Design Of CMOS Temperature Sensors Integrated With RFID Tag Chip

Size: px
Start display at page:

Download "Design Of CMOS Temperature Sensors Integrated With RFID Tag Chip"

Transcription

1 Design Of CMOS Temperature Sensors Integrated With RFID Tag Chip Hua Peng ChongQing College of Electronic Engineering ChongQing College, China Abstract To study the application of temperature sensor in RFID chip. To make innovative design based on the existing related technologies. The article introduced the development and the important role of RFID technology, described the theory of temperature sensor and RFID technology, established the design model of RFID tag chip with integrated CMOS temperature sensor, and described the design principle of the CMOS temperature sensor. This paper studied the overall performance of COMS temperature sensor, analyzed the simulation data, and concluded that the integrated chip model could realize the capture of temperature. The RFID tag chip integrated with temperature sensor can achieve the design goal of this paper. Keywords - temperature sensor; RFID chip; CMOS; design principle I. INTRODUCTION With the rapid development of modern society, people's collection and processing of information is becoming more and more important, all kinds of sensors have been developed very quickly. In recent years, the combination of RFID and sensing technology has become a trend, it also becomes a hot research and application, in particular, the rise of cold chain logistics is to provide a broad application space for the integration of temperature sensor RFID tags. RFID technology is a kind of technology that relies on the radio frequency signal to carry on the information transmission, which is able to achieve the recognition target without contact information and the electronic tag is one of the core components. Its development is the result of a number of technological developments, including antenna technology, integrated circuit technology, electromagnetic field propagation technology, encoding decoding technology and data information exchange, etc. (Dakin, 1985). RFID technology first appeared in the second war period, but in recent years, it has been greatly developed, many countries have focused on supporting and developing RFID technology, today, some large international companies have joined the ranks of RFID technology, such as NXP, TI, Microchips, Motorola and other companies have introduced the corresponding products, and each has its own characteristics from the system. The application of RFID is becoming more and more extensive, at present, many companies in some industries are seeking to use RFID technology to simplify the operation, meet regulatory requirements and prevent the introduction of counterfeit products into the supply chain, both protecting the safety of consumers and the company's profitability. Some industry experts believe that RFID technology has no competitive advantage, but as a supplement to the bar code technology, in many cases, such as tracking tray and cardboard boxes in a warehouse, using RFID technology has overcome some of the limitations found in some bar code applications. ecause it is not an optical technology like bar code, so there is no inherent line of sight between the reader and the reader. In addition, RFID is a wireless transmission data, but also a read / write technology, so it can be updated or changed in the tag data content (akker, 1996). Figure 1 is a part of the application of the RFID technology. (a) Application of RFID in Antenna (b) Application of RFID In Shopping Fig. 1. Part of The Applications of RFID Technology DOI /IJSSST.a.16.4A ISSN: x online, print

2 II. OVERVIEW OF CMOS TEMPERATURE SENSOR Temperature sensor is a kind of sensor that can be output to the corresponding signal through the temperature of the sensor and the bad environment, it is widely used in the fields of industry, agriculture, science and life, is also the most basic and most of the sensor. It has mainly experienced three stages of development: (1) the traditional split vertical, which is caused by temperature changes by the sensing element, generates a relative current, voltage, resistance, etc.. (2) integrated temperature sensor and temperature switch controller for analog output, the main output is a type of sensor that is proportional to the temperature of the analog signal or the control switch. (3) intelligent temperature sensor, digital signal output of integrated temperature sensor, can be integrated with advanced digital signal processing system (ao, 1995). Integrated temperature sensor is one of the most widely used today, compared with the traditional temperature sensor, it has small size, low power consumption, good output characteristics and many other characteristics. On the same chip, the temperature sensing element and the processing circuit are integrated on the same chip, the traditional sensor technology can be combined with IC technology. Such as reference circuit, linear amplifier, temperature compensation and other signal processing circuit can be very good use of IC technology to achieve, so the linear design of the integrated temperature sensor is not required, and the design of temperature compensation is realized. Integrated temperature sensor is mainly composed of temperature sensing circuit, reference circuit and related control unit circuit, etc., a smart temperature sensor is usually connected to a digital converter and a storage device. ipolar technology is the first technology used to design commercial integrated circuits, many types of integrated temperature sensors are designed using bipolar technology, such as LM135, ADR590, etc.. ut with the rapid development of integrated circuit technology, it drives the product to become smaller and smaller and meet the requirements of high performance. CMOS process due to its easy realization of mixed signal processing circuit, and also the size of miniature, the chip area is small, so it is widely used, gradually in the integrated circuit design in the dominant position. CMOS process compatible bipolar devices (parasitic longitudinal substrate PNP transistor), very suitable for design of temperature sensor. With the rapid development of CMOS integrated circuit design technology, today's CMOS temperature sensor has been able to meet many aspects of the application, and the direction of the intelligent temperature sensor is also developed. ut, due to the deviation of the process and the physical characteristics of the parasitic bipolar transistor in CMOS process, the CMOS temperature sensor is the problem of the low temperature measurement accuracy, its application in many fields (Chen, 2005). III. INTEGRATED TEMPERATURE SENSOR OF THE RFID TAGS AT HOME AND AROAD RESEARCH STATUS So far, there are many reports on the integration of RFID tag chip with temperature sensor, and the research on this aspect is more obvious than that in China. In 2007 Pardo D. and so on in the RFID IEEE international conference to do a report, a passive UHF RFID temperature sensor for human body temperature monitoring is described, it discusses the problem that the temperature sensor is integrated on RFID, at the same time, the optimization criteria of the modules are given. In 2006, Opasjumruskit K. et al. In a theoretical study of a passive RFID temperature sensor, it is expected that its operating frequency is 100 khz khz-150. They have carried on the detailed division and the analysis to the RFID tag chip module, the theoretical simulation shows that the error of the measurement error of the temperature at 0 degrees -100 is less than 2.5, and the error can be less than 1. In the domestic research of RFID temperature sensor, Shen Hongwei et al. et al., in 2008, has studied the ultra high frequency RFID temperature sensor. They proposed the design idea of RFID passive tag chip with temperature sensing function, class EPC 0 protocol for 900MHz, they use multi-voltage design idea to put forward the electronic tag structure and reference circuit (ao, 1993). Using Chartered 0.35 m CMOS Technology Library for circuit simulation, the simulation results show that the proposed circuit is in the range of temperature measurement at the -10 of -120, error less than 2. RFID tag chip fabrication in integrated temperature sensor, March 2006 German KSW company released a new RFID smart tag Vario Sens asic integrated temperature sensor. Vario Sens temperature tags follow the ISO air interface protocol, it works in the HF-3.56-MHz frequency band, with a total of 8 K bit of the read write EEPROM storage space. Vario Sens temperature tag using 1.5 V battery, the use of about 1.5 years, its main application areas are chemical industry chemical monitoring, medical industry, drug transport and perishable food tracking, etc.. Gentag is a company based in Washington, D. C., Columbia, for the RFID intellectual property development company, in July 2006, the company announced that it has been designed, patented and successfully tested an ultra linear, low power, single calibration temperature sensor circuit, this circuit can be directly applied to any one of the two generation high frequency or MHz global RFID market. Gentag claims that the sensor can only increase the cost of very small tags. May 2008 IDS Microchip AG company launched the IDS SL13A smart active tag chip, IDS-SL13A compatible ISO15693 standard, is a passive / semi passive tag chip, it is specially designed for the single cell with sensor function to optimize the smart tags for the power supply. It can assign a unique identification code to any product that is labeled. An environmentally friendly battery (1.5 V or 3 V) can be used to support the integration of real-time clock and EPROM memory, to record data from the internal temperature sensor or other external sensor (Varghese, 2004). DOI /IJSSST.a.16.4A ISSN: x online, print

3 IV. ASIC THEORY OF IPOLAR TRANSISTOR IN CMOS PROCESS In forward bias (i.e. the base emitter junction is biased, and the collector base junction is biased), transistor collector current CI presents exponential relationship with the base emitter voltage EV: qv E k IC IS exp 1 (1) Where Ic is the collector current of the bipolar transistor, I s is the saturation current of the bipolar transistor, V E is the bias between the base and emitter forward voltage, k is the Pohl Seidman constant, q is an electronic charge, is the k temperature. If VE 3 the formula (1) can be simplified q as: qv E k IC IS exp (2) The saturation current is about is: 2 2 qnad i E IS (3) Q Among them, A E is the emitter area, n i is the base carrier concentration, D is an effective minority carrier diffusion constant in the base, Q is the number of atoms in the unit area of the intrinsic silicon. Q can be learned through the following formula: N xc Q q N dx (4) xe is the majority carrier concentration, X C and X E are the intrinsic silicon base area and the emission region and the collector region boundary. Under the appropriate temperature, all ionization of doping, the intrinsic carrier concentration is far less than the doping concentration, in this case can be found: xc Q q N dx (5) xe Where N is the base doping concentration. The relationship between I S and was performed in the parameters n i and D, according to the formula: qv g 2 3 k n exp (6) i k D X (7) q You can get together: qv ( E Vg 0 ) IC C exp (8) k Among them, C is a constant, 4-n, and n is a constant process related, V g0 means the band gap voltage of silicon in absolute zero (Nguyen, 2008). V. INTEGRATED TEMPERATURE SENSOR RFID TAG OVERALL STRUCTURE The passive RFID tag chip is in line with the international standard ISO15693, working frequency is MHz. According to the functional division, integrated temperature sensor RFID tag chip can be divided into four modules: RF analog front end, digital controller, memory, temperature sensor. Its structure diagram is shown in Figure 2. Fig. 2. RFID Tag Structure lock Diagram of Integrated Temperature Sensor The RF analog front end includes a rectifier circuit, a voltage regulator circuit, a modulation / demodulation circuit, a reset circuit and a clock extraction circuit, it has four main functions: (1) The energy required to provide work for each part of the RFID tag for the integrated temperature sensor, this is accomplished by the power generation circuit. (2) The clock required for the normal operation of the circuit from the carrier, this is done by the clock extraction circuit. (3) Modulation / demodulation of data on the RFID tag, this is done by a data modulation / demodulation circuit. (4) When the power is reset, the reset circuit is completed. The digital controller is composed of a control module, a modulation and demodulation module, a CRC verification module, mapping module and state machine. The main function of the digital circuit is to deal with the analog circuit and temperature sensor sent over the data, responsible for controlling and communicating with readers, at the same time according to the reader's requirements and EEPROM for communication (erthou, 1990). Memory uses EEPROM as a storage unit, which can save the data for a long time, and according to the needs of the data to update, but it can not DOI /IJSSST.a.16.4A ISSN: x online, print

4 read and write data directly as RAM or ROM, different controls must be carried out for different operations. The main function of the memory in the RFID temperature sensor tag chip is to store the data sent by the digital portion, and send the data to the digital part for processing. Another memory will be provided to the temperature sensor for a stable 1.26 V bias voltage independent of the power supply and temperature. The main function of the temperature sensor is to detect the temperature, and the detection results are transmitted to the digital part by ADC conversion to digital form. Temperature sensor mainly includes PTAT voltage generating module and single slope ADC module. The PTAT voltage generating module is a voltage signal which is proportional to the temperature by the band gap. The output voltage signal is processed by the single slope ADC module, and the output voltage signal is converted to digital output (Tuthill, 1998). The single slope ADC module consists of two parts, a constant current source module and a comparator module, the constant current source module is responsible for generating a constant current which is independent of temperature and power supply voltage, the comparator module compares the PTAT voltage with the charge voltage of the capacitor to obtain a charge time proportional to the temperature. The charging time is sent to the digital module for further processing, the values are stored in the memory. This data is returned by the memory when the reader reads the temperature. VI. TEMPERATURE SENSOR SYSTEM DESIGN A. System Structure Design For the design of CMOS temperature sensor, according to the different temperature principle, people put forward different circuit design: Temperature characteristics of carrier mobility of MOS field effect tube; Temperature properties of V and current gain of the MOS field effect transistor; Frequency temperature correlation principle of ring oscillator; Thermal related properties of internal thermal diffusion constant of silicon crystal. ut these methods have some shortcomings in the performance, design of integrated temperature sensor in standard CMOS process, the sensing temperature element is widely used to work in the sub threshold region of the MOS field effect transistor and substrate PNP transistor fully compatible with CMOS process. ased on the above two kinds of sensing principle of temperature, temperature sensor system design is mainly based on the following two kinds of structure (Choi, 2008): (1) The substrate PNP transistor is fully compatible with the CMOS process, a voltage signal, which is proportional to the absolute temperature, is generated by the JT bandgap circuit, in order to produce a pulse signal, the width of the pulse signal is proportional to the absolute temperature, the pulse signal is converted to digital signal by using a counter; (2) The current characteristics of the MOSFET are used to work in the sub threshold region, a current signal proportional to the absolute temperature, periodic square wave signal is generated by the periodic charge discharge of the integral circuit to generate a frequency proportional to the absolute temperature, finally, the frequency of the pulse can be obtained by using the counter at the specified time. The structure of a temperature sensor integrated in the RFID tag chip is proposed in the paper, the bias circuit and the PTAT current generating circuit, the ADC component (Liu, 2003), the structure is shown in Figure 3. Fig. 3. System Structure of Temperature Sensor. PTAT Application A lot of studies have used the band gap circuit to generate the PTAT current to detect the temperature, the PTAT current can be obtained with a good linearity of the current temperature curve, And its power control is very good. ut considering the band gap circuit, there are JT, its power consumption and area is relatively large, not suitable for passive RFID tag chip. The electric current which is proportional to the temperature is obtained by the relationship between the threshold voltage and the gain factor of the MOS tube, the structure of the circuit is simple and the power supply rejection is better, but the output current of the temperature curve is not an ideal linear relationship, in order to get a higher accuracy of the output results must be calibrated, will lead to an increase in power consumption, also not suitable for passive RFID tag chip (Collins, 1998). In this paper, the PTAT current is generated by the MOS tube operating in the sub threshold region, the structure can obtain a good linearity of the current temperature relationship, at the same time, because most of the tubes work in the sub threshold region, the power consumption of the circuit is also very small, very consistent with the low power requirements of RFID tag chip. However, the structure of the power supply rejection characteristics is relatively poor, the temperature sensitivity is also very small, we can be in the process of circuit design, overcome this difficulty by the optimal design of reference current source, reference voltage source and ADC. So in the design process, we must ensure that the reference current source, reference voltage source stability, improve the resolution of ADC (Hartog, 1983). C. ADC Principle Digital converter, A/D converter, or ADC, is an electronic component that converts analog signals into digital signals, typically a digital converter is an input voltage signal converted to an output digital signal. Analog to digital converter is a system to convert analog signals into digital signals, is a filtering, sampling and maintaining the process of encoding. The analog signal is filtered through the filter DOI /IJSSST.a.16.4A ISSN: x online, print

5 circuit, the sample and hold circuit is changed into a step shape signal, and then, by means of the encoder, the level of the step signal is converted into binary code. The integral type and the voltage frequency conversion type are the input analog quantity to convert to the time (pulse width signal) or the frequency (periodic pulse signal), and then through the subsequent counter to realize the analog to digital conversion. In this paper, the input signal of IPTAT is ADC, integral ADC can be used, the traditional single rate integral type ADC as shown in Figure 4, the ADC is characterized by simple circuit structure, low power consumption. sensor is sensitive to the change of the power supply voltage, need further improvement. Fig. 5. Output Data Curve Under Different Power Supply Voltage Fig. 4. Principle Diagram of Single Slope Integral Type ADC The single slope integral ADC is divided into three parts, which are the integral circuit, voltage comparator circuit and counter. When the switch A is closed, PTAT current charges the capacitor Cp, the comparator output high, counter start count. When the charging voltage is equal to the reference voltage Vref, the comparator output is changed to a low level, and the counter is stopped when the comparator is reversed. At this time, A disconnect switch, the voltage on the capacitor Cp is charged by discharge switch, end of a measurement cycle. The traditional single rate integral type ADC does not apply to the analog of the PTAT current. So we use a ADC containing the CCO structure of the current control oscillator, the ADC consists of a current controlled oscillator and a counter. CCO design for converting current into a periodic pulse signal, IPTAT is proportional to the temperature of the current CCO to get a frequency and temperature dependent pulse signal. This signal is used as a counter clock signal, after a counter is obtained by a digital signal that is proportional to the temperature, the temperature is sensed. VII. SIMULATION RESULTS OF THE WHOLE CIRCUIT When the supply voltage varies between 1.6V-2.0V, temperature sensor output is also a certain change, Figure 5 shows the output of the temperature sensor 1.6V, 1.8V, 2.0V, the power supply voltage of the data curve. The output pulse frequency can be decreased with the increase of the power supply voltage, which leads to a small reading of the temperature, this phenomenon has a great influence on the measurement accuracy, it also shows that the temperature We simulate the whole circuit of the temperature sensor, when the temperature was changed at , the output frequency of the temperature sensor is linear with temperature, and increases with temperature [17]. VIII. CONCLUSION The main work of this paper is to study the design and research of CMOS temperature sensor integrated with RFID tag chip. Design and Simulation of the analog part of the temperature sensor circuit was completed. Through simulation analysis, the design of the sensor could complete the temperature reading, but in some detail the need to adjust the improvement and the overall design was successful. ACKNOWLEDGEMENTS This work is supported by 2015 Science and Technology Research Project of Chongqing Academic Affairs, Intelligent Electronic Guiding System sased on NFC and RFID Technologies. Project Number: KJ REFERENCES [1] Dakin J P, Pratt D J, ibby G W, Distributed optical fibre Raman temperature sensor using a semiconductor light source and detector. Electronics Letters, vol.21, No.13, pp , [2] akker A, Huijsing J H, Micropower CMOS temperature sensor with digital output. Solid-State Circuits, IEEE Journal of, vol.31,no.7, pp , [3] ao X, Dhliwayo J, Heron N., Experimental and theoretical studies on a distributed temperature sensor based on rillouin scattering. Journal of Lightwave Technology, vol.13,no.7, pp , 1995 [4] Chen P, Chen C C, Tsai C C., A time-to-digital-converter-based CMOS smart temperature sensor. Solid-State Circuits, IEEE Journal of,vol. 40,No.8, pp , [5] ao X, Webb D J, Jackson D A., 32-km distributed temperature sensor based on rillouin loss in an optical fiber. Optics Letters, vol.18,no.18, pp , DOI /IJSSST.a.16.4A ISSN: x online, print

6 [6] Varghese O K, Mor G K, Grimes C A., A titania nanotube-array room-temperature sensor for selective detection of hydrogen at low concentrations. Journal of nanoscience and nanotechnology, vol.4, No.7, pp , [7] Nguyen L V, Hwang D, Moon S., High temperature fiber sensor with high sensitivity based on core diameter mismatch. Optics express, 16(15): pp , [8] erthou H, Jörgensen C K., Optical-fiber temperature sensor based on upconversion-excited fluorescence. Optics letters, vol.15no.19, pp , [9] Tuthill M., A switched-current, switched-capacitor temperature sensor in 0.6-μm CMOS. Solid-State Circuits, IEEE Journal of, vol.33no.7, pp , [10] Choi H Y, Park K S, Park S J, Miniature fiber-optic high temperature sensor based on a hybrid structured Fabry-Perot interferometer. Optics letters, vol.33no.21, pp , [11] Liu H, Liu H Y, Peng G D, Strain and temperature sensor using a combination of polymer and silica fibre ragg gratings. Optics Communications, vol.219, No.1, pp , [12] Collins S F, axter G W, Wade S A., Comparison of fluorescencebased temperature sensor schemes: Theoretical analysis and experimental validation. Journal of applied physics, vol. 84,No. 9, pp , [13] Hartog A H, A distributed temperature sensor based on liquid-core optical fibers. Lightwave Technology, Journal of, vol.1,no.3, pp , DOI /IJSSST.a.16.4A ISSN: x online, print

A CMOS Analog Front-End Circuit for MEMS Based Temperature Sensor

A CMOS Analog Front-End Circuit for MEMS Based Temperature Sensor Technology Volume 1, Issue 2, October-December, 2013, pp. 01-06, IASTER 2013 www.iaster.com, Online: 2347-6109, Print: 2348-0017 A CMOS Analog Front-End Circuit for MEMS Based Temperature Sensor Bollam

More information

Department of Electrical Engineering IIT Madras

Department of Electrical Engineering IIT Madras Department of Electrical Engineering IIT Madras Sample Questions on Semiconductor Devices EE3 applicants who are interested to pursue their research in microelectronics devices area (fabrication and/or

More information

1 FUNDAMENTAL CONCEPTS What is Noise Coupling 1

1 FUNDAMENTAL CONCEPTS What is Noise Coupling 1 Contents 1 FUNDAMENTAL CONCEPTS 1 1.1 What is Noise Coupling 1 1.2 Resistance 3 1.2.1 Resistivity and Resistance 3 1.2.2 Wire Resistance 4 1.2.3 Sheet Resistance 5 1.2.4 Skin Effect 6 1.2.5 Resistance

More information

Electromagnetic Modelling of UHF RFID Tags*

Electromagnetic Modelling of UHF RFID Tags* SERBIAN JOURNAL OF ELECTRICAL ENGINEERING Vol. 8, No. 1, February 2011, 1-7 UDK: 621.396.029:537.531 Electromagnetic Modelling of UHF RFID Tags* Nemanja Milošević 1, Branko Kolundžija 1 Abstract: Paper

More information

Fundamentals of CMOS Image Sensors

Fundamentals of CMOS Image Sensors CHAPTER 2 Fundamentals of CMOS Image Sensors Mixed-Signal IC Design for Image Sensor 2-1 Outline Photoelectric Effect Photodetectors CMOS Image Sensor(CIS) Array Architecture CIS Peripherals Design Considerations

More information

ECE 440 Lecture 29 : Introduction to the BJT-I Class Outline:

ECE 440 Lecture 29 : Introduction to the BJT-I Class Outline: ECE 440 Lecture 29 : Introduction to the BJT-I Class Outline: Narrow-Base Diode BJT Fundamentals BJT Amplification Things you should know when you leave Key Questions How does the narrow-base diode multiply

More information

Analysis and Simulation of UHF RFID System

Analysis and Simulation of UHF RFID System ICSP006 Proceedings Analysis and Simulation of UHF RFID System Jin Li, Cheng Tao Modern Telecommunication Institute, Beijing Jiaotong University, Beijing 00044, P. R. China Email: lijin3@63.com Abstract

More information

Review Energy Bands Carrier Density & Mobility Carrier Transport Generation and Recombination

Review Energy Bands Carrier Density & Mobility Carrier Transport Generation and Recombination Review Energy Bands Carrier Density & Mobility Carrier Transport Generation and Recombination Current Transport: Diffusion, Thermionic Emission & Tunneling For Diffusion current, the depletion layer is

More information

Internet of Things Application Practice and Information and Communication Technology

Internet of Things Application Practice and Information and Communication Technology 2019 2nd International Conference on Computer Science and Advanced Materials (CSAM 2019) Internet of Things Application Practice and Information and Communication Technology Chen Ning Guangzhou City Polytechnic,

More information

RFIC Group Semester and Diploma Projects

RFIC Group Semester and Diploma Projects RFIC Group Semester and Diploma Projects 1. Fully Implantable Remotely Powered Sensor System for Biomedical Monitoring System This project focuses on the design of a fully implantable, remotely powered

More information

EE 5611 Introduction to Microelectronic Technologies Fall Thursday, September 04, 2014 Lecture 02

EE 5611 Introduction to Microelectronic Technologies Fall Thursday, September 04, 2014 Lecture 02 EE 5611 Introduction to Microelectronic Technologies Fall 2014 Thursday, September 04, 2014 Lecture 02 1 Lecture Outline Review on semiconductor materials Review on microelectronic devices Example of microelectronic

More information

Low Jitter, Low Emission Timing Solutions For High Speed Digital Systems. A Design Methodology

Low Jitter, Low Emission Timing Solutions For High Speed Digital Systems. A Design Methodology Low Jitter, Low Emission Timing Solutions For High Speed Digital Systems A Design Methodology The Challenges of High Speed Digital Clock Design In high speed applications, the faster the signal moves through

More information

DESIGN AND ANALYSIS OF SUB 1-V BANDGAP REFERENCE (BGR) VOLTAGE GENERATORS FOR PICOWATT LSI s.

DESIGN AND ANALYSIS OF SUB 1-V BANDGAP REFERENCE (BGR) VOLTAGE GENERATORS FOR PICOWATT LSI s. http:// DESIGN AND ANALYSIS OF SUB 1-V BANDGAP REFERENCE (BGR) VOLTAGE GENERATORS FOR PICOWATT LSI s. Shivam Mishra 1, K. Suganthi 2 1 Research Scholar in Mech. Deptt, SRM University,Tamilnadu 2 Asst.

More information

Digital Electronics. By: FARHAD FARADJI, Ph.D. Assistant Professor, Electrical and Computer Engineering, K. N. Toosi University of Technology

Digital Electronics. By: FARHAD FARADJI, Ph.D. Assistant Professor, Electrical and Computer Engineering, K. N. Toosi University of Technology K. N. Toosi University of Technology Chapter 7. Field-Effect Transistors By: FARHAD FARADJI, Ph.D. Assistant Professor, Electrical and Computer Engineering, K. N. Toosi University of Technology http://wp.kntu.ac.ir/faradji/digitalelectronics.htm

More information

A Robust Oscillator for Embedded System without External Crystal

A Robust Oscillator for Embedded System without External Crystal Appl. Math. Inf. Sci. 9, No. 1L, 73-80 (2015) 73 Applied Mathematics & Information Sciences An International Journal http://dx.doi.org/10.12785/amis/091l09 A Robust Oscillator for Embedded System without

More information

The Design of Tag-ItTM Compatible MHz Passive RFID Transponder IC Employing TSMC 0.18µm Process

The Design of Tag-ItTM Compatible MHz Passive RFID Transponder IC Employing TSMC 0.18µm Process The Design of Tag-ItTM Compatible 13.56 MHz Passive RFID Transponder IC Employing TSMC 0.18µm Process Author Khaw, M., Mohd-Yasin, Faisal, I Reaz, M. Published 2006 Conference Title 5th WSEAS International

More information

Multi Frequency RFID Read Writer System

Multi Frequency RFID Read Writer System Multi Frequency RFID Read Writer System Uppala Sunitha 1, B Rama Murthy 2, P Thimmaiah 3, K Tanveer Alam 1 PhD Scholar, Department of Electronics, Sri Krishnadevaraya University, Anantapur, A.P, India

More information

INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET)

INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET) INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET) International Journal of Electronics and Communication Engineering & Technology (IJECET), ISSN 0976 ISSN 0976 6464(Print)

More information

NAME: Last First Signature

NAME: Last First Signature UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences EE 130: IC Devices Spring 2003 FINAL EXAMINATION NAME: Last First Signature STUDENT

More information

Physics of RFID. Pawel Waszczur McMaster RFID Applications Lab McMaster University

Physics of RFID. Pawel Waszczur McMaster RFID Applications Lab McMaster University 1 Physics of RFID Pawel Waszczur McMaster RFID Applications Lab McMaster University 2 Agenda Radio Waves Active vs. Passive Near field vs. Far field Behavior of UHF fields Modulation & Signal Coding 3

More information

Fundamentals of Power Semiconductor Devices

Fundamentals of Power Semiconductor Devices В. Jayant Baliga Fundamentals of Power Semiconductor Devices 4y Spri ringer Contents Preface vii Chapter 1 Introduction 1 1.1 Ideal and Typical Power Switching Waveforms 3 1.2 Ideal and Typical Power Device

More information

Operational Description

Operational Description Operational Description Wallterminal WT2000 ISO Tagit The Wallterminal WT2000 consists of the two components control unit and reader unit. The control unit is usually mounted in a save area inside the

More information

Integrating a Temperature Sensor into a CMOS Image Sensor.

Integrating a Temperature Sensor into a CMOS Image Sensor. Master Thesis project 2014-2015 Integrating a Temperature Sensor into a CMOS Image Sensor. Author: BSc. J. Markenhof Supervisor: Prof. Dr. Ir. A.J.P. Theuwissen Monday 24 th August, 2015 Delft University

More information

Device Technologies. Yau - 1

Device Technologies. Yau - 1 Device Technologies Yau - 1 Objectives After studying the material in this chapter, you will be able to: 1. Identify differences between analog and digital devices and passive and active components. Explain

More information

An Improved Bandgap Reference (BGR) Circuit with Constant Voltage and Current Outputs

An Improved Bandgap Reference (BGR) Circuit with Constant Voltage and Current Outputs International Journal of Research in Engineering and Innovation Vol-1, Issue-6 (2017), 60-64 International Journal of Research in Engineering and Innovation (IJREI) journal home page: http://www.ijrei.com

More information

A Study on the Characteristics of a Temperature Sensor with an Improved Ring Oscillator

A Study on the Characteristics of a Temperature Sensor with an Improved Ring Oscillator Proceedings of the World Congress on Electrical Engineering and Computer Systems and Science (EECSS 2015) Barcelona, Spain July 13-14, 2015 Paper No. 137 A Study on the Characteristics of a Temperature

More information

Extreme Temperature Invariant Circuitry Through Adaptive DC Body Biasing

Extreme Temperature Invariant Circuitry Through Adaptive DC Body Biasing Extreme Temperature Invariant Circuitry Through Adaptive DC Body Biasing W. S. Pitts, V. S. Devasthali, J. Damiano, and P. D. Franzon North Carolina State University Raleigh, NC USA 7615 Email: wspitts@ncsu.edu,

More information

Fast IC Power Transistor with Thermal Protection

Fast IC Power Transistor with Thermal Protection Fast IC Power Transistor with Thermal Protection Introduction Overload protection is perhaps most necessary in power circuitry. This is shown by recent trends in power transistor technology. Safe-area,

More information

Moderne Teilchendetektoren - Theorie und Praxis 2. Dr. Bernhard Ketzer Technische Universität München SS 2013

Moderne Teilchendetektoren - Theorie und Praxis 2. Dr. Bernhard Ketzer Technische Universität München SS 2013 Moderne Teilchendetektoren - Theorie und Praxis 2 Dr. Bernhard Ketzer Technische Universität München SS 2013 7 Signal Processing and Acquisition 7.1 Signals 7.2 Amplifier 7.3 Electronic Noise 7.4 Analog-to-Digital

More information

Solid State Devices- Part- II. Module- IV

Solid State Devices- Part- II. Module- IV Solid State Devices- Part- II Module- IV MOS Capacitor Two terminal MOS device MOS = Metal- Oxide- Semiconductor MOS capacitor - the heart of the MOSFET The MOS capacitor is used to induce charge at the

More information

R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad. ELECTRONIC PRINCIPLES AND APPLICATIONS

R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad. ELECTRONIC PRINCIPLES AND APPLICATIONS R.B.V.R.R. WOMEN S COLLEGE (AUTONOMOUS) Narayanaguda, Hyderabad. DEPARTMENT OF PHYSICS QUESTION BANK FOR SEMESTER V PHYSICS PAPER VI (A) ELECTRONIC PRINCIPLES AND APPLICATIONS UNIT I: SEMICONDUCTOR DEVICES

More information

Copyright 2007 Year IEEE. Reprinted from ISCAS 2007 International Symposium on Circuits and Systems, May This material is posted here

Copyright 2007 Year IEEE. Reprinted from ISCAS 2007 International Symposium on Circuits and Systems, May This material is posted here Copyright 2007 Year IEEE. Reprinted from ISCAS 2007 International Symposium on Circuits and Systems, 27-30 May 2007. This material is posted here with permission of the IEEE. Such permission of the IEEE

More information

Semiconductor Detector Systems

Semiconductor Detector Systems Semiconductor Detector Systems Helmuth Spieler Physics Division, Lawrence Berkeley National Laboratory OXFORD UNIVERSITY PRESS ix CONTENTS 1 Detector systems overview 1 1.1 Sensor 2 1.2 Preamplifier 3

More information

Low Power Design of Successive Approximation Registers

Low Power Design of Successive Approximation Registers Low Power Design of Successive Approximation Registers Rabeeh Majidi ECE Department, Worcester Polytechnic Institute, Worcester MA USA rabeehm@ece.wpi.edu Abstract: This paper presents low power design

More information

Lecture 16. The Bipolar Junction Transistor (I) Forward Active Regime. Outline. The Bipolar Junction Transistor (BJT): structure and basic operation

Lecture 16. The Bipolar Junction Transistor (I) Forward Active Regime. Outline. The Bipolar Junction Transistor (BJT): structure and basic operation Lecture 16 The Bipolar Junction Transistor (I) Forward Active Regime Outline The Bipolar Junction Transistor (BJT): structure and basic operation I-V characteristics in forward active regime Reading Assignment:

More information

Design of Adaptive RFID Reader based on DDS and RC522 Li Yang, Dong Zhi-Hong, Cong Dong-Sheng

Design of Adaptive RFID Reader based on DDS and RC522 Li Yang, Dong Zhi-Hong, Cong Dong-Sheng International Conference on Applied Science and Engineering Innovation (ASEI 2015) Design of Adaptive RFID Reader based on DDS and RC522 Li Yang, Dong Zhi-Hong, Cong Dong-Sheng Beijing Key Laboratory of

More information

The Study on the Effect Factors of Single-mode Fiber Optical Signal Transmission Time Delay Hechuan1, a

The Study on the Effect Factors of Single-mode Fiber Optical Signal Transmission Time Delay Hechuan1, a 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering (ICMMCCE 2015) The Study on the Effect Factors of Single-mode Fiber Optical Signal Transmission Time Delay Hechuan1,

More information

Basic concepts. Optical Sources (b) Optical Sources (a) Requirements for light sources (b) Requirements for light sources (a)

Basic concepts. Optical Sources (b) Optical Sources (a) Requirements for light sources (b) Requirements for light sources (a) Optical Sources (a) Optical Sources (b) The main light sources used with fibre optic systems are: Light-emitting diodes (LEDs) Semiconductor lasers (diode lasers) Fibre laser and other compact solid-state

More information

EE 330 Lecture 18. Characteristics of Finer Feature Size Processes. Bipolar Process

EE 330 Lecture 18. Characteristics of Finer Feature Size Processes. Bipolar Process 330 Lecture 18 haracteristics of Finer Feature Size Processes ipolar Process How does the inverter delay compare between a 0.5u process and a 0.13u process? DD IN OUT IN OUT SS How does the inverter

More information

Lecture 4: Voltage References

Lecture 4: Voltage References EE6378 Power Management Circuits Lecture 4: oltage References Instructor: t Prof. Hoi Lee Mixed-Signal & Power IC Laboratory Department of Electrical Engineering The University of Texas at Dallas Introduction

More information

Objective Type Questions 1. Why pure semiconductors are insulators at 0 o K? 2. What is effect of temperature on barrier voltage? 3.

Objective Type Questions 1. Why pure semiconductors are insulators at 0 o K? 2. What is effect of temperature on barrier voltage? 3. Objective Type Questions 1. Why pure semiconductors are insulators at 0 o K? 2. What is effect of temperature on barrier voltage? 3. What is difference between electron and hole? 4. Why electrons have

More information

A Bandgap Voltage Reference Circuit Design In 0.18um Cmos Process

A Bandgap Voltage Reference Circuit Design In 0.18um Cmos Process A Bandgap Voltage Reference Circuit Design In 0.18um Cmos Process It consists of a threshold voltage extractor circuit and a proportional to The behavior of the circuit is analytically described, a design

More information

DESIGN AND ANALYSIS OF LOW POWER CHARGE PUMP CIRCUIT FOR PHASE-LOCKED LOOP

DESIGN AND ANALYSIS OF LOW POWER CHARGE PUMP CIRCUIT FOR PHASE-LOCKED LOOP DESIGN AND ANALYSIS OF LOW POWER CHARGE PUMP CIRCUIT FOR PHASE-LOCKED LOOP 1 B. Praveen Kumar, 2 G.Rajarajeshwari, 3 J.Anu Infancia 1, 2, 3 PG students / ECE, SNS College of Technology, Coimbatore, (India)

More information

PHYS 3050 Electronics I

PHYS 3050 Electronics I PHYS 3050 Electronics I Chapter 4. Semiconductor Diodes and Transistors Earth, Moon, Mars, and Beyond Dr. Jinjun Shan, Associate Professor of Space Engineering Department of Earth and Space Science and

More information

Hello, and welcome to the TI Precision Labs video discussing comparator applications, part 4. In this video we will discuss several extra features

Hello, and welcome to the TI Precision Labs video discussing comparator applications, part 4. In this video we will discuss several extra features Hello, and welcome to the TI Precision Labs video discussing comparator applications, part 4. In this video we will discuss several extra features that are integrated into some comparators to help simplify

More information

Tuesday, February 1st, 9:15 12:00. Snorre Aunet Nanoelectronics group Department of Informatics University of Oslo

Tuesday, February 1st, 9:15 12:00. Snorre Aunet Nanoelectronics group Department of Informatics University of Oslo Bandgap references, sampling switches Tuesday, February 1st, 9:15 12:00 Snorre Aunet (sa@ifi.uio.no) Nanoelectronics group Department of Informatics University of Oslo Outline Tuesday, February 1st 11.11

More information

Speed regulation vehicles using RFID

Speed regulation vehicles using RFID Speed regulation vehicles using RFID Chandrashekar.P Electronics and communication engineering SDIT-Mangalore Karnataka-India Cschandran44@gmail.com Praveen kumar.m Electronics and communication engineering

More information

Simulation Study for the Decoding of UHF RFID Signals

Simulation Study for the Decoding of UHF RFID Signals PIERS ONLINE, VOL. 3, NO. 7, 2007 955 Simulation Study for the Decoding of UHF RFID Signals Shengli Wang 1, Shan Qiao 1,2, Shaoyuan Zheng 1, Zhiguang Fan 1 Jiangtao Huangfu 1, and Lixin Ran 1 1 Department

More information

Power MOSFET Zheng Yang (ERF 3017,

Power MOSFET Zheng Yang (ERF 3017, ECE442 Power Semiconductor Devices and Integrated Circuits Power MOSFET Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Evolution of low-voltage (

More information

PHD Description and Application Manual for PHD HV high power IGBT driver

PHD Description and Application Manual for PHD HV high power IGBT driver Description and Application Manual for PHD620-65 HV high power IGBT driver WEPOWER series high power IGBT intelligent driving modules are specially designed for high power IGBT module with high reliability

More information

Introduction to semiconductor technology

Introduction to semiconductor technology Introduction to semiconductor technology Outline 7 Field effect transistors MOS transistor current equation" MOS transistor channel mobility Substrate bias effect 7 Bipolar transistors Introduction Minority

More information

PHYSICS OF SEMICONDUCTOR DEVICES

PHYSICS OF SEMICONDUCTOR DEVICES PHYSICS OF SEMICONDUCTOR DEVICES PHYSICS OF SEMICONDUCTOR DEVICES by J. P. Colinge Department of Electrical and Computer Engineering University of California, Davis C. A. Colinge Department of Electrical

More information

Section 2.3 Bipolar junction transistors - BJTs

Section 2.3 Bipolar junction transistors - BJTs Section 2.3 Bipolar junction transistors - BJTs Single junction devices, such as p-n and Schottkty diodes can be used to obtain rectifying I-V characteristics, and to form electronic switching circuits

More information

DESIGN OF GLOBAL SAW RFID TAG DEVICES C. S. Hartmann, P. Brown, and J. Bellamy RF SAW, Inc., 900 Alpha Drive Ste 400, Richardson, TX, U.S.A.

DESIGN OF GLOBAL SAW RFID TAG DEVICES C. S. Hartmann, P. Brown, and J. Bellamy RF SAW, Inc., 900 Alpha Drive Ste 400, Richardson, TX, U.S.A. DESIGN OF GLOBAL SAW RFID TAG DEVICES C. S. Hartmann, P. Brown, and J. Bellamy RF SAW, Inc., 900 Alpha Drive Ste 400, Richardson, TX, U.S.A., 75081 Abstract - The Global SAW Tag [1] is projected to be

More information

EE 330 Lecture 19. Bipolar Devices

EE 330 Lecture 19. Bipolar Devices 330 Lecture 19 ipolar Devices Review from last lecture n-well n-well n- p- Review from last lecture Metal Mask A-A Section - Section Review from last lecture D A A D Review from last lecture Should now

More information

Chapter 6. FM Circuits

Chapter 6. FM Circuits Chapter 6 FM Circuits Topics Covered 6-1: Frequency Modulators 6-2: Frequency Demodulators Objectives You should be able to: Explain the operation of an FM modulators and demodulators. Compare and contrast;

More information

3 ppm Ultra Wide Range Curvature Compensated Bandgap Reference

3 ppm Ultra Wide Range Curvature Compensated Bandgap Reference 1 3 ppm Ultra Wide Range Curvature Compensated Bandgap Reference Xiangyong Zhou 421002457 Abstract In this report a current mode bandgap with a temperature coefficient of 3 ppm for the range from -117

More information

Student Lecture by: Giangiacomo Groppi Joel Cassell Pierre Berthelot September 28 th 2004

Student Lecture by: Giangiacomo Groppi Joel Cassell Pierre Berthelot September 28 th 2004 Student Lecture by: Giangiacomo Groppi Joel Cassell Pierre Berthelot September 28 th 2004 Lecture outline Historical introduction Semiconductor devices overview Bipolar Junction Transistor (BJT) Field

More information

An Ultra Low Power Voltage Regulator for RFID Application

An Ultra Low Power Voltage Regulator for RFID Application University of Windsor Scholarship at UWindsor Electronic Theses and Dissertations 2012 An Ultra Low Power Voltage Regulator for RFID Application Chia-Chin Liu Follow this and additional works at: https://scholar.uwindsor.ca/etd

More information

BICMOS Technology and Fabrication

BICMOS Technology and Fabrication 12-1 BICMOS Technology and Fabrication 12-2 Combines Bipolar and CMOS transistors in a single integrated circuit By retaining benefits of bipolar and CMOS, BiCMOS is able to achieve VLSI circuits with

More information

6. Bipolar Diode. Owing to this one-direction conductance, current-voltage characteristic of p-n diode has a rectifying shape shown in Fig. 2.

6. Bipolar Diode. Owing to this one-direction conductance, current-voltage characteristic of p-n diode has a rectifying shape shown in Fig. 2. 33 6. Bipolar Diode 6.1. Objectives - to experimentally observe temperature dependence of the current flowing in p-n junction silicon and germanium diodes; - to measure current-voltage characteristics

More information

Intelligent and passive RFID tag for Identification and Sensing

Intelligent and passive RFID tag for Identification and Sensing Zürich University Of Applied Sciences Institute of Embedded Systems InES Intelligent and passive RFID tag for Identification and Sensing (Presented at Embedded World, Nürnberg, 3 rd March 2009) Dipl. Ing.

More information

UNIT-III Bipolar Junction Transistor

UNIT-III Bipolar Junction Transistor DC UNT-3.xplain the construction and working of JT. UNT- ipolar Junction Transistor A bipolar (junction) transistor (JT) is a three-terminal electronic device constructed of doped semiconductor material

More information

420 Intro to VLSI Design

420 Intro to VLSI Design Dept of Electrical and Computer Engineering 420 Intro to VLSI Design Lecture 0: Course Introduction and Overview Valencia M. Joyner Spring 2005 Getting Started Syllabus About the Instructor Labs, Problem

More information

Georgia Institute of Technology School of Electrical and Computer Engineering. Midterm Exam

Georgia Institute of Technology School of Electrical and Computer Engineering. Midterm Exam Georgia Institute of Technology School of Electrical and Computer Engineering Midterm Exam ECE-3400 Fall 2013 Tue, September 24, 2013 Duration: 80min First name Solutions Last name Solutions ID number

More information

A 7ns, 6mA, Single-Supply Comparator Fabricated on Linear s 6GHz Complementary Bipolar Process

A 7ns, 6mA, Single-Supply Comparator Fabricated on Linear s 6GHz Complementary Bipolar Process A 7ns, 6mA, Single-Supply Comparator Fabricated on Linear s 6GHz Complementary Bipolar Process Introduction The is an ultrafast (7ns), low power (6mA), single-supply comparator designed to operate on either

More information

MOBILE COMPUTING 2/25/17. What is RFID? RFID. CSE 40814/60814 Spring Radio Frequency IDentification

MOBILE COMPUTING 2/25/17. What is RFID? RFID. CSE 40814/60814 Spring Radio Frequency IDentification MOBILE COMPUTING CSE 40814/60814 Spring 2017 What is RFID? Radio Frequency IDentification Who Are You? I am Product X RFID ADC (automated data collection) technology that uses radio-frequency waves to

More information

AE53/AC53/AT53/AE103 ELECT. DEVICES & CIRCUITS DEC 2015

AE53/AC53/AT53/AE103 ELECT. DEVICES & CIRCUITS DEC 2015 Q.2 a. By using Norton s theorem, find the current in the load resistor R L for the circuit shown in Fig.1. (8) Fig.1 IETE 1 b. Explain Z parameters and also draw an equivalent circuit of the Z parameter

More information

Pramoda N V Department of Electronics and Communication Engineering, MCE Hassan Karnataka India

Pramoda N V Department of Electronics and Communication Engineering, MCE Hassan Karnataka India Advanced Low Power CMOS Design to Reduce Power Consumption in CMOS Circuit for VLSI Design Pramoda N V Department of Electronics and Communication Engineering, MCE Hassan Karnataka India Abstract: Low

More information

REFERENCE circuits are the basic building blocks in many

REFERENCE circuits are the basic building blocks in many IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II: EXPRESS BRIEFS, VOL. 53, NO. 8, AUGUST 2006 667 New Curvature-Compensation Technique for CMOS Bandgap Reference With Sub-1-V Operation Ming-Dou Ker, Senior

More information

A 23 nw CMOS ULP Temperature Sensor Operational from 0.2 V

A 23 nw CMOS ULP Temperature Sensor Operational from 0.2 V A 23 nw CMOS ULP Temperature Sensor Operational from 0.2 V Divya Akella Kamakshi 1, Aatmesh Shrivastava 2, and Benton H. Calhoun 1 1 Dept. of Electrical Engineering, University of Virginia, Charlottesville,

More information

Definition of RF-ID. Lecture on RF-IDs

Definition of RF-ID. Lecture on RF-IDs Definition of RF-ID RF-ID: Radio Frequency Identification. Indicates the use of Electromagnetic waves to detect and identify TAGS (i.e. labels) purposely attached to objects Basic components (2) Interrogator

More information

The Influence of the Distance between the Strike Location and the Drain on 90nm Dual-Well Bulk CMOS

The Influence of the Distance between the Strike Location and the Drain on 90nm Dual-Well Bulk CMOS International Conference on Mathematics, Modelling, Simulation and Algorithms (MMSA 8) The Influence of the Distance between the Strike Location and the Drain on 9nm Dual-Well Bulk CMOS Qiqi Wen and Wanting

More information

Mechanis m Faliures. Group Leader Jepsy 1)Substrate Biasing 2) Minority Injection. Bob 1)Minority-Carrier Guard Rings

Mechanis m Faliures. Group Leader Jepsy 1)Substrate Biasing 2) Minority Injection. Bob 1)Minority-Carrier Guard Rings Mechanis m Faliures Group Leader Jepsy 1)Substrate Biasing 2) Minority Injection As im 1)Types Of Guard Rings Sandra 1)Parasitics 2)Field Plating Bob 1)Minority-Carrier Guard Rings Shawn 1)Parasitic Channel

More information

Lecture 4 -- Tuesday, Sept. 19: Non-uniform injection and/or doping. Diffusion. Continuity/conservation. The five basic equations.

Lecture 4 -- Tuesday, Sept. 19: Non-uniform injection and/or doping. Diffusion. Continuity/conservation. The five basic equations. 6.012 ELECTRONIC DEVICES AND CIRCUITS Schedule -- Fall 1995 (8/31/95 version) Recitation 1 -- Wednesday, Sept. 6: Review of 6.002 models for BJT. Discussion of models and modeling; motivate need to go

More information

1) A silicon diode measures a low value of resistance with the meter leads in both positions. The trouble, if any, is

1) A silicon diode measures a low value of resistance with the meter leads in both positions. The trouble, if any, is 1) A silicon diode measures a low value of resistance with the meter leads in both positions. The trouble, if any, is A [ ]) the diode is open. B [ ]) the diode is shorted to ground. C [v]) the diode is

More information

Power Semiconductor Devices

Power Semiconductor Devices TRADEMARK OF INNOVATION Power Semiconductor Devices Introduction This technical article is dedicated to the review of the following power electronics devices which act as solid-state switches in the circuits.

More information

UNIT 3: FIELD EFFECT TRANSISTORS

UNIT 3: FIELD EFFECT TRANSISTORS FIELD EFFECT TRANSISTOR: UNIT 3: FIELD EFFECT TRANSISTORS The field effect transistor is a semiconductor device, which depends for its operation on the control of current by an electric field. There are

More information

Lecture 8 Optical Sensing. ECE 5900/6900 Fundamentals of Sensor Design

Lecture 8 Optical Sensing. ECE 5900/6900 Fundamentals of Sensor Design ECE 5900/6900: Fundamentals of Sensor Design Lecture 8 Optical Sensing 1 Optical Sensing Q: What are we measuring? A: Electromagnetic radiation labeled as Ultraviolet (UV), visible, or near,mid-, far-infrared

More information

070 ELECTRONICS WORKS EXAMINATION STRUCTURE

070 ELECTRONICS WORKS EXAMINATION STRUCTURE 070 ELECTRONICS WORKS EXAMINATION STRUCTURE The trade will be examined under the following components or subject grouping: Electronic Devices and Circuit, Radio Communication and Television. EXAMINATION

More information

ANALYSIS AND DESIGN OF ANALOG INTEGRATED CIRCUITS

ANALYSIS AND DESIGN OF ANALOG INTEGRATED CIRCUITS ANALYSIS AND DESIGN OF ANALOG INTEGRATED CIRCUITS Fourth Edition PAUL R. GRAY University of California, Berkeley PAUL J. HURST University of California, Davis STEPHEN H. LEWIS University of California,

More information

Electronic Devices 1. Current flowing in each of the following circuits A and respectively are: (Circuit 1) (Circuit 2) 1) 1A, 2A 2) 2A, 1A 3) 4A, 2A 4) 2A, 4A 2. Among the following one statement is not

More information

ALTHOUGH zero-if and low-if architectures have been

ALTHOUGH zero-if and low-if architectures have been IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 40, NO. 6, JUNE 2005 1249 A 110-MHz 84-dB CMOS Programmable Gain Amplifier With Integrated RSSI Function Chun-Pang Wu and Hen-Wai Tsao Abstract This paper describes

More information

L MOSFETS, IDENTIFICATION, CURVES. PAGE 1. I. Review of JFET (DRAW symbol for n-channel type, with grounded source)

L MOSFETS, IDENTIFICATION, CURVES. PAGE 1. I. Review of JFET (DRAW symbol for n-channel type, with grounded source) L.107.4 MOSFETS, IDENTIFICATION, CURVES. PAGE 1 I. Review of JFET (DRAW symbol for n-channel type, with grounded source) 1. "normally on" device A. current from source to drain when V G = 0 no need to

More information

Photon Count. for Brainies.

Photon Count. for Brainies. Page 1/12 Photon Count ounting for Brainies. 0. Preamble This document gives a general overview on InGaAs/InP, APD-based photon counting at telecom wavelengths. In common language, telecom wavelengths

More information

Design of a Temperature-Compensated Crystal Oscillator Using the New Digital Trimming Method

Design of a Temperature-Compensated Crystal Oscillator Using the New Digital Trimming Method Journal of the Korean Physical Society, Vol. 37, No. 6, December 2000, pp. 822 827 Design of a Temperature-Compensated Crystal Oscillator Using the New Digital Trimming Method Minkyu Je, Kyungmi Lee, Joonho

More information

Passive Sensors Technical Guide

Passive Sensors Technical Guide Application Note Version 1.0 10/17/2016 This document is a technical user guide to the working principles and usage of Smartrac passive sensor products using RF Micron Magnus S2 and S3 ICs. 1. INTRODUCTION...

More information

STUDY OF A NEW PHASE DETECTOR BASED ON CMOS

STUDY OF A NEW PHASE DETECTOR BASED ON CMOS STUDY OF A NEW PHASE DETECTOR BASED ON CMOS 1 CHEN SHUYUE, 2 WANG NU 1 Prof., School of Information Science and Engineering, Changzhou University, Changzhou213164,P.R.China 2 Graduate Student, School of

More information

WHITE PAPER SERIES / EDITION 1 BUSINESS PROCESSES & APPLICATIONS. An HF/UHF RFID Analogue Front-end Design and Analysis SOFTWARE & NETWORK HARDWARE

WHITE PAPER SERIES / EDITION 1 BUSINESS PROCESSES & APPLICATIONS. An HF/UHF RFID Analogue Front-end Design and Analysis SOFTWARE & NETWORK HARDWARE WHITE PAPER SERIES / EDITION 1 BUSINESS PROCESSES & APPLICATIONS SOFTWARE & NETWORK HARDWARE AUTOIDLABS-WP-HARDWARE-012 An HF/UHF RFID Analogue Front-end Design and Analysis Zheng Zhu, Behnam Jamali, Peter

More information

Semiconductors, ICs and Digital Fundamentals

Semiconductors, ICs and Digital Fundamentals Semiconductors, ICs and Digital Fundamentals The Diode The semiconductor phenomena. Diode performance with ac and dc currents. Diode types: General purpose LED Zener The Diode The semiconductor phenomena

More information

Power Bipolar Junction Transistors (BJTs)

Power Bipolar Junction Transistors (BJTs) ECE442 Power Semiconductor Devices and Integrated Circuits Power Bipolar Junction Transistors (BJTs) Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Power Bipolar Junction Transistor (BJT) Background The

More information

VLSI Based Design of Low Power and Linear CMOS Temperature Sensor

VLSI Based Design of Low Power and Linear CMOS Temperature Sensor VLSI Based Design of Low Power and Linear CMOS Temperature Sensor Poorvi Jain 1, Pramod Kumar Jain 2 1 Research Scholar (M.Teh), Department of Electronics and Instrumentation,SGSIS, Indore 2 Associate

More information

WINTER 14 EXAMINATION

WINTER 14 EXAMINATION Subject Code:173 WINTER 14 EXAMINATION Model Answer Important Instructions to examiners: 1) The answers should be examined by key words and not as word-to-word as given in the model answer scheme. 2) The

More information

PHYS 3152 Methods of Experimental Physics I E2. Diodes and Transistors 1

PHYS 3152 Methods of Experimental Physics I E2. Diodes and Transistors 1 Part I Diodes Purpose PHYS 3152 Methods of Experimental Physics I E2. In this experiment, you will investigate the current-voltage characteristic of a semiconductor diode and examine the applications of

More information

InP-based Waveguide Photodetector with Integrated Photon Multiplication

InP-based Waveguide Photodetector with Integrated Photon Multiplication InP-based Waveguide Photodetector with Integrated Photon Multiplication D.Pasquariello,J.Piprek,D.Lasaosa,andJ.E.Bowers Electrical and Computer Engineering Department University of California, Santa Barbara,

More information

SMART SENSOR SYSTEMS. WILEY A John Wiley and Sons, Ltd, Publication. Edited by. Gerard CM. Meijer

SMART SENSOR SYSTEMS. WILEY A John Wiley and Sons, Ltd, Publication. Edited by. Gerard CM. Meijer SMART SENSOR SYSTEMS Edited by Gerard CM. Meijer Delft University of Technology, the Netherlands SensArt, Delft, the Netherlands WILEY A John Wiley and Sons, Ltd, Publication Preface About the Authors

More information

Summer 2015 Examination

Summer 2015 Examination Summer 2015 Examination Subject Code: 17445 Model Answer Important Instructions to examiners: 1) The answers should be examined by key words and not as word-to-word as given in the model answer scheme.

More information

Comparison between Analog and Digital Current To PWM Converter for Optical Readout Systems

Comparison between Analog and Digital Current To PWM Converter for Optical Readout Systems Comparison between Analog and Digital Current To PWM Converter for Optical Readout Systems 1 Eun-Jung Yoon, 2 Kangyeob Park, 3* Won-Seok Oh 1, 2, 3 SoC Platform Research Center, Korea Electronics Technology

More information

ELECTRONIC DEVICES AND CIRCUITS

ELECTRONIC DEVICES AND CIRCUITS ELECTRONIC DEVICES AND CIRCUITS 1. At room temperature the current in an intrinsic semiconductor is due to A. holes B. electrons C. ions D. holes and electrons 2. Work function is the maximum energy required

More information

Module-3: Metal Oxide Semiconductor (MOS) & Emitter coupled logic (ECL) families

Module-3: Metal Oxide Semiconductor (MOS) & Emitter coupled logic (ECL) families 1 Module-3: Metal Oxide Semiconductor (MOS) & Emitter coupled logic (ECL) families 1. Introduction 2. Metal Oxide Semiconductor (MOS) logic 2.1. Enhancement and depletion mode 2.2. NMOS and PMOS inverter

More information