1.5 Giga Hertz Ultra High Speed ADC Testing on ATE
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1 1.5 Giga Hertz Ultra High Speed ADC Testing on ATE Jin-Soo Ko Teradyn Inc. 1 6
2 Contents Giga Hertz ADC Overview Challenges to ATE Systems Tiger Mixed Signal Instruments Introduction Device Test Requirements Tiger System Configuration DIB Design Technique Dynamic Testing Results Conclusion 2 6
3 Giga Hertz ADC Overview Flash, Folding Architectures 6 to 10 Bit Resolution ~500MHz to 2~3 GHz Sample Rate Bipolar, SiGe, CMOS Processes Differential Analog Input, Differential Digital Output, Differential Clock BGA, LQFP Packages 3 6
4 Giga Hertz ADC Applications Direct RF Down Conversion Digital RF/IF Signal Processing Satellite Set-top Boxes Electronic Countermeasures/Electronic Warfare High Speed Data Acquisition ATE Systems Digital Oscilloscopes 4 6
5 Test System Requirements High Frequency High Performance Sine Wave Signal Generator Low Jitter High Frequency Clock Generator Ultra High Speed Digital Pin Electronics with DSSC ( Digital Signal Source and capture) Capabilities Differential Analog & Digital Capabilities 5 6
6 AC Instruments for GHz ADC Testing AC Instrument LFAC BBAC VHFCW AWGLAN AWG GHz CW Src PicoClock Description 1.2 MHz, 90 db Source and Dig DC to 15 MHz Source and Digitizer 250 MHz CW Source Octal Diff Outputs, 250 MHz BW 10-bit, 2500 Msps, DC to 1400 MHz BW Microwave Sine Wave Source 1 GHz Clock, <1.5 ps rms Jitter 6 6
7 High Speed Differential Digital Instruments for GHz ADC Testing 1.6 Gbps Drive/Compare/ IO Differential Driver 6-Level Output Waveform Differential Comparator Pass/Fail Signal DPE32: Differential Pin Electronics 7 6
8 Tiger DSSC - Digital Signal I/O 10110HLHLXX H-- HHLHL X00 XXXXX LHH 10110HLHLXX H-- HHLHL X00 REPEAT HLHLXXWWWWWWWWWWW 10110HLHLXX H-- HHLHL X00 XXXXX LHH 10110HLHLXX H-- HHLHL X00 XXXXX LHH 10110HLHLXX H-- HHLHL X00 REPEAT HLHLXXVVVVVVVVVVV 10110HLHLXX H-- HHLHL X00 XXXXX LHH Functional Testing Functional Test Requirement W means substitute data from the source segment memory V means compare to LOW or HIGH and send data to capture memory Digital Signal Segment #1 32 samples Digital Signal Capture #1 32 samples?????????????????????????????????????????????????????????????????????????????.. Performance Test Requirement 8 DUT needs a specific waveform Captured waveform to be processed. Result is a performance measurement like SNR 6
9 Tiger DC Instruments DC Instruments Quantity Description AAPU s Up to V, 30 ma VI Up to 7 60 V, 200 ma HCU Up to 4 30 V, 2 A Quad Voltage Source Up to 8 +6 V, 5 A (QVS) Sources Gangable to 10 A High Current Power Up to 24 6 A per board, Supplies (HCPS) Sources Gangable to 48 A 9 6
10 Device Test Requirements 1.5Gsps, 8Bit ADC INL, DNL < 1.0 LSB Dynamic fi = 250MHz, fs = 1.5GHz SNR > 45 db THD < -50 db SFDR < -50 db SINAD > 44 db ENOB > 7.0 LSB IMD < -66.8dBc 10 6
11 Test Setup CW WG t. Src HSD Pico Clk Ext. Clk BPF DUT DIGCAP DIGCAP QVS, dutsrc, duthcu, etc DUT Input, Output, CLK are Differential DIGCAP: Parallel Octal Mode 4 Bit Width 2 for Primary Data Output 2 for Auxiliary Data Output 750Msps Data Rate High Freq Relays Controlled by SDBs BPF: Low distortion CW signal shaping 11 6
12 Dual Tone Generation CW1 CW2 f1 Combiner f2 vhfawg f1 f2 Splitter vhfcw f1 f2 f1 f2 To Site #0 To Site #1 Multi-Site Parallel Testing High Quality Dual Tone Generation Improving IMD Performance by Using 2 Independent Sources CW Source: 250MHz Range 1 Hz Step 12Bit Resolution Combiner/Splitter 12 6
13 DIB Design Information BPF Site #0 Combiner/ Splitter High Speed Relays 13 Ext. Sig. Input Site #1 Ext. Clk Input Dual Site Design 20 Layers: 8 GND Layers 4 Power Layers 6 Internal Layers 1 Component Side 1 Solder Side Single GND Plane Splitted PWR Planes Avoid through holes Matching impedance 6
14 PECL Digital Output Termination Drive Side: Differential drive Force high common mode 1.3v (device spec) 50 Ohm termination Receive Side: Differential Receive Compare pattern Vod = 0.2v (device Spec) 14 6
15 Dynamic Test Pattern DIGCAPs for Primary Data Output DIGCAPs for Auxiliary Data Output Pattern Running in T8 Mode 15 6
16 External Instrument Integration Marconi M Ref. ATE Mainframe Cable Trunk DIB Generic CC/Cardlet for signal delivery ATE Testhead 16 6
17 Test Results: CW Src for Fs=0.8GHz Fs=0.8GHz fi=250mhz, 17 6
18 Test Results: Ext Src for Fs=0.8GHz Fs=0.8GHz fi=250mhz, 18 6
19 Test Results: CW Src for Fs=1.5GHz Fs=1.5GHz fi=250mhz, SNR = 45.72dB THD =-67.84dB SFDR =-57.88dB SINAD = 45.70dB ENOB = 7.30dB 19 6
20 Test Results: Ext Src for Fs=1.5GHz Fs=1.5GHz fi=250mhz, SNR = 47.45dB THD =-67.31dB SFDR =-63.45dB SINAD = 47.41dB ENOB = 7.58dB 20 6
21 Dual Tone IMD Testing Results Fs = 1.5GHz Fi1 = 249.5MHz Fi2 = 250.5MHz IMD <= -67dB Clk Src: Marconi 2026 Sig Src: HP8644B 21 6
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