Test Report. Product Name : MEGA BOOK. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series. Model No. Applicant : MICRO-STAR INTL Co., LTD.

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1 Test Report Product Name : MEGA BOOK Model No. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2005/12/28 Issued Date : 2006/04/03 Report No. : 061L018-IT-CE-P11V04 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

2 Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000 Class B : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

3 QTK No.: 061L018-IT-CE-P11V04 Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : MEGA BOOK : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : MSI : MICRO-STAR INTL Co., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000 Class B : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

4 Test Report Certification Issued Date : 2006/04/03 Report No. : 061L018-IT-CE-P11V04 Product Name Applicant Address Manufacturer Model No. Rated Voltage EUT Voltage Trade Name : MEGA BOOK : MICRO-STAR INTL Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INTL Co., LTD. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : AC 230 V / 50 Hz : AC V, 50-60Hz : MSI Applicable Standard : EN 55022:1998+A1: 2000 EN :2000EN :1995+A1:2001 EN 55024: 1998+A1: 2001+A2: 2003 AS/NZS CISPR 22: 2002 Test Result Performed Location : Complied : Linkou EMC laboratory No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : (Rita Huang ) Reviewed By : ( Tommy Chen ) Approved By : ( Gene Chang ) Page: 2 of 127

5 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com 1313 LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C. TEL : / FAX : service@quietek.com 0914 Page: 3 of 127

6 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Page: 4 of 127

7 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 127

8 10.7. Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 127

9 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Component Power Adapter (1) Power Adapter (2) MEGA BOOK MSI MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series MFR: LITEON, M/N: PA Input: AC V, 50-60Hz 1.6A Output: DC19V-3.42A Cable out: Shielded, 1.8m with one ferrite core bonded. MFR: LI SHIN, M/N:0335A1965 Input: AC V, 50-60Hz 1.7A Output: DC19V-3.42A Cable out: Shielded, 1.8m with one ferrite core bonded. Note: 1. The EUT is including six models for different marketing requirement. Keyparts List Item Vendor Model CPU Intel Yonah 1.66GHz/ FSB 667MHz Battery MSI 925C2110 RAM Transcend 512M*2 HDD Toshiba MK4025GAS DVD-RW H.L GWA-4082N Motherboard MSI MS-1057 Invter SUMIDA IV140801T Panel AU 1312EW02 Adapter LITEON PA Modem Card LI SHIN Qcom 0335A1965 MD560(B)-01 MD560LMI-2 WLAN Intel WM3945ABG Page: 7 of 127

10 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Final Test Mode Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Emission Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Immunity Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor SAMSUNG 1200NF E Non-Shielded, 1.8m 2 Microphone & ROSA RSM-900 N/A N/A Earphone 3 Slim COMBO ASUS SCB-2408D N/A Non-Shielded, 1.8m With Core*1 4 USB 2.0 HDD Topdisk ME Power by PC 5 USB 2.0 HDD Topdisk ME Power by PC 6 USB 2.0 HDD Topdisk ME Power by PC 7 Notebook PC DELL PPT N/A Non-Shielded, 0.8m 8 Exchange Network Sun Moon Star PX Non-Shielded, 1.8m Page: 8 of 127

11 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded B Earphone & Microphone Cable Non-Shielded, 1.6m C 1394 Cable Shielded, 1.6m D USB Cable Shielded, 1.6m E USB Cable Shielded, 1.6m F USB Cable Shielded, 1.6m G LAN Cable Non-Shielded, 7.0m H TELECOM Cable Non-Shielded, 1.5m I TELECOM Cable Non-Shielded, 1.5m Page: 9 of 127

12 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 EUT get into Windows XP operating system. 4 Notebook will read data from USB 2.0 HDD and then writes the data into USB 2.0 HDD, same operation for hard disk. 5 Notebook will read data from CD-ROM or DVD and then writes the data into External USB optical device. 6 Notebook sends H character to LCD display and external monitor at the same time, the screen will display and fill with H pattern. 7 Notebook will communicate with the partner PC through the internal Fax/modem module (Lan Module). 8 The transmitted and received status will be shown on the monitor (TV). 9 Repeat the above procedure (4) to (8). Page: 10 of 127

13 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1: 2000 Class B Yes No AS/NZS CISPR 22: 2002 Radiated Emission EN 55022:1998+A1: 2000 Class B Yes No AS/NZS CISPR 22: 2002 Power Harmonics EN :2000 Yes No Voltage Fluctuation and Flicker EN :1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC Edition 1.2: Yes No Radiated susceptibility IEC :2002+A1:2002 Yes No Electrical fast transient/burst IEC :2004 Yes No Surge IEC Edition 1.1: Yes No Conducted susceptibility IEC Edition 2.1: Yes No Power frequency magnetic field IEC Edition 1.1: Yes No Voltage dips and interruption IEC nd Edition: Yes No Page: 11 of 127

14 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS / /07/21 LISN R&S ENV / /07/27 LISN R&S ESH3-Z / /02/17 Pulse Limiter R&S ESH3-Z /09/07 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /09/15 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESI / /05/25 EMI Test Receiver R&S ESCS / /03/22 Horn Antenna Schwarzbeck BBHA9120D /08/10 Pre-Amplifier QTK N/A N/A 2006/01/03 Pre-Amplifier MITEQ AMF-4D P /01/03 Spectrum Analyzer Advantest R /10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /07/11 IEC X Analyzer(Flicker) Schaffner CCN X /07/11 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG /06/07 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /03/31 Bilog Antenna Schaffner Chase CBL6112B /01/03 Broad-Band Antenna Schwarzbeck VULB /08/01 CMU200 UNIV.RADIOCOMM R&S CMU /03/28 Directional Coupler A&R DC /08/03 Dual Microphone Supply B&K /08/03 Page: 12 of 127

15 Mouth Simulator B&K /08/03 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Meter R&S NRVD(P.M) /01/17 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /08/03 Signal Generator R&S SMY02(9K-208 0) / /10/03 Electrical fast transient/burst / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A /12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW LU 2006/01/03 PQT Generator Schaffner PNW SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN SC 2005/12/28 Surge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A /12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW LU 2006/01/03 PQT Generator Schaffner PNW SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN SC 2005/12/28 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A /04/21 CDN Schaffner TRA U /04/21 CDN M016S Schaffner CAL U100A /04/21 CDN M016S Schaffner TRA U /04/21 CDN T002 Schaffner TRA U /04/21 CDN T002 Schaffner CAL U /04/21 CDN T400 Schaffner CAL U /04/21 CDN T400 Schaffner TRA U /04/21 Coupling Decoupling Network Schaffner CDN M016S /02/23 Coupling Decoupling Network Schaffner CDN T /04/21 Coupling Decoupling Network Schaffner CDN T /04/21 Coupling Decoupling Network Schaffner CDN M016S /04/21 EM-CLAMP Schaffner KEMZ /04/21 N/A N/A N/A N/A N/A Power frequency magnetic field / SR3 Page: 13 of 127

16 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F.B.BELL /05/30 Voltage dips and interruption / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A /12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW LU 2006/01/03 PQT Generator Schaffner PNW SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN SC 2005/12/28 Page: 14 of 127

17 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. Page: 15 of 127

18 The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 127

19 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power frequency Humidity (%RH) magnetic field Barometric pressure (mbar) Temperature ( C) Voltage dips and interruption Humidity (%RH) Barometric pressure (mbar) Page: 17 of 127

20 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN and AS/NZS CISPR 22: Test Setup 3.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 18 of 127

21 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 19 of 127

22 3.6. Test Result Site : SR-1 Time : 2006/02/06-11:47 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Page: 20 of 127

23 Site : SR-1 Time : 2006/02/06-11:49 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 21 of 127

24 Site : SR-1 Time : 2006/02/06-11:49 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 127

25 Site : SR-1 Time : 2006/02/06-11:50 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Page: 23 of 127

26 Site : SR-1 Time : 2006/02/06-11:53 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 127

27 Site : SR-1 Time : 2006/02/06-11:53 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 127

28 Site : SR-1 Time : 2006/02/06-11:12 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Page: 26 of 127

29 Site : SR-1 Time : 2006/02/06-11:14 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 127

30 Site : SR-1 Time : 2006/02/06-11:14 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 127

31 Site : SR-1 Time : 2006/02/06-11:15 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Page: 29 of 127

32 Site : SR-1 Time : 2006/02/06-11:17 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 127

33 Site : SR-1 Time : 2006/02/06-11:17 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 127

34 1. Site : SR-1 Time : 2006/03/23-06:14 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 32 of 127

35 Site : SR-1 Time : 2006/03/23-06:15 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 127

36 Site : SR-1 Time : 2006/03/23-06:15 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 34 of 127

37 Site : SR-1 Time : 2006/03/23-06:16 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 35 of 127

38 Site : SR-1 Time : 2006/03/23-06:18 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 127

39 Site : SR-1 Time : 2006/03/23-06:18 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 37 of 127

40 3.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Front View of Conducted Test Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Back View of Conducted Test Page: 38 of 127

41 Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Front View of Conducted Test Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Back View of Conducted Test Page: 39 of 127

42 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Front View of Conducted Test Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Back View of Conducted Test Page: 40 of 127

43 4. Radiated Emission 4.1. Test Specification According to EMC Standard : EN and AS/NZS CISPR Test Setup 4.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 41 of 127

44 4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 42 of 127

45 4.6. Test Result Site : OATS-3 Time : 2006/01/27-14:29 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 1 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 43 of 127

46 Site : OATS-3 Time : 2006/01/27-14:13 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 1 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 127

47 Site : OATS-3 Time : 2006/01/27-14:00 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 2 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 127

48 Site : OATS-3 Time : 2006/01/27-13:44 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 2 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 127

49 Site : OATS-3 Time : 2006/03/23-14:58 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 127

50 Site : OATS-3 Time : 2006/03/23-14:47 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 127

51 4.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Front View of Radiated Test Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Back View of Radiated Test Page: 49 of 127

52 Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Front View of Radiated Test Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Back View of Radiated Test Page: 50 of 127

53 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Front View of Radiated Test Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Back View of Radiated Test Page: 51 of 127

54 5. Harmonic Current Emission 5.1. Test Specification According to EMC Standard : EN Test Setup 5.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 52 of 127

55 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 53 of 127

56 5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 54 of 127

57 5.6. Test Result Product MEGA BOOK Test Item Test Mode Power Harmonics Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 55 of 127

58 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 46 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 56 of 127

59 Product MEGA BOOK Test Item Power Harmonics Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 57 of 127

60 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 47 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 58 of 127

61 Product MEGA BOOK Test Item Power Harmonics Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/23 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 59 of 127

62 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 59 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 60 of 127

63 5.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Power Harmonics Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Power Harmonics Test Setup Page: 61 of 127

64 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Power Harmonics Test Setup Page: 62 of 127

65 6. Voltage Fluctuation and Flicker 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 63 of 127

66 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 64 of 127

67 6.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage Fluctuation and Flicker Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :08:21 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 65 of 127

68 Product MEGA BOOK Test Item Voltage Fluctuation and Flicker Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :27:49 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 66 of 127

69 Product MEGA BOOK Test Item Voltage Fluctuation and Flicker Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/23 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :05:46 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 67 of 127

70 6.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Flicker Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Flicker Test Setup Page: 68 of 127

71 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Flicker Test Setup Page: 69 of 127

72 7. Electrostatic Discharge 7.1. Test Specification According to Standard : IEC Test Setup 7.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 70 of 127

73 7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 71 of 127

74 7.6. Test Result Product MEGA BOOK Test Item Test Mode Electrostatic Discharge Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/10 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 72 of 127

75 Product MEGA BOOK Test Item Electrostatic Discharge Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/10 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 73 of 127

76 Product MEGA BOOK Test Item Electrostatic Discharge Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 74 of 127

77 7.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : ESD Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : ESD Test Setup Page: 75 of 127

78 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : ESD Test Setup Page: 76 of 127

79 8. Radiated Susceptibility 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 77 of 127

80 8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Deviation from Test Standard No deviation. Page: 78 of 127

81 8.6. Test Result Product MEGA BOOK Test Item Test Mode Radiated susceptibility Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 79 of 127

82 Product MEGA BOOK Test Item Radiated susceptibility Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 80 of 127

83 Product MEGA BOOK Test Item Radiated susceptibility Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 81 of 127

84 8.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Radiated Susceptibility Test Setup Page: 82 of 127

85 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Radiated Susceptibility Test Setup Page: 83 of 127

86 9. Electrical Fast Transient/Burst 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 84 of 127

87 9.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 85 of 127

88 9.6. Test Result Product MEGA BOOK Test Item Test Mode Electrical fast transient/burst Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 86 of 127

89 Product MEGA BOOK Test Item Electrical fast transient/burst Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 87 of 127

90 Product MEGA BOOK Test Item Electrical fast transient/burst Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 88 of 127

91 9.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : EFT/B Test Setup Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : EFT/B Test Setup-Clamp Page: 89 of 127

92 Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : EFT/B Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : EFT/B Test Setup-Clamp Page: 90 of 127

93 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : EFT/B Test Setup Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : EFT/B Test Setup-Clamp Page: 91 of 127

94 10. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± /50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 92 of 127

95 10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 93 of 127

96 10.6. Test Result Product MEGA BOOK Test Item Test Mode Surge Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 94 of 127

97 Product MEGA BOOK Test Item Surge Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 95 of 127

98 Product MEGA BOOK Test Item Surge Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 96 of 127

99 10.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : SURGE Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : SURGE Test Setup Page: 97 of 127

100 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : SURGE Test Setup Page: 98 of 127

101 11. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 99 of 127

102 11.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 100 of 127

103 11.6. Test Result Product MEGA BOOK Test Item Test Mode Conducted susceptibility Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/07 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) Clamp LAN A A PASS 0.15~ (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 101 of 127

104 Product MEGA BOOK Test Item Conducted susceptibility Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/07 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) Clamp LAN A A PASS 0.15~ (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 102 of 127

105 Product MEGA BOOK Test Item Conducted susceptibility Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN GIGA LAN A A PASS 0.15~ (3V) CDN Telecom A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 103 of 127

106 11.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup-(LAN) Page: 104 of 127

107 Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup-(Telecom) Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup Page: 105 of 127

108 Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup (LAN) Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup (Telecom) Page: 106 of 127

109 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (GIGA LAN) Page: 107 of 127

110 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (Telecom) Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (LAN) Page: 108 of 127

111 12. Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 109 of 127

112 12.6. Test Result Product MEGA BOOK Test Item Test Mode Power frequency magnetic field Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 110 of 127

113 Product MEGA BOOK Test Item Power frequency magnetic field Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 111 of 127

114 Product MEGA BOOK Test Item Power frequency magnetic field Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 112 of 127

115 12.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Power Frequency Magnetic Field Test Setup Page: 113 of 127

116 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Power Frequency Magnetic Field Test Setup Page: 114 of 127

117 13. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 115 of 127

118 13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 116 of 127

119 13.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage dips and interruption Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 117 of 127 kv

120 Product MEGA BOOK Test Item Voltage dips and interruption Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 118 of 127

121 Product MEGA BOOK Test Item Voltage dips and interruption Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 119 of 127 kv

122 13.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Voltage Dips Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Voltage Dips Test Setup Page: 120 of 127

123 Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Voltage Dips Test Setup Page: 121 of 127

124 14. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 122 of 127

125 (3) EUT Photo (4) EUT Photo Page: 123 of 127

126 (5) EUT Photo (6) EUT Photo Page: 124 of 127

127 (7) EUT Photo (8) EUT Photo Page: 125 of 127

128 (9) EUT Photo (10) EUT Photo Page: 126 of 127

129 (11) EUT Photo (12) EUT Photo Page: 127 of 127