IR Emitter and Detector Product Data Sheet LTE-S9511-E Spec No.: DS Effective Date: 01/07/2014 LITE-ON DCC RELEASE

Transcription

1 IR Emitter and Detectr Prduct Data Sheet Spec N.: DS Effective Date: 1/7/214 Revisin: C LITE-ON DCC RELEASE BNS-OD-FC1/A4 LITE-ON Technlgy Crp. / Optelectrnics N.9,Chien 1 Rad, Chung H, New Taipei City 23585, Taiwan, R.O.C. Tel: Fax: /

2 IR Emitter and Detectr 1. Descriptin Lite-On ffers a brad range f discrete infrared cmpnents fr applicatin such as remte cntrl, IR wireless data transmissin, security alarm & etc. Custmers need infrared slutins featuring high pwer, high speed and wide viewing angels. The prduct line includes GaAs 94nm IREDs, AlGaAs high speed 85nm IREDs, PIN Phtdides and Phttransistrs. Phtdides and Phttransistrs can be prvided with a filter that reduces digital light nise in the sensr functin, which enables a high signal-t-nise rati Features Meet RHS, Green Prduct. Package In 8mm Tape On 13" Diameter Reels.. Cmpatible With Autmatic Placement Equipment. Cmpatible With Infrared Reflw Slder Prcess. EIA STD package. Peak wavelength λp=94nm Water clear plastic with side view lens. Misture-Sensitive Level Applicatins Infrared emitter PCB Munted Infrared Sensr 2. Outline Dimensins Ntes : 1. All dimensins are in millimeters (inches). 2. Tlerance is ±.1mm (.4") unless therwise nted. 3. Specificatins are subject t change withut ntice. 1/7 Part N. :

3 3. Abslute Maximum Ratings at TA=25 IR Emitter and Detectr Parameter Maximum Rating Unit Pwer Dissipatin 1 mw Peak Frward Current(3pps, 1μs pulse) 1 A DC Frward Current 5 ma Reverse Vltage 5 V Operating Temperature Range -4 C t + 85 C Strage Temperature Range -55 C t + 1 C Infrared Sldering Cnditin 26 C fr 1 Secnds Max. 4. Electrical / Optical Characteristics at TA=25 Parameter Symbl Min. Typ. Max. Unit Test Cnditin Radiant Intensity I E mw/sr I F = 2mA Peak Emissin Wavelength λ Peak nm I F = 2mA Spectral Line Half-Width Δλ nm I F = 2mA Frward Vltage V F V I F = 2mA Reverse Current I R μa V R = 5V Viewing Angle 2θ 1/ deg NOTE: 1. θ1/2 is the ff-axis angle at which the luminus intensity is half the axial luminus intensity. 2. The dminant wavelength, λd is derived frm the CIE chrmaticity diagram and represents the single wavelength which defines the clr f the device. 3. Reverse vltage (V R) cnditin is applied fr IR test nly. The device is nt designed fr reverse peratin. Bin Cde List Radiant Intensity Unit mw/sr@2ma Bin Cde Min Max K 4 6 L M 6 9 N /7 Part N. :

4 V alue at IF=2m A Output Pwer Relative T Relative Radiant Intensity Frward Current (m A ) Output Pwer Relative T V alue at IF=2m A Relative Radiant Intensity Frw ard C urrent IF (m A ) 5. Typical Electrical / Optical Characteristics Curves (25 C Ambient Temperature Unless Otherwise Nted) IR Emitter and Detectr W avelength (nm ) FIG.1 S P E C TR A L D IS TR IB U TIO N A m bient Tem perature Ta ( C ) FIG.2 FO R W A R D C U R R E N T V S. A M B IE N T TE M P E R A TU R E Frward Vltage (V ) FIG.3 FO R W A R D C U R R E N T V S. FO R W A R D V O LTAG E A m bient Tem perature Ta ( C ) FIG.4 R E LA TIV E R A D IA N T IN TEN S ITY V S. A M B IE N T TE M P E R A TU R E Fward Current (m A ) FIG.5 R E LA TIV E R A D IA N T IN TEN S ITY V S. FO R W A R D C U R R E N T FIG.6 R A D IA TIO N D IA G R A M 3/7 Part N. :

5 6. Suggest Sldering Pad Dimensins IR Emitter and Detectr 7. Package Dimensins Of Tape And Reel Nte: All dimensins are in millimeters (inches). 4/7 Part N. :

6 IR Emitter and Detectr Nte: 1. All dimensins are in millimeters (inches). 2. Empty cmpnent pckets sealed with tp cver tape inch reel-9 pieces per reel. 4. The maximum number f cnsecutive missing lamps is tw. 5. In accrdance with ANSI/EIA A-1994 specificatins. 8. CAUTIONS 8.1. Applicatin The LEDs described here are intended t be used fr rdinary electrnic equipment (such as ffice equipment, cmmunicatin equipment and husehld applicatins).cnsult Liten s Sales in advance fr infrmatin n applicatins in which exceptinal reliability is required, particularly when the failure r malfunctin f the LEDs may directly jepardize life r health (such as in aviatin, transprtatin, traffic cntrl equipment, medical and life supprt systems and safety devices) Strage The package is sealed: The LEDs shuld be stred at 3 C r less and 9%RH r less. And the LEDs are limited t use within ne year, while the LEDs is packed in misture-prf package with the desiccants inside. The package is pened: The strage ambient fr the LEDs shuld nt exceed 3 C temperature r 6% relative humidity. It is recmmended that LEDs ut f their riginal packaging are IR-reflwed within ne week hrs. Fr extended strage ut f their riginal packaging, it is recmmended that the LEDs be stred in a sealed cntainer with apprpriate desiccant, r in a desiccatrs with nitrgen ambient. LEDs stred ut f their riginal packaging fr mre than ne week hrs shuld be baked at abut 6 deg C fr at least 2 hurs befre slder assembly Cleaning Use alchl-based cleaning slvents such as isprpyl alchl t clean the LEDs if necessary. 5/7 Part N. :

7 8.4. Sldering Recmmended sldering cnditins: Reflw Sldering IR Emitter and Detectr Sldering irn Pre-heat Pre-heat time Peak temperature Sldering time 15~2 C 12 secnds Max. 26 C Max. 1 secnds Max.(Max. tw times) Temperature Sldering time 3 C Max. 3 secnds Max. (ne time ne) Because different bard designs use different number and types f devices, slder pastes, reflw vens, and circuit bards, n single temperature prfile wrks fr all pssible cmbinatins. Hwever, yu can successfully munt yur packages t the PCB by fllwing the prper guidelines and PCB-specific characterizatin. LITE-ON Runs bth cmpnent-level verificatin using in-huse KYRAMX98 reflw chambers and bard-level assembly. The results f this testing are verified thrugh pst-reflw reliability testing. Prfiles used at LITE-ON are based n JEDEC standards t ensure that all packages can be successfully and reliably surface munted. Figure n page3 shws a sample temperature prfile cmpliant t JEDEC standards. Yu can use this example as a generic target t set up yur reflw prcess. Yu shuld adhere t the JEDEC prfile limits as well as specificatins and recmmendatins frm the slder paste manufacturer t avid damaging the device and create a reliable slder jint Drive Methd An LED is a current-perated device. In rder t ensure intensity unifrmity n multiple LEDs cnnected in parallel in an applicatin, it is recmmended that a current limiting resistr be incrprated in the drive circuit, in series with each LED as shwn in Circuit A belw. Circuit mdel (A) Circuit mdel (B) LED LED (A) Recmmended circuit (B) The brightness f each LED might appear different due t the differences in the I-V characteristics f thse LEDs. 6/7 Part N. :

8 9. Reliability Test IR Emitter and Detectr Classificatin Test Item Test Cnditin Reference Standard Operatin Life Ta= Under Rm Temperature As Per Data Sheet Maximum Rating Test Time= 1HRS MIL-STD-75D:126 (1995) MIL-STD-883G:15 (26) Endurance Test High Temperature High Humidity strage (THB) Ta= 85 C RH= 85% Test Time= 5HRS MIL-STD-22G:13B (22) JEITA ED-471:1 13 (21) High Temperature Strage Ta= 1±5 C Test Time= 5HRS MIL-STD-75D:131 (1995) MIL-STD-883G:18 (26) JEITA ED-471:2 21 (21) Lw Temperature Strage Ta= -55±5 C Test Time=5HRS JEITA ED-471:2 22 (21) Temperature Cycling -55 C ~ 25 C ~ 15 C ~ 25 C, 3mins~5mins~ 3mins~5mins Test time: 2 Cycles MIL-STD-75D:151 (1995) MIL-STD-883G:11 (26) JEITA ED-471:1 15 (21) JESD22-A14C (25) Envirnmental Thermal Shck 1 ± 5 C ~ -3 C ± 5 C 15mins 15mins Test time: 2 Cycles MIL-STD-75D:156 (1995) MIL-STD-883G:111 (26) MIL-STD-22G:17G (22) JESD22-A16B (24) Test Slder Resistance T.sl = 26 ± 5 C Dwell Time= 1±1 secnds MIL-STD-75D:231(1995) JEITA ED-471: 3 32 (21) Slderability T. sl = 235 ± 5 C Dwell Time= 2 ± 1 secnds ( 95% f the dipped surface) MIL-STD-75D:226 (1995) MIL-STD-883G:23 (26) MIL-STD-22G:28H (22) IPC/EIA J-STD-2 (24) 1. Others The appearance and specificatins f the prduct may be mdified fr imprvement, withut prir ntice. 7/7 Part N. :