When Failure Analysis Meets Side-Channel Attacks
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1 When Failure Analysis Meets Side-Channel Attacks Jérôme DI-BATTISTA (THALES), Jean-Christophe COURREGE (THALES), Bruno ROUZEYRE (LIRMM), Lionel TORRES (LIRMM), Philippe PERDU (CNES)
2 Outline Introduction Context Failure analysis Test vehicle Light Emission as a Side-Channel signal Experimental setup Results Laser to improve Side-Channel attacks Experimental setup Results 1 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
3 Outline Introduction Context Failure analysis Test vehicle Light Emission as a Side-Channel signal Experimental setup Results Laser to improve Side-Channel attacks Experimental setup Results 2 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
4 Context Failure Analysis Test vehicle Context & Partnership CNES / Thales : Common laboratory : Failure analysis activity (CNES) Security evaluation ITSEF (Thales - CEACI ) Electrical and physical testing (Thales - CEL) 3 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
5 Context Failure Analysis Test vehicle Failure analysis overview Electrical Test Laser Stimulation Normal signature Leakage / Short Thermal (OBIRCH, TIVA ) Photoelectric (OBIC, LIVA ) FAILURE ANALYSIS MCI : Magnetic Current Microscopy EMMI : EMission MIcroscopy Weak Current (SQUID) Strong Current (MGR) Static (SEM) Dynamic (PICA, TRE ) 4 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
6 Context Failure Analysis Test vehicle Failure analysis overview Electrical Test Laser Stimulation Normal signature Leakage / Short Thermal (OBIRCH, TIVA ) Photoelectric (OBIC, LIVA ) FAILURE ANALYSIS MCI : Magnetic Current Microscopy EMMI : EMission MIcroscopy Weak Current (SQUID) Strong Current (MGR) Static (SEM) Dynamic (PICA, TRE ) 5 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
7 Context Failure Analysis Test vehicle FPGA sample Different view and informations about the FPGA Actel Proasic3e : d) X-ray image Layout informations / location of DES implementation Backside aperture FPGA test board Light Emission : Experiment on the 1 st DES round : 64 Messages Xor random Subkey => SBOX => Encrypted data Laser stimulation : Experiment on a full DES : Messages & random key => DES => Encrypted data 6 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
8 Outline Introduction Context Failure analysis Test vehicle Light Emission as a Side-Channel signal Experimental setup Results Laser to improve Side-Channel attacks Experimental setup Results 7 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
9 DLEA Results Light Emission in Failure Analysis nmos transistor Photon emission depends on: V GS, I DS, V DS & transistor size Inverter case Optical detector system detector system CCD silicium captor wavelength: λ = nm or InGaAs captor wavelength: λ = nm Infrared : λ = 780nm 100 µm Visible : λ = nm 8 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
10 DLEA Results TRE Dynamic technique TRE curves Many techniques were developed in failure analysis using EMMI: Static Emission Microscopy (SEM) : spatial coordinate (x,y) Dynamic Emission Microscopy (TRE, PICA) : time information 9 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
11 DLEA Results Hamamatsu Tri-PHEMOS Camera types: InGaAs : 950nm to 1400nm / 640x480 / pixel size of 20m x 20m Objective lens: 1x / 2.5x / 20x / 100x Laser selection : 1.3 µm Laser (100 mw) / 1.3 µm High Power laser (400 mw ) / 1.1 µm Pulse Laser (200 mw) 10 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
12 DLEA Results Process DLEA => Differential Light Emission Analysis : Cipher algorithm implementation SBOX Localisation Mesuring light emission during device operation : Variation of plain text = time and space variation : Differences between TRE curves Correlation between TRE curves and the Key used: TRE curves (DLEA) = Power consumption curves (DPA) 11 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
![..Mx 00 ] Camera OFF Photons Counting during 20 seconds 2 transitions : 0 => 0 or 0 => 1](/docs-images/81/82617281/images/13-1.jpg "Hamming weight model 12 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P.")
13 DLEA Results Process The photons emitted during 1 cycle clock are insufficient to be operated Acquisition system: Camera ON [ Mx 00 Mx 00 Mx 00...Mx 00 ] Camera OFF Photons Counting during 20 seconds 2 transitions : 0 => 0 or 0 => 1 Hamming weight model 12 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
14 DLEA Results Results 1st output bit 2nd output bit 0x07 (07) Bad key 0x00 (00) Bad key 3rd output bit + 4th output bit 0x1A (26) Good key 0x1E (30) Bad key 13 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
15 DLEA Results Results 0x1A (26) Good key Attack on the 3rd Bit or sum of output bits reveal the good key In this case only time and photon counting data was used, but spatial factor can bring a lot of complementary information. 14 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
16 Outline Introduction Context Failure analysis Test vehicle Light Emission as a Side-Channel signal Experimental setup Results Laser to improve Side-Channel attacks Experimental setup Results 15 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
17 Laser stimulation Results Laser in Failure Analysis Laser - Photoelectric effect : Many techniques were developed in failure analysis using the 2 laser effects: Thermal effect with a 1340 nm Laser (OBIRCH, TIVA, SEI ) Photoelectric effect with a 1064 nm Laser (OBIC, LIVA, SCOBIC ) 16 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
18 Laser stimulation Results Previous Works S. Skorobogatov : «Optically Enhanced Position-Locked Power Analysis» Spot Laser between 2 transistor of a SRAM cell: Increasing power consumption of transistors targeted (local) inducing a global increase of the circuit Laser source : 639 nm Power : 1 to 3 mw Layout of an SRAM cell S. Skorobogatov: Optically Enhanced Position-Locked Power Analysis. Cryptographic Hardware and Embedded Systems Workshop (CHES 2006) 17 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
19 Laser stimulation Results DCG Systems Meridian 1 Laser selection : 1064 nm (Photo-electric) / 1340 nm (thermal) Analytical capability for 45 nm.inverted platform for easy ATE direct docking Laser Scanning Microscope (LSM) for static and dynamic analysis 18 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
20 Laser stimulation Results Process 1st step : power consumption acquisition without laser stimulation on random messages. 2nd step : power consumption acquisition with laser stimulation on same messages (same conditions). 3rd step : Comparison of the minimum number of curves necessary to perform a successful DPA attack with & without laser stimulation. 19 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
21 Laser stimulation Results Challenges Laser source : 1064 nm Power : 10 to 12 mw Scanning laser of the area containing SBOX 4,7 & 8 : local increase of the consumption Scanning laser in continuous until obtaining traces 20 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
22 Laser stimulation Results DPA Results Laser ON / OFF Comparison between both DPA results with and without laser stimulation and numbers of curves necessary to perform the attack Conclusive results on SBOX 4, 6, 7 and inconclusive on SBOX 5, 8 On SBOX 4,7 number of curves required are decreased by approximately 1/2 21 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
23 Laser stimulation Results Amplitude comparison Amplitude comparison between differential curves on the right key, with and without laser stimulation (DPA in curves on bit 0 of SBOX 4) 22 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
24 Benefit Drawbacks Light Emission Static acquisition : Cipher localization Spy memory activity Dynamic acquisition (TRE) : Probe internal signal Recover a subkey from DES Acquisition method : Each messages need to be integrated on time to obtain a significant TRE curves. Lack of resolution on latest techno Sample preparation Equipment cost : 2 M Laser stimulation Local increase of the power consumption Reduce the number of power consumption curves necessary to perform an attack Need a partial knowledge of the design / implementation Sample preparation Equipment cost : 500 K 23 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
25 Thank you for your attention Questions? Contact : jerome.dibattista@cnes.fr 24 J. Di-Battista, J.C. Courrège, B. Rouzeyre, L. Torres, P. Perdu When Failure Analysis Meets Side-Channel Attacks CHES 10
When Failure Analysis Meets Side-Channel Attacks
When Failure Analysis Meets Side-Channel Attacks Jérôme Di Battista, Jc Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu To cite this version: Jérôme Di Battista, Jc Courrège, Bruno Rouzeyre, Lionel
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