The Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects
|
|
- Maud Hancock
- 5 years ago
- Views:
Transcription
1 The Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects Dennis Poulin Anritsu Company Slide 1
2 Outline PSU Signal Integrity Symposium The challenge for SI Engineers High Speed Serial Design Flow S-parameter measurements frequency considerations Eye Diagrams and low frequency measurement data issues Verifying simulation-measurement correspondence Setting emphasis levels Superposition vs. true mode stimulus for active device measurement Resources Questions Slide 2
3 Background challenge for SI Engineers Compliance with higher data rate standards Cost/performance trade-offs Locating Defects Measurement simulation correlation Dealing with test fixtures Gaining confidence in models and 3D-EM Simulations Getting accurate eye diagram simulations Slide 3
4 Desired Result from VNA Measurements Enhanced causality & reduction of DC extrapolation errors Accurate models to accelerate design cycle Accurate eye diagrams Poor S-parameter Data Actual performance Good S-parameter Data Slide 4
5 Challenges for SI Engineers Parallel Data 8B/10B Encoder Serializer Equalizer Driver Serial Data Channel Issues Clock/PLL Parallel Data Data Recovery Equalizer De- Serializer 10B/8B Decoder Jitter and Noise CR/PLL Slide 5
6 Types of Channel Slide 6
7 Typical High Speed Design Flow Slide 7
8 If This Project Did Not Meet Objectives Slide 8
9 Improved High Speed Design Flow Slide 9
10 Transforms into the time domain Slide 10
11 Loss (db) PSU Signal Integrity Symposium Channel Issues - Loss Tx Rx FR-4 Electrical Loss Function (1 m) Frequency (GHz) Skin Dielectric Total Slide 11
12 Loss (db) PSU Signal Integrity Symposium Channel Issues - Loss Tx Rx FR-4 Electrical Loss Function (1 m) Frequency (GHz) Skin Dielectric Total Slide 12
13 Loss (db) PSU Signal Integrity Symposium Channel Issues - Loss Tx Rx FR-4 Electrical Loss Function (1 m) Frequency (GHz) Skin Dielectric Total Slide 13
14 Transmission Characteristics [db] PSU Signal Integrity Symposium Channel Effect Tx Rx Frequency [GHz] Differential Transmission Characteristic of 27 backplane High frequency Attenuation closes eye Slide 14
15 Emphasis PSU Signal Integrity Symposium Added to the Tx signal Sharpens the edges Adds more high frequency content to counteract high frequency attenuation of backplane Aim is to have open eye at Rx Slide 15
16 Using Emphasis Tx Input waveform with no emphasis R x Simulated Using measured S- parameter data Measured using Oscilloscope Input waveform with emphasis Simulated Using measured S- parameter data How to set the right degree of emphasis? Measured using Oscilloscope Slide 16
17 Setting Ideal Emphasis Challenge: Difficult to find the ideal emphasis settings from the many possibilities Problem: Searching for ideal settings while verifying the output waveform takes an extremely long time hard to explain why those settings are ideal. Solution: Use VNA-captured S-parameter data to apply inverse DUT characteristics to input waveform Slide 17
18 Channel Issues - Structures Channel artifacts (vias, impedance changes, ground plane issues etc.) Slide 18
19 Backplane Transmission Measurement Slide 19
20 Channel Issues Crosstalk Tx Rx FEXT Tx Rx NEXT Rx Tx Slide 20
21 VNA Measurements Importance of Max and Min Frequency for Time Domain De-embedding Superposition vs. True Balanced Slide 21
22 Importance of Maximum Frequency Range Attenuating harmonics distorts signal Harmonic Content of 28 Gbps NRZ clock signal Ideally measure to 5 th harmonic Slide 22
23 Importance of Maximum Frequency Range Lack of causality means output appears to occur prior to stimulus Can cause unstable simulations Higher frequency data improves causality Non-Causal Results Slide 23
24 Time Domain Resolution More bandwidth = better resolution Frequency domain only tells you that you have problems Hi-res time domain results can tell you where you have problems Slide 24
25 Bandwidth and window choices affect causality and resolution Slide 25
26 Importance of Low Frequency Range Eye pattern simulated from poor low frequency S-parameter data below 10 MHz Eye pattern simulated from good low frequency S-parameter data down to 70 khz Eye pattern measured with an oscilloscope Slide 26
27 linear PSU Signal Integrity Symposium Importance of Low Frequency Range DC term estimated if start freq f 1 f 2 f 1 FREQUENCY DC term estimated from lower frequency S-parameter data down to f 2 DUT step response vs. extrapolation bad extrap ok Time (ps) Slide 27
28 Importance of Low Frequency Range VectorStar displays a flat 25 ohm section as expected Measured Data range from to ohms Low noise on low frequency data give rock-steady results from sweep to sweep (Composite picture of multiple screen captures showing measurements made on Beatty Standard) Slide 28
29 Need for Low Frequency Data 2 Reasons Slide 29
30 VNA performance and DC Extrapolation Slide 30
31 VNA performance and DC Extrapolation Slide 31
32 Impact on step response Slide 32
33 Stability at low frequency also critical Slide 33
34 Eye diagrams 10 Gbit Slide 34
35 Low frequency data: uncertainties Slide 35
36 Time domain result vs. low frequency uncertainties Slide 36
37 VectorStar Architecture: Two VNAs in One! > 2.5 GHz High Band MS4640B Block Diagram < 2.5 GHz Low Band a 1 a 1 a 2 a 2 b 1 b 2 b 1 b 2 Bias 1 Bias 2 Slide 37
38 Unique Hybrid VNA Architecture Two VNAs in parallel: Almost the only way to get 6 decades of coverage (from khz to GHz frequencies) Each receiver technology (sampler or mixer) used in its best range Each coupling technology (coupler or bridge) used in its best range Both share a common IF path and fully synthesized source Slide 38
39 De-embedding Methods available within VectorStar Method Type A (adapter removal) Type B (Bauer-Penfield) Type C (inner-outer) Type D (2-port lines) Standards Fundamental Sensitivity to Media preferences complexity accuracy standards High High High (refl.) Need good reflect and thru stds Medium High High (refl.) Only need reflect standards, not great for coupled lines High High Medium (refl.) More redundant than A so less sensitive but need good stds still Med Low for low-loss or Medium (line Only need decent lines; match relegated to mismatched fixtures def n.) lower dependence; can handle coupled lines Best Accuracy Requires good repeatability Type E (4 port inner-outer) Type F (4-port uncoupled) Type G (4-port coupled) High High Medium (refl.) Somewhat redundant (like C) but need decent standards. Best for uncoupled multiport fixtures Med Med Low for low-loss or mismatched fixtures Low for low-loss or mismatched fixtures Medium (line def n.) Medium (line def n.) Only need decent lines; match relegated to lower dependence; can handle coupled lines Only need decent lines; match relegated to lower dependence; can handle coupled lines well Backplanes Slide 39
40 Superposition and True Mode Stimulus Time-coherent in phase and amplitude Port 1 Port 2 Port 3 Port 4 Port 1 Port 2 Port 3 Port 4 DUT DUT Slide 40
41 Applicability of the two methods Device to be measured: Passive Balanced / Differential DUT Superposition True Mode Stimulus Transmission Lines X X PCB X X Lumped Components X X Passive Filters X X Unshielded and Shielded Twisted Pair, Quad Cables X X Connectors / Interfaces X X Linear Active Balanced / Differential DUT Linear Amplifiers, Differential Amplifiers X X Linear Active Filters X X Input / Output Match ADC / DAC X X Non Linear Active Balanced / Differential DUT Devices in Compression / Saturation Log Amplifiers X X Slide 41
42 Trade Offs PSU Signal Integrity Symposium Superposition True Mode Stimulus* Type of VNA Single source VNA Dual source required Method of obtaining Differential and Mixed Mode Parameters Calculated Measured directly Type of DUTs Passive and active linear Necessary only for non-linear Available Frequency Range 70 khz to 110 GHz 70 khz GHz Calibration Complexity Average Calibration Time Calibration stability considerations Typical 4-port T (Time depends on number of points, IF BW, skill of operator) Normal measurement calibration intervals Typical 4-port plus calibration of dual sources Approx. 2T Calibrate more frequently due to stability issues if VNA does not feature advanced correction algorithms Overall Solution Cost $ $$ * Only recommended when device is non-linear Slide 42
43 Correlation - Measurement and Simulation Use Channel Modeling Platform Use time domain equipment to measure Eye and compare with simulated Eye Slide 43
44 Use of Channel Modeling Platform Slide 44
45 Lower Risk, Improved Design Flow, Greater Confidence Slide 45
46 CMP-28 Features- Capabilities Slide 46
47 Simulation to Measurement in Minutes! Slide 47
48 3D EM Challenge Structures 2 Examples Slide 48
49 Potential Simulation Issues Add Measure + CMP Early in Design Process Slide 49
50 CMP-28 Measurement Standard +VectorStar = Quality S-Parameter Measurements Slide 50
51 DUT: Overlay S-parameter-based results with direct BERT measurements Slide 51
52 Questions? Slide 52
53 Thank You Slide 53
Signal Integrity: VNA Applications
Signal Integrity: VNA Applications Joe Mallon Business Development Manager VNA Products joe.mallon@anritsu.com DesignCon February 2017 Agenda Why use both BERTS and VNA s? Anritsu VNA product types SI
More informationVector Network Analyzer
Vector Network Analyzer VNA Basics VNA Roadshow Budapest 17/05/2016 Content Why Users Need VNAs VNA Terminology System Architecture Key Components Basic Measurements Calibration Methods Accuracy and Uncertainty
More informationVector Network Analysis
Portfolio Brochure Vector Network Analysis Product Portfolio Vector Network Analysis VNA Innovation Timeline In 1965, Anritsu filed the patent that defined the first modern Vector Network Analyzer (VNA).
More informationLimitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices
Limitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices Outline Short Overview Fundamental Differences between TDR & Instruments Calibration & Normalization Measurement
More informationSignal Integrity Tips and Techniques Using TDR, VNA and Modeling. Russ Kramer O.J. Danzy
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling Russ Kramer O.J. Danzy Simulation What is the Signal Integrity Challenge? Tx Rx Channel Asfiakhan Dreamstime.com - 3d People Communication
More informationE-band and mmwave Components & Sub-Assemblies testing Challenges New Technology. VNA Roadshow Budapest 17/05/2016
E-band and mmwave Components & Sub-Assemblies testing Challenges New Technology VNA Roadshow Budapest 17/05/2016 Agenda Applications drive the need Challenges faced by device characterization engineers
More informationOptoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016
Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016 Content Introduction Photonics & Optoelectronics components Optical Measurements VNA (Vector Network
More informationAgilent Technologies High-Definition Multimedia
Agilent Technologies High-Definition Multimedia Interface (HDMI) Cable Assembly Compliance Test Test Solution Overview Using the Agilent E5071C ENA Option TDR Last Update 013/08/1 (TH) Purpose This slide
More informationAdvanced Product Design & Test for High-Speed Digital Devices
Advanced Product Design & Test for High-Speed Digital Devices Presenters Part 1-30 min. Hidekazu Manabe Application Marketing Engineer Agilent Technologies Part 2-20 min. Mike Engbretson Chief Technology
More informationRF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand
RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand Advanced VNA Measurements Agenda Overview of the PXIe-5632 Architecture SW Experience Overview of VNA Calibration
More informationSignal Integrity Testing with a Vector Network Analyzer. Neil Jarvis Applications Engineer
Signal Integrity Testing with a Vector Network Analyzer Neil Jarvis Applications Engineer 1 Agenda RF Connectors A significant factor in repeatability and accuracy Selecting the best of several types for
More informationKeysight Technologies Signal Integrity Tips and Techniques Using TDR, VNA and Modeling
Keysight Technologies Signal Integrity Tips and Techniques Using, VNA and Modeling Article Reprint This article first appeared in the March 216 edition of Microwave Journal. Reprinted with kind permission
More informationA Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs
A Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs Presenter: Brian Shumaker DVT Solutions, LLC, 650-793-7083 b.shumaker@comcast.net
More informationHigh Speed Digital Design & Verification Seminar. Measurement fundamentals
High Speed Digital Design & Verification Seminar Measurement fundamentals Agenda Sources of Jitter, how to measure and why Importance of Noise Select the right probes! Capture the eye diagram Why measure
More informationUSB 3.1 Cable-Connector Assembly Compliance Tests. Test Solution Overview Using the Keysight E5071C ENA Option TDR. Last Update 2015/02/06
USB 3.1 Cable-Connector Assembly s Test Solution Overview Using the Keysight E5071C ENA Option TDR Last Update 015/0/06 Purpose This slide will show how to make measurements of USB 3.1 cable & connector
More informationConfiguration of PNA-X, NVNA and X parameters
Configuration of PNA-X, NVNA and X parameters VNA 1. S-Parameter Measurements 2. Harmonic Measurements NVNA 3. X-Parameter Measurements Introducing the PNA-X 50 GHz 43.5 GHz 26.5 GHz 13.5 GHz PNA-X Agilent
More informationValidation & Analysis of Complex Serial Bus Link Models
Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract
More informationHigh Speed Characterization Report
ESCA-XX-XX-XX.XX-1-3 Mated with: SEAF8-XX-05.0-X-XX-2-K SEAM8-XX-S02.0-X-XX-2-K Description: 0.80 mm SEARAY High-Speed/High-Density Array Cable Assembly, 34 AWG Samtec, Inc. 2005 All Rights Reserved Table
More informationKeysight MOI for USB Type-C Connectors & Cable Assemblies Compliance Tests (Type-C to Legacy Cable Assemblies)
Revision 01.01 Jan-21, 2016 Universal Serial Bus Type-C TM Specification Revision 1.1 Keysight Method of Implementation (MOI) for USB Type-C TM Connectors and Cables Assemblies Compliance Tests Using Keysight
More informationDifferential Signal and Common Mode Signal in Time Domain
Differential Signal and Common Mode Signal in Time Domain Most of multi-gbps IO technologies use differential signaling, and their typical signal path impedance is ohm differential. Two 5ohm cables, however,
More informationFIBRE CHANNEL CONSORTIUM
FIBRE CHANNEL CONSORTIUM FC-PI-2 Clause 9 Electrical Physical Layer Test Suite Version 0.21 Technical Document Last Updated: August 15, 2006 Fibre Channel Consortium Durham, NH 03824 Phone: +1-603-862-0701
More informationHigh Speed Characterization Report
ECDP-16-XX-L1-L2-2-2 Mated with: HSEC8-125-XX-XX-DV-X-XX Description: High-Speed 85Ω Differential Edge Card Cable Assembly, 30 AWG ACCELERATE TM Twinax Cable Samtec, Inc. 2005 All Rights Reserved Table
More informationKeysight MOI for USB Type-C Connectors & Cable Assemblies Compliance Tests (Type-C to Legacy Cable Assemblies)
Revision 01.00 Nov-24, 2015 Universal Serial Bus Type-C TM Specification Revision 1.1 Keysight Method of Implementation (MOI) for USB Type-C TM Connectors and Cables Assemblies Compliance Tests Using Keysight
More informationHigh Speed Characterization Report
PCIEC-XXX-XXXX-EC-EM-P Mated with: PCIE-XXX-02-X-D-TH Description: 1.00 mm PCI Express Internal Cable Assembly, 30 AWG Twinax Ribbon Cable Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable
More informationHigh Speed Characterization Report
PCRF-064-XXXX-EC-SMA-P-1 Mated with: PCIE-XXX-02-X-D-TH Description: PCI Express Cable Assembly, Low Loss Microwave Cable Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable Assembly Overview...
More informationProbing Techniques for Signal Performance Measurements in High Data Rate Testing
Probing Techniques for Signal Performance Measurements in High Data Rate Testing K. Helmreich, A. Lechner Advantest Test Engineering Solutions GmbH Contents: 1 Introduction: High Data Rate Testing 2 Signal
More informationHigh Speed Characterization Report
ERCD_020_XX_TTR_TED_1_D Mated with: ERF8-020-05.0-S-DV-L Description: 0.8mm Edge Rate High Speed Coax Cable Assembly Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable Assembly Overview... 1
More informationTransient Current Measurement for Advance Materials & Devices
& Devices 8 May 2017 Brian YEO Application Engineer Keysight Technologies Agenda 2 High speed data acquisition basics Challenges & solutions for transient current measurement. Considerations when making
More informationSHF Communication Technologies AG. Wilhelm-von-Siemens-Str. 23D Berlin Germany. Phone Fax
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone ++49 30 772 051-0 Fax ++49 30 753 10 78 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF D836 A Differential
More informationDemo / Application Guide for DSA815(-TG) / DSA1000 Series
Demo / Application Guide for DSA815(-TG) / DSA1000 Series TX1000 Mobile Phone Frontend Mixer Bandpass Filter PA The schematic above shows a typical front end of a mobile phone. Our TX1000 RF Demo Kit shows
More informationSHF Communication Technologies AG
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone ++49 30 772 051-0 Fax ++49 30 753 10 78 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF 46123 A Optical
More informationNetwork Analyzers. R3765G/3767G Series. R3765G/67G Series Network Analyzers. 300 khz to 3.8 GHz/300 khz to 8 GHz
(Photo is R3767CG) R3765G/67G Series Network Analyzers The R3765G/67G-series network analyzers are vector network analyzers that incorporate a new RF circuit analysis technique. The measuring frequency
More informationCompact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES
Compact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES Frequency range: 9 khz - 6.5 or 8.5 GHz Measured parameters: S11, S12, S21, S22 Wide output power adjustment range: -50 dbm to +5 dbm
More informationSV2C 28 Gbps, 8 Lane SerDes Tester
SV2C 28 Gbps, 8 Lane SerDes Tester Data Sheet SV2C Personalized SerDes Tester Data Sheet Revision: 1.0 2015-03-19 Revision Revision History Date 1.0 Document release. March 19, 2015 The information in
More informationHigh Speed Characterization Report
SSW-1XX-22-X-D-VS Mates with TSM-1XX-1-X-DV-X Description: Surface Mount Terminal Strip,.1 [2.54mm] Pitch, 13.59mm (.535 ) Stack Height Samtec, Inc. 25 All Rights Reserved Table of Contents Connector Overview...
More informationA Guide to Making RF Measurements for Signal Integrity Applications. White Paper
A Guide to Making RF Measurements for Signal Integrity Applications White Paper Introduction Designing a system for Signal Integrity requires a great deal of knowledge and tremendous effort from all disciplines
More informationTest & Calibration Benefits from a New Precision RF/Microwave Calibrator
Test & Calibration Benefits from a New Precision RF/Microwave Calibrator Topics: RF & Microwave calibration signal requirements Design philosophy and architecture of the new RF Calibrator. Spectrum analyzer
More informationMS2760A a new approach for mm-wave and 5G spectrum measurements
MS2760A a new approach for mm-wave and 5G spectrum measurements RF Technology Days 2018 Ferdinand Gerhardes EMEA BDM April 2018 Agenda Anritsu SPA product portfolio MS2760A feature overview What is NLTL?
More informationUFS v2.0 PHY and Protocol Testing for Compliance. Copyright 2013 Chris Loberg, Tektronix
UFS v2.0 PHY and Protocol Testing for Compliance Copyright 2013 Chris Loberg, Tektronix Agenda Introduction to MIPI Architecture & Linkage to UFS Compliance Testing Ecosystem UFS Testing Challenges Preparing
More informationHigh Speed Characterization Report
HLCD-20-XX-TD-BD-2 Mated with: LSHM-120-XX.X-X-DV-A Description: 0.50 mm Razor Beam High Speed Hermaphroditic Coax Cable Assembly Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable Assembly
More information32Gbaud PAM4 True BER Measurement Solution
Product Introduction 32Gbaud PAM4 True BER Measurement Solution Signal Quality Analyzer MP1800A Series 32Gbaud Power PAM4 Converter G0375A 32Gbaud PAM4 Decoder with CTLE G0376A MP1800A Series PAM4 Measurement
More informationBill Ham Martin Ogbuokiri. This clause specifies the electrical performance requirements for shielded and unshielded cables.
098-219r2 Prepared by: Ed Armstrong Zane Daggett Bill Ham Martin Ogbuokiri Date: 07-24-98 Revised: 09-29-98 Revised again: 10-14-98 Revised again: 12-2-98 Revised again: 01-18-99 1. REQUIREMENTS FOR SPI-3
More informationPNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE
PNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE Table of Contents PNA Family Network Analyzer Configurations... 05 Test set and power configuration options...05 Hardware options...
More informationMeasuring Hot TDR and Eye Diagrams with an Vector Network Analyzer?
Measuring Hot TDR and Eye Diagrams with an Vector Network Analyzer? Gustaaf Sutorius Application Engineer Agilent Technologies gustaaf_sutorius@agilent.com Page 1 #TDR fit in Typical Digital Development
More informationSignal Integrity Basics
Signal Integrity Basics By Anritsu Field Application Engineers TABLE OF CONTENTS 1.0 Bits, Bytes and Hertz 2.0 Eye Patterns 3.0 Pulse Composition 4.0 Common Causes of Pulse Distortion 5.0 Measurements
More informationHybrid Modeled Measured Characterization of a 320 Gbit/s Backplane System
DesignCon 2015 Hybrid Modeled Measured Characterization of a 320 Gbit/s Backplane System Josiah Bartlett, Tektronix Josiah.Bartlett@Tektronix.com Sarah Boen Vo, Tektronix Sarah.Boen@Tektronix.com Ed Ford,
More informationAries Kapton CSP socket
Aries Kapton CSP socket Measurement and Model Results prepared by Gert Hohenwarter 5/19/04 1 Table of Contents Table of Contents... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 4 Setup... 4 MEASUREMENTS...
More informationDigital Waveform Recorders
Digital Waveform Recorders Error Models & Performance Measures Dan Knierim, Tektronix Fellow Experimental Set-up for high-speed phenomena Transducer(s) high-speed physical phenomenon under study physical
More informationUtilizzo del Time Domain per misure EMI
Utilizzo del Time Domain per misure EMI Roberto Sacchi Measurement Expert Manager - Europe 7 Giugno 2017 Compliance EMI receiver requirements (CISPR 16-1-1 ) range 9 khz - 18 GHz: A normal +/- 2 db absolute
More informationSHF Communication Technologies AG
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone ++49 30 / 772 05 10 Fax ++49 30 / 753 10 78 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF 806 E SHF
More informationKeysight Technologies 8 Hints for Making Better Measurements Using RF Signal Generators. Application Note
Keysight Technologies 8 Hints for Making Better Measurements Using RF Signal Generators Application Note 02 Keysight 8 Hints for Making Better Measurements Using RF Signal Generators - Application Note
More informationSerial Data Transmission
Serial Data Transmission Dr. José Ernesto Rayas Sánchez 1 Outline Baseband serial transmission Line Codes Bandwidth of serial data streams Block codes Serialization Intersymbol Interference (ISI) Jitter
More informationEBERT 2904 Pulse Pattern Generator and Error Detector Datasheet
EBERT 2904 Pulse Pattern Generator and Error Detector Datasheet REV 1.0 2904 KEY FEATURES Four channel NRZ Pulse Pattern Generator and Error Detector Operating range between 24.6 to 29.5 Gb/s along with
More information3 Definitions, symbols, abbreviations, and conventions
T10/02-358r2 1 Scope 2 Normative references 3 Definitions, symbols, abbreviations, and conventions 4 General 4.1 General overview 4.2 Cables, connectors, signals, transceivers 4.3 Physical architecture
More informationHigh Speed Characterization Report
QTH-030-01-L-D-A Mates with QSH-030-01-L-D-A Description: High Speed Ground Plane Header Board-to-Board, 0.5mm (.0197 ) Pitch, 5mm (.1969 ) Stack Height Samtec, Inc. 2005 All Rights Reserved Table of Contents
More informationX-Parameters with Active and Hybrid Active Load Pull
X-Parameters with Active and Hybrid Active Load Pull Gary Simpson, CTO Maury Microwave EuMW 2012 www.maurymw.com 1 General Load Pull Overview 2 Outline 1. Introduction to Maury Microwave 2. Basics and
More informationSHF Communication Technologies AG. Wilhelm-von-Siemens-Str. 23D Berlin Germany. Phone Fax
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone +49 30 772 051-0 Fax +49 30 753 10 78 E-Mail: sales@shf-communication.com Web: www.shf-communication.com Datasheet
More informationValidation Report Comparison of Eye Patterns Generated By Synopsys HSPICE and the Agilent PLTS
Comparison of Eye Patterns Generated By Synopsys HSPICE and the Agilent PLTS Using: Final Inch Test/Eval Kit, Differential Pair - No Grounds Configuration, QTE-DP/QSE-DP, 5mm Stack Height (P/N FIK-QxE-04-01)
More informationMicrowave Measurements for signal integrity applications
Microwave Measurements for signal integrity applications Prof. Andrea Ferrero,FIEEE Distinguished Microwave Lectures Dip. Elettronica- Politecnico di Torino Summary Signal Integrity and Microwave S-parameter:
More informationDate: October 4, 2004 T10 Technical Committee From: Bill Ham Subject: SAS 1.1 PHY jitter MJSQ modifications
SAS 1.1 PHY jitter MJSQ modifications T10/04-332r0 Date: October 4, 2004 To: T10 Technical Committee From: Bill Ham (bill.ham@hp,com) Subject: SAS 1.1 PHY jitter MJSQ modifications The following proposed
More informationSHF Communication Technologies AG
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23 Aufgang D 12277 Berlin Marienfelde Germany Phone ++49 30 / 772 05 10 Fax ++49 30 / 753 10 78 E-Mail: sales@shf.biz Web: http://www.shf.biz
More informationH19- Reliable Serial Backplane Data Transmission at 10 Gb/s. January 30, 2002 Slide 1 of 24
H19- Reliable Serial Backplane Data Transmission at 10 Gb/s Slide 1 of 24 Evolution of the Interconnect F r e q u e n c y A c t i v e Channel Architecture Connectors Transmission Media Loss Properties
More informationSHF Communication Technologies AG. Wilhelm-von-Siemens-Str. 23D Berlin Germany. Phone Fax
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone ++49 30 772 051-0 Fax ++49 30 753 10 78 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF D837 A Differential
More informationHigh Speed Characterization Report
High Speed Characterization Report MMCX-P-P-H-ST-TH1 mated with MMCX-J-P-H-ST-TH1 MMCX-P-P-H-ST-MT1 mated with MMCX-J-P-H-ST-MT1 MMCX-P-P-H-ST-SM1 mated with MMCX-J-P-H-ST-SM1 MMCX-P-P-H-ST-EM1 mated with
More informationNarrow Pulse Measurements on Vector Network Analyzers
Narrow Pulse Measurements on Vector Network Analyzers Bert Schluper Nearfield Systems Inc. Torrance, CA, USA bschluper@nearfield.com Abstract - This paper investigates practical aspects of measuring antennas
More informationEBERT 1504 Pulse Pattern Generator and Error Detector Datasheet
EBERT 1504 Pulse Pattern Generator and Error Detector Datasheet REV 1.0 1504 KEY FEATURES Four channel NRZ Pulse Pattern Generator and Error Detector Wide operating range between 1 to 15 Gb/s and beyond
More informationMillimeter Signal Measurements: Techniques, Solutions and Best Practices
New Network Analyzer platform Millimeter Signal Measurements: Techniques, Solutions and Best Practices Phase Noise measurements update 1 N522XA PNA Series Network Analyzer Introducing Highest Performance
More informationKeysight Technologies Using the Time-Domain Reflectometer. Application Note S-Parameter Series
Keysight Technologies Using the Time-Domain Reflectometer Application Note S-Parameter Series 02 Keysight S-parameter Series: Using the Time-Domain Reflectometer - Application Note Analysis of High-Speed
More informationPhysical Test Setup for Impulse Noise Testing
Physical Test Setup for Impulse Noise Testing Larry Cohen Overview Purpose: Use measurement results for the EM coupling (Campbell) clamp to determine a stable physical test setup for impulse noise testing.
More informationImproving Amplitude Accuracy with Next-Generation Signal Generators
Improving Amplitude Accuracy with Next-Generation Signal Generators Generate True Performance Signal generators offer precise and highly stable test signals for a variety of components and systems test
More informationHigh-Speed Circuits and Systems Laboratory B.M.Yu. High-Speed Circuits and Systems Lab.
High-Speed Circuits and Systems Laboratory B.M.Yu 1 Content 1. Introduction 2. Pre-emphasis 1. Amplitude pre-emphasis 2. Phase pre-emphasis 3. Circuit implantation 4. Result 5. Conclusion 2 Introduction
More informationAccurate Harmonics Measurement by Sampler Part 2
Accurate Harmonics Measurement by Sampler Part 2 Akinori Maeda Verigy Japan akinori.maeda@verigy.com September 2011 Abstract of Part 1 The Total Harmonic Distortion (THD) is one of the major frequency
More information32Gbaud PAM4 True BER Measurement Solution
Product Introduction 32Gbaud PAM4 True BER Measurement Solution Signal Quality Analyzer-R MP1900A Series 32Gbaud Power PAM4 Converter G0375A 32Gbaud PAM4 Decoder with CTLE G0376A MP1900A Series PAM4 Measurement
More information5Gbps Serial Link Transmitter with Pre-emphasis
Gbps Serial Link Transmitter with Pre-emphasis Chih-Hsien Lin, Chung-Hong Wang and Shyh-Jye Jou Department of Electrical Engineering,National Central University,Chung-Li, Taiwan R.O.C. Abstract- High-speed
More information5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis
5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis Contents 5 Essential Hints to Improve Millimeter-wave Network Analysis Ensure Accurate, Repeatable Results Go to Hint 1 > Calibrate for Better
More informationPlatform Migration 8510 to PNA. Graham Payne Application Engineer Agilent Technologies
Platform Migration 8510 to PNA Graham Payne Application Engineer Agilent Technologies We set the standard... 8410 8510 When we introduced the 8510, we changed the way S-parameter measurements were made!
More informationAV3672 Series Vector Network Analyzer
AV3672 Series Vector Network Analyzer AV3672A/B/C/D/E (10MHz 13.5 GHz/26.5 GHz/43.5 GHz/50 GHz/67 GHz) Product Overview: AV3672 series vector network analyzer include AV3672A (10MHz 13.5GHz), AV3672B (10MHz
More informationSpecification for Conducted Emission Test
1 of 10 1. EMI Receiver Frequency range 9kHz 7.0 GHz Measurement time per frequency 10 µs to 100 s time sweep, span = 0 Hz - 1 µs to 16000 s Sweep time in steps of 5 % frequency sweep, span 10 Hz - 2.5
More informationSHF Communication Technologies AG
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23 Aufgang D 12277 Berlin Marienfelde Germany Phone ++49 30 / 772 05 10 Fax ++49 30 / 753 10 78 E-Mail: sales@shf.biz Web: http://www.shf.biz
More informationDescription, operating instructions and hardware specification of the HL Transverse balance measurement module (TBMM).
, operating instructions and hardware specification of the HL 8240 - Transverse balance measurement module (TBMM). The increasing use of telecom equipment in ultrafast applications has enhanced the need
More informationAgilent MOI for MIPI M-PHY Conformance Tests Revision Mar 2014
Revision 1.10 20 Mar 2014 Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR 1 Table of Contents 1. Modification Record... 4 2.
More informationAries QFP microstrip socket
Aries QFP microstrip socket Measurement and Model Results prepared by Gert Hohenwarter 2/18/05 1 Table of Contents Table of Contents... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 4 Setup... 4
More informationAUTOMOTIVE ETHERNET CONSORTIUM
AUTOMOTIVE ETHERNET CONSORTIUM Clause 96 100BASE-T1 Physical Medium Attachment Test Suite Version 1.0 Technical Document Last Updated: March 9, 2016 Automotive Ethernet Consortium 21 Madbury Rd, Suite
More informationTEST & MEASURING INSTRUMENTS. Analyzer. (4 Ports) 4 Ports
TEST & MEASURING INSTRUMENTS Analyzer (4 Ports) 4 Ports Key Features Frequrncy Range : 100kHz ~ 8GHz, 16 Parameters support (S11 ~ S44) Measurement time per point : 100us per point Wide Output Power Range
More informationThe data rates of today s highspeed
HIGH PERFORMANCE Measure specific parameters of an IEEE 1394 interface with Time Domain Reflectometry. Michael J. Resso, Hewlett-Packard and Michael Lee, Zayante Evaluating Signal Integrity of IEEE 1394
More informationS3602A/B Vector Network Analyzer Datasheet
S3602A/B Vector Network Analyzer Datasheet Saluki Technology Inc. The document applies to the vector network analyzers of the following models: S3602A vector network analyzer (10MHz-13.5GHz). S3602B vector
More informationOvercome mmwave Component Test Challenges. Senior Project Manager / Keysight Technologies
Overcome mmwave Component Test Challenges Senior Project Manager / Keysight Technologies Kenny Liao 2018.06.11 Taipei D I S C U S S I O N T O P I C S Millimeter Wave Component Application Space Millimeter
More informationSHF Communication Technologies AG. Wilhelm-von-Siemens-Str. 23D Berlin Germany. Phone Fax
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone +49 30 772051-0 Fax ++49 30 7531078 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF 100 BPP Broadband
More informationHow to Read S-Parameters Like a Book or Tapping Into Some Of The Information Buried Inside S- Parameter Black Box Models
Slide -1 Bogatin Enterprises and LeCroy Corp No Myths Allowed Webinar Time before start: How to Read S-Parameters Like a Book or Tapping Into Some Of The Information Buried Inside S- Parameter Black Box
More information1Gbps to 12.5Gbps Passive Equalizer for Backplanes and Cables
19-46; Rev 2; 2/8 EVALUATION KIT AVAILABLE 1Gbps to 12.Gbps General Description The is a 1Gbps to 12.Gbps equalization network that compensates for transmission medium losses encountered with FR4 and cables.
More informationWhat Makes a Good VNA?
Introduction Everyone knows that a good VNA should have both excellent hardware performance and an easy to use software interface with useful post-processing capabilities. But there are numerous VNAs in
More informationAgilent PNA Family Microwave Network Analyzers
gilent PN Family Microwave Network nalyzers Configuration Guide This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the PN Family
More informationHow the Braid Impedance of Instrumentation Cables Impact PI and SI Measurements
How the Braid Impedance of Instrumentation Cables Impact PI and SI Measurements Istvan Novak (*), Jim Nadolny (*), Gary Biddle (*), Ethan Koether (**), Brandon Wong (*) (*) Samtec, (**) Oracle This session
More information325 to 500 GHz Vector Network Analyzer System
325 to 500 GHz Vector Network Analyzer System By Chuck Oleson, Tony Denning and Yuenie Lau OML, Inc. Abstract - This paper describes a novel and compact WR-02.2 millimeter wave frequency extension transmission/reflection
More informationOvercoming Mixer Measurement Challenges
Overcoming Mixer Measurement Challenges October 10, 2002 presented by: Robb Myer Dave Ballo Today we will be looking at overcoming measurements challenges associated with frequency translating devices
More informationAdvanced Test Equipment Rentals ATEC (2832)
Established 1981 Advanced Test Equipment Rentals www.atecorp.com 800-404-ATEC (2832) Agilent 2-Port and 4-Port PNA-X Network Analyzer N5249A - 10 MHz to 8.5 GHz N5241A - 10 MHz to 13.5 GHz N5242A - 10
More informationA 0.18µm CMOS Gb/s Digitally Controlled Adaptive Line Equalizer with Feed-Forward Swing Control for Backplane Serial Link
1 A 0.18µm CMOS 3.125-Gb/s Digitally Controlled Adaptive Line Equalizer with Feed-Forward Swing Control for Backplane Serial Link Ki-Hyuk Lee, Jae-Wook Lee nonmembers and Woo-Young Choi regular member
More informationPDN Probes. P2100A/P2101A Data Sheet. 1-Port and 2-Port 50 ohm Passive Probes
P2100A/P2101A Data Sheet PDN Probes 1-Port and 2-Port 50 ohm Passive Probes power integrity PDN impedance testing ripple PCB resonances transient step load stability and NISM noise TDT/TDR clock jitter
More informationDetermination of Uncertainty for Dielectric Properties Determination of Printed Circuit Board Material
Determination of Uncertainty for Dielectric Properties Determination of Printed Circuit Board Material Marko Kettunen, Kare-Petri Lätti, Janne-Matti Heinola, Juha-Pekka Ström and Pertti Silventoinen Lappeenranta
More informationAgilent Technologies PSA Series Spectrum Analyzers Test and Adjustment Software
Test System Overview Agilent Technologies PSA Series Spectrum Analyzers Test and Adjustment Software Test System Overview The Agilent Technologies test system is designed to verify the performance of the
More information