Datasheet Product Specification. Datasheet Product Specification. Document No: CISC-XPL-DO V02 Issue:

Transcription

1 CISC Dc. N.: CISC-XPL-DO V02 CISC CISC Dcument N: CISC-XPL-DO V CISC Semicnductr GmbH Page 1 f 15

2 CISC CONTENTS 1 OVERVIEW 3 2 KEY FACTS General Test mdes Supprted standards and prtcls 4 3 TAG TESTING Tag Cnfrmance tests Tag perfrmance tests 6 4 READER TESTING Functins 9 5 SPECIFICATION 10 6 ENVIRONMENTAL CONDITIONS 11 7 OPERATION OF THE TEST EQUIPMENT 11 8 DISCLAIMER 12 9 REVISION HISTORY CISC Semicnductr GmbH Page 2 f 15

3 CISC 1 OVERVIEW The CISC is a cmpact, high-precisin RFID perfrmance and cnfrmance test system, develped fr UHF RFID reader and tag testing. Figure 1: The CISC is a UHF RFID perfrmance measurement prduct develped t be easily used fr tag frequency sensitivity, cmmunicatin range and backscatter pwer measurements as well as fr testing f UHF RFID readers. The device can perate within the frequency range f 500 MHz t 1.3 GHz. In the tag perfrmance tests, the measurement speed achieved can be as lw as 1 secnd per frequency. In the reader perfrmance and cnfrmance tests the signal recding is dne in real-time with n limitatin f the recrding time 1. The CISC Semicnductr leadership in bth standardizatin rganizatins ISO/IEC and GS1 EPCglbal, as well as mre than10 years f experience in RFID testing ensure that the test results cmply with the latest industry standards and guarantee a reliable prduct that can easily be used and applied by custmers. With dimensins f nly 160 x 205 x 50 mm, the CISC is the smallest, prfessinal measurement tl n the market, which guarantees high flexibility and easy transprtatin. Dismantling and setup can be accmplished within minutes, saving time and prviding user friendly handling. The device is available bth in the cnfiguratin f a cst effective versin fr tests in the pen air and as a high-precisin slutin fr measurements in an RF cntrlled envirnment using an RF test chamber. The test equipment is cntrlled using a graphical user interface (GUI). Additinally, an applicatin prgramming interface (API) is available fr the develpment f user-defined test sequences within standard develpment envirnments (e.g. C/C++, Labview). 1 Limitatin f the recrded data is given by the capacity f the data strage. Recrding speed f signals is 12.5 MB/s t 200 MB/s CISC Semicnductr GmbH Page 3 f 15

4 CISC 2 KEY FACTS 2.1 General High precisin Fast and easy t use Full autmatin Self-calibratin Cntrlled using GUI r API functins 2.2 Test mdes Tag perfrmance and cnfrmance Reader perfrmance and cnfrmance Tag t reader cmmunicatin and RF signal analysis 2.3 Supprted standards and prtcls Glbal UHF RFID prtcls ISO/IEC REV1 ISO/IEC Type C EPC Gen 2 V1.2.0 EPC Gen 2V2 Brazil RFID prtcls SINAV G0 ARTESP PA Brasil-ID P63 Test standards ISO/IEC GS1 EPCglbal Tag Perfrmance Parameters and Test Methds, versin ETSI EN V CISC Semicnductr GmbH Page 4 f 15

5 CISC 3 TAG TESTING The CISC tag Tester can be used fr testing cnfrmance and measuring perfrmance f bth standalne tags and tags applied t prducts. Figure 2: Setup f the UHF RFID tag perfrmance test system using the CISC 3.1 Tag Cnfrmance tests Fully autmated cmpliance testing f tags and tag ICs Pass/Fail result Reprt with details n results f individual test cases Cmpliant with prtcls and test standards listed in sectin CISC Semicnductr GmbH Page 5 f 15

6 CISC 3.2 Tag perfrmance tests Delivers key characteristics f a tag: Read range ver frequency (meters, feet) Backscatter range ver frequency (meters, feet) Minimum tag activatin electric field ver frequency (V/m) Minimum tag activatin pwer ver frequency (dbm) Tag backscatter pwer ver frequency (dbm) Delta radar crss-sectin ver frequency (dbm 2 ) Angular sensitivity tag radiatin pattern measurement Tag access tests Read/Write memry test Supprt f user-defined cmmands including crypt suite Analysis f multiple tags Inventry f all tags in the field Analyze selected tag ut f a ppulatin Cmpare perfrmance f multiple tags Selectin f best spt t place the tag n a prduct 2017 CISC Semicnductr GmbH Page 6 f 15

7 CISC Figure 3: Tag Perfrmance Test Panel 4 READER TESTING The CISC Reader Tester can be used fr perfrmance and cnfrmance tests f UHF RFID readers and tag-t-reader cmmunicatin and RF signal analysis. It supprts tw test mdes: 2017 CISC Semicnductr GmbH Page 7 f 15

8 CISC Sniffer Tag Emulatr Figure 4: Setup f the Reader Tester with the Tag Emulatr Cntact RF sensr mdule 2017 CISC Semicnductr GmbH Page 8 f 15

9 CISC 4.1 Functins Tag Emulatr mde with user-definable parameters: Memry cntent Timing Reader cmmand decder settings (Tari, RTcal, TRcal, delimiter, etc.) Optins fr fixed RN16/Handle, Skip cmmand CRC check, Dummy respnse CRC, etc. Reader testing ptins: ver the cable (using cnnectr interface) ver the air (using wireless sensr mdule interface) Sniffer mde t analyze the cmmunicatin between the reader and tags Real-time recrding f reader-tag cmmunicatin Recrding bandwidth f up t 50 MHz Spectrum analysis Data cntent analysis Autmatic detectin f reader cmmands and tags respnses Reader antenna radiatin pattern measurement Figure 5: Reader Perfrmance and Cnfrmance Test Panel 2017 CISC Semicnductr GmbH Page 9 f 15

10 CISC 5 SPECIFICATION Table 1: Electrical Specificatin PARAMETER SYMBOL VALUE UNIT Min. Typ. Max. Frequency range fbase MHz Extended frequency range fext 700 (500) 1100 (1300) Frequency step fstep 100 khz Frequency reference clck 2 TCXO 2.5 ppm RF prts impedance Z 50 hm System transmit pwer ver frequency band 800 MHz t 1000 MHz TX prt return lss ERP 2 RL (VSWR) Transmit pwer level reslutin Pstep 0.1 db RX prt input pwer - linear peratin - n damage 3 Pin 5 Spurius-free dynamic range SFDR 30 db Pwer measurement inaccuracy Pacc db Signal sampling rate tag tester fs MHz Signal sampling rate sniffer/reader tester fs MHz Timing measurement inaccuracy - sniffer - tag tester t 250 Receiver nise flr at 900 MHz PRXnise dbm Receiver sensitivity abve nise flr 3 PRXffset db Transmit antenna gain GTX 4 dbi Transmit antenna plarizatin 160 RHCP r linear Receive antenna gain GRX 4 dbi (33) (6:1) 37 MHz MHz W (dbm) db (-) dbm dbm ns ns 2 Frequency accuracy is based n temperature-cmpensated crystal scillatr (TCXO) vendr specificatins and is nt measured. 3 Ttal receiver sensitivity depends n many factrs including, but nt limited t, TX pwer level, envirnmental nise, and RX gain setting CISC Semicnductr GmbH Page 10 f 15

11 CISC Receive antenna plarizatin LHCP r linear Duratin f ne measurement step (Cmmand rate) tstep 65 ms Pwer supply vltage V Pwer supply frequency Hz Table 2: Mechanical Specificatin PARAMETER SYMBOL VALUE UNIT Min. Typ. Max. Weight f the unit 1.3 kg Dimensins f the unit W x L x H 160 x 205 x 50 mm Antenna weight 0.47 kg Antenna dimensins W x L x H 245 x 235 x 30 mm The is cntrlled using a Laptp r PC with Windws 7 32-bit ver an Ethernet cable. The Ethernet card must supprt at least 1 GBits/s. 6 ENVIRONMENTAL CONDITIONS Strage temperature range: -25 t +70 C Operating temperature range: +5 t +40 C (ambient temperature) Relative humidity (max.) 85 % relative humidity N water spray r cndensatin is allwed If the CISC has been stred utside the perating temperature range, it shall nt be perated until it has reached the envirnmental temperature cnditins. 7 OPERATION OF THE TEST EQUIPMENT The prduct r prducts described in this dcument are a part f r a set f test equipment fr radi equipment testing. The intended use f the equipment is fr measurements. As this test equipment may transmit in frequency ranges and at pwer level beynd lcal radi regulatins it may nly be used inside a measurement chamber r in a setup that des nt vilate emissins limits like a TEM cell. At its wn respnsibility the user r peratr may seek fr a site license r ther permissin frm radi frequency authrities fr use in ther envirnments CISC Semicnductr GmbH Page 11 f 15

12 CISC Operatin f the device with shrt r pen lad at the TX prt may result in permanent damage. CISC Semicnductr GmbH des nt accept respnsibility r liability fr use and applicatin f the prduct r prducts by the user. The sle respnsibility f cmplying with lcal laws and regulatins lies with the user. This applies especially fr any radi regulatins and human expsure t electrmagnetic fields. 8 DISCLAIMER Data sheet status Objective specificatin This data sheet cntains target r gal specificatins fr prduct develpment. Preliminary specificatin This data sheet cntains preliminary data; supplementary data may be published later. Prduct specificatin This data sheet cntains final prduct specificatins. Limiting values Limiting values given are in accrdance with the Abslute Maximum Rating System (IEC 134). Stress abve ne r mre f the limiting values may cause permanent damage t the device. These are stress ratings nly and peratin f the device at these r at any ther cnditins abve thse given in the characteristics sectin f the specificatin is nt implied. Expsure t limiting values fr extended perids may affect device reliability. Applicatin infrmatin and User Manuals Where applicatin r use infrmatin is given, it is advisry and des nt frm part f the specificatin. These prducts are nt designed fr use in life supprt appliances, devices, r systems where malfunctin f these prducts can reasnably be expected t result in persnal injury. CISC Semicnductr GmbH custmers using r selling these prducts fr use in such applicatins d s n their wn risk and agree t fully indemnify CISC Semicnductr GmbH fr any damages resulting frm such imprper use r sale CISC Semicnductr GmbH Page 12 f 15

13 CISC 9 REVISION HISTORY Table 3: Revisin Histry REVISION DATE PAGE DESCRIPTION Initial versin Update f Figure Update f Figure Update Table Update f sectins 1, 2 and Inserted sectin Release as preliminary specificatin Update Figure General update and extensin with tag emulatr mde Updated Table 1. V New dcument numbering intrduced. V Updated figures and sectin 5 and 7, inserted sectin CISC Semicnductr GmbH Page 13 f 15

14 CISC NOTES 2017 CISC Semicnductr GmbH Page 14 f 15

15 Abut CISC Semicnductr CISC Semicnductr GmbH is a design and cnsulting service cmpany fr industries develping embedded micrelectrnic systems with extremely shrt Time-T-Market cycles. Our cre cmpetences are: System design, mdeling, simulatin, verificatin and ptimizatin f hetergeneus embedded micrelectrnic systems with a particular fcus n Autmtive and RFID systems. Our custmers are cming frm Semicnductr, Autmtive, and RFID industry. The cmpany was funded in 1999 and is 100% private wned. CISC is managed by an internatinal team f highest skilled experts. Our main ffice is situated in Klagenfurt, Austria (clse t well knwn Wörthersee) at the heart f the Alpe-Adria-Regin. We are prud t be able t cnduct ur internatinal business frm this part f the wrld and als enjy ur life with ur families and friends within this beautiful nature. Being an independent cmpany CISC furthermre is able t prvide nn CAD/CAE market driven technlgy fr individual custmer slutins. CISC ffers cmmercial tls and techniques fr simulatin based system develpment f embedded micrelectrnic systems including RFID systems. Mre dcuments are available at the dwnlad sectin at CISC Reprductin in whle r in parts is prhibited withut the prir written cnsent f the cpyright wner. The infrmatin presented in this dcument des nt frm part f any qutatin r cntract, is believed t be accurate and reliable and may be changed withut ntice. N liability will be accepted by the publisher fr any cnsequence f its use. Publicatin theref des nt cnvey r imply any license under patent r ther industrial r intellectual prperty rights. SyAD, CISC RFID Field Recrder, CISC RFID TAG Emulatr, and MeETS are registered trademarks f CISC Semicnductr. Other prducts r brand names are trademark r registered trademarks f their respective hlders. CISC Semicnductr GmbH Lakeside B07, 9020 Klagenfurt, Austria