CERTIFICATE. Issued Date: Jul. 07, 2011 Report No.: R-ITCEP07V06

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Godfrey Welch
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MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T,

This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following

1 CERTIFICATE Issued Date: Jul. 07, 2011 Report No.: R-ITCEP07V06 This is to certify that the following designated product Product : Notebook Trade name : msi Model Number : MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) Company Name : MICRO-STAR INT'L Co., LTD. This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 2006+A1: 2007 EN 55024: 1998+A1: 2001+A2: 2003 EN : 2006+A2: 2009 IEC : 2008 EN : 2008 IEC : 2010 IEC : 2011 IEC : 2005 IEC : 2008 IEC : 2009 IEC : 2004 TEST LABORATORY Vincent Lin / Manager No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL: FAX: service@quietek.com

2 Test Report Product Name : Notebook Model No. : MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan Date of Receipt : 2011/04/29 Issued Date : 2011/07/07 Report No. : R-ITCEP07V06 Report Version : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

3 Declaration of Conformity We herewith confirm the following designated products to comply with the requirements set out in the Council Directive on the approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC) with applicable standards listed below. Product Trade name Model Number Applicable Harmonized Standards under Directive 2004/108/EC : Notebook : msi : MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) : EN 55022:2006+A1: 2007, Class B EN : 2006+A2: 2009 EN : 2008 EN 55024: 1998+A1: 2001+A2: 2003 Company Name : Company Address : Telephone : Facsimile : Person in responsible for marking this declaration: Name (Full Name) Title/ Department Date Legal Signature

Accredited by NVLAP, TAF-CNLA, DNV, TUV, Nemko Date: Jul. 07, 2011 QTK No.: 115076R-ITCEP07V06 Statement of Conformity This statement is to certify that the designated product below.

MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX,

4 Accredited by NVLAP, TAF-CNLA, DNV, TUV, Nemko Date: Jul. 07, 2011 QTK No.: R-ITCEP07V06 Statement of Conformity This statement is to certify that the designated product below. Product Trade name Model Number Company Name : Notebook : msi : MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) : MICRO-STAR INT'L Co., LTD. Applicable Standards : EN 55022:2006+A1: 2007, Class B EN : 2006+A2: 2009 EN : 2008 EN 55024:1998+A1: 2001+A2: 2003 One sample of the designated product has been tested and evaluated in our laboratory to find in compliance with the applicable standards above. The issued test report(s) show(s) it in detail. Report Number : R-ITCEP07V06 TEST LABORATORY Vincent Lin / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel: , Fax: , service@quietek.com

5 Test Report Certification Issued Date : 2011/07/07 Report No. : R-ITCEP07V06 Product Name Applicant Address Manufacturer Model No. EUT Rated Voltage EUT Test Voltage Trade Name Applicable Standard Test Result Performed Location : Notebook : MICRO-STAR INT L Co., LTD. : No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan : MICRO-STAR INT'L Co., LTD. : MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) : AC V, 50-60Hz : AC 230 V / 50 Hz : msi : EN 55022: 2006+A1: 2007, Class B EN 55024: 1998+A1: 2001+A2: 2003 EN : 2006+A2: 2009 EN :2008 : Complied : Quietek Corporation (Linkou Laboratory) No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL: / FAX: Documented By : ( Adm. Specialist / Joanne Lin ) Reviewed By : ( Assistant Engineer / JoJolee jung ) Approved By : ( Manager / Vincent Lin ) Page: 2 of 214

Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories.

: BSMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded

6 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN and specified testing scopes: Taiwan R.O.C. : BSMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Suzhou (China) Testing Laboratory : No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China. TEL : / FAX : service@quietek.com Page: 3 of 214

7 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Page: 4 of 214

8 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 5 of 214

9 10.7. Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 214

10 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Component Power Adapter (1) Power Adapter (2) Power Adapter (3) Notebook msi MS-1491, MS-1492, MS-1493, MS-1494, MS-1495, MS-1496, MS-1497, MS-1498, MS-1499, MS-149A, MS-149B, MS-149C, MS-149D, MS-149E, MS-149F, MS-149G, MS-149H, MS-149I, MS-149J, MS-149K, MS-149L, MS-149M, MS-149N, MS-149O, MS-149P, MS-149Q, MS-149R, MS-149S, MS-149T, MS-149U, MS-149V, MS-149W, MS-149X, MS-149Y, MS-149Z, X460, X460DX, X460DXR, Xyyyyyy ( y =0~9,a~z,A~Z & blank) MFR: Delta, M/N: ADP-65HB BB Input: AC V, 50-60Hz, 1.5A Output: DC 19V, 3.42A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: LI SHIN, M/N: 0713A1990 Input: AC V, 50-60Hz 1.5A Output: DC 19V, 4.74A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. MFR: Delta, M/N: ADP-90SB BB Input: AC V, 50-60Hz 1.5A Output: DC 19V, 4.74A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Note: The EUT is including thirty-eight models for different marketing requirement. Page: 7 of 214

11 Keyparts List Component Vendor / Model No. Remark M/B MSI / CPU (PGA-988pin) Intel / FF (SR04R), 2.1GHz DUAL-CORE I3-2310M Intel / FF (SR04B), 2.3GHz DUAL-CORE I5-2410M Intel / FF (SR02Y), 2.0GHz QUAD-CORE I7-2630QM Panel (14 ) IVO / M140NWR1 R0 14 inch CPT / CLAA140WB01A 14 inch HDD(SATA) WD / WD3200BEKT 2.5 inch,320gb,7200rpm WD / WD5000BEKT 2.5 inch,500gb,7200rpm WD / WD3200BPVT 2.5 inch,320gb,5400rpm WD / WD6400BPVT 2.5 inch,640gb,5400rpm WD / WD7500BPVT 2.5 inch,750gb,5400rpm Toshiba / MK3265GSX 2.5 inch,320gb,5400rpm Toshiba / MK5065GSX 2.5 inch,500gb,5400rpm Toshiba / MK6465GSX 2.5 inch,640gb,5400rpm Toshiba / MK5056GSY 2.5 inch,500gb,7200rpm TOSHIBA / MK7559GSXP 2.5 inch,750gb,5400rpm Hitachi / HTS545025B9A inch,250gb,5400rpm Hitachi / HTS545032B9A inch,320GB,5400rpm Hitachi / HTS545050B9A inch,500gb,5400rpm HITACHI / HTS547550A9E384/4K 2.5 inch,500gb,5400rpm HITACHI / HTS547564A9E384/4K 2.5 inch,640gb,5400rpm HITACHI / HTS547575A9E384/4K 2.5 inch,750gb,5400rpm Seagate / ST AS 2.5 inch,320gb,5400rpm Seagate / ST AS 2.5 inch,500gb,5400rpm Seagate / ST AS 2.5 inch,500gb,7200rpm SEAGATE / ST AS/4K 2.5 inch,750gb,7200rpm SEAGATE / ST AS/4K 2.5 inch,750gb,5400rpm DRAM Elixir / DDRIII 4G ODD TSST / TS-U633J -- WLAN (Combo) Intel / 11230BNHMW -- WLAN Intel / 62230ANHMW -- WLAN (WiFi only) Intel / 100BNHMW -- Webcam BISON / BN82M6SA AzureWave / AM-1S BISON / BN82M6SK Battery SMP / BTY-M V, 6000mAh Adapter Delta / ADP-90SB BB -- LI SHIN / 0713A Delta / ADP-65HB BB -- SSD Intel / SSDSA2M120G2K5 -- Intel / SSDSA2CW120G3 -- Page: 8 of 214

12 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Mode 7 Mode 8 Final Test Mode Mode 1 Mode 2 Emission Mode 3 Mode 4 Mode 1 Mode 2 Immunity Mode 3 Mode 4 Mode 9 Mode 10 Mode 11 Mode 12 Mode 13 Mode 14 Mode 15 Mode 16 Mode 17 Mode 18 Mode 19 Mode 20 Mode 21 ITEM Mode 1 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 2 LCD + HDMI 1366*768/60Hz CPU Intel / QUAD-CORE I7-2630QM, 2.0G Intel / DUAL-CORE I5-2410M, 2.3GHz Panel IVO / 14 inch, M140NWR1 R0 CPT / CLAA140WB01A HDD WD / WD7500BPVT WD / WD6400BPVT RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter Delta / ADP-90SB BB LI SHIN / 0713A1990 Page: 9 of 214

13 ITEM Mode 3 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 4 LCD + D-SUB 1366*768/60Hz CPU Intel / DUAL-CORE I3-2310M, 2.1GHz Intel / QUAD-CORE I7-2630QM, 2.0G Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD TOSHIBA / MK5056GSY WD / WD3200BEKT RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 62230ANHMW Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter Delta / ADP-65HB BB Delta / ADP-90SB BB ITEM Mode 5 LCD + D-SUB 1366*768/60Hz M/B MSI / MSI / Mode 6 LCD + D-SUB 1366*768/60Hz CPU Intel / DUAL-CORE I5-2410M, 2.3GHz Intel / DUAL-CORE I3-2310M, 2.1GHz Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD WD / WD5000BEKT WD / WD3200BPVT RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter LI SHIN / 0713A1990 Delta / ADP-65HB BB Page: 10 of 214

14 ITEM Mode 7 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 8 LCD + HDMI 1366*768/60Hz CPU Intel / QUAD-CORE I7-2630QM, 2.0G Intel / DUAL-CORE I5-2410M, 2.3GHz Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD TOSHIBA / MK3265GSX TOSHIBA / MK5065GSX RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter Delta / ADP-90SB BB LI SHIN / 0713A1990 ITEM Mode 9 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 10 LCD + HDMI 1366*768/60Hz CPU Intel / DUAL-CORE I3-2310M, 2.1GHz Intel / QUAD-CORE I7-2630QM, 2.0G Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD TOSHIBA / MK6465GSX HITACHI / HTS545025B9A300 RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter Delta / ADP-65HB BB Delta / ADP-90SB BB Page: 11 of 214

15 ITEM Mode 11 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 12 LCD + HDMI 1366*768/60Hz CPU Intel / DUAL-CORE I5-2410M, 2.3GHz Intel / DUAL-CORE I3-2310M, 2.1GHz Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD HITACHI / HTS545032B9A300 HITACHI / HTS545050B9A300/500G RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter LI SHIN / 0713A1990 Delta / ADP-65HB BB ITEM Mode 13 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 14 LCD + HDMI 1366*768/60Hz CPU Intel / QUAD-CORE I7-2630QM, 2.0G Intel / DUAL-CORE I5-2410M, 2.3GHz Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD SEAGATE / ST AS SEAGATE / ST AS RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2M120G2K5 Adapter Delta / ADP-90SB BB LI SHIN / 0713A1990 Page: 12 of 214

16 ITEM Mode 15 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 16 LCD + HDMI 1366*768/60Hz CPU Intel / DUAL-CORE I3-2310M, 2.1GHz Intel / DUAL-CORE I5-2410M, 2.3GHz Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD SEAGATE / ST AS TOSHIBA / MK7559GSXP SSD Intel / SSDSA2M120G2K5 Intel / SSDSA2CW120G3 RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SK1-310 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 Adapter Delta / ADP-65HB BB LI SHIN / 0713A1990 ITEM Mode 17 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 18 LCD + HDMI 1366*768/60Hz CPU Intel / DUAL-CORE I3-2310M, 2.1GHz Intel / QUAD-CORE I7-2630QM, 2.0G Panel IVO / M140NWR1 R0 CPT / CLAA140WB01A HDD Hitachi / HTS547550A9E384 Hitachi / HTS547564A9E384 SSD Intel / SSDSA2CW120G3 Intel / SSDSA2CW120G3 RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 100BNHMW(WIFI ONLY) Webcam BISON / BN82M6SA8-010 AzureWave / AM-1S005 Battery SMP / BTY-M46 SMP / BTY-M46 Adapter Delta / ADP-65HB BB Delta / ADP-90SB BB Page: 13 of 214

17 ITEM Mode 19 LCD + HDMI 1366*768/60Hz M/B MSI / MSI / Mode 20 LCD + HDMI 1366*768/60Hz CPU Intel / DUAL-CORE I5-2410M, 2.3GHz Intel / QUAD-CORE I7-2630QM, 2.0G Panel IVO / M140NWR1 R0 IVO / M140NWR1 R0 HDD Hitachi / HTS547575A9E384 Seagate / ST AS SSD Intel / SSDSA2CW120G3 Intel / SSDSA2CW120G3 RAM DDRIII, 4G, 1333 DDRIII, 4G, 1333 ODD TSST / TS-U633J TSST / TS-U633J WLAN Intel / 11230BNHMW(COMBO) Intel / 11230BNHMW(COMBO) Webcam BISON / BN82M6SA8-010 BISON / BN82M6SA8-010 Battery SMP / BTY-M46 SMP / BTY-M46 Adapter LI SHIN / 0713A1990 Delta / ADP-90SB BB ITEM M/B MSI / CPU Panel HDD SSD Mode 21 LCD + HDMI 1366*768/60Hz Intel / DUAL-CORE I5-2410M, 2.3GHz CPT / CLAA140WB01A Seagate / ST AS Intel / SSDSA2CW120G3 RAM DDRIII, 4G, 1333 ODD WLAN Webcam Battery Adapter TSST / TS-U633J Intel / 100BNHMW(WIFI ONLY) AzureWave / AM-1S005 SMP / BTY-M46 LI SHIN / 0713A1990 Page: 14 of 214

18 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor (EMI) DELL U2410 CN-0J257M I-04ML Non-Shielded, 1.8m Monitor (EMS) LG W2261VT 907YHPB07296 Non-Shielded, 1.8m 2 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m 3 USB 3.0 BUFFALO HD-H1.0TU Shielded, 1.5m 4 USB 3.0 BUFFALO HD-H1.0TU Shielded, 1.5m 5 Microphone & Ergotech ET-E201 N/A N/A Earphone (EMI) Microphone & Ergotech ET-E201 N/A N/A Earphone (EMS) 6 USB Mouse (EMI) Logitech M-U0003 LZ024HR N/A USB Mouse (EMS) Logitech M-U0003 LZ024HR N/A 7 SD Card 512MB Transcend N/A Page: 15 of 214

19 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded. B HDMI Cable Shielded, 1.0m C USB Cable Shielded, 1.0m, two PCS. D Microphone & Earphone Cable Non-Shielded, 1.6m E Mouse Cable Shielded, 1.8m F LAN Cable Non-Shielded, 7m Page: 16 of 214

20 1.5. EUT Exercise Software 1 Setup the EUT and peripheral as shown on Figure 2 Connect the power to EUT and peripherals, then turn on the power of all equipments. Waiting for EUT to enter Windows Operating System, and adjust the display resolution 3 to the test mode first. 4 Connect LAN to Notebook for transmitting data. Activate Wireless interface and Bluetooth function, and perform the wireless data 5 communication with the other Notebook (write/delete action). 6 Connect to HDD for transmitting data. 7 Run Windows Media Player program and play a disk with color Bar pattern 8 Run H" pattern. 9 Begin to test and repeat the above procedure (4)~(8) Page: 17 of 214

21 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022: 2006+A1: 2007 Yes No Impedance Stabilization Network EN 55022: 2006+A1: 2007 Yes No Radiated Emission EN 55022: 2006+A1: 2007 Yes No Power Harmonics EN : 2006+A2: 2009 Yes No Voltage Fluctuation and Flicker EN : 2008 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC : 2008 Yes No Radiated susceptibility IEC : 2010 Yes No Electrical fast transient/burst IEC : 2011 Yes No Surge IEC : 2005 Yes No Conducted susceptibility IEC : 2008 Yes No Power frequency magnetic field IEC : 2009 Yes No Voltage dips and interruption IEC : 2004 Yes No Page: 18 of 214

22 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS /11/10 LISN R&S ENV / /09/06 LISN R&S ENV /02/10 Pulse Limiter R&S ESH3-Z /09/02 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/15 EMI Test Receiver R&S ESCS /11/10 LISN R&S ENV /02/10 LISN R&S ENV / /09/06 Pulse Limiter R&S ESH3-Z /09/02 RF Current Probe FCC F-65 10KHz~1GHz /11/08 BALANCED TELECOM ISN FCC FCC-TLISN-T /06/26 BALANCED TELECOM ISN FCC FCC-TLISN-T /06/26 BALANCED TELECOM ISN FCC FCC-TLISN-T /06/26 Radiated Emission / Site1 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /01/24 Broadband Horn Antenna Schwarzbeck BBHA /10/27 EMI Test Receiver R&S ESCS /12/06 Horn Antenna Schwarzbeck BBHA9120D /10/28 Pre-Amplifier QTK N/A N/A 2010/08/01 Spectrum Analyzer Advantest R /11/10 Radiated Emission / 9x6x6_Chamber Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESIB / /07/05 Horn Antenna Schwarzbeck 9120D /11/12 Pre-Amplifier QuieTek AP-180C CHM/ /08/04 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /09/06 IEC X Analyzer(Flicker) Schaffner CCN X /09/06 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK /09/06 IEC X Analyzer(Flicker) Schaffner CCN X /09/06 Page: 19 of 214

23 Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System Noiseken TC-815R ESS /08/30 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /05/09 Biconilog Antenna EMCO N/A Directional Coupler A&R DC N/A Dual Microphone Supply B&K /04/21 Mouth Simulator B&K /04/21 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A N/A Power Meter R&S NRVD(P.M) /05/09 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /04/21 Signal Generator R&S SMT /05/09 Electrical fast transient/burst / SR3 Instrument Manufacturer Type No. Serial No Cal. Date TRANSIENT TEST SYSTEM EMC PARTNER TRA2000IN /12/09 Surge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date TRANSIENT TEST SYSTEM EMC PARTNER TRA2000IN /12/09 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2011/04/07 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA N/A Magnetic Loop Coil Schaffner INA N/A Voltage dips and interruption / SR3 Instrument Manufacturer Type No. Serial No Cal. Date TRANSIENT TEST SYSTEM EMC PARTNER TRA2000IN /12/09 Page: 20 of 214

24 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A N/A CDN Schaffner TRA U N/A CDN M016S Schaffner CAL U100A N/A CDN M016S Schaffner TRA U N/A CDN T002 Schaffner CAL U N/A CDN T002 Schaffner TRA U N/A CDN T400 Schaffner CAL U N/A CDN T400 Schaffner TRA U N/A Coupling Decoupling Network Schaffner CDN M016S /04/08 Coupling Decoupling Network Schaffner CDN T /04/08 Coupling Decoupling Network Schaffner CDN T /04/08 EM-CLAMP Schaffner KEMZ /04/08 Page: 21 of 214

25 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.0 % and 3.8%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 3.57 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 4 %, and 2.5%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%. Page: 22 of 214

26 Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 2.0 db and 2.61 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2.0 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025, the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%. Page: 23 of 214

27 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Impedance Stabilization Network Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast transient/burst Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Power frequency magnetic field Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Voltage dips and interruption Humidity (%RH) Barometric pressure (mbar) Page: 24 of 214

3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 55022 3.2. Test Setup 3.3. Limit Limits Frequency (MHz) QP AV 0.

28 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN Test Setup 3.3. Limit Limits Frequency (MHz) QP AV Remarks: In the above table, the tighter limit applies at the band edges. Page: 25 of 214

29 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 26 of 214

30 3.6. Test Result Site : SR_1 Time : 2011/05/03-06:01 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Page: 27 of 214

31 Site : SR_1 Time : 2011/05/03-06:02 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 214

32 Site : SR_1 Time : 2011/05/03-06:02 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 214

33 Site : SR_1 Time : 2011/05/03-06:02 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Page: 30 of 214

34 Site : SR_1 Time : 2011/05/03-06:03 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 214

35 Site : SR_1 Time : 2011/05/03-06:03 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 214

36 Site : SR_1 Time : 2011/05/04-16:52 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Page: 33 of 214

37 Site : SR_1 Time : 2011/05/04-16:53 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 34 of 214

38 Site : SR_1 Time : 2011/05/04-16:53 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 214

39 Site : SR_1 Time : 2011/05/04-16:54 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Page: 36 of 214

40 Site : SR_1 Time : 2011/05/04-16:54 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 37 of 214

41 Site : SR_1 Time : 2011/05/04-16:54 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 214

42 Site : SR_1 Time : 2011/05/03-06:41 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 39 of 214

43 Site : SR_1 Time : 2011/05/03-06:41 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 40 of 214

44 Site : SR_1 Time : 2011/05/03-06:41 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 214

45 Site : SR_1 Time : 2011/05/03-06:42 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 42 of 214

46 Site : SR_1 Time : 2011/05/03-06:43 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 43 of 214

47 Site : SR_1 Time : 2011/05/03-06:43 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 214

48 Site : SR_1 Time : 2011/07/04-17:04 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Page: 45 of 214

49 Site : SR_1 Time : 2011/07/04-17:05 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 214

50 Site : SR_1 Time : 2011/07/04-17:05 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_L1 - Line1 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 214

51 Site : SR_1 Time : 2011/07/04-17:06 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Page: 48 of 214

52 Site : SR_1 Time : 2011/07/04-17:07 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 49 of 214

Site : SR_1 Time : 2011/07/04-17:07 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level

53 Site : SR_1 Time : 2011/07/04-17:07 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : ENV_216_N - Line2 Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 50 of 214

54 3.7. Test Photograph Test Mode : Mode 1 Description : Front View of Conducted Test Test Mode : Mode 1 Description : Back View of Conducted Test Page: 51 of 214

55 Test Mode : Mode 2 Description : Front View of Conducted Test Test Mode : Mode 2 Description : Back View of Conducted Test Page: 52 of 214

56 Test Mode : Mode 3 Description : Front View of Conducted Test Test Mode : Mode 3 Description : Back View of Conducted Test Page: 53 of 214

57 Test Mode : Mode 4 Description : Front View of Conducted Test Test Mode : Mode 4 Description : Back View of Conducted Test Page: 54 of 214

4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN 55022 4.2. Test Setup 4.3.

58 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN Test Setup 4.3. Limit Limits Frequency (MHz) QP AV Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 55 of 214

59 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB LCL ISN is used for cat Deviation from Test Standard No deviation. Page: 56 of 214

60 4.6. Test Result Site : SR_1 Time : 2011/05/03-06:11 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10Mbps Page: 57 of 214

61 Site : SR_1 Time : 2011/05/03-06:11 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 58 of 214

62 Site : SR_1 Time : 2011/05/03-06:11 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 214

63 Site : SR_1 Time : 2011/05/03-06:09 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100Mbps Page: 60 of 214

64 Site : SR_1 Time : 2011/05/03-06:09 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 61 of 214

65 Site : SR_1 Time : 2011/05/03-06:09 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 1, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 62 of 214

66 Site : SR_1 Time : 2011/05/03-06:04 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 1, ISN 1G Page: 63 of 214

67 Site : SR_1 Time : 2011/05/03-06:05 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 1, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 64 of 214

68 Site : SR_1 Time : 2011/05/03-06:05 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 1, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE 3 * AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 65 of 214

69 Site : SR_1 Time : 2011/05/04-00:48 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10Mbps Page: 66 of 214

70 Site : SR_1 Time : 2011/05/04-00:49 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 67 of 214

71 Site : SR_1 Time : 2011/05/04-00:49 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 68 of 214

72 Site : SR_1 Time : 2011/05/04-00:46 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100Mbps Page: 69 of 214

73 Site : SR_1 Time : 2011/05/04-00:47 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 70 of 214

74 Site : SR_1 Time : 2011/05/04-00:47 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 2, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 71 of 214

75 Site : SR_1 Time : 2011/05/04-00:41 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Page: 72 of 214

76 Site : SR_1 Time : 2011/05/04-00:42 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 73 of 214

77 Site : SR_1 Time : 2011/05/04-00:42 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 2, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 74 of 214

78 Site : SR_1 Time : 2011/05/16-20:21 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10Mbps Page: 75 of 214

79 Site : SR_1 Time : 2011/05/16-20:22 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 76 of 214

80 Site : SR_1 Time : 2011/05/16-20:22 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 77 of 214

81 Site : SR_1 Time : 2011/05/16-20:23 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100Mbps Page: 78 of 214

82 Site : SR_1 Time : 2011/05/16-20:24 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 79 of 214

83 Site : SR_1 Time : 2011/05/16-20:24 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T4 - Line1 Note : Mode 3, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 80 of 214

84 Site : SR_1 Time : 2011/05/16-20:25 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Page: 81 of 214

85 Site : SR_1 Time : 2011/05/16-20:26 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 82 of 214

Site : SR_1 Time : 2011/05/16-20:26 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Frequency Correct Factor Reading Level

86 Site : SR_1 Time : 2011/05/16-20:26 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : ISN_T8 - Line1 Note : Mode 3, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 83 of 214

87 Site : SR_1 Time : 2011/07/04-17:17 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 10Mbps Page: 84 of 214

88 Site : SR_1 Time : 2011/07/04-17:18 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 85 of 214

89 Site : SR_1 Time : 2011/07/04-17:18 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 86 of 214

90 Site : SR_1 Time : 2011/07/04-17:15 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 100Mbps Page: 87 of 214

91 Site : SR_1 Time : 2011/07/04-17:16 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 88 of 214

92 Site : SR_1 Time : 2011/07/04-17:16 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 89 of 214

93 Site : SR_1 Time : 2011/07/04-17:09 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 1G Page: 90 of 214

94 Site : SR_1 Time : 2011/07/04-17:10 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 91 of 214

95 Site : SR_1 Time : 2011/07/04-17:10 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Power : AC 230V/50Hz Probe : TESEQ_T8 - Line1 Note : Mode 4, ISN 1G Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 92 of 214

96 4.7. Test Photograph Test Mode : Mode 1 Description : Front View of ISN Test Test Mode : Mode 1 Description : Back View of ISN Test Page: 93 of 214

97 Test Mode : Mode 2 Description : Front View of ISN Test Test Mode : Mode 2 Description : Back View of ISN Test Page: 94 of 214

98 Test Mode : Mode 3 Description : Front View of ISN Test Test Mode : Mode 3 Description : Back View of ISN Test Page: 95 of 214

99 Test Mode : Mode 4 Description : Front View of ISN Test Test Mode : Mode 4 Description : Back View of ISN Test Page: 96 of 214

100 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN Test Setup Under 1GHz Test Setup: Above 1GHz Test Setup: Page: 97 of 214

101 5.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Limits Frequency Distance Peak Average (GHz) (m) (dbuv/m) (dbuv/m) Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Highest frequency generated or used Upper frequency of measurement in the device or on which the device range (MHz) operates or tunes (MHz) Below Above th harmonic of the highest frequency or 6 GHz, whichever is lower Page: 98 of 214

102 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 3/10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz and above 1GHz using a receiver bandwidth of 1MHz. 30MHz to1ghz Radiated was performed at an antenna to EUT distance of 10 meters. Above1GHz Radiated was performed at an antenna to EUT distance of 3 meters. It is placed with absorb on the ground between EUT and Antenna Deviation from Test Standard No deviation. Page: 99 of 214

5.6. Test Result Site : OATS-1 Time : 2011/05/03-03:33 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_0811 - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency

103 5.6. Test Result Site : OATS-1 Time : 2011/05/03-03:33 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 100 of 214

104 Site : OATS-1 Time : 2011/05/03-03:16 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 101 of 214

105 Site : OATS-1 Time : 2011/05/03-19:19 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 102 of 214

106 Site : OATS-1 Time : 2011/05/03-18:49 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 103 of 214

107 Site : OATS-1 Time : 2011/05/03-02:37 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 104 of 214

108 Site : OATS-1 Time : 2011/05/03-02:44 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 105 of 214

109 Site : OATS-1 Time : 2011/07/02-00:23 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ HORIZONTAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 106 of 214

110 Site : OATS-1 Time : 2011/07/02-00:01 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe : Site1_CBL6112_10M_ VERTICAL Power : AC 230V/50Hz Note : Mode 4 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 107 of 214

111 Site : 9x6x6_Chamber Time : 2011/05/03-19:39 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 108 of 214

112 Site : 9x6x6_Chamber Time : 2011/05/03-19:39 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 109 of 214

113 Site : 9x6x6_Chamber Time : 2011/05/03-19:39 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 110 of 214

114 Site : 9x6x6_Chamber Time : 2011/05/03-19:39 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) AVERAGE 2 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 111 of 214

115 Site : 9x6x6_Chamber Time : 2011/05/03-20:04 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) PEAK 2 * PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 112 of 214

Site : 9x6x6_Chamber Time : 2011/05/03-20:04 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct

116 Site : 9x6x6_Chamber Time : 2011/05/03-20:04 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 113 of 214

117 Site : 9x6x6_Chamber Time : 2011/05/03-20:05 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 114 of 214

118 Site : 9x6x6_Chamber Time : 2011/05/03-20:05 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 115 of 214

119 Site : 9x6x6_Chamber Time : 2011/05/03-20:25 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 116 of 214

120 Site : 9x6x6_Chamber Time : 2011/05/03-20:25 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 117 of 214

121 Site : 9x6x6_Chamber Time : 2011/05/03-20:26 Limit : CISPR_22_B_(Above_1G)_03M_PK Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 118 of 214

122 Site : 9x6x6_Chamber Time : 2011/05/03-20:26 Limit : CISPR_22_B_(Above_1G)_03M_AV Margin : 6 EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (dbuv/m) (dbuv/m) 1 * AVERAGE Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 119 of 214

Site: 9x6x6_Chamber Time: 2011/07/02-05:53 Limit: EN55022_B_(Above_1G) Margin: 0 Probe: 9120D_1-18G_Horn EUT: Notebook Polarity: Horizontal Power: AC 230V/50Hz Note: Mode 4 Frequency Measure Level

123 Site: 9x6x6_Chamber Time: 2011/07/02-05:53 Limit: EN55022_B_(Above_1G) Margin: 0 Probe: 9120D_1-18G_Horn EUT: Notebook Polarity: Horizontal Power: AC 230V/50Hz Note: Mode 4 Frequency Measure Level Reading Level Over Limit Limit Factor Type (MHz) (dbuv/m) (dbuv/m) 1 * PK AV PK AV PK AV PK AV Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp). Page: 120 of 214

124 Site: 9x6x6_Chamber Time: 2011/07/02-05:46 Limit: EN55022_B_(Above_1G) Margin: 0 Probe: 9120D_1-18G_Horn EUT: Notebook Polarity: Vertical Power: AC 230V/50Hz Note: Mode 4 Frequency Measure Level Reading Level Over Limit Limit Factor Type (MHz) (dbuv/m) (dbuv/m) PK AV 3 * PK AV PK AV PK AV Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp). Page: 121 of 214

125 5.7. Test Photograph Test Mode : Mode 1 Description : Front View of Radiated Test Test Mode : Mode 1 Description : Back View of Radiated Test Page: 122 of 214

126 Test Mode : Mode 1 Description : Front View of High Frequency Radiated Test Test Mode : Mode 2 Description : Front View of Radiated Test Page: 123 of 214

127 Test Mode : Mode 2 Description : Back View of Radiated Test Test Mode : Mode 2 Description : Front View of High Frequency Radiated Test Page: 124 of 214

128 Test Mode : Mode 3 Description : Front View of Radiated Test Test Mode : Mode 3 Description : Back View of Radiated Test Page: 125 of 214

129 Test Mode : Mode 3 Description : Front View of High Frequency Radiated Test Test Mode : Mode 4 Description : Front View of Radiated Test Page: 126 of 214

130 Test Mode : Mode 4 Description : Back View of Radiated Test Test Mode : Mode 4 Description : Front View of High Frequency Radiated Test Page: 127 of 214

131 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics n * 8/n n * 15/n Page: 128 of 214

132 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % λ * n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 129 of 214

133 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 130 of 214

134 6.6. Test Result Product Notebook Test Item Test Mode Mode 1 Power Harmonics Date of Test 2011/05/18 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #37 with 54.33% of the limit. Page: 131 of 214

135 Test Result: Pass Source qualification: Normal THC(A): 0.12 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 90.7 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 132 of 214

136 Product Notebook Test Item Power Harmonics Test Mode Mode 2 Date of Test 2011/05/18 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: Pass Worst harmonic was #27 with 43.54% of the limit. Page: 133 of 214

137 Test Result: Pass Source qualification: Normal THC(A): 0.12 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 82.2 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 134 of 214

138 Product Notebook Test Item Power Harmonics Test Mode Mode 3 Date of Test 2011/05/24 Test Site No.3 Shielded Room Test Result: pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: pass Worst harmonic was #11 with 0.00% of the limit. Page: 135 of 214

139 Test Result: pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 71.6 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 136 of 214

140 Product Notebook Test Item Power Harmonics Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.3 Shielded Room Test Result: pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class D limit line European Limits Current RMS(Amps) Harmonic # Test result: pass Worst harmonic was #3 with 53.84% of the limit. Page: 137 of 214

141 Test Result: pass Source qualification: Normal THC(A): 0.16 I-THD(%): POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): 88.9 Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass pass Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 138 of 214

142 6.7. Test Photograph Test Mode : Mode 1 Description : Power Harmonics Test Setup Test Mode : Mode 2 Description : Power Harmonics Test Setup Page: 139 of 214

143 Test Mode : Mode 3 Description : Power Harmonics Test Setup Test Mode : Mode 4 Description : Power Harmonics Test Setup Page: 140 of 214

7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-3-3 7.2. Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.

144 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about Page: 141 of 214

145 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed Deviation from Test Standard No deviation. Page: 142 of 214

146 7.6. Test Result Product Notebook Test Item Test Mode Mode 1 Voltage Fluctuation and Flicker Date of Test 2011/05/18 Test Site No.3 Shielded Room Test Result: Pass Pst i and limit line Status: Test Completed European Limits Pst :21:40 Plt and limit line 0.50 Plt :21:40 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 143 of 214

147 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 2 Date of Test 2011/05/18 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :33:16 Plt and limit line 0.50 Plt :33:16 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 144 of 214

148 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 3 Date of Test 2011/05/25 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :47:26 Plt and limit line 0.50 Plt :47:26 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.15 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.10 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 145 of 214

149 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits Pst :13:43 Plt and limit line 0.50 Plt :13:43 Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): Test limit: Pass Highest Plt (2 hr. period): Test limit: Pass Page: 146 of 214

150 7.7. Test Photograph Test Mode : Mode 1 Description : Flicker Test Setup Test Mode : Mode 2 Description : Flicker Test Setup Page: 147 of 214

151 Test Mode : Mode 3 Description : Flicker Test Setup Test Mode : Mode 4 Description : Flicker Test Setup Page: 148 of 214

8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2 8.2. Test Setup 8.3.

152 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 149 of 214

153 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 150 of 214

154 8.6. Test Result Product Notebook Test Item Test Mode Mode 1 Electrostatic Discharge Date of Test 2011/05/23 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 151 of 214

155 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 2 Date of Test 2011/05/23 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 152 of 214

156 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 3 Date of Test 2011/05/23 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 153 of 214

157 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.6 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -8kV B B B B Pass Pass Contact Discharge kV -4kV B B A A Pass Pass Indirect Discharge 25 +4kV B A Pass (HCP) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Front) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Left) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Back) 25-4kV B A Pass Indirect Discharge 25 +4kV B A Pass (VCP Right) 25-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 154 of 214

158 8.7. Test Photograph Test Mode : Mode 1 Description : ESD Test Setup Test Mode : Mode 2 Description : ESD Test Setup Page: 155 of 214

159 Test Mode : Mode 3 Description : ESD Test Setup Test Mode : Mode 4 Description : ESD Test Setup Page: 156 of 214

9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3

160 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 157 of 214

161 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 158 of 214

162 9.6. Test Result Product Notebook Test Item Test Mode Mode 1 Radiated susceptibility Date of Test 2011/05/23 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 159 of 214

163 Product Notebook Test Item Radiated susceptibility Test Mode Mode 2 Date of Test 2011/05/23 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 160 of 214

164 Product Notebook Test Item Radiated susceptibility Test Mode Mode 3 Date of Test 2011/05/23 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 161 of 214

165 Product Notebook Test Item Radiated susceptibility Test Mode Mode 4 Date of Test 2011/07/05 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 3 A A PASS FRONT V 3 A A PASS BACK H 3 A A PASS BACK V 3 A A PASS RIGHT H 3 A A PASS RIGHT V 3 A A PASS LEFT H 3 A A PASS LEFT V 3 A A PASS UP H 3 A A PASS UP V 3 A A PASS DOWN H 3 A A PASS DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 162 of 214

166 9.7. Test Photograph Test Mode : Mode 1 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2 Description : Radiated Susceptibility Test Setup Page: 163 of 214

167 Test Mode : Mode 3 Description : Radiated Susceptibility Test Setup Test Mode : Mode 4 Description : Radiated Susceptibility Test Setup Page: 164 of 214

10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4-4 10.2. Test Setup 10.3.

168 10. Electrical Fast Transient/Burst Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria / / /50 5 B B B Page: 165 of 214

169 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 166 of 214

170 10.6. Test Result Product Notebook Test Item Test Mode Mode 1 Electrical fast transient/burst Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 167 of 214

171 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2 Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 168 of 214

172 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 3 Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 169 of 214

173 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 1kV 60 Direct B A PASS LAN ± 0.5kV 60 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 170 of 214

174 10.7. Test Photograph Test Mode : Mode 1 Description : EFT/B Test Setup Test Mode : Mode 1 Description : EFT/B Test Setup - Clamp Page: 171 of 214

175 Test Mode : Mode 2 Description : EFT/B Test Setup Test Mode : Mode 2 Description : EFT/B Test Setup - Clamp Page: 172 of 214

176 Test Mode : Mode 3 Description : EFT/B Test Setup Test Mode : Mode 3 Description : EFT/B Test Setup - Clamp Page: 173 of 214

177 Test Mode : Mode 4 Description : EFT/B Test Setup Test Mode : Mode 4 Description : EFT/B Test Setup - Clamp Page: 174 of 214

178 11. Surge Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) 1 1.2/50 (8/20) /50 (8/20) 1 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 175 of 214

179 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 176 of 214

180 11.6. Test Result Product Notebook Test Item Surge Test Mode Mode 1 Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 177 of 214

181 Product Notebook Test Item Surge Test Mode Mode 2 Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 178 of 214

182 Product Notebook Test Item Surge Test Mode Mode 3 Date of Test 2011/05/19 Test Site No.3 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 179 of 214

183 Product Notebook Test Item Surge Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.3 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 180 of 214

184 11.7. Test Photograph Test Mode : Mode 1 Description : SURGE Test Setup Test Mode : Mode 2 Description : SURGE Test Setup Page: 181 of 214

185 Test Mode : Mode 3 Description : SURGE Test Setup Test Mode : Mode 4 Description : SURGE Test Setup Page: 182 of 214

186 12. Conducted Susceptibility Test Specification According to Standard : IEC Test Setup CDN Test Mode EM Clamp Test Mode Page: 183 of 214

187 12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s Deviation from Test Standard No deviation. Page: 184 of 214

188 12.6. Test Result Product Notebook Test Item Test Mode Mode 1 Conducted susceptibility Date of Test 2011/05/20 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 185 of 214

189 Product Notebook Test Item Conducted susceptibility Test Mode Mode 2 Date of Test 2011/05/20 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 186 of 214

190 Product Notebook Test Item Conducted susceptibility Test Mode Mode 3 Date of Test 2011/05/20 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 187 of 214

191 Product Notebook Test Item Conducted susceptibility Test Mode Mode 4 Date of Test 2011/05/20 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (3V) CDN AC IN A A PASS 0.15~ (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 188 of 214

192 12.7. Test Photograph Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup-CDN Page: 189 of 214

193 Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup-CDN Page: 190 of 214

194 Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup Test Mode : Mode 3 Description : Conducted Susceptibility Test Setup-CDN Page: 191 of 214

195 Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup Test Mode : Mode 4 Description : Conducted Susceptibility Test Setup-CDN Page: 192 of 214

13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-8 13.2. Test Setup 13.3. Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field 13.

196 13. Power Frequency Magnetic Field Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 193 of 214

197 13.6. Test Result Product Notebook Test Item Test Mode Mode 1 Power frequency magnetic field Date of Test 2011/05/20 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 194 of 214

198 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 2 Date of Test 2011/05/20 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 195 of 214

199 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 3 Date of Test 2011/05/20 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 196 of 214

200 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 4 Date of Test 2011/07/06 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 197 of 214

201 13.7. Test Photograph Test Mode : Mode 1 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2 Description : Power Frequency Magnetic Field Test Setup Page: 198 of 214

202 Test Mode : Mode 3 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 4 Description : Power Frequency Magnetic Field Test Setup Page: 199 of 214

14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-11 14.2. Test Setup 14.3.

203 14. Voltage Dips and Interruption Test Specification According to Standard : IEC Test Setup Limit Item Environmental Phenomena Input AC Power Ports Units Test Specification Performance Criteria Voltage Dips % Reduction Period C % Reduction Period > B Voltage Interruptions % Reduction Period > C Page: 200 of 214

204 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage Deviation from Test Standard No deviation. Page: 201 of 214

205 14.6. Test Result Product Notebook Test Item Test Mode Mode 1 Voltage dips and interruption Date of Test 2011/05/20 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 202 of 214

206 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 2 Date of Test 2011/05/20 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 203 of 214

207 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 3 Date of Test 2011/05/20 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 204 of 214

208 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 4 Date of Test 2011/07/05 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS C A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > B A PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS > C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 205 of 214

209 14.7. Test Photograph Test Mode : Mode 1 Description : Voltage Dips Test Setup Test Mode : Mode 2 Description : Voltage Dips Test Setup Page: 206 of 214

210 Test Mode : Mode 3 Description : Voltage Dips Test Setup Test Mode : Mode 4 Description : Voltage Dips Test Setup Page: 207 of 214

211 15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 208 of 214

212 (3) EUT Photo (4) EUT Photo Page: 209 of 214

213 (5) EUT Photo (6) EUT Photo Page: 210 of 214

214 (7) EUT Photo (8) EUT Photo Page: 211 of 214

215 (9) EUT Photo (10) EUT Photo Page: 212 of 214

216 (11) EUT Photo (12) EUT Photo Page: 213 of 214

217 (13) EUT Photo Page: 214 of 214

Test Report. Product Name : IPC Model No.

Test Report. Product Name : IPC Model No. Test Report Product Name : IPC Model No. : On Demand Switch 3 (RODS3-DEFAULT) On Demand Switch 3 (RODS3-S1-DEFAULT) On Demand Switch 3 (RODS3-S2-DEFAULT) Applicant : Radware Ltd. Address : 22 Raoul Wallenberg