NanoWizard 3 NanoScience AFM

Transcription

1 Introducing the HyperDrive Revolution NanoWizard 3 NanoScience AFM Total Flexibility by Design Optimum imaging in air and liquid for single molecules, polymers and surface-science HyperDrive provides SuperResolution of soft samples in liquids Expanded flexibility and modularity with the widest range of operation modes and accessories for applications ranging from electrochemistry to organic electronics New Vortis digital controller with built-in flexibility Large sample size compatibility by tip-scanning design State-of-the-art single molecule force measurements and nanoindentation experiments with ExperimentPlanner and RampDesigner

2 JPK dedicated to NanoSciences Launched in 2002, the NanoWizard represented the beginning of a family of AFM systems that introduced multiple advances in imaging and surface characterization in the fields of Life Sciences and Nano Sciences. The focus in the design of the NanoWizard 3 NanoScience version is maximum applications versatility in combination with superior AFM performance and usability. Engineered & made in Germany JPK develop, engineer and manufacture instrumentation in Germany to the world-recognised standards of German precision engineering, quality and functionality. The company has a simple philosophy. As CTO, Torsten Jähnke, says - We have always designed our instrumentation after first listening to users and their challenges. Delivering successful answers for us means no compromises between usability and handling on one side and highest performance on the other. Everywhere where AFM and optics, AFM in liquid and high quality AFM are needed, JPK is the right partner. We do not follow every AFM application but what we do, we do with passion and perfection. Building relationships with the SPM community and collaborating with users worldwide has enabled JPK to develop flexible systems which are upgradeable and therefore providing a guaranteed safe investment for users now and for their future research. A team of experienced scientists and developers backs its instrumentation to the full with field service and support from installation through training and upgrading - worldwide. The milestones of development 1999 was founded Launch of CellHesion module: for expansion of the NanoWizard in the field of cell mechanics Launch of NanoWizard II: next generation BioAFM with our proprietary DirectOverlay feature which combines AFM and optical images 2007 Launch of the NanoTracker : first force sensing optical tweezers; Launch of the CellHesion 200: first dedicated cell mechanics system Launch of the NanoWizard : the first dedicated BioAFM in the world Launch of TAO module: for tip-enhanced NanoOptics Launch of BioMAT Workstation: unique ue coupling of AFM with upright microscopy Launch of the ForceRobot 300: worlds first dedicated Automated Force Spectroscope cope NanoWizard 3 NanoScience AFM setup with TopViewOptics 2010 NanoWizard 3 BioScience now with HyperDrive for SuperResolution in liquid 2011 NanoWizard 3 NanoScience Total flexibility by design

3 HyperDrive SuperResolution AFM imaging in liquids AFM imaging of soft samples has always provided much discussion. Which cantilever is correct to use? Should it be a DC or an AC mode? Does the sample get damaged? Are the measurements correct? Remove these questions with HyperDrive, a soft sample imaging technique in liquid which provides subnanometer lateral resolution with minimal tip-sample interactions. HyperDrive HyperDrive is available with the NanoWizard 3 AFM head and the Vortis high bandwidth, low noise electronic control system. These electronics are extremely stable regarding drift and have the ability to detect the smallest cantilever deflections below a typical noise level of 2 pm RMS. A new designed cantilever excitation is the key for precise control of the probe oscillation. The NanoWizard 3 is the only AFM system on the market which is designed for optimal and safe use in liquid and comes with a vapour barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecules and polymers to electrochemistry. Cross section of the marked region: the height average of the molecule is ~2nm, which is very close to the native size. This is made possible with HyperDrive mode which has the lowest tip sample interactions. Height (nm) Offset (nm) HyperDrive is a sub-nm SuperResolution AFM imaging technique in liquid has extremely low tip-sample interaction is not damaging the sample doesn t need a special cantilever is unique to the NanoWizard 3 AFM DNA origami imaged with HyperDrive in buffer solution in closed loop. Scan size: 370 nm 155 nm, Z-range: 2.9 nm Sample courtesy of Institute for Bioelectronics, Physics Department, Technical University of Munich, and G. Acuna and P. Tinnefeld from NanoBioSciences, Technical University of Braunschweig. Closed loop image of lambda phage DNA on mica surface scanned in buffer solution (10 mm HEPES, 2 mm NiCl 2 ). The 3D topography image clearly shows the arrangement of the single DNA molecules. Scan size: 1µm 1µm Z-range: 4 nm Topography image of a single DNA strand. (zoomed region). Scan size: 185nm 65nm

4 NanoWizard 3 system design Benchmark in stability and accuracy The robust NanoWizard 3 head is engineered to provide maximum stability and accuracy. The high specification of every component from the scanner to closed loop sensors, from electronics to optics is the result of continuous advancement over the last 10 years. The tip-scanning head equipped with a flexure scanner gives the highest flexibility for a large variety of different samples, even larger ones without limitations on sample weight and geometry. Only a tip-scanning configuration allows the use of micro-pipettes or multiple electrical probes in contact with the sample simultaneous to AFM operation. Top view optical access High bandwidth of 8 MHz Precise stepper motors for intelligent approach and automatic tilt correction Special optical filters avoiding cross-talk IR light source with lowest noise Sample stage for tip and sample positioning The NanoWizard 3 comes with the lowest possible noise level in the cantilever deflection detection system available on the market today. It is the only atomic-resolution AFM to operate successfully 1 Flexure scanner with decoupled axes (xy from z) Flexible sample holder Cantilever holder Lowest closed loop noise in all 3 axes Vapor barrier for safe liquid imaging Bottom view port on an inverted microscope. Improved closed loop control on all three axes, highest resonance frequency in z and no cross-coupling between x, y and z axis delivers a scanner performance previously not available in a commercial AFM. This ensures highest data quality for imaging and force measurements in air and liquid. The new Vortis SPM controller family delivers cutting edge values for noise levels, speed and the highest versatility. The system comes with a huge number of user-accessible analog and digital signal channels via the Signal Access Module (SAM) front panel, multiple fast lockin amplifiers and digital Q-control. The user can choose a variety of feedback control options to drive different setups with tuning forks, STM based systems or one with high frequency cantilevers. The advanced and high bandwidth phase-locked loop (PLL) gives ultimate control over the probe oscillation. Equipped with digital TTL pixel and line clock, the system can be easily synchronized with other instruments such as spectrometers, detectors and potentiostats. 2 3 n z [fm Hz -1/2 ] f [khz] 1 DNA on octadecylamine, 3D topography, scan in closed loop Scan size: 500 nm 500 nm Z-range: 5.2 nm 2 Island growth of pentacene layers on silicon, scan in closed loop Scan size: 2 µm 2 µm Z-range: nm 3 Thermal noise spectral density of a NCHR cantilever (NanoWorld) measured in water. The solid line is a fit including the sensor deflection noise of 22 fm/ Hz.

5 Most flexible setup Highest AFM performance for the largest variety of samples The NanoWizard 3 System is made with maximum flexibility and usability in mind. Compromise in the performance is not acceptable. The result is a true multi-purpose system. Electrical oxidation on a plain silicon substrate. Voltage ramps: V Ramp speed: 3 V/s Writing speed: 250nm/s Circle radius: 5µm Unlimited experimental freedom Hard or soft samples Measurements in gas or liquid environment From atomic resolution to large scans Force measurements Electrical and magnetic characterization Electrochemistry with or without optical microscopy Heating, cooling and humidity control Local thermal experiments by SThM Measurements of mechanical properties such as Young s modulus, adhesion, dissipation Study of optical properties Dynamic processes Scanning Tunneling Microscopy image (STM, current) of arachidic acid molecules on HOPG. Scan size: 25nm 25nm Current range: 0.8 na Bias: 0.3 V Piezoresponse Force Microscopy (PFM) on a periodically poled LiNbO 3 single crystal. The phase image shows the piezo response of the crystal s z-plane in vertical direction (zpfm). Scan size: 66µm 43µm 1 2 Kelvin Probe Microscopy (KPM) on an interdigitated electrode, 21µm scan region. The height image is displayed as 3D topography with the added colour to indicate measured surface potential. The raised electrodes (100nm thick) are interdigitated in pairs, the separation between topography and potential is clearly visible. Magnetic Force Microscopy image (MFM) of a hard drive section. Scan size: 2µm 2µm 3 current [pa] Light ON 100 Light OFF time [s] Conductive AFM topography ( 1 ) and current ( 2 ) images of optically active conductive polymer film on ITO, using the JPK conductive AFM module with environmental control. The conductivity is constant over the film, but highly dependent on incident light. The graph ( 3 ) shows a current trace against time at a typical point, the UV illumination light was switched on and off as marked, giving an increase of the current to around 70pA. Scan size 5µm 5µm, imaged in oxygen-free atmosphere. Sample courtesy of Dr. Yeng Ming Lam and Teddy Salim, School of Materials Science and Engineering, NTU, Singapore.

6 Imaging and force spectroscopy experiments with environmental control The advanced AFM head and stable, low noise control electronics raise the standard of imaging and force spectroscopy measurements with NanoWizard 3. Software design that reduces operator interactions may be important to some users while other prefer full access to instrument parameters. JPK s latest GUI design gives users control to the level they require. Imaging and Force Spectroscopy in controlled environment JPK is the force spectroscopy expert with complete hardware and software solutions to meet individual experimental requirements Powerful and fast batch-processing with comprehensive fitting routines Full range of accessories for environmental control from harsh sample environments (e.g. toluene), heating and cooling to liquid exchange Measurements in controlled atmosphere (e.g. argon or nitrogen) The force RampDesigner can be used to create custom force curves while the whole experiment and environment can be controlled through the ExperimentPlanner interface. This allows convenient and customized force mapping and force ramp/clamp experiments. Advanced algorithms are in place for easy, rapid analysis of large data sets. Melting and dewetting of a thin film of polystyrene on silicon over 40 minutes, using the JPK Heating Cooling Stage (HCS ) to maintain the temperature at 45 C. All images 4µm 6µm scan region, color range 56nm in height. Accessory versatility is important for users to control the experimental environment whether this is for working at different temperatures or being able to perform advanced electrochemistry experiments. NanoWizard 3 comes with a broad range of liquid cells, gas flow solutions and sample heaters/coolers for imaging and force measurements. Closed loop image of DNA at -25 C in inert gas atmosphere performed with the Heating Cooling Module (HCM ). Scan size: 875nm 785nm Z-range: 2.3nm Topography image of nano fibres ( 1 ) and indentation curve ( 2 ) at the marked point. The breaking point is reached after an applied force of 5nN. Scan size: 10µm 10µm, Z-range: 738nm Vertical deflection: Extended (nn) Breaking point Height (nm)

7 The NanoWizard 3 AFM family Optional heads CellHesion 200 CellHesion 200 ForceRobot 300 ForceRobot 300 NanoWizard NanoWizard Head Vortis SPMControl SPMControl Vortis Advanced SPMControl Control electronics options SIGNAL ACCESS MODULE SIGNAL ACCESS MODULE ((((SAM (SAM) SAM)))) SPMControl Vortis SPMControl Software SPM CONTROL & DATA PROCESSING Scripting SPM CONTROL & DATA PROCESSING Manipulation & lithography Direct Overlay Advanced Force Spectroscopy Micro Rheology System options BioMAT TAO Module CellHesion Module TopView Optics PetriDishHeater for BioMAT 2-axes 3-axes Stages Motorized precision stage Life sciences stage Standard stage HCS Heating cooling stage ECCell Electrochemisty cell Temperature control PetriDishHeater BioCell ECCell Electrochemistry cell HCM Heating cooling module HTHS High temperature heating system CoverslipHolder Fluid cells & cantilever holders SmallCell small volume SmallCell Standard CantileverHolder Supercut CantileverHolder Magnetic field CantileverHolder Electrical modes & application modules STM module PiezoResponse module Conductive AFM module KelvinProbe module Electrical tip connection Extras & OEM 8x FluidicsModule Acoustic enclosure Vibration isolation Base frame for active isolation tables Setups and accessories for BioScience applications highlighted with LIGHT BLUE BOXES Typical BioScience applications and research fields: High resolution imaging in air and liquid of single molecules such as proteins, DNA/RNA, carbohydrates, lipids, Live Cell Imaging, bacteria and virus characterization, cellular adhesion and cytomechanics, molecular interactions, receptor-ligand, antibody-antigen, molecular unfolding, molecular recognition, biomaterials, compound and implant characterization, material properties such as adhesion, elasticity, hardness; drug formulation, encapsulation and aging studies and many more Setups and accessories for NanoScience applications highlighted with GRAY BOXES Typical NanoScience applications and research fields: High resolution imaging in air and liquid of single molecules, thin films, nanoparticles or nanowires, surface properties characterization such as adhesion, stiffness, friction, conductivity, charges, hardness; polymer science, single molecule force measurements, smart organic materials, surface properties of conjugated polymers, biosensors, degradable materials, electrochemistry, colloidal probe, surface forces and interface phenomena; and many more For more detailed information about all options see the brochures and product notes or visit

8 Specifications for the NanoWizard 3 NanoScience AFM System specifications Atomic lattice resolution on inverted microscope (< 0.035nm RMS z noise level) Ultra-low noise level of cantilever deflection detection system < 2pm RMS free (0.1Hz - 1kHz) Best closed-loop AFM on the market for reproducible tip positioning and long time position stability Tip-scanning stand alone system, the only choice for simultaneous AFM and laser scanning experiments IR deflection detection light source with low coherence for interference-free measurements NanoWizard 3 can be operated: 1) On top of an inverted research microscope for AFM simultaneously with optical Microscopy Find a measurement spot optically on your sample by fluorescent labeling Combine AFM with advanced optical techniques such as confocal, FCS, FRET, TIRF or optical tweezers Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay software module 2) Stand-alone based Maximum flexibility even if no fluorescence is needed (the sample stage can be mounted on an optical microscope within a minute) Free access to the sample area for micropipettes or electrical connections TopViewOptics optional NanoWizard 3 head Rigid low-noise design and drift-minimized mechanics High detector bandwidth of 8MHz for high speed signal capture Liquid-safe design with integrated vapor barrier, special encapsulated piezo drives and tip-moving design Intelligent and automated approach with user defined parameters for soft landing even with functionalized tips Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast Built-in optical filters for fluorescence without crosstalk Scanner unit Flexure stage scanner design with decoupled, low mass z scanner µm³ scan range for the head in closed-loop mode Position noise level 0.2nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw) Vortis SPMControl electronics State-of-the-art digital controller with lowest noise levels and highest number on signal channels High speed 16 bit AD conversion with 60MHz High speed Lock-in amplifier technology for precise amplitude and phase detection High speed data capture with optional burst mode Modular hybrid analog/digital design with latest FPGA/PPC technology 660MHz / 240MHz) Gigabit Ethernet interface for fast data link Number of data points that can be captured continuously: restricted only by HDD Thermal noise acquisition up to 3.25MHz Optional Signal Access Module (SAM) with analog and digital connectors for maximum experimental freedom SPMControl software Fully automated sensitivity and spring constant calibration using thermal noise method Patented DirectOverlay for picture-in-picture functionality Outline mode for precise selection of a new scan area even in the optical image Improved ForceWatch mode for force spectroscopy and imaging for cantilever-drift free measurements Advanced oscilloscope functionality and online measurement of distances, cross sections etc. True multi-user platform User-programmable software Unlimited pixel resolution for imaging or force curves Comprehensive force measurement with TipSaver JPK ExperimentPlanner for designing a dedicated measurement workflow JPK RampDesigner for custom designed force curves Advanced spectroscopy modes such as various force clamp modes or user-defined ramp design, e.g. for temperature ramps, pulling speed or force feedback Enhanced fast force mapping capabilities Automated filtering of curves without events Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section etc. DataProcessing Image-Viewer for picture-in-picture display and export, including calibrated optical images Powerful batch processing of force curves including WLC, FJC, step-fitting and other analysis Stages Liquid-safe, robust and drift-minimized design for highest stability Motorized precision stage with 20 20mm² travel range with joystick or software control Manual precision stage with 20 20mm² travel range Independent positioning of tip & sample with respect to the optical axis Stages are available for all major inverted optical microscope manufacturers (see below) Sample holders Holders for Petri dishes, coverslips, microscope slides or metal SPM stubs Special holders and liquid cells possible Ø140 18mm 3 free sample volume Optical configurations Fits to inverted microscopes from Zeiss (Axio Observer, AxioVert 200) Olympus (IX line) Nikon (TE 2000, Ti) Leica (DMI line) Fully simultaneous operation with optical phase contrast and DIC, using standard condensers Compatible with commercial confocal microscopes and fluorescence techniques such as TIRF, FRET, FCS, FRAP, FLIM Upgradeable for scatter-type SNOM, Raman, TERS measurements AFM and upright high-na optics combination with the JPK BioMAT workstation (see BioMAT brochure) Large variety of high-end EM-CCD cameras supported TopViewOptics video optics for opaque samples Temperature control options RT C temperature range with 0.1 C precision with the JPK High Temperature Heating Stage (HTHS ) -35 C C temperature range with 0.1 C precision with the JPK Heating Cooling Module (HCM ) (~0 C - ~80 C for experiments in buffer solution) All heaters and heating/cooling solutions are software-controlled Fluid cell options Inert glass standard cantilever holders for experiments in droplets or custom fluid cells JPK s patent-pending BioCell for high-na immersion lenses and high resolution AFM down to the single molecule level allows temperature control between C, perfusion and gas flow for standard cover slips JPK CoverslipHolder offers the same capability as the BioCell for ambient temperature experiments JPK temperature controlled electrochemistry cell ECCell with transmission illuminations JPK PetriDishHeater perfect for living cells accommodates 35mm Petri dishes even with coverslip bottom ambient to 60 C temperature range perfusion and gas flow possible JPK SmallCell small volume version for aqueous solutions Closed fluid cell for minimized volumes (< 60µl) 3 easily accessible sample ports, 2 for buffer exchange and 1 for adding chemical detergents Flexibility integrated Different sample holders, cantilever holders & stages for every application Large choice of add-ons such as temperature controls, liquid cells even for aggressive solvents JPK s ForceWheel handheld accessory for most sensitive experimenteriment control Full experimental control by scripting functionality and access to all signals Options (see accessories data sheet) Sample holders for all kinds of substrates CellHesion module with extra 100µm closed loop z range TAO module with µm² or µm³ closed loop sample scanning stage Vortis Advanced SPMControl station for maximum flexibility Electrical measurement modes Cameras and light sources for video imaging or fluorescence Vibration and acoustic isolation from leading suppliers Standard operating modes Imaging modes (air or liquid) Contact mode with LFM AC modes with Q-control Phase detection Force spectroscopy (air or liquid) Static and dynamic spectroscopy Force clamp & ramp Fast Force Mapping Optional modes HyperDrive Advanced AC modes like FM or PM Higher harmonics imaging MicroRheology KPM, SCM MFM EFM in one-pass Conductive AFM (CAFM) STM Electrical spectroscopy modes Piezo-Response Force Microscopy Electrochemistry with temperature control and optics NanoLithography and NanoManipulation NanoIndentation Scanning Thermal AFM Environmental control DirectOverlay for combined AFM and optics NanoWizard, ForceRobot, CellHesion, BioMat, Vortis, HyperDrive, TAO, ForceWheel, SmallCell, PetriDishHeater, BioCell, HCM, HTHS, RampDesigner, ExperimentalPlanner, TipSaver, Outline, DirectOverlay, TopViewOptics are trademarks or registered trademarks of JPK Instruments AG Visit the JPK web site for more information and sign up for our enewsletter. Web address: NanoWizard 3 AFM on a Olympus IX71 All information and specifications are subject to change without notice. All rights reserved. 2011, JPK Instruments AG JPK Instruments AG Bouchéstraße Berlin, Germany tel.: fax.: