NanoFocus Inc. Next Generation Scanning Probe Technology. Tel : Fax:
|
|
- David Snow
- 6 years ago
- Views:
Transcription
1 NanoFocus Inc. Next Generation Scanning Probe Technology Tel : Fax:
2 Albatross SPM is Multi functional research grade system Flexure scanner and closed-loop scanning Acceptable large samples Easy to add environmental aperture Easy to exchange sample, probe and positioning Liquid operation and temperature control of sample Confocal microscope, raman and PL spectroscopy Powerful nanolithography tools NanoFocus Albatross SPM covers the full range scanning probe microscopy techniques to investigate the surface properties like as topography, electronic, magnetic and optical characteristics from nanoscale to several tens of micron, especially for Bio Technology. The state-of-the-art DSP-based fast digital controller provides not only much easy and flexible operational interface but also sufficient high speed & resolution imaging solution. Also, our system provides very versatile Ethernet-based remote control of the SPM instrument. Advance nanolithography tool supports the very convenient interface as well as various probe-based writing techniques.
3 Hardware System Mechanical Head Type : Laser beam bounce Easy/quick laser alignment(linear translation of laser point and PSPD for all axis). Easy to exchange probe and sample Easy/precise movement of the probe Confocal Microscope Module Inverted optical microscope and optical measurement setup (Nikon TE-2000U inverted optical microscope) Low-noise photon counting module(apd and counter electronic module) 40mW, multi-line(457 nm~ 514 nm) laser Easy fiber alignment/laser focusing system Nano raman & photo luminescence spectroscopy and imaging High resolution CCD for inverted optical microscope imaging Active anti-vibration table Frequency : 0.7Hz ~ 1000Hz Static compliance - vertical : approx.12um/n - horizontal : approx.30~40um/n Load range : 0~150 kg High performance Digital Controller Built-in the most fast digital signal processor in the world market Fast and high resolution imaging are realized by the high performance DSP technology, 16bit AD, 24-bit DA Converter The first SPM running in the internet(remote operation/on wireless communication) Synchronous integrated photon counting electronics
4 Image Gallery 3.0um 0.60um Standard Sample /Noncontact Mode PZT film/topography Au Nanoparticle/Topography (200 nm X 200 nm) 10um 0.20um 1.0um TGS/EFM Mode PZT film/efm Mode (Before Poling) PZT film/efm Mode (After Poling) 1.0um 2.0um LSMO thin film/mfm Mode Hard disk data bits/mfm Mode Vector lithography 2.0um 2.0um Raster lithography/einstein Raster lithography/hahoe Mask Raster lithography/kim Yuna
5 Image Gallery 5.0um TGS/Topography TGS/Topography TGS, Enhanced gray color /Topography 5.8um 5.8um PMN-PT nanowire /Topography(Noncontact mode) PMN-PT nanowire/confocal PMN-PT nanowire /Photo luminescence 1.8um 8.0um 6.0um Au Nano Particle /Confocal(Size = 50 nm) 4GBit DRAM/ Confocal Bovine Serum Albumin Protein Pattern 1.2um 1.0um Shewanella bacterium /Contact mode DNA with atomic step /DFM mode Tobacco Virus/DFM Mode
6 Spectroscopy Tools Spectroscopy tool is very powerful and valuable function to measure the physical characteristics at the specific point. The Albatross gives you various spectroscopy methods such as force vs. distance, current vs. voltage, and polarization vs. electric filed measurement. The closed loop scanner minimizes positioning error due to drift, creep, nonlinearity and hysteresis of the piezoelectric scanner while the spectroscopy is carried out. F-D spectroscopy Measure inter-atomic force, vibration amplitude and phase of the probe with as a function of distance from surface. I-V Spectroscopy Measure current(i-v) and differential conductance (di/dv) between probe and sample. D-E Spectroscopy Measure polarization versus applied electric filed curve on the ferroelectric materials. User Spectroscopy mode User can freely choose driving and signal to measure with any combination. Au ZnO Wire I V
7 Probe-Based Nanolithography Nanolithography tool gives users a chance to modify the sample surface and to make nanostructures. Vector and raster drawing method, various exposure source can be used as samples and applications. In the vector type lithography mode, the probe just moves over sample surface where the pattern is transferred. In raster scan lithography mode, the probe scans entire surface where patterns are drawn. The Albatross software and hardware support not only both drawing methods but also various exposing source, like as tip bias, sample bias, set-point, z-piezo position or any combinations of those. Users can easily created their own pattern by using pattern editor on Albatross software or others painting tools. In the vector mode, user can freely add or edit objects such as a point, line, square, ellipse, circle, and poly line etc. Any photos can be handled as well as many painting job can be done in the raster mode. Our software gives easy and powerful platform you to work the nanolithography. Vector Lithography Software Raster Lithography Software 2.4um 1.4um Domain Reversal on PZT/Vector Scratching poly carbonate surface/ Vector Oxidation on Ti thin film/raster Nano-indentation on polycarbonate/raster Application Fields Oxidation of Si or metal surface Low-voltage electron beam lithography with precise current control Thermal mechanical writing on the polymer sample Mechanical modification/nano-indentation Modify electrical information on the ferroelectric domain reversal Data storage Bio material printing Nano manipulation 2.8um Nano-indentation Lithography
8 Albatross Specification Mechanical Head CCD Optical Microscope XYZ 3D Scanner - Type : Single module parallel-kinematics flexure stage with closed loop control - Range : 100 μm x 100 μm for XY, 12 μm for Z - Resolution : 0.2 nm for XY, 0.05nm for Z Precision Positioning Stage - Tip XY movement : ± 2mm - Resolution :~ 5 μm -Sample XY movement : ± 5mm - Resolution : 5μm - Sample size : 40 mm x 40 mm Z-stage -Travel: 30 mm - Resolution: < 0.05um High resolution optical microscope for probe & sample view On-axis optical view with max.1000x magnification Max field of view : 1 mm x 1 mm(depends on zoom) Resolution : 1 um Working distance : 35 mm Precise penning view with a manual micrometer stage Manual view positioning : ±10 mm in XY Manual fine coarse & fine focus stage Inverted Optical Microscope 20X Objective NA = MPixel CCD(High Resolution/Sensitivity CCD) High performance Digital Controller Fast(300MHz) floating point DSP 1800 MFLOPS 14 Ch 16 Bit, 1Mbps sampling ADC 4 Ch 24 Bit DAC and 8 Ch 12 Bit DAC(±10V output) Digital lock-in module for DFM mode - Frequency : Dual-phase lock-in, 1KHz~1MHz - Phase resolution : Frequency resolution : 0.02Hz Analog signal access module - 10 channel 16 bit 1MPS ADC for user input signal(±10v) - 2 channel 12 bit DAC output for user signal(±10v) Two 32-bit digital counter for user application 3 Ch digital feedback for closed loop scanner 8 bit digital input and 24 bit digital output Ethernet communication Standard Application Mode Contact and Noncontact mode dynamic force microscopy(dfm) Lateral force microscopy(lfm) F-D Spectroscopy Advanced Mode Magnetic force microscopy(mfm) Force modulation microscopy(fmm) Phase imaging mode Nanolithography(Vector/Raster) mode Conductive mode(current imaging mode) I-V Spectroscopy Constant current lithography Electric force microscopy(efm) and KFM Liquid imaging mode
Optical Microscope. Active anti-vibration table. Mechanical Head. Computer and Software. Acoustic/Electrical Shield Enclosure
Optical Microscope On-axis optical view with max. X magnification Motorized zoom and focus Max Field of view: mm x mm (depends on zoom) Resolution : um Working Distance : mm Magnification : max. X Zoom
More informationMeasurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation
238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura
More informationCutting-edge Atomic Force Microscopy techniques for large and multiple samples
Cutting-edge Atomic Force Microscopy techniques for large and multiple samples Study of up to 200 mm samples using the widest set of AFM modes Industrial standards of automation A unique combination of
More informationAdvanced Nanoscale Metrology with AFM
Advanced Nanoscale Metrology with AFM Sang-il Park Corp. SPM: the Key to the Nano World Initiated by the invention of STM in 1982. By G. Binnig, H. Rohrer, Ch. Gerber at IBM Zürich. Expanded by the invention
More informationNanosurf easyscan 2 FlexAFM
Nanosurf easyscan 2 FlexAFM Your Versatile AFM System for Materials and Life Science www.nanosurf.com The new Nanosurf easyscan 2 FlexAFM scan head makes measurements in liquid as simple as measuring in
More informationSPM The Industry s Performance Leader High Resolution Closed-loop System Fast, Easy Tip & Sample Exchange Versatility and Value Powerful Research
SPM The Industry s Performance Leader High Resolution Closed-loop System Fast, Easy Tip & Sample Exchange Versatility and Value Powerful Research Flexibility Atomic resolution STM image of highly-oriented
More informationNanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries
Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries 2002 Photonics Circle of Excellence Award PLC Ltd, England, a premier provider of Raman microspectral
More information- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy
- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy Yongho Seo Near-field Photonics Group Leader Wonho Jhe Director School of Physics and Center for Near-field
More informationPark NX20 The leading nano metrology tool for failure analysis and large sample research.
The Most Accurate Atomic Force Microscope Park NX20 The leading nano metrology tool for failure analysis and large sample research www.parkafm.com The Most Accurate Atomic Force Microscope Park NX20 The
More informationLOW TEMPERATURE STM/AFM
* CreaTec STM of Au(111) using a CO-terminated tip, 20mV bias, 0.6nA* LOW TEMPERATURE STM/AFM High end atomic imaging, spectroscopy and manipulation Designed and manufactured in Germany by CreaTec Fischer
More informationattocfm I for Surface Quality Inspection NANOSCOPY APPLICATION NOTE M01 RELATED PRODUCTS G
APPLICATION NOTE M01 attocfm I for Surface Quality Inspection Confocal microscopes work by scanning a tiny light spot on a sample and by measuring the scattered light in the illuminated volume. First,
More information:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm.
PAGE 30 & 2008 2007 PRODUCT CATALOG Confocal Microscopy - CFM fundamentals :... Over the years, confocal microscopy has become the method of choice for obtaining clear, three-dimensional optical images
More informationattosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G
APPLICATION NOTE M06 attosnom I: Topography and Force Images Scanning near-field optical microscopy is the outstanding technique to simultaneously measure the topography and the optical contrast of a sample.
More informationScanning Ion Conductance Microscope ICnano
Sperm Cell Epithelial Cells I nner Ear Hair Cells I nner Ear Hair Cell Neurons E- Coli Bac teria Scanning Ion Conductance Microscope ICnano About ionscope About ionscope The ionscope scanning ion conductance
More informationThe Most Accurate Atomic Force Microscope. Park NX20 The leading nano metrology tool for failure analysis and large sample research.
The Most Accurate Atomic Force Microscope Park NX20 The leading nano metrology tool for failure analysis and large sample research www.parkafm.com Park Systems The Most Accurate Atomic Force Microscope
More informationScanning Tunneling Microscopy
EMSE-515 02 Scanning Tunneling Microscopy EMSE-515 F. Ernst 1 Scanning Tunneling Microscope: Working Principle 2 Scanning Tunneling Microscope: Construction Principle 1 sample 2 sample holder 3 clamps
More informationNear-field Optical Microscopy
Near-field Optical Microscopy R. Fernandez, X. Wang, N. Li, K. Parker, and A. La Rosa Physics Department Portland State University Portland, Oregon Near-Field SPIE Optics Microscopy East 2005 Group PSU
More informationINDIAN INSTITUTE OF TECHNOLOGY BOMBAY
IIT Bombay requests quotations for a high frequency conducting-atomic Force Microscope (c-afm) instrument to be set up as a Central Facility for a wide range of experimental requirements. The instrument
More informationPark XE7 The most affordable research grade AFM with flexible sample handling.
Park XE7 The most affordable research grade AFM with flexible sample handling www.parkafm.com Park Systems The Most Accurate Atomic Force Microscope Park XE7 The economical choice for innovative research
More informationLecture 20: Optical Tools for MEMS Imaging
MECH 466 Microelectromechanical Systems University of Victoria Dept. of Mechanical Engineering Lecture 20: Optical Tools for MEMS Imaging 1 Overview Optical Microscopes Video Microscopes Scanning Electron
More information; A=4π(2m) 1/2 /h. exp (Fowler Nordheim Eq.) 2 const
Scanning Tunneling Microscopy (STM) Brief background: In 1981, G. Binnig, H. Rohrer, Ch. Gerber and J. Weibel observed vacuum tunneling of electrons between a sharp tip and a platinum surface. The tunnel
More informationFiber Optic Device Manufacturing
Precision Motion Control for Fiber Optic Device Manufacturing Aerotech Overview Accuracy Error (µm) 3 2 1 0-1 -2 80-3 40 0-40 Position (mm) -80-80 80 40 0-40 Position (mm) Single-source supplier for precision
More informationImaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch
Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch I. Introduction In this lab you will image your carbon nanotube sample from last week with an atomic force microscope. You
More informationPark NX-Hivac The world s most accurate and easy to use high vacuum AFM for failure analysis.
Park NX-Hivac The world s most accurate and easy to use high vacuum AFM for failure analysis www.parkafm.com Park NX-Hivac High vacuum scanning for failure analysis applications 4 x 07 / Cm3 Current (µa)
More informationIndian Institute of Technology Bombay
Specifications for High Resolution Scanning Probe Microscope Item Essential measuring modes with complete hardware and software. All the modes should be demonstrated during installation & training Scanners
More informationIonscope SICM. About Ionscope. Scanning Ion Conductance Microscopy. Ionscope A brand of Openiolabs Limited
SICM About is a brand of openiolabs Ltd, headquartered in Cambridge UK, is the world-leader in (SICM), a rapidly emerging Scanning Probe Microscopy (SPM) technique which allows nanoscale topographical
More informationScanning Microwave. Expanding Impedance Measurements to the Nanoscale: Coupling the Power of Scanning Probe Microscopy with the PNA
Agilent Technologies Scanning Microwave Microscopy (SMM) Expanding Impedance Measurements to the Nanoscale: Coupling the Power of Scanning Probe Microscopy with the PNA Presented by: Craig Wall PhD Product
More informationNanosurf Nanite. Automated AFM for Industry & Research.
Nanosurf Nanite Automated AFM for Industry & Research www.nanosurf.com Multiple Measurements Automated Got work? Nanosurf has the solution! The Swiss-based innovator and manufacturer of the most compact
More informationThe Most Accurate Atomic Force Microscope. Park XE15 Power and versatility, brilliantly combined.
The Most Accurate Atomic Force Microscope Park XE15 Power and versatility, brilliantly combined. www.parkafm.com Park XE15 Increase your productivity with our powerfully versatile atomic force microscope
More informationApproachable Raman Solutions The Shortest Path from Problem to Answer
Approachable Raman Solutions The Shortest Path from Problem to Answer Michael S. Bradley The world leader in serving science Thermo Scientific Raman Spectroscopy: Discover. Solve. Assure. Raman Spectroscopy
More informationMicroscopic Structures
Microscopic Structures Image Analysis Metal, 3D Image (Red-Green) The microscopic methods range from dark field / bright field microscopy through polarisation- and inverse microscopy to techniques like
More informationOutline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry
1 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry 2 Back to our solutions: The main problem: How to get nm
More informationPFM Experiments with High Voltage DC/AC Bias
PFM Experiments with High Voltage DC/AC Bias Support Note Shijie Wu and John Alexander Agilent Technologies Introduction Piezoelectric force microscopy (PFM) has found major applications in the study of
More informationNanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy
Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy F. Sarioglu, M. Liu, K. Vijayraghavan, A. Gellineau, O. Solgaard E. L. Ginzton Laboratory University Tip-sample
More informationPark NX10. The most accurate and easiest to use Atomic Force Microscope.
The most accurate and easiest to use Atomic Force Microscope www.parkafm.com Park Systems Enabling Nanoscale Advances The premiere choice for nanotechnology research Better data Park NX10 produces data
More informationController Design for Z Axis Movement of STM Using SPM Control Software
Controller Design for Z Axis Movement of STM Using SPM Control Software Neena Tom, Rini Jones S. B Abstract Scanning probe microscopy is a branch of microscopy that forms images of surfaces using a physical
More informationPICO MASTER 200. UV direct laser writer for maskless lithography
PICO MASTER 200 UV direct laser writer for maskless lithography 4PICO B.V. Jan Tinbergenstraat 4b 5491 DC Sint-Oedenrode The Netherlands Tel: +31 413 490708 WWW.4PICO.NL 1. Introduction The PicoMaster
More informationpicoemerald Tunable Two-Color ps Light Source Microscopy & Spectroscopy CARS SRS
picoemerald Tunable Two-Color ps Light Source Microscopy & Spectroscopy CARS SRS 1 picoemerald Two Colors in One Box Microscopy and Spectroscopy with a Tunable Two-Color Source CARS and SRS microscopy
More informationAtomic Scale Patterning Made Easy
ZyVector STM Control System for Atomically Precise Lithography Making Atomic Resolution Lithography a reality Distributed by Distortion-Free Imaging Automatic Lattice Alignment Digital Vector Lithography
More informationHigh Precision Positioning Mechanisms for a Hard X-ray Nanoprobe Instrument. Abstract
High Precision Positioning Mechanisms for a Hard X-ray Nanoprobe Instrument D. Shu, J. Maser,, B. Lai, S. Vogt, M. Holt, C. Preissner, A. Smolyanitskiy,4, R. Winarski, and G. B. Stephenson,3 Center for
More informationCharacterisation of the Montana Instruments Cryostation C2 for low temperature Magneto-Optical Kerr Effect measurements using the NanoMOKE 3
Technical Report TR16711rev3 Characterisation of the Montana Instruments Cryostation C2 for low temperature Magneto-Optical Kerr Effect measurements using the NanoMOKE 3 EXECUTIVE SUMMARY This technical
More informationattocube systems Probe Stations for Extreme Environments CRYOGENIC PROBE STATION fundamentals principles of cryogenic probe stations
PAGE 88 & 2008 2007 PRODUCT CATALOG CRYOGENIC PROBE STATION fundamentals...................... 90 principles of cryogenic probe stations attocps I.......................... 92 ultra stable cryogenic probe
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy The wavelike properties of electrons allows them to tunnel beyond the regions of a solid into a region of space forbidden for them to exist in. In this region they can be
More informationM-041 M-044 Tip/Tilt Stage
M-041 M-044 Tip/Tilt Stage Piezo Drive Option for Nanometer Precision Ordering Information Linear Actuators & Motors M-041.00 Small Tilt Stage, Manual Micrometer Drive M-041.D01 Small Tilt Stage, DC-Motor
More informationStandard Operating Procedure of Atomic Force Microscope (Anasys afm+)
Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) The Anasys Instruments afm+ system incorporates an Atomic Force Microscope which can scan the sample in the contact mode and generate
More informationInvestigate in magnetic micro and nano structures by Magnetic Force Microscopy (MFM)
Investigate in magnetic micro and nano 5.3.85- Related Topics Magnetic Forces, Magnetic Force Microscopy (MFM), phase contrast imaging, vibration amplitude, resonance shift, force Principle Caution! -
More information10 Things to Consider when Acquiring a Nanopositioning System
10 Things to Consider when Acquiring a Nanopositioning System There are many factors to consider when looking for nanopositioning piezo stages. This article will help explain some items that are important
More informationwrite-nanocircuits Direct-write Jaebum Joo and Joseph M. Jacobson Molecular Machines, Media Lab Massachusetts Institute of Technology, Cambridge, MA
Fab-in in-a-box: Direct-write write-nanocircuits Jaebum Joo and Joseph M. Jacobson Massachusetts Institute of Technology, Cambridge, MA April 17, 2008 Avogadro Scale Computing / 1 Avogadro number s? Intel
More informationSupporting Information 1. Experimental
Supporting Information 1. Experimental The position markers were fabricated by electron-beam lithography. To improve the nanoparticle distribution when depositing aqueous Ag nanoparticles onto the window,
More informationAdministrative details:
Administrative details: Anything from your side? www.photonics.ethz.ch 1 What are we actually doing here? Optical imaging: Focusing by a lens Angular spectrum Paraxial approximation Gaussian beams Method
More informationManufacturing Metrology Team
The Team has a range of state-of-the-art equipment for the measurement of surface texture and form. We are happy to discuss potential measurement issues and collaborative research Manufacturing Metrology
More informationIntroduction of New Products
Field Emission Electron Microscope JEM-3100F For evaluation of materials in the fields of nanoscience and nanomaterials science, TEM is required to provide resolution and analytical capabilities that can
More informationFigure for the aim4np Report
Figure for the aim4np Report This file contains the figures to which reference is made in the text submitted to SESAM. There is one page per figure. At the beginning of the document, there is the front-page
More informationSurface Finish Measurement Methods and Instrumentation
125 years of innovation Surface Finish Measurement Methods and Instrumentation Contents Visual Inspection Surface Finish Comparison Plates Contact Gauges Inductive / Variable Reluctance (INTRA) Piezo Electric
More informationLarge Signal Displacement Measurement with an MTI Photonic Sensor Rev B
Radiant Technologies, Inc. 2835D Pan American Freeway NE Albuquerque, NM 8717 Tel: 55-842-87 Fax: 55-842-366 e-mail: radiant@ferrodevices.com www.ferrodevices.com Large Signal Displacement Measurement
More informationsensicam em electron multiplication digital 12bit CCD camera system
sensicam em electron multiplication digital 12bit CCD camera system electron multiplication gain of up to 1000 superior resolution (1004 1002 pixel) for EMCCD extremely low noise < 1e excellent quantum
More informationKeysight Technologies Why Magnification is Irrelevant in Modern Scanning Electron Microscopes. Application Note
Keysight Technologies Why Magnification is Irrelevant in Modern Scanning Electron Microscopes Application Note Introduction From its earliest inception, the Scanning Electron Microscope (SEM) has been
More informationSystematic Workflow via Intuitive GUI. Easy operation accomplishes your goals faster than ever.
Systematic Workflow via Intuitive GUI Easy operation accomplishes your goals faster than ever. 16 With the LEXT OLS4100, observation or measurement begins immediately once the sample is placed on the stage.
More informationPicoMaster 100. Unprecedented finesse in creating 3D micro structures. UV direct laser writer for maskless lithography
UV direct laser writer for maskless lithography Unprecedented finesse in creating 3D micro structures Highest resolution in the market utilizing a 405 nm diode laser Structures as small as 300 nm 375 nm
More informationSUPRA Optix 3D Optical Profiler
SUPRA Optix 3D Optical Profiler Scanning White-light Interferometric Microscope SWIM Series Applications The SUPRA Optix is the latest development in the field of Scanning White-light Interferometry. With
More informationXYZ Stage. Surface Profile Image. Generator. Servo System. Driving Signal. Scanning Data. Contact Signal. Probe. Workpiece.
Jpn. J. Appl. Phys. Vol. 40 (2001) pp. 3646 3651 Part 1, No. 5B, May 2001 c 2001 The Japan Society of Applied Physics Estimation of Resolution and Contact Force of a Longitudinally Vibrating Touch Probe
More informationFemtoFAB. Femtosecond laser micromachining system. tel fax Konstitucijos ave. 23C LT Vilnius, Lithuania
FemtoFAB Femtosecond laser micromachining system Konstitucijos ave. 23C LT-08105 Vilnius, Lithuania tel. +370 5 272 57 38 fax +370 5 272 37 04 info@wophotonics.com www.wophotonics.com INTRODUCTION FemtoFAB
More informationMicro-manipulated Cryogenic & Vacuum Probe Systems
Janis micro-manipulated probe stations are designed for non-destructive electrical testing using DC, RF, and fiber-optic probes. They are useful in a variety of fields including semiconductors, MEMS, superconductivity,
More informationBeams and Scanning Probe Microscopy
IFN-CNR, Sezione di Trento Istituto Trentino di Cultura of Trento Department of Physics University of Trento Towards the joint use of X-ray Beams and Scanning Probe Microscopy Silvia Larcheri SILS 2005
More informationHoriba LabRAM ARAMIS Raman Spectrometer Revision /28/2016 Page 1 of 11. Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer
Page 1 of 11 Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer The Aramis Raman system is a software selectable multi-wavelength Raman system with mapping capabilities with a 400mm monochromator and
More informationIndentation Cantilevers
curve is recorded utilizing the DC displacement of the cantilever versus the extension of the scanner. Many indentations may be made using various forces, rates, etc. Upon exiting indentation mode, TappingMode
More informationNano Scale Optics with Nearfield Scanning Optical Microscopy (NSOM)
Nano Scale Optics with Nearfield Scanning Optical Microscopy (NSOM) Presentation Overview Motivation for nearfield optics Introduction to NSOM What is NSOM today? What can you do with NSOM? November 2,
More informationNanovie. Scanning Tunnelling Microscope
Nanovie Scanning Tunnelling Microscope Nanovie STM Always at Hand Nanovie STM Lepto for Research Nanovie STM Educa for Education Nanovie Auto Tip Maker Nanovie STM Lepto Portable 3D nanoscale microscope
More informationGet the full picture of your sample. Applications
Follow the Experts Get the full picture of your sample The new generation of confocal Raman microscopes offers a non-destructive and non-contact method of sample analysis at the sub-micron level. More
More informationMaterials Science Devices Life Science Advanced Applications
TM Head XY Scanner Base Technical Innovations TM Sensored, closed loop positioning for high resolution imaging, accuracy, and reproducibility. Pioneering all-digital controller for open software adaptability,
More informationphotolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited by
Supporting online material Materials and Methods Single-walled carbon nanotube (SWNT) devices are fabricated using standard photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited
More informationAkiyama-Probe (A-Probe) guide
Akiyama-Probe (A-Probe) guide This guide presents: what is Akiyama-Probe, how it works, and what you can do Dynamic mode AFM Version: 2.0 Introduction NANOSENSORS Akiyama-Probe (A-Probe) is a self-sensing
More informationCONSTRUCTING A SCANNING TUNNELING MICROSCOPE FOR THE STUDY OF SUPERCONDUCTIVITY
CONSTRUCTING A SCANNING TUNNELING MICROSCOPE FOR THE STUDY OF SUPERCONDUCTIVITY CHRISTOPHER STEINER 2012 NSF/REU Program Physics Department, University of Notre Dame Advisors: DR. MORTEN ESKILDSEN CORNELIUS
More informationFabrication of Probes for High Resolution Optical Microscopy
Fabrication of Probes for High Resolution Optical Microscopy Physics 564 Applied Optics Professor Andrès La Rosa David Logan May 27, 2010 Abstract Near Field Scanning Optical Microscopy (NSOM) is a technique
More informationManipulation, Assembly & Characterization. of Optically Functional 1-D Organic. Nanostructures.
1 Manipulation, Assembly & Characterization of Optically Functional 1-D Organic Nanostructures. Authors: Ken Reynolds, P. Lovera, D. Iacopino, H. Doyle, A. O Riordan, G. Redmond. Nanotechnology Group Tyndall
More informationBringing Answers to the Surface
3D Bringing Answers to the Surface 1 Expanding the Boundaries of Laser Microscopy Measurements and images you can count on. Every time. LEXT OLS4100 Widely used in quality control, research, and development
More informationSection 2: Lithography. Jaeger Chapter 2 Litho Reader. The lithographic process
Section 2: Lithography Jaeger Chapter 2 Litho Reader The lithographic process Photolithographic Process (a) (b) (c) (d) (e) (f) (g) Substrate covered with silicon dioxide barrier layer Positive photoresist
More informationAkiyama-Probe (A-Probe) guide
Akiyama-Probe (A-Probe) guide This guide presents: what is Akiyama-Probe, how it works, and its performance. Akiyama-Probe is a patented technology. Version: 2009-03-23 Introduction NANOSENSORS Akiyama-Probe
More informationAbout NT-MDT. To know more about us and our products you are welcome to Victor A. Bykov President, NT-MDT Co.
About NT-MDT Our mission: NT-MDT is the innovation company which develops and promotes Scanning Probe technologies to various fields of science, production and education world wide We are living in a surprisingly
More informationMEASUREMENT OF STRAIN AND POLARIZATION IN PIEZOELECTRIC AND ELECTROSTRICTIVE ACTUATORS
2 nd Canada-US CanSmart Workshop 1-11 October 22, Montreal, Quebec, Canada. MEASUREMENT OF STRAIN AND POLARIZATION IN PIEZOELECTRIC AND ELECTROSTRICTIVE ACTUATORS B. Yan, D. Waechter R. Blacow and S. E.
More informationBasic methods in imaging of micro and nano structures with atomic force microscopy (AFM)
Basic methods in imaging of micro and nano P2538000 AFM Theory The basic principle of AFM is very simple. The AFM detects the force interaction between a sample and a very tiny tip (
More informationUltrafast Beams and Applications UBA July, 2017 Presenter: Arsham Yeremyan
Laser driven facility for irradiation experiments, two-photon microscopy and microfabrication Ultrafast Beams and Applications UBA17 04-07 July, 2017 Presenter: Arsham Yeremyan Outline Parallel operation
More informationLateral Force: F L = k L * x
Scanning Force Microscopy (SFM): Conventional SFM Application: Topography measurements Force: F N = k N * k N Ppring constant: Spring deflection: Pieo Scanner Interaction or force dampening field Contact
More informationSection 2: Lithography. Jaeger Chapter 2 Litho Reader. EE143 Ali Javey Slide 5-1
Section 2: Lithography Jaeger Chapter 2 Litho Reader EE143 Ali Javey Slide 5-1 The lithographic process EE143 Ali Javey Slide 5-2 Photolithographic Process (a) (b) (c) (d) (e) (f) (g) Substrate covered
More informationpco.1600 cooled digital 14bit CCD camera system
pco.1600 cooled digital 14bit CCD camera system n excellent resolution (1600 1200 pixel) n 14 bit dynamic range n frame rate of 30 fps at full resolution n image memory in camera (camram up to 4 GB) n
More informationState of the Art Room Temperature Scanning Hall Probe Microscopy using High Performance micro-hall Probes
State of the Art Room Temperature Scanning Hall Probe Microscopy using High Performance micro-hall Probes A. Sandhu 1, 4, H. Masuda 2, A. Yamada 1, M. Konagai 3, A. Oral 5, S.J Bending 6 RCQEE, Tokyo Inst.
More informationSuper High Vertical Resolution Non-Contact 3D Surface Profiler BW-S500/BW-D500 Series
Super High Vertical Resolution Non-Contact 3D Surface Profiler BW-S500/BW-D500 Series Nikon's proprietary scanning-type optical interference measurement technology achieves 1pm* height resolution. * Height
More informationIMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM
Laboratorio MDM - INFM Via C.Olivetti 2, I-20041 Agrate Brianza (MI) M D M Materiali e Dispositivi per la Microelettronica IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL
More informationSupplementary Materials for
advances.sciencemag.org/cgi/content/full/2/7/e1629/dc1 Supplementary Materials for Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films Xuewen Wang, Xuexia He, Hongfei Zhu,
More informationElectronic Characterization of Materials Using Conductive AFM
Electronic Characterization of Materials Using Conductive AFM Amir Moshar Electrical Measurements SKPM EFM CAFM PFM SCM Non-Contact Electrical Techniques Scanning Kelvin Probe Microscopy Electric Force
More informationLaser Speckle Reducer LSR-3000 Series
Datasheet: LSR-3000 Series Update: 06.08.2012 Copyright 2012 Optotune Laser Speckle Reducer LSR-3000 Series Speckle noise from a laser-based system is reduced by dynamically diffusing the laser beam. A
More informationCorporate Introduction of CRESTEC CORPORATION Expert in E-Beam Nanofabrication
Corporate Introduction of CRESTEC CORPORATION Expert in E-Beam Nanofabrication David López-Romero Moraleda. Technical Support Manager, Crestec Corporation Spain Branch. Financiación-Internacionalización-Cooperación.
More informationPanasonic, 2 Channel FFT Analyzer VS-3321A. DC to 200kHz,512K word memory,and 2sets of FDD
Panasonic, 2 Channel FFT Analyzer VS-3321A DC to 200kHz,512K word memory,and 2sets of FDD New generation 2CH FFT Anal General The FFT analyzer is a realtime signal analyzer using the Fast Fourier Transform
More informationnanovea.com PROFILOMETERS 3D Non Contact Metrology
PROFILOMETERS 3D Non Contact Metrology nanovea.com PROFILOMETER INTRO Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano
More informationStudy of shear force as a distance regulation mechanism for scanning near-field optical microscopy
Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy C. Durkan a) and I. V. Shvets Department of Physics, Trinity College Dublin, Ireland Received 31 May 1995;
More informationTHE DEVELOPMENT OF AN INTEGRATED GRAPHICAL SLS PROCESS CONTROL INTERFACE
THE DEVELOPMENT OF AN INTEGRATED GRAPHICAL SLS PROCESS CONTROL INTERFACE ABSTRACT Guohua Ma and Richard H. Crawford The University of Texas at Austin This paper presents the systematic development of a
More informationLMT F14. Cut in Three Dimensions. The Rowiak Laser Microtome: 3-D Cutting and Imaging
LMT F14 Cut in Three Dimensions The Rowiak Laser Microtome: 3-D Cutting and Imaging The Next Generation of Microtomes LMT F14 - Non-contact laser microtomy The Rowiak laser microtome LMT F14 is a multi-purpose
More informationFirst Time User Manual
Fiber Fabry-Perot Tunable Filter FFP-TF2 First Time User Manual Micron Optics Inc. 1852 Century Place NE Atlanta, GA 30345 USA phone 404 325 0005 fax 404 325 4082 www.micronoptics.com Copyright 2009 Micron
More informationDemo Pattern and Performance Test
Raith GmbH Hauert 18 Technologiepark D-44227 Dortmund Phone: +49(0)231/97 50 00-0 Fax: +49(0)231/97 50 00-5 Email: postmaster@raith.de Internet: www.raith.com Demo Pattern and Performance Test For Raith
More informationPrepare Sample 3.1. Place Sample in Stage. Replace Probe (optional) Align Laser 3.2. Probe Approach 3.3. Optimize Feedback 3.4. Scan Sample 3.
CHAPTER 3 Measuring AFM Images Learning to operate an AFM well enough to get an image usually takes a few hours of instruction and practice. It takes 5 to 10 minutes to measure an image if the sample is
More information