Test Report. Product Name : MEGA BOOK Model No. : MS-1049, MS-1049B, L710, 7100U Series

Transcription

1 Test Report Product Name : MEGA BOOK Model No. : MS-1049, MS-1049B, L710, 7100U Series Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2005/10/11 Issued Date : 2006/02/06 Report No. : 05AL126E The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Page: 1 of 82

2 Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1049, MS-1049B, L710, 7100U Series : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

3 QTK No.:05AL126E Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : MEGA BOOK : MS-1049, MS-1049B, L710, 7100U Series : MSI : MICRO-STAR INT L Co., LTD This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN :2000 Class D : Limits for harmonic current emission EN :1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

4 Test Report Certification Issued Date : 2006/02/06 Report No. : 05AL126E Product Name Applicant Address Manufacturer Model No. Rated Voltage EUT Voltage Trade Name Applicable Standard Classification Test Result : MEGA BOOK : MICRO-STAR INT L Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INT L Co., LTD. : MS-1049, MS-1049B, L710, 7100U Series : AC 230 V / 50 Hz : AC V, 50/60Hz : MSI, Averatec : EN 55022:1998+A1:2000+A2:2003, EN 55024:1998+A1:2001+A2:2003, EN :2000,EN :1995+A1:2001, AS/NZS CISPR 22:2004 : B : Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Documented By : Tested By : (Gina Chen) Approved By : (Gary Wu ) (Gene Chang) 0914 Page: 2 of 82

5 TABLE OF CONTENTS Description Page 1. General Information EUT Description Test Mode Tested System Details Configuration of tested System EUT Exercise Software Test Facility Conducted Emission Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Impedance Stabilization Network Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Radiated Emission Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Power Harmonics Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Voltage Fluctuation and Flicker...41 Page: 3 of 82

6 6.1. Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Electrostatic Discharge (ESD) Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Radiated Susceptibility (RS) Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Electrical Fast Transient/Burst (EFT/B) Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Surge Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Conducted Susceptibility (CS) Test Equipment List Test Setup...62 Page: 4 of 82

7 11.3. Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Power Frequency Magnetic Field Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo Voltage Dips and Interruption Measurement Test Equipment List Test Setup Limits Test Procedure Uncertainty Test Specification Test Result Test Photo...75 Attachement...76 EUT Photograph...76 Reference : Laboratory of License Page: 5 of 82

8 1. General Information 1.1. EUT Description Product Name Trade Name Model No. MEGA BOOK MSI, Averatec MS-1049, MS-1049B, L710, 7100U Series Keypart List Type Description P/N CPU K8,AMD/TURION 64TMDML40BKX5LD,,2200MHz,OUPGA-754pin CPU K8,AMD/TMSMT28BQX4LD,,T1600MHz,OUPGA-754pin A10-K82G216-A08 A10-K81G616-A08 CPU K8,AMD/SMS2800BQX3LF,1.6GHz,OuPGA-754pin,256KB L2 CACHE,Mobile Sempron 25W A10-K81G636-A08 Series,2800+ CPU LCD HDD ODD CPU K8,AMD/SMS3000BQX2LF,,1.8GHz,OUPGA-754pin,128KBL2CACHE MOBILE SEMPRON 25W SERIES3000+ CPU K8,AMD/SMS3100BQX3LF,,1.8GHz,OUPGA-754pin,256KBL2CACHE MOBILE SEMPRON 25W SERIES3100+ CPU K8,AMD/SMS3300BQX2LF,,2.0GHz,OUPGA-754pin,128KBL2CACHE MOBILE SEMPRON 25W SERIES 3300+,LEAD FREE SYS/MODULE/LCD/SAMSUNG/LTN170WX-L05-G/1440x900DOTS/DISPLAY/WXGA/GLARE TYPE/17.0 inch TFT LCD PANEL/FOR MS-1036/#B SYS/HDD/ATA-100/IDE/2.5 /60GB/4200RPM/FUJITSU/MHT2060AT SYS/HDD/ATA-6/IDE/2.5 inch/80gb/4200rpm/fujitsu/mht2080at/for MS-1036 SYS/HDD/ATA-6/2.5 INCH/60GB/5400RPM/FUJITSU/MHV2060AH/FOR MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/80GB/5400RPM/FUJITSU/MHV2080AH/FOR MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/100GB/5400RPM/FUJITSU/MHV2100AH/FOR MS-1036,RoHS COMPLIANCE SYS/HDD/ATA-6/IDE/2.5 inch/100gb/5400rpm/toshiba/mk1032gax/for MS-1049,RoHS COMPLIANCE SYS/DVDRW/Slim type/8x-dvd±r/8x-dvd+rw/6x-dvd-rw/4x-dvd±r DL/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GWA-4082N/for MS-1046,RoHS COMPLIANCE SYS/CDRW/DVDROM combo/slim type/24x-r/24x-rw/8x-dvdrom/24x-cdrom/hlds/gcc-4244n/for MS-1029,RoHS COMPLIANCE A10-K81G856-A08 A10-K81G846-A08 A10-K83G306-A08 S78-230A020-S02 S F06 S F06 S F06 S F06 S F06 S T14 S7A H44 S H44 Page: 6 of 82

9 Memory Inverter Battery Adaptor M2SAJ08D1AHXAF161GA-T, DDR1 400, 512MB M2S9I08D6APS9F081KA-T, DDR1 400, 256MB M2S5J08D1AHXAF161GA-T, DDR1 333, 512MB M2S5I08D6AHXAF081GA-T, DDR1 333, 256MB SYS,MODULE/INVERTER,SAMPO/DIVNMS0016D11--,NOTEBOOK INVERTER FOR 17 TFT LCD,FOR MS-1035 AND MS-1036 SYS/BATTERY PACK/LITHIUM-ION/SMP/ /PANASONIC/VAVE=3.6V/2200mAh/6CELLS/10.8V/4400 mah/18650 SIZE/Pack: BLACK/MSI LOGO/FOR MS-1016 SYS/battery Pack/lithium-ion/WellTop/GMS-BMS080AAA00/Sony/Vave=3.7V/2400mAh/9cells/10.8V/720 0mAH/18650 size/pack: Black color/for MS-1016 SYS/ Power Supply Adaptor/ 90W/90-264Vin/4.74A/19Vout/ LI SHIN/LSE0202D1990/For MS-1029 S T75 S T75 S T75 S T75 S SG3 S H-SB3 S W38 S L44 K/B SYS/KEYBOARD/103Key/CHICONY/MP-03233US-359/US/Keycap:Black C/For MS-1035 S11-00US140-C54 Touchpad MDC Thermal SYS/MODULE/NoteBook Touchpad module/elantech/ / 73.7mm* 43 mm/for MS-1029 SYS/MODEM/QCOM/MD560LMI-2(A)/MDC(Factor AC97/Azalia V.92 Modem Card)/For MS-1039 CPU new North bridge S E47 S Q09 E L01 E Y WALN B 6855B Note: 1. The EUT includes four models. Regarding to the different construction of the EUT, the model number is shown in the table as following: Model No. Trade Name MS-1049, MS-1049B, L710 MSI 7100U Series Averatec Page: 7 of 82

10 1.2. Test Mode QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode EMC Mode 1: Mode 2: Mode 3: Mode 4: Mode 5: Mode 6: Final Test Mode EMI Mode 1: EMS Mode 1: Type Description P/N Mode1 Mode2 Mode3 Mode4 Mode5 Mode6 CPU LCD HDD CPU K8,AMD/TURION 64TMDML40BKX5LD,,2200MHz,OUPGA-754pin A10-K82G216-A08 CPU K8,AMD/TMSMT28BQX4LD,,T1600MHz,OUPGA-754pin A10-K81G616-A08 V CPU K8,AMD/SMS2800BQX3LF,1.6GHz,OuPGA-754pin,256KB A10-K81G636-A08 L2 CACHE,Mobile Sempron 25W Series,2800+ V CPU K8,AMD/SMS3000BQX2LF,,1.8GHz,OUPGA-754pin,128KBL2C A10-K81G856-A08 V ACHE MOBILE SEMPRON 25W SERIES3000+ CPU K8,AMD/SMS3100BQX3LF,,1.8GHz,OUPGA-754pin,256KBL2C A10-K81G846-A08 V ACHE MOBILE SEMPRON 25W SERIES3100+ CPU K8,AMD/SMS3300BQX2LF,,2.0GHz,OUPGA-754pin,128KBL2C A10-K83G306-A08 V ACHE MOBILE SEMPRON 25W SERIES 3300+,LEAD FREE SYS/MODULE/LCD/SAMSUNG/LTN170WX-L05-G/1440x900D OTS/DISPLAY/WXGA/GLARE TYPE/17.0 inch TFT LCD S78-230A020-S02 V PANEL/FOR MS-1036/#B SYS/HDD/ATA-100/IDE/2.5 /60GB/4200RPM/FUJITSU/MHT2060AT S F06 V V V V V V SYS/HDD/ATA-6/IDE/2.5 inch/80gb/4200rpm/fujitsu/mht2080at/for MS-1036 S F06 V SYS/HDD/ATA-6/2.5 INCH/60GB/5400RPM/FUJITSU/MHV2060AH/FOR S F06 V MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/80GB/5400RPM/FUJITSU/MHV2080AH/FOR S F06 V MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/100GB/5400RPM/FUJITSU/MHV2100AH/FOR MS-1036,RoHS COMPLIANCE S F06 V SYS/HDD/ATA-6/IDE/2.5 inch/100gb/5400rpm/toshiba/mk1032gax/for S T14 V MS-1049,RoHS COMPLIANCE Page: 8 of 82

11 ODD Memory SYS/DVDRW/Slim type/8x-dvd±r/8x-dvd+rw/6x-dvd-rw/4x-dvd±r DL/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/G WA-4082N/for MS-1046,RoHS COMPLIANCE S7A H44 V SYS/CDRW/DVDROM combo/slim type/24x-r/24x-rw/8x-dvdrom/24x-cdrom/hlds/gcc-4 S H44 V V V 244N/For MS-1029,RoHS COMPLIANCE M2SAJ08D1AHXAF161GA-T, DDR1 400, 512MB S T75 V V V M2S9I08D6APS9F081KA-T, DDR1 400, 256MB S T75 V M2S5J08D1AHXAF161GA-T, DDR1 333, 512MB S T75 V V Inverter Battery Adaptor K/B Touchpad MDC Thermal M2S5I08D6AHXAF081GA-T, DDR1 333, 256MB S T75 V V SYS,MODULE/INVERTER,SAMPO/DIVNMS0016D11--,NOTEB OOK INVERTER FOR 17 TFT LCD,FOR MS-1035 AND MS-1036 S SG3 SYS/BATTERY PACK/LITHIUM-ION/SMP/ /PANASONIC/VAVE=3.6V /2200mAh/6CELLS/10.8V/4400mAH/18650 SIZE/Pack: S H-SB3 V V V V V V BLACK/MSI LOGO/FOR MS-1016 SYS/battery Pack/lithium-ion/WellTop/GMS-BMS080AAA00/Sony/Vave=3. S W38 V 7V/2400mAh/9cells/10.8V/7200mAH/18650 size/pack: Black V V color/for MS-1016 SYS/ Power Supply Adaptor/ 90W/90-264Vin/4.74A/19Vout/ S L44 V V V LI SHIN/LSE0202D1990/For MS-1029 SYS/KEYBOARD/103Key/CHICONY/MP-03233US-359/US/Ke ycap:black C/For MS-1035 SYS/MODULE/NoteBook Touchpad module/elantech/ / 73.7mm* 43 mm/for MS-1029 SYS/MODEM/QCOM/MD560LMI-2(A)/MDC(Factor AC97/Azalia V.92 Modem Card)/For MS-1039 S11-00US140-C54 V V V V V V S E47 V V V V V V S Q09 V V V V V V CPU new E L01 V V V V V V North bridge E Y V WALN B V 6855B V V V Page: 9 of 82

12 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 LCD Monitor CMV CT-730D FMC122F56DA1145 Non-Shielded, 1.8m 2 USB Mouse Logitech M-BE58 HCA N/A 3 Walkman AIWA HS-TA164 N/A N/A 4 Microphone & N/A MIC-06 N/A N/A Earphone 5 Slim COMBO ASUS SCB-2408D 42DM Non-shielded, 1.8m,with one ferrite core bonded. 6 USB 2.0 HDD Topdisk ME Power by PC 7 USB 2.0 HDD Topdisk ME Power by PC 8 Notebook PC DELL PPT N/A Non-Shielded, 0.8m 9 Monitor SONY PVM-14M2U Non-Shielded, 1.8m 10 Exchange Network Sun Moon Star PX Non-shielded, 1.8m Page: 10 of 82

13 1.4. Configuration of tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.5m, with two ferrite cores bonded B USB Mouse Cable Shielded, 1.5m C USB Cable Shielded, 1.5m D Audio Cable Shielded, 1.8m E Earphone & Microphone Cable Non-Shielded, 2m F 1394 Cable Shielded, 2m G USB Cable Shielded, 1.5m H S-VIDEO Cable Shielded, 2m I LAN Cable Non-Shielded, 7m J TELECOM Cable Non-Shielded, 7m K TELECOM Cable Non-Shielded, 7m Page: 11 of 82

14 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Notebook sends H pattern to monitor. 5 Notebook sends H pattern to printer, the printer will print H pattern on paper. 6 Notebook reads and writes data into and from modem. 7 Notebook will read data from floppy disk and then writes the data into floppy disk, same operation for hard disk. 8 Repeat the above procedure (4) to (7). Page: 12 of 82

15 1.6. Test Facility Ambient conditions in the laboratory: Items Test Item Required (IEC 68-1) Actual Temperature ( C) EN55022 CE Humidity (%RH) Barometric pressure (mbar) Temperature ( C) EN55022 RE Humidity (%RH) Barometric pressure (mbar) Temperature ( C) IEC Humidity (%RH) Barometric pressure (mbar) Temperature ( C) IEC Humidity (%RH) Barometric pressure (mbar) Temperature ( C) IEC Humidity (%RH) Barometric pressure (mbar) Temperature ( C) IEC Humidity (%RH) Barometric pressure (mbar) Site Description: Accredited by NVLAP NVLAP Lab Code: June 11, 2001 Accredited by DNV Statement No. : LAB April 18, 2001 Accredited by Nemko Certificate No.: ELA 165 May 03,2001 Accredited by TUV Rheinland Certificate No.: Accredited by CNLA Accredited Number: 0914 Site Name: Site Address: Quietek Corporation No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Page: 13 of 82

16 2. Conducted Emission 2.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan., L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May, No.1 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 14 of 82

17 2.3. Limits EN 55022:1998+A1: 2000+A2:2003 AC Mains Limits (dbuv) Frequency Class A Class B MHz QP AV QP AV Remarks: In the above table, the tighter limit applies at the band edges 2.4. Test Procedure AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to EN 55022:1998+A1: 2000+A2:2003 on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz Uncertainty The measurement uncertainty is defined as ± 2.02 db 2.6. Test Specification According to EN 55022:1998+A1:2000+A2:2003 Page: 15 of 82

18 2.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/20 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 1 Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 16 of 82

19 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/20 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 2 Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 17 of 82

20 2.8. Test Photo Test Mode : Mode 1: Description: Front View of Conducted Test - Mode 1 Test Mode : Mode 1: Description: Back View of Conducted Test - Mode 1 Page: 18 of 82

21 3. Impedance Stabilization Network 3.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan., L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripheral 4 Pulse Limiter R & S ESH3-Z2 May, ISN SCHAFFNER T400/19099 Apr., Voltage Probe SCHAFFNER CVP 2200A/18331 Apr., RF Current Probe FCC F-65/199 Apr., No.1 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 19 of 82

22 3.3. Limits Telecommunication ports EN 55022:1998+A1: 2000+A2:2003 Telecommunication ports Limits db(uv) Frequency MHz Limit for conducted emissions from telecommunication ports of equipment intended for use in telecommunication centers only Limit for conducted emissions from telecommunication ports QP AV QP AV Remarks: In the above table, the tighter limit applies at the band edges Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one Uncertainty The measurement uncertainty is defined as ± 1.8 db 3.6. Test Specification According to EN 55022:1998+A1: 2000+A2:2003 Page: 20 of 82

23 3.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 100Mbps Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 21 of 82

24 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 10Mbps Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 82

25 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 1Gbps (Vol) Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 82

26 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 1Gbps (Current) Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 82

27 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv Telecom Quasi-Peak * Average * Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 82

28 3.8. Test Photo Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1 Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1 Page: 26 of 82

29 Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-1G(Vol) Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-1G(Vol) Page: 27 of 82

30 Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-1G(Current) Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-1G(Current) Page: 28 of 82

31 Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-Telecom Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-Telecom Page: 29 of 82

32 4. Radiated Emission 4.1. Test Equipment List The following test equipment are used during the radiated emission test: Test Site Equipment Manufacturer Model No./Serial No. Last Cal. OATS 3 Test Receiver R & S ESCS 30 / Feb.,2005 Spectrum Analyzer Advantest R3162 / Feb.,2005 Pre-Amplifier QTK AP-025C / CHM May,2005 Bilog Antenna SCHAFFNER CBL6112B / 2697 May,2005 Note: 1. All equipments that need to be calibrate are with calibration period of 1 year. 2. Mark X test instruments are used to measure the final test results Test Setup Page: 30 of 82

33 4.3. Limits EN 55022: 1998+A1: 2000+A2:2003 Limits (dbuv/m) Frequency Class A Class B MHz Distance (m) dbuv/m Distance (m) dbuv/m Remarks: In the above table, the tighter limit applies at the band edges Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to EN 55022: 1998+A1: 2000+A2:2003 on radiated measurement. Radiated emissions were investigated over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated measurement was performed at an antenna to EUT distance of 10 meters Uncertainty The measurement uncertainty is defined as ± 3.8 db 4.6. Test Specification According to EN 55022: 1998+A1: 2000+A2:2003 Page: 31 of 82

34 4.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/11 Test Site OATS 3 Test Condition Radiated Emission Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Horizontal * Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 82

35 Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/11 Test Site OATS 3 Test Condition Radiated Emission Test Range MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Vertical * Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 82

36 4.8. Test Photo Test Mode : Mode 1: Description: Front View of Radiated Test- Mode 1 Test Mode : Mode 1: Description: Back View of Radiated Test- Mode 1 Page: 34 of 82

37 5. Power Harmonics 5.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline S/N: HK54148 Feb., Analyzer SCHAFFNER CCN /X71887 Feb., No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 35 of 82

38 5.3. Limits Limits of Class A Harmonics Currents Harmonics Maximum Permissible Order harmonic current A n Odd harmonics Harmonics Order n Maximum Permissible harmonic current A Even harmonics n * 8/n n * 15/n Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table which is the limit of Class A multiplied by a factor of 1.5. Limits of Class C Harmonics Currents Harmonics Order n Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency % λ * n 39 (odd harmonics only) *λ is the circuit power factor 3 Page: 36 of 82

39 Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A 5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Uncertainty The measurement uncertainty is defined as ± 3.23 % 5.6. Test Specification According to EN :2000 Page: 37 of 82

40 5.7. Test Result Date of Test 2005/10/20 Test Site No.3 Shielded Room Test Mode Mode 1: Product MEGA BOOK Test Condition Power Harmonics Test Range Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #9 with 13.09% of the limit. Page: 38 of 82

41 Test Result: Pass Source qualification: Normal THC(A): 0.06 I-THD(pk%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 88 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 39 of 82

42 5.8. Test Photo Test Mode : Mode 1: Description: Power Harmonics Test Setup -Mode 1 Page: 40 of 82

43 6. Voltage Fluctuation and Flicker 6.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline S/N: HK54148 Feb., Analyzer SCHAFFNER CCN /X71887 Feb., No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 41 of 82

44 6.3. Limits Voltage Fluctuations and Flicker: The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P 1t shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Uncertainty The measurement uncertainty is defined as ± 3.23 % 6.6. Test Specification According to EN :1995+A1:2001 Page: 42 of 82

45 6.7. Test Result Date of Test 2005/10/20 Test Site No.3 Shielded Room Test Mode Mode 1: Product MEGA BOOK Test Condition Flicker Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :00:09 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 43 of 82

46 6.8. Test Photo Test Mode : Mode 1: Description: Flicker Test Setup -Mode 1 Page: 44 of 82

47 7. Electrostatic Discharge (ESD) 7.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 ESD Simulator System SCHAFFNER NSG 438,S/N:167 Mar., Horizontal Coupling Plane(HCP) 3 Vertical Coupling Plane(VCP) QuieTek HCP AL50 N/A QuieTek VCP AL50 N/A 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 45 of 82

48 7.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge B ±4 Contact Discharge Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Uncertainty The measurement uncertainty is defined as ± % 7.6. Test Specification According to IEC Edition 1.2: Page: 46 of 82

49 7.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/13 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Indirect Discharge (VCP Right) Amount of Discharge Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A B B A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 47 of 82

50 7.8. Test Photo Test Mode : Mode 1: Description: ESD Test Setup -Mode 1 Page: 48 of 82

51 8. Radiated Susceptibility (RS) 8.1. Test Equipment List Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 Signal Generator R & S SMY02 / /029 Oct., Power Amplifier A & R 100W10000M7 / A N/A 3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A 4 Bilog Antenna Chase CBL6112B / 2452 Sep., Power Meter R & S NRVD / Jan., Directional Coupler A & R DC6180 / Jan, No.2 EMC Fully Chamber N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 49 of 82

52 8.3. Limits Item Environmental Phenomena Enclosure Port Radio-Frequency Electromagnetic Field Amplitude Modulated Units MHz V/m(Un-modulated, rms) % AM (1kHz) Test Specification Performance Criteria A 8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and six sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/M Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 8.6. Test Specification According to IEC :2002+A1:2002 Page: 50 of 82

53 8.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 51 of 82

54 8.8. Test Photo Test Mode : Mode 1: Description: Radiated Susceptibility Test Setup -Mode 1 Page: 52 of 82

55 9. Electrical Fast Transient/Burst (EFT/B) 9.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Fast Transient/Burst Generator SCHAFFNER NSG 2050 S/N: AR Jun., No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 53 of 82

56 9.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz / / /50 5 B B B 9.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min. For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 0.5m ± 0.05m Uncertainty The measurement uncertainty is defined as ± 8.80 % 9.6. Test Specification According to IEC :2004 Page: 54 of 82

57 9.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 1kV 60 CDN B A PASS LAN ± 0.5kV 90 Clamp B B PASS Telecom ± 0.5kV 90 Clamp B B PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 55 of 82

58 9.8. Test Photo Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1 Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1-Clamp-LAN Page: 56 of 82

59 Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1-Clamp-Telecom Page: 57 of 82

60 10. Surge Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Surge Generator SCHAFFNER NSG 2050 S/N: AR Nov., No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 58 of 82

61 10.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Signal Ports and Telecommunication Ports (See 1) and 2)) Surges Tr/Ts us 1.2/50 (8/20) Line to Ground kv ± 1 B Input DC Power Ports Surges Line to Ground Tr/Ts us kv AC Input and AC Output Power Ports Surges Tr/Ts us Line to Line kv Line to Ground kv 1.2/50 (8/20) ± 0.5 B 1.2/50 (8/20) ± 1 ± 2 Notes: 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT,no test shall be required. B Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Uncertainty The measurement uncertainty is defined as ± 7.93 % Test Specification According to IEC Edition 1.1: Page: 59 of 82

62 10.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Surge Test Range Voltage Time Inject Inject Required Complied to Polarity Angle Interval Line Method Criteria Criteria kv (Second) Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 60 of 82

63 10.8. Test Photo Test Mode : Mode 1: Description: SURGE Test Setup-Mode 1 Page: 61 of 82

64 11. Conducted Susceptibility (CS) Test Equipment List The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 CS SYSTEM SCHAFFNER NSG 2070 Mar., CDN SCHAFFNER CDN M016S / Dec., CDN SCHAFFNER CDN M016S / Dec., FIXED PAD SCHAFFNER INA / 2115 N/A 5 EM Clamp KEMZ 801 / Mar., No.6 Shielded Room N/A Note: All equipment upon which need to calibrated are with calibration period of 1 year Test Setup Page: 62 of 82

65 11.3. Limits Item Environmental Phenomena Units Signal Ports and Telecommunication Ports MHz Radio-Frequency V (rms, Continuous Conducted Un-modulated) % AM (1kHz) Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A Page: 63 of 82

66 11.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Uncertainty The measurement uncertainty is defined as ± 6.17 % Test Specification According to IEC Edition 2.1: Page: 64 of 82

67 11.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.6 Shielded Room Test Condition Conducted Susceptibility Test Range MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) Clamp LAN A A PASS 0.15~ (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 65 of 82

68 11.8. Test Photo Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1 Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1-Clamp-LAN Page: 66 of 82

69 Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1-Clamp-Telecom Page: 67 of 82

70 12. Power Frequency Magnetic Field Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Line Maganetics SCHAFFNER INA 2141 S/N: 6002 Jun., Gauss Meter F.W.BELL 4090 Jun., Magnetic Field Coil SCHAFFNER INA702 Jun.,2005 S/N: IN 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 68 of 82

71 12.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Power-Frequency Magnetic Field Hz A/m (r.m.s.) 50 1 A Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Uncertainty The measurement uncertainty is defined as ± 3.23 % Test Specification According to IEC Edition 1.1: Page: 69 of 82

72 12.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 70 of 82

73 12.8. Test Photo Test Mode : Mode 1: Description: Power Frequency Magnetic Field Test Setup -Mode 1 Page: 71 of 82

74 13. Voltage Dips and Interruption Measurement Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: AR Nov., No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year Test Setup Page: 72 of 82

75 13.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Input AC Power Ports Voltage Dips Voltage Interruptions > > % Reduction Period % Reduction Periods % Reduction Periods B C C Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 O, 45 O, 90 O, 135 O, 180 O, 225 O, 270 O, 315 O of the voltage Uncertainty The measurement uncertainty is defined as ± 2.03 % Test Specification According to IEC Second Edition: Page: 73 of 82

76 13.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Voltage Dips and Interruption Reduction(%) Voltage Dips and Interruption Measurement Test Range Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS 30(161V) C A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) B A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS >95(0V) C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 74 of 82

77 13.8. Test Photo Test Mode : Mode 1: Description: Voltage Dips Test Setup -Mode 1 Page: 75 of 82

78 Attachement EUT Photograph (1) EUT Photo (2) EUT Photo Page: 76 of 82

79 (3) EUT Photo (4) EUT Photo Page: 77 of 82

80 (5) EUT Photo (6) EUT Photo Page: 78 of 82

81 (7) EUT Photo (8) EUT Photo Page: 79 of 82

82 (9) EUT Photo (10) EUT Photo Page: 80 of 82

83 (11) EUT Photo Page: 81 of 82