SGM3717 4Ω, 400MHz Bandwidth, Dual, SPDT Negative Signal Handling Analog Switch

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1 Preliminary datasheet SGM3717 GENERAL DESCRIPTION The SGM3717 is a dual, bidirectional, single-pole/ double-throw (SPDT) CMOS analog switch designed to operate from a single +2.5V to +5.0V supply. It features high-bandwidth (400MHz) and low on-resistance (4Ω TYP), the lowest -2.0V negative signal can pass switch. SGM3717 features guaranteed on-resistance matching (0.15Ω TYP) between switches and guaranteed on-resistance flatness over the signal range (1.5Ω TYP). This ensures excellent linearity and low distortion when switching audio signals. The SGM3717 is a committed dual single-pole/ double-throw (SPDT) that consist of two normally open (NO) and two normally close (NC) switches. This configuration can be used as a dual 2-to-1 multiplexer. SGM3717 is available in UTQFN L package. FEATURES Voltage Operation: +2.5V to +5.0V -2.0V to Signal Passing Ability On-Resistance: 4Ω (TYP) at +5.0V High Bandwidth: 400MHz Fast Switching Times t ON 15ns t OFF 11ns High Off-Isolation: -49dB at 10MHz Low Crosstalk: -52dB at 10MHz Negative signal handling: the lowest -2.0V negative signal pass TTL/CMOS Compatible Break-Before-Make Switching Extended Industrial Temperature Range: -40 to +85 Small Package: UTQFN L P CONFIGURATION (TOP VIEW) APPLICATIONS NO1 Portable Instrumentation Battery-Operated Equipment Computer Peripherals Cell Phones PDAs MP3s 1 1 NC NC NO2 2 2 UTQFN L September 26, 2011

2 ORDERG FORMATION MODEL ORDERG NUMBER P- PACKAGE SPECIFIED TEMPERATURE RANGE PACKAGE MARKG PACKAGE OPTION SGM3717 SGM3717YUWQ10G UTQFN L -40 to +85 A3XX Tape and Reel, 3000 ORDER NUMBER SGM3717 Y X G / TR MARKG FORMATION YY X X Tape and Reel Green product Package Type UWQ10 UTQFN L Operating Temperature Range Y -40 to +85 Date code - month ("A" = Jan. "B" = Feb. "L" = Dec.) Date code - year ("A" = 2010, "B" = 2011 ) Chip I.D. For example: A3BA (2011, January) ABSOLUTE MAXIMUM RATGS, to v to +6V Analog, Digital voltage range (1)... ( ) - 6.0V to ( ) + 0.3V Continuous Current NO, NC, or...±50ma Peak Current NO, NC, or...±80ma Operating Temperature Range to +85 Junction Temperature Storage Temperature to +150 Lead Temperature (soldering, 10s) ESD Susceptibility HBM V MM...400V Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. (1) Signals on NC, NO, or or exceeding V+ will be clamped by internal diodes. Limit forward diode current to maximum current ratings. CAUTION This integrated circuit can be damaged by ESD if you don t pay attention to ESD protection. SGMICRO recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. SGMICRO reserves the right to make any change in circuit design, specification or other related things if necessary without notice at any time. Please contact SGMICRO sales office to get the latest datasheet. 2

3 FUNCTION TABLE LOGIC NO NC 0 OFF ON 1 ON OFF Switches Shown For Logic 0 Input. P DESCRIPTION NAME FUNCTION 1, 2 1, 2 NO1, NO2 NC1, NC2 Note: NO, NC and terminals may be an input or output. Power supply Ground Digital control pin to connect the terminal to the NO or NC terminals Common terminal Normally-open terminal Normally-closed terminal APPLICATION DIAGRAM 200Ω Audio Codec R L 1 FS USB D+ D- 1 Control 2 2 3

4 ELECTRICAL CHARACTERISTICS ( = +4.5V to +5.0V, Typical values are at = +5.0V, T A = +25, unless otherwise noted.) PARAMETER SYMBOL CONDITIONS M TYP MAX UNITS ANALOG SWITCH 2.5V 3.5V -2.0 Analog Signal Range V NO, V NC, V 3.5V V+ 5.0V ( ) V On-Resistance On-Resistance Match Between Channels On-Resistance Flatness Source OFF Leakage Current Channel ON Leakage Current R ON = 4.5V, V NO or V NC = 3.5V, I = -10mA, Test Circuit 1 ΔR ON = 4.5V, V NO or V NC = 3.5V, I = -10mA, Test Circuit 1 R FLAT(ON) = 4.5V, 0V V NO or V NC, I = -10mA, Test Circuit 1 I NC(OFF), I = 5.0V, V NO or V NC = 1.0V, 4.5V, NO(OFF) V = 4.5V, 1.0V I NC(ON), I NO(ON), = 5.0V, V = 1.0V, 4.5V, I (ON) V NO or V NC = 1.0V, 4.5V, or floating 4 Ω 0.15 Ω 1.5 Ω 0.1 μa 0.1 μa Power Off Leakage Current I Power OFF = 0V, V NO or V NC = 0V, V = 5V 0.5 μa DIGITAL PUTS Input High Voltage H 1.8 V Input Low Voltage L 0.4 V Input Leakage Current I = 5.0V, = 0V or 5.0V 0.1 μa DYNAMIC CHARACTERISTICS Turn-On Time Turn-Off Time Break-Before-Make Time Delay t ON t OFF t D V NO or V NC = 3.0V, V IH = 1.8V, V IL = 0V, = 300Ω, = 35pF, Test Circuit 2 V NO or V NC = 3.0V, V IH = 1.8V, V IL = 0V, = 300Ω, = 35pF, Test Circuit 2 V NO1 or V NC1 = V NO2 or V NC2 = 3V, = 300Ω, = 35pF, Test Circuit 3 15 ns 11 ns 6 ns Skew t SKEW R S = 39Ω, = 50pF, Test Circuit 4 1 ns Off Isolation Channel-to-Channel Crosstalk -3dB Bandwidth Charge Injection O ISO X TALK BW Q Signal = 0dBm, = 50Ω, f = 10MHz -49 db = 5pF, Test Circuit 5 f = 1MHz -70 db Signal = 0dBm, = 50Ω, f = 10MHz -52 db = 5pF, Test Circuit 6 f = 1MHz -72 db Signal = 0dBm, = 50Ω, = 5pF, Test Circuit 7 V G =, R G = 0Ω, = 1.0nF, Test Circuit MHz 16 pc Switch ON Capacitance C ON 24 pf Switch OFF Capacitance C OFF 9 pf POWER REQUIREMENTS Power Supply Current I + = 5.0V, = 0V or 0.1 μa 4

5 ELECTRICAL CHARACTERISTICS ( = +2.7V to +3.6V, Typical values are at = +3.0V, T A = +25, unless otherwise noted.) PARAMETER SYMBOL CONDITIONS M TYP MAX UNITS ANALOG SWITCH 2.5V 3.5V -2.0 Analog Signal Range V NO, V NC, V 3.5V V+ 5.0V ( ) V On-Resistance On-Resistance Match Between Channels On-Resistance Flatness Source OFF Leakage Current Channel ON Leakage Current R ON = 2.7V, V NO or V NC = 1.5V, I = -10mA, Test Circuit 1 ΔR ON = 2.7V, V NO or V NC = 1.5V, I = -10mA, Test Circuit 1 R FLAT(ON) = 2.7V, 0V V NO or V NC, I = -10mA, Test Circuit 1 I NC(OFF), I = 3.6V, V NO or V NC = 0.3V, 3.3V, NO(OFF) V = 3.3V, 0.3V I NC(ON), I NO(ON), = 3.6V, V = 0.3V, 3.3V, I (ON) V NO or V NC = 0.3V, 3.3V, or floating 6 Ω 0.25 Ω 3 Ω 0.1 μa 0.1 μa Power Off Leakage Current I Power OFF = 0V, V NO or V NC = 0V, V = 3V 0.5 μa DIGITAL PUTS Input High Voltage H 1.8 V Input Low Voltage L 0.4 V Input Leakage Current I = 3.6V, = 0V or 3.6V 0.1 μa DYNAMIC CHARACTERISTICS Turn-On Time Turn-Off Time Break-Before-Make Time Delay t ON t OFF t D V NO or V NC = 1.5V, V IH = 1.8V, V IL = 0V, = 300Ω, = 35pF, Test Circuit 2 V NO or V NC = 1.5V, V IH = 1.8V, V IL = 0V, = 300Ω, = 35pF, Test Circuit 2 V NO1 or V NC1 = V NO2 or V NC2 = 1.5V, = 300Ω, = 35pF, Test Circuit 3 24 ns 15 ns 10 ns Skew t SKEW R S = 39Ω, = 50pF, Test Circuit 4 1 ns Off Isolation Channel-to-Channel Crosstalk -3dB Bandwidth Charge Injection O ISO X TALK BW Q Signal = 0dBm, = 50Ω, f = 10MHz -49 db = 5pF, Test Circuit 5 f = 1MHz -70 db Signal = 0dBm, = 50Ω, f = 10MHz -52 db = 5pF, Test Circuit 6 f = 1MHz -72 db Signal = 0dBm, = 50Ω, = 5pF, Test Circuit 7 V G =, R G = 0Ω, = 1.0nF Test Circuit MHz 10 pc Switch ON Capacitance C ON 24 pf Switch OFF Capacitance C OFF 9 pf Total Harmonic Distortion POWER REQUIREMENTS THD = 3V, V NC/NO = 2Vpp, f=20hz to 20kHz, =600Ω Test Circuit 9 =32Ω 0.85 Power Supply Current I + = 3.6V, = 0V or 0.1 μa % 5

6 TYPICAL PERFORMANCE CHARACTERISTICS 3 On Response vs. Frequency 3 On Response vs. Frequency On Response (db) = +3V T A = Frequency (MHz) On Response (db) = +5V T A = Frequency (MHz) On Response (db) Response vs. Frequency ON-LOSS OFF-ISOLATION CROSSTALK = +3V T A = Frequency (MHz) On Response (db) OFF-ISOLATION Response vs. Frequency ON-LOSS CROSSTALK = +5V T A = Frequency (MHz) 6

7 TEST CIRCUITS 10mA V1 NO or NC V NO or V NC R ON = V1/10mA Test Circuit 1. On Resistance NO or NC V NO or V NC 300Ω 35pF t ON t OFF Test Circuit 2. Switching Times V NO or V NC NC NO 0 300Ω 35pF t D Test Circuit 3. Break-Before-Make Time Delay (t D ) 7

8 TEST CIRCUITS (Cont.) SGM RS NO1 or NC1 1 OUT+ Rise Time Delay = trise toutrise Fall Time Delay = tfall toutfall Rise Time to Fall Time Mismatch = toutfall toutrise 1 CL RS NO2 or NC2 2 - OUT- 2 CL V tfall trise V+ V+ 0V 10% 10% V+ V- 0V toutfall toutrise VOUT+ V+ 0V 10% 10% V+ VOUT- 0V ON tskew Test Circuit 4. Output Signal Skew (T SKEW ) NC Source Signal 50Ω NO 50Ω 5pF Test Circuit 5. Off Isolation (O ISO) 8

9 TEST CIRCUITS (Cont.) NO1 or NC1 1 Source Signal 1 50Ω 5pF 2 N.C. NO2 or NC2 2 50Ω 5pF Channel to Channel Crosstalk = 20 log V NO or V NC Test Circuit 6. Channel-to-Channel Crosstalk (X TALK) NO or NC Source Signal 50Ω 5pF Test Circuit 7. -3dB Bandwidth (BW) Logic Input (VI) OFF ON OFF VIH VIL + V G Logic Input R G NO or NC V V V G = 0 to R G = 0 = 1nF Q C = x ΔV ΔV V I = V IH or V IL Test Circuit 8. Charge Injection (Q) 9

10 TEST CIRCUITS (Cont.) V NO or NC Source Signal + Test Circuit 9. Total Harmonic Distortion (THD) 10

11 SGM3717 PACKAGE OUTLE DIMENSIONS UTQFN L 1.800± ± ( 9) TYP P #1 IDENTIFICATION CHAMFER ± REF P #1 DOT BY MARKG TOP VIEW 0.500± ± BOTTOM VIEW ± SIDE VIEW REF REMENDED LAND PATTERN NOTE: All linear dimensions are in millimeters. 11