Topic 3. CMOS Fabrication Process
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1 Topic 3 CMOS Fabrication Process Peter Cheung Department of Electrical & Electronic Engineering Imperial College London URL: p.cheung@ic.ac.uk Lecture 3-1
2 Layout of a Inverter V DD Q p v i v o Q n GND Lecture 3-2
3 The CMOS Process - photolithography (1) (a) Bare silicon wafer Silicon Wafer (b) Grow Oxide layer Silicon Wafer SiO 2 ~ 1µm (c) Spin on photoresist photoresist Silicon Wafer Lecture 3-3
4 The CMOS Process - photolithography (2) (d) Expose resist to UV light through a MASK (f) Etch away oxide Silicon Wafer Silicon Wafer (g) Remove remaining resist (e) Remove unexposed resist Silicon Wafer Silicon Wafer Lecture 3-4
5 Mask 1: N-well Diffusion SiO 2 is etched using Mask 1. Phosphorous Diffusion SiO 2 Phosphorous is diffused into the unmasked regions of silicon creating an n- well for the fabrication of p-channel devices Lecture 3-5
6 Mask 2: Define Active Regions Mask 2 creates the active regions where the MOSFETs will be placed Photoresist SiO 2 Photoresist A thick field oxide is grown using a contruction technique called Local Oxidation Of Silicon (LOCOS). The thick oxide regions provides isolation between the MOSFETs SiO 2 Lecture 3-6
7 Mask 3: Polysilicon Gate A high quality thin oxide is grown in the active area (~100A->300A) Mask 3 is used to deposit the polysilicon gate (most critical step) Thin Oxide SiO 2 The polysilicon layer is usually arsenic doped (n-type). The photolithography in this step is the most demanding since it requires the finest resolution to create the narrow MOS channels. SiO 2 Lecture 3-7
8 Mask 4: n+ Diffusion Mask 4 is used to control a heavy arsenic implant and create the source and drain of the n-channel devices. This is a self-aligned structure. Arsenic Implant Photoresist SiO 2 The polysilicon gate acts like a barrier for this implant to protect the channel region. n + n + SiO 2 n + Lecture 3-8
9 Mask 5: p+ Diffusion Mask 5 is used to control a heavy Boron implant and create the source and drain of the n-channel devices. This is a self-aligned structure. Boron Implant Photoresist SiO 2 The polysilicon gate acts like a barrier for this implant to protect the channel region. p + n + n + SiO 2 p + p + n + Lecture 3-9
10 Mask 6: Contact Holes A thin layer of oxide is deposited over the entire wafer Mask 6 is used to pattern the contact holes Etching opens the holes. oxide SiO p + n + n + 2 p + p + n + Etched contact holes SiO p + n + n + 2 p + p + n + Lecture 3-10
11 Mask 7: Metalization A thin layer of aluminum is evaporated or sputtered onto the wafer. Mask 7 is used to pattern the interconnection. SiO p + n + n + 2 p + p + n + Aluminum Interconnection SiO p + n + n + 2 p + p + n + Lecture 3-11
12 Cross section of a CMOS Inverter v i v o V DD p + n + n + Source-Body Connection Q n p + p + Q p n + Source-Body Connection Lecture 3-12
13 Physical Layout of an Inverter PMOS active region V DD NMOS active region Q p n + diffusion p + diffusion Poly 1 (poly-si gate) v i v o Contact Hole Metal 1 GND Q n Lecture 3-13
14 Dimension of transistors L L W n + n + Poly W p + Poly p + Source Drain Source Drain Gate n-channel MOSFET Gate p-channel MOSFET Lecture 3-14
15 Photo cross-section of a transistor Lecture 3-15
16 Advanced metalization with polishing Lecture 3-16
17 Latch-up problem (1) As shown above, the p+ region of the p-transistor, the and the p- substrate form a parasitic pnp transistor T1. The n- well, the p- substrate and the p+ source of the n-transistor forms another parasitic npn transistor T2. There exists two resistors Rw and Rs due to the resistive drop in the well area and the substrate area. Lecture 3-17
18 Latch-up (con t) T1 and T2 form a thyristor circuit. If Rw and/or Rs are not 0, and for some reason (power-up, current spike etc), T1 or T2 are forced to conduct, Vdd will be shorted to Gnd through the small resistances and the transistors. Once the circuit is 'fired', both transistors will remain conducting due to the voltage drop across Rw and Rs. The only way to get out of this mode is to turn the power off. This condition is known as latch-up. To avoid latch-up, substrate-taps (tied to Gnd) and well-taps (tied to Vdd) are inserted as frequently as possible. This has the effect of shorting out Rw and Rs. Lecture 3-18
Layout of a Inverter. Topic 3. CMOS Fabrication Process. The CMOS Process - photolithography (2) The CMOS Process - photolithography (1) v o.
Layout of a Inverter Topic 3 CMOS Fabrication Process V DD Q p Peter Cheung Department of Electrical & Electronic Engineering Imperial College London v i v o Q n URL: www.ee.ic.ac.uk/pcheung/ E-mail: p.cheung@ic.ac.uk
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