L293D QUADRUPLE HALF-H DRIVER

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1 00-m Current Capability Per Driver Pulsed Current.- Per Driver Clamp Diodes for Inductive Transient Suppression Wide Supply Voltage Range 4.5 V to V Separate -ogic Supply Thermal Shutdown Internal ESD Protection igh-noise-immunity s Functional Replacement for SGS description The is a quadruple high-current half- driver designed to provide bidirectional drive currents of up to 00-m at voltages from 4.5 V to V. It is designed to drive inductive loads such as relays, solenoids, dc and bipolar stepping motors, as well as other high-current/high-voltage loads in positive-supply applications. ll inputs are TT-compatible. Each output is a complete totem-pole drive circuit with a Darlington transistor sink and a pseudo-darlington source. Drivers are enabled in pairs with drivers and enabled by and drivers and 4 enabled by, 4. When an enable input is high, the associated drivers are enabled, and their outputs are active and in phase with their inputs. External high-speed output clamp diodes should be used for inductive transient suppression. When the enable input is low, those drivers are disabled, and their outputs are off and in a high-impedance state. With the proper data inputs, each pair of drivers form a full- (or bridge) reversible drive suitable for solenoid or motor applications. V CC terminal, separate from V CC, is provided for the logic inputs to minimize device power dissipation. The is designed for operation from 0 C to 0 C. ET SINK ND GROUND logic symbol V CC 0 5 NE PCKGE (TOP VIEW) V CC ET SINK ND GROUND Y This symbol is in accordance with NSI/IEEE Std -84 and IEC Publication -. logic diagram 0 5 INPUTS X FUNCTION TBE (each driver) 4 OUTPUT Y Z Y 4 = high-level, = low level, X = irrelevant, Z = high-impedance (off) In the thermal shutdown mode, the output is in the high-impedance state regardless of the input levels. Y PRODUCTION DT information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright 0, Texas Instruments Incorporated POST OFFICE BOX 550 DS, TEXS 55

2 schematics of inputs and outputs EQUIVT OF EC INPUT TYPIC OF OUTPUTS VCC VCC Current Source absolute maximum ratings over operating free-air temperature range (unless otherwise noted) NOTES: ogic supply voltage range, V CC (see Note ) V supply voltage range, V CC V voltage range, V I V voltage range, V O V to V CC + V Peak output current (nonrepetitive, t 00 µs) ±. Continuous output current, I O ±00 m Continuous total dissipation at (or below) 5 C free-air temperature (see Notes and ) mw Continuous total dissipation at 80 C case temperature (see Note ) mw Operating case or virtual junction temperature range, T J C to 50 C Storage temperature range, T stg C to 50 C ead temperature, mm (/ inch) from case for 0 seconds C. ll voltage values are with respect to the network ground terminal.. For operation above 5 C free-air temperature, derate linearly at the rate of. mw/ C.. For operation above 5 C case temperature, derate linearly at the rate of.4 mw/ C. Due to variations in individual device electrical characteristics and thermal resistance, the built-in thermal overload protection may be activated at power levels slightly above or below the rated dissipation. recommended operating conditions MIN MX UNIT ogic supply voltage, VCC 4.5 V supply voltage, VCC VCC V igh-level input voltage, VI VCC V. VCC VCC V. ow-level input voltage, VI 0..5 V Operating free-air temperature, T 0 0 C The algebraic convention, in which the least positive (most negative) value is designated minimum, is used in this data sheet for logic voltage levels. V POST OFFICE BOX 550 DS, TEXS 55

3 electrical characteristics, V CC = 5 V, V CC = 4 V, T = 5 C PRMETER TEST CONDITIONS MIN TYP MX UNIT VO igh-level output voltage IO = 0. VCC.8 VCC.4 V VO ow-level output voltage IO = V VOK igh-level output clamp voltage IOK = 0. VCC+. V VOK ow-level output clamp voltage IOK = 0.. V II igh-level input current VI =V 0. ±0 µ II ow-level input current 0 VI =0 00 µ ll outputs at high level ICC ogic supply current IO = 0 ll outputs at low level 5 0 m ll outputs at high impedance 8 4 ll outputs at high level 4 4 ICC supply current IO = 0 ll outputs at low level m ll outputs at high impedance 4 switching characteristics, V CC = 5 V, V CC = 4 V, T = 5 C PRMETER TEST CONDITIONS MIN TYP MX UNIT tp Propagation delay time, low-to-high-level output from input 800 ns tp Propagation delay time, high-to-low-level output from input 400 ns C =0 pf, See Figure tt Transition time, low-to-high-level output 00 ns tt Transition time, high-to-low-level output 00 ns PRMETER MESUREMT INFORMTION 5 V 4 V 0%.5 V tf tr 0%.5 V V Pulse Generator (see Note ) V VCC VCC Y C = 0 pf (see Note B) 0% 0% 0 tw tp tp 0% 0% VO 50% 50% 0% 0% VO tt tt TEST CIRCUIT VOTGE WVEFORMS NOTES:. The pulse generator has the following characteristics: tr 0 ns, tf 0 ns, tw = 0 µs, PRR = 5 kz, ZO = 50 Ω. B. C includes probe and jig capacitance. Figure. Test Circuit and Voltage Waveforms POST OFFICE BOX 550 DS, TEXS 55

4 PPICTION INFORMTION 5 V 4 V 0 kω VCC VCC Control Motor Control B 0 Y 5 4 Thermal Shutdown 4, 5,, Figure. Two-Phase Motor Driver 4 POST OFFICE BOX 550 DS, TEXS 55

5 IMPORTNT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. ll products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTIN PPICTIONS USING SEMICONDUCTOR PRODUCTS MY INVOVE POTTI RISKS OF DET, PERSON INJURY, OR SEVERE PROPERTY OR VIRONMT DMGE ( CRITIC PPICTIONS ). TI SEMICONDUCTOR PRODUCTS RE NOT DESIGNED, UTORIZED, OR WRRNTED TO BE SUITBE FOR USE IN IFE-SUPPORT DEVICES OR SYSTEMS OR OTER CRITIC PPICTIONS. INCUSION OF TI PRODUCTS IN SUC PPICTIONS IS UNDERSTOOD TO BE FUY T TE CUSTOMER S RISK. In order to minimize risks associated with the customer s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI s publication of information regarding any third party s products or services does not constitute TI s approval, warranty or endorsement thereof. Copyright 8, Texas Instruments Incorporated

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