Barry Olawsky Hewlett Packard (1/16/2007)
|
|
- Sheila Glenn
- 5 years ago
- Views:
Transcription
1 SAS-2 Transmitter/Receiver S-Parameter Measurement (07-012r1) Barry Olawsky Hewlett Packard (1/16/2007) r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 1
2 S-Parameter Measurement S11 S12 S13 S14 S21 S22 S23 S24 S31 S32 S33 S34 S41 S42 S43 S44 Four Port S-Parameter Table r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 2
3 Balanced S-Parameter Measurement Sdd11 Sdd12 Sdc11 Sdc12 Sdd21 Sdd22 Sdc21 Sdc22 Scd11 Scd12 Scc11 Scc12 Scd21 Scd22 Scc21 Scc22 Two Port Balanced (differential) S-Parameter Table r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 3
4 S-Parameter Terminology For unbalanced terms the form is, S <measured port><injected port> For example, S 32 is the response measured at port 3 from the signal injected into port 2 For balanced terms the form is, S <mode of measured port><mode of injected port> <measured port><injected port> For example, S dc12 is the differential response measured at ports 1/3 from a common mode signal injected on both ports 2 and 4 (see balanced measurement diagram) Correctly interpreting the common mode to differential conversion measurement is difficult. More on that topic later. This presentation will focus on the various S 11 terms r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 4
5 Balanced Port Values Differential Mode Common Mode Voltage VA VB V A + VB 2 I A V A A Current IA IB 2 I A + IB I B V B B Impedance Z DM = V I DM DM Z CM = V I CM CM Balanced 1-port r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 5
6 Reflection Coefficient (Γ) and S 11 How do the S 11 terms correlate to the reflection coefficient? The reflection coefficient (Γ) is the ratio of the amplitudes of the reflected wave to the incident wave It can be computed from the impedances of the incident media and termination The magnitude of Γ is ρ and the S 11 magnitude is then V Γ = V reflected incident = Z Z Incident Wave Reflected Wave t t + Z Z i i Termination S11 = 20 log( ρ) Z incident Z termination r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 6
7 Comparison of ρ and S 11 Results To verify the interpretation of the S 11 terms is correct, the following circuit was constructed with various termination values Both S 11 and ρ where measured. S 11 was then verified using the equations presented earlier Incident Wave 50Ω 50 Ohm +V S Transmission Line R TERMINATION Reflected Wave Incident Wave 50Ω 50 Ohm -V S Transmission Line R TERMINATION Reflected Wave r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 7
8 Comparison of ρ and S 11 Results In the following case the differential impedance matches the transmission line at 100Ω but the common mode impedance is 22.2Ω. Since the legs are mismatched a conversion is also introduced. We will introduce a common mode signal and analyze the conversion. Incident Wave 50Ω 50 Ohm +V S Transmission Line 66.7Ω Reflected Wave Incident Wave 50Ω 50 Ohm +V S Transmission Line 33.3Ω Reflected Wave r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 8
9 Comparison of ρ and S 11 Results Calculating the reflection coefficient ρ for the first leg we obtain is and for the second Also note that the results match very closely to the measured values For the reflected wave the first leg experiences a positive transitioning signal and the second leg a negative transitioning one ρ = = ρ = = r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 9
10 Comparison of ρ and S 11 Results The reflected waves can be thought of as a signal injected into the instrumentation by the DUT. The same balanced port equations apply but in the opposite direction The reflected waves can be expressed as a ratio of the original signal injected into the termination network To determine S DC11 for the DUT, we merely need to interpret the reflected currents as differential mode signals I A V A I A(reflected) = 0.143* IA I B V B I B(reflected) = 0.200* IB A B Balanced 1-port r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 10
11 Comparison of ρ and S 11 Results The equation for differential mode currents presented earlier is (I A -I B )/2. Using the calculated values we obtain: ( 0.200) 2 SDC = = 20 log(0.172) = 15.3 Below 1 GHz, this value compares well with the actual measurement shown to the right db Measured Scd11 and Sdc GHz Scd11 Sdc r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 11
12 Full S DC11 Equation The equation used in the above comparison is: ρ 20*log( pos _ leg ρ 2 neg Assuming identical impedance for both legs of the testing fixture we obtain _ leg ) DUT Test Board Transmission Lines on DUT Fixture + Tx or Rx - 20*log( R R pos pos term term + Z Z fixture fixture 2 R R neg neg term term + Z Z fixture fixture ) r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 12
13 What do S 11 values mean? The fixture shown below can be used to demonstrate the relationship between S11 and S21 db S S GHz S21 The that S11 and S21 are the relative amplitude and not power db S21-4 GHz r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 13
14 What do S 11 values mean? For interfaces with impedance discontinuities, power is conserved. The sum of the reflected and transferred power is equal to the injected power minus the power dissipated across the span of the discontinuity. Signal amplitude is determined by the reflection coefficient. S 11 is not a direct indicator of what S 21 is GHz GHz Power Reflection / Transmission 0.0 0% 50% 100% 150% Ratio of Incident Power Signal Amplitude Reflection / Transmission 0.0 0% 50% 100% 150% Ratio of Incident Signal Power Reflected Power Transmitted Signal Reflected Signal Transmitted r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 14
15 Vendor Samples To the right are S DD11 measurements of two test boards provided by two different PHY suppliers The measurements are made with power on and off Test board effects were not de-embedded from the measurements db db Vendor A Measurements GHz Vendor B Measurements GHz rx pwr off rx pwr on tx pwr off tx pwr on rx pwr off 1 rx pwr off 2 rx pwr off r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 15
16 Reference Material Agilent has two application notes with materials used in this presentation. Both are good for further reading on this topic. 1. Characterization of balanced digital components and communication paths 2. Advanced measurements and modeling of differential devices r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 16
17 07-012r1 SAS-2 Transmitter/Receiver S-Parameter Measurement 17
SAS-2 Transmitter/Receiver S- Parameter Measurement (07-012r0) Barry Olawsky Hewlett Packard (1/11/2007)
SAS-2 Transmitter/Receiver S- Parameter Measurement (07-012r0) Barry Olawsky Hewlett Packard (1/11/2007) 07-012r0 SAS-2 Transmitter/Receiver S-Parameter Measurement 1 S-Parameter Measurement S11 S12 S13
More informationUNH IOL SAS Consortium SAS-3 Phy Layer Test Suite v1.0
SAS-3 Phy Layer Test Suite v1.0 InterOperability Lab 121 Technology Drive, Suite 2 Durham, NH 03824 (603) 862-0701 Cover Letter XX/XX/XXXX Vendor Company Vendor: Enclosed are the results from the SAS-3
More informationAgilent MOI for MIPI D-PHY Conformance Tests Revision 1.00 Dec-1, 2011
Revision 1.00 Dec-1, 2011 Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR 1 Table of Contents 1. Modification Record... 4 2.
More informationPreliminary Users Manual for the Self Contained Return Loss and Cable Fault Test Set with Amplified Wideband Noise Source Copyright 2001 Bryan K.
Preliminary Users Manual for the Self Contained Return Loss and Cable Fault Test Set with Amplified Wideband Noise Source Copyright 2001 Bryan K. Blackburn Self Contained Test Set Test Port Regulated 12
More informationAgilent MOI for MIPI M-PHY Conformance Tests Revision Mar 2014
Revision 1.10 20 Mar 2014 Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR 1 Table of Contents 1. Modification Record... 4 2.
More informationHow Return Loss Gets its Ripples
Slide -1 How Return Loss Gets its Ripples an homage to Rudyard Kipling Dr. Eric Bogatin, Signal Integrity Evangelist, Bogatin Enterprises @bethesignal Downloaded handouts from Fall 211 Slide -2 45 Minute
More informationApplication Note 5525
Using the Wafer Scale Packaged Detector in 2 to 6 GHz Applications Application Note 5525 Introduction The is a broadband directional coupler with integrated temperature compensated detector designed for
More informationSWR/Return Loss Measurements Using System IIA
THE GLOBAL SOURCE FOR PROVEN TEST SWR/Return Loss Measurements Using System IIA SWR/Return Loss Defined Both SWR and Return Loss are a measure of the divergence of a microwave device from a perfect impedance
More informationSAS-2 6Gbps PHY Specification
SAS-2 6 PHY Specification T10/07-063r5 Date: April 25, 2007 To: T10 Technical Committee From: Alvin Cox (alvin.cox@seagate.com) Subject: SAS-2 6 PHY Electrical Specification Abstract: The attached information
More informationSignal Integrity Tips and Techniques Using TDR, VNA and Modeling. Russ Kramer O.J. Danzy
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling Russ Kramer O.J. Danzy Simulation What is the Signal Integrity Challenge? Tx Rx Channel Asfiakhan Dreamstime.com - 3d People Communication
More informationBill Ham Martin Ogbuokiri. This clause specifies the electrical performance requirements for shielded and unshielded cables.
098-219r2 Prepared by: Ed Armstrong Zane Daggett Bill Ham Martin Ogbuokiri Date: 07-24-98 Revised: 09-29-98 Revised again: 10-14-98 Revised again: 12-2-98 Revised again: 01-18-99 1. REQUIREMENTS FOR SPI-3
More informationCAUI-4 Consensus Building, Specification Discussion. Oct 2012
CAUI-4 Consensus Building, Specification Discussion Oct 2012 ryan.latchman@mindspeed.com 1 Agenda Patent Policy: - The meeting is an official IEEE ad hoc. Please review the patent policy at the following
More informationKeysight MOI for MIPI D-PHY Conformance Tests Revision Oct, 2014
Revision 1.10 10-Oct, 2014 Keysight Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR 1 Table of Contents 1. Modification Record... 4
More informationLab 2 Radio-frequency Coils and Construction
ab 2 Radio-frequency Coils and Construction Background: In order for an MR transmitter/receiver coil to work efficiently to excite and detect the precession of magnetization, the coil must be tuned to
More informationValidation & Analysis of Complex Serial Bus Link Models
Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract
More informationProduct Note 75 DLPS, a Differential Load Pull System
63 St-Regis D.D.O, Quebec H9B 3H7, Canada Tel 54-684-4554 Fax 54-684-858 E-mail: info@ focus-microwaves.com Website: http://www.focus-microwaves.com Product Note 75 DLPS, a Differential Load Pull System
More informationHow to Read S-Parameters Like a Book or Tapping Into Some Of The Information Buried Inside S- Parameter Black Box Models
Slide -1 Bogatin Enterprises and LeCroy Corp No Myths Allowed Webinar Time before start: How to Read S-Parameters Like a Book or Tapping Into Some Of The Information Buried Inside S- Parameter Black Box
More information04-370r1 SAS-1.1 Merge IT and IR with XT and XR 1 December 2004
To: T10 Technical Committee From: Rob Elliott, HP (elliott@hp.com) Date: 1 December 2004 Subject: 04-370r1 SAS-1.1 Merge and with XT and XR Revision history Revision 0 (6 November 2004) First revision
More informationNetwork Analysis Seminar. Cables measurement
Network Analysis Seminar Cables measurement Agenda 1. Device Under Test: Cables & Connectors 2. Instrument for cables testing: Network Analyzer 3. Measurement: Frequency Domain 4. Measurement: Time Domain
More informationSMT Hybrid Couplers, RF Parameters and Applications
SMT Hybrid Couplers, RF Parameters and Applications A 90 degree hybrid coupler is a four-port device used to equally split an input signal into two signals with a 90 degree phase shift between them. The
More informationVSWR MEASUREMENT APPLICATION NOTE ANV004.
APPLICATION NOTE ANV004 Bötelkamp 31, D-22529 Hamburg, GERMANY Phone: +49-40 547 544 60 Fax: +49-40 547 544 666 Email: info@valvo.com Introduction: VSWR stands for voltage standing wave ratio. The ratio
More informationPhysical Test Setup for Impulse Noise Testing
Physical Test Setup for Impulse Noise Testing Larry Cohen Overview Purpose: Use measurement results for the EM coupling (Campbell) clamp to determine a stable physical test setup for impulse noise testing.
More informationThe data rates of today s highspeed
HIGH PERFORMANCE Measure specific parameters of an IEEE 1394 interface with Time Domain Reflectometry. Michael J. Resso, Hewlett-Packard and Michael Lee, Zayante Evaluating Signal Integrity of IEEE 1394
More informationFast network analyzers also for balanced measurements
GENERAL PURPOSE Network analyzers 44297/5 FIG 1 The new Vector Network Analyzer R&S ZVB, here with four-port configuration. Vector Network Analyzers R&S ZVB Fast network analyzers also for balanced measurements
More informationVector Network Analyzer Application note
Vector Network Analyzer Application note Version 1.0 Vector Network Analyzer Introduction A vector network analyzer is used to measure the performance of circuits or networks such as amplifiers, filters,
More informationMIPI M-PHY
MIPI M-PHY MIPI M-PHY* Measurements & Setup Library Methods of Implementation (MOI) for Verification, Debug, Characterization, Conformance and Interoperability Test 077-051800 www.tektronix.com Copyright
More information04-370r2 SAS-1.1 Merge IT and IR with XT and XR 9 December 2004
To: T10 Technical Committee From: Rob Elliott, HP (elliott@hp.com) Date: 9 December 2004 Subject: 04-370r2 SAS-1.1 Merge and with XT and XR Revision history Revision 0 (6 November 2004) First revision
More informationTECHNICAL INFORMATION
TECHNICAL INFORMATION TECHNOLOGY Y-Junction circulator PORT 1 PORT 2 PORT 3 FIG. 1 The Y-junction circulator uses spinel ferrites or garnet ferrites in the presence of a magnetic bias field, to provide
More information40 AND 100 GIGABIT ETHERNET CONSORTIUM
40 AND 100 GIGABIT ETHERNET CONSORTIUM Clause 93 100GBASE-KR4 PMD Test Suite Version 1.0 Technical Document Last Updated: October 2, 2014 40 and 100 Gigabit Ethernet Consortium 121 Technology Drive, Suite
More informationFIBRE CHANNEL CONSORTIUM
FIBRE CHANNEL CONSORTIUM FC-PI-2 Clause 9 Electrical Physical Layer Test Suite Version 0.21 Technical Document Last Updated: August 15, 2006 Fibre Channel Consortium Durham, NH 03824 Phone: +1-603-862-0701
More informationSAS-2 6Gbps PHY Specification
SAS-2 6Gbps PHY Speciication T10/07-063r2 Date: March 8, 2007 To: T10 Technical Committee From: Alvin Cox (alvin.cox@seagate.com) Subject: SAS-2 6Gbps PHY Electrical Speciication Abstract: The attached
More informationLAB MANUAL EXPERIMENT NO. 9
LAB MANUAL EXPERIMENT NO. 9 Aim of the Experiment: 1. Measure the characteristics of a Directional Coupler. 2. Use of the Directional Coupler and Ratio Meter to construct a Scalar Network Analyzer for
More information10GECTHE 10 GIGABIT ETHERNET CONSORTIUM
10GECTHE 10 GIGABIT ETHERNET CONSORTIUM 10GBASE-T Clause 55 PMA Electrical Test Suite Version 1.0 Technical Document Last Updated: September 6, 2006, 3:00 PM 10 Gigabit Ethernet Consortium 121 Technology
More informationEffect of slots in reference planes on signal propagation in single and differential t-lines
Simbeor Application Note #2007_09, November 2007 2007 Simberian Inc. Effect of slots in reference planes on signal propagation in single and differential t-lines Simberian, Inc. www.simberian.com Simbeor:
More informationDate: October 4, 2004 T10 Technical Committee From: Bill Ham Subject: SAS 1.1 PHY jitter MJSQ modifications
SAS 1.1 PHY jitter MJSQ modifications T10/04-332r0 Date: October 4, 2004 To: T10 Technical Committee From: Bill Ham (bill.ham@hp,com) Subject: SAS 1.1 PHY jitter MJSQ modifications The following proposed
More informationIEEE CX4 Quantitative Analysis of Return-Loss
IEEE CX4 Quantitative Analysis of Return-Loss Aaron Buchwald & Howard Baumer Mar 003 Return Loss Issues for IEEE 0G-Base-CX4 Realizable Is the spec realizable with standard packages and I/O structures
More informationSAS-2 6Gbps PHY Specification
SAS-2 6Gbps PHY Specification T10/07-339r4 Date: September 6, 2007 To: T10 Technical Committee From: Alvin Cox (alvin.cox@seagate.com) Subject: SAS-2 6Gbps PHY Electrical Specification Abstract: The attached
More informationDifferential Signaling is the Opiate of the Masses
Differential Signaling is the Opiate of the Masses Sam Connor Distinguished Lecturer for the IEEE EMC Society 2012-13 IBM Systems & Technology Group, Research Triangle Park, NC My Background BSEE, University
More informationUniversity of New Hampshire InterOperability Laboratory Gigabit Ethernet Consortium
University of New Hampshire InterOperability Laboratory Gigabit Ethernet Consortium As of June 18 th, 2003 the Gigabit Ethernet Consortium Clause 40 Physical Medium Attachment Conformance Test Suite Version
More informationKeysight Technologies High Precision Time Domain Reflectometry (TDR) Application Note
Keysight Technologies High Precision Time Domain Reflectometry (TDR) Application Note Introduction High performance communications systems require a quality transmission path for electrical signals. For
More informationNetwork Analysis Basics
Adolfo Del Solar Application Engineer adolfo_del-solar@agilent.com MD1010 Network B2B Agenda Overview What Measurements do we make? Network Analyzer Hardware Error Models and Calibration Example Measurements
More informationClause 71 10GBASE-KX4 PMD Test Suite Version 0.2. Technical Document. Last Updated: April 29, :07 PM
BACKPLANE CONSORTIUM Clause 71 10GBASE-KX4 PMD Test Suite Version 0.2 Technical Document Last Updated: April 29, 2008 1:07 PM Backplane Consortium 121 Technology Drive, Suite 2 Durham, NH 03824 University
More informationRF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand
RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand Advanced VNA Measurements Agenda Overview of the PXIe-5632 Architecture SW Experience Overview of VNA Calibration
More informationLimitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices
Limitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices Outline Short Overview Fundamental Differences between TDR & Instruments Calibration & Normalization Measurement
More informationBACKPLANE ETHERNET CONSORTIUM
BACKPLANE ETHERNET CONSORTIUM Clause 72 10GBASE-KR PMD Test Suite Version 1.1 Technical Document Last Updated: June 10, 2011 9:28 AM Backplane Ethernet Consortium 121 Technology Drive, Suite 2 Durham,
More information100G QSFP28 Passive Copper Cable OPQS28-T-xx-Px Datasheet
Features Compliant with SFF-8665/SFF-8679 Compliant with IEEE 802.3bj 4 independent full-duplex channels Up to 25.78125 Gbps data rate per channel Up to 5m transmission Single 3.3V power supply Low insertion
More informationMWA REVB LNA Measurements
1 MWA REVB LNA Measurements Hamdi Mani, Judd Bowman Abstract The MWA LNA (REVB) was measured on the Low Frequency Radio astronomy Lab using state of the art test equipment. S-parameters of the amplifier
More informationExpanding Impedance Measurement to Nanoscale:
Expanding Impedance Measurement to Nanoscale: Coupling the Power of Scanning Probe Microscopy with Performance Network Analyzer (PNA) Hassan Tanbakuchi Senior Research Scientist Agilent Technologies Agilent
More informationMeasurement Results and Analysis on a HBC Channel M. D. Pereira RFIC Research Group - Federal University of Santa Catarina - Brazil June 11, 2014
Measurement Results and Analysis on a HBC Channel M. D. Pereira RFIC Research Group - Federal University of Santa Catarina - Brazil June 11, 2014 Presentation Outline What is HBC Channel characterization
More informationTime Domain Reflectometry (TDR) and Time Domain Transmission (TDT) Measurement Fundamentals
Time Domain Reflectometry (TDR) and Time Domain Transmission (TDT) Measurement Fundamentals James R. Andrews, Ph.D., IEEE Fellow PSPL Founder & former President (retired) INTRODUCTION Many different kinds
More information06-496r3 SAS-2 Electrical Specification Proposal. Kevin Witt SAS-2 Phy Working Group 1/16/07
06-496r3 SAS-2 Electrical Specification Proposal Kevin Witt SAS-2 Phy Working Group 1/16/07 Overview Motivation Multiple SAS-2 Test Chips Have Been Built and Tested, SAS-2 Product Designs have Started
More informationMWA Antenna Impedance Measurements
1 MWA Antenna Impedance Measurements Hamdi Mani, Judd Bowman Abstract we describe measurements of the differential output impedance of the MWA bowtie antenna. The data shows that the magnitude of the impedance
More informationCAUI-4 Chip Chip Spec Discussion
CAUI-4 Chip Chip Spec Discussion 1 Chip-Chip Considerations Target: low power, simple chip-chip specification to allow communication over loss with one connector Similar to Annex 83A in 802.3ba 25cm or
More informationTDR Primer. Introduction. Single-ended TDR measurements. Application Note
Application Note TDR Primer Introduction Time Domain Reflectometry (TDR) has traditionally been used for locating faults in cables. Currently, high-performance TDR instruments, coupled with add-on analysis
More informationCHAPTER 4 LARGE SIGNAL S-PARAMETERS
CHAPTER 4 LARGE SIGNAL S-PARAMETERS 4.0 Introduction Small-signal S-parameter characterization of transistor is well established. As mentioned in chapter 3, the quasi-large-signal approach is the most
More information100G QSFP28 DAC Passive Copper Cable SLQS28-100PC-XX
100G QSFP28 DAC Passive Copper Cable SLQS28-100PC-XX Overview The 100GE QSFP28 cable assemblies are high performance, cost effective I/O solutions for LAN, HPC and SAN. The high speed cable assemblies
More informationKeysight MOI for USB Type-C Connectors & Cable Assemblies Compliance Tests (Type-C to Legacy Cable Assemblies)
Revision 01.01 Jan-21, 2016 Universal Serial Bus Type-C TM Specification Revision 1.1 Keysight Method of Implementation (MOI) for USB Type-C TM Connectors and Cables Assemblies Compliance Tests Using Keysight
More informationFast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters.
Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters. April 15, 2015 Istanbul, Turkey R&D Principal Engineer, Component Test Division Keysight
More informationSwept Return Loss & VSWR Antenna Measurements using the Eagle Technologies RF Bridge
Swept Return Loss & VSWR Antenna Measurements using the Eagle Technologies RF Bridge April, 2015 Page 1 of 7 Introduction Return loss and VSWR are a measure of the magnitude of a transmitted RF Signal
More informationUpdate to Alternative Specification to OCL Inductance to Control 100BASE-TX Baseline Wander
Update to Alternative Specification to OCL Inductance to Control 100BASE-TX Baseline Wander G. Zimmerman, C. Pagnanelli Solarflare Communications 6/4/08 Supporters Sean Lundy, Aquantia Your name here 2
More informationEXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER
ECE 351 ELECTROMAGNETICS EXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER OBJECTIVE: The objective to this experiment is to introduce the student to some of the capabilities of a vector network analyzer.
More informationApplication Note: Swept Return Loss & VSWR Antenna Measurements using the Eagle Technologies RF Bridge
: Swept Return Loss & VSWR Antenna Measurements using the Eagle Technologies RF Bridge FCT-1008A Introduction Return loss and VSWR are a measure of the magnitude of a transmitted RF Signal in relation
More informationTechnical Report
Primus AR Analysis Rev. E Page 1 of 10 Letter Revisions Date Approval A Original 13-11-008 BP B Correct doc. Number on pages through 9 0-11-008 BP C Updated references to FCC regulations 1-01-010 BP D
More informationKeysight MOI for USB Type-C Connectors & Cable Assemblies Compliance Tests (Type-C to Legacy Cable Assemblies)
Revision 01.00 Nov-24, 2015 Universal Serial Bus Type-C TM Specification Revision 1.1 Keysight Method of Implementation (MOI) for USB Type-C TM Connectors and Cables Assemblies Compliance Tests Using Keysight
More information772D coaxial dual-directional coupler 773D coaxial directional coupler. 775D coaxial dual-directional coupler 776D coaxial dual-directional coupler
72 772D coaxial dual-directional coupler 773D coaxial directional coupler 775D coaxial dual-directional coupler 776D coaxial dual-directional coupler 777D coaxial dual-directional coupler 778D coaxial
More informationCircuit Characterization with the Agilent 8714 VNA
Circuit Characterization with the Agilent 8714 VNA By: Larry Dunleavy Wireless and Microwave Instruments University of South Florida Objectives 1) To examine the concepts of reflection, phase shift, attenuation,
More information04-370r0 SAS-1.1 Merge IT and IR with XT and XR 6 November 2004
To: T10 Technical Committee From: Rob Elliott, HP (elliott@hp.com) Date: 6 November 2004 Subject: 04-370r0-1.1 Merge IT and IR with XT and XR Revision history Revision 0 (6 November 2004) First revision
More informationKeysight Technologies Signal Integrity Tips and Techniques Using TDR, VNA and Modeling
Keysight Technologies Signal Integrity Tips and Techniques Using, VNA and Modeling Article Reprint This article first appeared in the March 216 edition of Microwave Journal. Reprinted with kind permission
More informationThe Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects
The Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects Dennis Poulin Anritsu Company Slide 1 Outline PSU Signal Integrity Symposium
More informationAdvancements in Noise Measurement
Advancements in Noise Measurement by Ken Wong, Senior Member IEEE R&D Principal Engineer Component Test Division Agilent Technologies, Inc. Page 1 EuMw Objectives 007 Aerospace Agilent Workshop and Defense
More informationEXHIBIT 10 TEST REPORT. FCC Parts 2 & 24
EXHIBIT 10 TEST REPORT FCC Parts 2 & 24 SUB-EXHIBIT 10.1 MEASUREMENT PER SECTION 2.1033 (C) (14) OF THE RULES SECTION 2.1033 (c) (14) The data required by Section 2.1046 through 2.1057, inclusive, measured
More informationECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration
ECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration Objectives The purpose of this lab is to introduce the concepts of calibration and error correction for microwave s-parameter measurements.
More informationAs presented at Euro DesignCon 2004 Channel Compliance Testing Utilizing Novel Statistical Eye Methodology
T10/05-198r0 As presented at Euro DesignCon 2004 Channel Compliance Testing Utilizing Novel Statistical Eye Methodology Anthony Sanders Infineon Technologies Mike Resso John D Ambrosia Technologies Agilent
More informationChapter 2 Displaying Characteristics
Chapter 2 Displaying Characteristics Impedance Characteristics of Chip Beads Chip beads are parts used to prevent EMI and control decoupling of LSI power source lines and to control over/under shooting
More informationAdvanced Product Design & Test for High-Speed Digital Devices
Advanced Product Design & Test for High-Speed Digital Devices Presenters Part 1-30 min. Hidekazu Manabe Application Marketing Engineer Agilent Technologies Part 2-20 min. Mike Engbretson Chief Technology
More informationGIGABIT ETHERNET CONSORTIUM
GIGABIT ETHERNET CONSORTIUM Clause 126 2.5G/5GBASE-T PMA Test Suite Version 1.2 Technical Document Last Updated: March 15, 2017 2.5, 5 and 10 Gigabit Ethernet Testing Service 21 Madbury Road, Suite 100
More information2.5G/5G/10G ETHERNET Testing Service
2.5G/5G/10G ETHERNET Testing Service Clause 126 2.5G/5GBASE-T PMA Test Plan Version 1.3 Technical Document Last Updated: February 4, 2019 2.5, 5 and 10 Gigabit Ethernet Testing Service 21 Madbury Road,
More informationAUTOMOTIVE ETHERNET CONSORTIUM
AUTOMOTIVE ETHERNET CONSORTIUM Clause 96 100BASE-T1 Physical Medium Attachment Test Suite Version 1.0 Technical Document Last Updated: March 9, 2016 Automotive Ethernet Consortium 21 Madbury Rd, Suite
More informationAgilent 8703B Lightwave Component Analyzer Technical Specifications. 50 MHz to GHz modulation bandwidth
Agilent 8703B Lightwave Component Analyzer Technical Specifications 50 MHz to 20.05 GHz modulation bandwidth 2 The 8703B lightwave component analyzer is a unique, general-purpose instrument for testing
More informationBackplane Ethernet Consortium Clause 72 PMD Conformance Test Suite v1.0 Report
Backplane Ethernet Consortium Clause 72 PMD Conformance Test Suite v1.0 Report UNH-IOL 121 Technology Drive, Suite 2 Durham, NH 03824 +1-603-862-0090 BPE Consortium Manager: Backplane Ethernet Consortium
More informationyellow highlighted text indicates refinement is needed turquoise highlighted text indicates where the text was original pulled from
yellow highlighted text indicates refinement is needed turquoise highlighted text indicates where the text was original pulled from The text of this section was pulled from clause 72.7 128.7 2.5GBASE-KX
More information10 GIGABIT ETHERNET CONSORTIUM
10 GIGABIT ETHERNET CONSORTIUM Clause 54 10GBASE-CX4 PMD Test Suite Version 1.0 Technical Document Last Updated: 18 November 2003 10:13 AM 10Gigabit Ethernet Consortium 121 Technology Drive, Suite 2 Durham,
More informationSerial ATA International Organization
Serial ATA International Organization Version 1.0 May 29, 2008 Serial ATA Interoperability Program Revision 1.3 Tektronix MOI for Rx/Tx Tests (DSA/CSA8200 based sampling instrument with IConnect SW) This
More information10 Gigabit Ethernet Consortium Clause 55 PMA Conformance Test Suite v1.0 Report
10 Gigabit Ethernet Consortium Clause 55 PMA Conformance Test Suite v1.0 Report UNH-IOL 121 Technology Drive, Suite 2 Durham, NH 03824 +1-603-862-0090 10 GE Consortium Manager: Jeff Lapak jrlapak@iol.unh.edu
More informationVVM measurement with E5061B for replacing 8508A vector voltmeter. May 2013 Agilent Technologies
VVM measurement with E5061B for replacing 8508A vector voltmeter May 2013 Agilent Technologies Overview of VVM measurement with E5061B Application discussed here Measuring the phase difference (& magnitude
More informationIEEE Std 802.3ap (Amendment to IEEE Std )
IEEE Std 802.3ap.-2004 (Amendment to IEEE Std 802.3.-2002) IEEE Standards 802.3apTM IEEE Standard for Information technology. Telecommunications and information exchange between systems. Local and metropolitan
More informationScattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Scattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Scattering parameters or S-parameters (aka Spars) are used by RF and microwave engineers
More informationLISN UP Application Note
LISN UP Application Note What is the LISN UP? The LISN UP is a passive device that enables the EMC Engineer to easily distinguish between differential mode noise and common mode noise. This will enable
More informationImproving TDR/TDT Measurements Using Normalization Application Note
Improving TDR/TDT Measurements Using Normalization Application Note 1304-5 2 TDR/TDT and Normalization Normalization, an error-correction process, helps ensure that time domain reflectometer (TDR) and
More informationCharacterization of Balanced Digital Components and Communication Paths
Characterization of Balanced Digital Components and Communication Paths This paper describes a method and a system for accurately and comprehensively characterizing the linear performance of balanced devices.
More informationMaking a S11 and S21 Measurement Using the Agilent N9340A
Making a S11 and S21 Measurement Using the Agilent N9340A Application Note Introduction Spectrum characteristics are important in wireless communication system maintenance. Network and spectrum analyzers
More informationAnalysis and Measurement of a Resistor Bridge Circuit with Three Voltage Sources
Analysis and Measurement of a Resistor Bridge Circuit with Three Voltage Sources EL 111 - DC Fundamentals Required Laboratory Project By: Walter Banzhaf, E.K. Smith, and Winfield Young University of Hartford
More informationapplication In-Fixture Measurements Using Vector Network Analyzers Network Analysis Solutions Application Note
application Network Analysis Solutions In-Fixture Measurements Using Vector Network Analyzers Application Note 1287-9 Table of contents Introduction..................................................3 The
More informationPart Number I s (Amps) n R s (Ω) C j (pf) HSMS x HSMS x HSCH x
The Zero Bias Schottky Detector Diode Application Note 969 Introduction A conventional Schottky diode detector such as the Agilent Technologies requires no bias for high level input power above one milliwatt.
More informationE/O & O/E measurements using the Anritsu 37300C series VNA
E/O & O/E measurements using the Anritsu 37300C series VNA The following note describes the set-up and calibrations required to make E/O and O/E measurements using the Lightning VNA and a transfer standard.
More informationFriis Formula and Effects
Friis Formula and Effects Page 1 Friis transmission formula in free space is This equation assumes the following: Friis Formula and Effects G rg t λ (4πR). (1) 1. That the antennas are pointed at each
More informationUnderstanding the Fundamental Principles of Vector Network Analysis. Application Note
Understanding the Fundamental Principles of Vector Network Analysis Application Note Table of Contents Introduction... 3 Measurements in Communications Systems... 3 Importance of Vector Measurements...
More informationEFFECT OF SHIELDING ON CABLE RF INGRESS MEASUREMENTS LARRY COHEN
EFFECT OF SHIELDING ON CABLE RF INGRESS MEASUREMENTS LARRY COHEN OVERVIEW Purpose: Examine the common-mode and differential RF ingress levels of 4-pair UTP, F/UTP, and F/FTP cables at an (RJ45) MDI port
More informationProduct Specification 10Gb/s Laserwire Serial Data Link Active Cable FCBP110LD1Lxx
Product Specification 10Gb/s Laserwire Serial Data Link Active Cable FCBP110LD1Lxx PRODUCT FEATURES Single 1.0 10.3125 Gb/s bi-directional link. RoHS-6 compliant (lead-free) Available in lengths of 3,
More informationChallenges and Solutions for Removing Fixture Effects in Multi-port Measurements
DesignCon 2008 Challenges and Solutions for Removing Fixture Effects in Multi-port Measurements Robert Schaefer, Agilent Technologies schaefer-public@agilent.com Abstract As data rates continue to rise
More information