Test Report : MS-16Y1. : 10C319R-ITCEP07V04 Report Version : V1.0

Transcription

1 Test Report Product Name : Notebook PC Model No. : MS-16Y1 Applicant : PEGATRON CORPORATION Address : 5F,No.76,Ligong St.,Beitou,Taipei 112,Taiwan Date of Receipt : 2010/12/20 Issued Date : 2011/01/12 Report No. : 10C319R-ITCEP07V04 Report Version : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

2 Test Report Certification Issued Date : 2011/01/12 Report No. : 10C319R-ITCEP07V04 Product Name : Notebook PC Applicant : PEGATRON CORPORATION Address : 5F,No.76, Ligong St., Beitou,Taipei 112,Taiwan Manufacturer : 1.PEGATRON CORPORATION Taoyuan Mfg 2.Protek (Shanghai) Limited. 3.MAINTEK COMPUTER(SUZHOU) CO., LTD. Model No. : MS-16Y1 EUT Rated Voltage : AC V, 50-60Hz EUT Test Voltage : AC 230 V / 50 Hz Trade Name : msi Applicable Standard : EN 55022:2006+A1: 2007, Class B EN 55024: 1998+A1: 2001+A2: 2003 EN : 2006+A2: 2009 EN : 2008 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No. 5-22, Rueishu Keng, Linkou Dist., New Taipei City 24451, Taiwan. R.O.C. TEL: / FAX: Documented By : (Adm.Assistant / Anny Chou) Reviewed By : ( Assistant Engineer / Tim Ho ) Approved By : ( Manager / Vincent Lin ) Page: 2 of 217

3 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN and specified testing scopes: Taiwan R.O.C. : BSMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No. 5-22, Rueishu Keng, Linkou Dist., New Taipei City 24451, Taiwan. R.O.C. TEL : / FAX : service@quietek.com Suzhou (China) Testing Laboratory : No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China. TEL : / FAX : service@quietek.com Page: 3 of 217

4 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 217

5 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Page: 5 of 217

6 11. Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 217

7 1. General Information 1.1. EUT Description Product Name Notebook PC Trade Name msi Model No. MS-16Y1 Component Power Adapter #1 Power Adapter #2 Power Adapter #3 Power Adapter #4 MFR: DELTA, M/N: ADP-65JH CB Input: AC V, 50-60Hz, 2.0A Output: DC 19V, 3.42A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: DELTA, M/N: ADP-65JH BB Input: AC V, 50-60Hz, 1.5A Output: DC 19V, 3.42A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: DELTA, M/N: ADP-90CD DB Input: AC V, 50-60Hz, 1.5A Output: DC 19V, 4.74A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: LITEON, M/N: PA Input: AC V, 50-60Hz, 1.5A Output: DC 19V, 4.74A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Page: 7 of 217

8 Keyparts List Component Vendor Model Name Comments Motherboard CPU (Pin:988) VGA PEGATRON A15HC -- Intel i5-2410m, DC, 35W DC, 2.3GHz,L3:3M, 35W, PGA988, Intel i3-2310m, DC, 35W DC, 2.3GHz,L3:3M, 35W, PGA988, nvidia N12P-GV2+Samsung 1GB VRM 40-nm process,29mmx29mm,c.s GB2-128 FCBGA973,20W VRAM 64x16(512Mb - 4pcs, 1Gbit - 8pcs ) DDR3 Samsung K4W1G1646E-HC11 DDR M*16-1.5V FBGA HD LED (1366x768) 12.7 mm SATA ODD Samsung LTN156AT05-H x209.0x5.5mm INNOLUX BT156GW x210x5.5mm Super Multi PIONEER DVR-TD10RS SLIM SATA DVD SM DL F/W:1.00 Blu-Ray Combo PLDS DS-4E1S SLIM SATA BD COMBO FW:EP81 2.5" SATA HDD 9.5 mm WD WD6400BPVT-xxHXZT1 SATA Scorpio Blue ML320S-AF, 6400GB, 5400 RPM height (4K sector) WD WD7500BPVT-xxHXZTx SATA Scorpio Blue ML320S-AF, 750GB, 5400 RPM WLAN Module Atheros AR5B95(AW-NE785H ) x1 b/g/n, Atheros AR9285L, PCIE interface WLAN+BT Combo Module Keyboard Touchpad Battery Adaptor Atheros AR5B195(Chicony/WB214E) Page: 8 of b/g/n 1x1+BT 3.0 EDR, Atheros AR9285L+AR3011, PCIE for Wifi, USB3.0 for BT Monterey NK81MT T-01/A Montetery-340mm, frame type w/num US Monterey NK81MT D-01/A Montetery-340mm, frame type w/num UK Sent C8048D-7300 TBD PEGATRON A42-A Vdc, 4400mAh or 14.6Vdc,5200mAh PEGATRON A32-A Vdc, 4400mAh 90W DELTA ADP-90CD DB Adapter 90W, 3PIN, Energy Star level 5 LITEON PA Adapter 90W, 3PIN, Energy Star level 5 65W DELTA ADP-65JH CB Adapter 65W, 2PIN, Liteon LOGO DELTA ADP-65JH BB Adapter 65W 3PIN, DELTA LOG 1GB DDR SO-DIMM Elixir M2S1G64CBH4B5P-CG DDRIII1333 SO-D 1GB 204P

9 ASINT SSY3128M8-EDJEF DDRIII 1333 SO-D 1GB 204P 2GB DDR SO-DIMM Elixir M2S2G64CB88B5N-CG DDRIII1333 SO-DIM 2GB 204P HYNIX HMT325S6BFR8C-H9N0 DDRIII1333 SO-D 2G B-DIE 204P Fixed Camera Module 1.3M Foxlink Chicony FE13FF-231H-3 CNF LH 60x8x4.74mm, Sensor: SET SIM120C-10N, IC: RTS5801-GR, LENS: LARGAN 9317D 60x8x5.03(w/tape), Sensor: S5K6AA, IC: AU3831, LENS: NewMax 2P Page: 9 of 217

10 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1 Mode 2 Mode 3 Mode 4 Final Test Mode Mode 1 Mode 2 Emission Mode 3 Mode 4 Mode 1 Mode 2 Immunity Mode 3 Mode 4 Mode 1 LCD+D-SUB (1366*768/60Hz) Mode 2 LCD+HDMI (1366*768/60Hz) CPU Intel/i5-2410M, DC, 35W Intel/i3-2310M, DC, 35W MB PEGATRON /A15HC PEGATRON /A15HC 15.6 HD LED (1366x768) Samsung/LTN156AT05-H02 INNOLUX/BT156GW mm SATA ODD PLDS/DS-4E1S PIONEER/DVR-TD10RS 2.5" SATA HDD WD/WD7500BPVT-xxHXZTx WD/WD6400BPVT-xxHXZT1 WLAN Module N/A Atheros/ AR5B95(AW-NE785H ) WLAN+BT Combo Module Atheros/ AR5B195(Chicony/WB214E) N/A Battery PEGATRON/A42-A15 PEGATRON/A32-A15 Adaptor DELTA/ADP-90CD DB LITEON/PA DDR HYNIX/HMT325S6BFR8C-H9N0 Elixir/M2S2G64CB88B5N-CG Camera Chicony/CNF LH Foxlink/FE13FF-231H-3 Page: 10 of 217

11 Mode 3 LCD+D-SUB (1366*768/60Hz) Mode 4 LCD+D-SUB (1366*768/60Hz) CPU Intel/i3-2310M, DC, 35W Intel/i3-2310M, DC, 35W MB PEGATRON /A15HC PEGATRON /A15HC 15.6 HD LED (1366x768) Samsung/LTN156AT05-H02 INNOLUX/BT156GW mm SATA ODD PLDS/DS-4E1S PIONEER/DVR-TD10RS 2.5" SATA HDD WD/WD7500BPVT-xxHXZTx WD/WD6400BPVT-xxHXZT1 WLAN Module N/A Atheros/ AR5B95(AW-NE785H ) WLAN+BT Combo Module Atheros/ AR5B195(Chicony/WB214E) N/A Battery PEGATRON/A42-A15 PEGATRON/A32-A15 Adaptor DELTA/ADP-65JH BB DELTA/ADP-65JH CB DDR ASINT/SSY3128M8-EDJEF Elixir/M2S1G64CBH4B5P-CG Camera Chicony/CNF LH Foxlink/FE13FF-231H-3 Page: 11 of 217

12 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor (EMI) Dell 3008WFPt CN-0G501H BK-005L Non-Shielded, 1.8m Monitor (EMS) Dell U2410f CN-0J257M JML Shielded, 1.5m 2 USB 3.0 BUFFALO HD-H1.0TU Shielded, 1.5m 3 USB 3.0 BUFFALO HD-H1.0TU N/A 4 Microphone & PCHOME N/A N/A N/A Earphone (EMI) Microphone & Ergotech ET-E201 N/A N/A Earphone (EMS) 5 USB Mouse (EMI) Logitech M-UV83 LNA N/A USB Mouse (EMS) Logitech M-UAL-96 LZ923A40006 N/A 6 DELL HDD(80G) DELL RD1000 BGPWZD1 N/A (EMI) IPod nano (EMS) Apple A1199 YM706LSCVQ5 N/A 7 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 0.8m Page: 12 of 217

13 1.4. Configuration of Tested System EMI Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m with two ferrite cores bonded B HDMI Cable Shielded, 1.0m C USB 3.0 Cable Shielded, 1.0m, two PCS. D Microphone & Earphone Cable Non-Shielded, 1.6m E USB Cable Shielded, 1.5m F LAN Cable Non-Shielded, 3.0m G USB Cable Shielded, 1.2m Page: 13 of 217

14 EMS Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m with two ferrite cores bonded B HDMI Cable Shielded, 1.0m C USB 3.0 Cable Shielded, 1.0m, two PCS. D Microphone & Earphone Cable Non-Shielded, 1.6m E USB Cable Shielded, 1.5m F LAN Cable Non-Shielded, 3.0m G USB Cable Shielded, 1.2m Page: 14 of 217

15 1.5. EUT Exercise Software 1 Setup the EUT and peripheral as shown on Figure 2 Connect the power to EUT and peripherals, then turn on the power of all equipments. 3 Waiting for EUT to enter Vista Operating System, and adjust the display resolution to the test mode first. 4 Connect LAN to Notebook PCPC for transmitting data. Activate Wireless interface and Bluetooth function, and perform the wireless data communication 5 with the other Notebook PC(write/delete action). 6 Run Windows Media Player program and play a disk with color Bar pattern Carry out the function of the EUT cell-phone and platform of simulation base of cell-phone and do 7 the line 8 Run H" pattern. 9 Begin to test and repeat the above procedure (4)~(7) Page: 15 of 217

16 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022: 2006+A1: 2007 Yes No Impedance Stabilization Network EN 55022: 2006+A1: 2007 Yes No Radiated Emission EN 55022: 2006+A1: 2007 Yes No Power Harmonics EN : 2006+A2: 2009 Yes No Voltage Fluctuation and Flicker EN : 2008 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC : 2008 Yes No Radiated susceptibility IEC : 2008 Yes No Electrical fast transient/burst IEC : 2004 Yes No Surge IEC : 2005 Yes No Conducted susceptibility IEC : 2008 Yes No Power frequency magnetic field IEC : 2009 Yes No Voltage dips and interruption IEC : 2004 Yes No Page: 16 of 217

17 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS /10/29 LISN R&S ENV / /08/14 LISN R&S ENV /02/17 Pulse Limiter R&S ESH3-Z /09/10 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/16 EMI Test Receiver R&S ESCS /10/29 LISN R&S ENV /02/17 LISN R&S ENV / /08/14 Pulse Limiter R&S ESH3-Z /09/10 RF Current Probe FCC F-65 10KHz~1GHz /11/13 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/22 Radiated Emission / Site5 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /08/01 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESCS / /10/12 Horn Antenna Schwarzbeck BBHA9120D /08/26 Pre-Amplifier QTK N/A N/A 2010/08/01 Spectrum Analyzer Advantest R /12/16 Radiated Emission / 9x6x6_Chamber Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer (9K-26.5GHz) Agilent E4408B MY /08/12 Horn Antenna Schwarzbeck 9120D /10/21 Pre-Amplifier QuieTek AP-180C CHM/ /08/04 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /08/11 IEC X Analyzer(Flicker) Schaffner CCN X /08/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /08/11 IEC X Analyzer(Flicker) Schaffner CCN X /08/11 Page: 17 of 217

18 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System Noiseken TC-815R ESS /07/06 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /04/15 Biconilog Antenna EMCO N/A Directional Coupler A&R DC N/A Dual Microphone Supply B&K /04/16 Mouth Simulator B&K /04/16 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A N/A Power Meter R&S NRVD(P.M) /04/16 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /04/16 Signal Generator R&S SML /04/16 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /03/10 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /03/10 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2010/04/21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA N/A Triaxial ELF Magnetic Field Meter F.B.BELL /03/27 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /03/10 Page: 18 of 217

19 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A N/A CDN Schaffner TRA U N/A CDN M016S Schaffner CAL U100A N/A CDN M016S Schaffner TRA U N/A CDN T002 Schaffner CAL U N/A CDN T002 Schaffner TRA U N/A CDN T400 Schaffner CAL U N/A CDN T400 Schaffner TRA U N/A Coupling Decoupling Network Schaffner CDN M016S /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 EM-CLAMP Schaffner KEMZ /04/02 Page: 19 of 217

20 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.0 % and 0.1%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 3.57 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 4 %, and 2.5%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%. Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have Page: 20 of 217

21 been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 2.0 db and 2.61 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2.0 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%. Page: 21 of 217

22 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Impedance Stabilization Network Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power frequency magnetic field Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Voltage dips and interruption Humidity (%RH) Barometric pressure (mbar) Page: 22 of 217

23 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard: EN Test Setup 3.3. Limit Limits Frequency (MHz) QP AV Remarks: In the above table, the tighter limit applies at the band edges. Page: 23 of 217

24 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 24 of 217

25 3.6. Test Result Site : SR_1 Time : 2010/12/27-23:01 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Page: 25 of 217

26 Site : SR_1 Time : 2010/12/27-23:02 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 217

27 Site : SR_1 Time : 2010/12/27-23:02 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 217

28 Site : SR_1 Time : 2010/12/27-23:03 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Page: 28 of 217

29 Site : SR_1 Time : 2010/12/27-23:04 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 217

30 Site : SR_1 Time : 2010/12/27-23:04 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 217

31 Site : SR_1 Time : 2010/12/30-09:49 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Page: 31 of 217

32 Site : SR_1 Time : 2010/12/30-09:51 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 217

33 Site : SR_1 Time : 2010/12/30-09:51 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 217

34 Site : SR_1 Time : 2010/12/30-09:52 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Page: 34 of 217

35 Site : SR_1 Time : 2010/12/30-09:54 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 217

36 Site : SR_1 Time : 2010/12/30-09:54 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 217

37 Site : SR_1 Time : 2010/12/29-00:20 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 37 of 217

38 Site : SR_1 Time : 2010/12/29-00:21 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 217

39 Site : SR_1 Time : 2010/12/29-00:21 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 217

40 Site : SR_1 Time : 2010/12/29-00:21 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 40 of 217

41 Site : SR_1 Time : 2010/12/29-00:22 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 217

42 Site : SR_1 Time : 2010/12/29-00:22 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 217

43 Site : SR_1 Time : 2010/12/23-04:44 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Page: 43 of 217

44 Site : SR_1 Time : 2010/12/23-04:45 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 217

45 Site : SR_1 Time : 2010/12/23-04:45 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 217

46 Site : SR_1 Time : 2010/12/23-04:46 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Page: 46 of 217

47 Site : SR_1 Time : 2010/12/23-04:47 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 217

48 Site : SR_1 Time : 2010/12/23-04:47 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook P.C. Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 217

49 3.7. Test Photograph Test Mode : Mode 1 Description : Front View of Conducted Test Test Mode : Mode 1 Description : Back View of Conducted Test Page: 49 of 217

50 Test Mode : Mode 2 Description : Front View of Conducted Test Test Mode : Mode 2 Description : Back View of Conducted Test Page: 50 of 217

51 Test Mode : Mode 3 Description : Front View of Conducted Test Test Mode : Mode 3 Description : Back View of Conducted Test Page: 51 of 217

52 Test Mode : Mode 4 Description : Front View of Conducted Test Test Mode : Mode 4 Description : Back View of Conducted Test Page: 52 of 217

53 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN Test Setup 4.3. Limit Limits Frequency (MHz) QP AV Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 53 of 217

54 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB LCL ISN is used for cat Deviation from Test Standard No deviation. Page: 54 of 217

55 4.6. Test Result Site : SR_1 Time : 2010/12/27-23:08 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10MB Page: 55 of 217

56 Site : SR_1 Time : 2010/12/27-23:10 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 56 of 217

57 Site : SR_1 Time : 2010/12/27-23:10 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 57 of 217

58 Site : SR_1 Time : 2010/12/27-23:05 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100MB Page: 58 of 217

59 Site : SR_1 Time : 2010/12/27-23:08 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 217

60 Site : SR_1 Time : 2010/12/27-23:08 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 60 of 217

61 Site : SR_1 Time : 2010/12/27-23:11 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode1, ISN 1G Page: 61 of 217

62 Site : SR_1 Time : 2010/12/27-23:14 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 1, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 62 of 217

63 Site : SR_1 Time : 2010/12/27-23:14 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 1, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 63 of 217

64 Site : SR_1 Time : 2010/12/28-23:32 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10MB Page: 64 of 217

65 Site : SR_1 Time : 2010/12/28-23:34 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 65 of 217

66 Site : SR_1 Time : 2010/12/28-23:34 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 66 of 217

67 Site : SR_1 Time : 2010/12/28-23:22 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100MB Page: 67 of 217

68 Site : SR_1 Time : 2010/12/28-23:24 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 68 of 217

69 Site : SR_1 Time : 2010/12/28-23:24 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 69 of 217

70 Site : SR_1 Time : 2010/12/28-23:19 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Page: 70 of 217

71 Site : SR_1 Time : 2010/12/28-23:21 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 71 of 217

72 Site : SR_1 Time : 2010/12/28-23:21 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 72 of 217

73 Site : SR_1 Time : 2010/12/29-00:48 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10MB Page: 73 of 217

74 Site : SR_1 Time : 2010/12/29-00:49 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 74 of 217

75 Site : SR_1 Time : 2010/12/29-00:49 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 75 of 217

76 Site : SR_1 Time : 2010/12/29-00:41 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100MB Page: 76 of 217

77 Site : SR_1 Time : 2010/12/29-00:42 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 77 of 217

78 Site : SR_1 Time : 2010/12/29-00:42 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 78 of 217

79 Site : SR_1 Time : 2010/12/29-00:38 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Page: 79 of 217

80 Site : SR_1 Time : 2010/12/29-00:40 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 80 of 217

81 Site : SR_1 Time : 2010/12/29-00:40 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 81 of 217

82 Site : SR_1 Time : 2010/12/23-04:58 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 10MB Page: 82 of 217

83 Site : SR_1 Time : 2010/12/23-04:59 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 83 of 217

84 Site : SR_1 Time : 2010/12/23-04:59 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 10MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 84 of 217

85 Site : SR_1 Time : 2010/12/23-04:55 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 100MB Page: 85 of 217

86 Site : SR_1 Time : 2010/12/23-04:56 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 86 of 217

87 Site : SR_1 Time : 2010/12/23-04:56 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 4, ISN 100MB Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 87 of 217

88 Site : SR_1 Time : 2010/12/23-04:49 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 4, ISN 1G Page: 88 of 217

89 Site : SR_1 Time : 2010/12/23-04:50 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 4, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 89 of 217

90 Site : SR_1 Time : 2010/12/23-04:50 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook P.C. Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 4, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 90 of 217

91 4.7. Test Photograph Test Mode : Mode 1 Description : Front View of ISN Test Test Mode : Mode 1 Description : Back View of ISN Test Page: 91 of 217

92 Test Mode : Mode 2 Description : Front View of ISN Test Test Mode : Mode 2 Description : Back View of ISN Test Page: 92 of 217

93 Test Mode : Mode 3 Description : Front View of ISN Test Test Mode : Mode 3 Description : Back View of ISN Test Page: 93 of 217

94 Test Mode : Mode 4 Description : Front View of ISN Test Test Mode : Mode 4 Description : Back View of ISN Test Page: 94 of 217

95 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN Test Setup Under 1GHz Test Setup: Above 1GHz Test Setup: Page: 95 of 217

96 5.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Limits Frequency Distance Peak Average (GHz) (m) (dbuv/m) (dbuv/m) Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Highest frequency generated or used Upper frequency of measurement in the device or on which the device range (MHz) operates or tunes (MHz) Below Above th harmonic of the highest frequency or 6 GHz, whichever is lower Page: 96 of 217

97 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 3/10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz and above 1GHz using a receiver bandwidth of 1MHz. 30MHz to1ghz Radiated was performed at an antenna to EUT distance of 10 meters. Above1GHz Radiated was performed at an antenna to EUT distance of 3 meters. It is placed with absorb on the ground between EUT and Antenna Deviation from Test Standard No deviation. Page: 97 of 217

98 5.6. Test Result Site : SITE5 Time : 2010/12/22-15:22 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 98 of 217

99 Site : SITE5 Time : 2010/12/22-11:34 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 8 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 99 of 217

100 Site : SITE5 Time : 2010/12/22-14:47 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 7 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 100 of 217

101 Site : SITE5 Time : 2010/12/22-15:12 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 9 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 101 of 217

102 Site : SITE5 Time : 2010/12/22-16:24 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 9 * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 102 of 217

103 Site : SITE5 Time : 2010/12/22-16:43 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 103 of 217

104 Site : SITE5 Time : 2010/12/22-17:11 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 11 * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 104 of 217

105 Site : SITE5 Time : 2010/12/22-17:27 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook P.C. Probe : Site5_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Page: 105 of 217

106 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-20:01 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 106 of 217

107 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-20:01 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 107 of 217

108 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-20:02 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 108 of 217

109 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-20:02 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 109 of 217

110 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-18:37 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 110 of 217

111 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-18:37 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 111 of 217

112 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-18:38 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 112 of 217

113 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-18:38 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 113 of 217

114 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:16 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 114 of 217

115 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:16 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 115 of 217

116 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:17 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 116 of 217

117 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:17 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 117 of 217

118 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:56 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 118 of 217

119 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:56 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 119 of 217

120 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:57 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 120 of 217

121 Site : CB7 (9x6x6_Chamber) Time : 2010/12/21-21:57 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook P.C. Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 121 of 217

122 5.7. Test Photograph Test Mode : Mode 1 Description : Front View of Radiated Test Test Mode : Mode 1 Description : Back View of Radiated Test Page: 122 of 217

123 Test Mode : Mode 1 Description : Front View of High Frequency Radiated Test Test Mode : Mode 2 Description : Front View of Radiated Test Page: 123 of 217

124 Test Mode : Mode 2 Description : Back View of Radiated Test Test Mode : Mode 2 Description : Front View of High Frequency Radiated Test Page: 124 of 217

125 Test Mode : Mode 3 Description : Front View of Radiated Test Test Mode : Mode 3 Description : Back View of Radiated Test Page: 125 of 217

126 Test Mode : Mode 3 Description : Front View of High Frequency Radiated Test Test Mode : Mode 4 Description : Front View of Radiated Test Page: 126 of 217

127 Test Mode : Mode 4 Description : Back View of Radiated Test Test Mode : Mode 4 Description : Front View of High Frequency Radiated Test Page: 127 of 217

128 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 128 of 217

129 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 129 of 217

130 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 130 of 217

131 6.6. Test Result Product Notebook PC Test Item Power Harmonics Test Mode Mode 1 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 56.54% of the limit. Page: 131 of 217

132 Test Result: Pass Source qualification: Normal THC(A): 0.16 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 82.7 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 132 of 217

133 Product Notebook PC Test Item Power Harmonics Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 45.95% of the limit. Page: 133 of 217

134 Test Result: Pass Source qualification: Normal THC(A): 0.15 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 91.1 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 134 of 217

135 Product Notebook PC Test Item Power Harmonics Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 0.00% of the limit. Page: 135 of 217

136 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 41.7 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 136 of 217

137 Product Notebook PC Test Item Power Harmonics Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #3 with 0.00% of the limit. Page: 137 of 217

138 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 57.4 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 138 of 217

139 6.7. Test Photograph Test Mode : Mode 1 Description : Power Harmonics Test Setup Test Mode : Mode 2 Description : Power Harmonics Test Setup Page: 139 of 217

140 Test Mode : Mode 3 Description : Power Harmonics Test Setup Test Mode : Mode 4 Description : Power Harmonics Test Setup Page: 140 of 217

141 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 141 of 217

142 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 142 of 217

143 7.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Voltage Fluctuation and Flicker Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :59:47 Plt and limit line 0.50 Plt :59:47 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 143 of 217

144 Product Notebook PC Test Item Voltage Fluctuation and Flicker Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :21:03 Plt and limit line 0.50 Plt :21:03 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 144 of 217

145 Product Notebook PC Test Item Voltage Fluctuation and Flicker Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :00:20 Plt and limit line 0.50 Plt :00:20 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 145 of 217

146 Product Notebook PC Test Item Voltage Fluctuation and Flicker Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :37:02 Plt and limit line 0.50 Plt :37:02 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 146 of 217

147 7.7. Test Photograph Test Mode : Mode 1 Description : Flicker Test Setup Test Mode : Mode 2 Description : Flicker Test Setup Page: 147 of 217

148 Test Mode : Mode 3 Description : Flicker Test Setup Test Mode : Mode 4 Description : Flicker Test Setup Page: 148 of 217

149 8. Electrostatic Discharge 8.1. Test Specification According to Standard: IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 149 of 217

150 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 150 of 217

151 8.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Electrostatic Discharge Date of Test 2011/01/05 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B B B Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 151 of 217

152 Product Notebook PC Test Item Electrostatic Discharge Test Mode Mode 2 Date of Test 2011/01/05 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B B B Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 152 of 217

153 Product Notebook PC Test Item Electrostatic Discharge Test Mode Mode 3 Date of Test 2011/01/05 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B B B Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 153 of 217

154 Product Notebook PC Test Item Electrostatic Discharge Test Mode Mode 4 Date of Test 2011/01/05 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B B B Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 154 of 217

155 8.7. Test Photograph Test Mode : Mode 1 Description : ESD Test Setup Test Mode : Mode 2 Description : ESD Test Setup Page: 155 of 217

156 Test Mode : Mode 3 Description : ESD Test Setup Test Mode : Mode 4 Description : ESD Test Setup Page: 156 of 217

157 9. Radiated Susceptibility 9.1. Test Specification According to Standard: IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 157 of 217

158 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD Notebook PCis used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 158 of 217

159 9.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Radiated susceptibility Date of Test 2011/01/05 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 159 of 217

160 Product Notebook PC Test Item Radiated susceptibility Test Mode Mode 2 Date of Test 2011/01/05 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 160 of 217

161 Product Notebook PC Test Item Radiated susceptibility Test Mode Mode 3 Date of Test 2011/01/05 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 161 of 217

162 Product Notebook PC Test Item Radiated susceptibility Test Mode Mode 4 Date of Test 2011/01/05 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 162 of 217

163 9.7. Test Photograph Test Mode : Mode 1 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2 Description : Radiated Susceptibility Test Setup Page: 163 of 217

164 Test Mode : Mode 3 Description : Radiated Susceptibility Test Setup Test Mode : Mode 4 Description : Radiated Susceptibility Test Setup Page: 164 of 217

165 10. Electrical Fast Transient/Burst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 165 of 217

166 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 166 of 217

167 10.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Electrical fast transient/burst Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 167 of 217

168 Product Notebook PC Test Item Electrical fast transient/burst Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 168 of 217

169 Product Notebook PC Test Item Electrical fast transient/burst Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 169 of 217

170 Product Notebook PC Test Item Electrical fast transient/burst Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 170 of 217

171 10.7. Test Photograph Test Mode : Mode 1 Description : EFT/B Test Setup Test Mode : Mode 1 Description : EFT/B Test Setup - Clamp Page: 171 of 217

172 Test Mode : Mode 2 Description : EFT/B Test Setup Test Mode : Mode 2 Description : EFT/B Test Setup - Clamp Page: 172 of 217

173 Test Mode : Mode 3 Description : EFT/B Test Setup Test Mode : Mode 3 Description : EFT/B Test Setup - Clamp Page: 173 of 217

174 Test Mode : Mode 4 Description : EFT/B Test Setup Test Mode : Mode 4 Description : EFT/B Test Setup - Clamp Page: 174 of 217

175 11. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) 1 1.2/50 (8/20) /50 (8/20) 1 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 175 of 217

176 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 176 of 217

177 11.6. Test Result Product Notebook PC Test Item Surge Test Mode Mode 1 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 177 of 217

178 Product Notebook PC Test Item Surge Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 178 of 217

179 Product Notebook PC Test Item Surge Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 179 of 217

180 Product Notebook PC Test Item Surge Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 180 of 217

181 11.7. Test Photograph Test Mode : Mode 1 Description : SURGE Test Setup Test Mode : Mode 2 Description : SURGE Test Setup Page: 181 of 217

182 Test Mode : Mode 3 Description : SURGE Test Setup Test Mode : Mode 4 Description : SURGE Test Setup Page: 182 of 217

183 12. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 183 of 217

184 12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 184 of 217

185 12.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Conducted susceptibility Date of Test 2010/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 185 of 217

186 Product Notebook PC Test Item Conducted susceptibility Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 186 of 217

187 Product Notebook PC Test Item Conducted susceptibility Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 187 of 217

188 Product Notebook PC Test Item Conducted susceptibility Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 188 of 217

189 12.7. Test Photograph Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup - CDN Page: 189 of 217

190 Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup - CDN Page: 190 of 217

191 Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup - CDN Page: 191 of 217

192 Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup - CDN Page: 192 of 217

193 13. Power Frequency Magnetic Field Test Specification According to Standard: IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 193 of 217

194 13.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Power frequency magnetic field Date of Test 2010/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 194 of 217

195 Product Notebook PC Test Item Power frequency magnetic field Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 195 of 217

196 Product Notebook PC Test Item Power frequency magnetic field Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 196 of 217

197 Product Notebook PC Test Item Power frequency magnetic field Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 197 of 217

198 13.7. Test Photograph Test Mode : Mode 1 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2 Description : Power Frequency Magnetic Field Test Setup Page: 198 of 217

199 Test Mode : Mode 3 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 4 Description : Power Frequency Magnetic Field Test Setup Page: 199 of 217

200 14. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Units Test Specification Performance Criteria Voltage Dips % Reduction Period C % Reduction Period > B Voltage Interruptions % Reduction Period > C Page: 200 of 217

201 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 201 of 217

202 14.6. Test Result Product Notebook PC Test Item Test Mode Mode 1 Voltage dips and interruption Date of Test 2010/12/31 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 202 of 217

203 Product Notebook PC Test Item Voltage dips and interruption Test Mode Mode 2 Date of Test 2010/12/31 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 203 of 217

204 Product Notebook PC Test Item Voltage dips and interruption Test Mode Mode 3 Date of Test 2010/12/31 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 204 of 217

205 Product Notebook PC Test Item Voltage dips and interruption Test Mode Mode 4 Date of Test 2010/12/31 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 205 of 217

206 14.7. Test Photograph Test Mode : Mode 1 Description : Voltage Dips Test Setup Test Mode : Mode 2 Description : Voltage Dips Test Setup Page: 206 of 217

207 Test Mode : Mode 3 Description : Voltage Dips Test Setup Test Mode : Mode 4 Description : Voltage Dips Test Setup Page: 207 of 217

208 15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 208 of 217

209 (3) EUT Photo (4) EUT Photo Page: 209 of 217

210 (5) EUT Photo (6) EUT Photo Page: 210 of 217

211 (7) EUT Photo (8) EUT Photo Page: 211 of 217

212 (9) EUT Photo (10) EUT Photo Page: 212 of 217

213 (11) EUT Photo (12) EUT Photo Page: 213 of 217

214 (13) EUT Photo (14) EUT Photo Page: 214 of 217

215 (15) EUT Photo (16) EUT Photo Page: 215 of 217

216 (17) EUT Photo (18) EUT Photo Page: 216 of 217

217 (19) EUT Photo (20) EUT Photo Page: 217 of 217

218 (21) EUT Photo (22) EUT Photo Page: 218 of 217