DECODER I/O DATA CIRCUIT CONTROL CIRCUIT

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Edith Perkins
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1 512K x 8 HIGH-SPEED CMOS STATIC RAM APRIL 2005 FEATURES High-speed access times: 10, 12 ns High-performance, low-power CMOS process Multiple center power and ground pins for greater noise immunity Easy memory expansion with and options power-down Fully static operation: no clock or refresh required TTL compatible inputs and outputs Single 3.3V power supply Packages available: 36-pin 400-mil SOJ 36-pin minibga 44-pin TSOP (Type II) Lead-free available DESCRIPTION The IS61LV5128AL is a very high-speed, low power, 524,288-word by 8-bit CMOS static RAM. The IS61LV5128AL is fabricated using 's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields higher performance and low power consumption devices. When is HIGH (deselected), the device assumes a standby mode at which the power dissipation can be reduced down to 250 µw (typical) with CMOS input levels. The IS61LV5128AL operates from a single 3.3V power supply and all inputs are TTL-compatible. The IS61LV5128AL is available in 36-pin 400-mil SOJ, 36- pin mini BGA, and 44-pin TSOP (Type II) packages. FUTIONAL BLOCK DIAGRAM A0-A18 DECODER 512K X 8 MEMORY ARRAY I/O0-I/O7 I/O DATA CIRCUIT COLUMN I/O CONTROL CIRCUIT Copyright 2005 Integrated Silicon Solution, Inc. All rights reserved. reserves the right to make changes to this specification and its products at any time without notice. assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc

2 PIN CONFIGURATION 36 mini BGA 44-Pin TSOP (Type II) A B C D E F G H A0 A1 A3 A6 A8 I/O4 A2 A4 A7 I/O0 I/O5 A5 I/O1 I/O6 A18 A17 I/O2 I/O7 A16 A15 I/O3 A9 A10 A11 A12 A13 A14 A0 A1 A2 A3 A4 I/O0 I/O1 I/O2 I/O3 A5 A6 A7 A8 A A18 A17 A16 A15 I/O7 I/O6 I/O5 I/O4 A14 A13 A12 A11 A10 PIN DESCRIPTIONS 36-Pin SOJ A0-A18 I/O0-I/O7 TRUTH TABLE Address Inputs Chip Enable Input Output Enable Input Write Enable Input Bidirectional Ports Power Ground No Connection Mode I/O Operation Current Not Selected X H X High-Z ISB1, ISB2 (Power-down) A0 A1 A2 A3 A4 I/O0 I/O1 I/O2 I/O3 A5 A6 A7 A8 A A18 A17 A16 A15 I/O7 I/O6 I/O5 I/O4 A14 A13 A12 A11 A10 Output Disabled H L H High-Z ICC Read H L L DOUT ICC Write L L X DIN ICC 2 Integrated Silicon Solution, Inc

3 ABSOLUTE MAXIMUM RATINGS (1) Symbol Parameter Value Unit VTERM Terminal Voltage with Respect to 0.5 to V TSTG Storage Temperature 65 to +150 C PT Power Dissipation 1.0 W 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. OPERATING RANGE Range Ambient Temperature 10ns 12ns Commercial 0 C to +70 C 3.3V +10%, -5% 3.3V +10% Industrial -40 C to +85 C 3.3V +10%, -5% 3.3V +10% CAPACITAE (1,2) Symbol Parameter Conditions Max. Unit CIN Input Capacitance VIN = 0V 6 pf CI/O Input/Output Capacitance VOUT = 0V 8 pf 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: TA = 25 C, f = 1 MHz, = 3.3V. Integrated Silicon Solution, Inc

4 DC ELECTRICAL CHARACTERISTICS (Over Operating Range) Symbol Parameter Test Conditions Min. Max. Unit VOH Output HIGH Voltage = Min., IOH = 4.0 ma 2.4 V VOL Output LOW Voltage = Min., IOL = 8.0 ma 0.4 V VIH Input HIGH Voltage V VIL Input LOW Voltage (1) V ILI Input Leakage VIN Com. 2 2 µa Ind. 5 5 ILO Output Leakage VOUT, Outputs Disabled Com. 2 2 µa Ind. 5 5 Note: 1. VIL = 3.0V for pulse width less than 10 ns. POR SUPPLY CHARACTERISTICS (1) (Over Operating Range) Symbol Parameter Test Conditions Min. Max. Min. Max. Unit ICC Dynamic Operating = Max., Com ma Supply Current IOUT = 0 ma, f = fmax Ind ISB TTL Standby Current = Max., Com ma (TTL Inputs) VIN = VIH or VIL Ind VIH, f = fmax. ISB1 TTL Standby Current = Max., Com ma (TTL Inputs) VIN = VIH or VIL Ind VIH, f = 0 ISB2 CMOS Standby = Max., Com ma Current (CMOS Inputs) 0.2V, Ind VIN 0.2V, or VIN 0.2V, f = 0 Note: 1. At f = fmax, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. 4 Integrated Silicon Solution, Inc

5 READ CYCLE SWITCHING CHARACTERISTICS (1) (Over Operating Range) Symbol Parameter Min. Max. Min. Max. Unit trc Read Cycle Time ns taa Address Access Time ns toha Output Hold Time 2 2 ns ta Access Time ns td Access Time 4 5 ns thz (2) to High-Z Output 4 5 ns tlz (2) to Low-Z Output 0 0 ns thz (2 to High-Z Output ns tlz (2) to Low-Z Output 3 3 ns tpu Power Up Time 0 0 ns tpd Power Down Time ns 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to 3.0V and output loading specified in Figure Tested with the load in Figure 2. Transition is measured ±500 mv from steady-state voltage. AC TEST CONDITIONS Parameter Unit Input Pulse Level 0V to 3.0V Input Rise and Fall Times 3 ns Input and Output Timing 1.5V and Reference Levels Output Load See Figures 1 and 2 AC TEST LOADS 3.3V 319 Ω 3.3V 319 Ω OUTPUT OUTPUT 30 pf Including jig and scope 353 Ω 5 pf Including jig and scope 353 Ω Figure 1 Figure 2 Integrated Silicon Solution, Inc

6 AC WAVEFORMS READ CYCLE NO. 1 (1,2) (Address Controlled) ( = = VIL) ADDRESS t RC t OHA t AA t OHA DOUT PREVIOUS DATA VALID DATA VALID READ1.eps READ CYCLE NO. 2 (1,3) ( and Controlled) ADDRESS t RC t AA t OHA t D t HZ t LZ t LZ t A t HZ DOUT HIGH-Z DATA VALID _RD2.eps 1. is HIGH for a Read Cycle. 2. The device is continuously selected., = VIL. 3. Address is valid prior to or coincident with LOW transitions. 6 Integrated Silicon Solution, Inc

7 WRITE CYCLE SWITCHING CHARACTERISTICS (1,3) (Over Operating Range) Symbol Parameter Min. Max. Min. Max. Unit twc Write Cycle Time ns ts to Write End 8 8 ns taw Address Setup Time 8 8 ns to Write End tha Address Hold from Write End 0 0 ns tsa Address Setup Time 0 0 ns tp1 Pulse Width 8 8 ns tp2 Pulse Width ( = LOW) ns tsd Data Setup to Write End 6 6 ns thd Data Hold from Write End 0 0 ns thz (2) LOW to High-Z Output 5 6 ns tlz (2) HIGH to Low-Z Output 2 2 ns 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to 3.0V and output loading specified in Figure Tested with the load in Figure 2. Transition is measured ±500 mv from steady-state voltage. Not 100% tested. 3. The internal write time is defined by the overlap of LOW and LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the write. AC WAVEFORMS WRITE CYCLE NO. 1 (1,2) ( Controlled, = HIGH or LOW) t WC ADDRESS VALID ADDRESS t SA t S t HA DOUT DATA UNDEFINED t AW t P1 t P2 t HZ HIGH-Z t LZ t SD t HD DIN DATAIN VALID _WR1.eps Integrated Silicon Solution, Inc

8 WRITE CYCLE NO. 2 (1,2) ( Controlled: is HIGH During Write Cycle) t WC ADDRESS VALID ADDRESS t HA LOW t AW t P1 t SA t HZ t LZ DOUT DATA UNDEFINED HIGH-Z t SD t HD DIN DATAIN VALID _WR2.eps 1. The internal write time is defined by the overlap of LOW and LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the Write. 2. I/O will assume the High-Z state if > VIH. WRITE CYCLE NO. 3 ( Controlled: is LOW During Write Cycle) t WC ADDRESS VALID ADDRESS LOW t HA LOW t AW t P2 t SA t HZ t LZ DOUT DATA UNDEFINED HIGH-Z t SD t HD DIN DATAIN VALID _WR3.eps 8 Integrated Silicon Solution, Inc

9 ORDERING INFORMATION Commercial Range: 0 C to +70 C Speed (ns) Order Part No. Package 10 IS61LV5128AL-10K 400-mil Plastic SOJ 10 IS61LV5128AL-10T TSOP (Type II) 12 IS61LV5128AL-12K 400-mil Plastic SOJ 12 IS61LV5128AL-12T TSOP (Type II) Industrial Range: 40 C to +85 C Speed (ns) Order Part No. Package 10 IS61LV5128AL-10KI 400-mil Plastic SOJ 10 IS61LV5128AL-10KLI 400-mil Plastic SOJ, Lead-free 10 IS61LV5128AL-10TI TSOP (Type II) 10 IS61LV5128AL-10TLI TSOP (Type II), Lead-free 10 IS61LV5128AL-10BI mini BGA (8mmx10mm) 10 IS61LV5128AL-10BLI mini BGA (8mmx10mm), Lead-free 12 IS61LV5128AL-12TI TSOP (Type II) Integrated Silicon Solution, Inc

10 PACKAGING INFORMATION Mini Ball Grid Array Package Code: B (36-pin) Top View Bottom View φ b (36x) D A B C D E F G H D1 e A B C D E F G H e E E1 1. Controlling dimensions are in millimeters. A2 A SEATING PLANE A1 mbga - 6mm x 8mm mbga - 8mm x 10mm MILLIMETERS IHES MILLIMETER IHES Sym. Min. Typ. Max. Min. Typ. Max. N0. Leads A A A D D1 5.25BSC 0.207BSC E E1 3.75BSC 0.148BSC e 0.75BSC 0.030BSC b Sym. Min. Typ. Max. Min. Typ. Max. N0. Leads A A A D D1 5.25BSC.207BSC E E1 3.75BSC 0.148BSC e 0.75BSC 0.030BSC b Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. reserves the right to make changes to this specification and its products at any time without notice. assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc Rev. E 01/15/03

11 PACKAGING INFORMATION 400-mil Plastic SOJ Package Code: K N N/2+1 E1 E 1. Controlling dimension: millimeters. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Reference document: JEDEC MS D N/2 SEATING PLANE b A C A2 e B A1 E2 Millimeters Inches Millimeters Inches Millimeters Inches Symbol Min Max Min Max Min Max Min Max Min Max Min Max No. Leads (N) A A A B b C D E E E BSC BSC 9.40 BSC BSC 9.40 BSC BSC e 1.27 BSC BSC 1.27 BSC BSC 1.27 BSC BSC Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. reserves the right to make changes to this specification and its products at any time without notice. assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc Rev. F 10/29/03

12 PACKAGING INFORMATION Millimeters Inches Millimeters Inches Millimeters Inches Symbol Min Max Min Max Min Max Min Max Min Max Min Max No. Leads (N) A A A B b C D E E E BSC BSC 9.40 BSC BSC 9.40 BSC BSC e 1.27 BSC BSC 1.27 BSC BSC 1.27 BSC BSC Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. reserves the right to make changes to this specification and its products at any time without notice. assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. 2 Integrated Silicon Solution, Inc Rev. F 10/29/03

13 PACKAGING INFORMATION Plastic TSOP Package Code: T (Type II) N N/2+1 E1 E 1. Controlling dimension: millimieters, unless otherwise specified. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Formed leads shall be planar with respect to one another within inches at the seating plane. 1 N/2 D. ZD A SEATING PLANE e b A1 L α C Plastic TSOP (T - Type II) Millimeters Inches Millimeters Inches Millimeters Inches Symbol Min Max Min Max Min Max Min Max Min Max Min Max Ref. Std. No. Leads (N) A A b C D E E e 1.27 BSC BSC 0.80 BSC BSC 0.80 BSC BSC L ZD 0.95 REF REF 0.81 REF REF 0.88 REF REF α Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. reserves the right to make changes to this specification and its products at any time without notice. assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc Rev. F 06/18/03

DECODER I/O DATA CIRCUIT CONTROL CIRCUIT

DECODER I/O DATA CIRCUIT CONTROL CIRCUIT 32K x 8 LOW VOLTAGE CMOS STATIC RAM June 2005 FEATURES High-speed access times: -- 8, 10, 12, 15 ns Automatic power-down when chip is deselected CMOS low power operation -- 345 mw (max.) operating -- 7