8-BIT SERIAL-INPUT SHIFT REGISTER WITH LATCHED 3-STATE OUTPUTS High-Performance Silicon-Gate CMOS

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1 8-BIT SERIAL-INPUT SHIFT REGISTER WITH LATCHED -STATE OUTPUTS High-Performance Silicon-Gate CMOS The IN74HC4094 is identical in pinout to the LS/ALS4094. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LS/ALSTTL outputs. This device coists of an 8-bit shift register and 8-bit D-type latch with three-state parallel outputs. Data is shifted serially through the shift register on the positive going traition of the clock input signal. The output of the last stage SQ H can be used to cascade several devices. Data on the SQ H output is traferred to a second output (SQ H ) on the following negative traition of the clock input signal. The data of each stage of the shift register is provided with a latch, which latches data on the negative going traition of the Strobe input signal. When the Strobe input is held high, data propagates through the latch to a -state output buffer. This buffer is enabled when Output Enable input is taken high. Outputs Directly Interface to CMOS, NMOS, and TTL Operating oltage Range: to Low Input Current: 1.0 µa High Noise Immunity Characteristic of CMOS Devices ORDERING INFORMATION IN74HC4094N Plastic IN74HC4094D SOIC T A = -55 to 125 C for all packages PIN ASSIGNMENT LOGIC DIAGRAM PIN 16 = CC PIN 8 = GND FUNCTION TABLE Inputs Parallel Outputs Serial Outputs Clock Output Enable Strobe A Q A Q N SQ H SQ H L X X Z Z Q6 NC L X X Z Z NC SQ H H L X NC NC Q6 NC H H L L Q N-1 Q6 NC H H H H Q N-1 Q6 NC H X X NC NC NC SQ H NC = No Change Z = high impedance X = don t care 1

2 MAXIMUM RATINGS * Symbol Parameter alue Unit CC DC Supply oltage (Referenced to GND) -0.5 to +7.0 IN DC Input oltage (Referenced to GND) -1.5 to CC +1.5 OUT DC Output oltage (Referenced to GND) -0.5 to CC +0.5 I IN DC Input Current, per Pin ±20 ma I OUT DC Output Current, per Pin ±25 ma I CC DC Supply Current, CC and GND Pi ±50 ma P D Power Dissipation in Still Air, Plastic DIP+ 750 mw SOIC Package+ Tstg Storage Temperature -65 to +150 C T L Lead Temperature, 1 mm from Case for 10 Seconds (Plastic DIP or SOIC Package) 260 C * Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditio. +Derating - Plastic DIP: - 10 mw/ C from 65 to 125 C SOIC Package: : - 7 mw/ C from 65 to 125 C RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit CC DC Supply oltage (Referenced to GND) IN, OUT DC Input oltage, Output oltage (Referenced to GND) 0 CC T A Operating Temperature, All Package Types C t r, t f Input Rise and Fall Time (Figure 1) CC = CC = CC = This device contai protection circuitry to guard agait damage due to high static voltages or electric fields. However, precautio must be taken to avoid applicatio of any voltage higher than maximum rated voltages to this high-impedance circuit. For proper operation, IN and OUT should be cotrained to the range GND ( IN or OUT ) CC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or CC ). Unused outputs must be left open. 2

3 DC ELECTRICAL CHARACTERISTICS(oltages Referenced to GND) CC Guaranteed Limit Symbol Parameter Test Conditio 25 C to -55 C 85 C IH Minimum High- Level Input oltage IL Maximum Low - Level Input oltage Minimum High- Level Output oltage OH OL I IN I OZ I CC Maximum Low- Level Output oltage Maximum Input Leakage Current Maximum Three- State Leakage Current Maximum Quiescent Supply Current (per Package) OUT = or CC - I OUT 20 µa OUT = or CC - I OUT 20 µa IN = IH or IL I OUT 20 µa IN = IH or IL I OUT 4.0 ma I OUT 5.2 ma IN = IH or IL I OUT 20 µa C Unit IN = IH or IL I OUT 4.0 ma I OUT 5.2 ma IN = CC or GND ± ±1.0 ±1.0 µa Output in High- Impedance State IN = IL or IH OUT = CC or GND IN = CC or GND I OUT =0µA ±0.5 ±5.0 ±10 µa µa

4 AC ELECTRICAL CHARACTERISTICS(C L =50pF,Input t r =t f = ) CC Guaranteed Limit Symbol Parameter 25 C to -55 C 85 C f max t PLH, t PHL t PLH, t PHL t PLZ, t PHZ t PZL, t PZH Maximum Clock Frequency (50% Duty Cycle) (Figures 1 and 5) Maximum Propagation Delay, Clock to SQ H (Figures 1 and 5) Maximum Propagation Delay, Clock to Q A -Q H (Figures 2 and 5) Maximum Propagation Delay,Output Enable to Q A -Q H (Figures and 6) Maximum Propagation Delay,Output Enable to Q A -Q H (Figures and 6) C C IN Maximum Input Capacitance pf C OUT Maximum Three-State Output pf Capacitance (Output in High-Impedance State), Q A -Q H Power Dissipation Capacitance (Per C, CC =5.0 Package) C PD Used to determine the no-load dynamic power coumption: P D =C PD 2 CC f+i CC CC 00 pf TIMING REQUIREMENTS(C L =50pF,Input t r =t f = ) CC Guaranteed Limit Symbol Parameter 25 C to 85 C 125 C Unit -55 C t su Minimum Setup Time, Serial Data Input A to Clock (Figure 4) t h t w t r, t f Minimum Hold Time, Clock to Data Input A (Figure 4) Minimum Pulse Width, Strobe (Figure 1) Maximum Input Rise and Fall Times (Figure 1) Unit MHz 4

5 Figure 1. Switching Waveforms Figure 2. Switching Waveforms Figure. Switching Waveforms Figure 4. Switching Waveforms Figure 5. Test Circuit Figure 6. Test Circuit 5

6 EXPANDED LOGIC DIAGRAM 6

7 TIMING DIAGRAM 7

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