EMC / ESD Pulse Measurements Using Oscilloscopes September /16/$ IEEE

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1 EMC / ESD Pulse Measurements Using Oscilloscopes September /16/$ IEEE

2 Contents EMC Measurement Categories and Requirements ESD Pulse Test Requirements and Measurement Thresholds Sequenced Acquisition for EFT (Electrical Fast Transient) Debug Surge Testing MIL-STD-461G Voltage Testing Below Battery Level Sample Rate and V/div Effect on ESD Pulse Measurements Level-At-Pulse, Time-To-Value, and Parameter Limiters ESD RC Time Constant Measurement Radiated Immunity Testing

3 Quadrants of EMC/ESD Testing Radiated Emissions Will the EUT create emissions that interfere with the operation of other products? Radiated Immunity Will the EUT be susceptible to emissions from other devices, either through the air or via cables? EUT = Equipment Under Test Conducted Emissions How much noise voltage is injected back into the mains by the EUT? Conducted Immunity Will the EUT be susceptible to transients generated by switching of capacitive or inductive components? Oscilloscopes are used for: Radiated Immunity Conducted Immunity Conducted Immunity Pulsed EMI tests include: ESD (Electrostatic Discharge) EFT (Electrical Fast Transient) Surge Testing

4 ESD Pulse Test Requirements

Conducted Immunity General Test Requirements Generate a Burst, Surge, or ESD pulse Verify the pulse shape from the generator using an oscilloscope, verifying parameters such as: Rise

unit still transmits proper messages Telecom board serial data messages are uncorrupted Consumer electronics item still functions ESD Standards examples: IEC 61000-4, EN 61000-4, ITU,

5 Conducted Immunity General Test Requirements Generate a Burst, Surge, or ESD pulse Verify the pulse shape from the generator using an oscilloscope, verifying parameters such as: Rise Time Fall Time Pulse Width Frequency Pulse Repetition interval Burst Repetition interval Ensure that the DUT still operates correctly during test, for example: Automotive engine control unit still transmits proper messages Telecom board serial data messages are uncorrupted Consumer electronics item still functions ESD Standards examples: IEC , EN , ITU, UL, FCC, Telcordia, ANSI, Bellcore, ISO10605:2001, ISO10605:2008, MIL-STD-461G, proprietary military, proprietary automotive, etc. The majority of Immunity Testing follows the IEC (CE Mark)

6 Diagram of ESD calibration using scope

7 ESD Testing Electrostatic Discharge Measurement Steps Typical Pulse Characteristics T rise = 0.7 to 1.0 ns T fall = 0.7 to 1.0 ns Measurement Needs Capture a Single Pulse Measure one pulse, verify rise time for positive pulses, verify fall time for negative pulses 1 GHz, 2 GHz, or 4 GHz+ scope depending on standard specification How is risetime measured on this ESD pulse? 10%-90% risetime measurement first requires the determination of 0% and 100% levels.

8 Pulse Measurement Definitions

9 IEEE Standard Pulse Definitions How Oscilloscopes Measure Pulse Parameters Oscilloscopes determine pulse parameters from Top and Base values

10 IEEE Pulse Definitions How Pulse Measurements Are Determined Pulse measurement definitions are defined by the IEEE Std "IEEE standard on transitions, pulses, and related waveforms" Oscilloscopes conform to the IEEE pulse measurement definitions, and Top and Base are determined statistically based on the two modes of a voltage level histogram. Top and Base form the 100% and 0% reference levels which are used for measurements such as amplitude, risetime, falltime, period, frequency, width, duty cycle, overshoot, and virtually every timing measurement. Top and Base must first be calculated correctly in order for timing and amplitude measurements to produce the correct measurement result.

11 Clock Top and Base are correctly determined from a voltage histogram Top Clock pulses with clearly delineated Top and Base Two main modes emerge from the voltage level histogram, identifying the steady state values of Top and Base Base

12 Top and Base are not meaningful for ESD pulse measurements What happens when standard pulse parameters are applied to an ESD waveform? Top ESD pulse A voltage level histogram of this ESD pulse does not result in the identification of two main modes. Standard pulse parameters will not yield correct results in this case. Base

13 ESD Top and Base are not meaningful for pulse measurements With Top (100%) and Base (0%) identified in the following locations, the 10%-90% risetime measurement will only encompass a very small portion of the total ESD pulse rising edge Top Base

14 ESD Pulse Rise Time Definitions Require 0% and Max Different than IEEE pulse definitions, EMC pulse definitions (for example the IEC standard) use 0% and Max, instead of Top and Base to calculate 10%-90% risetime An oscilloscope must use 0% and Max thresholds in order to perform the EMC-specific measurement EMC pulse measurements now require the use of thresholds set to 0% and Max (where Max is the peak voltage level of the waveform), instead of Top and Base, to meet the measurement specification. Modern oscilloscopes have begun to allow for EMC pulse parameter measurements using threshold settings of peak-to-peak, 0% to Max, and 0% to Min along with the standard absolute or percent levels.

15 Risetime calculated using standard IEEE pulse parameter definitions Risetime is incorrectly calculated as 494 picoseconds on this ESD pulse. Note the risetime detailed marker location.

16 Risetime calculated using EMC thresholds Max 0% Risetime is correctly calculated as 854 picoseconds on this ESD pulse

17 Effect of thresholds on the Width measurement of this ESD pulse

18 Effect of thresholds on the Width measurement of this ESD pulse

19 Standard and EMC thresholds for ESD pulse width The pulse width and risetime are measured, both with and without EMC thresholds applied. In parameter 1 (P1), the thresholds are set to 0% - Max, and the pulse width is measured correctly as nanoseconds. In parameter 2 (P2), the thresholds are set to the standard scope threshold of 50% of Top and Base. In this case, the measurement is incorrectly reported as nanoseconds -- an error of 2287%. The width measurement was impacted so significantly, that the 50% threshold between Top and Base actually produced a width measurement on the wrong pulse shape. Parameter 3 (P3) is set to the correct EMC threshold of 0% to Max, producing a correct electrostatic pulse risetime measurement of 833 picoseconds. Notice that in parameter 4 (P4), the standard risetime is incorrectly reported as 873 picoseconds. When using standard pulse parameter measurements, erroneous values can be obtained. Use of standard pulse thresholds produced a 2287% measurement error on this ESD pulse. Note the threshold indicated in the width@level parameter marker for each.

20 EMC Level-At-Pulse, Time-To-Value, Parameter Limiting

21 EMC Level-At-Pulse Parameter

22 EMC Level-At-Pulse Parameter

23 EMC Level-At-Pulse Parameter

24 EMC Time-To-Half Value Parameter

25 Parameter limiting technique for ESD width measurement Because EMC pulses often have pulse perturbations on the falling edge of the pulse, these can result in false measurement readings when using standard parameters. For example, if the falling edge had ringing oscillations which repeatedly crossed the threshold, then multiple false width readings would be possible. For this reason, a measurement filtering capability which can limit the number of pulses the scope measures in an acquisition is needed. This measurement filtering capability, now available on modern scopes, allows for pulse-like perturbations on the falling edge of a pulse to be ignored and excluded from the measurement results. Parameter statistics could be accumulated on the first pulse in conjunction with parameter limiting subsequent perturbations.

26 A Parameter Limiter Is Needed To Avoid Measuring The Bounce Areas As Widths

27 Parameter Limiter Isolates Correct Width

28 ESD Verification Test Setup Example

shunt target output double shielded cable leads to 6 db attenuators

29 Verification Of The Output Characteristics Of The Test Pulse Generator current shunt target 20 db attenuator connects to current shunt target output double shielded cable leads to 6 db attenuators on input of scope Teledyne LeCroy in cooperation with Hitachi Automotive Systems

30 Verification Of The Output Characteristics Of The Test Pulse Generator Teledyne LeCroy in cooperation with Hitachi Automotive Systems

31 Verification Of The Output Characteristics Of The Test Pulse Generator Teledyne LeCroy in cooperation with Hitachi Automotive Systems

32 Using 0% - Max Thresholds for ESD Rise Time Measurement Teledyne LeCroy in cooperation with Hitachi Automotive Systems

33 Calculating ESD Pulse Maximum (first peak current) Teledyne LeCroy in cooperation with Hitachi Automotive Systems

34 Voltage level calculation at 400 ns delay after 50% incident pulse level (current at t 1 ) Teledyne LeCroy in cooperation with Hitachi Automotive Systems

35 Voltage level calculation at 800 ns delay after 50% incident pulse level (current at t 2 ) Teledyne LeCroy in cooperation with Hitachi Automotive Systems

36 ESD pulse parameters of rise time, first peak current, and currents at t 1 and t 2 First peak current Rise time Current at t 1 Current at t 2 Teledyne LeCroy in cooperation with Hitachi Automotive Systems

37 Sample Rate's Impact On Rise Time For ESD Pulse Measurements

Effect of Sample Rate On ESD Rise Time Measurements ESD pulse sampled at 40 GS/s Approximately 50 sample points on rising edge ESD pulse sampled at 4 GS/s Approximately 5-6 sample points on

38 Effect of Sample Rate On ESD Rise Time Measurements ESD pulse sampled at 40 GS/s Approximately 50 sample points on rising edge ESD pulse sampled at 4 GS/s Approximately 5-6 sample points on rising edge ESD pulse sampled at 2 GS/s Not enough sample points to correctly characterize rising edge ESD pulse sampled at 1 GS/s Not enough sample points to correctly characterize rising edge

(3% measurement error) ESD pulse sampled at 2 GS/s Measured rise time: 1.

39 Effect of Sample Rate On ESD Rise Time Measurements ESD pulse sampled at 40 GS/s Measured rise time: 839 ps ESD pulse sampled at 4 GS/s Measured rise time: 865 ps (3% measurement error) ESD pulse sampled at 2 GS/s Measured rise time: ns ESD pulse sampled at 1 GS/s Measured rise time < 1.54 ns, and measurement warning is reported

40 Sample Rate Goal for ESD Pulses: Rule Of Thumb: Acquire At Least 10 Sample Points On The Rising Edge 50 sample pts on rising edge 10 sample pts on rising edge Measured risetime result is within one half of one percent (measurement result is within 0.5% of 839 ps)

41 Measurement Method Background: Sparse Math Operator Was Used To Isolate Sample Rate Effect On Same Input Waveform

42 Measurement Method Background: Sparse Math Operator Was Used To Isolate Sample Rate Effect On Same Input Waveform

43 Measurement Method Background: Sparse Math Operator Was Used To Isolate Sample Rate Effect On Same Input Waveform

44 Dynamic Range and Signal Integrity For ESD Pulse Measurements

45 Dynamic Range and Signal Integrity For ESD Pulse Measurements This Concept Holds True for All Digitizing Real Time Scopes 8 vertical bits (256 ADC levels) available at full scale or 12 vertical bits (4096 ADC levels) available at full scale

46 Dynamic Range and Signal Integrity For ESD Pulse Measurements This Concept Holds True for All Digitizing Real Time Scopes 7 vertical bits (128 ADC levels) available at full scale or 11 vertical bits (2048 ADC levels) available at full scale

47 Dynamic Range and Signal Integrity For ESD Pulse Measurements This Concept Holds True for All Digitizing Real Time Scopes 6 vertical bits (64 ADC levels) available at full scale or 10 vertical bits (1024 ADC levels) available at full scale

48 Scope Block Diagram Shows Why Maximizing Waveforms In Grid Maximizes Measurement Accuracy This Concept Holds True for All Digitizing Real Time Scopes

49 Surge Testing

50 Surge Testing General Test Requirements Pulse Characteristics T rise = typically 1.2 to 10 ms T fall = typically 20 to 10,000ms Measurement Needs Rise time Pulse Width Maximum Area Charge

A Surge pulse also does not have a clearly-defined Top and Base The pulse characteristics of a surge pulse also do not conform to the IEEE pulse parameter definitions, because the surge does not have

51 A Surge pulse also does not have a clearly-defined Top and Base The pulse characteristics of a surge pulse also do not conform to the IEEE pulse parameter definitions, because the surge does not have high and low steady-state values. After a fast linear rise to a sharp peak, the waveform then exponentially decays toward, but does not quickly reach, an asymptote. With no steady-state values, the surge will produce indeterminate Top and Base values. Because Top and Base must be determined in order to calculate the thresholds used for risetime, falltime, and pulse width, the measurements therefore become invalid when using traditional oscilloscope clock pulse parameters.

52 Hardware Configuration for Surge Verification Teledyne LeCroy in cooperation with Hitachi Automotive Systems

53 Hardware Configuration for Surge Verification Teledyne LeCroy in cooperation with Hitachi Automotive Systems

54 Surge Verification Measurements Including Rise Time, Pulse Width, Maximum, Area, and Charge Teledyne LeCroy in cooperation with Hitachi Automotive Systems

55 Application example: The ISO10605:2008 standard requires the measurement of 10 consecutive parameter values

56 ISO10605:2008 pulse measurement statistics of 10 consecutive acquisitions Teledyne LeCroy in cooperation with Hitachi Automotive Systems

57 Histogram statistical distribution of 10 consecutive acquisitions Teledyne LeCroy in cooperation with Hitachi Automotive Systems

58 Application example: The ISO10605:2001(E) standard (pg 13) requires the measurement of the RC time constant value of the decay of an air discharge ESD pulse. A location is referenced at a stable point on the waveform, then a second point is located at 37% voltage level of the first value. The time difference between the two points is calculated to determine the RC time constant of the decay time.

59 Hardware setup for RC time constant measurement Published: /16/$ IEEE

60 ISO10605:2001(E) RC time constant measurement Published: /16/$ IEEE

61 ISO10605:2001(E) RC time constant measurement Published: /16/$ IEEE

62 ISO10605:2001(E) RC time constant measurement script Published: /16/$ IEEE

63 Script used to measure the RC Time Constant Set app = CreateObject("LeCroy.XStreamDSO") ' ActiveX COM handle numsamples = InResult1.Samples ' number of sample points in acquisition scaleddata = InResult1.DataArray(True) ' waveform sample points array If (app.measure.p1.source1) <> "F4" Then ' if the source for P1 isn't F4 app.measure.p1.source1 = "F4" ' then set it to F4 app.measure.p1.source2 = "None" ' and set the other input to be blank End If ' Force F4 to be the input source for this script at all times trigpt = app.math.f4.out.result.horizontaloffset ' Determine the trigger point / horizontal offset sampleres = app.math.f4.out.result.horizontalperstep ' Determine the spacing between sample points horzunits = app.math.f4.out.result.horizontalunits ' Query for units (e.g. Seconds, etc.) vertunits = app.math.f4.out.result.verticalunits ' Query for units (e.g. Volts, etc.) x2_array_position = numsamples ' hardcoded value for X2 that placed it on the rightmost graticule on the screen x2_time_position = trigpt + (sampleres * x2_array_position) ' calculate the rightmost falling edge value in terms of time (rather than an array index) e_constant = value from ISO spec i = x2_array_position ' counter position x1_target_value = scaleddata(x2_array_position)/(e_constant) Do While (scaleddata(i) < x1_target_value) And (i > 1) i = i - 1 Loop x1_array_position = i x1_time_position = trigpt + (sampleres * x1_array_position) x1_vertical_position = scaleddata(x1_array_position) x2_vertical_position = scaleddata(x2_array_position) labelsposition = Cstr(x1_time_position) & "," & Cstr(x2_time_position) app.math.f4.viewlabels = True ' turn label display on app.math.f4.labelsposition = labelsposition ' set position of labels app.math.f4.labelstext = "X1" & "," & "X2" ' set text of labels OutResult.VerticalResolution = ' set fine resolution of measurement output (for example, picosecond timing resolution) OutResult.VerticalUnits = "S" ' set horizontal units of measurement to be the same as the horizontal units of the input waveform (e.g. seconds) OutResult.Value = x2_time_position - x1_time_position ' time constant is reported app.measure.p2.operator.value = (x2_vertical_position / x1_vertical_position) app.measure.p1.alias="rc Time Constant" app.measure.p2.alias="y1/y2 ratio" app.measure.p3.alias="y1/y2 percent" Published: /16/$ IEEE

64 Y1/Y2 ratio is computed with a pushed parameter constant value Published: /16/$ IEEE

65 Convert Y1/Y2 to Ratio in Percent Published: /16/$ IEEE

66 ISO10605:2001(E) RC time constant on inverted pulse Published: /16/$ IEEE

67 Trend Plot Shows Data Log of RC Time Constant Values Published: /16/$ IEEE

68 Application example: Voltages Referenced Below Battery Level

69 Battery Voltage Signal From Generator Teledyne LeCroy in cooperation with Hitachi Automotive Systems

70 Method 1 to characterize voltage level: Runt Trigger on individual pulses Teledyne LeCroy in cooperation with Hitachi Automotive Systems

71 Method 1 to characterize voltage level: Runt Trigger on individual pulses Teledyne LeCroy in cooperation with Hitachi Automotive Systems

72 Method 2 to characterize voltage level: Gated Mean Measurement Teledyne LeCroy in cooperation with Hitachi Automotive Systems

73 Method 2 to characterize voltage level: Gated Mean Measurement Teledyne LeCroy in cooperation with Hitachi Automotive Systems

74 Method 2 to characterize voltage level: Gated Mean Measurement Teledyne LeCroy in cooperation with Hitachi Automotive Systems

75 Method 2 to characterize voltage level: Gated Mean Measurement Teledyne LeCroy in cooperation with Hitachi Automotive Systems

76 Dropout and Interrupt Testing Method 1 Runt / Glitch Triggering Can Also Be Used To Capture Dropouts and Interrupts Monitor AC or DC voltage line with oscilloscope during EMC testing Verify that dropout or interrupt occurred, and that device under test was unaffected

77 Electrical Fast Transient (EFT) Testing

78 Transient Testing Pulse Characteristics Capacitive load dump Inductive kickback/spike (back EMF from motor turn off) Measurement Needs Capture Time longer the better: Relay bounce (ms to ms) Transient time ms (motor) ns (FET switch) Measure MHz transient 10s capture = 2Mpts at 100 MHz Sample Rate

79 EFT Testing Electrical Fast Transient Measurement Steps Pulse Characteristics T rise = 5ns T fall = 50ns Burst of many 5x50 pulses Measurement Needs Capture 2ms of burst Measure one pulse, verify shape (rise, fall, width) Measure burst frequency ( khz) Measure Capture time of burst packet (2ms) Measure burst packet rate (300ms)

80 EFT Testing Electrical Fast Transient Measurement Statistics All-instance measurements characterizes all 76 rise times and pulse widths in this EFT burst. EFT bursts can be batch processed to determine EFT pulse characteristics, burst frequency, and packet rate (shown next).

81 Maximizing Acquisition Memory for Events Event occupies 1% of acquisition time Empty space Empty space 100 ns/div

82 Maximizing Acquisition Memory for Events Acquisition time optimized for event 1 ns/div

83 Maximizing Acquisition Memory for Events Mosaic of events is acquired while optimizing acquisition memory, and displayed without empty spaces between events

Maximizing Acquisition Memory for Events Mosaic of events is acquired while optimizing acquisition memory, and displayed without empty spaces between

84 Maximizing Acquisition Memory for Events Mosaic of events is acquired while optimizing acquisition memory, and displayed without empty spaces between events Individual timestamps for each event listed with segment acquisition time and intersegment time. This will automatically measure the EFT burst packet rate.

85 EFT Testing Electrical Fast Transient Sequence Mode and Octal Grid Sequenced acquisition of 5 EFT bursts Zoom of EFT pulses Zoom of one EFT burst Zoom of EFT pulses Zoom of one EFT pulse Zoom of one EFT pulse Zoom of one EFT pulse FFT

86 Individual EFT Pulses Teledyne LeCroy in cooperation with Hitachi Automotive Systems

87 One EFT Burst - Acquired at 2.5 GS/s - note linear top of burst Teledyne LeCroy in cooperation with Hitachi Automotive Systems

88 One EFT Burst - Acquired at 125 MS/s - note amplitude distortion at top of burst Teledyne LeCroy in cooperation with Hitachi Automotive Systems

89 Comparison of one EFT burst captured at 1.25 GS/s and 125 MS/s 125 MS/s 2.5 GS/s Teledyne LeCroy in cooperation with Hitachi Automotive Systems

90 Effect of Sample Rate on EFT Pulse Capture Sampled at 100 MS/s vs GS/s 100 MS/s 2.5 GS/s Teledyne LeCroy in cooperation with Hitachi Automotive Systems

91 Frequency measurement parameter measures only values in the range between 9kHz and 11kHz Teledyne LeCroy in cooperation with Hitachi Automotive Systems

92 Negative width parameter calculates gap time with values in range Teledyne LeCroy in cooperation with Hitachi Automotive Systems

93 EFT Rise Time With 0-Max Thresholds Teledyne LeCroy in cooperation with Hitachi Automotive Systems

94 Note the difference between P2 Width (gap time) and P4 Width (EFT pulse width) Teledyne LeCroy in cooperation with Hitachi Automotive Systems

95 EFT Max, Area, and Energy Calculations Teledyne LeCroy in cooperation with Hitachi Automotive Systems

96 Electrical Fast Transient (EFT) Debugging Techniques Using Segmented Memory

97 20 EFT Bursts Captured Using Segmented Memory Teledyne LeCroy in cooperation with Hitachi Automotive Systems

98 Inter-burst EFT Timestamps Teledyne LeCroy in cooperation with Hitachi Automotive Systems

99 Inter-pulse EFT Timestamps: Individual EFT pulses in segmented memory Teledyne LeCroy in cooperation with Hitachi Automotive Systems

100 Overlay And Waterfall Of EFT Pulses Verifies Correct EFT Pulse Shape Characteristics Teledyne LeCroy in cooperation with Hitachi Automotive Systems

101 Segmented Overlay And Waterfall Of EFT Pulses Highlights Anomalies Reveals Possible Bad Contact Within The Transient Simulator Teledyne LeCroy in cooperation with Hitachi Automotive Systems

102 MIL-STD-461G Department of Defense Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment

MIL-STD-461G CS117 and CS118 are new with the G version of the standard specification Applicable to a wide variety of DoD systems CS117: Lightning strike testing CS118: ESD testing This requirement

103 MIL-STD-461G CS117 and CS118 are new with the G version of the standard specification Applicable to a wide variety of DoD systems CS117: Lightning strike testing CS118: ESD testing This requirement is applicable to all aircraft safety-critical equipment interconnecting cables, including complete power cables, and individual high side power leads. It is also applicable to non-safety critical equipment with interconnecting cables/electrical interfaces that are part of or connected to equipment performing safety critical functions. It may be applicable to aircraft equipment performing nonsafety critical functions when specified by the procuring activity. This requirement applies to surface ship equipment which is located above deck or has interconnecting cables which are routed above deck.

104 MIL-STD-461G CS116 damped sinusoid measurement

105 MIL-STD-461G EMC level-at-pulse and half life measurements

106 MIL-STD-461G multiple stroke and multiple burst lightning strike test

107 Surge Test example computing Rise Time, Pulse Width, Maximum, Area, and Charge

108 EMC - Radiated Immunity Testing

109 Radiated Immunity Testing - Real Time Functional Performance Evaluation Deviation detection of a device under test (DUT) during exposure to a disturbance Functional state of the DUT is output through non-conductive fiber optic cables Mechanical mode tuner Devices under test are exposed to electric fields high enough to effect operation of nonshielded equipment. Transmit and receive antennas generate a controlled electric field RF-hardened fiber optic transmitters Teledyne LeCroy in cooperation with Hitachi Automotive Systems

level, signal low level, frequency, duty cycle, and other criteria fit within tolerance

110 Outside the reverberant chamber, oscilloscope masks test for acceptance criteria Optical receiver and O/E converter 16 channels performing mask test criteria such as signal high level, signal low level, frequency, duty cycle, and other criteria fit within tolerance limits described in the test plan Teledyne LeCroy in cooperation with Hitachi Automotive Systems

111 Views from inside and outside of the reverberant chamber Teledyne LeCroy in cooperation with Hitachi Automotive Systems

112 Simulated ECU (Electronic Control Unit) outputs: Two PWM outputs, a driver actuator signal, and a CAN split signal Teledyne LeCroy in cooperation with Hitachi Automotive Systems

113 Mask testing ECU outputs: example with passing results Teledyne LeCroy in cooperation with Hitachi Automotive Systems

114 Mask testing ECU outputs exceeding the tolerance mask criteria Teledyne LeCroy in cooperation with Hitachi Automotive Systems

115 Special Thanks To: Special thanks to Hitachi Automotive Systems (an ISO accredited lab) for providing access to EMC test setups, equipment, expertise and insight. Teledyne LeCroy in cooperation with Hitachi Automotive Systems

116 Questions?

EMC Pulse Measurements

EMC Pulse Measurements and Custom Thresholding Presented to the Long Island/NY IEEE Electromagnetic Compatibility and Instrumentation & Measurement Societies - May 13, 2008 Surge ESD EFT Contents EMC measurement