CERTIFICATE. Issued Date: May. 26, 2009 Report No. : R-ITCEP07V06

Transcription

1 CERTIFICATE Issued Date: May. 26, 2009 Report No. : R-ITCEP07V06 This is to certify that the following designated product Product : Notebook Trade name : MSI Model Number : MS-1462, X400 Company Name : MICRO-STAR INT L Co., LTD. This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003 EN :2006 IEC Edition 1.2: EN :1995+A1:2001+A2: 2005 IEC Edition 3.0: 2006 IEC : 2004 IEC Edition 2.0: 2005 IEC Edition 2.2: 2006 IEC Edition 1.1: IEC Second Edition: TEST LABORATORY Vincent Lin / Manager No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL: FAX: service@quietek.com

2 Test Report Product Name : Notebook Model No. : MS-1462, X400 Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2009/05/15 Issued Date : 2009/05/26 Report No. : R-ITCEP07V06 Report Version : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

3 Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : Notebook : MS-1462, X400 : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:2006, Class B : Product family standard EN :2006, Class D : Limits for harmonic current emission EN :1995+A1:2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

4 QTK No.: R-ITCEP07V06 Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : Notebook : MS-1462, X400 : MSI : MICRO-STAR INT'L Co., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:2006, Class B : Product family standard EN :2006, Class D : Limits for harmonic current emission EN :1995+A1:2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY Vincent Lin / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

5 Test Report Certification Issued Date : 2009/05/26 Report No. : R-ITCEP07V06 Product Name : Notebook Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Manufacturer : MICRO-STAR INT L Co., LTD. Model No. : MS-1462, X400 Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC V, 50-60Hz Trade Name : MSI Applicable Standard : EN 55022: 2006 Class B EN 55024: 1998+A1: 2001+A2: 2003 EN :2006 EN :1995+A1:2001+A2: 2005 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : ( Adm. Specialist / Jinn Chen ) Reviewed By : ( Engineer / Kevin Ker ) Approved By : ( Manager / Vincent Lin ) Page: 2 of 185

6 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN and specified testing scopes: Taiwan R.O.C. : BSMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Suzhou (China) Testing Laboratory : No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China. TEL : / FAX : service@quietek.com Page: 3 of 185

7 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 185

8 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 185

9 10.7. Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 185

10 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Notebook MSI MS-1462, X400 Component Power Adapter (1) Power Adapter (2) Power Adapter (3) Power Adapter (4) MFR: LI SHIN, M/N: 0225A2040 Input: AC V, 50-60Hz 1.7A Output: DC 20V, 2.0A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: DELTA, M/N: ADP-40MH BD Input: AC V, 50-60Hz 1.7A Output: DC 20V, 2.0A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: LITE-ON, M/N: PA Input: AC V, 50-60Hz 1.2A Output: DC 19V, 2.1A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: DELTA, M/N: ADP-40PH AB Input: AC V, 50-60Hz 1.2A Output: DC 19V, 2.1A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Page: 7 of 185

11 Keyparts List Item Vendor Model No. INTEL AV80585VG0091M,1.2GHz CPU INTEL SU2700,1.3GHz INTEL SU3500,1.4GHz AU 14.0'', B140XW01 V0 LCD CMO 14.0'', N140B6-L02 SAMSUNG 14.0'', LTN140AT01-G01 Fujitsu 160G(new series) MHZ2160BH Fujitsu 250G(new series) MJA2250BH Fujitsu 250G MHZ2250BH Fujitsu 320G MHZ2320BH Fujitsu 320G(new series) MJA2320BH Fujitsu 500G(new series) MJA2500BH Toshiba 160G(new series) MK1655GSX Toshiba 250G(new series) MK2555GSX Toshiba 250G(new series) MK2555GSX-AZK HDD Toshiba 250G MK2552GSX Toshiba 320G(new series) MK3255GSX Toshiba 320G(new series) MK3255GSX-AZK Toshiba 320G MK3252GSX Toshiba 500G(new series) MK5055GSX Hitachi 160G HTS545016B9A300 Hitachi 250G HTS545025B9A300 Hitachi 320G HTS545032B9A300 WD 250G 5400rpm WD2500BEVT WD 320G 5400rpm WD3200BEVT Transcend DDRII 800 2GB TS256MSQ64V8U Samsung DDRII 800 2GB M470T5663QZ3-CF7 Samsung DDRII 800 2GB M470T5663EH3-CF7 Memory DDRII 800 2GB UNIFOSA DDRII 800 2GB GU332G0ALEPR8H2F UNIFOSA DDRII 800 2GB GU332G0ALEPR8H2F6F1 HYNIX DDRII 800 2GB (tiva die) HYMP125S64CP8-S6 HYNIX DDRII 800 2GB (orion die) HMP125S6EFR8C-S6 INTEL 512AN_HMW Wireless LAN Realtek RT8192E(MS-6896) Ralink RT3090(MS-6891 ) BT MSI BT 2.1(CSR BC4 A07) MS-6837D LI SHIN 3 pin 0225A2040 Adaptor DELTA 3 pin ADP-40MH BD LITE-ON 2 pin PA DELTA 2 pin ADP-40PH AB Battery MITAC 4 cells,2150mah,white W/ texturebty-s31 MITAC 4 cells,2150mah,black W/ texture BTY-S31 Webcam BISON BN82M6S8-000 Azurewave AM-1S004 Page: 8 of 185

12 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Mode 7 Mode 8 Mode 9 Mode 10 Mode 11 Mode 12 Mode 13 Mode 14 Mode 15 Mode 16 Mode 17 Mode 18 Mode 19 Final Test Mode Emission Mode 1 Mode 2 Mode 3 Mode 4 MODE1 LCD+D-SUB (1366*768/60Hz) MODE2 LCD+HDMI (1366*768/60Hz) CPU INTEL AV80585VG0091M,1.2GHz INTEL SU2700,1.3GHz LCD SAMSUNG 14.0'', LTN140AT01-G01 CMO 14.0'', N140B6-L02 HDD Toshiba MK3255GSX 320G Toshiba MK5055GSX 500G DDR UNIFOSA GU332G0ALEPR8H2F 2G Samsung M470T5663QZ3-CF7 2G WLAN INTEL 512AN_HMWG Realtek RT8192E(MS-6896) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LI SHIN 0225A2040 DELTA ADP-40MH BD Page: 9 of 185

13 MODE3 LCD+D-SUB (1366*768/60Hz) MODE4 LCD+HDMI (1366*768/60Hz) CPU INTEL SU3500,1.4GHz INTEL SU2700,1.3GHz LCD AU 14.0'', B140XW01 V0 SAMSUNG 14.0'', LTN140AT01-G01 HDD Fujitsu MHZ2160BH 160G Fujitsu MJA2250BH 250G DDR Transcend TS256MSQ64V8U 2G Samsung M470T5663EH3-CF7 2G WLAN Ralink RT3090(MS-6891 ) INTEL 512AN_HMWG BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LITE-ON PA DELTA ADP-40PH AB MODE5 LCD+D-SUB (1366*768/60Hz) MODE6 LCD+HDMI (1366*768/60Hz) CPU INTEL AV80585VG0091M,1.2GHz INTEL SU2700,1.3GHz LCD CMO 14.0'', N140B6-L02 AU 14.0'', B140XW01 V0 HDD Fujitsu MHZ2250BH 250G Fujitsu MHZ2320BH 320G DDR UNIFOSA GU332G0ALEPR8H2F6F1 2G HYNIX HYMP125S64CP8-S6 2G WLAN Realtek RT8192E(MS-6896) Ralink RT3090(MS-6891 ) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LI SHIN 0225A2040 DELTA ADP-40MH BD MODE7 LCD+D-SUB (1366*768/60Hz) MODE8 LCD+HDMI (1366*768/60Hz) CPU INTEL SU3500,1.4GHz INTEL AV80585VG0091M,1.2GHz LCD SAMSUNG 14.0'', LTN140AT01-G01 AU 14.0'', B140XW01 V0 HDD Fujitsu MJA2320BH 320G Fujitsu MJA2500BH 500G DDR HYNIX HYMP125S64CP8-S6 2G HYNIX HMP125S6EFR8C-S6 2G WLAN INTEL 512AN_HMW Realtek RT8192E(MS-6896) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LITE-ON PA DELTA ADP-40PH AB Page: 10 of 185

14 MODE9 LCD+D-SUB (1366*768/60Hz) MODE10 LCD+HDMI (1366*768/60Hz) CPU INTEL AV80585VG0091M,1.2GHz INTEL SU2700,1.3GHz LCD CMO 14.0'', N140B6-L02 AU 14.0'', B140XW01 V0 HDD Toshiba MK1655GSX 160G Toshiba MK2555GSX 250G DDR Transcend TS256MSQ64V8U 2G Samsung M470T5663QZ3-CF7 2G WLAN Realtek RT8192E(MS-6896) Ralink RT3090(MS-6891 ) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LI SHIN 0225A2040 DELTA ADP-40MH BD MODE11 LCD+D-SUB (1366*768/60Hz) MODE12 LCD+HDMI (1366*768/60Hz) CPU INTEL SU3500,1.4GHz INTEL AV80585VG0091M,1.2GHz LCD SAMSUNG 14.0'', LTN140AT01-G01 AU 14.0'', B140XW01 V0 HDD Toshiba MK2555GSX-AZK 250G Toshiba MK2552GSX 250G DDR Samsung M470T5663EH3-CF7 2G UNIFOSA GU332G0ALEPR8H2F 2G WLAN INTEL 512AN_HMW Realtek RT8192E(MS-6896) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LITE-ON PA DELTA ADP-40PH AB MODE13 LCD+D-SUB (1366*768/60Hz) MODE14 LCD+HDMI (1366*768/60Hz) CPU INTEL AV80585VG0091M,1.2GHz INTEL SU2700,1.3GHz LCD CMO 14.0'', N140B6-L02 AU 14.0'', B140XW01 V0 HDD Toshiba MK3255GSX-AZK 320G Toshiba MK3252GSX 320G DDR UNIFOSA GU332G0ALEPR8H2F6F1 2G HYNIX HYMP125S64CP8-S6 2G WLAN Realtek RT8192E(MS-6896) Ralink RT3090(MS-6891 ) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LI SHIN 0225A2040 DELTA ADP-40MH BD Page: 11 of 185

15 MODE15 LCD+D-SUB (1366*768/60Hz) MODE16 LCD+HDMI (1366*768/60Hz) CPU INTEL SU3500,1.4GHz INTEL AV80585VG0091M,1.2GHz LCD SAMSUNG 14.0'', LTN140AT01-G01 AU 14.0'', B140XW01 V0 HDD Hitachi HTS545016B9A G Hitachi HTS545025B9A G DDR HYNIX HMP125S6EFR8C-S6 2G Transcend TS256MSQ64V8U 2G WLAN INTEL 512AN_HMW Realtek RT8192E(MS-6896) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LITE-ON PA DELTA ADP-40PH AB MODE17 LCD+D-SUB (1366*768/60Hz) MODE18 LCD+HDMI (1366*768/60Hz) CPU INTEL SU3500,1.4GHz INTEL SU2700,1.3GHz LCD SAMSUNG 14.0'', LTN140AT01-G01 AU 14.0'', B140XW01 V0 HDD Hitachi HTS545032B9A G WD WD2500BEVT 250G DDR HYNIX HMP125S6EFR8C-S6 2G Transcend TS256MSQ64V8U 2G WLAN INTEL 512AN_HMW Realtek RT8192E(MS-6896) BT MSI MS-6837D MSI MS-6837D Webcam BISON BN82M6S8-000 Azurewave AM-1S004 BATTERY MITAC BTY-S31 MITAC BTY-S31 ADAPTER LI SHIN 0225A2040 DELTA ADP-40MH BD MODE19 LCD+D-SUB (1366*768/60Hz) CPU INTEL AV80585VG0091M,1.2GHz LCD CMO 14.0'', N140B6-L02 HDD WD WD3200BEVT 320G DDR HYNIX HMP125S6EFR8C-S6 2G WLAN INTEL 512AN_HMW BT MSI MS-6837D Webcam BISON BN82M6S8-000 BATTERY MITAC ADAPTER LITE-ON BTY-S31 PA Page: 12 of 185

16 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor Dell 2408WFPb CN-0NN Non-Shielded, 1.8m 2S-0YCS 2 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m 3 Microphone & PCHOME N/A N/A Earphone N/A 4 USB Mouse Logitech M-BE58 HCA N/A 5 IPod nano Apple A1236 7K823DY0Y0P N/A Page: 13 of 185

17 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded. B HDMI Cable Shielded, 1.0m C LAN Cable Non-Shielded, 3.0m D Earphone & Microphone Cable Non-Shielded, 1.6m E USB Cable Shielded, 1.0m F USB Cable Shielded, 1.6m Page: 14 of 185

18 1.5. EUT Exercise Software 1 Setup the EUT and peripheral as shown on Figure 2 Connect the power to EUT and peripherals, then turn on the power of all equipments. 3 Waiting for EUT to enter Window Windows Vista Operating System, and adjust the display resolution to the test mode first. 4 Connect LAN and Telecom to Notebook PC for transmitting data. 5 Activate Wireless interface and Bluetooth function, and perform the wireless data communication with the other Notebook (write/delete action). 6 Run Windows Media Player program and play a disk with color Bar pattern 7 Run H" pattern. 8 Begin to test and repeat the above procedure (4)~(7) Page: 15 of 185

19 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:2006 Class B Yes No Impedance Stabilization EN 55022:2006 Class B Yes No Network Radiated Emission EN 55022:2006 Class B Yes No Power Harmonics EN :2006 Yes No Voltage Fluctuation and Flicker EN :1995+A1:2001+A2: 2005 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC Edition 1.2: Yes No Radiated susceptibility IEC Edition 3.0: 2006 Yes No Electrical fast transient/burst IEC :2004 Yes No Surge IEC Edition 2.0: 2005 Yes No Conducted susceptibility IEC Edition 2.2: 2006 Yes No Power frequency magnetic field IEC Edition 1.1: Yes No Voltage dips and interruption IEC nd Edition: Yes No Page: 16 of 185

20 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS /10/20 LISN R&S ENV / /08/14 LISN R&S ENV /02/17 Pulse Limiter R&S ESH3-Z /09/09 Coaxial Cable Huber+Suhner RG 400 LC001-RG /11/12 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/14 EMI Test Receiver R&S ESCS /10/20 LISN R&S ENV /02/17 LISN R&S ENV / /08/14 lmpedance Stabilization Network Schaffner ISN T /09/19 Pulse Limiter R&S ESH3-Z /09/09 RF Current Probe FCC F-65 10KHz~1GHz /11/14 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 Radiated Emission / Site1 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /09/25 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESCS /02/03 Horn Antenna Schwarzbeck BBHA9120D /08/10 Pre-Amplifier QTK N/A N/A 2009/01/03 Spectrum Analyzer Advantest R /11/10 Coaxial Cable Huber+Suhner RG 214 LC001-RG 2008/11/12 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /06/23 IEC X Analyzer(Flicker) Schaffner CCN X /06/23 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /06/23 IEC X Analyzer(Flicker) Schaffner CCN X /06/23 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG /01/15 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Page: 17 of 185

21 Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /04/23 Bilog Antenna Schaffner Chase CBL6112B /01/03 Broad-Band Antenna Schwarzbeck VULB /08/02 Biconilog Antenna EMCO /05/29 Directional Coupler A&R DC N/A Dual Microphone Supply B&K /08/14 Mouth Simulator B&K /08/14 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A N/A Power Meter R&S NRVD(P.M) /04/05 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /08/14 Signal Generator R&S SMY02(9K-208 0) / /11/21 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2009/04/21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA N/A Triaxial ELF Magnetic Field Meter F.B.BELL /03/27 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Page: 18 of 185

22 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A N/A CDN Schaffner TRA U N/A CDN M016S Schaffner CAL U100A N/A CDN M016S Schaffner TRA U N/A CDN T002 Schaffner CAL U N/A CDN T002 Schaffner TRA U N/A CDN T400 Schaffner CAL U N/A CDN T400 Schaffner TRA U N/A Coupling Decoupling Network Schaffner CDN M016S /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 EM-CLAMP Schaffner KEMZ /04/02 Page: 19 of 185

23 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 Db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 20 of 185

24 Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 21 of 185

25 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Impedance Stabilization Network Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power frequency magnetic Humidity (%RH) field Barometric pressure (mbar) Temperature ( C) Voltage dips and interruption Humidity (%RH) Barometric pressure (mbar) Page: 22 of 185

26 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN Test Setup 3.3. Limit Limits Frequency (MHz) QP AV Remarks: In the above table, the tighter limit applies at the band edges. Page: 23 of 185

27 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 24 of 185

28 3.6. Test Result Site : SR1 Time : 2009/05/19-22:53 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Page: 25 of 185

29 Site : SR1 Time : 2009/05/19-22:54 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 185

30 Site : SR1 Time : 2009/05/19-22:54 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 185

31 Site : SR1 Time : 2009/05/19-22:55 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 1 Page: 28 of 185

32 Site : SR1 Time : 2009/05/19-22:55 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 185

33 Site : SR1 Time : 2009/05/19-22:55 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 185

34 Site : SR1 Time : 2009/05/19-22:56 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Page: 31 of 185

35 Site : SR1 Time : 2009/05/19-22:58 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 185

36 Site : SR1 Time : 2009/05/19-22:58 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 185

37 Site : SR1 Time : 2009/05/19-23:00 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 2 Page: 34 of 185

38 Site : SR1 Time : 2009/05/19-23:00 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 185

39 Site : SR1 Time : 2009/05/19-23:00 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 185

40 Site : SR1 Time : 2009/05/21-23:33 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 37 of 185

41 Site : SR1 Time : 2009/05/21-23:33 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 185

42 Site : SR1 Time : 2009/05/21-23:33 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 185

43 Site : SR1 Time : 2009/05/21-23:34 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 40 of 185

44 Site : SR1 Time : 2009/05/21-23:35 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 185

45 Site : SR1 Time : 2009/05/21-23:35 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 185

46 Site : SR1 Time : 2009/05/22-00:04 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Page: 43 of 185

47 Site : SR1 Time : 2009/05/22-00:05 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 185

48 Site : SR1 Time : 2009/05/22-00:05 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 185

49 Site : SR1 Time : 2009/05/22-00:05 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 4 Page: 46 of 185

50 Site : SR1 Time : 2009/05/22-00:06 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 185

51 Site : SR1 Time : 2009/05/22-00:06 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV-216-N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 185

52 3.7. Test Photograph Test Mode : Mode 1 Description : Front View of Conducted Test Test Mode : Mode 1 Description : Back View of Conducted Test Page: 49 of 185

53 Test Mode : Mode 2 Description : Front View of Conducted Test Test Mode : Mode 2 Description : Back View of Conducted Test Page: 50 of 185

54 Test Mode : Mode 3 Description : Front View of Conducted Test Test Mode : Mode 3 Description : Back View of Conducted Test Page: 51 of 185

55 Test Mode : Mode 4 Description : Front View of Conducted Test Test Mode : Mode 4 Description : Back View of Conducted Test Page: 52 of 185

56 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN Test Setup 4.3. Limit Limits Frequency (MHz) QP AV Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 53 of 185

57 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB LCL ISN is used for cat Deviation from Test Standard No deviation. Page: 54 of 185

58 4.6. Test Result Site : SR1 Time : 2009/05/19-23:38 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 10M Page: 55 of 185

59 Site : SR1 Time : 2009/05/19-23:39 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 56 of 185

60 Site : SR1 Time : 2009/05/19-23:39 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 57 of 185

61 Site : SR1 Time : 2009/05/19-23:40 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 100M Page: 58 of 185

62 Site : SR1 Time : 2009/05/19-23:41 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 185

63 Site : SR1 Time : 2009/05/19-23:41 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 1, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 60 of 185

64 Site : SR1 Time : 2009/05/19-23:33 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 10M Page: 61 of 185

65 Site : SR1 Time : 2009/05/19-23:34 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 62 of 185

66 Site : SR1 Time : 2009/05/19-23:34 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 63 of 185

67 Site : SR1 Time : 2009/05/19-23:35 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 100M Page: 64 of 185

68 Site : SR1 Time : 2009/05/19-23:36 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 65 of 185

69 Site : SR1 Time : 2009/05/19-23:36 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 2, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 66 of 185

70 Site : SR1 Time : 2009/05/21-23:40 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 10M Page: 67 of 185

71 Site : SR1 Time : 2009/05/21-23:40 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 68 of 185

72 Site : SR1 Time : 2009/05/21-23:40 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 69 of 185

73 Site : SR1 Time : 2009/05/21-23:42 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 100M Page: 70 of 185

74 Site : SR1 Time : 2009/05/21-23:42 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 71 of 185

75 Site : SR1 Time : 2009/05/21-23:42 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 3, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 72 of 185

76 Site : SR1 Time : 2009/05/21-23:58 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 10M Page: 73 of 185

77 Site : SR1 Time : 2009/05/21-23:59 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 74 of 185

78 Site : SR1 Time : 2009/05/21-23:59 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 75 of 185

79 Site : SR1 Time : 2009/05/22-00:01 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 100M Page: 76 of 185

80 Site : SR1 Time : 2009/05/22-00:01 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 77 of 185

81 Site : SR1 Time : 2009/05/22-00:01 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN-T4 - Line1 Note : Mode 4, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 78 of 185

82 4.7. Test Photograph Test Mode : Mode 1 Description : Front View of ISN Test Test Mode : Mode 1 Description : Back View of ISN Test Page: 79 of 185

83 Test Mode : Mode 2 Description : Front View of ISN Test Test Mode : Mode 2 Description : Back View of ISN Test Page: 80 of 185

84 Test Mode : Mode 3 Description : Front View of ISN Test Test Mode : Mode 3 Description : Back View of ISN Test Page: 81 of 185

85 Test Mode : Mode 4 Description : Front View of ISN Test Test Mode : Mode 4 Description : Back View of ISN Test Page: 82 of 185

86 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN Test Setup 5.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 83 of 185

87 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 84 of 185

88 5.6. Test Result Site : OATS-1 Time : 2009/05/18 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 7 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 85 of 185

89 Site : OATS-1 Time : 2009/05/18 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 86 of 185

90 Site : OATS-1 Time : 2009/05/18 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 87 of 185

91 Site : OATS-1 Time : 2009/05/18 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 88 of 185

92 Site : OATS-1 Time : 2009/05/22-04:52 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 89 of 185

93 Site : OATS-1 Time : 2009/05/22-04:27 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 90 of 185

94 Site : OATS-1 Time : 2009/05/22-04:09 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 91 of 185

95 Site : OATS-1 Time : 2009/05/22-03:47 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 92 of 185

96 5.7. Test Photograph Test Mode : Mode 1 Description : Front View of Radiated Test Test Mode : Mode 1 Description : Back View of Radiated Test Page: 93 of 185

97 Test Mode : Mode 2 Description : Front View of Radiated Test Test Mode : Mode 2 Description : Back View of Radiated Test Page: 94 of 185

98 Test Mode : Mode 3 Description : Front View of Radiated Test Test Mode : Mode 3 Description : Back View of Radiated Test Page: 95 of 185

99 Test Mode : Mode 4 Description : Front View of Radiated Test Test Mode : Mode 4 Description : Back View of Radiated Test Page: 96 of 185

100 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 97 of 185

101 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 98 of 185

102 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 99 of 185

103 6.6. Test Result Product Notebook Test Item Test Mode Mode 1 Power Harmonics Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: PASS Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: PASS Worst harmonic was #0 with 0.00% of the limit. Page: 100 of 185

104 Test Result: PASS Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 45.4 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 101 of 185

105 Product Notebook Test Item Power Harmonics Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: PASS Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: PASS Worst harmonic was #0 with 0.00% of the limit. Page: 102 of 185

106 Test Result: PASS Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 45.3 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 103 of 185

107 Product Notebook Test Item Power Harmonics Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: PASS Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: PASS Worst harmonic was #0 with 0.00% of the limit. Page: 104 of 185

108 Test Result: PASS Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 43.0 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 105 of 185

109 Product Notebook Test Item Power Harmonics Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: PASS Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: PASS Worst harmonic was #0 with 0.00% of the limit. Page: 106 of 185

110 Test Result: PASS Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 43.1 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 107 of 185

111 6.7. Test Photograph Test Mode : Mode 1 Description : Power Harmonics Test Setup Test Mode : Mode 2 Description : Power Harmonics Test Setup Page: 108 of 185

112 Test Mode : Mode 3 Description : Power Harmonics Test Setup Test Mode : Mode 3 Description : Power Harmonics Test Setup Page: 109 of 185

113 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 110 of 185

114 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 111 of 185

115 7.6. Test Result Product Notebook Test Item Test Mode Mode 1 Voltage Fluctuation and Flicker Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :22:43 Plt and limit line 0.50 Plt :22:43 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 112 of 185

116 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :39:19 Plt and limit line 0.50 Plt :39:19 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 113 of 185

117 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :58:55 Plt and limit line 0.50 Plt :58:55 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 114 of 185

118 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :15:12 Plt and limit line 0.50 Plt :15:12 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 115 of 185

119 7.7. Test Photograph Test Mode : Mode 1 Description : Flicker Test Setup Test Mode : Mode 2 Description : Flicker Test Setup Page: 116 of 185

120 Test Mode : Mode 3 Description : Flicker Test Setup Test Mode : Mode 4 Description : Flicker Test Setup Page: 117 of 185

121 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 118 of 185

122 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 119 of 185

123 8.6. Test Result Product Notebook Test Item Test Mode Mode 1 Electrostatic Discharge Date of Test 2009/05/22 Test Site No.3 Shielded Room Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Amount of Discharge Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 120 of 185

124 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.3 Shielded Room Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Amount of Discharge Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 121 of 185

125 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.3 Shielded Room Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Amount of Discharge Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 122 of 185

126 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.3 Shielded Room Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Amount of Discharge Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 123 of 185

127 8.7. Test Photograph Test Mode : Mode 1 Description : ESD Test Setup Test Mode : Mode 2 Description : ESD Test Setup Page: 124 of 185

128 Test Mode : Mode 3 Description : ESD Test Setup Test Mode : Mode 4 Description : ESD Test Setup Page: 125 of 185

129 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 126 of 185

130 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 127 of 185

131 9.6. Test Result Product Notebook Test Item Test Mode Mode 1 Radiated susceptibility Date of Test 2009/05/22 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 128 of 185

132 Product Notebook Test Item Radiated susceptibility Test Mode Mode 2 Date of Test 2009/05/22 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 129 of 185

133 Product Notebook Test Item Radiated susceptibility Test Mode Mode 3 Date of Test 2009/05/22 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 130 of 185

134 Product Notebook Test Item Radiated susceptibility Test Mode Mode 4 Date of Test 2009/05/22 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 131 of 185

135 9.7. Test Photograph Test Mode : Mode 1 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2 Description : Radiated Susceptibility Test Setup Page: 132 of 185

136 Test Mode : Mode 3 Description : Radiated Susceptibility Test Setup Test Mode : Mode 4 Description : Radiated Susceptibility Test Setup Page: 133 of 185

137 10. Electrical Fast Transient/Burst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 134 of 185

138 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 135 of 185

139 10.6. Test Result Product Notebook Test Item Test Mode Mode 1 Electrical fast transient/burst Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 136 of 185

140 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 137 of 185

141 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 138 of 185

142 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 1kV 60 Direct B A PASS LAN ± 0.5 kv 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 139 of 185

143 10.7. Test Photograph Test Mode : Mode 1 Description : EFT/B Test Setup Test Mode : Mode 1 Description : EFT/B Test Setup-Clamp Page: 140 of 185

144 Test Mode : Mode 2 Description : EFT/B Test Setup Test Mode : Mode 2 Description : EFT/B Test Setup-Clamp Page: 141 of 185

145 Test Mode : Mode 3 Description : EFT/B Test Setup Test Mode : Mode 3 Description : EFT/B Test Setup-Clamp Page: 142 of 185

146 Test Mode : Mode 4 Description : EFT/B Test Setup Test Mode : Mode 4 Description : EFT/B Test Setup-Clamp Page: 143 of 185

147 11. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) 1 1.2/50 (8/20) /50 (8/20) 1 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 144 of 185

148 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 145 of 185

149 11.6. Test Result Product Notebook Test Item Surge Test Mode Mode 1 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 146 of 185

150 Product Notebook Test Item Surge Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 147 of 185

151 Product Notebook Test Item Surge Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 148 of 185

152 Product Notebook Test Item Surge Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 149 of 185

153 11.7. Test Photograph Test Mode : Mode 1 Description : SURGE Test Setup Test Mode : Mode 2 Description : SURGE Test Setup Page: 150 of 185

154 Test Mode : Mode 3 Description : SURGE Test Setup Test Mode : Mode 4 Description : SURGE Test Setup Page: 151 of 185

155 12. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 152 of 185

156 12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 153 of 185

157 12.6. Test Result Product Notebook Test Item Test Mode Mode 1 Conducted susceptibility Date of Test 2009/05/22 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS 0.15~ (3V) CDN GLAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 154 of 185

158 Product Notebook Test Item Conducted susceptibility Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS 0.15~ (3V) CDN GLAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 155 of 185

159 Product Notebook Test Item Conducted susceptibility Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS 0.15~ (3V) CDN GLAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 156 of 185

160 Product Notebook Test Item Conducted susceptibility Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS 0.15~ (3V) CDN GLAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 157 of 185

161 12.7. Test Photograph Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup -CDN Page: 158 of 185

162 Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup -CDN Page: 159 of 185

163 Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup -CDN Page: 160 of 185

164 Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup -CDN Page: 161 of 185

165 13. Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 162 of 185

166 13.6. Test Result Product Notebook Test Item Test Mode Mode 1 Power frequency magnetic field Date of Test 2009/05/22 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 163 of 185

167 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 164 of 185

168 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 165 of 185

169 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 166 of 185

170 13.7. Test Photograph Test Mode : Mode 1 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2 Description : Power Frequency Magnetic Field Test Setup Page: 167 of 185

171 Test Mode : Mode 3 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 4 Description : Power Frequency Magnetic Field Test Setup Page: 168 of 185

172 14. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 169 of 185

173 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 170 of 185

174 14.6. Test Result Product Notebook Test Item Test Mode Mode 1 Voltage dips and interruption Date of Test 2009/05/22 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 171 of 185 kv

175 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 2 Date of Test 2009/05/22 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 172 of 185

176 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 3 Date of Test 2009/05/22 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 173 of 185

177 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 4 Date of Test 2009/05/22 Test Site No.6 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS >95(0V) C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 174 of 185 kv

178 14.7. Test Photograph Test Mode : Mode 1 Description : Voltage Dips Test Setup Test Mode : Mode 2 Description : Voltage Dips Test Setup Page: 175 of 185

179 Test Mode : Mode 3 Description : Voltage Dips Test Setup Test Mode : Mode 4 Description : Voltage Dips Test Setup Page: 176 of 185

180 15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 177 of 185

181 (3) EUT Photo (4) EUT Photo Page: 178 of 185

182 (5) EUT Photo (6) EUT Photo Page: 179 of 185

183 (7) EUT Photo (8) EUT Photo Page: 180 of 185

184 (9) EUT Photo (10) EUT Photo Page: 181 of 185

185 (11) EUT Photo (12) EUT Photo Page: 182 of 185

186 (13) EUT Photo (14) EUT Photo Page: 183 of 185

187 (15) EUT Photo (16) EUT Photo Page: 184 of 185

188 (17) EUT Photo (18) EUT Photo Page: 185 of 185