HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR

Transcription

1 2N4209CA & 2N4209CB Hermetic Ceramic Surface Mount Package (SOT23 Compatible) Silicon Planar Epitaxial PNP Transistor High Speed low Saturation Switching Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (T A unless otherwise stated) CBO Collector Base oltage -5 CEO Collector Emitter oltage -5 EBO Emitter Base oltage -4.5 I C Continuous Collector Current -50mA P D Total Power Dissipation at T A 360mW Derate Above 25 C 2.05mW/ C T J Junction Temperature Range -65 to +200 C T stg Storage Temperature Range -65 to +200 C THERMAL PROPERTIES Symbol Parameter Max Units R θja Thermal Resistance Junction to Ambient 250 C/W R θjsp(in) Thermal Resistance, Junction To Solder Pads T SP 60 C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. sales@semelab-tt.com Website: Page of 5

2 2N4209CA & 2N4209CB ELECTRICAL CHARACTERISTICS (T A unless otherwise stated) Symbols Parameters Test Conditions Min Typ Max Units () (BR)CEO Collector-Emitter Breakdown oltage I C = -3mA -5 (BR)CES Collector-Emitter Breakdown oltage I C = -00µA -5 I CES Collector-Emitter Cut-Off Current CE = -0-0 na T A -5.0 µa I EBO Emitter Cut-Off Current EB = µa EB = na I CBO Collector Cut-Off Current CB = -5 I E = 0-0 µa I C = -.0mA CE = I C = -0mA CE = h FE () Forward-current transfer ratio I C = -0mA CE = T A = -55 C 25 I C = -50mA CE = I C = -.0mA I B = -0.mA CE(sat) () Collector-Emitter Saturation oltage I C = -0mA I B = -.0mA I C = -50mA I B = -5.0mA I C = -.0mA I B = -0.mA BE(sat) Base-Emitter Saturation oltage I C = -0mA I B = -.0mA I C = -50mA I B = -5.0mA -.50 DYNAMIC CHARACTERISTICS h fe Small signal forward current transfer ratio I C = -0mA CE = -0 f = 00MHz C obo Output Capacitance f =.0MHz CB = -5.0 I E = C ibo Input Capacitance f =.0MHz BE = 0.5 I C = pf t on Turn-On Time CC = -3 I C = -0mA 5 t off Turn-Off Time 20 t d Turn-On Delay Time I B = -.0mA 0 ns t r Rise Time 5 Notes () Pulse Width < 380µs, Duty Cycle <2% sales@semelab-tt.com Website: Page 2 of 5

3 2N4209CA & 2N4209CB oltage () "ON" oltage T A I C Collector Current (ma) CESAT BESAT h FE, DC Current Gain CE = DC Current Gain I C, Collector Current (ma) 25 C 75 C 00 C 50 C 200 C -55 C Capacitance (pf) Capacitance 0 T A R, Reverse oltage () Forward Current Transfer Ratio 00 0 Forward Current Transfer Ratio CE = 0 T A 0 00 I C, Collector Current (ma) CIBO COBO hfe sales@semelab-tt.com Website: Page 3 of 5

4 2N4209CA & 2N4209CB MECHANICAL DATA Dimensions in mm (Inches) 0.5 ± 0.0 (0.02 ± 0.004) R0.3 (0.02).02 ± 0.0 (0.04 ± 0.004) 2.54 ± 0.3 (0.0 ± 0.005) ± 0.0 (0.075 ± 0.004) 3.05 ± 0.3 (0.2 ± 0.005) R0.56 (0.022) ± 0.5 (0.03 ± 0.006) See Package ariant Table 0.3 (0.02) rad..40 (0.055) max. LCC Underside iew PACKAGE ARIANT TABLE ariant Pad Pad 2 Pad 3 Pad 4 CA Base Emitter Collector No Pad (3-Pins Only) CB Base Emitter Collector Lid Contact * * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link on the Semelab web site. Package variant to be specified at order. sales@semelab-tt.com Website: Page 4 of 5

5 SCREENING OPTIONS Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Semelabs QR26 and QR27 processing specifications (JQRS), in conjunction with the companies ISO 900:2000 approval present a viable alternative to the American MIL- PRF-9500 space level processing. QR27 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF groups A (table ), B (table Ia), C (table II) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR26 (Space Level Screening) is based on the screening requirements of MIL-PRF-9500 (table I) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR26 with conformance testing to Q27 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap isual Inspection, Buy-Off isit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be marked with approximately 8 characters on two lines and can include the cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: ORDERING INFORMATION Part numbers are built up from Type, Package ariant, and screening level. The part numbers are extended to include the additional options as shown below. Type See Electrical Characteristics Table Package ariant See Mechanical Data Screening Level See Screening Options (ESA / JQRS) Additional Options: Customer Pre-Cap isual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test MIL-PRF-9500 (QR27) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples ESA/ESCC Lot alidation Testing (subgroup ) charge LT destructive samples (environmental) LT destructive samples (mechanical) Lot alidation Testing (subgroup 2) charge LT2 endurance samples (electrical) Lot alidation Testing (subgroup 3) charge LT3 destructive samples (mechanical).cp.cb.da.ss.sem.xray.rad.grpb.gbdm (2 pieces).grpc.gcde (2 pieces).gcdm (6 pieces).lt.lde (5 pieces).ldm (5 pieces).lt2.l2d (5 pieces).lt3.l3d (5 pieces) Additional Option Notes: ) All Additional Options are chargeable and must be specified at order stage. 2) When Group B,C or LT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 2N4209CB part with package variant B, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N4209CB-JQRS (Include quantity for flight parts) 2N4209CB.GRPC (chargeable conformance option) 2N4209CB.GCDE (charge for destructive parts) 2N4209CB.GCDM (charge for destructive parts) 2N4209CB.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. sales@semelab-tt.com Website: Page 5 of 5