Device Type Generic Number Circuit Function 01 DG408A(x)/883B 8-Channel Analog Multiplexer 02 DG409A(x)/883B Dual 4-Channel Analog Multiplexer

Transcription

1 SCOPE: IMPROVED 8-CHANNEL/DUAL 4-CHANNEL CMOS ANALOG MULTIPLEXER Type Generic Number Circuit Function 0 (x)/883b 8-Channel Analog Multiplexer DG409A(x)/883B Dual 4-Channel Analog Multiplexer Case Outline(s). The case outlines shall be designated in Mil-Std-835 and as follows: Outline Letter Mil-Std-835 Case Outline Package Code K GDIP-T6 or CDIP2-T6 6 LEAD CERDIP J6 L CDFP4-F6 6 LEAD FLATPACK F6 Z CQCC-N20 20-Pin Ceramic LCC L20 Absolute imum Ratings Voltage Referenced to V - V + to V V, 44V V - to GND V, 25V Digital Inputs, S, D /...(V - ) -2V to (V + )+2V or 30mA whichever occurs first Continuous, Any terminal... 30mA Peak, S or D (Pulsed at ms, 0% duty cycle max)... 00mA Lead Temperature (soldering, 0 seconds) C Storage Temperature C to +50 C Continuous Power Dissipation T A =+70 C 6 lead FLATPACK (derate 6.mW/ C above +70 C) mW 6 lead CERDIP(derate 0.0mW/ C above +70 C) mW 20 lead LCC (derate 9.mW/ C above +70 C) mW Junction Temperature T J C Thermal Resistance, Junction to Case, ΘJC: Case Outline 6 lead FLATPACK C/W Case Outline 6 lead CERDIP C/W Case Outline 20 lead LCC C/W Thermal Resistance, Junction to Ambient, ΘJA: Case Outline 6 lead FLATPACK C/W Case Outline 6 lead CERDIP C/W Case Outline 20 lead LCC C/W Recommended Operating Conditions Ambient Operating (T A ) C to +25 C Positive Supply Voltage (V + ) V Negative Supply Voltage (V - ) V V AL (max) V V AH (min) V / Signals on SX, DX, EN, A0, A, A2 exceeding V+ or V- will be clamped by internal diodes. Limit forward current to the maximum current ratings. Stresses beyond those listed under Absolute imum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability Electrical Characteristics of /DG409A/883B Rev. C Page 2 of 7

2 TABLE. ELECTRICAL TESTS: DUAL SUPPLIES TEST SWITCH Analog-Signal Drain-Source On Resistance On-resistance Matching between Channels On-resistance Flatness Source- Off Leakage Drain-Off Leakage Drain-On Leakage INPUT Input /Voltage High Input /Voltage Low SUPPLY Power Supply Positive Supply -55 C <=T A <= +25 C V + =+5V, V - =-5V, GND=0V V, All -5 5 V ANALOG NOTE 3 r DS(ON) I S =-.0mA, V D =±0V All 00 Ω 25 r DS(ON I S =-0mA, V D =±0V All 8 Ω NOTE 4 0 ) r FLAT I S =-0mA, V D =±5V or 0V I S(OFF) V D =±0V V S =±0V, V EN =0V I D(OFF) V S =±0mA, VD=±0V, V EN =0V I D(ON) V D =V S =±0V, sequence each switch on All 9 2 All I AH V IN = 2.4V, 5V, All µa I AL V EN =0V, 2.4V; V A =0V, All µa I+ V EN =V A =0V or 4.5V.0 50, All ±4.5 ±20 V All Ω µa V EN =2.4V, V A(ALL) =0V or 2.4V All 0.5 ma 2.0 Negative Supply I- V EN =2.4V, V A(ALL) =0V or 2.4V All - µa -0 0 DYNAMIC Transition Time t TRANS Figure 2 9 All 75 ns 0, 250 Break-Before- t OPEN Figure 4 9 All 0 ns Make interval Electrical Characteristics of /DG409A/883B Rev. C Page 3 of 7

3 TEST TABLE. ELECTRICAL TESTS: DUAL SUPPLIES -55 C <=T A <= +25 C V + =+5V, V - =-5V, GND=0V Enable Turn-On t ON(EN) Figure 3 9 All 50 ns Time 0, 225 Enable Turn-Off t OFF(EN) Figure 3 9 All 50 ns Time 0, 300 Charge Injection Q Figure 5, NOTE 3 9 ALL 5 pc TEST SWITCH Analog Signal Drain-Source On- Resistance DYNAMIC Transition Time NOTE 3 Enable Turn-On Time NOTE 3 Enable Turn-Off Time NOTE 3 TABLE. ELECTRICAL TESTS: SINGLE SUPPLY -55 C <=T A <= +25 C V + =+2V, V - =0V, GND=0V V ANALOG NOTE 3, All 0 2 V r DS(ON) I S =-.0mA, V D =3V or 0V All 75 Ω t TRANS V S =8V, V S8 =0V, V A =0V, 9 All 450 ns Figure 2 t ON(EN) V AL =0V, V S =5V, Figure 3 9 All 600 ns t OFF(EN) V AL =0V, V S =5V, Figure 3 9 All 300 ns NOTE 2: The algebraic convention where the most negative value is a minimum and the most positive value a maximum is used in this data sheet. NOTE 3: Guaranteed by design. NOTE 4: r DS(ON) = r DS(ON)max -r DS(ON)min. On-resistance match between channels and flatness are guaranteed only with specified voltages. Flatness is defined as the difference between the maximum and minimum value of on-resistance as measured at the extremes of the specified analog signal range. FIGURE 2: Transition Time Diagrams: See Commercial Data Sheet FIGURE 3: Enable Switching Time Diagrams: See Commercial Data Sheet FIGURE 4: Break-Before-Make Interval Diagrams: See Commercial Data Sheet FIGURE 5: Charge Injection Diagrams: See Commercial Data Sheet Electrical Characteristics of /DG409A/883B Rev. C Page 4 of 7

4 ORDERING INFORMATION: L/883B 6 FLATPACK DG409AL/883B 6 FLATPACK K/883B 6 CDIP DG409AK/883B 6 CDIP Z/883B 20 LCC DG409AZ/883B 20 LCC TRUTH TABLE TERMINAL CONNECTION A2 A A0 EN ON SWITCH TERMINAL NUMBER 0 0 DG409A DG409A X X X 0 None F6 & J6 20LCC F6 & J6 20LCC A0 NC A0 NC EN A0 EN A V- EN V- EN S V- Sa V S2 S S2a Sa S3 NC S3a NC S4 S2 S4a S2a 8 8 D S3 Da S3a 9 S8 S4 Db S4a DG409 0 S7 D S4b Da A A0 EN ON SWITCH S6 NC S3b NC X X 0 None 2 S5 S8 S2b Db V+ S7 Sb S4b GND S6 V+ S3b A2 S5 GND S2b 4 6 A NC A NC 7 V+ Sb 8 GND V+ 9 A2 GND 20 A A Electrical Characteristics of /DG409A/883B Rev. C Page 5 of 7

5 QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil- Std-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 05:. Test Condition, A, B, C, or D. 2. TA = +25 C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with of Mil-Std-883, including Groups A, B, C, and D inspection. inspection:. Tests as specified in Table Selected subgroups in Table, of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table. b. Steady-state life test, Method 005 of Mil-Std-883:. Test condition A, B, C, D. 2. TA = +25 C, minimum. 3. Test duration, 000 hours, except as permitted by Method 005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Test Requirements Group C and D End-Point Electrical Parameters s per, Table *, 2, 3, 9, 2, 3, 9, 0, * PDA applies to only Electrical Characteristics of /DG409A/883B Rev. C Page 6 of 7