Scanning Electron MICROSCOPES. SEM-20/30, TableTop SEM-20. The Wise SEM for Your Application
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1 SEM-20/30, TableTop SEM-20 The Wise SEM for Your Application Navigation to Nanoworld With SEM How do you keep the forefront from competition in researching nanometer small world. MRC provides convenient Table-top SEM to industry and school which makes it possible having high resolution Image precisely and quickly. By adopting SEM, It is possible to observe nano-world and obtain high quality images without paying excessive expenses. High Quality Images with Economical Price SEM help customer to obtain urn and nm quality images within a few minutes. The size of SEM enhances space efficiency in the laboratory. SEM is the best reasonable instrument which help science teacher to give visual explanation to the students. SEM is also more affordable to small and medium industry company. MRC promises precise nano-world measurement using SEM. Material Analysis SEM helps to grasp material characteristiathrough providing precise images. SEM makes it possible to analyze deep submicron or nanometer structure. Alteration of material caused by pressure, heat can be detectable using SEM. High depth of field and dear image from SEM would be the best solution to find defects and changes of various materials. Pharmaceutical Chemistry The structure and size of material in pharmaceutical chemistry keep diminishing to reach nanometer in researching area. SEM can be utilized to view nanometer samples precisely and eventually help researcher to get exact output what is needed. Quality Control Tiny defects can be found exactly through having high quality Images with SEM. Deep submicron cracks that is hard to find using optical microscope can be detectable using SEM. Inspection with SEM may find out problems in manufacturing process and hence quality of product can be upgraded into higher level. Educational Purpose SEM leads students into the nano-world of science that has not been viewed practically in school. Now, numeral application such as cells, insect, pollen, metal texture, forensic evidence would be applicable with SEM. This instrument may derive students curiosity of nano-world which help to discover a talent of students.
2 Scanning Electron Specifications: Model SEM-20 Magnification Range x 20 ~ x Effective Magnification x Resolution Accelerating Voltage Electron Gun Detector Stage Sample Size Image Mode (Mod) Frame Rate Vacuum System Auto Functions 7nm (at 20kv SE Image) 1KV ~ 20KV (1/3/5/10/15/20KV) Tungsten Flarment (W) SE Detector default, BSE/EDS optional X: 35mm (Motorized), Y: 35mm (Motorized), R: 360, Z: 0 ~ 60mm 45mm (H), 70mm (Diameter) RED(320x240), TV(640x480), Slow(800x600), Phto(1280x960, 2560x1920, 5120x3840) RED (Max. 30 frarres/sec), TV (Max. 10 frames/sec), Slow(Max. 2 frams/sec) Turbo Molecular Pump Start,Focus,Filament,Brightness/contrast OS Windows 7 Operation Dimension Key Board/Mouse 400(W) x 600(L)x 550(H)mm, 90kg Model SEM-30 Magnification Range x 20 ~ x Effective Magnification x Resolution Accelerating Voltage Electron Gun Detector Stage Sample Size Image Mode (Mod) Frame Rate Vacuum System Auto Functions 5nm (at 30kv SE Image) 1KV ~ 30KV (1/3/5/10/15/20/30KV) Tungsten Flarment (W) SE Detector (optional: BSE/EDS) X: 35mm (Motorized), Y: 35mm (Motorized), T: 0 ~ 45 (Motorized) R: 360, Z: 0 ~ 60mm 45mm (H), 70mm (Diameter) RED(320x240), TV(640x480), Slow(800x600), Phto(1280x960, 2560x1920, 5120x3840) RED (Max. 30 frarres/sec), TV (Max. 10 frames/sec), Slow(Max. 2 frams/sec) Turbo Molecular Pump Start,Focus,Filament,Brightness/contrast OS Windows 7 Operation Dimension Key Board/Mouse 400(W) x 600(L)x 550(H)mm, 90kg
3 Automatic Stage 1. Automation of X,Y,T axis Stage. 2. Click & Move function Free magnification zooming function by mouse wheel. 4. Image focusing by mouse wheel Compare time-saving by Auto Stage Items Time for Sample Analysis (10 point basis) Manual Stage Time of 1 Point Analysis : 10 minutes - Vacuum : 3 minutes - Finding Sample : 3 minutes - Alignment & setting : 1 minute - Focusing : 30 seconds - Brightness and Contrast settings : 20 seconds - Image data acquisition : 30 seconds Time of 10 Points Analysis : about 48 minutes Auto Stage (SEM-30, SEM-20) Time of 1 Point Analysis : 8 minutes - Vacuum : 5 minutes - Finding Sample : 30 seconds - Alignment & setting : 1 minute - Focusing : 30 seconds - Brightness and Contrast settings : 20 seconds - Image data acquisition : 30 seconds Time of 10 Points Analysis : about 25 minutes
4 Scanning Electron Nanostation GUI Display Automatic Function: Auto Filament
5 Automatic Function: Auto Focus Automatic Function: Auto Contrast/Brightness MRC.4.14
6 Scanning Electron Clean Images: Maximum magnification x300,000 (Effective x100,000) Accurate focus by the fast frame on RED mode. Secure a large amount of beam with a short distance. The high brightness image is obtained by digital FPGA. Easy Maintenance by Modular Boards/Parts Established by modular parts/boards
7 Images from Metal Oxides: Images from SEM MRC.4.14
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