Index. B Back focal length, 12 Beam expander, 35 Berek, Max, 244 Binary phase grating, 326 Buried surface, 131,

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About the Author The author studied Technical Physics at the Technical University of Delft, The Netherlands. He obtained a master s degree in 1965 with a thesis on the fabrication of lasers.

1 About the Author The author studied Technical Physics at the Technical University of Delft, The Netherlands. He obtained a master s degree in 1965 with a thesis on the fabrication of lasers. After military service he found a position with Philips Electronics of Eindhoven, where he joined projects in holography, spectroscopy, optical recording, and semiconductor laser research. He obtained a doctor s degree from the University of Utrecht with a thesis on Fourier spectroscopy (1974). In the second half of his Philips career ( ) he was a consultant in industrial metrology. Dr. Velzel left Philips in 1997 to join the company Nano Focus (Oberhausen, Germany), of which he is a co-founder. After 7 years with Nano Focus, where he assisted in the development of confocal microscopes for surface characterisation, he started a new career as a teacher and consultant in optics, which he follows until the present day. Dr. Velzel is co-author of the book What Is Light, with his teacher Prof. A. C. S. van Heel and of many other publications and patents. He served on the International Commission for Optics as a Vice-President (for industry) from C. Velzel, A Course in Lens Design, Springer Series in Optical Sciences 183, DOI: / , Ó Springer Science+Business Media Dordrecht

2 Index A Abbe, Ernst, 36 Abbe s number, 79 Abbe s sine rule, 31 Aberration(s), balancing, 96 coefficients, 49, 53 chromatic, fifth order, plots, 103 Achromat, 79 Airspace (doublet), 136 Airy radius, 118 Amici, G. B., 298 Angle aperture, 20 field, 20 of incidence, 2 of reflection, 2 of refraction, 2 solve, 93 Angulon, 69, 292 Aperture angle, 20 numerical, 30, 116 Aplanatic doublet, surface, 56, 140, 304 Apochromat, 79, 130 Apochromatic microscope objective, 304, 307 triplet, 66 thin systems, 129 Aspheric surfaces, 137, Astigmatism correction of, 146 of eye, 30 of third order, 46 Axial colour, B Back focal length, 12 Beam expander, 35 Berek, Max, 244 Binary phase grating, 326 Buried surface, 131, C Camera, 25 lenses, obscura, 26 Cassegrain objective, CD objective, Celor, 66, Centering errors, 106, Channel capacity, 37 Chevalier lens, 64 Chromatic aberration, 47-48, longitudinal, 47, 84 transverse, 48, 84 Colour correction, Coma third order, 43 fifth order, 97 elliptic, 98 Conjugate shift equations, Constraints, 94 Convention for distances, 6 for angles, 7 Cooke triplet, Cornea, 27 Correction of axial colour, 79 of astigmatism, 145 of distortion, 78, of (thin) doublets, of field curvature, 77, C. Velzel, A Course in Lens Design, Springer Series in Optical Sciences 183, DOI: / , Ó Springer Science+Business Media Dordrecht

3 332 Index Correction (cont.) of lateral colour, 80 of two-component systems, 130, 132, D Damped least squares (DLS), 101 Defocussing error, 41 Degrees of freedom, 80, Diffraction theory, Diffractive lens, 326 Diffractive optics, Dispersion, 47, 126 Distortion, 47, 78 Double Gauss objective, 66, Doublet achromat aplanatic, cemented, Fraunhofer, 69 Gauss, 66 Steinheil, 69 Dupin, C, 1 E Ektar, 64 Elmar, 247 Elmax, 244 Equivalent index, 177 Abbe number, 177 Euclid, 3 Eye, model, 28 in triplets, 231 Grating equation, 326 Grubb lens, 64 H Height solve, 93 Heliar, Hologon, Huygens, Christiaen, 3 Huygens construction, 57 Huygens ocular, 74, 131, 146 I Ideal system, 92 Illumination, Image, 5 equation, 129 Immersion oil, 307 Incoherent, 119 Induced aberrations, 113 Invariant Abbe s, 8 optical, 16 Lagrange s, 50 skew, 46 Inversion, 167 Inverting prism, 168 K Kellner ocular, Kinoform, 327 Kron glass (K), 127 F Fabrication errors, 113 Farsightedness, 29 Fermat, Pierre de, 2 Field angle, 21 Field curvature, 45, 49, Field flattener, 313 Field lens, 33 Flat field microscope objective, Flint glass (F), 127 Front focal length (FFL), 13 G Glass chart, 127 Glass selection, 132 L Lay-out, paraxial, Leeuwenhoek, Anthoni van, 30 Lens Chevalier, 64, 161 field, 34 Grubb, 64 landscape, 64 65, , 161 Petzval, single, 12 tele, 68, thin, 19 Lens types, Linear variation, 101 Lister, J. J, 297 Lister type microscope objective,

4 Index 333 M Magnification, 7, 10, 12 angular, 30, 32 linear, 32 Magnification error, 42 Magnifier, 31 Malus, Etienne, 1 Maximum magnification, 31 Meridional coma, 45 field curvature, 47, 55 image surface, 52 plane, 46 rays, 46, 109 ray tracing, 109 Merit function(s), 93, variable of, 97 weight factors in, 94 Micro-objectives, Microscope, Microscope objective(s), apochromatic, flat field, Lister type, Tudorovsky, Microscopy dry, 308 immersion, 31, 308 wet, 307 Mirror concave, 6 convex, 7 Mirror objectives, Modulation depth, 94 Modulation transfer function (MTF), 105, MTF plots, 106, 190, 315 N Nearsightedness, 29 Newton objective, Nodal points, 29 O Object, 5 Oculars, 76 Huygens, 131, 146 Kellner, Plössl, Ramsden, 131, Optical instruments, Optical invariant, Optical materials, Optical path length, 2 Optical transfer function (OTF), 121 Optimization, P Paraxial approximation, 5 optics, 5 22 ray tracing, Partial dispersion, 79, 126 Perspective, 26 Petzval curvature, 51 lens, 65, 176, sum, 143 Phase function, 121 Pick-up solve, 93 Planar, Plate(s), 9 aberrations of, 170 Point spread function (PSF), 106, Position factor, 134 Power of lens, 13 of mirror, 6 of thin lens, 13 of thin lens system, 14 of surface, 7 Principal planes (points), 10 Prism(s), 8 9 of Porro, 168 Pupil(s), entrance, 20 exit, 20 Q Quaternary phase grating, 326 q-factor, 54 R Radiance, 36 Rapid rectilinear, 65 Ray chief, 21 finite, 109 marginal, 20 skew, 46 Ray-tracing paraxial, 14 meridional, 109 thin lenses, 18 Ray vectors, 24

5 334 Index Reflection law, 3 Refraction equation, 15 Refraction law, 3 Refractive index, 2 Relative coordinates, 39, 41 Retina, 27 Retinascope lay-out of, 180 eye lens of, 179 objective of, Reversed tele-objective, S Sagittal coma, 43 focus, 42 field curvature, 49, 154 oblique spherical aberration (SOBSA), 98 plane, 46 rays, 46 Scale factor, 76 Scale equation, 77 Schmidt camera, Seidel coefficients, Seidel, L. von, 50 Shape factor, 85 Skew rays, 46 Snell s law, 3 Snell, Willebrord, 3 Solves, 93 Spatial frequency, 105 Spherical aberration of third order, 43 of fifth order, 98 oblique, Spherochromatism, 48 Stigmatic imaging, 92 Spot diagrams, 103 Stop(s), aperture, 20 field, 21 Stop position, 141 Stop shift equations, 54, 86 Strain, 112 Strehl number, 106, Surface refractive, 7 spherical, 7 aspheric, 137 buried, 131 Symmetry, 138 mirror, 138, concentric, 138, 323 T Tangential, see Meridional Tangential oblique spherical aberration (TOBSA), Telecentricity, 22 Telecentric perspective, 26 Tele-objectives, 68, Telescope(s) Kepler s, 32 Dutch or Galilei s, 34 design of, Tessar, 68, Thickness, 90, 91 Thin lens, 14 Thin lens predesign, Throughput, 36 Tolerancing, , 311 Total internal reflection (TIR), 8 Transfer equation, 12, 15 Transmission of lenses, 63 Triplet, Tudorovsky objective, Tunnel diagram, 9 V Variables (in optimization), 95 Variables (in lay-out and predesign), see Degrees of freedom Vertex (V), 5 Vignetting, 20, 32, 142 W Wavefront, 1 3, Wavefront coefficients, 39 and Seidel coefficients, 50 Wavefront error, 94 plots, 105, 314 Weight factors, 93 Wide-angle lens, 68, Window(s) entrance, 20 exit, 20 Z Zonal aberration, 136 Zonal image, 41 Zoom lens, lay-out of, 82

GEOMETRICAL OPTICS AND OPTICAL DESIGN

GEOMETRICAL OPTICS AND OPTICAL DESIGN Pantazis Mouroulis Associate Professor Center for Imaging Science Rochester Institute of Technology John Macdonald Senior Lecturer Physics Department University of