 16 ) are placed in a high-impedance state when the device is deselected ( HIGH), the outputs are disabled (OE HIGH), the BHE and BLE are disabled (BHE, BLE HIGH), or during a write operation ( LOW, and LOW). The CY7C1021 is available in standard 44-pin TSOP Type II and 400-mil-wide SOJ packages. Logic Block Diagram DATA IN DRIVERS Pin Configuration SOJ / TSOP II Top View A 7 A 6 A 5 A 4 A 3 A 2 ROW DECODER 64K x 16 RAM Array I/O 1 I/O X 2048 I/O 9 I/O 16 A 1 A 0 COLUMN DECODER A 8 A 9 A 10 A 11 A 12 A 13 A 14 A 15 SENSE AMPS BHE OE BLE A 4 A 3 A 2 A 1 A 0 I/O 1 I/O 2 I/O 3 I/O 4 V CC V SS I/O 5 I/O 6 I/O 7 I/O 8 A 15 A 14 A 13 A 12 NC A 5 A 6 A 7 OE BHE BLE I/O 16 I/O 15 I/O 14 I/O 13 V SS V CC I/O 12 I/O 11 I/O 10 I/O 9 NC A 8 A 9 A 10 A 11 NC Selection Guide 7C C C C Maximum Access Time (ns) Maximum Operating Current (ma) Commercial Maximum CMOS Standby Current (ma) Commercial L Shaded areas contain preliminary information. Cypress Semiconductor Corporation 3901 North First Street San Jose CA Document #: Rev. ** Revised August 24, 2001

2 Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature C to +150 C Ambient Temperature with Power Applied C to +125 C Supply Voltage on V CC to Relative GND [1] V to +7.0V DC Voltage Applied to Outputs in High Z State [1] V to V CC +0.5V DC Input Voltage [1] V to V CC +0.5V Current into Outputs (LOW) ma Static Discharge Voltage... >2001V (per MIL-STD-883, Method 3015) Latch-Up Current... >200 ma Operating Range Ambient Range Temperature [2] V CC Commercial 0 C to +70 C 5V ± 10% Industrial 40 C to +85 C 5V ± 10% Electrical Characteristics Over the Operating Range Parameter Description V OH Output HIGH Voltage V CC = Min., I OH = 4.0 ma Test Conditions 7C C C C Min. Max. Min. Max. Min. Max. Min. Max V V OL Output LOW Voltage V CC = Min., I OL = 8.0 ma V V IH Input HIGH Voltage V V IL Input LOW Voltage [1] V I IX Input Load Current GND < V I < V CC µa I OZ Output Leakage GND < V I < V CC, µa Current Output Disabled I OS I CC I SB1 I SB2 Output Short Circuit Current [3] V CC Operating Supply Current Automatic Power-Down Current TTL Inputs Automatic Power-Down Current CMOS Inputs Shaded areas contain preliminary information. V CC = Max., V OUT = GND V CC = Max., I OUT = 0 ma, f = f MAX = 1/t RC Max. V CC, > V IH V IN > V IH or V IN < V IL, f = f MAX Max. V CC, > V CC 0.3V, V IN > V CC 0.3V, or V IN < 0.3V, f=0 Unit ma ma ma ma L ma Capacitance [4] Parameter Description Test Conditions Max. Unit C IN Input Capacitance T A = 25 C, f = 1 MHz, 8 pf C OUT Output Capacitance V CC = 5.0V 8 pf Notes: 1. V IL (min.) = 2.0V for pulse durations of less than 20 ns. 2. T A is the case temperature. 3. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds. 4. Tested initially and after any design or process changes that may affect these parameters. Document #: Rev. ** Page 2 of 9

3 AC Test Loads and Waveforms R 481Ω 5V OUTPUT 30 pf INCLUDING JIG AND SCOPE (a) Equivalent to: THÉVENIN EQUIVALENT R 481Ω 5V OUTPUT R2 255Ω 5 pf INCLUDING JIG AND SCOPE (b) OUTPUT V 30 pf R2 255Ω ALL INPUT PULSES 3.0V GND 90% 10% 90% 10% < 3 ns < 3 ns Switching Characteristics [5] Over the Operating Range 7C C C C Parameter Description Min. Max. Min. Max. Min. Max. Min. Max. Unit READ CYCLE t RC Read Cycle Time ns t AA Address to Data Valid ns t OHA Data Hold from Address Change ns t A LOW to Data Valid ns t DOE OE LOW to Data Valid ns t LZOE OE LOW to Low Z [6] ns t HZOE OE HIGH to High Z [6, 7] ns t LZ LOW to Low Z [6] ns t HZ HIGH to High Z [6, 7] ns t PU LOW to Power-Up ns t PD HIGH to Power-Down ns t DBE Byte Enable to Data Valid ns t LZBE Byte Enable to Low Z ns t HZBE Byte Disable to High Z ns WRITE CYCLE [8] t WC Write Cycle Time ns t S LOW to Write End ns t AW Address Set-Up to Write End ns t HA Address Hold from Write End ns t SA Address Set-Up to Write Start ns t P Pulse Width ns t SD Data Set-Up to Write End ns t HD Data Hold from Write End ns t LZ HIGH to Low Z [6] ns t HZ LOW to High Z [6, 7] ns t BW Byte Enable to End of Write ns Shaded areas contain preliminary information. Notes: 5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I OL /I OH and 30-pF load capacitance. 6. At any given temperature and voltage condition, t HZ is less than t LZ, t HZOE is less than t LZOE, and t HZ is less than t LZ for any given device. 7. t HZOE, t HZBE, t HZ, and t HZ are specified with a load capacitance of 5 pf as in part (b) of AC Test Loads. Transition is measured ±500 mv from steady-state voltage. 8. The internal write time of the memory is defined by the overlap of LOW, LOW and BHE / BLE LOW., and BHE / BLE must be LOW to initiate a write, and the transition of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write. Document #: Rev. ** Page 3 of 9

4 Switching Waveforms [9, 10] Read Cycle No. 1 t RC t OHA t AA DATA OUT PREVIOUS DATA VALID DATA VALID [10, 11] Read Cycle No. 2 (OE Controlled) t RC t A OE BHE, BLE t DOE t LZOE t HZOE t DBE t HZ DATA OUT t LZBE HIGH IMPEDAN DATA VALID t HZBE HIGH IMPEDAN V CC SUPPLY CURRENT t LZ t PU 50% t PD 50% IICC IISB Notes: 9. Device is continuously selected. OE,, BHE and/or BHE = V IL. 10. is HIGH for read cycle. 11. Address valid prior to or coincident with transition LOW. Document #: Rev. ** Page 4 of 9

5 Switching Waveforms (continued) [12, 13] Write Cycle No. 1 ( Controlled) t WC t SA t S t AW t HA t P tbw BHE, BLE t SD t HD DATA I/O Write Cycle No. 2 (BLE or BHE Controlled) t WC BHE,BLE t SA t BW t AW t HA t P t S t SD t HD DATA I/O Notes: 12. Data I/O is high impedance if OE or BHE and/or BLE= V IH. 13. If goes HIGH simultaneously with going HIGH, the output remains in a high-impedance state. Document #: Rev. ** Page 5 of 9

6 Switching Waveforms (continued) Write Cycle No.3 ( Controlled, LOW) t WC t S t SA t AW t P t HA t BW BHE, BLE t HZ t SD t HD DATA I/O t LZ Truth Table OE BLE BHE I/O 1 I/O 8 I/O 9 I/O 16 Mode Power H X X X X High Z High Z Power-Down Standby (I SB ) L L H L L Data Out Data Out Read - All bits Active (I CC ) L H Data Out High Z Read - Lower bits only Active (I CC ) H L High Z Data Out Read - Upper bits only Active (I CC ) L X L L L Data In Data In Write - All bits Active (I CC ) L H Data In High Z Write - Lower bits only Active (I CC ) H L High Z Data In Write - Upper bits only Active (I CC ) L H H X X High Z High Z Selected, Outputs Disabled Active (I CC ) L X X H H High Z High Z Selected, Outputs Disabled Active (I CC ) Document #: Rev. ** Page 6 of 9

7 Ordering Information Speed (ns) Ordering Code Package Name Package Type Operating Range 10 CY7C VC V34 44-Lead (400-Mil) Molded SOJ Commercial CY7C ZC Z44 44-Lead TSOP Type II Commercial CY7C1021L-10ZC Z44 44-Lead TSOP Type II Commercial 12 CY7C VC V34 44-Lead (400-Mil) Molded SOJ Commercial CY7C VI V34 44-Lead (400-Mil) Molded SOJ Industrial CY7C ZC Z44 44-Lead TSOP Type II Commercial 15 CY7C VC V34 44-Lead (400-Mil) Molded SOJ Commercial CY7C VI V34 44-Lead (400-Mil) Molded SOJ Industrial CY7C ZC Z44 44-Lead TSOP Type II Commercial CY7C ZI Z44 44-Lead TSOP Type II Industrial CY7C1021L-15ZC Z44 44-Lead TSOP Type II Commercial 20 CY7C VC V34 44-Lead (400-Mil) Molded SOJ Commercial CY7C ZC Z44 44-Lead TSOP Type II Commercial Shaded areas contain preliminary information. Package Diagrams 44-Lead (400-Mil) Molded SOJ V B Document #: Rev. ** Page 7 of 9

8 Package Diagrams (continued) 44-Pin TSOP II Z A Document #: Rev. ** Page 8 of 9 Cypress Semiconductor Corporation, The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.

9 Document Title: CY7C K x 16 Static RAM Document Number: Issue Orig. of REV. ECN NO. Date Change Description of Change ** /10/01 SZV Change from Spec number: to Document #: Rev. ** Page 9 of 9

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