Steel. Surface Inspection. Yield Management. Solutions.

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1 Steel Surface Ispectio Yield Maagemet Solutios.

2 The Parsytec Flat Steel Solutio Map Casters Slab Decisio (ON01) Material Reassigmet (OP01) Process Aalysis (OP02) Mii Mills Surface Ispectio (SI01) Process Aalysis HSM & Caster (OP02) Preview of Castig Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Tred View (ON04) Roll Moitor (ON05) Hot Strip Mills Surface Ispectio (SI01) Coil Surface Recorder (RT06) Process Aalysis HSM & Caster (OP02) Preview of Castig Evets (ON02) Defect Tred View (ON04) Roll Moitor (ON05) Coil Decisio (ON01) Material Reassigmet (OP01) Hot Temper Mills Surface Ispectio (SI02) Width Measuremet (RT03) Preview of HSM Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Aealig Picklig Lies Surface Ispectio (SI04) Preview of Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Steckel Mills Picklig Lies Surface Ispectio (SI02) Preview of HSM Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Pickle Speed Tuig (ON06) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Coupled Pickle/Tadem Lies Surface Ispectio for Picklig (SI02) Surface Ispectio for Tadem (SI02) Width Measuremet (RT03) Tadem Protectio (RT01) Preview of HSM Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Pickle Speed Tuig (ON06) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Tadem Lies Surface Ispectio (SI02) Tadem Protectio (RT01) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Surface Ispectio (SI01) Width Measuremet (RT03) Preview of Castig Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01)

3 for Surface Ispectio ad Yield Maagemet Reversig Cold Mills Surface Ispectio (SI02) Preview of Picklig Evets (ON02) Cold Mill Protectio (RT01) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Tred View (ON04) Cotiuous Aealig Lies Surface Ispectio (SI05) Strip Target Stoppig (RT02) Preview of Cold Rollig Evets (ON02) Head/Tail Cut Optimizatio (ON03) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Bright Aealig Lies Surface Ispectio (SI03) Preview of Cold Rollig Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Temper & Ski Pass Mills Surface Ispectio (SI04) Coil Decisio (ON01) Defect Trackig (OP03) Recoilig/Ispectio Lies Surface Ispectio (SI05) Width Measuremet (RT03) Preview of Coil Evets (ON02) Coil Decisio (ON01) Electrolytic Galvaizig Lies Surface Ispectio (SI03 or SI04) Strip Target Stoppig (RT02) Differetial Coatig Mark Aalyzer (RT07) Defect Markig (RT04) Preview of Coil Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Hot Dip Galvaizig Lies Surface Ispectio (SI05) Strip Target Stoppig (RT02) Defect Markig (RT04) Width Measuremet (RT03) Preview of Coil Evets (ON02) Coil Decisio (ON01) Material Reassigmet (OP01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Dross & Cloudiess Moitor (ON07) Color Paitig Lies Surface Ispectio (SI05) Preview of Coil Evets (ON02) Coil Decisio (ON01) Defect Trackig (OP03) Defect Tred View (ON04) Process Aalysis (OP02) Cut-to-Legth/Slittig Lies Surface Ispectio (SI04) Width Measuremet (RT03) Automatic Sheet Sortig (RT05) Slittig Optimizatio (OP04) Coil Decisio (ON01)

4 The Parsytec Flat Steel Solutio Map Surface Ispectio Systems White Light Ispectio (SI01) for Mii Mills, Hot Strip Mills, The world s leadig surface ispectio for red hot strips at high speeds. Key beefits: fully ecapsulated, small footprit, easy to istall & maitai, prove performace for all hot rollig defects. Icludig Coil Live View, WWW access. Diffuse IR Light Ispectio (SI04) for Aealig / Picklig, Slittig Lies,... The most cost-effective, compact ad uiversal solutio for surface ispectio. Twilight Ispectio (SI02) for Pickle Lies, Tadem Lies, The world s leadig ispectio system for pickled ad cold rolled strip, compact, robust, fastest commissioig, suitable for sulfuric ad hydrochloric pickle lies ad hot temper mills, etc. Dual Sesor TM Ispectio (SI05) for Coatig, Recoilig,... The Dual Sesor TM for extreme requiremets: combied diffuse & direct light sesors, area & lie sca. Key beefits: covers the widest spectrum for material grades ad delivers extreme accuracy of detectio results. Tadem Ispectio Direct Light Ispectio (SI03) for Bright Aealig, Istallatio optimized lie sca oly ispectio solutio, targetig extremely clea surfaces, small topological defects, e.g. for bright aealig, electrolytic galvaizig (zic).

5 - product portfolio for quality maagemet - Real-time Solutios Tadem Protectio (RT01) Full featured solutio, itegratig operator feedback screes for picklig ad tadem pulpits, decisio rules, PLC itegratio, looper & tadem cotrol (tesio, speed, gaps). Automatic Sheet Sortig (RT05) Rule-based software aalyzig ispectio results for critical defect coditios icludig direct cotrol of sorters. x Meter Sigal to Sorter Beleuchtug Ispectio bad Sortig good Strip Target Stoppig (RT02) Rule-based software to aalyze ispectio results ad perform strip stoppig right at the ispectio booth for verificatio, suitable for aealig ad galvaizig lies. Coil Surface Recorder (RT06) IT techology today allows capturig ad archivig the etire surface of a strip (regardless of surface aomalies). The Parsytec software supports ispectors with live view, quality egieers with complete records, e.g. for rare steel grades & auditig processes with a referece base. Width Measuremet (RT03) Ispectio cameras ca measure a lot more tha defects: based o Parsytec s calibrated sesor, they measure the strip positio o the lie (ceter deviatio) ad other shape aspects, i particular the strip width. Defect Markig (RT04) Whe coil repair is ot the ideal solutio: strip markig idetifies drop-out sectios, rule-based software icludig iteractive review termial. Differetial Coatig Marks (RT07) Software module to aalyze ad hadle ay variatio of coatig marks o the strip.

6 - additioal value for surface ispectio systems - Olie Software Solutios Coil Decisio (ON01) Stadardized software usig database rules for automatic/ iteractive coil decisios, icludig ay 3 rd party gauge data. Defect Tred View (ON04) Cotrol moitor trackig defect occurreces over coils, shifts, days ad weeks. Rule-based alarms. Preview of Coil Evets (ON02) Software package to preview scheduled coils with respect to critical processig parameters. Roll Moitor (ON05) Moitor iterfacig the roll maagemet software, trackig roll mark positios across several coils. Itegrated tred- ad warig aalysis. Pickle Speed Tuig (ON06) Based o hot strip mill iformatio, this software computes a offset to the curret picklig speed to improve throughput ad avoid over / uder picklig icludig secod pickle rus. Software package computes recoilig rus or optimized dowstream head / tail cuts. Dross & Cloudiess Moitor (ON07) Based o cotiuous aalysis of images, critical parameters like dross desity ad surface cloudiess are measured ad displayed.

7 - itegratig SIS ad all other gauges. Optimizatio Software Solutios Material Reassigmet (OP01) Software package aalyzig blocked coils versus order books to idetify potetial for upgradig these blocked coils to achieve prime quality prices. Matches key product parameters ad quality requiremets. Calculates recoilig ad slittig rus to achieve the customer cofiguratio plus resultig ecoomic beefit. Defect Trackig (OP03) To optimize coil releasig ad coil re-routig, it is ecessary to aalyze evolutio of defects ad their correspodig impact o dowstream productio processes. The Defect Trackig software implemets the matchig of selectable defects or regios with observatios from dowstream SIS. As a result of judgig the dowstream impact, coil release ad re-routig decisio rules ca be optimized. The software package ca compare ay two (or more) lies i direct or idirect sequece. Process Aalysis (OP02) Software package to match ay defect occurrece with ay other process or product parameter for all database stored gauge data. Targetig root cause aalysis. Ca trasform time-stamped data to positioal data ad itegrate material trackig iformatio such as head / tail cuts, coil legtheig from rollig, etc. Parameters to be reviewed ca be iteractively selected as well as the focus to data sources from a particular lie. Slittig Optimizatio (OP04) The precise kowledge of defect locatios ad their relevace for a particular customer ad applicatio allows to recalculate the best slittig positios. This software product takes customer specificatios ad the defect map as basis to compute a optimized slittig pla. Also, gaied yields ad the ecoomic beefit ca be computed ad displayed.

8 & Our Missio: Our solutios ad services support our customers through quality cotrol ad process aalysis i maufacturig target quality at optimal costs. Best practice. Best system. Best service. Customers choose ISRA VISION & PARSYTEC for the ability to develop products cosistetly to their requiremets. More tha 400 employees at locatios worldwide are workig to cotribute to your success. Your global parter for surface ispectio. We offer our experiece ad a highly qualified team of experts to desig ad implemet solutios for advaced applicatios. We assure that our missio starts beyod our shippig dock. Just challege our Customer Support Ceter. We guaratee excellece to our customers - from cosultig to service, from tailored solutios to worldwide support. We ca make your busiess more competitive. Germay T: +49 (241) F: +49 (241) ifo@isra-parsytec.com Brazil T: +55 (11) F: +55 (11) Chia T: +86 (21) F: +86 (21) Frace T: +33 (4) F: +33 (4) Idia T: +91 (99) Italy T: +39 (0464) F: +39 (0464) Japa T: +81 (3) F: +81 (3) Korea T: +82 (2) F: +82 (2) Taiwa (R.O.C.) T: +886 (3) F: +886 (3) Our thikig makes automatic surface ispectio global. ISRA VISION & PARSYTEC your worldwide parter. ISRA VISION &PARSYTEC, 2008 all trademarks ackowledged Turkey T: +90 (216) F: +90 (216) UK T: +44 (1322) F: +44 (1322) USA T: +1 (770) F: +1 (770)

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