5054H series, 5054xF Crystal Oscillator Module ICs

Transcription

1 55H series, 55xF Crystal Oscillator Module ICs OVERVIEW The 55H series, 55xF are miniature crystal oscillator module ICs supported MHz to 17MHz 3rd overtone oscillation mode. The Oscillator circuit stage has voltage regulator drive, significantly reducing current consumption and crystal current, compared with existing devices, and significantly reducing the oscillator characteristics supply voltage dependency. There are 3 pad layout package options available for optimized mounting, making these devices ideal for miniature crystal oscillators. FEATURES Wide range of operating supply voltage: 1.7 to 3.63V (HxA to HxE ver.), 2.25 to 3.63V (xf ver.) Recommended oscillation frequency range (3rd overtone oscillator): to 135MHz (HxA to HxE ver.), 133 to 17MHz (xf ver.) Operating temperature range: - to 125 C (HxA to HxE ver.), - to 15 C (xf ver.) Regulated voltage drive oscillator circuit for reduced power consumption and crystal drive current Standby function High impedance in standby mode, oscillator stops Optimized low crystal drive current oscillation for miniature crystal units Output drive capability: ±8mA 5±5% output duty (1/2V DD ) 15pF output load capacitance 3 pad layout options for mounting 55(H)Ax for Flip Chip Bonding, 55(H)Bx, 55(H)Cx for Wire Bonding Wafer form WF55(H)xx Chip form CF55(H)xx APPLICATIONS , , size miniature crystal oscillator modules SERIES CONFIGURATION Operating supply voltage range[v] Recommended oscillation frequency range *1 [MHz] C cancellation / Recommended C value [pf] PAD layout and Version name *2 Flip Chip Bonding Wire BondingⅠ Wire BondingⅡ 1.7 to 3.63 to 5 No/ 2 55HAA - 55HCA 1.7 to to 65 No/ 2 55HAB - 55HCB 1.7 to to 85 Yes/1 to 2 55HAC 55HBC 55HCC 1.7 to to 15 Yes/1 to 2 55HAD 55HBD 55HCD 1.7 to to 135 Yes/1 to 2 55HAE 55HBE 55HCE 2.25 to to 17 Yes/1 to 2 55AF 55BF 55CF *1. The oscillation frequency is a yardstick value derived from the crystal used for Seiko NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. It becomes WF55(H)xx in case of the wafer form and CF55(H)xx in case of the chip form. ORDERING INFORMATION Device Package Version name WF55(H) - WF55(H)xx-x Wafer form Form WF : Wafer form Chip thickness 5: 1μm CF : Chip(Die) form Oscillation frequency range CF55(H)xx-x Chip form PAD layout A: for Flip Chip Bonding B: for Wire Bonding TypeⅠ C: for Wire Bonding TypeⅡ SEIKO NPC CORPORATION - 1

2 55H series, 55xF BLOCK DIAGRAM R PU V Reg C Cancel *1 R F CMOS XT R D C G C D XTN *1. The 55HxA, HxB versions don t have built-in C cancellation circuit. PAD LAYOUT 55(H)Ax 55(H)Bx 55(H)Cx for Flip Chip Bonding for Wire Bonding TypeⅠ for Wire Bonding TypeⅡ (3,285) (3,285) (3,285) Y 6 (,) 3 Y 6 (,) 3 Y 6 (,) (-3,-285) XT XTN (-3,-285) XTN XT (-3,-285) XT XTN X X X Chip size:.6mm.57mm, PAD size: 8μm 8μm, Chip base: V SS level Coordinates at the chip center are (,). PAD COORDINATES PIN DESCRIPTION PAD No. PAD coordinates[μm] X Y 55 (H)Ax PAD No. 55 (H)Bx 55 (H)Cx Pin Function XT Crystal connection pins XTN Crystal is connected between XT and XTN (+) supply voltage Output pin (-) ground Input pin controlled output state (oscillator stops when Low), Power-saving pull-up resistor built-in SEIKO NPC CORPORATION - 2

3 SPECIFICATIONS Absolute Maximum Ratings V SS =V 55H series, 55xF Parameter Symbol Condition Rating Unit Supply voltage range *1 V DD Between and -.3 to +. V Input voltage range *1*2 V IN Input pins -.3 to +.3 V Output voltage range *1*2 V OUT Output pins -.3 to +.3 V Output current *3 I OUT pin ±2 ma Junction temperature *3 T j 15 C Storage temperature range * T STG Chip form, Wafer form -55 to +15 C *1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions. *2. V DD is a V DD value of recommended operating conditions. *3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded. *. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials). Recommended Operating Conditions V SS =V Parameter Symbol Condition MIN TYP MAX Unit Oscillator frequency *1 Output frequency f OSC f OUT V DD =1.7 to 3.63V 55HxA ver HxB ver HxC ver HxD ver HxE ver V DD =2.25 to 3.63V 55xF ver V DD =1.7 to 3.63V, C LOUT 15pF 55HxA ver HxB ver HxC ver HxD ver HxE ver V DD =2.25 to 3.63V, C LOUT 15pF 55xF ver HxA ~ 55HxE ver. 1.7 Operating supply voltage V DD Between and *2 55xF ver MHz MHz V Input voltage V IN Input pins V SS - V DD V Operating temperature T a 55HxA ~ 55HxE ver xF ver Output load capacitance C L output pf *1. The oscillation frequency is a yardstick value derived from the crystal used for Seiko NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Mount a ceramic chip capacitor that is larger than.1μf proximal to IC (within approximately 3mm) between and in order to obtain stable operation of 55 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range. C SEIKO NPC CORPORATION - 3

4 Electrical Characteristics DC Characteristics (HxA to HxE versions) 55H series, 55xF V DD =1.7 to 3.63V, V SS =V, T a = - to +125 C unless otherwise noted. Parameter Symbol Condition MIN TYP MAX Unit HIGH-level output voltage LOW-level output voltage V OH V OL pin, measurement circuit 3, I OH =-8mA, T a = - to +85 C V DD -. - V DD pin, measurement circuit 3, I OH =-8mA V DD V DD pin, measurement circuit 3, I OL =8mA, T a = - to +85 C -. pin, measurement circuit 3, I OL =8mA -.5 HIGH-level input voltage V IH pin, measurement circuit.7v DD - - V LOW-level input voltage V IL pin, measurement circuit - -.3V DD V Output leakage current Current consumption *1 Standby current pull-up resistance I Z I DD I ST pin, measurement circuit 5 = Low 55HxA(f OSC ), measurement circuit 1 no load, = OPEN f OSC =5MHz, f OUT =5MHz 55HxB(f OSC ), measurement circuit 1 no load, = OPEN f OSC =65MHz, f OUT =65MHz 55HxC(f OSC ), measurement circuit 1 no load, = OPEN f OSC =85MHz, f OUT =85MHz 55HxD(f OSC ), measurement circuit 1 no load, = OPEN f OSC =1MHz, f OUT =1MHz 55HxE(f OSC ), measurement circuit 1 no load, = OPEN f OSC =133MHz, f OUT =133MHz Measurement circuit 1, = V SS, T a = - to +85 C =V DD =V SS V DD =3.3V V DD =2.5V V DD =1.8V V DD =3.3V V DD =2.5V V DD =1.8V V DD =3.3V V DD =2.5V V DD =1.8V V DD =3.3V V DD =2.5V V DD =1.8V V DD =3.3V V DD =2.5V V DD =1.8V Measurement circuit 1, = V SS R PU1 Measurement circuit MΩ R PU2 Measurement circuit kω 55HxA ver. Design value V V μa ma μa Oscillator feedback resistance R F 55HxB ver. Design value HxC ver. Design value HxD ver. Design value kω 55HxE ver. Design value SEIKO NPC CORPORATION -

5 55H series, 55xF V DD =1.7 to 3.63V, V SS =V, T a = - to +125 C unless otherwise noted. Parameter Symbol Condition MIN TYP MAX Unit Oscillator capacitance C G 55HxA ver Design value (a monitor pattern on a wafer is tested) C D Excluding parasitic capacitance C G 55HxB ver Design value (a monitor pattern on a wafer is tested) C D Excluding parasitic capacitance C G 55HxC ver Design value (a monitor pattern on a wafer is tested) C D Excluding parasitic capacitance C G 55HxD ver Design value (a monitor pattern on a wafer is tested) C D Excluding parasitic capacitance C G 55HxE ver.... Design value (a monitor pattern on a wafer is tested) C D Excluding parasitic capacitance *1. The consumption current I DD (C LOUT ) with a load capacitance (C LOUT ) connected to the pin is given by the following equation, where I DD is the no-load consumption current and f OUT is the output frequency. I DD (C LOUT )[ma] = I DD [ma]+c LOUT [pf] f OUT [MHz] 1-3 pf SEIKO NPC CORPORATION - 5

6 55H series, 55xF DC Characteristics (xf version) V DD =2.25 to 3.63V, V SS =V, T a = - to +15 C unless otherwise noted. Parameter Symbol Condition MIN TYP MAX Unit HIGH-level output voltage V OH pin, measurement circuit 3, I OH =-8mA, T a = - to +85 C V DD -. - V DD V LOW-level output voltage V OL pin, measurement circuit 3, I OH =-8mA V DD V DD pin, measurement circuit 3, I OL =8mA, T a = - to +85 C *1. The consumption current I DD (C LOUT ) with a load capacitance (C LOUT ) connected to the pin is given by the following equation, where I DD is the no-load consumption current and f OUT is the output frequency. I DD (C LOUT )[ma] = I DD [ma]+c LOUT [pf] f OUT [MHz] pin, measurement circuit 3, I OL =8mA -.5 HIGH-level input voltage V IH pin, measurement circuit.7v DD - - V LOW-level input voltage V IL pin, measurement circuit - -.3V DD V Output leakage current Current consumption *1 Standby current pull-up resistance Oscillator feedback resistance Oscillator capacitance I Z I DD I ST pin, measurement circuit 5 = Low, T a = - to +85 C pin, measurement circuit 5 = Low 55xF(f OSC ), measurement circuit 1, no load, = OPEN, f OSC =17MHz, f OUT =17MHz Measurement circuit 1, = V SS T a = - to +85 C =V DD =V SS =V DD =V SS V DD =3.3V V DD =2.5V Measurement circuit 1, = V SS R PU1 Measurement circuit MΩ R PU2 Measurement circuit kω R F Design value kω C G Design value (a monitor pattern on a wafer is tested)... C D Excluding parasitic capacitance V μa ma μa pf SEIKO NPC CORPORATION - 6

7 55H series, 55xF AC Characteristics V DD =1.7 to 3.63V, V SS =V, T a = - to +125 C unless otherwise noted. Parameter Symbol Condition MIN TYP MAX Unit Output rise time t r1 t r2 Measurement circuit 1 C LOUT =15pF.1V DD to.9v DD V DD =2.25 to 3.63V Measurement circuit 1 C LOUT =15pF.1V DD to.9v DD V DD =1.7 to 2.25V HxA, HxB, HxC, HxD, HxE ver T a = - to +15 C, xf ver T a = - to +85 C HxA, HxB, HxC, HxD, HxE ver HxA, HxB, HxC, HxD, HxE ver ns Output fall time t f1 t f2 Measurement circuit 1 C LOUT =15pF.9V DD to.1v DD V DD =2.25 to 3.63V Measurement circuit 1 C LOUT =15pF.9V DD to.1v DD V DD =1.7 to 2.25V HxA, HxB, HxC, HxD, HxE ver T a = - to +15 C, xf ver T a = - to +85 C HxA, HxB, HxC, HxD, HxE ver HxA, HxB, HxC, HxD, HxE ver ns Output duty cycle DUTY Measurement circuit 1 C LOUT =15pF T a =25 C V DD =1.7 to 3.63V HxA, HxB, HxC, HxD, HxE ver V DD =2.25 to 3.63V, xf ver % Output disable delay time t OD Measurement circuit 2, T a =25 C, C LOUT 15pF ns Timing chart.9v DD.9.1 Tw T.1 DUTY measurement voltage.5v DD DUTY = Tw/T 1 (%) t r t f Figure 1.Output switching waveform V DD V SS V IL V IH V DD t OD.1V.5V DD V SS.1V f OUT Hi-Z Low f OUT Figure 2.Output disable delay (t OD ) timing chart SEIKO NPC CORPORATION - 7

8 FUNCTIONAL DESCRIPTION Function When goes Low level, the output becomes high impedance. 55H series, 55xF Oscillator High(Open) f OUT Operating Low Hi-Z Stopped Power Saving Pull-up Resistor The pin pull-up resistance changes its value to R PU1 or R PU2 in response to the input level (High or Low). When is tied to Low level, the pull-up resistance becomes large (R PU1 ), thus reducing the current consumed by the resistance. When is left open circuit or tied to High level, the pull-up resistance becomes small (R PU2 ), thus internal circuit of becomes High level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly. Oscillation Detection Function The 55 series incorporate an oscillation detection circuit. The oscillation detection circuit disables the output until the oscillator circuit starts up. This function avoids the problem where the oscillator does not start, due to abnormal oscillation conditions, where power is applied or when the oscillator is restarted using. C cancellation circuit Oscillation circuit with a built-in C cancellation circuit provides a fixed compensation amount to cancel the effect of the crystal C. It reduces the C parameter in the equivalent circuit, reducing the shallow negative resistance for increasing values of C. This cancellation circuit makes it easier to maintain the oscillation margin. SEIKO NPC CORPORATION - 8

9 55H series, 55xF MEASUREMENT CIRCUITS Measurement circuit 1 Measurement Parameter: I DD, I ST, DUTY, t r, t f A I DD, I ST *AC characteristics observed on the pin using an oscilloscope..1μf X'tal XT XTN SW1 Parameter SW1 SW2 I DD OFF OFF SW2 C LOUT =15pF (Including probe capacitance) I ST ON or OFF ON DUTY, t r, t f ON OFF Measurement circuit 2 Measurement Parameter: t OD Input signal : 1Vp-p, sine wave Signal Generator.1μF 5Ω XTN.1μF 15pF R L1 =1kΩ R L2 =1kΩ Input signal :V DD V SS Function Generator 5Ω Measurement circuit 3 Measurement Parameter: V OH, V OL Input signal : 1Vp-p, sine wave Signal Generator.1μF 5Ω XTN.1μF 5Ω V OH V OL V.1μF V S ΔV V OH V S ΔV V S V OL V S adjusted so that ΔV=5 I OH V S adjusted so that ΔV=5 I OL SEIKO NPC CORPORATION - 9

10 55H series, 55xF Measurement circuit Measurement Parameter: V IH, V IL X'tal XT XTN.1μF V IH, V IL V V IH : V SS V DD voltage that changes output state V IL : V DD V SS voltage that changes output state Measurement circuit 5 Measurement Parameter: I Z.1μF A I Z V DD or V SS Measurement circuit 6 Measurement Parameter: R PU1, R PU2.1μF V IN V A I PU R PU1 = R PU2 = V DD I PU V DD (V IN = V) I PU.7V DD (V IN =.7V DD ) SEIKO NPC CORPORATION - 1

11 55H series, 55xF DATA REFERENCE CHARACTERISTICS EXAMPLE (55 Typical Characteristics) The characters given below were measured using a Seiko NPC standards jig and standard crystal element, and do not represent a guarantee of device characteristics. Note that the characteristics will vary due to measurement environement and the oscillator element used. Crystal used for measurement Parameter 5MHz 65MHz 8MHz 1MHz 125MHz 17MHz C (pf) R 1 (Ω) Crystal parameters L 1 C 1 R 1 C Current Consumption Current Consumption Characteristics T a =25, No load Current consumption [ma] l HxA HxB HxC HxD HxE xf V 2.5 V 1.8 V Frequency [MHz] SEIKO NPC CORPORATION - 11

12 55H series, 55xF Negative Resistance Negative Resistance Characteristics 55HxB version, Ta= C=2pF -7 C=pF(None) C=1pF =1.8V -8 Negative Resistance [Ω] Negative Resistance [Ω] Negative Resistance Characteristics 55HxA version, Ta= C=2pF -6 C=1pF C=pF(None) -7 =1.8V -8 =2.5V -9-5 =2.5V -9 =3.3V =3.3V C=2pF =1.8V C=1pF =2.5V C=pF(None) -9 =3.3V -1 C=2pF =1.8V C=1pF =2.5V C=pF(None) =3.3V Frequency [MHz] C=2pF C=1pF C=pF(None) -7 =1.8V -8 =2.5V -9 =3.3V Frequency [MHz] Negative Resistance [Ω] Negative Resistance Characteristics 55xF version, Ta= Frequency [MHz] Negative Resistance Characteristics 55HxE version, Ta=25 Negative Resistance [Ω] 12 Negative Resistance Characteristics 55HxD version, Ta=25 Negative Resistance [Ω] Negative Resistance [Ω] Negative Resistance Characteristics 55HxC version, Ta= Frequency [MHz] Frequency [MHz] C=2pF C=1pF -7 C=pF(None) -8 =2.5V -9 =3.3V Frequency [MHz] Measurement equipment: Agilent 396B Impedance Analyzer The figures show the measurement result of the crystal equivalent circuit C capacitance, connected between the XT and XTN pins. They were performed with Agilent 396B using the Seiko NPC test jig. They may vary in a measurement jig, and measurement environment. SEIKO NPC CORPORATION - 12

13 55H series, 55xF Frequency Deviation by Voltage Frequency Deviation Characteristics 55HxA version, f OSC =5MHz, T a =25 ppm: V DD =2.5V Frequency Deviation Characteristics 55HxB version, f OSC =65MHz, T a =25 ppm: V DD =2.5V 5 5 Frequency Deviation [ppm] Frequency Deviation [ppm] Frequency Deviation Characteristics 55HxC version, f OSC =8MHz, T a =25 ppm: V DD =2.5V Frequency Deviation Characteristics 55HxD version, f OSC =1MHz, T a =25 ppm: V DD =2.5V 5 5 Frequency Deviation [ppm] Frequency Deviation [ppm] Frequency Deviation Characteristics 55HxE version, f OSC =125MHz, T a =25 ppm: V DD =2.5V Frequency Deviation Characteristics 55xF version, f OSC =17MHz, T a =25 ppm: V DD =2.5V Frequency Deviation [ppm] Frequency Deviation [ppm] Measurement equipment: Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 13

14 55H series, 55xF Drive Level Drive Level Characteristics 55HxA version, f OSC =5MHz, T a =25 C Drive Level Characteristics 55HxB version, f OSC =65MHz, T a =25 C Drive Level [μw] Drive Level [μw] Drive Level Characteristics 55HxC version, f OSC =85MHz, T a =25 C Drive Level Characteristics 55HxD version, f OSC =1MHz, T a =25 C Drive Level [μw] Drive Level [μw] Drive Level Characteristics 55HxE version, f OSC =125MHz, T a =25 C Drive Level Characteristics 55xF version, f OSC =17MHz, T a =25 C 3 8 Drive Level [μw] Drive Level [μw] Measurement equipment: Agilent DSO86B Digital Oscilloscope Tektronix CT-6 Current probe Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 1

15 55H series, 55xF Phase Noise - Phase Noise Characteristics 55HxA version, V DD =3.3V, f OSC =5MHz, T a =25 - Phase Noise Characteristics 55HxB version, V DD =3.3V, f OSC =65MHz, T a = Phase Noise [dbc/hz] Phase Noise [dbc/hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] Phase Noise Characteristics 55HxC version, V DD =3.3V, f OSC =8MHz, T a =25 Phase Noise Characteristics 55HxD version, V DD =3.3V, f OSC =1MHz, T a = Phase Noise (dbc/hz) Phase Noise [dbc/hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] Phase Noise Characteristics 55HxE version, V DD =3.3V, f OSC =125MHz, T a =25 Phase Noise Characteristics 55xF version, V DD =3.3V, f OSC =17MHz, T a = Phase Noise [dbc/hz] Phase Noise [dbc/hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] E+1 1.E+2 1.E+3 1.E+ 1.E+5 1.E+6 1.E+7 1.E+8 Offset Frequency [Hz] Measurement equipment: Signal Source Analyzer Agilent E552B SEIKO NPC CORPORATION - 15

16 55H series, 55xF Output Waveform 55HxA version, V DD =3.3V, f OUT =5MHz, C LOUT =15pF, T a =25 C 55HxB version, V DD =3.3V, f OUT =65MHz, C LOUT =15pF, T a =25 C SEIKO NPC CORPORATION - 16

17 55H series, 55xF 55HxC version, V DD =3.3V, f OUT =85MHz, C LOUT =15pF, T a =25 C 55HxD version, V DD =3.3V, f OUT =16.25MHz, C LOUT =15pF, T a =25 C SEIKO NPC CORPORATION - 17

18 55H series, 55xF 55HxE version, V DD =3.3V, f OUT =133MHz, C LOUT =15pF, T a =25 C 55xF version, V DD =3.3V, f OUT =17MHz, C LOUT =15pF, T a =25 C Measurement equipment: Agilent DSO86B Oscilloscope Agilent 113A Differential Probe Agilent E2678A Probe Head SEIKO NPC CORPORATION - 18

19 55H series, 55xF Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter Products ) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. Seiko NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements.. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass production products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 1-32, Japan Telephone: Facsimile: sales@npc.co.jp ND151-E SEIKO NPC CORPORATION - 19