CERTIFICATE. Issued Date: July 27, 2007 Report No.: 076L030-ITCEP07V03

Transcription

1 CERTIFICATE Issued Date: July 27, 2007 Report No.: 076L030-ITCEP07V03 This is to certify that the following designated product Product : Secure Serial Device Server (with Extension network module) Trade name : Moxa Model Number : NPort ,NPort ,NPort , NPort ,NPort ,NPort Company Name : Moxa Technologies Co., Ltd This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003 EN : A2:2005 IEC Edition 1.2: Level 3, Level 2 EN : A1:2001 IEC : 2002+A1: 2002 Level 2 IEC : 2004 Level 2 IEC Edition 1.1: Level 2, Level 3 IEC Edition 2.1: Level 2 IEC Edition 1.1: Level 1 IEC Second Edition: TEST LABORATORY President / Gene Chang No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL: FAX: service@quietek.com

2 Test Report Product Name : Secure Serial Device Server (with Extension network module) Model No. : NPort ,NPort ,NPort , NPort ,NPort ,NPort Applicant : Moxa Technologies Co., Ltd Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Date of Receipt : 2007/05/31 Issued Date : 2007/07/27 Report No. : 076L030-ITCEP07V03 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

3 QTK No.: 076L030-ITCEP07V03 Statement of Conformity This certifies that the following designated product: Product : Secure Serial Device Server (with Extension network module) Model Number : NPort ,NPort ,NPort , NPort ,NPort ,NPort Trade Name : Moxa Company Name : Moxa Technologies Co., Ltd This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class A : Product family standard EN :2000+A2:2005 : Limits for harmonic current emission EN :1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

4 Test Report Certification Issued Date : 2007/07/27 Report No. : 076L030-ITCEP07V03 Product Name : Secure Serial Device Server (with Extension network module) Applicant : Moxa Technologies Co., Ltd Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Manufacturer : Moxa Technologies Co., Ltd Model No. : NPort ,NPort ,NPort , NPort ,NPort ,NPort Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC ,50/60Hz Trade Name : Moxa Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class A EN 55024: 1998+A1: 2001+A2: 2003 EN :2000+A2:2005 EN :1995+A1:2001 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : ( Engineering Adm. Assistant / Joanne Lin ) Reviewed By : ( Assistant Engineer /Elvis Su ) Approved By : ( President / Gene Chang ) Page: 2 of 147

5 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com 1313 LinKou Testing Laboratory : No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com 0914 Page: 3 of 147

6 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 147

7 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 147

8 10.7. Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 147

9 1. General Information 1.1. EUT Description Product Name Secure Serial Device Server (with Extension network module) Trade Name Moxa Model No. NPort ,NPort ,NPort , NPort ,NPort ,NPort Component Fiber Cable Non-Shielded, 1.1m Non-Shielded, 1.0m Page: 7 of 147

10 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Normal Operation(NM-FX02-S-SC) Mode 2:Normal Operation(NM-FX02-M-SC) Mode 3:Normal Operation(NM-TX01) Mode 4:Normal Operation(NM-FX01-S-SC) Mode 5:Normal Operation(NM-FX01-M-SC) Final Test Mode Mode 1:Normal Operation(NM-FX02-S-SC) Emission Mode 2:Normal Operation(NM-FX02-M-SC) Mode 3:Normal Operation(NM-TX01) Mode 1:Normal Operation(NM-FX02-S-SC) Immunity Mode 2:Normal Operation(NM-FX02-M-SC) Mode 3:Normal Operation(NM-TX01) Page: 8 of 147

11 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Mode 1 Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PPT N/A Non-Shielded, 1.8m 2 Industrial Media Converter 3 Industrial Media Converter Moxa IMC-101-S-SC N/A N/A Moxa IMC-101-M-SC N/A Non-Shielded, 1.8m Mode 2 Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PPT N/A Non-Shielded, 1.8m 2 Industrial Media Converter 3 Industrial Media Converter Moxa IMC-101-S-SC N/A Non-Shielded, 1.8m Moxa IMC-101-M-SC N/A N/A Mode 3 Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PPT N/A Non-Shielded, 1.8m 2 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m Page: 9 of 147

12 1.4. Configuration of Tested System Mode 1 & Mode 2 Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 7m B Fiber Cable Non-Shielded, 1.1m C Fiber Cable Non-Shielded, 1m Mode 3 Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 7m Page: 10 of 147

13 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 Boot the PC from Hard Disk. 4 The personal computer s and partner computer s monitor will show the transmitting and receiving characteristics when the communication is success. 5 Repeat the above procedure (4) to (5). Page: 11 of 147

14 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class A Yes No Conducted Emissions EN 55022:1998+A1:2000+A2:2003 Class A Yes No (Telecommunication Ports) Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class A Yes No Power Harmonics EN :2000+A2:2005 Yes No Voltage Fluctuation and Flicker EN :1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC Edition 1.2: Yes No Radiated susceptibility IEC :2002+A1:2002 Yes No Electrical fast transient/burst IEC :2004 Yes No Surge IEC Edition 1.1: Yes No Conducted susceptibility IEC Edition 2.1: Yes No Power frequency magnetic field IEC Edition 1.1: Yes No Voltage dips and interruption IEC nd Edition: Yes No Page: 12 of 147

15 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS / /02/18 LISN R&S ESH3-Z / /02/14 LISN R&S ENV / /07/27 Pulse Limiter R&S ESH3-Z /09/07 Conducted Emissions (Telecommunication Ports) / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/11 EMI Test Receiver R&S ESCS / /02/18 LISN R&S ESH3-Z / /02/14 LISN R&S ENV / /07/27 lmpedance Stabilization Network Schaffner ISN T /07/14 Pulse Limiter R&S ESH3-Z /09/07 RF Current Probe FCC F-65 10KHz~1GHz /11/11 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /09/15 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESI / /06/19 EMI Test Receiver R&S ESCS / /05/11 Horn Antenna Schwarzbeck BBHA9120D /08/10 Pre-Amplifier QTK N/A N/A 2007/01/03 Pre-Amplifier MITEQ AMF-4D P /01/03 Spectrum Analyzer Advantest R /10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Page: 13 of 147

16 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System KeyTek MZ-15/EC /08/02 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /03/16 Bilog Antenna Schaffner Chase CBL6112B /01/03 Broad-Band Antenna Schwarzbeck VULB /08/01 CMU200 UNIV.RADIOCOMM R&S CMU /03/16 Directional Coupler A&R DC /08/03 Dual Microphone Supply B&K /08/03 Mouth Simulator B&K /08/03 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Meter R&S NRVD(P.M) /04/21 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /08/03 Signal Generator R&S SMY02(9K-208 0) / /10/03 Electrical fast transient/burst / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe Schaffner N/A N/A 2006/12/28 Surge / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe Schaffner N/A N/A 2006/12/28 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2007/04/21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F.B.BELL /05/30 Page: 14 of 147

17 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A /03/27 CDN Schaffner TRA U /03/27 CDN M016S Schaffner CAL U100A /03/27 CDN M016S Schaffner TRA U /03/27 CDN T002 Schaffner CAL U /03/27 CDN T002 Schaffner TRA U /03/27 CDN T400 Schaffner CAL U /03/27 CDN T400 Schaffner TRA U /03/27 Coupling Decoupling Network Schaffner CDN M016S /03/27 Coupling Decoupling Network Schaffner CDN M016S /03/27 Coupling Decoupling Network Schaffner CDN T /03/27 Coupling Decoupling Network Schaffner CDN T /03/27 EM-CLAMP Schaffner KEMZ /04/21 Page: 15 of 147

18 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Conducted Emissions (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility Page: 16 of 147

19 As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 17 of 147

20 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted Emissions Humidity (%RH) (Telecommunicati on Ports) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Page: 18 of 147

21 Power frequency magnetic field Voltage dips and interruption Temperature ( C) Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Humidity (%RH) Barometric pressure (mbar) Page: 19 of 147

22 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN Test Setup 3.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 20 of 147

23 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 21 of 147

24 3.6. Test Result Site : SR-1 Time : 2007/06/22-16:08 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Page: 22 of 147

25 Site : SR-1 Time : 2007/06/22-16:11 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 147

26 Site : SR-1 Time : 2007/06/22-16:11 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 147

27 Site : SR-1 Time : 2007/06/22-16:13 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Page: 25 of 147

28 Site : SR-1 Time : 2007/06/22-16:15 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 147

29 Site : SR-1 Time : 2007/06/22-16:15 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 147

30 Site : SR-1 Time : 2007/07/10-15:18 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(L) - Line1 network module) Power : AC 230V/50Hz Note : Mode 2 Page: 28 of 147

31 Site : SR-1 Time : 2007/07/10-15:20 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(L) - Line1 network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 147

32 Site : SR-1 Time : 2007/07/10-15:20 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(L) - Line1 network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 147

33 Site : SR-1 Time : 2007/07/10-15:21 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(N) - Line2 network module) Power : AC 230V/50Hz Note : Mode 2 Page: 31 of 147

34 Site : SR-1 Time : 2007/07/10-15:22 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(N) - Line2 network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 147

35 Site : SR-1 Time : 2007/07/10-15:22 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-020(N) - Line2 network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 147

36 Site : SR-1 Time : 2007/06/22-04:41 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 3 Page: 34 of 147

37 Site : SR-1 Time : 2007/06/22-04:42 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 147

38 Site : SR-1 Time : 2007/06/22-04:42 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 147

39 Site : SR-1 Time : 2007/06/22-04:43 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 3 Page: 37 of 147

40 Site : SR-1 Time : 2007/06/22-04:44 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 147

41 Site : SR-1 Time : 2007/06/22-04:44 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 147

42 3.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Front View of Conducted Test Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Back View of Conducted Test Page: 40 of 147

43 Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Front View of Conducted Test Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Back View of Conducted Test Page: 41 of 147

44 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Front View of Conducted Test Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Back View of Conducted Test Page: 42 of 147

45 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN Test Setup 4.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 43 of 147

46 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one Deviation from Test Standard No deviation. Page: 44 of 147

47 4.6. Test Result Site : SR-1 Time : 2007/06/22-15:47 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 10Mbps Page: 45 of 147

48 Site : SR-1 Time : 2007/06/22-15:48 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 147

49 Site : SR-1 Time : 2007/06/22-15:48 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 147

50 Site : SR-1 Time : 2007/06/22-15:43 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 100Mbps Page: 48 of 147

51 Site : SR-1 Time : 2007/06/22-15:46 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 49 of 147

52 Site : SR-1 Time : 2007/06/22-15:46 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 1, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 50 of 147

53 Site : SR-1 Time : 2007/06/22-15:32 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 10Mbps Page: 51 of 147

54 Site : SR-1 Time : 2007/06/22-15:33 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 52 of 147

55 Site : SR-1 Time : 2007/06/22-15:34 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 53 of 147

56 Site : SR-1 Time : 2007/06/22-15:25 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 100Mbps Page: 54 of 147

57 Site : SR-1 Time : 2007/06/22-15:29 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 55 of 147

58 Site : SR-1 Time : 2007/06/22-15:29 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 2, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 56 of 147

59 Site : SR-1 Time : 2007/06/22-16:50 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 10Mbps Page: 57 of 147

60 Site : SR-1 Time : 2007/06/22-16:50 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 58 of 147

61 Site : SR-1 Time : 2007/06/22-16:51 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 147

62 Site : SR-1 Time : 2007/06/22-16:49 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 100Mbps Page: 60 of 147

63 Site : SR-1 Time : 2007/06/22-16:49 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 61 of 147

64 Site : SR-1 Time : 2007/06/22-16:49 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : Mode 3, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 62 of 147

65 4.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Front View of ISN Test Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Back View of ISN Test Page: 63 of 147

66 Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Front View of ISN Test Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Back View of ISN Test Page: 64 of 147

67 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Front View of ISN Test Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Back View of ISN Test Page: 65 of 147

68 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN Test Setup 5.3. Limit Frequency MHz Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 66 of 147

69 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 67 of 147

70 5.6. Test Result Site : OATS -3 Time : 2007/07/19-01:46 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - HORIZONTAL network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 68 of 147

71 Site : OATS -3 Time : 2007/07/19-01:46 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - VERTICAL network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 69 of 147

72 Site : OATS -3 Time : 2007/07/19-01:46 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - HORIZONTAL network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 7 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 70 of 147

73 Site : OATS -3 Time : 2007/07/19-01:46 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - VERTICAL network module) Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 71 of 147

74 Site : OATS -3 Time : 2007/07/19-01:46 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - HORIZONTAL network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 72 of 147

75 Site : OATS -3 Time : 2007/07/19-01:47 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKCBL6112(2704) - VERTICAL network module) Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK 7 * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 73 of 147

76 5.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Front View of Radiated Test Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Back View of Radiated Test Page: 74 of 147

77 Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Front View of Radiated Test Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Back View of Radiated Test Page: 75 of 147

78 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Front View of Radiated Test Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Back View of Radiated Test Page: 76 of 147

79 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 77 of 147

80 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 78 of 147

81 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 79 of 147

82 6.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Power Harmonics Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class A limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #15 with 18.94% of the limit. Page: 80 of 147

83 Test Result: Pass Source qualification: Normal THC(A): 0.16 I-THD(pk%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 16 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 81 of 147

84 Product Secure Serial Device Server (with Extension network module) Test Item Power Harmonics Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class A limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #15 with 20.08% of the limit. Page: 82 of 147

85 Test Result: Pass Source qualification: Normal THC(A): 0.18 I-THD(pk%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 17 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 83 of 147

86 Product Secure Serial Device Server (with Extension network module) Test Item Power Harmonics Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class A limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #17 with 15.98% of the limit. Page: 84 of 147

87 Test Result: Pass Source qualification: Normal THC(A): 0.13 I-THD(pk%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 12 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 85 of 147

88 6.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Power Harmonics Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Power Harmonics Test Setup Page: 86 of 147

89 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Power Harmonics Test Setup Page: 87 of 147

90 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 88 of 147

91 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 89 of 147

92 7.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Voltage Fluctuation and Flicker Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :43:31 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 90 of 147

93 Product Secure Serial Device Server (with Extension network module) Test Item Voltage Fluctuation and Flicker Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :28:23 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 91 of 147

94 Product Secure Serial Device Server (with Extension network module) Test Item Voltage Fluctuation and Flicker Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :14:42 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 92 of 147

95 7.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Flicker Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Flicker Test Setup Page: 93 of 147

96 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Flicker Test Setup Page: 94 of 147

97 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 95 of 147

98 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 96 of 147

99 8.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Electrostatic Discharge Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 97 of 147

100 Product Secure Serial Device Server (with Extension network module) Test Item Electrostatic Discharge Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 98 of 147

101 Product Secure Serial Device Server (with Extension network module) Test Item Electrostatic Discharge Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 99 of 147

102 8.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : ESD Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : ESD Test Setup Page: 100 of 147

103 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : ESD Test Setup Page: 101 of 147

104 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 102 of 147

105 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 103 of 147

106 9.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Radiated susceptibility Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m at frequency MHz. No false alarms or other malfunctions were observed during or after the test. Page: 104 of 147

107 Product Secure Serial Device Server (with Extension network module) Test Item Radiated susceptibility Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m at frequency MHz. No false alarms or other malfunctions were observed during or after the test. Page: 105 of 147

108 Product Secure Serial Device Server (with Extension network module) Test Item Radiated susceptibility Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m at frequency MHz. No false alarms or other malfunctions were observed during or after the test. Page: 106 of 147

109 9.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Radiated Susceptibility Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Radiated Susceptibility Test Setup Page: 107 of 147

110 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Radiated Susceptibility Test Setup Page: 108 of 147

111 10. Electrical Fast Transient/Burst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 109 of 147

112 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 110 of 147

113 10.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Electrical fast transient/burst Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 111 of 147

114 Product Secure Serial Device Server (with Extension network module) Test Item Electrical fast transient/burst Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 112 of 147

115 Product Secure Serial Device Server (with Extension network module) Test Item Electrical fast transient/burst Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 113 of 147

116 10.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : EFT/B Test Setup Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : EFT/B Test Setup-Clamp Page: 114 of 147

117 Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : EFT/B Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : EFT/B Test Setup-Clamp Page: 115 of 147

118 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : EFT/B Test Setup Test Mode : Mode 3:Normal Operation(NM-TX01) Description : EFT/B Test Setup-Clamp Page: 116 of 147

119 11. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± /50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 117 of 147

120 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 118 of 147

121 11.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Surge Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Complied Required to Criteria Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 119 of 147

122 Product Secure Serial Device Server (with Extension network module) Test Item Surge Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Complied Required to Criteria Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 120 of 147

123 Product Secure Serial Device Server (with Extension network module) Test Item Surge Test Mode Mode 3:Normal Operation (NM-TX01) Date of Test 2007/06/13 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Complied Required to Criteria Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 121 of 147

124 11.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : SURGE Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : SURGE Test Setup Page: 122 of 147

125 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : SURGE Test Setup Page: 123 of 147

126 12. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 124 of 147

127 12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 125 of 147

128 12.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Conducted susceptibility Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/15 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN01 AC IN A A PASS 0.15~ (3V) CDN11 LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 126 of 147

129 Product Secure Serial Device Server (with Extension network module) Test Item Conducted susceptibility Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/15 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN01 AC IN A A PASS 0.15~ (3V) CDN11 LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 127 of 147

130 Product Secure Serial Device Server (with Extension network module) Test Item Conducted susceptibility Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/15 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN01 AC IN A A PASS 0.15~ (3V) CDN11 LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 128 of 147

131 12.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Conducted Susceptibility Test Setup Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Conducted Susceptibility Test Setup-CDN Page: 129 of 147

132 Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Conducted Susceptibility Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Conducted Susceptibility Test Setup-CDN Page: 130 of 147

133 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Conducted Susceptibility Test Setup Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Conducted Susceptibility Test Setup-CDN Page: 131 of 147

134 13. Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 132 of 147

135 13.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Power frequency magnetic field Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 133 of 147

136 Product Secure Serial Device Server (with Extension network module) Test Item Power frequency magnetic field Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 134 of 147

137 Product Secure Serial Device Server (with Extension network module) Test Item Power frequency magnetic field Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 135 of 147

138 13.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Power Frequency Magnetic Field Test Setup Page: 136 of 147

139 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Power Frequency Magnetic Field Test Setup Page: 137 of 147

140 14. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 138 of 147

141 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 139 of 147

142 14.6. Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Voltage dips and interruption Mode 1:Normal Operation(NM-FX02-S-SC) Date of Test 2007/06/13 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 140 of 147 kv

143 Product Secure Serial Device Server (with Extension network module) Test Item Voltage dips and interruption Test Mode Mode 2:Normal Operation(NM-FX02-M-SC) Date of Test 2007/06/13 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 141 of 147 kv

144 Product Secure Serial Device Server (with Extension network module) Test Item Voltage dips and interruption Test Mode Mode 3:Normal Operation(NM-TX01) Date of Test 2007/06/13 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 142 of 147 kv

145 14.7. Test Photograph Test Mode : Mode 1:Normal Operation(NM-FX02-S-SC) Description : Voltage Dips Test Setup Test Mode : Mode 2:Normal Operation(NM-FX02-M-SC) Description : Voltage Dips Test Setup Page: 143 of 147

146 Test Mode : Mode 3:Normal Operation(NM-TX01) Description : Voltage Dips Test Setup Page: 144 of 147

147 15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 145 of 147

148 (3) EUT Photo (4) EUT Photo Page: 146 of 147

149 (5) EUT Photo Page: 147 of 147

150 CERTIFICATE Issued Date: Sep. 19, 2007 Report No.: R-ITCEP07V03 This is to certify that the following designated product Product : Secure Serial Device Server (with Extension network module) Trade name : Moxa Model Number : NPort ,NPort ,NPort , NPort ,NPort ,NPort Company Name : Moxa Technologies Co., Ltd This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003 EN : A2:2005 IEC Edition 1.2: Level 3, Level 2 EN : A1:2001 IEC : 2002+A1: 2002 Level 2 IEC : 2004 Level 2 IEC Edition 1.1: Level 2, Level 3 IEC Edition 2.1: Level 2 IEC Edition 1.1: Level 1 IEC Second Edition: TEST LABORATORY Vincent Lin / Deputy Manager No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL: FAX: service@quietek.com

151 Appendix Report Product Name : Secure Serial Device Server (with Extension network module) Model No. : NPort ,NPort ,NPort , NPort ,NPort ,NPort Applicant : Moxa Technologies Co., Ltd Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Date of Receipt : 2007/05/31 Issued Date : 2007/09/19 Report No. : R-ITCEP07V03 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

152 QTK No.: R-ITCEP07V03 Statement of Conformity This certifies that the following designated product: Product : Secure Serial Device Server (with Extension network module) Model Number : NPort ,NPort ,NPort , NPort ,NPort ,NPort Trade Name : Moxa Company Name : Moxa Technologies Co., Ltd This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class A : Product family standard EN :2000+A2:2005 : Limits for harmonic current emission EN :1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Vincent Lin / Deputy Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

153 Report No: R-ITCEP07V03 Test Report Certification Issued Date : 2007/09/19 Report No. : R-ITCEP07V03 Product Name : Secure Serial Device Server (with Extension network module) Applicant : Moxa Technologies Co., Ltd Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Manufacturer : Moxa Technologies Co., Ltd Model No. : NPort ,NPort ,NPort , NPort ,NPort ,NPort Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC ,50/60Hz Trade Name : Moxa Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class A EN 55024: 1998+A1: 2001+A2: 2003 EN :2000+A2:2005 EN :1995+A1:2001 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : ( Engineering Adm. Assistant / Joanne Lin ) Reviewed By : ( Assistant Engineer /Elvis Su ) Approved By : (Deputy Manager / Vincent Lin) Page: 2 of 81

154 Report No: R-ITCEP07V03 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com 1313 LinKou Testing Laboratory : No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com 0914 Page: 3 of 81

155 Report No: R-ITCEP07V03 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 81

156 Report No: R-ITCEP07V Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 81

157 Report No: R-ITCEP07V Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 81

158 Report No: R-ITCEP07V03 1. General Information 1.1. EUT Description Product Name Secure Serial Device Server (with Extension network module) Trade Name Moxa Model No. NPort ,NPort ,NPort , NPort ,NPort ,NPort Note: This appendix report was based on Quietek report No.076L030-ITCEP07V03. The different is modem module. Page: 7 of 81

159 Report No: R-ITCEP07V Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Normal Operation Final Test Mode Emission Immunity Mode 1:Normal Operation Mode 1:Normal Operation Page: 8 of 81

160 Report No: R-ITCEP07V Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PPT N/A Non-Shielded, 1.8m Page: 9 of 81

161 Report No: R-ITCEP07V Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 0.03m, thirty-two PCS. B LAN Cable Non-Shielded, 7m C LAN to RS-232 Cable Non-Shielded, 1.6m D Telecom Cable Non-Shielded, 0.03m Page: 10 of 81

162 Report No: R-ITCEP07V EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 Boot the PC from Hard Disk. 4 The personal computer s and partner computer s monitor will show the transmitting and receiving characteristics when the communication is success. 5 Repeat the above procedure (3) to (4). Page: 11 of 81

163 Report No: R-ITCEP07V03 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class A Yes No Conducted Emissions EN 55022:1998+A1:2000+A2:2003 Class A Yes No (Telecommunication Ports) Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class A Yes No Power Harmonics EN :2000+A2:2005 Yes No Voltage Fluctuation and Flicker EN :1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC Edition 1.2: Yes No Radiated susceptibility IEC :2002+A1:2002 Yes No Electrical fast transient/burst IEC :2004 Yes No Surge IEC Edition 1.1: Yes No Conducted susceptibility IEC Edition 2.1: Yes No Power frequency magnetic field IEC Edition 1.1: Yes No Voltage dips and interruption IEC nd Edition: Yes No Page: 12 of 81

164 Report No: R-ITCEP07V List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS / /02/18 LISN R&S ESH3-Z / /02/14 LISN R&S ENV / /07/27 Pulse Limiter R&S ESH3-Z /09/07 Conducted Emissions (Telecommunication Ports) / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/11 EMI Test Receiver R&S ESCS / /02/18 LISN R&S ESH3-Z / /02/14 LISN R&S ENV / /07/27 lmpedance Stabilization Network Schaffner ISN T /07/14 Pulse Limiter R&S ESH3-Z /09/07 RF Current Probe FCC F-65 10KHz~1GHz /11/11 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /09/15 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESI / /06/19 EMI Test Receiver R&S ESCS / /05/11 Horn Antenna Schwarzbeck BBHA9120D /08/10 Pre-Amplifier QTK N/A N/A 2007/01/03 Pre-Amplifier MITEQ AMF-4D P /01/03 Spectrum Analyzer Advantest R /10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Page: 13 of 81

165 Report No: R-ITCEP07V03 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System KeyTek MZ-15/EC /08/02 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /03/16 Bilog Antenna Schaffner Chase CBL6112B /01/03 Broad-Band Antenna Schwarzbeck VULB /08/01 CMU200 UNIV.RADIOCOMM R&S CMU /03/16 Directional Coupler A&R DC /08/03 Dual Microphone Supply B&K /08/03 Mouth Simulator B&K /08/03 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Meter R&S NRVD(P.M) /04/21 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /08/03 Signal Generator R&S SMY02(9K-208 0) / /10/03 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo N/A /12/01 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2007/04/21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F.B.BELL /05/30 Page: 14 of 81

166 Report No: R-ITCEP07V03 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A /03/27 CDN Schaffner TRA U /03/27 CDN M016S Schaffner CAL U100A /03/27 CDN M016S Schaffner TRA U /03/27 CDN T002 Schaffner CAL U /03/27 CDN T002 Schaffner TRA U /03/27 CDN T400 Schaffner CAL U /03/27 CDN T400 Schaffner TRA U /03/27 Coupling Decoupling Network Schaffner CDN M016S /03/27 Coupling Decoupling Network Schaffner CDN M016S /03/27 Coupling Decoupling Network Schaffner CDN T /03/27 Coupling Decoupling Network Schaffner CDN T /03/27 EM-CLAMP Schaffner KEMZ /04/21 Page: 15 of 81

167 Report No: R-ITCEP07V Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Conducted Emissions (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility Page: 16 of 81

168 Report No: R-ITCEP07V03 As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 17 of 81

169 Report No: R-ITCEP07V Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted Emissions Humidity (%RH) (Telecommunicati on Ports) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Page: 18 of 81

170 Report No: R-ITCEP07V03 Power frequency magnetic field Voltage dips and interruption Temperature ( C) Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Humidity (%RH) Barometric pressure (mbar) Page: 19 of 81

171 Report No: R-ITCEP07V03 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN Test Setup 3.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 20 of 81

172 Report No: R-ITCEP07V Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 21 of 81

173 Report No: R-ITCEP07V Test Result Site : SR-1 Time : 2007/09/13-16:29 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Page: 22 of 81

174 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/13-16:30 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 81

175 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/13-16:30 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-L(023) - Line1 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 81

176 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/13-16:31 Limit : CISPR_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Page: 25 of 81

177 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/13-16:32 Limit : CISPR_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 81

178 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/13-16:32 Limit : CISPR_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : LISN-N(023) - Line2 network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 81

179 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Front View of Conducted Test Test Mode : Mode 1:Normal Operation Description : Back View of Conducted Test Page: 28 of 81

180 Report No: R-ITCEP07V03 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN Test Setup 4.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 29 of 81

181 Report No: R-ITCEP07V Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one Deviation from Test Standard No deviation. Page: 30 of 81

182 Report No: R-ITCEP07V Test Result Site : SR-1 Time : 2007/09/19-11:25 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 10Mbps Page: 31 of 81

183 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/19-11:25 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 81

184 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/19-11:25 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 81

185 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/19-11:24 Limit : ISN_Voltage_A_00M_QP Margin : 10 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 100Mbps Page: 34 of 81

186 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/19-11:25 Limit : ISN_Voltage_A_00M_QP Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 81

187 Report No: R-ITCEP07V03 Site : SR-1 Time : 2007/09/19-11:25 Limit : ISN_Voltage_A_00M_AV Margin : 0 EUT : Secure Serial Device Server (with Extension Probe : ISN-T400 - Line1 network module) Power : AC 230V/50Hz Note : ISN, 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 81

188 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Front View of ISN Test Test Mode : Mode 1:Normal Operation Description : Back View of ISN Test Page: 37 of 81

189 Report No: R-ITCEP07V03 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN Test Setup 5.3. Limit Frequency MHz Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 38 of 81

190 Report No: R-ITCEP07V Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 39 of 81

191 Report No: R-ITCEP07V Test Result Site : OATS -3 Time : 2007/09/13-14:34 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKANT_S3_2006_01 - HORIZONTAL network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 40 of 81

192 Report No: R-ITCEP07V03 Site : OATS -3 Time : 2007/09/13-14:26 Limit : CISPR_A_10M_QP Margin : 6 EUT : Secure Serial Device Server (with Extension Probe : LKANT_S3_2006_01 - VERTICAL network module) Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 81

193 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Front View of Radiated Test Test Mode : Mode 1:Normal Operation Description : Back View of Radiated Test Page: 42 of 81

194 Report No: R-ITCEP07V03 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 43 of 81

195 Report No: R-ITCEP07V03 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 44 of 81

196 Report No: R-ITCEP07V Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 45 of 81

197 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Power Harmonics Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class A limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #15 with 16.34% of the limit. Page: 46 of 81

198 Report No: R-ITCEP07V03 Test Result: Pass Source qualification: Normal THC(A): 0.14 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 13.2 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 47 of 81

199 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Power Harmonics Test Setup Page: 48 of 81

200 Report No: R-ITCEP07V03 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 49 of 81

201 Report No: R-ITCEP07V03 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 50 of 81

202 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Voltage Fluctuation and Flicker Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :08:57 Plt and limit line Plt :08:57 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 51 of 81

203 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Flicker Test Setup Page: 52 of 81

204 Report No: R-ITCEP07V03 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 53 of 81

205 Report No: R-ITCEP07V Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 54 of 81

206 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Electrostatic Discharge Mode 1:Normal Operation Date of Test 2007/09/19 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 55 of 81

207 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : ESD Test Setup Page: 56 of 81

208 Report No: R-ITCEP07V03 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 57 of 81

209 Report No: R-ITCEP07V Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 58 of 81

210 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Radiated susceptibility Mode 1:Normal Operation Date of Test 2007/09/14 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m at frequency MHz. No false alarms or other malfunctions were observed during or after the test. Page: 59 of 81

211 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Radiated Susceptibility Test Setup Page: 60 of 81

212 Report No: R-ITCEP07V Electrical Fast Transient/Burst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 61 of 81

213 Report No: R-ITCEP07V Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 62 of 81

214 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Electrical fast transient/burst Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 63 of 81

215 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : EFT/B Test Setup Test Mode : Mode 1:Normal Operation Description : EFT/B Test Setup-Clamp Page: 64 of 81

216 Report No: R-ITCEP07V Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± /50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 65 of 81

217 Report No: R-ITCEP07V Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 66 of 81

218 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Surge Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Complied Required to Criteria Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 67 of 81

219 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : SURGE Test Setup Page: 68 of 81

220 Report No: R-ITCEP07V Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 69 of 81

221 Report No: R-ITCEP07V Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 70 of 81

222 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Conducted susceptibility Mode 1:Normal Operation Date of Test 2007/09/17 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN01 AC IN A A PASS 0.15~ (3V) CDN11 LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 71 of 81

223 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Conducted Susceptibility Test Setup Test Mode : Mode 1:Normal Operation Description : Conducted Susceptibility Test Setup-CDN Page: 72 of 81

224 Report No: R-ITCEP07V Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 73 of 81

225 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Power frequency magnetic field Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 74 of 81

226 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Power Frequency Magnetic Field Test Setup Page: 75 of 81

227 Report No: R-ITCEP07V Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 76 of 81

228 Report No: R-ITCEP07V Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 77 of 81

229 Report No: R-ITCEP07V Test Result Product Secure Serial Device Server (with Extension network module) Test Item Test Mode Voltage dips and interruption Mode 1:Normal Operation Date of Test 2007/09/14 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS >95(0V) C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 78 of 81 kv

230 Report No: R-ITCEP07V Test Photograph Test Mode : Mode 1:Normal Operation Description : Voltage Dips Test Setup Page: 79 of 81

231 Report No: R-ITCEP07V Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 80 of 81

232 Report No: R-ITCEP07V03 (3) EUT Photo (4) EUT Photo Page: 81 of 81