EMC. Test Report. Product Name : Rugged BOX PC. : I570EAC-XXX Serial. Model No. Applicant : WinMate Communication INC.

Transcription

1 EMC Test Report Product Name : Rugged BOX PC Model No. : I570EAC-XXX Serial Applicant : WinMate Communication INC. Address : 9F, No , Shing-De Rd., San-Chung City, Taipei, Taiwan, R.O.C. Date of Receipt : 2008/07/08 Issued Date : 2008/09/19 Report No. : R-MISC Version : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

2 Test Report Certification Issued Date : 2008/09/19 Report No. : R-MISC Product Name : Rugged BOX PC Applicant : WinMate Communication INC. Address : 9F, No , Shing-De Rd., San-Chung City, Taipei, Taiwan, R.O.C. Manufacturer : WinMate Communication INC. Model No. : I570EAC-XXX Serial Rated Voltage : DC 24V / 4A EUT Voltage : DC 24V / 4A Trade Name : WinMate Applicable Standard : IEC 60945: Chapter 9 and Chapter 10 DNV 2.4 E 10 Test Result : Complied Performed Location : Quietek Corporation (Linkou Taiwan Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : (Adm. Specialist / Joanne Lin) Reviewed By : ( Assistant Engineer / Sampras Yen ) Approved By : ( Manager / Vincent Lin ) DNV Review By : Page: 2 of 72

3 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN and specified testing scopes: Taiwan R.O.C. : BSMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Suzhou (China) Testing Laboratory : No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China. TEL : / FAX : service@quietek.com Page: 3 of 72

4 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Radio Frequency Disturbance Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Radio Frequencies Page: 4 of 72

5 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Slow Transient/Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Supply Shore Term Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Power Supply Failure Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Electrostatic Discharge Page: 5 of 72

6 11.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 72

7 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Rugged BOX PC WinMate I570EAC-XXX Serial Component M/B Winmate / I570 CPU Intel_Celeron_M_1.0 GHz HDD Seagate, ST AM 40GB VGA Card On Board LAN Card On Board Sound Card On Board DDR-RAM T ranscend 1GB Page: 7 of 72

8 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Final Test Mode Emission Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Immunity Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Page: 8 of 72

9 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Non-Shielded, 0.8m, Notebook PC DELL PPT N/A With Core*1 2 Modem ACEEX DM Non-Shielded, 1.8m 3 Modem ACEEX DM Non-Shielded, 1.8m 4 Modem ACEEX DM Non-Shielded, 1.8m 5 Modem ACEEX DM Non-Shielded, 1.8m 6 IPod nano Apple A1199 YM706LSCVQ5 N/A 7 IPod nano Apple A1199 5U7047U8VQ5 N/A 8 IPod nano Apple A1199 7R649LBKVQ5 Non-Shielded, 1.8m 9 IPod nano Apple A1199 YM706KKGVQ5 Non-Shielded, 1.8m 10 Mouse HP M-S69 N/A N/A 11 Keyboard Logitech Y-SAH N/A 12 Microph one & PCHOME N/A N/A N/A Earphone 13 W alkman AIWA HS-TA164 N/A N/A 14 Modem ACEEX DM Non-Shielded, 1.8m 15 Monitor SONY CPD-G Non-Shielded, 1.8m 16 Non-Shielded, 0.8m, Notebook PC DELL PP04X 2D2ZM1S With Core*1 Page: 9 of 72

10 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 7m, two PCS. B RS-232 Cable Shielded, 1.5m, five PCS. C USB Cable Shielded, 1.2m, four PCS. D Mouse Cable Shielded, 1.8m E Microphone & Earphone Cable Non-Shielded, 1.6m F Keyboard Cable Shielded, 1.8m G Audio Cable Non-Shielded, 1.6m H D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded. Page: 10 of 72

11 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 Personal Computer reads data from disk. 4 Personal Computer sends H pattern to printer, the printer will print H pattern on paper. 5 Personal Computer reads and writes data into and from modem. 6 Personal Computer reads and writes data into and from Notebook. 7 Repeat the above procedure (4) to (6). Page: 11 of 72

12 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Conducted Emission IEC 60945: chapter 9.2 DNV , E10-No.20 CISPR 16-1, 16-2 Radiated Emission IEC 60945: chapter 9.3 DNV , E10-No.19 CISPR 16-1, 16-2 Test Performed Yes No Yes No Deviation Immunity Performed Item Normative References Conducted radio frequency IEC 60945: chapter 10.3 disturbance DNV , E10-No.16 Radiated radio frequencies IEC 60945: chapter 10.4 DNV Fast transient/burst IEC 60945: chapter 10.5 DNV , E10-No.17 Slow transient/surge IEC 60945: chapter 10.6 DNV , E10-No.18 Power supply shore term IEC 60945: chapter 10.7 variation DNV , E10-No.4 Power supply failure IEC 60945: chapter 10.8 DNV , E10-No.3 Electrostatic discharge IEC 60945: chapter 10.9 DNV , E10-No.13 Test Performed Yes No Yes No Yes No Yes No Yes No Yes No Yes No Deviation Page: 12 of 72

13 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS /10/18 LISN R&S ENV / /08/12 LISN R&S ENV /02/14 Pulse Limiter R&S ESH3-Z /09/04 EMI Test Receiver R&S ESCS /10/18 LISN R&S ENV / /08/12 DC power supply GW GPR-3030HD N/A N/A DC LISN Schwarzbeck NNBL / /04/14 DC LISN Schwarzbeck NNBL / /04/14 Radiated Emission / Site5 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /09/15 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESCS /08/15 Horn Antenna Schwarzbeck BBHA9120D /08/10 Pre-Amplifier QTK N/A N/A 2008/05/01 Spectrum Analyzer Advantest R /01/03 EMI Test Receiver R&S ESI / /05/25 Pre-Amplifier MITEQ QMF-4D P /0 1/03 Loop Antenna R&S HFH2-Z / /07/25 Loop Antenna Teseq HLA /07/10 DC power supply GW GPR-3030HD N/A N/A Conducted radio frequency disturbance / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2008/04/21 Radiated radio frequencies / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /04/23 Bilog Antenna Schaffner Chase CBL6112B /01/03 Broad-Band Antenna Schwarzbeck VULB /08/02 Biconilog Antenna EMCO /05/29 CMU200 UNIV.RADIOCOMM R&S CMU /04/23 Directional Coupler A&R DC N/A Dual Microphone Supply B&K /08/04 Mouth Simulator B&K /08/04 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A N/A Power Meter R&S NRVD(P.M) /04/22 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /08/04 Signal Generator R&S SMY02(9K-208 0) / /0 9/22 Page: 13 of 72

14 Fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Slow transient/surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /12/01 Power supply short term variation / SR6 Instrument Manufacturer Type No. Serial No Cal. Date DC power supply GW GPR-3030HD N/A N/A Oscilloscope LeCro y L T322 N/A N/A Power supply failure / SR6 Instrument Manufacturer Type No. Serial No Cal. Date DC power supply GW GPR-3030HD N/A N/A Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG /01/17 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW SC 2007/12/28 Damped osc. Wave 100kHz and 1MHz Schaffner PNW SC 2007/12/28 Double AC Source Variator Schaffner NSG 642A /12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW LU 2007/12/28 PQT Generator Schaffner PNW SC 2008/01/02 Pulse COUPLING NETWORK Schaffner CDN SC 2007/12/28 Page: 14 of 72

15 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaf fner CAL U100A /04/21 CDN Schaf fner TRA U /04/21 CDN M016S Schaffner CAL U100A /04/21 CDN M016S Schaffner TRA U /04/21 CDN T002 Schaffner CAL U /04/21 CDN T002 Schaffner TRA U /04/21 CDN T400 Schaffner CAL U /04/21 CDN T400 Schaffner TRA U /04/21 Coupling Decoupling Network Schaffner CDN M016S /02/23 Coupling Decoupling Network Schaffner CDN M016S /04/21 Coupling Decoupling Network Schaffner CDN T /04/21 Coupling Decoupling Network Schaffner CDN T /04/21 EM-CLAMP Schaf fner KEMZ /04/21 Page: 15 of 72

16 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Conducted radio frequency disturbance The immunity test signal from the CS system for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Radiated radio frequencies The immunity test signal from the RS system for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Fast transient/burst The immunity test signal from the EFT/Burst system with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 % and 2.76%. Slow transient/surge The immunity test signal from the Surge system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Power supply short term variation The DC power supply system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Power supply failure The DC power supply system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Electrostatic discharge The immunity test signal from the ESD system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 72

17 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted radio frequency Humidity (%RH) disturbance Barometric pressure (mbar) Temperature ( C) Radiated radio frequencies Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Slow transient/surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power supply shore term variation Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power supply failure Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic discharge Humidity (%RH) Barometric pressure (mbar) Page: 17 of 72

18 3. Conducted Emission 3.1. Test Specification According to EMC Standard : IEC 60945, DNV 2.4, E 10 CISPR 16-1, Test Setup 3.3. Limit Limits Frequency (MHz) QP (mv) QP (dbuv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 18 of 72

19 3.4. Test Procedure The EUT and simulators are connected to the main power through a DC line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /5uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 10kHz to 0.15MHz using a receiver bandwidth of 200Hz, 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 19 of 72

20 3.6. Test Result Site : SR-1 Time : 2008/09/08-11:43 Limit : IEC60945_CLASSB_00M_QP Margin : 0 EUT : Rugged BOX PC Probe : Line1 Power : DC 24V M/N: Mode 1 (+) Page: 20 of 72

21 Site : SR-1 Time : 2008/09/08-11:57 Limit : IEC60945_CLASSB_00M_QP Margin : 0 EUT : Rugged BOX PC Probe : Line1 Power : DC 24V M/N: Mode 1 (+) Frequency (MHz) Correct Factor (db) Reading Level (dbuv) Measure Level (dbuv) Margin (db) Limit (dbuv) Detector Type QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 21 of 72

22 Site : SR-1 Time : 2008/09/08-11:59 Limit : IEC60945_CLASSB_00M_QP Margin : 0 EUT : Rugged BOX PC Probe : Line1 Power : DC 24V M/N: Mode 1 (-) Page: 22 of 72

23 Site : SR-1 Time : 2008/09/08-12:06 Limit : IEC60945_CLASSB_00M_QP Margin : 0 EUT : Rugged BOX PC Probe : Line1 Power : DC 24V M/N: Mode 1 (-) Frequency (MHz) Correct Factor (db) Reading Level (dbuv) Measure Level (dbuv) Margin (db) Limit (dbuv) Detector Type QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 72

24 3.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Front View of Conducted Test Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Back View of Conducted Test Page: 24 of 72

25 4. Radiated Emission 4.1. Test Specification According to EMC Standard : IEC 60945, DNV 2.4, E 10 CISPR 16-1, Test Setup 4.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 25 of 72

26 4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 3 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 0.15MHz to30mhz and 156MHz to 165MHz using a receiver bandwidth of 9kHz and 30MHz to2ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 3 meters Deviation from Test Standard No deviation. Page: 26 of 72

27 4.6. Test Result Site : SITE-5 Time : 2008/09/05-11:25 Limit : IEC_60945_150K-30M_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : HLA6120 Power : DC 24V Note : Mode 1 Page: 27 of 72

28 Site : SITE-5 Time : 2008/09/09-10:12 Limit : IEC_60945_150K-30M_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : HLA6120 Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 72

29 Site : SITE-5 Time : 2008/09/05-09:48 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9x6x6- HORIZONTAL Power : DC 24V Note : Mode 1 Page: 29 of 72

30 Site : SITE-5 Time : 2008/09/05-09:57 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9x6x6- VERTICAL Power : DC 24V Note : Mode 1 Page: 30 of 72

31 Site : SITE-5 Time : 2008/09/09-09:21 Limit : IEC60945_3M_QP Margin : 6 Power : DC 24V Probe : 2007_Site5(2921)_3M - HORIZONTAL EUT : Ruged BOX PC Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor. Page: 31 of 72

32 Site : SITE-5 Time : 2008/09/09-09:45 Limit : IEC60945_3M_QP Margin : 6 Power : DC 24V Probe : 2007_Site5(2921)_3M - VERTICAL EUT : Ruged BOX PC Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor. Page: 32 of 72

33 Site : SITE-5 Time : 2008/09/05-10:55 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - HORIZONTAL Power : DC 24V Note : Mode 1 Page: 33 of 72

34 Site : SITE-5 Time : 2008/09/05-10:50 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - VERTICAL Power : DC 24V Note : Mode 1 Page: 34 of 72

35 Site : SITE-5 Time : 2008/09/09-10:26 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - HORIZONTAL Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) PEAK 2 * PEAK PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 72

36 Site : SITE-5 Time : 2008/09/09-10:32 Limit : IEC_60945_30M-2G_00M_QP Margin : 6 EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - VERTICAL Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) PEAK 2 * PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 72

37 4.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Front View of Radiated Test-LOOP Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Back View of Radiated Test-LOOP Page: 37 of 72

38 Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Front View of Radiated Test Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Back View of Radiated Test Page: 38 of 72

39 Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Front View of High Frequency Radiated Test Page: 39 of 72

40 5. Conducted Radio Frequency Disturbance 5.1. Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup CDN Test Mode EM Clamp Test Mode Page: 40 of 72

41 5.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency MHz Continuous Conducted V (rms, Un-modulated) % AM (400Hz & 1kHz) Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted 5.4. Test Procedure MHz V (rms, Un-modulated) % AM (400Hz) MHz V (rms, Un-modulated) % AM (400Hz) Test Specification , , ,10 80 Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3V Level 2, 10V Level 3 2. Radiated Signal AM 80% Modulated with 400Hz for power supply line AM 80% Modulated with 400Hz & 1kHz for signal line 3. Scanning Frequency 0.15MHz 80MHz 2,3,4,6.2,8.2,12.6,16.5,18.8,22,25MHz for 10V(rms) 4 Dwell Time 2.86 Seconds 5. Frequency step size f 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s or 1% / 3 Seconds Note: Tolerances Amplitude ±10% 5.5. Deviation from Test Standard No deviation. Page: 41 of 72

42 5.6. Test Result Product Rugged BOX PC Test Item Test Mode Conducted susceptibility Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site No.6 Shielded Room Frequency Range (MHz) Voltage Applied dbuv(v) Inject Method Tested Port of EUT Required Criteria Performance Criteria Complied To Result DC Power Line (AM 80% Modulated with 400Hz) 0.15~80 3V CDN DC IN A A PASS 2 10V CDN DC IN A A PASS 3 10V CDN DC IN A A PASS 4 10V CDN DC IN A A PASS V CDN DC IN A A PASS V CDN DC IN A A PASS V CDN DC IN A A PASS V CDN DC IN A A PASS V CDN DC IN A A PASS 22 10V CDN DC IN A A PASS 25 10V CDN DC IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v ) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 42 of 72

43 Product Rugged BOX PC Test Item Conducted susceptibility Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site No.6 Shielded Room Frequency Range (MHz) Voltage Applied dbuv(v) Inject Method Tested Port of EUT Required Criteria Performance Criteria Complied To Result DC Power Line (AM 80% Modulated with 400Hz) 0.15~80 3V CDN LAN IN A A PASS 2 10V CDN LAN IN A A PASS 3 10V CDN LAN IN A A PASS 4 10V CDN LAN IN A A PASS V CDN LAN IN A A PASS V CDN LAN IN A A PASS V CDN LAN IN A A PASS V CDN LAN IN A A PASS V CDN LAN IN A A PASS 22 10V CDN LAN IN A A PASS 25 10V CDN LAN IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v ) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 43 of 72

44 Product Rugged BOX PC Test Item Conducted susceptibility Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site No.6 Shielded Room Frequency Range (MHz) Voltage Applied dbuv(v) Inject Method Tested Port of EUT Signal Line (AM 80% Modulated with 400Hz & 1kHz) 0.15~80 3V Clamp VGA, PS2, USB, COM Port 2 10V Clamp VGA, PS2, USB, COM Port 3 10V Clamp VGA, PS2, USB, COM Port 4 10V Clamp VGA, PS2, USB, COM Port V Clamp VGA, PS2, USB, COM Port V Clamp VGA, PS2, USB, COM Port V Clamp VGA, PS2, USB, COM Port V Clamp VGA, PS2, USB, COM Port V Clamp VGA, PS2, USB, COM Port 22 10V Clamp VGA, PS2, USB, COM Port 25 10V Clamp VGA, PS2, USB, COM Port Note: Required Criteria A A A A A A A A A A A A A A A A Performance Criteria Complied To The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information A A A A A A EUT stopped operation and could / could not be reset by operator at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Result PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS dbuv(v ) at Page: 44 of 72

45 5.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Conducted Susceptibility Test Setup Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Conducted Susceptibility Test Setup-CDN Page: 45 of 72

46 6. Radiated Radio Frequencies 6.1. Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup 6.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (400Hz & 1kHz) A Page: 46 of 72

47 6.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 10 V/m Level 3 2. Radiated Signal AM 80% Modulated with 400Hz &1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 2.86 Seconds 5. Frequency step size f 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s or 1% / 3 Seconds 0.5 oct/min for the frequency range 1GHz to 2GHz Note: Tolerances Electric field strength 0/+6dB 6.5. Deviation from Test Standard No deviation. Page: 47 of 72

48 6.6. Test Result Product Rugged BOX PC Test Item Test Mode Radiated susceptibility Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site Chamber 5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results AM 80% Modulated with 400Hz &1kHz FRONT H 10 A A PASS FRONT V 10 A A PASS BACK H 10 A A PASS BACK V 10 A A PASS RIGHT H 10 A A PASS RIGHT V 10 A A PASS LEFT H 10 A A PASS LEFT V 10 A A PASS UP H 10 A A PASS UP V 10 A A PASS DOWN H 10 A A PASS DOWN V 10 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m at frequency MHz. No false alarms or other malfunctions were observed during or after the test. Page: 48 of 72

49 6.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Radiated Susceptibility Test Setup Page: 49 of 72

50 7. Fast Transient/Burst 7.1. Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup 7.3. Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input AC/DC Power Ports Fast Transients Common Mode Units Note: Tolerances Burst duration and period ±20% Source impedance ±20% Amplitude ±10% kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria +1 5/ /50 5 B B Page: 50 of 72

51 7.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 51 of 72

52 7.6. Test Result Product Rugged BOX PC Test Item Test Mode Electrical fast transient/burst Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result DC Input ± 2kV 60 Direct B B PASS Page: 52 of 72

53 Product Rugged BOX PC Test Item Electrical fast transient/burst Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/17 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result LAN ± 1kV 60 Clamp B A PASS PS/2 Port ± 1Kv 60 Clamp B B PASS USB Port ± 1Kv 60 Clamp B A PASS COM Port ± 1kV 60 Clamp B A PASS D-SUB Port ± 1Kv 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 53 of 72

54 7.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : EFT/B Test Setup Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : EFT/B Test Setup-Clamp Page: 54 of 72

55 8. Slow Transient/Surge 8.1. Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup 8.3. Limit Item Environmental Phenomena Units AC/DC Input and Output Power Ports Surges Tr/Th us Dif ferential mode kv Common mode kv Note: Tolerances Amplitude, open/short circuit ±10% Test Specification Performance Criteria 1.2/50 (8/20) B Page: 55 of 72

56 8.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 56 of 72

57 8.6. Test Result Product Rugged BOX PC Test Item Test Mode Surge Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/18 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result DC Input ± 0 1 kv 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 57 of 72

58 8.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : SURGE Test Setup Page: 58 of 72

59 9. Power Supply Shore Term 9.1. Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup 9.3. Limit Item Environmental Phenomena Input DC Power Ports No. Test Specification Voltage Dips 7 +10%, +30% Voltage deviation (Duration>15min) 8-10%, -25% Voltage cyclic variation ( 3cycles) 9 >±5% Voltage ripple 10 <10% Page: 59 of 72

60 9.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. Voltage deviation (continuous) waveform Voltage cyclic variation 9.5. Deviation from Test Standard No deviation. Page: 60 of 72

61 9.6. Test Result Product Rugged BOX PC Test Item Test Mode Power Supply Shore Term Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/08 Test Site No.6 Shielded Room Voltage Test Specification Test Duration Total Test Result Time DC 24V +10%, +30% 5s 15min PASS DC 24V -10%, -25% 5s 15min PASS DC 24V ±5% 5s 3 Cycle PASS Voltage ripple Voltage Test Specification Test Value Test Result DC 24V <10% (2.4Vp-p) 200mVp-p PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. kv Page: 61 of 72

62 9.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Power Supply Short Term Page: 62 of 72

63 10. Power Supply Failure Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup Limit Item Environmental Phenomena Input DC Power Ports V oltage Dips Units Off On 75s Test Specification 30s Page: 63 of 72

64 10.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane. measured 1m*1m min. - 3 interruptions within a 5-minutes period seconds pause between switching off and switching back on Deviation from Test Standard No deviation. Page: 64 of 72

65 10.6. Test Result Product Rugged BOX PC Test Item Test Mode Power Supply Failure Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/08 Test Site No.6 Shielded Room Voltage Test Specification Test Duration Total DC 24V Power off 30s Power On 75s Time Test Result 3 Cycle 5 m PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. kv Page: 65 of 72

66 10.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : Power Supply Failure Page: 66 of 72

67 11. Electrostatic Discharge Test Specification According to Standard : IEC 60945, DNV 2.4, E Test Setup Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±6 Contact Discharge B Page: 67 of 72

68 11.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distan ce 0.1m from, the EUT, with the Discharge Electrode touching th e coupling plane. The four fa ces of t he EUT will be performed with electro static discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 68 of 72

69 11.6. Test Result Product Rugged BOX PC Test Item Test Mode Electrostatic Discharge Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Date of Test 2008/09/18 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B A A Pass Pass Contact Discharge kV -6kV B B A A Pass Pass Indirect Discharge 50 +6kV B A Pass (HCP) 50-6kV B A Pass Indirect Discharge 50 +6kV B A Pass (VCP Front) 50-6kV B A Pass Indirect Discharge 50 +6kV B A Pass (VCP Left) 50-6kV B A Pass Indirect Discharge 50 +6kV B A Pass (VCP Back) 50-6kV B A Pass Indirect Discharge 50 +6kV B A Pass (VCP Right) 50-6kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 69 of 72

70 11.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz) Description : ESD Test Setup Page: 70 of 72

71 12. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 71 of 72

72 (3) EUT Photo (4) EUT Photo Page: 72 of 72