54ACT11109, 74ACT11109 DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

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1 Inputs Are TTL-Voltage Compatible Flow-Through Architecture Optimizes PCB Layout Center-Pin V CC and GND Configuratio Minimize High-Speed Switching Noise EPIC (Enhanced-Performance Implanted CMOS) 1-µm Process 00-mA Typical Latch-Up Immunity at 12 C Package Optio Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 00-mil DIPs description These devices contain two independent J-K positive-edge-triggered flip-flops. A low level at the preset ( or ) or clear ( or 2CLR) input sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the J and K inputs meeting the setup time requirements are traferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the J and K inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by grounding K and tying J high. They also can perform as D-type flip-flops if J and K are tied together. 4ACT11109, 4ACT11109 The 4ACT11109 is characterized for operation over the full military temperature range of C to 12 C. The 4ACT11109 is characterized for operation from 40 C to C. EPIC is a trademark of Texas Itruments Incorporated. FUTION TABLE INPUTS OUTPUTS PRE CLR CLK J K Q Q L H X X X H L H L X X X L H L L X X X H H H H L L L H H H H L Toggle H H L H Q0 Q0 H H H H H L H H L X X Q0 Q0 This configuration is notable; that is, it will not persist when either PRE or CLR retur to the inactive (high) level. 4ACT J PACKAGE 4ACT D OR N PACKAGE (TOP VIEW) GND ACT FK PACKAGE (TOP VIEW) VCC GND 2CLR No internal connection V CC 2CLR PRODUCTION DATA information is current as of publication date. Products conform to specificatio per the terms of Texas Itruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright 199, Texas Itruments Incorporated POST OFFICE BOX 0 DALLAS, TEXAS 2 2 1

2 logic symbol 2CLR S C1 R 2 This symbol is in accordance with ANSI/IEEE Std and IEC Publication Pin numbers shown are for the D, J, and N packages. absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, V CC V to V Input voltage range, V I (see Note 1) V to V CC + 0. V Output voltage range, V O (see Note 1) V to V CC + 0. V Input clamp current, I IK (V I < 0 or V I > V CC ) ±20 ma Output clamp current, I OK (V O < 0 or V O > V CC ) ±0 ma Continuous output current, I O (V O = 0 to V CC ) ±0 ma Continuous current through V CC or GND ±100 ma Storage temperature range C to 10 C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditio beyond those indicated under recommended operating conditio is not implied. Exposure to absolute-maximum-rated conditio for extended periods may affect device reliability. NOTE 1: The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed. recommended operating conditio 4ACT ACT11109 MIN MAX MIN MAX VCC Supply voltage V VIH High-level input voltage 2 2 V VIL Low-level input voltage V VI Input voltage CC CC V VO Output voltage CC CC V IOH High-level output current ma IOL Low-level output current ma t/ v Input traition rise or fall rate / V TA Operating free-air temperature C 2 2 POST OFFICE BOX 0 DALLAS, TEXAS 2

3 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VCC IOH = 0 µa IOH = 24 ma TA = 2 C 4ACT ACT11109 MIN TYP MAX MIN MAX MIN MAX 4. V V V V IOH = 0 ma. V. IOH = ma. V. IOL =0µA IOL =24mA 4. V V V V IOL = 0 ma. V 1. IOL = ma. V 1. II VI = VCC or GND. V ±0.1 ±1 ±1 µa ICC VI = VCC or GND, IO = 0. V µa ICC One input at.4 V, Other inputs at VCC or GND. V ma Ci VI = VCC or GND V. pf Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms. This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than or VCC. timing requirements over recommended operating free-air temperature range, V CC = V ± 0. V (unless otherwise noted) (see Figure 1) TA = 2 C 4ACT ACT11109 MIN MAX MIN MAX MIN MAX fclock Clock frequency MHz tw tsu Pulse duration Setup time before CLK PRE or CLR low... CLK high or low Data high or low... PRE or CLR inactive th Hold time, data after CLK V V switching characteristics over recommended operating free-air temperature range, V CC = V ± 0. V (unless otherwise noted) (see Figure 1) PARAMETER FROM TO TA = 2 C 4ACT ACT11109 (INPUT) (OUTPUT) MIN TYP MAX MIN MAX MIN MAX fmax MHz PRE or CLR CLK QorQ Q QorQ Q POST OFFICE BOX 0 DALLAS, TEXAS 2 2

4 operating characteristics, V CC = V, T A = 2 C PARAMETER TEST CONDITIONS TYP Cpd Power dissipation capacitance per flip-flop CL = 0 pf, f = 1 MHz 1 pf PARAMETER MEASUREMENT INFORMATION From Output Under Test tw CL = 0 pf (see Note A) 00 Ω Input LOAD CIRCUIT Timing Input (see Note B) Data Input tsu th Input (see Note B) In-Phase Output Out-of-Phase Output NOTES: A. CL includes probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 0 Ω, tr =, tf =. C. The outputs are measured one at a time with one input traition per measurement. Figure 1. Load Circuit and Voltage Waveforms 2 4 POST OFFICE BOX 0 DALLAS, TEXAS 2

5 IMPORTANT NOTICE Texas Itruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditio of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specificatio applicable at the time of sale in accordance with TI s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ( CRITICAL APPLICATIONS ). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. ILUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER S RISK. In order to minimize risks associated with the customer s applicatio, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applicatio assistance or customer product design. TI does not warrant or represent that any licee, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI s publication of information regarding any third party s products or services does not cotitute TI s approval, warranty or endorsement thereof. Copyright 199, Texas Itruments Incorporated

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