5056 series Crystal Oscillator Module ICs

Transcription

1 Crystal Oscillator Module ICs OVERVIEW The 556 series are 7 to 135MHz oscillation frequency, crystal oscillator module ICs optimized for 3rd overtone crystal elements with C 2 to 4pF. They have built-in C cancelation circuit which provides high oscillation performance at high frequency. They also have CMOS output buffer which can drive 3pF output load. FEATURES Operating supply voltage range: 2.25 to 3.63V Recommended oscillation frequency range (3rd overtone oscillator): 7 to 125MHz (2.5V±1%) 75 to 135MHz (3.3V±1%) Output load 3pF (V DD : 3.3V±1%, output frequency: 75 to 125MHz) Optimized oscillator circuit for large 3rd overtone crystal element with C 2 to 4pF -4 to 85 C operating temperature range CMOS output Output drive capability: ±8mA Standby function High impedance in standby mode, oscillator stops Power-saving pull-up resistor built-in ( pin) Wafer form (WF556xx) Chip form (CF556xx) APPLICATIONS 7. 5., size crystal oscillator modules SERIES CONFIGURATION Version name *1 Recommended oscillation frequency range *2 [MHz] Recommended C value[pf] Oscillator capacitance *3 [pf] 556CC 7 to < C < 4 556CE 1 to *1. It becomes WF556xx in case of the wafer form and CF556xx in case of the chip form. *2. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *3. The oscillator capacitance does not contain parasitic capacitance. ORDERING INFORMATION Device Package Version name WF556C -4 WF556Cx-4 Wafer form Form WF : Wafer form Oscillation frequency range CF : Chip(Die) form PAD layout C: for Wire Bonding CF556Cx-4 Chip form C G C D SEIKO NPC CORPORATION - 1

2 PAD LAYOUT (Unit: μm) (3,285) 5 4 Y 6 (,) (-3,-285) XT XTN X Chip size :.6.57mm Chip thickness : 13μm PAD size : 8μm Chip base : Vss level Coordinates at the chip center are (,). PIN DESCRIPTION and PAD COORDINATES No. Pin I/O *1 Description PAD coordinates [μm] X Y 1 XT I Crystal connection pins XTN O Crystal is connected between XT and XTN (-) ground O Output pin (+) supply voltage I Input pin controlled output state (oscillator stops when LOW), Power-saving pull-up resistor built-in *1. I: Input pin O: Output pin BLOCK DIAGRAM R PU C Cancel R F XT C G R D C D CMOS XTN SEIKO NPC CORPORATION - 2

3 SPECIFICATIONS Absolute Maximum Ratings Vss=V 556 series Parameter Symbol Condition Rating Unit Supply voltage range *1 V DD Between and -.3 to +4. V Input voltage range *1*2 V IN Input pins -.3 to +.3 V Output voltage range *1*2 V OUT Output pins -.3 to +.3 V Output current *3 I OUT pin ±2 ma Junction temperature *3 T j 125 C Storage temperature range *4 T STG Chip form, Wafer form -55 to +125 C *1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions. *2. V DD is a V DD value of recommended operating conditions. *3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded. *4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials). Recommended Operating Conditions Vss=V Parameter Symbol Condition Oscillator frequency *1 Output frequency f OSC f OUT CC ver. CE ver. CC ver. CE ver. Rating MIN TYP MAX V DD =2.97 to 3.63V V DD =2.25 to 2.75V 7 8 V DD =2.97 to 3.63V V DD =2.25 to 2.75V V DD =2.97 to 3.63V C LOUT 3pF V DD =2.25 to 2.75V C LOUT 15pF 7 8 V DD =2.97 to 3.63V C LOUT 15pF C LOUT 3pF V DD =2.25 to 2.75V C LOUT 15pF Operating supply voltage V DD Between and * V Input voltage V IN Input pins V SS V DD V Operating temperature T a C Output load capacitance ( pin) C LOUT CC ver. CE ver. V DD =2.97 to 3.63V and 75MHz f OUT 85MHz V DD =2.97 to 3.63V and 1MHz f OUT 125MHz Condition except the above 15 *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Mount a ceramic chip capacitor that is larger than.1μf proximal to IC (within approximately 3mm) between and in order to obtain stable operation of 556 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range. 3 3 Unit MHz MHz MHz pf SEIKO NPC CORPORATION - 3

4 Electrical Characteristics DC Characteristics V DD =2.25 to 3.63V, V SS =V, T a = -4 to +85 C unless otherwise noted. Parameter Symbol Condition Rating MIN TYP MAX HIGH-level output voltage V OH pin, measurement circuit 3, I OH =-8mA V DD -.4 V DD V LOW-level output voltage V OL pin, measurement circuit 3, I OL =8mA.4 V HIGH-level input voltage V IH pin, measurement circuit 4.7V DD V LOW-level input voltage V IL pin, measurement circuit 4.3V DD V Output leakage current Current consumption *1 CC ver. CE ver. I Z pin, measurement circuit 5 = Low =V DD 1 =V SS -1 I DD_3.3V Measurement circuit 1, no load V DD =3.3V 15 3 I DD_2.5V = OPEN, f OSC =8MHz V DD =2.5V 8 16 I DD_3.3V Measurement circuit 1, no load V DD =3.3V I DD_2.5V = OPEN, f OSC =125MHz V DD =2.5V 1 2 Standby current I ST Measurement circuit 1, =V SS 1 μa pull-up resistance Oscillator feedback resistance Oscillator capacitance R PU1 Measurement circuit MΩ R PU2 Measurement circuit kω CC ver. R f Design value CE ver. R f Design value CC ver. CE ver. C G Design value (a monitor pattern on a wafer is tested), C D Excluding parasitic capacitance C G Design value (a monitor pattern on a wafer is tested), C D Excluding parasitic capacitance *1. The consumption current I DD (C LOUT ) with a load capacitance(c LOUT ) connected to the pin is given by the following equation, where I DD is the no-load consumption current and f OUT is the output frequency. I DD (C LOUT )[ma] = I DD [ma]+c LOUT [pf] V DD [V] f OUT [MHz] 1-3 Unit μa ma kω pf pf SEIKO NPC CORPORATION - 4

5 AC Characteristics V DD =2.25 to 3.63V, V SS =V, T a = -4 to +85 C unless otherwise noted. Output rise time Output fall time Output duty cycle Parameter Symbol Condition t r1 t r2 t f1 t f2 DUTY Measurement circuit 1, C LOUT =15pF,.1V DD.9V DD, V DD =2.25 to 3.63V Measurement circuit 1, C LOUT =3pF,.1V DD.9V DD, V DD =2.97 to 3.63V Measurement circuit 1, C LOUT =15pF,.9V DD.1V DD, V DD =2.25 to 3.63V Measurement circuit 1, C LOUT =3pF,.9V DD.1V DD, V DD =2.97 to 3.63V Measurement circuit 1, T a =25 C, C LOUT =15pF, V DD =2.25 to 3.63V Measurement circuit 1, T a =25 C, C LOUT =3pF, V DD =2.97 to 3.63V Rating MIN TYP MAX Unit ns ns % Output disable delay time t OD Measurement circuit 2, T a =25 C, C LOUT 15pF 2 ns Note. The ratings above are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated. Timing chart.9v DD.9V DD.1V DD.1V DD Tw T DUTY measurement voltage.5v DD DUTY = Tw/T 1 (%) t r t f Figure 1.Output switching waveform V DD V IL V IH V SS t OD V DD.1V V SS.1V f OUT Hi-Z Low f OUT When goes HIGH to LOW, the output becomes high impedance. When goes LOW to HIGH, the output goes LOW once and then becomes normal output operation after having detected oscillation signals. Figure 2.Output disable and oscillation start timing chart SEIKO NPC CORPORATION - 5

6 FUNCTIONAL DESCRIPTION Standby Function When goes LOW level, the output becomes high impedance. Oscillator HIGH(Open) f OUT Operating LOW Hi-Z Stopped Power Saving Pull-up Resistor The pin pull-up resistance changes its value to R PU1 or R PU2 in response to the input level (HIGH or LOW). When is tied to LOW level, the pull-up resistance becomes large (R PU1 ), thus reducing the current consumed by the resistance. When is left open circuit or tied to HIGH level, the pull-up resistance becomes small (R PU2 ), thus internal circuit of becomes HIGH level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly. Oscillation Detection Function The 556 series incorporate an oscillation detection circuit. The oscillation detection circuit disables the output until the oscillator circuit starts up. This function avoids the problem where the oscillator does not start, due to abnormal oscillation conditions, where power is applied or when the oscillator is restarted using. C cancellation circuit Oscillation circuit with a built-in C cancellation circuit provides a fixed compensation amount to cancel the effect of the crystal C. It reduces the C parameter in the equivalent circuit, reducing the shallow negative resistance for increasing values of C. This cancellation circuit makes it easier to maintain the oscillation margin. SEIKO NPC CORPORATION - 6

7 MEASUREMENT CIRCUITS MEASUREMENT CIRCUIT 1 Measurement Parameter: I DD, I ST, DUTY, t r, t f A I DD, I ST *AC characteristics observed on the pin using an oscilloscope..1μf X'tal XT XTN SW1 Parameter SW1 SW2 I DD OFF OFF SW2 C LOUT =15pF or 3pF (Including probe capacitance) I ST ON or OFF ON DUTY, t r, t f ON OFF MEASUREMENT CIRCUIT 2 Measurement Parameter: t OD Input signal : 1Vp-p, sine wave Signal Generator.1μF 5Ω XTN.1μF 15pF R L1 =1kΩ R L2 =1kΩ Input signal : V DD V SS Function Generator 5Ω MEASUREMENT CIRCUIT 3 Measurement Parameter: V OH, V OL Input signal : 1Vp-p, sine wave Signal Generator.1μF 5Ω XTN.1μF 5Ω V OH V OL V.1μF V S ΔV V OH V S ΔV V S V OL V S adjusted so that ΔV=5 I OH V S adjusted so that ΔV=5 I OL SEIKO NPC CORPORATION - 7

8 MEASUREMENT CIRCUIT 4 Measurement Parameter: V IH, V IL X'tal XT XTN.1μF V IH, V IL V V IH : V SS V DD voltage that changes output state V IL : V DD V SS voltage that changes output state has an oscillation stop function. MEASUREMENT CIRCUIT 5 Measurement Parameter: I Z.1μF A I Z V DD or V SS MEASUREMENT CIRCUIT 6 Measurement Parameter: R PU1, R PU2.1μF R PU1 = A V I IN V PU R PU2 = V DD I PU V DD (V IN = V) I PU.7V DD (V IN =.7V DD ) SEIKO NPC CORPORATION - 8

9 REFERENCE DATA The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used. Crystal used for measurement Parameter 8MHz 125MHz C (pf) R 1 (Ω) Crystal parameters L1 C1 R1 C Current Consumption Current consumption [ma] Supply voltage [V] Current consumption [ma] Supply voltage [V] 556CC, f OSC =8MHz, T a =25 C, no load 556CE, f OSC =125MHz, T a =25 C, no load Negative Resistance 1 Frequency[MHz] Frequency[MHz] Negative Resistance [Ω] C =4pF C =3pF C =2pF Negative Resistance [Ω] C =4pF C =3pF C =2pF CC, V DD =3.3V, T a =25 C 556CC, V DD =2.5V, T a =25 C SEIKO NPC CORPORATION - 9

10 Frequency[MHz] Frequency[MHz] Negative Resistance [Ω] C =4pF C =3pF C =2pF Negative Resistance [Ω] C =4pF C =3pF C =2pF CE, V DD =3.3V, T a =25 C 556CE, V DD =2.5V, T a =25 C Measurement equipment: Agilent 4396B Impedance Analyzer The figures show the measurement result of the crystal equivalent circuit C capacitance, connected between the XT and XTN pins. They were performed with Agilent 4396B using the NPC test jig. They may vary in a measurement jig, and measurement environment. Frequency Deviation by Voltage Frequency deviation [ppm] Frequency deviation [ppm] Supply voltage [V] Supply voltage [V] 556CC, f OSC =8MHz, T a =25 C, 2.5V and 3.3V std. 556CE, f OSC =125MHz, T a =25 C, 2.5V and 3.3V std. Measurement equipment: Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 1

11 Drive Level Drive level [mw] Supply voltage [V] Drive level [mw] Supply voltage [V] 556CC, f OSC =8MHz, T a =25 C 556CE, f OSC =125MHz, T a =25 C Measurement equipment: Agilent DSO864B Digital Oscilloscope Tektronix CT-6 Current probe Agilent 53132A Frequency Counter Phase Noise Phase Noise [dbc/hz] E+1 1.E+2 1.E+3 1.E+4 1.E+5 1.E+6 1.E+7 1.E+8 Offset Freqency [Hz] Phase Noise [dbc/hz] E+1 1.E+2 1.E+3 1.E+4 1.E+5 1.E+6 1.E+7 1.E+8 Offset Freqency [Hz] 556CC, V DD =3.3V, f OSC =8MHz, T a =25 C 556CE, V DD =3.3V, f OSC =125MHz, T a =25 C Measurement equipment: Signal Source Analyzer Agilent E552B SEIKO NPC CORPORATION - 11

12 Output Waveform 556CC, V DD =3.3V, f OSC =8MHz, T a =25 C, C LOUT =15pF 556CC, V DD =3.3V, f OSC =8MHz, T a =25 C, C LOUT =3pF SEIKO NPC CORPORATION - 12

13 556CE, V DD =3.3V, f OSC =125MHz, T a =25 C, C LOUT =15pF 556CE, V DD =3.3V, f OSC =125MHz, T a =25 C, C LOUT =3pF Measurement equipment: Oscilloscope Agilent DSO864B Differential probe 1134A (Probe head E2678A) SEIKO NPC CORPORATION - 13

14 Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter Products ) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass production products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 14-32, Japan Telephone: Facsimile: sales@npc.co.jp ND1323-E SEIKO NPC CORPORATION - 14