Towards a Reconfigurable Nanocomputer Platform
|
|
- Gervais Franklin
- 5 years ago
- Views:
Transcription
1 Towards a Reconfigurable Nanocomputer Platform Paul Beckett School of Electrical and Computer Engineering RMIT University Melbourne, Australia 1 The Nanoscale Cambrian Explosion Disparity: Widerangeof emerging non-si technologies Diversity: Many new device options in CMOS, GaAs and other non-si NSC-1 2 1
2 Example Nanoscale Devices Disparity Silicon SOI Si-Ge Dual-gate Vertical FET Ballistic nano-fet RTD/ HFET RTT logic & memory Multivalued logic nanopipelining Heterojunction Nanotube CNT C60 logic &memory Nanotube array logic Largebandgap devices (AlN, BN) Molecular Rotaxane molecular x-bar CAEN Coulombcoupled optically pumped nanodevices DNA Magnetic Quantum dot Quantum diffraction FET Quantum interference devices surface superlattices RSFQ GMR/ CMR MQCA Hybrid- Hall effect Molecular nanomagnetics Magnetic RTD Q-Well 3 The Ideal Nanocomputer Platform? Very large, scalable with rich, local connectivity Built from simple devices that exhibit: High functionality (?) Gain > 1 Static (at least) and preferably non-volatile operation (Very) low power density Room temperature operation Reliable and fault tolerant Preferably no intrinsic reliance on any form of global signal (e.g. a master clock) Reconfigurable in operation, with little or no performance penalty 4 2
3 Three Example Nanoscale Systems 1. Multi-valued SRAM Based Platform RTD multi-valued RAM Dual-gate transistors 2. Phase Transition Device Based Platform Resistive thin-films 3. A Nano-Magnetic Platform Double spin-filter junction 5 Multi-valued SRAM Based Platform metal-insulator tunnel transistor (MITT) gate voltage modulates the tunnel barrier compatible with current fabrication processes can be buried in oxide layer Proposed dual-gate increases functionality Low-overhead reconfiguration Source Top Gate gate insulator gate insulator Back Gate substrate A 0.0V -0.1V -0.2V Drain Tunnel Insulator -0.3V C -0.4V Second-Gate Voltage B V G1 6 V DD R L V G2 3
4 Multi-valued SRAM Based Platform 3-state memory (Wei & Lin) V 1-3 matched by adjusting RTD barrier layer thicknesses Word Line V DD3 I I D P Word Line R L insulator Bit Line RTDs RTDs VDD VSS VSS VDD Out 1 Substrate 1 Gnd Substrate 2 R L it Line V SS I V V SS V 1 V 2 V 3 7 V DD3 Ultimate dimensions 50nm ~3 x10 9 cells/cm 2 V D Non-volatility Chalcogenide Films Word Line Chalcogenide films act as fast non-volatile programmable resistor Compatible with current (CMOS) logic fabrication Scales well to nanoscale dimensions (20-30nm) Vertical integration SiO 2 Bit Line TiW Heater Al n <100nm n+ V A V SS p word line Polycrystalline Chalcogenide V dd plane internal routing top gate/input gate insulator tunnel insulator gate insulator back gate ground plane schottky metal bit line substrate layer 8 4
5 Double Spin-Filter Tunnel Junction Magnetoresistive tunnel device (Worledge & Geballe) Potentially very high GMR Formed from two different layers that are insulating but magnetic with unequal coercivities parallel nonmagnetic electrode pinned magnetic barrier free magnetic barrier nonmagnetic electrode Antiparallel pinned barrier free barrier J J E f d d 9 E f Vertical Double Spin-Filter Junction Resistance is varied between the inner pillar and the multiple outer conductors Requires ~20Ǻ films on vertical pillar No obvious candidates Thickness control and lattice matching will be important free layer inner conductor outer conductors (x 4) Substrate pinned layer a) Top View b) Side View c) Square Mesh Connections 10 5
6 Spin-Filter Based Platform RTD substrate adds non-linearity to effect logic VTT for isolation Junction densities in excess of 2 x /cm 2 possible RTD Vertical FET word line RTD RTD V DD tunnel junction BL BL BL gate dielectric vertical channel Conductive substrate 11 Spatial Computing Memory Hierarchy Tries to hide the cost of moving code and data items from one place to another in a processor system 3D memory (Zhang) Proposed as means memory and processing physically closer together memory layers Inter-level Dielectric IC substrate 3D ROM Zhang,
7 A 3D Reconfigurable Computing Platform Merged processor/ memory into 3D structure Reduced memory performance gap Extreme memory bandwidth Processing-in-memory; processing-is-memory memory/processor layers vertical interconnect base substrate 3D Processor/memory 13 Reconfigurable Nanoelectronic Devices? PRO Maximizes utility of small devices Reconfiguration overheads kept small (Mostly) evolving from existing techniques Compatible with logic synthesis systems CON Can they be built? Is the added complexity justified vs. (say) molecular approach? Will they efficiently support high-performance computer architectures 14 7
8 What s Next? Simulation of nano-magnetic materials Characterization of typical junctions e.g. tunneling conductance Simulation of GMR-based array platform Development of Spatial Computing techniques suited to this platform 15 Andinthelongterm? Decimation followed by diversification (Gould) Test against the environment ease of fabrication, cost, ease of use etc. Extinction for some, consolidation and growth for others 16 8
9 Towards a Reconfigurable Nanocomputer Platform Thank You Paul Beckett 17 9
Towards a Reconfigurable Nanocomputer Platform
Towards a Reconfigurable Nanocomputer Platform Paul Beckett School of Electrical & Computer Engineering, RMIT University 124 Latrobe St., Melbourne, Australia, 3000 pbeckett@rmit.edu.au Abstract Some ideas
More informationLecture #29. Moore s Law
Lecture #29 ANNOUNCEMENTS HW#15 will be for extra credit Quiz #6 (Thursday 5/8) will include MOSFET C-V No late Projects will be accepted after Thursday 5/8 The last Coffee Hour will be held this Thursday
More informationAlternatives to standard MOSFETs. What problems are we really trying to solve?
Alternatives to standard MOSFETs A number of alternative FET schemes have been proposed, with an eye toward scaling up to the 10 nm node. Modifications to the standard MOSFET include: Silicon-in-insulator
More informationINTRODUCTION: Basic operating principle of a MOSFET:
INTRODUCTION: Along with the Junction Field Effect Transistor (JFET), there is another type of Field Effect Transistor available whose Gate input is electrically insulated from the main current carrying
More informationParameter Optimization Of GAA Nano Wire FET Using Taguchi Method
Parameter Optimization Of GAA Nano Wire FET Using Taguchi Method S.P. Venu Madhava Rao E.V.L.N Rangacharyulu K.Lal Kishore Professor, SNIST Professor, PSMCET Registrar, JNTUH Abstract As the process technology
More informationNanoFabrics: : Spatial Computing Using Molecular Electronics
NanoFabrics: : Spatial Computing Using Molecular Electronics Seth Copen Goldstein and Mihai Budiu Computer Architecture, 2001. Proceedings. 28th Annual International Symposium on 30 June-4 4 July 2001
More informationAlternative Channel Materials for MOSFET Scaling Below 10nm
Alternative Channel Materials for MOSFET Scaling Below 10nm Doug Barlage Electrical Requirements of Channel Mark Johnson Challenges With Material Synthesis Introduction Outline Challenges with scaling
More informationNanoelectronics and the Future of Microelectronics
Nanoelectronics and the Future of Microelectronics Mark Lundstrom Electrical and Computer Engineering University, West Lafayette, IN August 22, 2002 1. Introduction 2. Challenges in Silicon Technology
More informationMagnetic and Electromagnetic Microsystems. 4. Example: magnetic read/write head
Magnetic and Electromagnetic Microsystems 1. Magnetic Sensors 2. Magnetic Actuators 3. Electromagnetic Sensors 4. Example: magnetic read/write head (C) Andrei Sazonov 2005, 2006 1 Magnetic microsystems
More informationCMOL: Hybrid of CMOS with Overlaid Nanogrid and Nanodevice Structure. John Zacharkow
CMOL: Hybrid of CMOS with Overlaid Nanogrid and Nanodevice Structure John Zacharkow Overview Introduction Background CMOS Review CMOL Breakdown Benefits/Shortcoming Looking into the Future Introduction
More informationInternational Center on Design for Nanotechnology Workshop August, 2006 Hangzhou, Zhejiang, P. R. China
Challenges and opportunities for Designs in Nanotechnologies International Center on Design for Nanotechnology Workshop August, 2006 Hangzhou, Zhejiang, P. R. China Sankar Basu Program Director Computing
More informationITRS MOSFET Scaling Trends, Challenges, and Key Technology Innovations
Workshop on Frontiers of Extreme Computing Santa Cruz, CA October 24, 2005 ITRS MOSFET Scaling Trends, Challenges, and Key Technology Innovations Peter M. Zeitzoff Outline Introduction MOSFET scaling and
More informationSemiconductor Memory: DRAM and SRAM. Department of Electrical and Computer Engineering, National University of Singapore
Semiconductor Memory: DRAM and SRAM Outline Introduction Random Access Memory (RAM) DRAM SRAM Non-volatile memory UV EPROM EEPROM Flash memory SONOS memory QD memory Introduction Slow memories Magnetic
More information2009 Spring CS211 Digital Systems & Lab 1 CHAPTER 3: TECHNOLOGY (PART 2)
1 CHAPTER 3: IMPLEMENTATION TECHNOLOGY (PART 2) Whatwillwelearninthischapter? we learn in this 2 How transistors operate and form simple switches CMOS logic gates IC technology FPGAs and other PLDs Basic
More informationOptical Fiber Communication Lecture 11 Detectors
Optical Fiber Communication Lecture 11 Detectors Warriors of the Net Detector Technologies MSM (Metal Semiconductor Metal) PIN Layer Structure Semiinsulating GaAs Contact InGaAsP p 5x10 18 Absorption InGaAs
More informationDepletion-mode operation ( 공핍형 ): Using an input gate voltage to effectively decrease the channel size of an FET
Ch. 13 MOSFET Metal-Oxide-Semiconductor Field-Effect Transistor : I D D-mode E-mode V g The gate oxide is made of dielectric SiO 2 with e = 3.9 Depletion-mode operation ( 공핍형 ): Using an input gate voltage
More informationPerformance Optimization of Dynamic and Domino logic Carry Look Ahead Adder using CNTFET in 32nm technology
IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 5, Issue 5, Ver. I (Sep - Oct. 2015), PP 30-35 e-issn: 2319 4200, p-issn No. : 2319 4197 www.iosrjournals.org Performance Optimization of Dynamic
More informationFinFET-based Design for Robust Nanoscale SRAM
FinFET-based Design for Robust Nanoscale SRAM Prof. Tsu-Jae King Liu Dept. of Electrical Engineering and Computer Sciences University of California at Berkeley Acknowledgements Prof. Bora Nikoli Zheng
More informationTopic 3. CMOS Fabrication Process
Topic 3 CMOS Fabrication Process Peter Cheung Department of Electrical & Electronic Engineering Imperial College London URL: www.ee.ic.ac.uk/pcheung/ E-mail: p.cheung@ic.ac.uk Lecture 3-1 Layout of a Inverter
More informationLOW-POWER SOFTWARE-DEFINED RADIO DESIGN USING FPGAS
LOW-POWER SOFTWARE-DEFINED RADIO DESIGN USING FPGAS Charlie Jenkins, (Altera Corporation San Jose, California, USA; chjenkin@altera.com) Paul Ekas, (Altera Corporation San Jose, California, USA; pekas@altera.com)
More informationMICROPROCESSOR TECHNOLOGY
MICROPROCESSOR TECHNOLOGY Assis. Prof. Hossam El-Din Moustafa Lecture 3 Ch.1 The Evolution of The Microprocessor 17-Feb-15 1 Chapter Objectives Introduce the microprocessor evolution from transistors to
More informationResonant Tunneling Device. Kalpesh Raval
Resonant Tunneling Device Kalpesh Raval Outline Diode basics History of Tunnel diode RTD Characteristics & Operation Tunneling Requirements Various Heterostructures Fabrication Technique Challenges Application
More informationHOW TO CONTINUE COST SCALING. Hans Lebon
HOW TO CONTINUE COST SCALING Hans Lebon OUTLINE Scaling & Scaling Challenges Imec Technology Roadmap Wafer size scaling : 450 mm 2 COST SCALING IMPROVED PERFORMANCE 3 GLOBAL TRAFFIC FORECAST Cloud Traffic
More informationAmbipolar electronics
Ambipolar electronics Xuebei Yang and Kartik Mohanram Department of Electrical and Computer Engineering, Rice University, Houston {xy3,mr11,kmram}@rice.edu Rice University Technical Report TREE12 March
More informationSilicon Photonics Technology Platform To Advance The Development Of Optical Interconnects
Silicon Photonics Technology Platform To Advance The Development Of Optical Interconnects By Mieke Van Bavel, science editor, imec, Belgium; Joris Van Campenhout, imec, Belgium; Wim Bogaerts, imec s associated
More informationEE 330 Lecture 7. Design Rules. IC Fabrication Technology Part 1
EE 330 Lecture 7 Design Rules IC Fabrication Technology Part 1 Review from Last Time Technology Files Provide Information About Process Process Flow (Fabrication Technology) Model Parameters Design Rules
More informationECE 340 Lecture 37 : Metal- Insulator-Semiconductor FET Class Outline:
ECE 340 Lecture 37 : Metal- Insulator-Semiconductor FET Class Outline: Metal-Semiconductor Junctions MOSFET Basic Operation MOS Capacitor Things you should know when you leave Key Questions What is the
More informationSub-micron technology IC fabrication process trends SOI technology. Development of CMOS technology. Technology problems due to scaling
Goodbye Microelectronics Welcome Nanoelectronics Sub-micron technology IC fabrication process trends SOI technology SiGe Tranzistor in 50nm process Virus The thickness of gate oxide= 1.2 nm!!! Today we
More informationSupplementary Figure 1 High-resolution transmission electron micrograph of the
Supplementary Figure 1 High-resolution transmission electron micrograph of the LAO/STO structure. LAO/STO interface indicated by the dotted line was atomically sharp and dislocation-free. Supplementary
More informationNEXT GENERATION SILICON PHOTONICS FOR COMPUTING AND COMMUNICATION PHILIPPE ABSIL
NEXT GENERATION SILICON PHOTONICS FOR COMPUTING AND COMMUNICATION PHILIPPE ABSIL OUTLINE Introduction Platform Overview Device Library Overview What s Next? Conclusion OUTLINE Introduction Platform Overview
More informationSession 3: Solid State Devices. Silicon on Insulator
Session 3: Solid State Devices Silicon on Insulator 1 Outline A B C D E F G H I J 2 Outline Ref: Taurand Ning 3 SOI Technology SOl materials: SIMOX, BESOl, and Smart Cut SIMOX : Synthesis by IMplanted
More informationLecture 33 - The Short Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 30, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 33-1 Lecture 33 - The Short Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 30, 2007 Contents: 1. MOSFET scaling
More informationDigital Design and System Implementation. Overview of Physical Implementations
Digital Design and System Implementation Overview of Physical Implementations CMOS devices CMOS transistor circuit functional behavior Basic logic gates Transmission gates Tri-state buffers Flip-flops
More informationSession 10: Solid State Physics MOSFET
Session 10: Solid State Physics MOSFET 1 Outline A B C D E F G H I J 2 MOSCap MOSFET Metal-Oxide-Semiconductor Field-Effect Transistor: Al (metal) SiO2 (oxide) High k ~0.1 ~5 A SiO2 A n+ n+ p-type Si (bulk)
More informationIn pursuit of high-density storage class memory
Edition October 2017 Semiconductor technology & processing In pursuit of high-density storage class memory A novel thermally stable GeSe-based selector paves the way to storage class memory applications.
More informationChapter 3: Basics Semiconductor Devices and Processing 2006/9/27 1. Topics
Chapter 3: Basics Semiconductor Devices and Processing 2006/9/27 1 Topics What is semiconductor Basic semiconductor devices Basics of IC processing CMOS technologies 2006/9/27 2 1 What is Semiconductor
More informationCourse Outcome of M.Tech (VLSI Design)
Course Outcome of M.Tech (VLSI Design) PVL108: Device Physics and Technology The students are able to: 1. Understand the basic physics of semiconductor devices and the basics theory of PN junction. 2.
More informationSimulation of High Resistivity (CMOS) Pixels
Simulation of High Resistivity (CMOS) Pixels Stefan Lauxtermann, Kadri Vural Sensor Creations Inc. AIDA-2020 CMOS Simulation Workshop May 13 th 2016 OUTLINE 1. Definition of High Resistivity Pixel Also
More information+1 (479)
Introduction to VLSI Design http://csce.uark.edu +1 (479) 575-6043 yrpeng@uark.edu Invention of the Transistor Vacuum tubes ruled in first half of 20th century Large, expensive, power-hungry, unreliable
More informationENG2410 Digital Design CMOS Technology. Fall 2017 S. Areibi School of Engineering University of Guelph
ENG2410 Digital Design CMOS Technology Fall 2017 S. reibi School of Engineering University of Guelph The Transistor Revolution First transistor Bell Labs, 1948 Bipolar logic 1960 s Intel 4004 processor
More informationCONTENTS. 2.2 Schrodinger's Wave Equation 31. PART I Semiconductor Material Properties. 2.3 Applications of Schrodinger's Wave Equation 34
CONTENTS Preface x Prologue Semiconductors and the Integrated Circuit xvii PART I Semiconductor Material Properties CHAPTER 1 The Crystal Structure of Solids 1 1.0 Preview 1 1.1 Semiconductor Materials
More informationMSE 410/ECE 340: Electrical Properties of Materials Fall 2016 Micron School of Materials Science and Engineering Boise State University
MSE 410/ECE 340: Electrical Properties of Materials Fall 2016 Micron School of Materials Science and Engineering Boise State University Practice Final Exam 1 Read the questions carefully Label all figures
More informationInvestigating the Electronic Behavior of Nano-materials From Charge Transport Properties to System Response
Investigating the Electronic Behavior of Nano-materials From Charge Transport Properties to System Response Amit Verma Assistant Professor Department of Electrical Engineering & Computer Science Texas
More informationComputing with nanoscale devices -- looking at alternate models
Oregon Health & Science University OHSU Digital Commons Scholar Archive May 2005 Computing with nanoscale devices -- looking at alternate models Karthikeyan VijayaRamachandran Follow this and additional
More informationHigh-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors
High-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors Veerendra Dhyani 1, and Samaresh Das 1* 1 Centre for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110016,
More informationHow material engineering contributes to delivering innovation in the hyper connected world
How material engineering contributes to delivering innovation in the hyper connected world Paul BOUDRE, Soitec CEO Leti Innovation Days - July 2018 Grenoble, France We live in a world of data In perpetual
More informationwrite-nanocircuits Direct-write Jaebum Joo and Joseph M. Jacobson Molecular Machines, Media Lab Massachusetts Institute of Technology, Cambridge, MA
Fab-in in-a-box: Direct-write write-nanocircuits Jaebum Joo and Joseph M. Jacobson Massachusetts Institute of Technology, Cambridge, MA April 17, 2008 Avogadro Scale Computing / 1 Avogadro number s? Intel
More informationLecture 0: Introduction
Lecture 0: Introduction Introduction Integrated circuits: many transistors on one chip. Very Large Scale Integration (VLSI): bucketloads! Complementary Metal Oxide Semiconductor Fast, cheap, low power
More informationThermal Management in the 3D-SiP World of the Future
Thermal Management in the 3D-SiP World of the Future Presented by W. R. Bottoms March 181 th, 2013 Smaller, More Powerful Portable Devices Are Driving Up Power Density Power (both power delivery and power
More informationEnabling Breakthroughs In Technology
Enabling Breakthroughs In Technology Mike Mayberry Director of Components Research VP, Technology and Manufacturing Group Intel Corporation June 2011 Defined To be defined Enabling a Steady Technology
More informationHomework 10 posted just for practice. Office hours next week, schedule TBD. HKN review today. Your feedback is important!
EE141 Fall 2005 Lecture 26 Memory (Cont.) Perspectives Administrative Stuff Homework 10 posted just for practice No need to turn in Office hours next week, schedule TBD. HKN review today. Your feedback
More informationMicrocontroller Systems. ELET 3232 Topic 13: Load Analysis
Microcontroller Systems ELET 3232 Topic 13: Load Analysis 1 Objective To understand hardware constraints on embedded systems Define: Noise Margins Load Currents and Fanout Capacitive Loads Transmission
More informationChapter 3 Basics Semiconductor Devices and Processing
Chapter 3 Basics Semiconductor Devices and Processing 1 Objectives Identify at least two semiconductor materials from the periodic table of elements List n-type and p-type dopants Describe a diode and
More informationNanotechnology, the infrastructure, and IBM s research projects
Nanotechnology, the infrastructure, and IBM s research projects Dr. Paul Seidler Coordinator Nanotechnology Center, IBM Research - Zurich Nanotechnology is the understanding and control of matter at dimensions
More informationModule-3: Metal Oxide Semiconductor (MOS) & Emitter coupled logic (ECL) families
1 Module-3: Metal Oxide Semiconductor (MOS) & Emitter coupled logic (ECL) families 1. Introduction 2. Metal Oxide Semiconductor (MOS) logic 2.1. Enhancement and depletion mode 2.2. NMOS and PMOS inverter
More informationLaser attacks on integrated circuits: from CMOS to FD-SOI
DTIS 2014 9 th International Conference on Design & Technology of Integrated Systems in Nanoscale Era Laser attacks on integrated circuits: from CMOS to FD-SOI J.-M. Dutertre 1, S. De Castro 1, A. Sarafianos
More informationChapter 7 Introduction to 3D Integration Technology using TSV
Chapter 7 Introduction to 3D Integration Technology using TSV Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan Outline Why 3D Integration An Exemplary TSV Process
More informationLecture 12 Memory Circuits. Memory Architecture: Decoders. Semiconductor Memory Classification. Array-Structured Memory Architecture RWM NVRWM ROM
Semiconductor Memory Classification Lecture 12 Memory Circuits RWM NVRWM ROM Peter Cheung Department of Electrical & Electronic Engineering Imperial College London Reading: Weste Ch 8.3.1-8.3.2, Rabaey
More informationJack Keil Wolf Lecture. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Lecture Outline. MOSFET N-Type, P-Type.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Jack Keil Wolf Lecture Lec 3: January 24, 2019 MOS Fabrication pt. 2: Design Rules and Layout http://www.ese.upenn.edu/about-ese/events/wolf.php
More informationLayout of a Inverter. Topic 3. CMOS Fabrication Process. The CMOS Process - photolithography (2) The CMOS Process - photolithography (1) v o.
Layout of a Inverter Topic 3 CMOS Fabrication Process V DD Q p Peter Cheung Department of Electrical & Electronic Engineering Imperial College London v i v o Q n URL: www.ee.ic.ac.uk/pcheung/ E-mail: p.cheung@ic.ac.uk
More informationNon-Volatile Memory Based on Solid Electrolytes
Non-Volatile Memory Based on Solid Electrolytes Michael Kozicki Chakku Gopalan Murali Balakrishnan Mira Park Maria Mitkova Center for Solid State Electronics Research Introduction The electrochemical redistribution
More informationEE 330 Lecture 7. Design Rules
EE 330 Lecture 7 Design Rules Last time: Response time of logic gates A Y C L t R C HL SWn L t R C LH SWp L C L proportional to #gates driven to avg input cap of gates R SW proportional length/width Last
More informationComparison of 32nm High-k Metal Gate Predictive Technology Model CMOS and MOSFET-Like CNFET compact Model Based Domino logic Circuits
Comparison of 32nm High-k Metal Gate Predictive Technology Model CMOS and MOSFET-Like CNFET compact Model Based Domino logic Circuits Saravana Maruthamuthu, Wireless Group Infineon Technologies India Private
More informationPreface to Third Edition Deep Submicron Digital IC Design p. 1 Introduction p. 1 Brief History of IC Industry p. 3 Review of Digital Logic Gate
Preface to Third Edition p. xiii Deep Submicron Digital IC Design p. 1 Introduction p. 1 Brief History of IC Industry p. 3 Review of Digital Logic Gate Design p. 6 Basic Logic Functions p. 6 Implementation
More informationEE4800 CMOS Digital IC Design & Analysis. Lecture 1 Introduction Zhuo Feng
EE4800 CMOS Digital IC Design & Analysis Lecture 1 Introduction Zhuo Feng 1.1 Prof. Zhuo Feng Office: EERC 730 Phone: 487-3116 Email: zhuofeng@mtu.edu Class Website http://www.ece.mtu.edu/~zhuofeng/ee4800fall2010.html
More informationvalue of W max for the device. The at band voltage is -0.9 V. Problem 5: An Al-gate n-channel MOS capacitor has a doping of N a = cm ;3. The oxi
Prof. Jasprit Singh Fall 2001 EECS 320 Homework 10 This homework is due on December 6 Problem 1: An n-type In 0:53 Ga 0:47 As epitaxial layer doped at 10 16 cm ;3 is to be used as a channel in a FET. A
More informationECE380 Digital Logic
ECE380 Digital Logic Implementation Technology: Standard Chips and Programmable Logic Devices Dr. D. J. Jackson Lecture 10-1 Standard chips A number of chips, each with a few logic gates, are commonly
More informationNANOELECTRONIC TECHNOLOGY: CHALLENGES IN THE 21st CENTURY
NANOELECTRONIC TECHNOLOGY: CHALLENGES IN THE 21st CENTURY S. M. SZE National Chiao Tung University Hsinchu, Taiwan And Stanford University Stanford, California ELECTRONIC AND SEMICONDUCTOR INDUSTRIES
More informationSemiconductor Physics and Devices
Metal-Semiconductor and Semiconductor Heterojunctions The Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is one of two major types of transistors. The MOSFET is used in digital circuit, because
More informationApplication Note Model 765 Pulse Generator for Semiconductor Applications
Application Note Model 765 Pulse Generator for Semiconductor Applications Non-Volatile Memory Cells Characterization The trend of memory research is to develop a new memory called Non-Volatile RAM that
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 3: January 24, 2019 MOS Fabrication pt. 2: Design Rules and Layout Penn ESE 570 Spring 2019 Khanna Jack Keil Wolf Lecture http://www.ese.upenn.edu/about-ese/events/wolf.php
More information3-D Modelling of the Novel Nanoscale Screen-Grid Field Effect Transistor (SGFET)
3-D Modelling of the Novel Nanoscale Screen-Grid Field Effect Transistor (SGFET) Pei W. Ding, Kristel Fobelets Department of Electrical Engineering, Imperial College London, U.K. J. E. Velazquez-Perez
More informationMagnetic Spin Devices: 7 Years From Lab To Product. Jim Daughton, NVE Corporation. Symposium X, MRS 2004 Fall Meeting
Magnetic Spin Devices: 7 Years From Lab To Product Jim Daughton, NVE Corporation Symposium X, MRS 2004 Fall Meeting Boston, MA December 1, 2004 Outline of Presentation Early Discoveries - 1988 to 1995
More informationPower-Delivery Network in 3D ICs: Monolithic 3D vs. Skybridge 3D CMOS
-Delivery Network in 3D ICs: Monolithic 3D vs. Skybridge 3D CMOS Jiajun Shi, Mingyu Li and Csaba Andras Moritz Department of Electrical and Computer Engineering University of Massachusetts, Amherst, MA,
More informationLecture 04 CSE 40547/60547 Computing at the Nanoscale Interconnect
Lecture 04 CSE 40547/60547 Computing at the Nanoscale Interconnect Introduction - So far, have considered transistor-based logic in the face of technology scaling - Interconnect effects are also of concern
More information2.8 - CMOS TECHNOLOGY
CMOS Technology (6/7/00) Page 1 2.8 - CMOS TECHNOLOGY INTRODUCTION Objective The objective of this presentation is: 1.) Illustrate the fabrication sequence for a typical MOS transistor 2.) Show the physical
More informationLow Energy Communication: NanoPhotonic & Electrical. Prof. Eli Yablonovitch EECS Dept. UC Berkeley
Low Energy Communication: NanoPhotonic & Electrical Prof. Eli Yablonovitch EECS Dept. UC Berkeley What is the energy cost of reading out your flash memory? Read the current going through a resistor, in
More informationSimulation and Analysis of CNTFETs based Logic Gates in HSPICE
Simulation and Analysis of CNTFETs based Logic Gates in HSPICE Neetu Sardana, 2 L.K. Ragha M.E Student, 2 Guide Electronics Department, Terna Engineering College, Navi Mumbai, India Abstract Conventional
More informationResearch Statement. Sorin Cotofana
Research Statement Sorin Cotofana Over the years I ve been involved in computer engineering topics varying from computer aided design to computer architecture, logic design, and implementation. In the
More informationThe Design of SET-CMOS Hybrid Logic Style of 1-Bit Comparator
The Design of SET-CMOS Hybrid Logic Style of 1-Bit Comparator A. T. Fathima Thuslim Department of Electronics and communication Engineering St. Peters University, Avadi, Chennai, India Abstract: Single
More informationWhite Paper Stratix III Programmable Power
Introduction White Paper Stratix III Programmable Power Traditionally, digital logic has not consumed significant static power, but this has changed with very small process nodes. Leakage current in digital
More informationIntegrated diodes. The forward voltage drop only slightly depends on the forward current. ELEKTRONIKOS ĮTAISAI
1 Integrated diodes pn junctions of transistor structures can be used as integrated diodes. The choice of the junction is limited by the considerations of switching speed and breakdown voltage. The forward
More informationECE 5745 Complex Digital ASIC Design Topic 2: CMOS Devices
ECE 5745 Complex Digital ASIC Design Topic 2: CMOS Devices Christopher Batten School of Electrical and Computer Engineering Cornell University http://www.csl.cornell.edu/courses/ece5950 Simple Transistor
More information3D SOI elements for System-on-Chip applications
Advanced Materials Research Online: 2011-07-04 ISSN: 1662-8985, Vol. 276, pp 137-144 doi:10.4028/www.scientific.net/amr.276.137 2011 Trans Tech Publications, Switzerland 3D SOI elements for System-on-Chip
More informationTransistor was first invented by William.B.Shockley, Walter Brattain and John Bardeen of Bell Labratories. In 1961, first IC was introduced.
Unit 1 Basic MOS Technology Transistor was first invented by William.B.Shockley, Walter Brattain and John Bardeen of Bell Labratories. In 1961, first IC was introduced. Levels of Integration:- i) SSI:-
More informationBody-Biased Complementary Logic Implemented Using AlN Piezoelectric MEMS Switches
University of Pennsylvania From the SelectedWorks of Nipun Sinha 29 Body-Biased Complementary Logic Implemented Using AlN Piezoelectric MEMS Switches Nipun Sinha, University of Pennsylvania Timothy S.
More informationOpportunities and Challenges for Nanoelectronic Devices and Processes
The Sixth U.S.-Korea Forum on Nanotechnology, April 28-29, 2009, Las Vegas, NV Opportunities and Challenges for Nanoelectronic Devices and Processes Yoshio Nishi Professor, Electrical Engineering, Material
More informationSEMINAR ON PERSPECTIVES OF NANOTECHNOLOGY FOR RF AND TERAHERTZ ELECTRONICS. February 1, 2013
SEMINAR ON PERSPECTIVES OF NANOTECHNOLOGY FOR RF AND TERAHERTZ ELECTRONICS February 1, 2013 GuideMr.Harikrishnan A.IAsst ProfessorANJUSEMINAR MICHAEL ONPERSPECTIVES (NSAJEEC013) OF NANOTECHNOLOGY FOR February
More informationA novel sensing algorithm for Spin-Transfer-Torque magnetic RAM (STT-MRAM) by utilizing dynamic reference
A novel sensing algorithm for Spin-Transfer-Torque magnetic RAM (STT-MRAM) by utilizing dynamic reference Yong-Sik Park, Gyu-Hyun Kil, and Yun-Heub Song a) Department of Electronics and Computer Engineering,
More informationTransistor Scaling in the Innovation Era. Mark Bohr Intel Senior Fellow Logic Technology Development August 15, 2011
Transistor Scaling in the Innovation Era Mark Bohr Intel Senior Fellow Logic Technology Development August 15, 2011 MOSFET Scaling Device or Circuit Parameter Scaling Factor Device dimension tox, L, W
More informationUNIT-VI FIELD EFFECT TRANSISTOR. 1. Explain about the Field Effect Transistor and also mention types of FET s.
UNIT-I FIELD EFFECT TRANSISTOR 1. Explain about the Field Effect Transistor and also mention types of FET s. The Field Effect Transistor, or simply FET however, uses the voltage that is applied to their
More informationSilicon Photonics Photo-Detector Announcement. Mario Paniccia Intel Fellow Director, Photonics Technology Lab
Silicon Photonics Photo-Detector Announcement Mario Paniccia Intel Fellow Director, Photonics Technology Lab Agenda Intel s Silicon Photonics Research 40G Modulator Recap 40G Photodetector Announcement
More informationPerformance Analysis of Vertical Slit Field Effect Transistor
Performance Analysis of Vertical Slit Field Effect Transistor Tarun Chaudhary 1 Gargi Khanna 2 1,2 Electronics and Communication Engineering Department National Institute of Technology, Hamirpur, (HP),
More informationFin-Shaped Field Effect Transistor (FinFET) Min Ku Kim 03/07/2018
Fin-Shaped Field Effect Transistor (FinFET) Min Ku Kim 03/07/2018 ECE 658 Sp 2018 Semiconductor Materials and Device Characterizations OUTLINE Background FinFET Future Roadmap Keeping up w/ Moore s Law
More informationEngr354: Digital Logic Circuits
Engr354: Digital Logic Circuits Chapter 3: Implementation Technology Curtis Nelson Chapter 3 Overview In this chapter you will learn about: How transistors are used as switches; Integrated circuit technology;
More informationDevice Technologies. Yau - 1
Device Technologies Yau - 1 Objectives After studying the material in this chapter, you will be able to: 1. Identify differences between analog and digital devices and passive and active components. Explain
More informationSilicon Single-Electron Devices for Logic Applications
ESSDERC 02/9/25 Silicon Single-Electron Devices for Logic Applications NTT Basic Research Laboratories Yasuo Takahashi Collaborators: : Yukinori Ono, Akira Fujiwara, Hiroshi Inokawa, Kenji Shiraishi, Masao
More informationCOMMERCIAL APPLICATIONS OF SPINTRONICS TECHNOLOGY
Presented at Nanomaterials 2004, Stamford, CT, October 25, 2004 COMMERCIAL APPLICATIONS OF SPINTRONICS TECHNOLOGY Carl H. Smith Senior Physicist, Advanced Technology Group NVE Corporation 11409 Valley
More informationEfficient logic architectures for CMOL nanoelectronic circuits
Efficient logic architectures for CMOL nanoelectronic circuits C. Dong, W. Wang and S. Haruehanroengra Abstract: CMOS molecular (CMOL) circuits promise great opportunities for future hybrid nanoscale IC
More informationVariation and Defect Tolerance for Nano Crossbars. Cihan Tunc
Variation and Defect Tolerance for Nano Crossbars A Thesis Presented by Cihan Tunc to The Department of Electrical and Computer Engineering in partial fulfillment of the requirements for the degree of
More information