Test Measurements with the Hit-Detection ASIC V2.00 for the APFEL Preamplifier

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1 Test Measurements with the Hit-Detection ASIC V2.00 for the APFEL Preamplifier L. Capozza, H. Deppe, H. Flemming, P. Grasemann, O. Noll, P. Wieczorek Helmholtz-Institut Mainz PANDA Collaboration Meeting 18/1 7. March 2018

2 1 Introduction & Motivation 2 The Data Readout Chain 3 Hit-Detection ASIC V2.0 4 Characterisation of the Hit-Detection ASIC V2.0 5 Summary and Outlook

3 FAIR (Facility for Antiproton and Ion Research) Introduction & Motivation Phillip Helmholtz-Institut Mainz 1/14

4 Data Readout Chain: Sampling ADC Board Uppsala ADC Design : Front End PWO-II APD APFEL Line Driver 10 m Back End Uppsala ADC + FE DAQ analog digital PWO-II: Lead tungstate scintillator APD: Avalanche Photodiode APFEL: Charge sensitive preamplifier FE: Feature Extraction DAQ: Data Acquisition The Data Readout Chain Phillip Helmholtz-Institut Mainz 2/14

5 Challenging Cable Guiding [M. Moritz: Barrel slice assembly, PANDA CM, September 2017] The Data Readout Chain Phillip Helmholtz-Institut Mainz 3/14

6 Data Readout Chain: Possible Design Hit-Detection Design : Front End Back End PWO-II APD APFEL HitDet + FE 10 m DAQ analog digital PWO-II: Lead tungstate scintillator APD: Avalanche Photodiode APFEL: Charge sensitive preamplifier FE: Feature Extraction DAQ: Data Acquisition The Data Readout Chain Phillip Helmholtz-Institut Mainz 4/14

7 Hit-Detection ASIC V2.0 Developed at GSI (H. Deppe, H. Flemming and P. Wieczorek) Hit-Detection ASIC V2.0 consists of Analogue part (Buffer, Trigger, Memory, Integrator, Multiplexer) Pipeline ADC (12 bit) Digital part (Write and read out logic, Backend) Front End [H. Deppe, H. Flemming, P. Wieczorek: The HitDetection ASIC - Version 2.00, ] Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 5/14

8 Teststand with automated measurements Measurements: ADC: Linear performance ADC: Dynamic performance Analog Memory Threshold Trigger Hit-Detection ASIC Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 6/14

9 ADC: Linear Performance Hit-Det ADC DC Function Generator DAQ Ramping DC voltage through ADC input range Retrieving the integral nonlinearity (INL) Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 7/14

10 ADC: Linear Performance ADC Channel [a.u.] Residues [a.u.] Fit (χ 2 /dof = /372) Data Voltage [mv] INL = 2.26 LSB Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 8/14

11 ADC: Dynamic Performance Hit-Det ADC Function Generator DAQ Different input frequencies, amplitudes & sampling rates Retrieving the effective number of bits (ENOB): ENOB = 0.5log 2 (SINAD) 0.5log 2 (1.5) log 2 (Ampl/FS) (SINAD: Signal to Noise and Distortion; Ampl: Amplitude; FS: Full Scale) Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 9/14

12 I: FFT-Method for obtaining ENOB 20 0 Number of samples: 2 12 ; input frequency: 3 khz; sampling rate: ks/s; half amplitude CPG+scalloping loss db Power [db] CPG+PG-ENBW SINAD = ENOB = Frequency [khz] CPG: Coherent Power Gain (influence of tapering function) Scallopping Loss: FFT sampling not appropriate PG: FFT Process Gain (Signal/Noise N) ENBW: Equivalent Noise Bandwidth (influence of tapering function) Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 10/14

13 II: Fit-Method for obtaining ENOB Input frequency: 0.2 MHz; sampling rate: 1.96 MS/s; half amplitude ADC [a.u.] Fit Freq.: khz Phase: Ampl.: a.u. Offset: 44.6 a.u. σ: 1.21 a.u. ENOB: ADC data Time [s] Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 11/14

14 ENOB Comparison ENOB Sampling rate: 0.53 MS/s Sampling rate: 1.00 MS/s Sampling rate: 1.96 MS/s Sampling rate: 3.70 MS/s Sampling rate: 6.67 MS/s Ratio of Frequency to Sampling Rate Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 12/14

15 It is not all roses Input frequency: 3.3 MHz; sampling rate: 6.67 MS/s; half amplitude ADC [a.u.] Fit (used 7 pts.) Freq.: khz Phase: Ampl.: a.u. Offset: 40.7 a.u. σ: 1.67 a.u. ENOB: 9.97 ADC data Time [s] Characterisation of the Hit-Detection ASIC V2.0 Phillip Helmholtz-Institut Mainz 13/14

16 Summary and Outlook Teststand was set up including automatized measurements ADC has an INL of 2.26 LSB ADC has an ENOB of about 10 ADC test board is beeing developed Dynamic tests can be made with higher sampling rates A feature extraction can be tested Limitations of current version were identified Summary and Outlook Phillip Helmholtz-Institut Mainz 14/14

17 End Thanks for your attention! End Phillip Helmholtz-Institut Mainz 14/14

18 Effect of geometrical Layout RMS [ADC channel] Set Voltage (corrected) [mv] Backup Phillip Helmholtz-Institut Mainz A

19 Differential Nonlinearity DNL [LSB] ADC Channel [a.u.] Backup Phillip Helmholtz-Institut Mainz B

20 Integral Nonlinearity INL [LSB] ADC Channel [a.u.] Backup Phillip Helmholtz-Institut Mainz C

21 Sampling Rate of 529 ks/s ENOB Comparison with 2 12 Samples ENOB fft_bm_ fft_bm_12_no_calib 3.5 fit_ fit_12_no_calib 2.5 fft_bm_12_quarter_amp 2.0 fit_12_quarter_amp 1.5 fft_bm_12_half_amp fit_12_half_amp Frequency [khz] Backup Phillip Helmholtz-Institut Mainz D

22 Sampling Rate of 529 ks/s ENOB Comparison with 2 12 Samples ENOB fft_bm_12_quarter_amp fit_12_quarter_amp fft_bm_12_half_amp fit_12_half_amp Frequency [khz] Backup Phillip Helmholtz-Institut Mainz E

23 ADC Dynamic Two possibilities to obtain the Effective Number of bits (ENOB): Fit Fast Fourier Transformation (FFT) y Res = y ADC y Fit, σ = std(y Res ), S N = 20log 10 ( Ampl σ SINAD = 10 S N/10, ), ENOB = 0.5log 2 (SINAD) 0.5log 2 (1.5) log 2 (Ampl/FS), SINAD: Signal to Noise and Distortion y Fit : y ADC corresponding value S N : Signal-to-Noise y ADC : ADC value Ampl: Amplitude FS: Full Scale Backup Phillip Helmholtz-Institut Mainz F

24 Analog Part The analog part consists of 4 channels, each with Input buffer Threshold trigger Memory Integrator Multiplexer [H. Deppe, H. Flemming, P. Wieczorek: The HitDetection ASIC - Version 2.00, ] Backup Phillip Helmholtz-Institut Mainz G

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