-RESEARCH ARTICLE- The impact transconductance parameter and threshold voltage of MOSFET s in static characteristics of CMOS inverter
|
|
- Jocelyn Geraldine Beasley
- 5 years ago
- Views:
Transcription
1 NEScieces, 2017, 2 (3): RESEARCH ARTICLE- The imact trascoductace arameter ad threshold voltage of MOSFET s i static characteristics of CMOS iverter Milaim Zabeli 1, Nebi Caa 1, Myzafere Limai 1, Qamil Kabashi 1* 1 Faculty of Electrical ad Comuter Egieerig, Uiversity of Prishtia, Prishtia, Kosovo Abstract The objective of this aer is to research the imact of electrical ad hysical arameters that characterize the comlemetary MOSFET trasistors (NMOS ad PMOS trasistors) i the CMOS iverter for static mode of oeratio. I additio to this, the aer also aims at exlorig the directives that are to be followed durig the desig hase of the CMOS iverters that eable desigers to desig the CMOS iverters with the best ossible erformace, deedig o oeratio coditios. The CMOS iverter desiged with the best ossible features also eables the desigig of the CMOS logic circuits with the best ossible erformace, accordig to the oeratio coditios ad desigers requiremets. Keywords: CMOS iverter, threshold voltage, voltage critical value, oise margis, trascoductace arameter. Article history: Received 25 Setember 2017, Acceted 13 November 2017, Available olie 14 November 2017 Itroductio CMOS logic circuits rereset the family of logic circuits which are the most oular techology for the imlemetatio of digital circuits, or digital systems. The small dimesios, low ower of dissiatio ad ease of fabricatio eable extremely high levels of itegratio (or circuits acig desities) i digital systems (Ludager, Zeiali, Tohidi, Madse, & Moradi, 2016; Pal, 2015; Plummer, Deal, & Griffi, 2009; Zat, 2014; Salma & Friedma, 2012). By oise margis, CMOS techology is the domiat of all the IC techologies available for digital circuits desig. The fudametal circuit of CMOS logic circuit is the CMOS iverter. Electrical ad hysical arameters that characterize the comlemetary MOS trasistors (or * Corresodig Author: Qamil Kabashi, qamil.abashi@ui-r.edu
2 Natural ad Egieerig Scieces 136 comlemetary MOSFET trasistors) determie the behavior of CMOS iverter, as for static coditios of oeratio, as well as dyamic coditios of oeratio (Kag & Leblebici, 2016; Sedra & Smith, 2015; Caa, Zabeli, Limai, & Kabashi, 2010; Karl, et al., 2013). The CMOS iverter cosists of two comlemetary MOS trasistors (of a ehacemettye NMOS trasistor ad a ehacemet-tye PMOS trasistor, because the ehacemet-tye of MOSFETs have high erformace o deletio- tye of MOSFETs), itercoected as i Figure 1 (Kag & Leblebici, 2016; Taur & Nig, 2013). The NMOS trasistor is called ull-dow trasistor, while the PMOS trasistor is called ull-u trasistor (Rai & Latha, 2016). Comlemetary MOS trasistors i the CMOS iverter oerates i comlemetary mode deedig o voltage level alied to the iut termial (to the gates of MOS trasistors). I the CMOS iverter, the cotributio of both MOS trasistors is equal to the circuit oeratio characteristics, therefore both trasistors are cosidered as driver trasistors. By circuit toology for iut high voltage (high level), the NMOS trasistor drives (ulls dow) the outut ode while the PMOS trasistor acts as the load (oliear resistor), ad for iut low voltage (low level) the PMOS trasistor drives (ulls u) the outut ode while the NMOS acts as load (Kag & Leblebici, 2016; Sedra & Smith, 2015; Baer, 2010). It s very imortat that the CMOS iverter has the static ower of dissiatio early zero, whe the subthreshold coductios ad leaage currets are eglected (Sedra & Smith, 2015; Baer, 2010; Weste & Harris, 2011; Zhag, Huag, Zhag, Li, & Yoshihara, 2013; Uddi, Nordi, Reaz, & Bhuiya, 2013). Figure 1. The structure of the CMOS iverter which cotais two comlemetary ehacemet-tye MOS trasistors. The role of the comlemetary MOSFET (NMOS ad PMOS) trasistors arameters i characteristic roerties of the CMOS iverters The behavior of the CMOS iverter for static coditios of oeratio is described by the voltage trasfer characteristic (TC), ad for dyamic oeratio coditios is described by the time resose durig switchig coductios (Kag & Leblebici, 2016; Sedra & Smith, 2015). The tyical TC of the CMOS iverter is show as i Figure 2. I the CMOS iverter, the NMOS trasistor ad PMOS trasistor ca be treated as a switch which oerates i comlemetary mode (Baer, 2010). For costructio of the TC of the CMOS iverter, five differet combiatios of oeratio modes of the NMOS ad PMOS trasistors should be examied, which are the results of the various
3 Natural ad Egieerig Scieces 137 ratios of the iut voltage levels ad the outut voltage levels. Oeratio modes of comlemetary MOS trasistors withi articular regios of the TC are reseted i Table 1. The characteristic roerties that characterize the TC are some voltage critical values at the iut ad outut termial of the CMOS iverter, as: OH, OL, IL, IH, th (Kag & Leblebici, 2016; Sedra & Smith, 2015). Figure 2. The tyical TC of the CMOS iverter. Table 1. Oeratio modes of comlemetary MOS trasistors (NMOS ad PMOS trasistors) Regio i o NMOS PMOS A B C D E < to, IL th IH > (DD+to,) OH OH th OL OL cut-off saturatio saturatio liear liear Liear liear saturatio saturatio cut-off OH outut high voltage whe outut level is a logic 1 (high logic level), OL outut low voltage whe outut level is a logic 0 (low logic level), IL maximum iut voltage which ca be iterreted as logic 0, IH miimum iut voltage which ca be iterreted as logic 1. The voltage critical values at iut ad outut of the CMOS iverter are determied by usig combiatios of oeratio regios (oeratio modes) of the NMOS trasistor ad the PMOS trasistor, deedig o the level of the outut voltage values relative to the voltage values at the iut of the CMOS iverter.
4 Natural ad Egieerig Scieces 138 The critical value of outut voltage OH ca be calculated by usig the A regio of TC s, whe the NMOS trasistor oerates i the cut-off mode, while the PMOS trasistor oerates i the liear mode, ad after calculatio will have voltage level of: OH DD whe DD ower suly voltage (source voltage). (1) By usig the B regio of the TC, the defiitio for IL critical value (the smaller of the two iut voltage value at which the sloe of the TC becomes do/di= -1) ad the oeratio modes of comlemetary MOS trasistors accordig to Table 1 (the NMOS trasistor oerates i saturatio mode, while the PMOS trasistors oerates liear mode) it ca be obtaied the exressios for the critical iut voltage ad the critical outut voltage, as: whe o IL 2 o to, DD rto, 1 r (3) 2 2 ( i t 0, ) ( i DD t 0, ) r( i t 0, ) t0, the threshold voltage of the NMOS trasistor, t0, the threshold voltage of the PMOS trasistor, r the trascoductace arameters ratio of the NMOS ad the PMOS trasistors, i iut voltage. ( W / L) ' r (4) ' ( W / L) trascoductace arameter of the NMOS trasistor, tracoductace arameter of the PMOS trasistor, ' - rocess trascoductace arameter of the NMOS trasistor, - rocess trascoductace arameter of the PMOS trasistor, ' W chael width of the MOS trasistor, L chael legth of the MOS trasistor, whereas idexes ad idicate the NMOS ad PMOS trasistor. The body effect of NMOS ad PMOS trasistor is ot reset i the CMOS iverter, because SB of both trasistors is zero. This will have to be tae ito cosideratio i other tyes of MOS iverters, as i NMOS iverter, whe it will ifluece the threshold voltage of NMOS ad PMOS trasistors, as well as the TC shae of iverters. Also, by usig the defiitio for obtaiig the exressio for iut voltage critical value IH (the larger of the two iut voltage values at which the sloe of the TC becomes do/di = -1), ad by usig D regio i TC of CMOS iverter, ad oeratio modes of the NMOS, ad the PMOS trasistors accordig to Table 1, we ca obtai the exressios for the critical voltage value IH ad the outut voltage o, as: (2)
5 Natural ad Egieerig Scieces 139 IH o DD to, 1 r 2 o to, r 2 2 ( i t 0, ) ( i t 0, ) 1/ r( i DD t 0, ) (6) I the CMOS iverter, it is also imortat to cosider a electrical arameter which reresets the threshold voltage of the CMOS iverter th, which is calculated uder the coditio that o = i. For calculatio of the threshold voltage of CMOS iverter th, the C regio of TC is used, where both trasistors (NMOS ad PMOS devices) oerate i saturatio mode ad will have: 1 r to, DD to, r th (7) 1 1 The low outut critical voltage value OL is calculated usig the E regio of TC, whe the NMOS trasistor oerates i liear mode ad the PMOS trasistor oerates i cut-off mode, resultig i: (5) OL 0 (8) The critical iut ad outut voltage values are also determiative to the oise margis values which characterize CMOS iverter for two logic levels (NML ad NMH) i static coditio of oeratio (steady state). The oise margis for two logic levels are exressed as: NML = IL-OL (9) NMH = OH -IH (10) From the exressios of the iut voltage critical values (IL ad IH) ad the outut voltage critical values (OL, OH) achieved above, imact o these characteristic voltage values will have: the values of the ower suly voltage (source voltage), the values of the threshold voltage of the comlemetary MOS trasistors, as well as the values of trascoductace arameters which characterize the comlemetary MOS trasistors. Relayig o fabricatio rocesses advaces of MOS trasistors, it is ossible that electrical ad hysical arameters which characterize MOS trasistors ca be cotrolled durig fabricatio rocess (Ludager, Zeiali, Tohidi, Madse, & Moradi, 2016; Plummer, Deal, & Griffi, 2009; Kag & Leblebici, 2016). Therefore, we will examie the imact of these arameters o the articular magitudes that characterize the CMOS iverter ad based o them, ca be defied the routes which lead to the desig of the CMOS iverter with favorable erformace accordig to the oeratio coditios ad digital circuits based o CMOS logic (Ludager, Zeiali, Tohidi, Madse, & Moradi, 2016; Karl, et al., 2013; Uddi, Nordi, Reaz, & Bhuiya, 2013; Chag, Liu, Zhag, & Kog, 2016; Zeiali, Madse, Raghava, & Moradi, 2015).
6 Natural ad Egieerig Scieces 140 Results ad Discussio The deedece of the iut voltage critical value IL o the ratio of MOS trasistors tracoductace arameters for two differet values of the threshold voltage of NMOS driver trasistor, whe the value of the PMOS trasistor threshold voltage (PMOS ca be treated as a load) remais costat, is reseted i Figure 3. Figure 3. The deedece of iut voltage critical value IL o ratio of MOS trasistor trascoductace arameters (the ratio of NMOS trascoductace arameters o PMOS trascoductace arameters) r for two differet values of NMOS threshold voltage (t0,), whe threshold voltage of PMOS trasistor has a costat value of t0, = I Figure 4 is show the deedece of iut voltage critical value IL o the ratio of MOS trasistor trascoductace arameters for a case whe threshold voltage of PMOS trasistor has two differet values (arametric values), whereas the NMOS trasistor threshold voltage remais costat. Figure 4. The deedece of iut voltage critical value IL o the ratio of MOS trasistor trascoductace arameters r for two differet values of PMOS threshold voltage (t0,), whe threshold voltage of NMOS trasistor has costat value of t0, = 0.5.
7 Natural ad Egieerig Scieces 141 For low critical value of iut voltage IL, the outut voltage value is slightly smaller tha value of the voltage source, but also it deeds o dimesios of the MOS trasistors ad their threshold voltage values. The imact of MOS trascoductace arameters ratio o outut voltage value o, for some arametric values of comlemetary MOS trasistor threshold voltages, is show i Figure 5. Figure 5. Ifluece of MOS trasistor trascoductace arameters ratio (r) o outut voltage value o, whe the iut termial of CMOS iverter is biased by voltage i = IL, for several arametric values of comlemetary MOS trasistor threshold voltage. From the results reseted i Figures 3 ad 4 for the iut voltage critical value IL, we ote that as the higher the value of the trascoductace arameter ratio of comlemetary MOS trasistors is, the low critical value of iut voltage IL will decrease. For higher values of the NMOS threshold voltage, the iut voltage critical value IL, will shift to higher values. Also, for the higher value of the absolute value of PMOS trasistor threshold voltage, the iut voltage critical value IL will shift to the lower values. The results reseted i Figure 5 show that whe the MOS trascoductace arameters ratio have higher value, the outut voltage value o will have higher values, whe the iut termial is biased by i = IL (or by iut low voltage critical value). Also, the imact o outut voltage value o will have liewise the values of MOS trasistors threshold voltage, but this imact is less imortat comared to the ratio of MOS trasistors trascoductace arameters. However for lower values of the comlemetary MOS trascoductace arameters ratio, the imact of threshold voltage of comlemetary MOS trasistors will be more sigificat. The imact of the MOS trasistor trascoductace arameters ratio, the MOS trasistor threshold voltage values i iut voltage critical value IH (high critical value of iut voltage) are show i Figures 6 ad 7. Preseted results show that the higher value of MOS trasistors trascoductace arameters ratio r will decrease the high critical value of iut voltage IH. Whe the value of the threshold voltage of NMOS trasistor is decreased, the the high critical value of iut voltage IH will be decreased ad this decreasig will be more romiet for the higher value of the MOS trasistor trascoductae arameters ratio r. Also, whe the value of the threshold voltage of PMOS
8 Natural ad Egieerig Scieces 142 trasistor icreases by absolute value, the iut critical voltage values IH will decrease, esecially the imact will be more sigificat for the smaller values of MOS trasistors trascoductace arameters ratio. Figure 6. The deedece of the voltage critical value IH o MOS trasistors trascoductace arameters ratio r for two arametric values of NMOS trasistor threshold voltage, whe PMOS trasistor threshold voltage remais costat t0, = Figure 7. The deedece of voltage critical value IH o MOS trasistors trascoductace arameters ratio r for two arametric values of PMOS trasistor threshold voltage, whe NMOS trasistor threshold voltage remais costat t0, = 0.5. Preseted results show that the higher value of MOS trasistors trascoductace arameters ratio r will decrease the high critical value of iut voltage IH. Whe the value of the threshold voltage of NMOS trasistor is decreased, the the high critical value of iut voltage IH will be decreased ad this decreasig will be more romiet for the higher value of the MOS trasistor trascoductae arameters ratio r. Also, whe the value of the threshold voltage of PMOS trasistor icreases by absolute value, the iut critical voltage values IH will decrease, esecially the imact will be more sigificat for the smaller values of MOS trasistors trascoductace arameters ratio.
9 Natural ad Egieerig Scieces 143 The MOS trasistors trascoductace arameters ratio ad the values of the MOS trasistors threshold voltage will have imact o the CMOS iverter characteristic value which is called the CMOS threshold voltage value (or switchig threshold). I Figures 8 ad 9 is show the imact of the MOS trasistors trascoductace arameters ratio that costitute CMOS iverter o the CMOS iverter threshold voltage value th for several arametric values of comlemetary MOS trasistors threshold voltage (NMOS ad PMOS threshold voltage). Figure 8. The imact of the trascoductace arameters ratio (r) of MOS trasistors (NMOS ad PMOS) o value of the CMOS iverter threshold voltage (o value of CMOS iverter switchig threshold voltage) for two differet values of the NMOS threshold voltage, whe t0, = ad source voltage DD = 2.5. Based o the obtaied results, it is show that the higher value of MOS trascoductae arameters ratio is, the CMOS threshold voltage value will be decreased, resectively, it will be shifted towards the logical lower value. For higher values of the NMOS threshold voltage, the value of the CMOS threshold voltage th would icrease i value, esecially the imact will be more romiet for greater values of the trascoductace arameters ratio r ( > ). While whe the threshold voltage of the PMOS trasistor has a higher value by absolute value, the value of the CMOS threshold voltage th will be decreased, ad this decreasig will be more sigificat whe the trascoductace arameter ratio r has lower values ( < ).
10 Natural ad Egieerig Scieces 144 Figure 9. The imact of the trascoductace arameters ratio (r) of MOS trasistors (NMOS ad PMOS) o value of the CMOS iverter threshold voltage th (o value of CMOS iverter switchig threshold voltage) for two differet values of the PMOS threshold voltage, whe t0, = 0.5 ad DD = 2.5. The immuity of CMOS iverter o uwated sigals is exressed through the oise margis for both logical levels (for low level ad for high level). The arameters that characterize the comlemetary MOS trasistors i a CMOS iverter determie the oise margis level for both logical levels. The deedece of oise margis (NM) o the comlemetary MOS trasistors trascoductace arameters ratio, for several arametric values of MOS trasistors threshold voltages i both logic levels are show i Figures 10 ad 11. Figure 10. The deedece of the oise margis for low logic level NML o comlemetary MOS trasistors trascoductace arameters ratio r, for three cases of differet MOS trasistor threshold voltage (NMOS ad PMOS trasistors), whe DD = 2.5. The results i Figure 10 idicate that the higher values of the MOS trascoductace arameters ratio r, oise margi for the low level will be lower. For the lower value of the NMOS trasistor threshold voltage (t0,), the level of oise margis NML (oise margis for low level) will decrease, resultig i the sigificat reductio i the bad of higher values of the
11 Natural ad Egieerig Scieces 145 trascoductace arameter ratio r. Also, the smaller the PMOS trasistor threshold voltage value (t0, ) by absolute value, the level of oise margis NML will icrease, esecially i the rage of small values of the trascoductace arameters ratio r. Figure 11. The deedece of the oise margis for high logic level NMH o comlemetary MOS trasistors trascoductace arameters ratio r, for three cases of differet MOS trasistor threshold voltage (NMOS ad PMOS trasistors), whe DD = 2.5. The level of oise margis NMH (oise margis for high level) will icrease whe the MOS trascoductace arameter ratio is desiged to be higher, Figure 11. For smaller value of NMOS threshold voltage, the oise margi for high level NMH will icrease esecially i the rage of higher values of the trascoductace arameter r. While the lower value of PMOS threshold voltage by absolute value (t0,), the level of oise margis NMH will decrease, esecially with sigificat imact i the rage of low values of the trascoductae arameter ratio r. By matchig the values of comlemetary MOS trascoductace arameters ad values of their threshold voltage, the CMOS iverter ca be desiged with higher erformace, deedig o the requiremets of desiger that dictate oeratio coditios. For CMOS iverter with matched arameters as: = ad t0, = t0, will be achieved that the oise margi to be equal to both logic levels ad the value of the threshold voltage of the CMOS iverter will be half of voltage source th = DD/2. The CMOS iverter which ossesses these features is called symmetric iverter ad it must satisfy the coditio: symetric 1 Cox W / L W / L W W 2.5 Cox W / L W / L L L (11) ad although the MOS trasistors built by equal legth of chael defied by lithograhic rocess, it aears that: W 2. 5W ) (12)
12 Natural ad Egieerig Scieces 146 The behavior of CMOS iverter is described through the TC i DC mode of oeratios (steady state mode). The arameters that characterize the comlemetary MOS trasistors ifluece i the shae of the TC. At the desig hase of CMOS iverter, the requiremets of CMOS iverter behavior are reseted, so the tas of the desiger is to adjust the arameters of the NMOS ad PMOS trasistors as much as ossible, which eable the desig of the CMOS iverter with accetable erformace. The imact of NMOS ad PMOS trasistor arameters i shae of the TC is show i Figure 12. Figure 12. The imact of comlemetary MOS trasistors chael legth ratio (W/W) o TC shae, whe L = L, t0, = t0, = 0.5 ad DD = 2.5. From the TC shae reseted i Figure 12 we ca see the imact of the chael width (resectively the ratio of the trascoductace arameter r) i the shae of TC, resultig i dislacemet of the TC's left or right, deedig o the chaels widths ratio, ad reflectig i the characteristic values of TC's. Whe the value of NMOS trasistor threshold voltage icreases, ad the PMOS trasistor threshold voltage remais uchaged, the TC of CMOS iverter shall shift to the right from the lower value of the NMOS threshold voltage (t0.), which is reflected i the voltage critical values, Figure 13. Figure 13. The imact of the NMOS trasistor threshold voltage (t0,) o TC shae, whe PMOS trasistor threshold voltage is t0, = - 0.5, ad trasistors have idetical dimesios. I Figure 14 is show the imact of the PMOS trasistor threshold voltage value i TC shae of CMOS iverter whe the NMOS trasistor threshold voltage has a fixed value. Whe the PMOS
13 Natural ad Egieerig Scieces 147 trasistor threshold voltage has lower value by a absolute value, the the CMOS iverter TC will shift to the right from the larger value. Figure 14. The imact of PMOS trasistor threshold voltage (t0,) o CMOS iverter TC shae, whe NMOS trasistor threshold voltage value is t0, = 0.5, ad trasistors have idetical dimesios. Accordig to the shaes of TC of the CMOS iverter reseted i Figure the sloe of TC i articular regios is idicted. It s very imortat that the sloe of TC i regio amed by C is same i all cases, which differs for other tyes of MOS iverters. Coclusios If durig the desig hase of the CMOS iverter, the threshold voltage values of comlemetary MOS trasistors (with the threshold voltage of NMOS (t0,) ad PMOS trasistor (t0,)) ad the ratio of comlemetary MOS trasistors trascoductace arameters (the ratio betwee trascoductace arameters of NMOS trasistor () ad PMOS trasistor (), r = /) are cotrolled, or matched, the CMOS iverter ca be desiged with high erformace as for static coditios of oeratio, as well as for dyamic coditios of oeratios, deedig o the desiger requiremets ad oeratig coditios. As for the outut voltage critical values OL ad OH (or for high ad low logic level at outut), the trascoductace arameter ratio of the comlemetary CMOS trasistors (r) ad the comlemetary MOS trasistor threshold voltages (t0. ad t0,) do t have imact, but their values are determied by zero volt (groud voltage) ad source voltage value (DD). For the higher values of comlemetary MOS trasistors trascoductace arameters ratio (r), lower value of the NMOS trasistor threshold voltage (t0,) ad higher value by absolute value of the PMOS trasistor threshold voltage (t0.), the iut voltage critical value IL ad oise margi for low level NML will decrease. For the higher values of comlemetary MOS trasistors trascoductace arameters ratio (r), lower value of the NMOS trasistor threshold voltage (t0,) ad higher value by absolute value of the PMOS trasistor threshold voltage (t0.), the iut voltage critical value IH will decrease, whereas oise margi for high level NMH will icrease. As for the outut voltage value o whe i = IL, for the higher values of comlemetary MOS trasistors trascoductace arameters ratio (r), lower value of the NMOS trasistor threshold voltage (t0,) ad higher.
14 Natural ad Egieerig Scieces 148 Refereces Baer, R. J. (2010). CMOS Circuit Desig, Layout ad Simulatio (3rd ed.). New Jersey, USA: Joh Wiley & Sogs. Caa, N., Zabeli, M., Limai, M., & Kabashi, Q. (2010). Role of driver ad load trasistor (MOSFET) arameters o seudo-nmos logic desig. WSEAS Trasactios o Circuits ad Systems, 8, Chag, C. H., Liu, C. O., Zhag, L., & Kog, Z. H. (2016). Sizig of SRAM cell with voltage biasig techiques for reliability ehacemet of memory ad PUF fuctios. Joural of Low Power Electroics ad Alicatios, 6, Kag, S., & Leblebici, Y. (2016). CMOS Digital Itegrated Circuits (4th ed.). New Yor, USA: McGraw-Hill. Karl, E., Wag, Y., Ng, Y. G., Guo, Z., Hamzaogly, F., Meterelliyoz, M.,... Bohr, M. (2013). A 4.6 GHZ 162 Mb SRAM desig i 22 m tri-gate CMOS techology with itegrated, read ad write assist circuitry. IEEE Joural of Solid-State Circuits, 48, Ludager, K., Zeiali, B., Tohidi, M., Madse, J. K., & Moradi, F. (2016). Low ower desig for future wearable ad imlatable devices. Joural of Low Power Eletroics ad Alicatios, 6(4), Pal, A. (2015). Low-Power LSI Circuits ad Systems (NA ed.). New Delhi, Idia: Sriger. Plummer, J. D., Deal, M. D., & Griffi, P. B. (2009). Silico LSI Techology: Fudametals, Practise ad Modelig (NA ed.). New Delhi, Idia: Pearso Educatio. Rai, L.., & Latha, M. M. (2016). Pass trasistor-based ull-u/ull-dow isertio techique for leaage ower otimizatio i CMOS LSI circuits. Circuts, System, Sigal Processig, 35(11), Salma, E., & Friedma, E. G. (2012). High Performace Itegrated Circuits Desig (1st ed.). New Yor, USA: McGraw-Hill. Sedra, A., & Smith, K. C. (2015). Microelectroic Circuits (8th ed.). New Yor, USA: Oxford Uiversity Press. Taur, Y., & Nig, T. H. (2013). Fudametals of Moder LSI Devices (2d ed.). Cambridge, UK: Cambridge Uiversity Press. Uddi, M. J., Nordi, A. N., Reaz, M. B., & Bhuiya, M. A. (2013). A CMOS ower slitter for 2.45 GHz ISM bad RFID rider i 0.18 um CMOS techology. Tehici jesi, 20(1), Weste, N. H., & Harris, D. M. (2011). CMOS LSI Desig: A Circuits ad System Persective (4th ed.). Bosto, USA: Pearso Educatio. Zat, P.. (2014). Microchi Fabricatio: A Practical Guide to Semicoductor Processig (6th ed.). New Yor, USA: McGraw-Hill. Zeiali, B., Madse, J. K., Raghava, P., & Moradi, F. (2015). Sub-threshold SRAM desig i 14 m FiFET techology with imoved access time ad leaage ower. Proceedigs of the IEEE Comuter Society Aual Symosium o LSI, ( ). Motellier. Zhag, H., Huag, M., Zhag, Y., Li, X., & Yoshihara, T. (2013). A ao-ower switchedcaacitor voltage referece usig body effect i MOSFETs for alicatio i subthreshold LSI. Proceedigs of the IEEE Iteratioal Coferece of Electro Devices ad Solid- State Circuits (EDSSC), ( ). Hog Kog.
Impact of MOSFET s structure parameters on its overall performance depending to the mode operation
NTERNTONL JOURNL O CRCUTS, SYSTEMS ND SGNL PROCESSNG Volume 10, 2016 mpact of MOSET s structure parameters o its overall performace depedig to the mode operatio Milaim Zabeli, Nebi Caka, Myzafere Limai,
More informationECE 2201 PRELAB 4A MOSFET SWITCHING APPLICATIONS. Digital CMOS Logic Inverter
ECE 2201 PRELAB 4A MOSFET SWITCHING APPLICATIONS Digital CMOS Logic Iverter Had Aalysis P1. I the circuit of Fig. P41, estimate the roagatio delays t PLH ad t PHL usig the resistive switch model for each
More informationReplacing MOSFETs with Single Electron Transistors (SET) to Reduce Power Consumption of an Inverter Circuit
Vol:9, No:3, 015 Relacig MOSFETs with Sigle Electro Trasistors (SET) to Reduce Power Cosumtio of a Iverter Circuit Ahmed Shariful Alam, Abu Hea M. Mustafa Kamal, M. Abdul Rahma, M. Nasmus Sakib Kha Shabbir,
More informationPhysical Sciences For NET & SLET Exams Of UGC-CSIR. Part B and C. Volume-16. Contents
Physical cieces For NET & LET Exams Of UC-CIR Part B ad C Volume-16 Cotets VI. Electroics 1.5 Field Effect evices 1 2.1 Otoelectroic evices 51 2.2 Photo detector 63 2.3 Light-Emittig iode (LE) 73 3.1 Oeratioal
More informationNovel Low Voltage CMOS Current Controlled Floating Resistor Using Differential Pair
48 S. A. TEKİN, H. ERCAN, M. ALÇI, NOVEL LOW VOLTAGE CMOS CURRENT CONTROLLED FLOATING RESISTOR Novel Low Voltage CMOS Curret Cotrolled Floatig Resistor Usig Differetial Pair Sezai Aler TEKİN, Hamdi ERCAN,
More informationR. W. Erickson. Department of Electrical, Computer, and Energy Engineering University of Colorado, Boulder
R. W. Erickso Departmet of Electrical, Computer, ad Eergy Egieerig Uiversity of Colorado, Boulder 4.2.2. The Power MOSFET Gate Source Gate legths approachig oe micro p - p Cosists of may small ehacemetmode
More informationRevision: June 10, E Main Suite D Pullman, WA (509) Voice and Fax
1.8.0: Ideal Oeratioal Amlifiers Revisio: Jue 10, 2010 215 E Mai Suite D Pullma, WA 99163 (509) 334 6306 Voice ad Fax Overview Oeratioal amlifiers (commoly abbreviated as o-ams) are extremely useful electroic
More informationMCP1525/ V and 4.096V Voltage References. Features. Description. Applications. Temperature Drift. Typical Application Circuit.
MCP/.V ad.96v Voltage Refereces Features Precisio Voltage Referece Outut Voltages:.V ad.96v Iitial Accuracy: ±% (max.) Temerature Drift: ± m/ C (max.) Outut Curret Drive: ± ma Maximum Iut Curret: µa @
More informationIntroduction to Electronic Devices
troductio to lectroic Devices, Fall 2006, Dr. D. Ki troductio to lectroic Devices (ourse Number 300331) Fall 2006 s Dr. Dietmar Ki Assistat Professor of lectrical gieerig formatio: htt://www.faculty.iubreme.de/dki/
More information(2) The MOSFET. Review of. Learning Outcome. (Metal-Oxide-Semiconductor Field Effect Transistor) 2.0) Field Effect Transistor (FET)
EEEB73 Electroics Aalysis & esig II () Review of The MOSFET (Metal-Oxide-Semicoductor Field Effect Trasistor) Referece: Neame, Chapter 3 ad Chapter 4 Learig Outcome Able to describe ad use the followig:
More informationDESIGN AVOLTAGE REFERENCE CIRCUIT WITHOUT USING BIPOLAR TRANSISTORS
: 53-539 ISSN: 77 4998 DESIGN AOAGE REFERENCE CIRCUI IHOU USING BIPOAR RANSISORS EHSAN SHABANI, MAHDI PIRMORADIAN* : M Sc., Eslamshahr Brach, Islamic Azad Uiversity, ehra, Ira : Assistat Professor, Eslamshahr
More informationTHE AUTOMATED SYSTEM OF THE RHYTHM ANALYSIS IN THE EDUCATIONAL PROCESS OF A HIGHER EDUCATIONAL INSTITUTION ON THE BASIS OF APRIORISTIC DATA
THE AUTOMATED SYSTEM OF THE RHYTHM ANALYSIS IN THE EDUCATIONAL PROCESS OF A HIGHER EDUCATIONAL INSTITUTION ON THE ASIS OF APRIORISTIC DATA Nicolae PELIN PhD, Associate Professor, Iformatio Techology Deartmet,
More informationSuper J-MOS Low Power Loss Superjunction MOSFETs
Low Power Loss Superjuctio MOSFETs Takahiro Tamura Mutsumi Sawada Takayuki Shimato ABSTRACT Fuji Electric has developed superjuctio MOSFETs with a optimized surface desig that delivers lower switchig.
More informationLecture 29: Diode connected devices, mirrors, cascode connections. Context
Lecture 9: Diode coected devices, mirrors, cascode coectios Prof J. S. Smith Cotext Today we will be lookig at more sigle trasistor active circuits ad example problems, ad the startig multi-stage amplifiers
More information3. Error Correcting Codes
3. Error Correctig Codes Refereces V. Bhargava, Forward Error Correctio Schemes for Digital Commuicatios, IEEE Commuicatios Magazie, Vol 21 No1 11 19, Jauary 1983 Mischa Schwartz, Iformatio Trasmissio
More informationR. W. Erickson. Department of Electrical, Computer, and Energy Engineering University of Colorado, Boulder
R. W. Erickso Departmet of Electrical, Computer, ad Eergy Egieerig Uiversity of Colorado, Boulder Specific o-resistace R o as a fuctio of breakdow voltage V B Majority-carrier device: AARR #$ = kk μμ $
More informationSummary of pn-junction (Lec )
Lecture #12 OUTLNE iode aalysis ad applicatios cotiued The MOSFET The MOSFET as a cotrolled resistor Pich-off ad curret saturatio Chael-legth modulatio Velocity saturatio i a short-chael MOSFET Readig
More informationSurvey of Low Power Techniques for ROMs
Survey of Low Power Techiques for ROMs Edwi de Agel Crystal Semicoductor Corporatio P.O Box 17847 Austi, TX 78744 Earl E. Swartzlader, Jr. Departmet of Electrical ad Computer Egieerig Uiversity of Texas
More informationA New Space-Repetition Code Based on One Bit Feedback Compared to Alamouti Space-Time Code
Proceedigs of the 4th WSEAS It. Coferece o Electromagetics, Wireless ad Optical Commuicatios, Veice, Italy, November 0-, 006 107 A New Space-Repetitio Code Based o Oe Bit Feedback Compared to Alamouti
More informationDesign of FPGA Based SPWM Single Phase Inverter
Proceedigs of MUCEET2009 Malaysia Techical Uiversities Coferece o Egieerig ad Techology Jue 20-22, 2009, MS Garde,Kuata, Pahag, Malaysia MUCEET2009 Desig of FPGA Based SPWM Sigle Phase Iverter Afarulrazi
More informationOptimal P/N Width Ratio Selection for Standard Cell Libraries
Otimal P/N Width Ratio Selectio for Stadard Cell Libraries David S. Kug ad Ruchir Puri IBM T. J. Watso Research Ceter Yorktow Heights, NY 0598 ABSTRACT The effectiveess of logic sythesis to satisfy icreasigly
More informationA 5th order video band elliptic filter topology using OTRA based Fleischer Tow Biquad with MOS-C Realization
Natural ad Egieerig Scieces 44 olume 1, No. 2, 44-52, 2016 A 5th order video bad elliptic filter topology usig OTA based Fleischer Tow Biquad with MOS-C ealiatio Ahmet Gökçe 1*, Uğur Çam 2 1 Faculty of
More informationCDS 270-2: Lecture 6-3 Optimum Receiver Design for Estimation over Wireless Links
CDS 70-: Lecture 6-3 Otimum Receiver Desig for stimatio over Wireless Lis Goals: Yasami Mostofi May 5, 006 To uderstad imact of wireless commuicatio imairmets o estimatio over wireless To lear o-traditioal
More informationHigh-Order CCII-Based Mixed-Mode Universal Filter
High-Order CCII-Based Mixed-Mode Uiversal Filter Che-Nog Lee Departmet of Computer ad Commuicatio Egieerig, Taipei Chegshih Uiversity of Sciece ad Techology, Taipei, Taiwa, R. O. C. Abstract This paper
More informationDesign of FPGA- Based SPWM Single Phase Full-Bridge Inverter
Desig of FPGA- Based SPWM Sigle Phase Full-Bridge Iverter Afarulrazi Abu Bakar 1, *,Md Zarafi Ahmad 1 ad Farrah Salwai Abdullah 1 1 Faculty of Electrical ad Electroic Egieerig, UTHM *Email:afarul@uthm.edu.my
More informationDelta- Sigma Modulator with Signal Dependant Feedback Gain
Delta- Sigma Modulator with Sigal Depedat Feedback Gai K.Diwakar #1 ad V.Vioth Kumar *2 # Departmet of Electroics ad Commuicatio Egieerig * Departmet of Electroics ad Istrumetatio Egieerig Vel Tech Uiversity,Cheai,
More informationA new Power MOSFET Generation designed for Synchronous Rectification
A New Power MOSFET Geeratio desiged for Sychroous Rectificatio A ew Power MOSFET Geeratio desiged for Sychroous Rectificatio Keywords R. Siemieiec, C. Mößlacher, O. Blak, M. Rösch, M. Frak, M. Hutzler
More informationAnalysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment
Aalysis ad Desig of LVTSCR-based EOS/ESD Protectio Circuits for Bur-i Eviromet O. Semeov, H. Sarbishaei ad M. Sachdev Det. of Electrical ad Comuter Egieerig, Uiversity of Waterloo, Waterloo, Caada NL 3G
More informationChater 6 Bipolar Junction Transistor (BJT)
hater 6 iolar Juctio Trasistor (JT) Xiula heg/shirla heg -5- vetio asic about JT veted i 948 by ardee, rattai ad Shockley i ell ab (First Trasistor) iolar oth tyes of carriers (electro ad hole) lay imortat
More informationPerformance analysis of NAND and NOR logic using 14nm technology node
Iteratioal Joural of Pure ad Applied Mathematics Volume 118 No. 18 2018, 4053-4060 ISSN: 1311-8080 (prited versio); ISSN: 1314-3395 (o-lie versio) url: http://www.ijpam.eu ijpam.eu Performace aalysis of
More informationAppendix B: Transistors
Aedix B: Trasistors Of course, the trasistor is the most imortat semicoductor device ad has eabled essetially all of moder solid-state electroics. However, as a matter of history, electroics bega with
More informationLecture 28: MOSFET as an Amplifier. Small-Signal Equivalent Circuit Models.
hites, EE 320 ecture 28 Page 1 of 7 ecture 28: MOSFET as a Amplifier. Small-Sigal Equivalet Circuit Models. As with the BJT, we ca use MOSFETs as AC small-sigal amplifiers. A example is the so-called coceptual
More information5.1 Introduction 5.2 Equilibrium condition Contact potential Equilibrium Fermi level Space charge at a junction 5.
5.1 Itroductio 5.2 Equilibrium coditio 5.2.1 Cotact otetial 5.2.2 Equilibrium Fermi level 5.2.3 Sace charge at a juctio 5.3 Forward- ad Reverse-biased juctios; steady state coditios 5.3.1 Qualitative descritio
More informationSEVEN-LEVEL THREE PHASE CASCADED H-BRIDGE INVERTER WITH A SINGLE DC SOURCE
SEVEN-LEVEL THREE PHASE CASCADED H-BRIDGE INVERTER WITH A SINGLE DC SOURCE T. Porselvi 1 ad Ragaath Muthu 1 Sri Sairam Egieerig College, Cheai, Idia SSN College of Egieerig, Cheai, Idia E-Mail: tporselvi@yahoo.com
More informationDelta- Sigma Modulator based Discrete Data Multiplier with Digital Output
K.Diwakar et al. / Iteratioal Joural of Egieerig ad echology (IJE Delta- Sigma Mulator based Discrete Data Multiplier with Digital Output K.Diwakar #,.ioth Kumar *2, B.Aitha #3, K.Kalaiarasa #4 # Departmet
More informationData Acquisition System for Electric Vehicle s Driving Motor Test Bench Based on VC++ *
Available olie at www.sciecedirect.com Physics Procedia 33 (0 ) 75 73 0 Iteratioal Coferece o Medical Physics ad Biomedical Egieerig Data Acquisitio System for Electric Vehicle s Drivig Motor Test Bech
More informationELEC 350 Electronics I Fall 2014
ELEC 350 Electroics I Fall 04 Fial Exam Geeral Iformatio Rough breakdow of topic coverage: 0-5% JT fudametals ad regios of operatio 0-40% MOSFET fudametals biasig ad small-sigal modelig 0-5% iodes (p-juctio
More informationResearch Article New Topologies of Lossless Grounded Inductor Using OTRA
Joural of Electrical ad omuter Egieerig Volume 2, Article ID 753, 6 ages doi:.55/2/753 Research Article New Toologies of Lossless Grouded Iductor Usig OTRA Rajeshwari Padey, Neeta Padey, Sajal K. Paul,
More informationEstimation of an L-G Fault Distance of an Underground Cable Using WNN
Iteratioal Joural of Scietific ad esearch Publicatios, Volume, Issue, February ISSN 5-353 Estimatio of a L-G Fault Distace of a Udergroud Cable Usig WNN Biswariya Chatteree Deartmet of Electrical Egieerig,
More informationPerformances Evaluation of Reflectarray Antenna using Different Unit Cell Structures at 12GHz
Idia Joural of Sciece ad Techology, Vol 9(46), DOI: 1.17485/ijst/216/v9i46/17146, December 216 ISSN (Prit) : 974-6846 ISSN (Olie) : 974-5645 Performaces Evaluatio of Reflectarray Atea usig Differet Uit
More informationECE 902. Modeling and Optimization of VLSI Interconnects
ECE 90 Modelig ad Optimizatio of VLSI Itercoects (http://eda.ece.wisc.edu/ece90.html Istructor: Lei He Email: he@ece.wisc.edu Office: EH343 Telephoe: 6-3736 Office hour: TR :30-3pm Course Prerequisites
More informationAfter completing this chapter you will learn
CHAPTER 7 Trasistor Amplifiers Microelectroic Circuits, Seeth Editio Sedra/Smith Copyright 015 by Oxford Uiersity Press After completig this chapter you will lear 1. How to use MOSFET as amplifier. How
More informationPerformance Comparison of PI and P Compensation in DSP-Based Average-Current-Controlled Three-Phase Six-Switch Boost PFC Rectifier
This article has bee acceted for ublicatio i a future issue of this joural, but has ot bee fully edited. Cotet may chage rior to fial ublicatio. Citatio iformatio: DOI.9/TEL..38964, IEEE Trasactios o ower
More information6.004 Computation Structures Spring 2009
MIT OeourseWare htt://ocw.mit.edu 6.4 omutatio tructures rig 29 For iformatio about citig these materials or our Terms of Use, visit: htt://ocw.mit.edu/terms. MO Techology ombiatioal evice Wish List NEXT
More informationLecture 3. OUTLINE PN Junction Diodes (cont d) Electrostatics (cont d) I-V characteristics Reverse breakdown Small-signal model
Lecture 3 AOUCEMETS HW2 is osted, due Tu 9/11 TAs will hold their office hours i 197 Cory Prof. Liu s office hours are chaged to TuTh 12-1PM i 212/567 Cory EE15 accouts ca access EECS Widows Remote eskto
More informationp n junction! Junction diode consisting of! p-doped silicon! n-doped silicon! A p-n junction where the p- and n-material meet!
juctio! Juctio diode cosistig of! -doed silico! -doed silico! A - juctio where the - ad -material meet! v material cotais mobile holes! juctio! material cotais mobile electros! 1! Formatio of deletio regio"
More informationEXPERIMENT 3 TRANSISTORS AMPLIFIERS
PH-315 XPRIMNT 3 TRANSISTORS AMPLIFIRS A. La Rosa I. PURPOS To familiarize with the characteristics of trasistors, how to roerly imlemet its D bias, ad illustrate its alicatio as small sigal amlifiers.
More informationIntroduction to CMOS. Dr. Lynn Fuller
MICROELECTRONIC ENINEERIN ROCHETER INTITUTE OF TECHNOLOY Itroductio to CMO Dr. Ly Fuller Webage: htt://eole.rit.edu/lffeee 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585) 475-2035 Fax (585) 475-5041
More informationTehrani N Journal of Scientific and Engineering Research, 2018, 5(7):1-7
Available olie www.jsaer.com, 2018, 5(7):1-7 Research Article ISSN: 2394-2630 CODEN(USA): JSERBR 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38
More informationA New Design of Log-Periodic Dipole Array (LPDA) Antenna
Joural of Commuicatio Egieerig, Vol., No., Ja.-Jue 0 67 A New Desig of Log-Periodic Dipole Array (LPDA) Atea Javad Ghalibafa, Seyed Mohammad Hashemi, ad Seyed Hassa Sedighy Departmet of Electrical Egieerig,
More informationRadar emitter recognition method based on AdaBoost and decision tree Tang Xiaojing1, a, Chen Weigao1 and Zhu Weigang1 1
Advaces i Egieerig Research, volume 8 d Iteratioal Coferece o Automatio, Mechaical Cotrol ad Computatioal Egieerig (AMCCE 7) Radar emitter recogitio method based o AdaBoost ad decisio tree Tag Xiaojig,
More informationA Fast-Processing Modulation Strategy for Three-Phase Four-Leg Neutral-Point- Clamped Inverter Based on the Circuit-Level Decoupling Concept
Dowloaded from orbit.dtu.dk o: Aug 22, 2018 A Fast-Processig Modulatio Strategy for Three-Phase Four-Leg Neutral-Poit- Clamed Iverter Based o the Circuit-Level Decoulig Cocet Ghoreishy, Hoda; Zhag, Zhe;
More informationThe Parametric Measurement Handbook. Third Edition March 2012
The Parametric Measuremet Hadbook Third Editio March 2012 Chater 7: Diode ad Trasistor Measuremet Choose a job you love, ad you will ever have to work a day i your life Cofucius Itroductio It is ot the
More informationISSN (Print) Research Article. *Corresponding author Oleksandr V. Lemeshko
Scholars Joural of Egieerig ad Techology (SJET) Sch. J. Eg. Tech., 06; 4(4):69-74 Scholars Academic ad Scietific Publisher (A Iteratioal Publisher for Academic ad Scietific Resources) www.sasublisher.com
More informationAN ESTIMATION OF MULTILEVEL INVERTER FED INDUCTION MOTOR DRIVE
9 IJRIC. All rights reserved. IJRIC www.ijric.org E-ISSN: 76-3336 AN ESTIMATION OF MULTILEVEL INVERTER FED INDUCTION MOTOR DRIVE K.RAMANI AND DR.A. KRISHNAN SMIEEE Seior Lecturer i the Departmet of EEE
More informationApplication of Improved Genetic Algorithm to Two-side Assembly Line Balancing
206 3 rd Iteratioal Coferece o Mechaical, Idustrial, ad Maufacturig Egieerig (MIME 206) ISBN: 978--60595-33-7 Applicatio of Improved Geetic Algorithm to Two-side Assembly Lie Balacig Ximi Zhag, Qia Wag,
More informationINCREASE OF STRAIN GAGE OUTPUT VOLTAGE SIGNALS ACCURACY USING VIRTUAL INSTRUMENT WITH HARMONIC EXCITATION
XIX IMEKO World Cogress Fudametal ad Applied Metrology September 6, 9, Lisbo, Portugal INCREASE OF STRAIN GAGE OUTPUT VOLTAGE SIGNALS ACCURACY USING VIRTUAL INSTRUMENT WITH HARMONIC EXCITATION Dalibor
More informationOutline. Introduction The Semiconductor Module Demonstration Modeling Advice Model Library Q & A
Semicoductor Module Coyright 2013 COMSOL. COMSOL, COMSOL Multihysics, Cature the Cocet, COMSOL Deskto, ad LiveLik are either registered trademarks or trademarks of COMSOL AB. All other trademarks are the
More informationLab 2: Common Source Amplifier.
epartet of Electrical ad Coputer Egieerig Fall 1 Lab : Coo Source plifier. 1. OBJECTIVES Study ad characterize Coo Source aplifier: Bias CS ap usig MOSFET curret irror; Measure gai of CS ap with resistive
More informationLoad Current Adaptive Control of a Monolithic CMOS DC/DC Converter for Dynamic Power Management
oad Curret Adatie Cotrol of a Moolithic CMOS DC/DC Coerter for Damic Power Maagemet ei-chi Su ad Yig-Yu Tzou, Member, IEEE Power Electroics Sstems & Chis ab., Adace Power Electroics Ceter, Deartmet of
More informationA New Basic Unit for Cascaded Multilevel Inverters with the Capability of Reducing the Number of Switches
Joural of Power Electroics, ol, o, pp 67-677, July 67 JPE --6 http://dxdoiorg/6/jpe67 I(Prit: 98-9 / I(Olie: 9-78 A ew Basic Uit for Cascaded Multi Iverters with the Capability of Reducig the umber of
More informationAnalysis and Optimization Design of Snubber Cricuit for Isolated DC-DC Converters in DC Power Grid
Aalysis ad Optimizatio Desig of Subber Cricuit for Isolated DC-DC Coverters i DC Power Grid Koji Orikawa Nagaoka Uiversity of Techology Nagaoka, Japa orikawa@st.agaokaut.ac.jp Ju-ichi Itoh Nagaoka Uiversity
More informationICM7213. One Second/One Minute Timebase Generator. Features. Description. Ordering Information. Pinout. August 1997
August 997 Features Guarateed V Operatio Very Low Curret Cosumptio (Typ).... µa at V All Outputs TTL Compatible O Chip Oscillator Feedback Resistor Oscillator Requires Oly Exteral compoets: Fixed Capacitor,
More informationThe Firing Dispersion of Bullet Test Sample Analysis
Iteratioal Joural of Materials, Mechaics ad Maufacturig, Vol., No., Ma 5 The Firig Dispersio of Bullet Test Sample Aalsis Youliag Xu, Jubi Zhag, Li Ma, ad Yoghai Sha Udisputed, this approach does reduce
More informationECE5461: Low Power SoC Design. Tae Hee Han: Semiconductor Systems Engineering Sungkyunkwan University
ECE5461: Low Power SoC Desig Tae Hee Ha: tha@skku.edu Semicoductor Systems Egieerig Sugkyukwa Uiversity Low Power SRAM Issue 2 Role of Memory i ICs Memory is very importat Focus i this lecture is embedded
More information1 Basics. a) Extended IGBT gate charge characteristic for gate control between V GG+ and V GGb) IGBT low-signal capacitances V GE [V] >V CE1 V CE2
V GE [V] V CE2 >V CE1 V GG+ 15 t 3 (V CE2 ) t 1 t 2 t 3 (V CE1 ) t 4 (V CE1 ) V CE1 V CE2 t 4 (V CE2 ) V GE(th) Q G- 0 Q G1 Q G2 250 Q G3 500 Q Gtot Q G [C] a) V GG- b) Figure 1.13 a) Exteded IGBT gate
More informationA 1.2V High Band-Width Analog Multiplier in 0.18µm CMOS Technology
Iteratioal Review of Electrical Egieerig (I.R.E.E.), Vol. 5, N. March-pril 00.V High Bad-Width alog Multiplier i 0.8µm CMOS Techology mir Ebrahimi, Hossei Miar Naimi bstract alog multiplier is a importat
More informationDesign of Double Gate Vertical MOSFET using Silicon On Insulator (SOI) Technology
Iteratioal Joural of Nao Devices, Sesors ad Systems (IJ-Nao) Volume 1, No. 1, May 2012, pp. 34-38 Desig of Double Gate Vertical MOSFET usig lico O Isulator () Techology Jatmiko E. Suseo 1,2* ad Razali
More informationNetwork reliability analysis for 3G cellular topology design
Soglaaari J. Sci. Techol. 3 (3, 63-69, May - Ju. 00 Origial Article Networ reliability aalysis for 3G cellular toology desig Chutima Promma* ad Ealu Esoo School of Telecommuicatio Egieerig Suraaree Uiversity
More informationCFAR DETECTION IN MIMO RADARS USING FUZZY FUSION RULES IN HOMOGENEOUS BACKGROUND
CFAR DETECTION IN MIMO RADARS USING FUZZY FUSION RULES IN HOMOGENEOUS BACKGROUND Faycal Khaldi 1 ad Faouzi Soltai 2 1,2 Départemet d électroique, Uiversité des Frères Metouri Costatie Costatie 25, Algeria
More informationComparison of Frequency Offset Estimation Methods for OFDM Burst Transmission in the Selective Fading Channels
Compariso of Frequecy Offset Estimatio Methods for OFDM Burst Trasmissio i the Selective Fadig Chaels Zbigiew Długaszewski Istitute of Electroics ad Telecommuicatios Pozań Uiversity of Techology 60-965
More informationEnhanced LUT For Modified Distributed Arithematic Architecture - FIR Filter
N Vivek et al It. Joural of Egieerig Research ad Alics RESEARCH ARTICLE OPEN ACCESS Ehaced LT For Modified Distributed Arithematic Architecture - FIR Filter N Vivek*, Prof K Ausudha** *(Deartmet of Electroics
More informationApplying MOSFETs in Amplifier Design. Microelectronic Circuits, 7 th Edition Sedra/Smith Copyright 2010 by Oxford University Press, Inc.
Applyig MOSFETs i Aplifier esig Microelectroic Circuits, 7 th Editio Sedra/Sith Copyright 010 by Oxford Uiersity Press, Ic. oltage Trasfer Characteristics (TC) i 1 k ( GS t ) S i R Microelectroic Circuits,
More informationCompound Controller for DC Motor Servo System Based on Inner-Loop Extended State Observer
BULGARIAN ACADEMY OF SCIENCES CYBERNETICS AND INFORMATION TECHNOLOGIES Volume 6, No 5 Special Issue o Applicatio of Advaced Computig ad Simulatio i Iformatio Systems Sofia 06 Prit ISSN: 3-970; Olie ISSN:
More informationA GHz Constant KVCO Low Phase Noise LC-VCO and an Optimized Automatic Frequency Calibrator Applied in PLL Frequency Synthesizer
A 4.6-5.6 GHz Costat KVCO Low Phase Noise LC-VCO ad a Optimized Automatic Frequecy Calibrator Applied i PLL Frequecy Sythesizer Hogguag Zhag, Pa Xue, Zhiliag Hog State Key Laboratory of ASIC & System Fuda
More informationThe Silicon Controlled Rectifier (SCR)
The Silico Cotrolled Rectifier (SCR The Silico Cotrolled Rectifier, also called Thyristor, is oe of the oldest power devices, ad it is actually employed as power switch for the largest currets (several
More informationMeasurement of Equivalent Input Distortion AN 20
Measuremet of Equivalet Iput Distortio AN 2 Applicatio Note to the R&D SYSTEM Traditioal measuremets of harmoic distortio performed o loudspeakers reveal ot oly the symptoms of the oliearities but also
More informationAnalysis of SDR GNSS Using MATLAB
Iteratioal Joural of Computer Techology ad Electroics Egieerig (IJCTEE) Volume 5, Issue 3, Jue 2015 Aalysis of SDR GNSS Usig MATLAB Abstract This paper explais a software defied radio global avigatio satellite
More informationPN Junction Diode: I-V Characteristics
Chater 6. PN Juctio Diode : I-V Characteristics Chater 6. PN Juctio Diode: I-V Characteristics Sug Jue Kim kimsj@su.ac.kr htt://helios.su.ac.kr Cotets Chater 6. PN Juctio Diode : I-V Characteristics q
More informationA Series Compensation Technique for Enhancement of Power Quality Isolated Power System Venkateshwara Rao R K.Satish Babu
A Series Compesatio Techique for Ehacemet of Power Quality Isolated Power System ekateshwara Rao R K.Satish Babu PG Studet [P.E], Dept of EEE, DR & DR. H S MIC College of Tech, A.P, Idia Assistat Professor,
More informationA Simplified Method for Phase Noise Calculation
Poster: T-18 Simplified Method for Phase Noise Calculatio Massoud Tohidia, li Fotowat hmady* ad Mahmoud Kamarei Uiversity of Tehra, *Sharif Uiversity of Techology, Tehra, Ira Outlie Itroductio Prelimiary
More informationVARIATIONS in process parameter values and on-chip
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION VLSI SYSTEMS 1 Comact Curret Source Models for Timig Aalysis uder Temerature ad Body Bias Variatios Saket Guta, ad Sachi S. Saatekar, Fellow, IEEE, Abstract
More informationWi-Fi or Femtocell: User Choice and Pricing Strategy of Wireless Service Provider
Wi-Fi or Femtocell: User Choice ad Pricig Strategy of Wireless Service Provider Yajiao Che, Qia Zhag Departmet of Computer Sciece ad Egieerig Hog Kog Uiversity of Sciece ad Techology Email: {cheyajiao,
More informationNonlinear System Identification Based on Reduced Complexity Volterra Models Guodong Jin1,a* and Libin Lu1,b
6th Iteratioal Coferece o Electroics, Mechaics, Culture ad Medicie (EMCM 205) Noliear System Idetificatio Based o Reduced Complexity Volterra Models Guodog Ji,a* ad Libi Lu,b Xi a research istitute of
More informationA New 3-Bit Integrating Time to Digital Converter Using Time to Voltage Conversion Technique
Bulleti of Eviromet, Pharmacology ad Life Scieces Bull. Ev. Pharmacol. Life Sci., ol 3 [11] October 2014:115-122 2014 Academy for Eviromet ad Life Scieces, dia Olie SSN 2277-1808 Joural s URL:http://www.bepls.com
More informationTwo-Dimensional Carrier Profiling by Scanning Tunneling Microscopy and Its Application to Advanced Device Development
Two-Dimesioal Carrier Profilig by Scaig Tuelig Microscopy ad Its Applicatio to Advaced Device Developmet Hideobu Fukutome (Mauscript received December 28, 2009) A high-resolutio two-dimesioal (2D) carrier
More informationBANDWIDTH AND GAIN ENHANCEMENT OF MULTIBAND FRACTAL ANTENNA BASED ON THE SIERPINSKI CARPET GEOMETRY
ISSN: 2229-6948(ONLINE) DOI: 10.21917/ijct.2013.0095 ICTACT JOURNAL ON COMMUNICATION TECHNOLOGY, MARCH 2013, VOLUME: 04, ISSUE: 01 BANDWIDTH AND GAIN ENHANCEMENT OF MULTIBAND FRACTAL ANTENNA BASED ON THE
More informationDIGITALLY TUNED SINUSOIDAL OSCILLATOR USING MULTIPLE- OUTPUT CURRENT OPERATIONAL AMPLIFIER FOR APPLICATIONS IN HIGH STABLE ACOUSTICAL GENERATORS
Molecular ad Quatum Acoustics vol. 7, (6) 95 DGTALL TUNED SNUSODAL OSCLLATOR USNG MULTPLE- OUTPUT CURRENT OPERATONAL AMPLFER FOR APPLCATONS N HGH STABLE ACOUSTCAL GENERATORS Lesław TOPÓR-KAMŃSK Faculty
More informationKey words: ZVT, Synchronous buck converter, soft switching, Losses, Efficiency.
Volume 3, Issue 5, May 2013 ISSN: 2277 128X Iteratioal Joural of Advaced Research i Computer Sciece ad Software Egieerig Research Paper Available olie at: www.ijarcsse.com Implemetatio of modified sychroous
More informationDepartment of Electrical and Computer Engineering, Cornell University. ECE 3150: Microelectronics. Spring Due on April 26, 2018 at 7:00 PM
Departmet of Electrical ad omputer Egieerig, orell Uiersity EE 350: Microelectroics Sprig 08 Homework 0 Due o April 6, 08 at 7:00 PM Suggested Readigs: a) Lecture otes Importat Notes: ) MAKE SURE THAT
More informationAn Advanced GPS Carrier Tracking Loop Based on Neural Networks Algorithm
Iteratioal Joural of Egieerig ad Alied Scieces (IJEAS ISSN: 394-366, Volume-3, Issue-9, Setember 06 A Advaced GPS Carrier Tracig Loo Based o Neural Networs Algorithm Jichu She, Shuai Che, Chaghui Jiag,
More informationBy: Pinank Shah. Date : 03/22/2006
By: Piak Shah Date : 03/22/2006 What is Strai? What is Strai Gauge? Operatio of Strai Gauge Grid Patters Strai Gauge Istallatio Wheatstoe bridge Istrumetatio Amplifier Embedded system ad Strai Gauge Strai
More informationHEXFET MOSFET TECHNOLOGY
PD - 91555A POWER MOSFET SURFACE MOUNT (SMD-1) IRFNG40 1000V, N-CHANNEL HEXFET MOSFET TECHNOLOGY Product Summary Part Number RDS(o) ID IRFNG40 3.5Ω 3.9A HEXFET MOSFET techology is the key to Iteratioal
More informationOutline. Motivation. Analog Functional Testing in Mixed-Signal Systems. Motivation and Background. Built-In Self-Test Architecture
Aalog Fuctioal Testig i Mixed-Sigal s Jie Qi Dept. of Electrical & Computer Egieerig Aubur Uiversity Co-Advisors: Charles Stroud ad Foster Dai Outlie Motivatio ad Backgroud Built-I Self-Test Architecture
More informationAnalysis and Simulation Modeling of Programmable Circuits Using Digital Potentiometers
Aalysis ad Simulatio Modelig of Programmable Circuits Usig Digital Potetiometers Ivailo M Padiev Abstract I this aer a object of aalysis ad simulatio modelig are the basic rogrammable circuits usig CMOS
More informationInfluence of Tunnel current on DC and Dynamic Properties of Si based Terahertz IMPATT source
erahertz Sciece ad echology, ISSN 94-74 Vol.4, No., March 0 Ifluece of uel curret o DC ad Dyamic Proerties of Si based erahertz IMPA source Aritra Acharyya *, Moumita Mukherjee ad. P. Baerjee 3, 3 Istitute
More informationFingerprint Classification Based on Directional Image Constructed Using Wavelet Transform Domains
7 Figerprit Classificatio Based o Directioal Image Costructed Usig Wavelet Trasform Domais Musa Mohd Mokji, Syed Abd. Rahma Syed Abu Bakar, Zuwairie Ibrahim 3 Departmet of Microelectroic ad Computer Egieerig
More informationComparative Analysis of Double Drift Region and Double Avalanche Region IMPATT Diodes
Comarative Aalysis of Double Drift Regio ad Double Avalache Regio IMPATT Diodes ALEXANDER ZEMLIAK, ROQUE DE LA CRUZ Deartmet of Physics ad Mathematics Puebla Autoomous Uiversity Av. Sa Claudio y 8 Sur,
More informationA Novel Three Value Logic for Computing Purposes
Iteratioal Joural o Iormatio ad Electroics Egieerig, Vol. 3, No. 4, July 23 A Novel Three Value Logic or Computig Purposes Ali Soltai ad Saeed Mohammadi Abstract The aim o this article is to suggest a
More informationNew MEGA POWER DUAL IGBT Module with Advanced 1200V CSTBT Chip
New MEGA POWER DUAL IGBT Module with Advaced 1200V CSTBT Chip Juji Yamada*, Yoshiharu Yu*, Joh F. Dolo**, Eric R. Motto** * Power Device Divisio, Mitsubishi Electric Corporatio, Fukuoka, Japa ** Powerex
More information