CERTIFICATE EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: EN : 2000 IEC Edition 1.

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1 CERTIFICATE Issued Date: Apr Report No.: 073L036-ITCEP11V04 This is to certify that the following designated product Product : Notebook Trade Name : MSI Model Number : MS-1222, PR210 Company Name : MICRO-STAR INT L Co., LTD. This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003 EN : 2000 IEC Edition 1.2: EN : A1: 2001 IEC : 2002+A1: 2002 IEC : 2004 IEC Edition 1.1: IEC Edition 2.1: IEC Edition 1.1: IEC Second Edition: AS/NZS CISPR 22: 2004 TEST LAORATORY Gene Chang / President No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL: FAX: service@quietek.com

2 Test Report Product Name : Notebook Model No. : MS-1222, PR210 Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2007/03/06 Issued Date : 2007/04/13 Report No. : 073L036-ITCEP11V04 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

3 Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment: Product Trade Name Model Number : Notebook : MSI : MS-1222, PR210 This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1: 2000+A2: 2003 Class : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

4 QTK No.: 073L036-ITCEP11V04 Statement of Conformity This certifies that the following designated product: Product Trade Name Model Number Company Name : Notebook : MSI : MS-1222, PR210 : MICRO-STAR INT L Co., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1: 2000+A2: 2003 Class : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LAORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

5 Test Report Certification Issued Date : 2007/04/13 Report No. : 073L036-ITCEP11V04 Product Name : Notebook Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Manufacturer : MICRO-STAR INT L Co., LTD. Model No. : MS-1222, PR210 Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC V / Hz Trade Name : MSI Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class EN 55024: 1998+A1: 2001+A2: 2003 EN :2000EN :1995+A1:2001 AS/NZS CISPR 22: 2004 Test Result : Complied Performed Location : Linkou EMC laboratory No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented y : Reviewed y : Approved y : ( Engineering Adm. Assistant / Genie Chang ) ( Engineer / Joy Liu ) ( President / Gene Chang ) Page: 2 of 205

6 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation odies in compliance with ISO 17025, EN and Guide 25: Taiwan R.O.C. : SMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com 1313 LinKou Testing Laboratory : No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com 0914 Page: 3 of 205

7 TALE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 205

8 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/urst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 205

9 10.7. Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 205

10 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Notebook MSI MS-1222, PR210 Component Antenna Cable Shielded, 1.8m Power Adapter (1) MFR: LITE-ON, M/N: PA Input: V, 50-60Hz, 1.6A Output: 19V, 4.2A Cable Out: Shielded, 1.8m with one ferrite core bonded. Power Adapter (2) MFR: LI SHIN, M/N:0335A1965 Input: V, 50-60Hz, 1.7A Output: 19V, 3.42A Cable Out: Shielded, 1.8m with one ferrite core bonded. Power Adapter (3) MFR: EDAC, M/N: EA10953 Input: V, 50-60Hz, 2.5A Output: 19V, 4.74A Cable Out: Shielded, 1.8m with one ferrite core bonded. Power Adapter (4) MFR: LI SHIN, M/N: LSE0202C1990 Input: V, 50-60Hz, 1.5A Output: 19V, 4.74A Cable Out: Shielded, 1.8m with one ferrite core bonded. Power Adapter (5) MFR: LITE ON, M/N: DA Input: V, 50-60Hz, 1.5A Output: 19V, 4.74A Cable Out: Shielded, 1.8m with one ferrite core bonded. Page: 7 of 205

11 Keyparts List Item Vendor Model Discription CPU AMD Turion64x2 Sampron TMDTL64HAX5CT,2.2GHz TMDTL60HAX5CT,,2.0GHz TMDTL56HAX5CT,,1.8GHz TMDTL52HAX5CT,,1.6GHz TMDTL50HAX4CT,,1.6GHz TMDMK36HAX4CM,2.0GHz SMS3500HAX4CM,,1.8GHz SMS3400HAX3CM,,1.8GHz SMS3200HAX4CM,,1.6GHz 121EW03 V.3 QD12TL02 TURION64-35W-2200MHz(S1 SOCKET) TL64 1M L2 TURION64x2-35W-2000MHz(S1 SOCKET) TL60 512Kx2 L2 TURION64x2-33W-1800MHz(S1 SOCKET) TL56 512Kx2 L2 TURION64x2-31W-1600MHz(S1 SOCKET) TL52 512Kx2 L2 TURION64x2-31W-1600MHz(S1 SOCKET) TL50 256Kx2 L2 TURION64-35W-2000MHz(S1 SOCKET); singal core 512K L2 CACHE MOILE SEMPRON(S1 SOCKET) 25W SERIES 3500+, 256K L2 CACHE MOILE SEMPRON(S1 SOCKET) 25W SERIES K L2 CACHE MOILE SEMPRON(S1 SOCKET) 25W SERIES x800//GLARE,RoHS Samsung LTN121W1-L "TFT type CMO N121I3-L "TFT type MHW2060H MHW2080H MHW2100H MHW2120H 1280x800//Anti-GLARE,RoHS HDD, 60G, 5400RPM, S-ATA, RoHS HDD, 80G, 5400RPM, S-ATA, RoHS HDD, 100G, 5400RPM, S-ATA, RoHS HDD, 120G, 5400RPM, S-ATA, RoHS Toshiba MK6034GSX (RoHS) HDD, 60G, 5400RPM, S-ATA, RoHS Toshiba MK1234GSX (RoHS) HDD, 120G, 5400RPM, S-ATA, RoHS Hitachi Hitachi HTS541060G9SA00 (RoHS) HTS541080G9SA00 (RoHS) HDD, 60G, 5400RPM, S-ATA, RoHS HDD, 80G, 5400RPM, S-ATA, RoHS Page: 8 of 205

12 WD WD800EVS-xxRST0 80G, 5400rpm (8M) WD WD160EVS-xxRST0 160G, 5400rpm (8M) HLDS Super Multi + LightScribe GMA-4084N QSI(Sony) Super Multi AD-7530A 3rd Lite-On Combo SSC-2485K Transcend TS128MSQ64V5J DDRII 533 1G, Samsung chip, RoHs 1G Transcend TS128MSQ64V5J (Elpida wga) 533 Apacer 78.02G (Elpida wga) TwinMos 8D-22KJ5MHTP Hynix 64x8 Transcend TS128MSQ64V6J DDRII 667, 1G, Micron chip, RoHs 1G TwinMos 8D-23KN5MHTP (Hynix) 667 A-data A-data ADOPE1A16332 Transcend TS64MSQ64V5J DDRII 533, 512M, Samsung chip, RoHs TwinMos 8D-22JJ3M-HTP (Hynix 32x16) DRAM 512M Apacer 78.92G51.AF1 (Hynix) (DDRII) 533 Transcend TS64MSQ64V5J (Elpida wga) Apacer 78.92G (Elpida wga) Transcend TS64MSQ64V6J DDRII 667, 512M, Micron chip, RoHs Transcend TS64MSQ64V6J DDRII M, Elpida chip, RoHs A-data A-data ADOPE M Transcend Transcend(RJETRAM) 667 Nanya NT512T64UHA1FN-3C DDRII 667, 512M, RoHs TwinMos 8D-23JN5MHATP (Hynix) Apacer 78.92G (Elpida wga) Inverter 1st SAMPO YIVNMS0018D11 MODULE/Inverter,12"~15" Lead free MSI MS Vdc,2200mAh Simplo MS1006,TY-S Vdc,2400mAh attery -- Gallopwire MS Vdc,4400mAh Gallopwire TY-S Vdc,4800mAh Welltop TY-S27,MS Vdc,4800mAh Adaptor 90W Lite-On PA RM PA ver.rm LI SHIN LSE0202C EDAC EA10953( ) -- Page: 9 of 205

13 65W 2nd Lite-On PA PA ver.rm LI SHIN Chicony US-international Power Cord 1st US; 3-pin Elantech TM TM Modify F4, F5(new layout) all P/N in the other page Silver ; the same as S SD2, but VPN lack lack Agere D40 MDC1.5 WLAN 2nd TwinHan AW-GE780 Atheros IC : AR2425 MSI D-050 TOSHIA firmware for VISTA ACME -- final version 2nd ISON N29M4SD11300_V M Pixel, 5.3mm height TV tuner 1st ProNet Hybrid HM100E FingerPrinter 1st UPEK TCS4 -- Note: 1. The EUT is including two models. 2. The MS-1222 for MSI and the PR210 for different marketing requirement. Page: 10 of 205

14 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Final Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Emission MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Immunity MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Page: 11 of 205

15 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Printer EPSON StyLus C63 FAPY Non-Shielded, 1.9m 2 Monitor TATUNG N/A N/A Non-Shielded, 1.8m 3 US 2.0 HDD AACOM F12-UF N/A Power by PC 4 Microphone & PCHOME N/A N/A N/A Earphone 5 Mouse COMPAQ M-S69 44J5 N/A 6 Notebook PC DELL PP18L Non-Shielded, 0.8m 7 Exchange Sun Moon Star PX Non-Shielded, 1.8m Network 8 Monitor SAMSUNG 1200NF Z Non-Shielded, 1.8m 9 TS9980 R&S N/A N/A Non-Shielded, 1.8m Page: 12 of 205

16 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A US Cable Shielded, 1.5m HDMI Cable Shielded, 1.8m, with two ferrite cores bonded C US Cable Shielded, 1.5m D Earphone & Microphone Cable Non-Shielded, 1.6m E US Mouse Cable Shielded, 1.8m F D-SU Cable Shielded, 1.8m, with two ferrite cores bonded G LAN Cable Non-Shielded, 4m H TELECOM Cable Non-Shielded, 2m I TELECOM Cable Non-Shielded, 2m J COAXIAL Cable Shielded, 7m Page: 13 of 205

17 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Notebook sends H pattern to monitor. 5 Notebook sends H pattern to printer, the printer will print H pattern on paper. 6 Notebook reads and writes data into and from modem. 7 Notebook will read data from floppy disk and then writes the data into floppy disk, same operation for hard disk. 8 Repeat the above procedure (4) to (7). Page: 14 of 205

18 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class Yes No AS/NZS CISPR 22: 2004 Impedance Stabilization EN 55022:1998+A1:2000+A2:2003 Class Yes No Network AS/NZS CISPR 22: 2004 Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class Yes No AS/NZS CISPR 22: 2004 Power Harmonics EN :2000 Yes No Voltage Fluctuation and Flicker EN :1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC Edition 1.2: Yes No Radiated susceptibility IEC :2002+A1:2002 Yes No Electrical fast transient/burst IEC :2004 Yes No Surge IEC Edition 1.1: Yes No Conducted susceptibility IEC Edition 2.1: Yes No Power frequency magnetic field IEC Edition 1.1: Yes No Voltage dips and interruption IEC nd Edition: Yes No Page: 15 of 205

19 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS / /02/12 LISN R&S ENV / /07/13 LISN R&S ESH3-Z / /01/26 Pulse Limiter R&S ESH3-Z /09/04 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator N/A N/A N/A N/A Capacitive Voltage Probe Schaffner CVP2200A /11/10 EMI Test Receiver R&S ESCS / /02/12 LISN R&S ESH3-Z / /01/26 LISN R&S ENV / /07/13 lmpedance Stabilization Network Schaffner ISN T /07/15 Pulse Limiter R&S ESH3-Z /09/04 RF Current Probe FCC F-65 10KHz~1GHz /11/10 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date ilog Antenna Schaffner Chase CL /08/09 roadband Horn Antenna Schwarzbeck HA /07/25 EMI Test Receiver R&S ESCS / /05/11 EMI Test Receiver R&S ESI / /06/19 Horn Antenna Schwarzbeck HA9120D /08/10 Pre-Amplifier QTK N/A N/A 2006/01/03 Pre-Amplifier MITEQ AMF-4D P /01/03 Spectrum Analyzer Advantest R /10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /06/29 IEC X Analyzer(Flicker) Schaffner CCN X /06/29 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /06/29 IEC X Analyzer(Flicker) Schaffner CCN X /06/29 Page: 16 of 205

20 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System KeyTek MZ-15/EC /08/02 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / C5 Instrument Manufacturer Type No. Serial No Cal. Date AF-OX R&S AF-OX ACCUST N/A Audio Analyzer R&S UPL /03/16 ilog Antenna Schaffner Chase CL /01/03 road-and Antenna Schwarzbeck VUL /08/02 CMU200 UNIV.RADIOCOMM R&S CMU /03/16 Directional Coupler A&R DC N/A Dual Microphone Supply &K /08/04 Mouth Simulator &K /08/04 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Meter R&S NRVD(P.M) /04/21 Pre-Amplifier A&R 150A N/A Probe Microphone &K /08/04 Signal Generator R&S SMY02(9K-208 0) / /09/22 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A EMC immunity system Thermo EMCPRO PLUS /03/01 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A EMC immunity system Thermo EMCPRO PLUS /03/01 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator N/A N/A N/A N/A N/A N/A N/A N/A N/A Page: 17 of 205

21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F..ELL /05/30 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A N/A EMC immunity system Thermo EMCPRO PLUS /03/01 Page: 18 of 205

22 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 d. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 d. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 d. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 d. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/urst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/urst standards. The immunity test signal from the EFT/urst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 19 of 205

23 Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 d and 2.78 d. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 20 of 205

24 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) arometric pressure (mbar) Temperature ( C) Impedance Stabilization Humidity (%RH) Network arometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) arometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) arometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) arometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) arometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) arometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) arometric pressure (mbar) Page: 21 of 205

25 Power frequency magnetic field Voltage dips and interruption Temperature ( C) Humidity (%RH) arometric pressure (mbar) Temperature ( C) Humidity (%RH) arometric pressure (mbar) Page: 22 of 205

26 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN and AS/NZS CISPR 22: Test Setup 3.3. Limit Limits Frequency (MHz) QP (duv) AV (duv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 23 of 205

27 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) oth sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 24 of 205

28 3.6. Test Result Site : SR-1 Time : 2007/03/09-11:57 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 1 Page: 25 of 205

29 Site : SR-1 Time : 2007/03/09-11:58 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 205

30 Site : SR-1 Time : 2007/03/09-11:58 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 205

31 Site : SR-1 Time : 2007/03/09-12:00 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 1 Page: 28 of 205

32 Site : SR-1 Time : 2007/03/09-12:01 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 205

33 Site : SR-1 Time : 2007/03/09-12:01 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 205

34 Site : SR-1 Time : 2007/03/09-13:15 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 2 Page: 31 of 205

35 Site : SR-1 Time : 2007/03/09-13:38 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 205

36 Site : SR-1 Time : 2007/03/09-13:39 Limit : CISPR 00M_AV Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 205

37 Site : SR-1 Time : 2007/03/09-13:40 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 2 Page: 34 of 205

38 Site : SR-1 Time : 2007/03/09-13:41 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 205

39 Site : SR-1 Time : 2007/03/09-13:41 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 205

40 Site : SR-1 Time : 2007/03/09-14:18 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 3 Page: 37 of 205

41 Site : SR-1 Time : 2007/03/09-14:19 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 205

42 Site : SR-1 Time : 2007/03/09-14:19 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 205

43 Site : SR-1 Time : 2007/03/09-14:29 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 3 Page: 40 of 205

44 Site : SR-1 Time : 2007/03/09-14:31 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 205

45 Site : SR-1 Time : 2007/03/09-14:31 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 205

46 Site : SR-1 Time : 2007/03/09-14:34 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 4 Page: 43 of 205

47 Site : SR-1 Time : 2007/03/09-14:35 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 205

48 Site : SR-1 Time : 2007/03/09-14:35 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 205

49 Site : SR-1 Time : 2007/03/09-14:36 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 4 Page: 46 of 205

50 Site : SR-1 Time : 2007/03/09-14:38 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 205

51 Site : SR-1 Time : 2007/03/09-14:38 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 205

52 Site : SR-1 Time : 2007/03/12-14:46 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 5 Page: 49 of 205

53 Site : SR-1 Time : 2007/03/12-14:47 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 50 of 205

54 Site : SR-1 Time : 2007/03/12-14:47 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 51 of 205

55 Site : SR-1 Time : 2007/03/12-14:48 Limit : CISPR 00M_QP Margin : 10 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 5 Page: 52 of 205

56 Site : SR-1 Time : 2007/03/12-14:50 Limit : CISPR 00M_QP Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 53 of 205

57 Site : SR-1 Time : 2007/03/12-14:50 Limit : CISPR 00M_AV Margin : 0 EUT : Notebook Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 54 of 205

58 3.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Front View of Conducted Test Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ack View of Conducted Test Page: 55 of 205

59 Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Front View of Conducted Test Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : ack View of Conducted Test Page: 56 of 205

60 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Front View of Conducted Test Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : ack View of Conducted Test Page: 57 of 205

61 Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Front View of Conducted Test Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ack View of Conducted Test Page: 58 of 205

62 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Front View of Conducted Test Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ack View of Conducted Test Page: 59 of 205

63 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN and AS/NZS CISPR 22: Test Setup 4.3. Limit Limits Frequency (MHz) QP (duv) AV (duv) Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 60 of 205

64 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. oth alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60d LCL ISN is used for cat. 5 cable, 50d LCL ISN is used for cat. 3 and 80d LCL is used for alternative one Deviation from Test Standard No deviation. Page: 61 of 205

65 4.6. Test Result Site : SR-1 Time : 2007/03/12-15:34 Limit : ISN_Voltage 10db_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 100 M Page: 62 of 205

66 Site : SR-1 Time : 2007/03/12-15:35 Limit : ISN_Voltage 10db_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 100 M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 63 of 205

67 Site : SR-1 Time : 2007/03/12-15:35 Limit : ISN_Voltage 10db_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 100 M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 64 of 205

68 Site : SR-1 Time : 2007/03/12-15:50 Limit : ISN_Voltage 10db_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 10 M Page: 65 of 205

69 Site : SR-1 Time : 2007/03/12-15:52 Limit : ISN_Voltage 10db_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 10 M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 66 of 205

70 Site : SR-1 Time : 2007/03/12-15:52 Limit : ISN_Voltage 10db_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN 10 M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 67 of 205

71 Site : SR-1 Time : 2007/03/12-16:08 Limit : ISN_Voltage 00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN TELCOM Page: 68 of 205

72 Site : SR-1 Time : 2007/03/12-16:09 Limit : ISN_Voltage 00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN TELCOM Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 69 of 205

73 Site : SR-1 Time : 2007/03/12-16:09 Limit : ISN_Voltage 00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T400 - Line1 Note : MODE 1, ISN TELCOM Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 70 of 205

74 Site : SR-1 Time : 2007/03/12-16:17 Limit : ISN_Voltage 00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : CVP-2200A - Line1 Note : MODE 1, ISN GIGA VOL Page: 71 of 205

75 Site : SR-1 Time : 2007/03/12-16:18 Limit : ISN_Voltage 00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : CVP-2200A - Line1 Note : MODE 1, ISN GIGA VOL Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 72 of 205

76 Site : SR-1 Time : 2007/03/12-16:18 Limit : ISN_Voltage 00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : CVP-2200A - Line1 Note : MODE 1, ISN GIGA VOL Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 73 of 205

77 Site : SR-1 Time : 2007/03/12-16:22 Limit : ISN_Current 00M_QP Margin : 10 EUT : Notebook Probe : - Line1 Power : AC 230V/50Hz Note : MODE 1, ISN GIGA CUR Page: 74 of 205

78 Site : SR-1 Time : 2007/03/12-16:25 Limit : ISN_Current 00M_QP Margin : 0 EUT : Notebook Probe : - Line1 Power : AC 230V/50Hz Note : MODE 1, ISN GIGA CUR Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 75 of 205

79 Site : SR-1 Time : 2007/03/12-16:25 Limit : ISN_Current 00M_AV Margin : 0 EUT : Notebook Probe : - Line1 Power : AC 230V/50Hz Note : MODE 1, ISN GIGA CUR Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 76 of 205

80 4.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Front View of ISN Test Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ack View of ISN Test Page: 77 of 205

81 Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Front View of ISN Test - GIGA VOL Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ack View of ISN Test - GIGA VOL Page: 78 of 205

82 Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Front View of ISN Test - GIGA CUR Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ack View of ISN Test - GIGA CUR Page: 79 of 205

83 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN and AS/NZS CISPR Test Setup 5.3. Limit Frequency (MHz) Limits Distance (m) duv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 80 of 205

84 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. oth horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 81 of 205

85 5.6. Test Result Site : OATS-3 Time : 2007/03/12-23:22 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - HORIZONTAL Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 82 of 205

86 Site : OATS-3 Time : 2007/03/12-23:26 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - VERTICAL Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 83 of 205

87 Site : OATS-3 Time : 2007/03/12-23:28 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - HORIZONTAL Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 84 of 205

88 Site : OATS-3 Time : 2007/03/12-23:29 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - VERTICAL Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 85 of 205

89 Site : OATS-3 Time : 2007/03/12-23:31 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - HORIZONTAL Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 86 of 205

90 Site : OATS-3 Time : 2007/03/12-23:32 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - VERTICAL Power : AC 230V/50Hz Note : MODE 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 87 of 205

91 Site : OATS-3 Time : 2007/03/12-23:33 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - HORIZONTAL Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 88 of 205

92 Site : OATS-3 Time : 2007/03/12-23:36 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - VERTICAL Power : AC 230V/50Hz Note : MODE 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 89 of 205

93 Site : OATS-3 Time : 2007/03/12-23:37 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - HORIZONTAL Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 90 of 205

94 Site : OATS-3 Time : 2007/03/12-23:38 Limit : CISPR 10M_QP Margin : 6 EUT : Notebook Probe : LKCL6112(2704)-Site3-10M - VERTICAL Power : AC 230V/50Hz Note : MODE 5 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 91 of 205

95 5.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Front View of Radiated Test Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ack View of Radiated Test Page: 92 of 205

96 Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Front View of Radiated Test Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : ack View of Radiated Test Page: 93 of 205

97 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Front View of Radiated Test Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : ack View of Radiated Test Page: 94 of 205

98 Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Front View of Radiated Test Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ack View of Radiated Test Page: 95 of 205

99 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Front View of Radiated Test Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ack View of Radiated Test Page: 96 of 205

100 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 97 of 205

101 (b) Limits of Class Harmonics Currents For Class equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 98 of 205

102 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 99 of 205

103 6.6. Test Result Product Notebook Test Item Power Harmonics Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/03/07 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 0.00% of the limit. Page: 100 of 205

104 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 74.7 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 101 of 205

105 Product Notebook Test Item Power Harmonics Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/03/07 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 0.00% of the limit. Page: 102 of 205

106 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 71.6 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 103 of 205

107 Product Notebook Test Item Power Harmonics Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/03/12 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 104 of 205

108 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 70.2 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 105 of 205

109 Product Notebook Test Item Power Harmonics Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/03/12 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 106 of 205

110 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 69.2 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 107 of 205

111 Product Notebook Test Item Power Harmonics Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/03/07 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 108 of 205

112 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 69.7 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 109 of 205

113 6.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Power Harmonics Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Power Harmonics Test Setup Page: 110 of 205

114 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Power Harmonics Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Power Harmonics Test Setup Page: 111 of 205

115 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Power Harmonics Test Setup Page: 112 of 205

116 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 113 of 205

117 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 114 of 205

118 7.6. Test Result Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/03/07 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :07:08 Plt and limit line Plt :07:08 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 115 of 205

119 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/03/07 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 Pst :28:49 Plt and limit line Plt :28:49 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 116 of 205

120 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/03/12 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 Pst :47:26 Plt and limit line Plt :47:26 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 117 of 205

121 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/03/12 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 Pst :59:56 Plt and limit line Plt :59:56 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 118 of 205

122 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/03/12 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 Pst :25:51 Plt and limit line Plt :25:51 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 119 of 205

123 7.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Flicker Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Flicker Test Setup Page: 120 of 205

124 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Flicker Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Flicker Test Setup Page: 121 of 205

125 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Flicker Test Setup Page: 122 of 205

126 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge Page: 123 of 205

127 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 124 of 205

128 8.6. Test Result Product Notebook Test Item Electrostatic Discharge Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge kV -8kV Pass Pass Contact Discharge kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 125 of 205

129 Product Notebook Test Item Electrostatic Discharge Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge kV -8kV Pass Pass Contact Discharge kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 126 of 205

130 Product Notebook Test Item Electrostatic Discharge Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge kV -8kV Pass Pass Contact Discharge kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 127 of 205

131 Product Notebook Test Item Electrostatic Discharge Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge kV -8kV Pass Pass Contact Discharge kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 128 of 205

132 Product Notebook Test Item Electrostatic Discharge Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge kV -8kV Pass Pass Contact Discharge kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 129 of 205

133 8.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : ESD Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : ESD Test Setup Page: 130 of 205

134 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : ESD Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ESD Test Setup Page: 131 of 205

135 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : ESD Test Setup Page: 132 of 205

136 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 133 of 205

137 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. oth horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 134 of 205

138 9.6. Test Result Product Notebook Test Item Radiated susceptibility Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS ACK H 3 A A PASS ACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 135 of 205

139 Product Notebook Test Item Radiated susceptibility Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS ACK H 3 A A PASS ACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 136 of 205

140 Product Notebook Test Item Radiated susceptibility Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS ACK H 3 A A PASS ACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 137 of 205

141 Product Notebook Test Item Radiated susceptibility Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS ACK H 3 A A PASS ACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 138 of 205

142 Product Notebook Test Item Radiated susceptibility Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS ACK H 3 A A PASS ACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 139 of 205

143 9.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Radiated Susceptibility Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Radiated Susceptibility Test Setup Page: 140 of 205

144 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Radiated Susceptibility Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Radiated Susceptibility Test Setup Page: 141 of 205

145 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Radiated Susceptibility Test Setup Page: 142 of 205

146 10. Electrical Fast Transient/urst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 Page: 143 of 205

147 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/ interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 144 of 205

148 10.6. Test Result Product Notebook Test Item Electrical fast transient/burst Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN PASS LAN ± 0.5 kv 90 Clamp PASS Telecom ± 0.5 kv 90 Clamp PASS Coaxial Cable ± 0.5 kv 90 Clamp PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 145 of 205

149 Product Notebook Test Item Electrical fast transient/burst Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN PASS LAN ± 0.5 kv 90 Clamp PASS Telecom ± 0.5 kv 90 Clamp PASS Coaxial Cable ± 0.5 kv 90 Clamp PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 146 of 205

150 Product Notebook Test Item Electrical fast transient/burst Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN PASS LAN ± 0.5 kv 90 Clamp PASS Telecom ± 0.5 kv 90 Clamp PASS Coaxial Cable ± 0.5 kv 90 Clamp PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 147 of 205

151 Product Notebook Test Item Electrical fast transient/burst Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN PASS LAN ± 0.5 kv 90 Clamp PASS Telecom ± 0.5 kv 90 Clamp PASS Coaxial Cable ± 0.5 kv 90 Clamp PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 148 of 205

152 Product Notebook Test Item Electrical fast transient/burst Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN PASS LAN ± 0.5 kv 90 Clamp PASS Telecom ± 0.5 kv 90 Clamp PASS Coaxial Cable ± 0.5 kv 90 Clamp PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 149 of 205

153 10.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : EFT/ Test Setup Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : EFT/ Test Setup-Clamp Page: 150 of 205

154 Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : EFT/ Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : EFT/ Test Setup-Clamp Page: 151 of 205

155 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : EFT/ Test Setup Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : EFT/ Test Setup-Clamp Page: 152 of 205

156 Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : EFT/ Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : EFT/ Test Setup-Clamp Page: 153 of 205

157 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : EFT/ Test Setup Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : EFT/ Test Setup-Calmp Page: 154 of 205

158 11. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± /50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. Page: 155 of 205

159 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 156 of 205

160 11.6. Test Result Product Notebook Test Item Surge Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complie d to Criteria Result L-N ± 0 1kV 60 Direct PASS L-N ± 90 1kV 60 Direct PASS L-N ± 180 1kV 60 Direct PASS L-N ± 270 1kV 60 Direct PASS L-PE ± 0 2kV 60 Direct PASS L-PE ± 90 2kV 60 Direct PASS L-PE ± 180 2kV 60 Direct PASS L-PE ± 270 2kV 60 Direct PASS N-PE ± 0 2kV 60 Direct PASS N-PE ± 90 2kV 60 Direct PASS N-PE ± 180 2kV 60 Direct PASS N-PE ± 270 2kV 60 Direct PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 157 of 205

161 Product Notebook Test Item Surge Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Page: 158 of 205 Inject Method Required Criteria Complie d to Criteria Result L-N ± 0 1kV 60 Direct PASS L-N ± 90 1kV 60 Direct PASS L-N ± 180 1kV 60 Direct PASS L-N ± 270 1kV 60 Direct PASS L-PE ± 0 2kV 60 Direct PASS L-PE ± 90 2kV 60 Direct PASS L-PE ± 180 2kV 60 Direct PASS L-PE ± 270 2kV 60 Direct PASS N-PE ± 0 2kV 60 Direct PASS N-PE ± 90 2kV 60 Direct PASS N-PE ± 180 2kV 60 Direct PASS N-PE ± 270 2kV 60 Direct PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test.

162 Product Notebook Test Item Surge Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Page: 159 of 205 Inject Method Required Criteria Complie d to Criteria Result L-N ± 0 1kV 60 Direct PASS L-N ± 90 1kV 60 Direct PASS L-N ± 180 1kV 60 Direct PASS L-N ± 270 1kV 60 Direct PASS L-PE ± 0 2kV 60 Direct PASS L-PE ± 90 2kV 60 Direct PASS L-PE ± 180 2kV 60 Direct PASS L-PE ± 270 2kV 60 Direct PASS N-PE ± 0 2kV 60 Direct PASS N-PE ± 90 2kV 60 Direct PASS N-PE ± 180 2kV 60 Direct PASS N-PE ± 270 2kV 60 Direct PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test.

163 Product Notebook Test Item Surge Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Page: 160 of 205 Inject Method Required Criteria Complie d to Criteria Result L-N ± 0 1kV 60 Direct PASS L-N ± 90 1kV 60 Direct PASS L-N ± 180 1kV 60 Direct PASS L-N ± 270 1kV 60 Direct PASS L-PE ± 0 2kV 60 Direct PASS L-PE ± 90 2kV 60 Direct PASS L-PE ± 180 2kV 60 Direct PASS L-PE ± 270 2kV 60 Direct PASS N-PE ± 0 2kV 60 Direct PASS N-PE ± 90 2kV 60 Direct PASS N-PE ± 180 2kV 60 Direct PASS N-PE ± 270 2kV 60 Direct PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test.

164 Product Notebook Test Item Surge Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Page: 161 of 205 Inject Method Required Criteria Complie d to Criteria Result L-N ± 0 1kV 60 Direct PASS L-N ± 90 1kV 60 Direct PASS L-N ± 180 1kV 60 Direct PASS L-N ± 270 1kV 60 Direct PASS L-PE ± 0 2kV 60 Direct PASS L-PE ± 90 2kV 60 Direct PASS L-PE ± 180 2kV 60 Direct PASS L-PE ± 270 2kV 60 Direct PASS N-PE ± 0 2kV 60 Direct PASS N-PE ± 90 2kV 60 Direct PASS N-PE ± 180 2kV 60 Direct PASS N-PE ± 270 2kV 60 Direct PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test.

165 11.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : SURGE Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : SURGE Test Setup Page: 162 of 205

166 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : SURGE Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : SURGE Test Setup Page: 163 of 205

167 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : SURGE Test Setup Page: 164 of 205

168 12. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 165 of 205

169 12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130duV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 166 of 205

170 12.6. Test Result Product Notebook Test Item Conducted susceptibility Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) duv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN 10/100 A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) Clamp Coaxial A A PASS 0.15~ (3V) CDN LAN GIGA A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 167 of 205

171 Product Notebook Test Item Conducted susceptibility Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) duv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN 10/100 A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) Clamp Coaxial A A PASS 0.15~ (3V) CDN LAN GIGA A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 168 of 205

172 Product Notebook Test Item Conducted susceptibility Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) duv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN 10/100 A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) Clamp Coaxial A A PASS 0.15~ (3V) CDN LAN GIGA A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 169 of 205

173 Product Notebook Test Item Conducted susceptibility Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) duv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN 10/100 A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) Clamp Coaxial A A PASS 0.15~ (3V) CDN LAN GIGA A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 170 of 205

174 Product Notebook Test Item Conducted susceptibility Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) duv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN 10/100 A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) Clamp Coaxial A A PASS 0.15~ (3V) CDN LAN GIGA A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 171 of 205

175 12.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Conducted Susceptibility Test Setup Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Conducted Susceptibility Test Setup-CDN Page: 172 of 205

176 Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Conducted Susceptibility Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Conducted Susceptibility Test Setup-CDN Page: 173 of 205

177 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Conducted Susceptibility Test Setup Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Conducted Susceptibility Test Setup-CDN Page: 174 of 205

178 Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Conducted Susceptibility Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Conducted Susceptibility Test Setup-CDN Page: 175 of 205

179 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Conducted Susceptibility Test Setup Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Conducted Susceptibility Test Setup-CDN Page: 176 of 205

180 13. Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 177 of 205

181 13.6. Test Result Product Notebook Test Item Power frequency magnetic field Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 178 of 205

182 Product Notebook Test Item Power frequency magnetic field Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 179 of 205

183 Product Notebook Test Item Power frequency magnetic field Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 180 of 205

184 Product Notebook Test Item Power frequency magnetic field Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 181 of 205

185 Product Notebook Test Item Power frequency magnetic field Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 182 of 205

186 13.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Power Frequency Magnetic Field Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Power Frequency Magnetic Field Test Setup Page: 183 of 205

187 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Power Frequency Magnetic Field Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Power Frequency Magnetic Field Test Setup Page: 184 of 205

188 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Power Frequency Magnetic Field Test Setup Page: 185 of 205

189 14. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 > > 95 C 250 Page: 186 of 205

190 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 187 of 205

191 14.6. Test Result Product Notebook Test Item Voltage dips and interruption Test Mode MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Date of Test 2007/04/12 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 188 of 205 kv

192 Product Notebook Test Item Voltage dips and interruption Test Mode MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Date of Test 2007/04/12 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 189 of 205 kv

193 Product Notebook Test Item Voltage dips and interruption Test Mode MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Date of Test 2007/04/12 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 190 of 205 kv

194 Product Notebook Test Item Voltage dips and interruption Test Mode MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 191 of 205 kv

195 Product Notebook Test Item Voltage dips and interruption Test Mode MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Date of Test 2007/04/12 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 192 of 205 kv

196 14.7. Test Photograph Test Mode : MODE 1: LCD+CRT 1280*800 60Hz AMD 2.2G Description : Voltage Dips Test Setup Test Mode : MODE 2: LCD+CRT 1280*800 60Hz AMD 2.0G Description : Voltage Dips Test Setup Page: 193 of 205

197 Test Mode : MODE 3: LCD+CRT 1280*800 60Hz AMD 1.8G Description : Voltage Dips Test Setup Test Mode : MODE 4: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Voltage Dips Test Setup Page: 194 of 205

198 Test Mode : MODE 5: LCD+HDMI 1280*720/60Hz AMD 1.6G Description : Voltage Dips Test Setup Page: 195 of 205

199 15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 196 of 205

200 (3) EUT Photo (4) EUT Photo Page: 197 of 205

201 (5) EUT Photo (6) EUT Photo Page: 198 of 205

202 (7) EUT Photo (8) EUT Photo Page: 199 of 205

203 (9) EUT Photo (10) EUT Photo Page: 200 of 205

204 (11) EUT Photo (12) EUT Photo Page: 201 of 205

205 (13) EUT Photo (14) EUT Photo Page: 202 of 205

206 (15) EUT Photo (16) EUT Photo Page: 203 of 205

207 (17) EUT Photo (18) EUT Photo Page: 204 of 205

208 (19) EUT Photo Page: 205 of 205