Acceptance and verification PCI tests according to MIL-STD

Transcription

1 Acceptance and verificatin PCI tests accrding t MIL-STD Bertrand Daut, mntena technlgy V1 - August 2013 CONTENTS 1. INTRODUCTION DEFINITIONS SCHEMATIC OF THE TEST SETUP WITH USE OF COUPLERS Acceptance tests Verificatin tests Shrt pulse verificatin test Intermediate pulse verificatin test Charge line verificatin test RESISTOR VALUE OF THE TERMINATION LOAD Intrductin This dcument describes the acceptance and the verificatin HEMP PCI tests accrding t MIL-Std , especially the set-up, the cupling / decupling netwrk and the selectin f the terminatin lads. 2. Definitins The PCI (Pulsed Current Injectin) shall be carried ut successively in tw different phases: the acceptance test and the verificatin test. The standard MIL-Std gives the fllwing definitins: Acceptance test (paragraph 3.3.9): An acceptance test f a system, subsystem, r cmpnent perfrmed t ensure that specified HEMP perfrmance characteristics have been met. HEMP acceptance tests, cnducted near the cnclusin f a hardening cnstructin r installatin cntract, are tests fr the purpse f demnstrating that at least minimum perfrmance requirements f the HEMP prtectin subsystem have been achieved befre the subsystem is accepted by the Gvernment frm the cntractr. Verificatin test (paragraph ): Tests cnducted fr demnstrating that the installed HEMP prtectin subsystem prvides the required HEMP hardness. These tests are perfrmed after the cnstructin and acceptance testing are cmplete and after the equipment is installed and functining t determine if the peratinal system suffers missin-abrting damage r upset due t simulated HEMP excitatins. Verificatin is nrmally a Gvernment-cnducted test and is nt part f a facility cnstructin cntract. The acceptance test set-up is different frm the verificatin test set-up as shwn in the next paragraphs. 1/5

2 3. Schematic f the test setup with use f cuplers 3.1 Acceptance tests Direct cupling 1 line test Dummy lad Shrt r intermediate Acceptance tests require wire t grund tests nly. The pulse generatr is directly cnnected t the prtecting device (direct cupling). The line n the prtected side is terminated by a dummy lad. Injected and residual current are measured and cmpared t pass-fail criteria f the standard. 3.2 Verificatin tests Shrt pulse verificatin test Pulse islatin Capacitive cupling with CCS3 Decupler DL3 Capacitive CCS3 Running Equipments under test Active pwer line + external equipements nt under test! Pwer The abve picture shws a cmmn mde injectin with the CCS3 cupler. Wire t grund test is the same as cmmn mde, but with cupling n ne line nly. The capacitive cupler CCS3 allws an injectin f the generatr utput pulse t all cnnected wire withut shrtcutting them tgether. The decupling bx DL3 is a 4 lines filter t blck as much as pssible the injected transient current twards the pwer grid side. 2/5

3 Injected and residual current are measured and cmpared t pass-fail criteria f the standard. Fr series f tests n pwer line filters, it can be useful t install shrt cables with pwer plugs cnnectrs n the CCS3 and the DL3 t ease the test prcedure. The CCS3 and the DL3 are designed fr up t 60 Arms current per phase. We als prpse a set f CCL2500 cuplers. These cuplers have the same functinality than the CCS3, but are in a different packaging: each CCL3 is fr ne single wire and has a utput shrt cable with an alligatr clamp. This is especially interesting t d the injectin n high current pwer lines, fr which the CCS3 cannt be used due t its 60 Arms limitatin. Capacitive cupling with N x CCL2500 Decupler DL3 Pwer N x CCL2500 The abve picture shws a cmmn mde injectin with the 4 x CCL2500 cuplers. Wire t grund test is the same as cmmn mde, but with cupling n ne line nly. We prpse an inductive cupler (= large injectin clamp) fr cmmn mde injectin n high number f wires. This is especially useful t test prtectin device f multiple wire data cables. The magnetic cuple has sme high frequency limitatin and shall nly be used when n ther slutin is applicable. Inductive cupling Audi and data system Frm and t system Inductive cupler IC3B Shrt 3/5

4 3.2.2 Intermediate pulse verificatin test Pulse islatin Cupling internal T generatr Islatin transfrmer Pwer The intermediate pulse generatr has 4 independent utputs which can be cnnected t 4 wires fr cmmn mde injectin r t ne single wire fr wire t grund injectin. There is n need fr cuplers. Due t the lw frequency cntent f the intermediate pulse, it is nt pssible t have prper filters t blck the prpagatin f the current pulse back t the pwer grid side n each wire individually. Only cmmn mde pulse can be blcked by the upstream 3 phases pwer transfrmer Charge line verificatin test Charge line test n antenna entry pint shall be dne as shwn in the belw diagram. The charge line test shall be perfrmed n shield-t-grund and wire-t-shield cnfiguratins. In bth cnfiguratins n cupler is needed. The utput f the charge line generatr can be cnnected t the wire r t the shield directly. 4/5

5 4. Resistr value f the terminatin lad Terminatin lad are nly used during the acceptance tests. The standard refers t fllwing resistr values: 50 hm in sme cases r 2 hm r Vrated / Irated, whichever is smaller in ther cases. In mst f the cases the specified 50 hm and 2 hm resistrs values are sufficient t perfrm the tests. Smaller resistr values are nly required in case f acceptance test n lw vltage, high current filters. We prpse 0.5 hm and 0.2 hm values. This crrespnds fr instance t fllwing examples: Fr 12 V pwer filter, the 2 hm resistr shall be used fr filters with nminal current up t 6 A. The 0.5 hm crrespnds t a nminal current f 24 A. The 0.2 hm fr a nminal current f 60 A. Fr 48V pwer filter, the 2 hm resistr shall be used fr filters with nminal current up t 24 A. The 0.5 hm crrespnds t a nminal current f 96 A. The 0.2 hm fr a nminal current f 240 A. Fr 230V pwer filter, the 2 hm resistr shall be used fr filters with nminal current up t 130 A. The resistr shall be nn-inductive and it is nt pssible t design cntinuusly variable nn inductive resistr fr the expected vltage, current and frequency. We recmmend using the available resistr with the nearest value. But we can prvide ther values f resistrs if desired. File: System_descriptin_PCI_Tests_acceptance_verificatin_V1.dc 5/5