Microwave Measurements for signal integrity applications
|
|
- Jerome Townsend
- 5 years ago
- Views:
Transcription
1 Microwave Measurements for signal integrity applications Prof. Andrea Ferrero,FIEEE Distinguished Microwave Lectures Dip. Elettronica- Politecnico di Torino
2 Summary Signal Integrity and Microwave S-parameter: so what? VNA Hardware Evolution Error Models and Calibration Techniques Interconnection and Fixture Design Calibration design for the DUT Uncertainty
3 Signal Integrity and Microwave
4 00 Introduction Dual-channel 0Gbps per port Bi-directional Dual-protocol (PCI Express and DisplayPort) Compatible with existing DisplayPort devices Daisy-chained devices Electrical or optical cables Low latency with highly accurate time synchronization Uses native protocol software drivers Power over cable for bus-powered devices
5 The S-matrix of a transmission line a a b Z Z R b l Port Port z s b a b s b Sa b s a 0 0, s b a a 0 e s s jkl a a, s b b b a a 0 s s e a a jkl s s, s a a b a a 0 0 S 0 e jkl e 0 jkl So to completely describe the propagation along a trasmission line we will need: REFERENCE PLANES REFERENCE IMPEDANCE S-MATRIX
6 Differential S-parameters? The differential mode Ed propagates mainly in the air thus it suffers much less of dielectric loss and anysotrtopy FR4 is a must for Digital application but FR4 is lossy and anysotropic thus Differental propagation became a must for high speed digital systems
7 Differential S-parameters What if instead of single ended voltages and currents we wish to use differential ones and associate the information to a couple of wires? I I 3 For Each Couple V V I V 3 I 4 V 4 V djk V cjk I djk I cjk V V j k ( V V )/ j k ( I I )/ j k ( I I ) j k 7
8 Differential S-parameters What are the propagation properties and is it usefull to have an S-parameter equivalent? Use a linear combination of V and I it s just another convention but to link it to propagation became more tricky: Which Reference impedance we need to take? What if we wish to have some port left single ended, i.e. an Operational Amplifier? Which are the properties of the new parameters? 8
9 Mixed Mode S-parameter Traditional definitions are: a b a b djk djk cjk cjk ( a ( b ( a ( b S j j j j a b a b k k k k ) ) ) ) BUT THESE ARE VALID ONLY IF Z Z cjk djk R Real Only R Real Only MSM 9
10 Generalized Mixed Mode S-parameters In general we may have a b a b djk djk cjk cjk R R R R djk djk cjk cjk V V V V djk djk cjk cjk Z Z Z I I I I Z djk djk djk djk cjk cjk cjk cjk Z Z Z Z djk djk cjk cjk p d ifferen tial p orts I d V d I c V c I d(p-)p V d(p-)p I c(p-)p V c(p-)p I V I V I p- V p- I p V p Ip+ n-ports V p+ S ( Ξ Ξ S)( Ξ Ξ S) BILINEAR MATRIX TRANSFORM n -p sing le end ed p orts In Vn 0
11 An example: The OpAmp ASSUME R R R D C OUT R0 R / 0 R 0
12 port Measurements ,,, a a a a a b s a b s a b s a b s a a s s s s b b Sa b S S a b a b
13 The old questions of S-parameter Measurements How can we generate microwave signals? How can we sample microwave signals? Where s the reference plane? What s the reference impedance?
14 Plus new problems for digital Low cost application How do I keep reasonable microwave signals on non microwave substrate? How can I make proper interconnections to measure these signals? How much accuracy can I accept?
15 VNA BASIC SCHEME IF Digitizer FOUR-CHANNEL MICROWAVE RECEIVER a m b m b m a m DUT PORT PORT BIAS BIAS REFLECTOMETER SIGNAL SEPARATION MICROWAVE SOURCE 5
16 From ports to multiports 4 Ports 4 Ref 4 Rec -ports Ref Rec 6
17 ports VNA Ref Switched Rec LEFT PORTS RIGHT PORTS 7
18 ports VNA Ref Switched Rec LEFT PORTS RIGHT PORTS
19 Interfacing Repeatibility Custom Fixtures Standard Availability
20 On Wafer
21 Let s summarize up to now. Directional Couplers have finite directivity and frequency depend behaviour. Switches are not ideal and frequency dependent 3. Reference Plane position depends on cable, adapter interconnections and so on 4. DownConversion and Digitizing problems like:. Source Phase Noise. Frequency accuracy and repeatibility 3. Non linearity of mixer/sampler 4. ADC Dynamic Range & Speed
22 Cause of Uncertainty Systematic Errors (85%) Microwave Components Interconnections Incorrect Standard Modeling Calibration Algorithm Random Error (0%) Connection Repeatibility Frequency Stability Noise Drift (5%)
23 Is Calibration fundamental? What if we would measure 30g of Ham with the scale plate of ton? THIS IS THE SAME EFFECT OF m cable at 0GHz if we are looking for degree of phase shift on S
24 Raw vs. Corrected Data
25 How does the calibration work? An error model A Specific Algorithm A Standard Sequence
26 Coax TRL On-Board Calibration Structures Thru and Line Structures Reflect and Match Structures 6
27 Multiport VNA Calibration Multiport standard may be required Calibration Algorithm must be found Cannot be a simple extension of the port ones
28 Multiport Calibration We do not have multiport standards We may not have Thrus We cannot connect one port to any others
29 Multiport VNA -state A: two side ports State A: port on the left, port on the right 4 directional couplers for the ports as the standard ports VNA LEFT PORTS RIGHT PORTS
30 Multiport VNA -state B: one side two ports State B: ports on the same side 3 directional couplers for the ports as the standard 3 sampler VNA each port is alternatively terminated LEFT PORTS RIGHT PORTS
31 Two States Multiport Error Model The partial reflectometer multiport system has two states, for each port: Linear Receivers Linear Network DUT STATE A STATE B
32 The multiport cal equation And the de-embedding is: 6n - unknowns Based on S parameters Always defined for any standards Can be used to find H,L,M,K,F,G during the cal As well as to find dut S matrix during the measurement A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers,Ferrero, A.; Teppati, V.; Garelli, M.; Neri, A. IEEE Transactions on Microwave Theory and Techniques, Volume 56, Issue 3, March 008 3
33 Dynamic Calibration Since no constrains are given on the standard type and the math can combine whatever sequence, the calibration becomes dynamic i.e. the software can generate the standard sequence which gives a set of enough linear independent equations as well as it accomplished for: Connectors at each ports Available standards USE ONLY or ports ONES!! User interconnection description Use of particular two port pairs self calibration 33
34 An Example a Socket Measurement
35 8-ports Socket Setup
36 Let s Design the Cal P LRM P5 P P3 P4 Thru Thru Thru P6 P7 P8
37 8-Port LRM Calibration Matrix Port Port Port 3 Port 4 Port 5 Port 6 Port 7 Port 8 Port X X X X P_LRM X X X Port X X X X Thru Thru X X Port 3 X X X X X Thru Thru X Port 4 X X X X X X Thru Thru Port 5 P_LRM Thru X X X X X X Port 6 X Thru Thru X X X X X Port 7 X X Thru Thru X X X X Port 8 X X X Thru X X X X Calibration Procedure: Thru Port, 5 Thru Port, 6 Thru Port 3, 7 Thru Port 4, 8 Thru Port, 5 Thru Port 3, 6 Thru Port 4, 7 Reflect Port Reflect Port 5 Load Port Load Port 5 Structure (All ports touchdown) Structure (All ports touchdown) Structures 3 4
38 GND SIG TERM Probe Touchdown 8-Port LRM Probe Touchdown N/A 8 Probe Touchdown Probe Touchdown 4 N/A N/A N/A 8
39 Calibration Design: A better cal with no xtalk P LSM P5 P Rec LSM P6 P3 LSM Rec P7 P4 Rec LSM P8
40 8-Port LRM/LSM Multi-Calibration Matrix with Reciprocal Thrus Port Port Port 3 Port 4 Port 5 Port 6 Port 7 Port 8 Port X Recip X X P_LSM X X X Port Recip X X X X P_LSM X X Port 3 X X X Recip X X P_LSM X Port 4 X X Recip X X X X P_LSM Port 5 P_LSM X X X X X X X Port 6 X P_LSM X X X X Recip X Port 7 X X P_LSM X X Recip X X Port 8 X X X P_LSM X X X X Calibration Procedure: 4 separate -port LSM/LRM calibrations linked with Thru Port, 5 reciprocal thru standards Thru Port, 6 Structure Thru Port 3, 7 No wasted probe touchdowns Thru Port 4, 8 Never move probe tips in x or y direction Recip, Recip 3, 4 Structure Full characterization of every port Recip 6, 7 Reflect Port, Reflect Port 5 Could provide more accurate calibrations Reflect Port, Reflect Port 6 Structures 3 Reflect Port 3, Reflect Port 7 Reflect Port 4, Reflect Port 8 Load Port, Load Port 5 Load Port, Load Port 6 Load Port 3, Load Port 7 Structures 4 Load Port 4, Load Port 8
41 8-Port LRM/LSM Standards (Probe tip Calibration) Probe Touchdown 5 Probe Touchdown X Length Probe Touchdown X Length Probe Touchdown Minimize probe tip Xtalk GND SIG TERM
42 Socket/Board Setup Close-up On Socket PROBES Land Places Cal Standards On Board PROBES Land Places
43 Socket-Board Data SDD-SDD-SDD33-SDD44
44 Socket-Board Data SDD - SDD34
45 Socket-Board Data SD4 SD3 (Far End Xtalk)
46 Socket-Board Data SD3 SD4 (Near End Xtalk) Bottom Board Top Board
47 Accuracy FAQ What s the residual error after the calibration? What s the overall accuracy of my measurements? What can I do to check if my calibration is good or bad? 47
48 General Uncertainty Procedure Calibration Measurement
49 S matrix Uncertainty We need the full covariance matrix, because we want the possibility to compute the mixed mode parameters, so:??
50 Where the Uncertainty comes from Standard Models Measurement Noise Repeatability
51 Repeatability Model
52 .4mm and the cable effect on repeatability
53 Conclusion VNA Hw is today capable of high accurate and fast measurements. Modern Calibration Technology solves many issues in multiport structure S parameter measurements Proper design of the measurement bench dramatically improves data accuracy Modern Software are today available to handle the measurement complexity and compute the uncertainty 53
54 Acknoledgements Valeria Teppati, Serena Bonino Politecnico of Torino Marco Garelli HFE Brett Grossmann, Tom Ruttan, Evan Fledell Intel Corp Jon Martens Anritsu Corp Dave Blackham Agilent
FieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements
FieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements FieldFox Handheld Education Series Interference Testing Cable and Antenna Measurements Calibration Techniques
More informationThere is a twenty db improvement in the reflection measurements when the port match errors are removed.
ABSTRACT Many improvements have occurred in microwave error correction techniques the past few years. The various error sources which degrade calibration accuracy is better understood. Standards have been
More informationBy convention, radio frequency (RF) and microwave frequencies range between 30 MHz and
Marco Pirola, Valeria Teppati, and Vittorio Camarchia By convention, radio frequency (RF) and microwave frequencies range between 30 MHz and 300 GHz. Conversely, this means their wavelengths range between
More informationConfiguration of PNA-X, NVNA and X parameters
Configuration of PNA-X, NVNA and X parameters VNA 1. S-Parameter Measurements 2. Harmonic Measurements NVNA 3. X-Parameter Measurements Introducing the PNA-X 50 GHz 43.5 GHz 26.5 GHz 13.5 GHz PNA-X Agilent
More informationThe Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects
The Practical Limitations of S Parameter Measurements and the Impact on Time- Domain Simulations of High Speed Interconnects Dennis Poulin Anritsu Company Slide 1 Outline PSU Signal Integrity Symposium
More informationVector Network Analyzer
Vector Network Analyzer VNA Basics VNA Roadshow Budapest 17/05/2016 Content Why Users Need VNAs VNA Terminology System Architecture Key Components Basic Measurements Calibration Methods Accuracy and Uncertainty
More informationIntroduction to On-Wafer Characterization at Microwave Frequencies
Introduction to On-Wafer Characterization at Microwave Frequencies Chinh Doan Graduate Student University of California, Berkeley Introduction to On-Wafer Characterization at Microwave Frequencies Dr.
More informationChallenges and Solutions for Removing Fixture Effects in Multi-port Measurements
DesignCon 2008 Challenges and Solutions for Removing Fixture Effects in Multi-port Measurements Robert Schaefer, Agilent Technologies schaefer-public@agilent.com Abstract As data rates continue to rise
More informationWinCal XE. Leonard Hayden Cascade Microtech, Inc.
WinCal XE - The Microwave Tool Leonard Hayden Cascade Microtech, Inc. Presentation Outline WinCal XE TM Software application for vector network analyzer probing and measurement Overview of WinCal XE features
More informationOptoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016
Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016 Content Introduction Photonics & Optoelectronics components Optical Measurements VNA (Vector Network
More informationMeasurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Network Analyzer Measurements In many RF and Microwave measurements the S-Parameters are typically
More informationA Complete Noise- and Scattering-Parameters Test-Set Marco Garelli, Member, IEEE, Andrea Ferrero, Senior Member, IEEE, and Serena Bonino
716 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 57, NO. 3, MARCH 2009 A Complete Noise- and Scattering-Parameters Test-Set Marco Garelli, Member, IEEE, Andrea Ferrero, Senior Member, IEEE,
More information5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis
5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis Contents 5 Essential Hints to Improve Millimeter-wave Network Analysis Ensure Accurate, Repeatable Results Go to Hint 1 > Calibrate for Better
More informationDetermination of Uncertainty for Dielectric Properties Determination of Printed Circuit Board Material
Determination of Uncertainty for Dielectric Properties Determination of Printed Circuit Board Material Marko Kettunen, Kare-Petri Lätti, Janne-Matti Heinola, Juha-Pekka Ström and Pertti Silventoinen Lappeenranta
More informationWafer-Level Calibration & Verification up to 750 GHz. Choon Beng Sia, Ph.D. Mobile:
Wafer-Level Calibration & Verification up to 750 GHz Choon Beng Sia, Ph.D. Email: Choonbeng.sia@cmicro.com Mobile: +65 8186 7090 2016 Outline LRRM vs SOLT Calibration Verification Over-temperature RF calibration
More informationA Measurement of Non-Coaxial RF Devices with Improved TRL Calibration Algorithm
A Measurement of Non-Coaxial RF Devices with Improved TRL Calibration Algorithm Chen Shouhong 1, Wang Zhuang 1, Ma Jun 1,*,and Hou Xingna 2 1 School of Electronic Engineering&Automation, Guangxi Key Laboratory
More informationComparison of Various RF Calibration Techniques in Production: Which is Right for You? Daniel Bock, Ph.D.
Comparison of Various RF Calibration Techniques in Production: Which is Right for You? Daniel Bock, Ph.D. Overview Introduction How does Calibration Work Types of Calibrations Comparison of Calibration
More informationA New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy
MAURY MICROWAVE CORPORATION March 2013 A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy Gary Simpson 1, David Ballo 2, Joel Dunsmore
More informationWaveguide Calibration with Copper Mountain Technologies VNA
Clarke & Severn Electronics Ph: +612 9482 1944 BUY NOW www.cseonline.com.au Introduction Waveguide components possess certain advantages over their counterpart devices with co-axial connectors: they can
More informationFast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters.
Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters. April 15, 2015 Istanbul, Turkey R&D Principal Engineer, Component Test Division Keysight
More informationProduct Note 75 DLPS, a Differential Load Pull System
63 St-Regis D.D.O, Quebec H9B 3H7, Canada Tel 54-684-4554 Fax 54-684-858 E-mail: info@ focus-microwaves.com Website: http://www.focus-microwaves.com Product Note 75 DLPS, a Differential Load Pull System
More informationPlatform Migration 8510 to PNA. Graham Payne Application Engineer Agilent Technologies
Platform Migration 8510 to PNA Graham Payne Application Engineer Agilent Technologies We set the standard... 8410 8510 When we introduced the 8510, we changed the way S-parameter measurements were made!
More informationAgilent AN Applying Error Correction to Network Analyzer Measurements
Agilent AN 287-3 Applying Error Correction to Network Analyzer Measurements Application Note 2 3 4 4 5 6 7 8 0 2 2 3 3 4 Table of Contents Introduction Sources and Types of Errors Types of Error Correction
More informationSimplifying the Art of Terahertz Measurements
Simplifying the Art of Terahertz Measurements Achieving metrology-level accuracy with a manual probe system With significant expansion of emerging THz applications, such as non-invasive spectroscopy, security
More informationUSB 3.1 Cable-Connector Assembly Compliance Tests. Test Solution Overview Using the Keysight E5071C ENA Option TDR. Last Update 2015/02/06
USB 3.1 Cable-Connector Assembly s Test Solution Overview Using the Keysight E5071C ENA Option TDR Last Update 015/0/06 Purpose This slide will show how to make measurements of USB 3.1 cable & connector
More informationTwo different ways in evaluating the uncertainty of S-parameter measurements
th IMEKO TC International Symposium and 8th International Workshop on ADC Modelling and Testing Research on Electric and Electronic Measurement for the Economic Upturn Benevento, Italy, September 57, Two
More informationCalibration and Accuracy in Millimeter Systems. Keith Anderson
IMS2011 in Baltimore: A Perfect Match Calibration and Accuracy in Millimeter Systems Keith Anderson Agilent Technologies Copyright 2010 Agilent Technologies, Inc. Agenda Interfaces S-parameter calibration
More informationPrecise Microwave Vector Measurements
Precise Microwave Vector Measurements Karel Hoffmann Czech Technical University in Prague Faculty of Electrical Engineering Department of Electromagnetic Field Technická 2, 162 Prague 6, Czech Republic
More informationOn Wafer Load Pull and Noise Measurements using Computer Controlled Microwave Tuners
970 Montee de Liesse, #308 Ville St-Laurent, Quebec, Canada, H4T 1W7 Tel: 514-335-6227 Fax: 514-335-6287 Email focusmw@compuserve.com Web Site: http://www.focus-microwaves.com Application Note No 14 On
More informationLimitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices
Limitations And Accuracies Of Time And Frequency Domain Analysis Of Physical Layer Devices Outline Short Overview Fundamental Differences between TDR & Instruments Calibration & Normalization Measurement
More informationNATIONAL UNIVERSITY of SINGAPORE
NATIONAL UNIVERSITY of SINGAPORE Faculty of Engineering Electrical & Computer Engineering Department EE3104 Introduction to RF and Microwave Systems & Circuits Experiment 1 Familiarization on VNA Calibration
More informationVector Network Analyzer Application note
Vector Network Analyzer Application note Version 1.0 Vector Network Analyzer Introduction A vector network analyzer is used to measure the performance of circuits or networks such as amplifiers, filters,
More informationPNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE
PNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE Table of Contents PNA Family Network Analyzer Configurations... 05 Test set and power configuration options...05 Hardware options...
More informationAmplifier Characterization in the millimeter wave range. Tera Hertz : New opportunities for industry 3-5 February 2015
Amplifier Characterization in the millimeter wave range Tera Hertz : New opportunities for industry 3-5 February 2015 Millimeter Wave Converter Family ZVA-Z500 ZVA-Z325 Y Band (WR02) ZVA-Z220 J Band (WR03)
More informationEE290C - Spring 2004 Advanced Topics in Circuit Design
EE290C - Spring 2004 Advanced Topics in Circuit Design Lecture #3 Measurements with VNA and TDR Ben Chia Tu-Th 4 5:30pm 531 Cory Agenda Relationships between time domain and frequency domain TDR Time Domain
More informationFrequency-Domain Characterization of Power Distribution Networks
Frequency-Domain Characterization of Power Distribution Networks Istvan Novak Jason R. Miller ARTECH H O U S E BOSTON LONDON artechhouse.com Preface Acknowledgments xi xv CHAPTER 1 Introduction 1 1.1 Evolution
More informationFABRICATING AND USING A PCB-BASED TRL PATTERN WITH A CMT VNA
FABRICATING AND USING A PCB-BASED TRL PATTERN WITH A CMT VNA 03/19/2018 Introduction Copper Mountain Technologies provides metrologically sound, lab grade USB VNAs which support advanced calibration techniques,
More informationLightning D Vector Network Analyzers. Network Analysis Solutions for Design and Manufacturing. 40 MHz to 65 GHz
Lightning 37000D Vector Network Analyzers 40 MHz to 65 GHz Network Analysis Solutions for Design and Manufacturing Vector Network Analyzers that offer... The 37000D Lightning Vector Network Analyzers are
More informationSpecifying Calibration Standards and Kits for Agilent Vector Network Analyzers. Application Note
Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers Application Note 1287-11 Table of Contents Introduction... 3 Measurement errors... 3 Measurement calibration...3 Calibration
More informationCharacterizing Non-Standard Impedance Channels with 50 Ohm Instruments
Characterizing Non-Standard Impedance Channels with 50 Ohm Instruments Julian Ferry, Jim Nadolny, Craig Rapp: Samtec Inc. Mike Resso, O.J. Danzy: Agilent Technologies Introduction Emerging systems are
More informationECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration
ECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration Objectives The purpose of this lab is to introduce the concepts of calibration and error correction for microwave s-parameter measurements.
More informationHigh Speed Characterization Report
SSW-1XX-22-X-D-VS Mates with TSM-1XX-1-X-DV-X Description: Surface Mount Terminal Strip,.1 [2.54mm] Pitch, 13.59mm (.535 ) Stack Height Samtec, Inc. 25 All Rights Reserved Table of Contents Connector Overview...
More informationMillimeter-Wave Characterization and test-benches
Millimeter-Wave Characterization and test-benches M. Spirito, L. Galatro, G. Gentile, S. Galbano, Electronic Research Laboratory, TU Delft 22-5-2013 Delft University of Technology Challenge the future
More informationDesignCon Differential PCB Structures using Measured TRL Calibration and Simulated Structure De-Embedding
DesignCon 2007 Differential PCB Structures using Measured TRL Calibration and Simulated Structure De-Embedding Heidi Barnes, Verigy, Inc. heidi.barnes@verigy.com Dr. Antonio Ciccomancini, CST of America,
More informationKeysight Technologies Signal Integrity Tips and Techniques Using TDR, VNA and Modeling
Keysight Technologies Signal Integrity Tips and Techniques Using, VNA and Modeling Article Reprint This article first appeared in the March 216 edition of Microwave Journal. Reprinted with kind permission
More informationVerification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates
Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates J.E. Pence Cascade Microtech, 2430 NW 206th Avenue, Beaverton, OR 97006 Abstract The on-wafer
More informationA Signal Integrity Measuring Methodology in the Extraction of Wide Bandwidth Environmental Coefficients
As originally published in the IPC APEX EXPO Conference Proceedings. A Signal Integrity Measuring Methodology in the Extraction of Wide Bandwidth Environmental Coefficients Eric Liao, Kuen-Fwu Fuh, Annie
More informationRF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand
RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand Advanced VNA Measurements Agenda Overview of the PXIe-5632 Architecture SW Experience Overview of VNA Calibration
More informationGain Lab. Image interference during downconversion. Images in Downconversion. Course ECE 684: Microwave Metrology. Lecture Gain and TRL labs
Gain Lab Department of Electrical and Computer Engineering University of Massachusetts, Amherst Course ECE 684: Microwave Metrology Lecture Gain and TRL labs In lab we will be constructing a downconverter.
More informationAgilent Accurate Measurement of Packaged RF Devices. White Paper
Agilent Accurate Measurement of Packaged RF Devices White Paper Slide #1 Slide #2 Accurate Measurement of Packaged RF Devices How to Measure These Devices RF and MW Device Test Seminar 1995 smafilt.tif
More informationAgilent 4-Port PNA-L Network Analyzers
Agilent 4-Port PNA-L Network Analyzers N5230A Options 240, 245 300 khz to 20 GHz Speed and accuracy you can count on Integrated 4-port, balanced measurements up to 20 GHz Introducing the 4-port PNA-L network
More informationMeasurements 2: Network Analysis
Measurements 2: Network Analysis Fritz Caspers CAS, Aarhus, June 2010 Contents Scalar network analysis Vector network analysis Early concepts Modern instrumentation Calibration methods Time domain (synthetic
More information3680 Series. Universal Test Fixtures. A Complete Measurement Solution. DC to 60 GHz DC to 20 GHz 3680K DC to 40 GHz 3680V DC to 60 GHz
3680 Series Universal Test Fixtures DC to 60 GHz A Complete Measurement Solution 3680-20 DC to 20 GHz 3680K DC to 40 GHz 3680V DC to 60 GHz Solid ground contacts top and bottom allow microstrip or coplanar
More informationHigh Speed Characterization Report
TMMH-115-05-L-DV-A Mated With CLT-115-02-L-D-A Description: Micro Surface Mount, Board-to Board, 2.0mm (.0787 ) Pitch, 4.77mm (0.188 ) Stack Height Samtec, Inc. 2005 All Rights Reserved Table of Contents
More informationAries Kapton CSP socket
Aries Kapton CSP socket Measurement and Model Results prepared by Gert Hohenwarter 5/19/04 1 Table of Contents Table of Contents... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 4 Setup... 4 MEASUREMENTS...
More informationMillimeter Signal Measurements: Techniques, Solutions and Best Practices
New Network Analyzer platform Millimeter Signal Measurements: Techniques, Solutions and Best Practices Phase Noise measurements update 1 N522XA PNA Series Network Analyzer Introducing Highest Performance
More informationCharacterizing Electromagnetic Properties of Materials. Making Reliable Measurements at mm and Sub-mm Wavelengths
Characterizing Electromagnetic Properties of Materials at 110GHz and Beyond Jeffrey Hesler Shelley Begley Suren Singh Phil Bartley Virginia Diodes Inc. Agilent Technologies Agilent Technologies IMS Agenda
More informationAgilent Network Analysis Applying the 8510 TRL Calibration for Non-Coaxial Measurements. Product Note A
Agilent Network Analysis Applying the 8510 TRL Calibration for Non-Coaxial Measurements Product Note 8510-8A Introduction This note describes how the Agilent 8510 network analyzer can be used to make error-corrected
More informationOn-Wafer Noise Parameter Measurements using Cold-Noise Source and Automatic Receiver Calibration
Focus Microwaves Inc. 970 Montee de Liesse, Suite 308 Ville St.Laurent, Quebec, Canada, H4T-1W7 Tel: +1-514-335-67, Fax: +1-514-335-687 E-mail: info@focus-microwaves.com Website: http://www.focus-microwaves.com
More informationExtraction of Broadband Error Boxes for Microprobes and Recessed Probe Launches for Measurement of Printed Circuit Board Structures
Extraction of Broadband Error Boxes for Microprobes and Recessed Probe Launches for Measurement of Printed Circuit Board Structures, Renato Rimolo-Donadio, Christian Schuster Institut für TU Hamburg-Harburg,
More informationValidation Report Comparison of Eye Patterns Generated By Synopsys HSPICE and the Agilent PLTS
Comparison of Eye Patterns Generated By Synopsys HSPICE and the Agilent PLTS Using: Final Inch Test/Eval Kit, Differential Pair - No Grounds Configuration, QTE-DP/QSE-DP, 5mm Stack Height (P/N FIK-QxE-04-01)
More informationTesting High-Speed Digital Interfaces with Automated Test Equipment
Testing High-Speed Digital Interfaces with Automated Test Equipment Jose Moreira and Hubert Werkmann Verigy jose.moreira@verigy.com hubert.werkmann@verigy.com Abstract For high-speed digital applications
More informationValidation & Analysis of Complex Serial Bus Link Models
Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract
More informationCalibration and De-Embedding Techniques in the Frequency Domain
Calibration and De-Embedding Techniques in the Frequency Domain Tom Dagostino tom@teraspeed.com Alfred P. Neves al@teraspeed.com Page 1 Teraspeed Labs Teraspeed Consulting Group LLC 2008 Teraspeed Consulting
More informationHigh Speed Characterization Report
PCRF-064-XXXX-EC-SMA-P-1 Mated with: PCIE-XXX-02-X-D-TH Description: PCI Express Cable Assembly, Low Loss Microwave Cable Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable Assembly Overview...
More informationThe Challenges of Differential Bus Design
The Challenges of Differential Bus Design February 20, 2002 presented by: Arthur Fraser TechKnowledge Page 1 Introduction Background Historically, differential interconnects were often twisted wire pairs
More informationA Comparison of Harmonic Tuning Methods for Load Pull Systems
MAURY MICROWAVE CORPORATION A Comparison of Harmonic Tuning Methods for Load Pull Systems Author: Gary Simpson, MSEE Director of Technical Development in Engineering, Maury Microwave Corporation July 2009
More informationApplication Note Three and Four Port S-parameter Measurements
Application Note Three and Four Port S-parameter Measurements Scorpion Calibrations and Mixed-Mode Parameters Introduction Calibrations are the critical first step to multiport vector network analyzer
More informationMS2760A a new approach for mm-wave and 5G spectrum measurements
MS2760A a new approach for mm-wave and 5G spectrum measurements RF Technology Days 2018 Ferdinand Gerhardes EMEA BDM April 2018 Agenda Anritsu SPA product portfolio MS2760A feature overview What is NLTL?
More informationMeasuring the Invasiveness of High-Impedance Probes
Measuring the Invasiveness of High-Impedance Probes Uwe Arz 1 Pavel Kabos 2 Dylan F. Williams 2 1 Physikalisch-Technische Bundesanstalt, Braunschweig, Germany 2 National Institute of Standards and Technology,
More informationManaging Complex Impedance, Isolation & Calibration for KGD RF Test Abstract
Managing Complex Impedance, Isolation & Calibration for KGD RF Test Roger Hayward and Jeff Arasmith Cascade Microtech, Inc. Production Products Division 9100 SW Gemini Drive, Beaverton, OR 97008 503-601-1000,
More informationS-Parameter Measurements with the Bode 100
Page 1 of 10 with the Bode 100 Page 2 of 10 Table of Contents 1 S-Parameters...3 2 S-Parameter Measurement with the Bode 100...4 2.1 Device Setup...4 2.2 Calibration...5 2.3 Measurement...7 2.3.1 S11 and
More informationA True Differential Millimeter Wave System with Port Power Control. Presented by: Suren Singh
A True Differential Millimeter Wave System with Port Power Control Presented by: Suren Singh Agenda Need for True Differential and RF Power Control Vector Network Analyzer RF Port Power Control Port Power
More information(a) The insertion loss is the average value of the transmission coefficient, S12 (db), in the passband (Figure 1 Label A)
Lab 6-1: Microwave Multiport Circuits In this lab you will characterize several different multiport microstrip and coaxial components using a network analyzer. Some, but not all, of these components have
More informationHigh Speed Characterization Report
ESCA-XX-XX-XX.XX-1-3 Mated with: SEAF8-XX-05.0-X-XX-2-K SEAM8-XX-S02.0-X-XX-2-K Description: 0.80 mm SEARAY High-Speed/High-Density Array Cable Assembly, 34 AWG Samtec, Inc. 2005 All Rights Reserved Table
More informationNovel Method for Vector Mixer Characterization and Mixer Test System Vector Error Correction. White Paper
Novel Method for Vector Mixer Characterization and Mixer Test System Vector Error Correction White Paper Abstract This paper presents a novel method for characterizing RF mixers, yielding magnitude and
More informationAdvanced Signal Integrity Measurements of High- Speed Differential Channels
Advanced Signal Integrity Measurements of High- Speed Differential Channels September 2004 presented by: Mike Resso Greg LeCheminant Copyright 2004 Agilent Technologies, Inc. What We Will Discuss Today
More informationSpurious and Stability Analysis under Large-Signal Conditions using your Vector Network Analyser
Spurious and Stability Analysis under Large-Signal Conditions using your Vector Network Analyser An application of ICE June 2012 Outline Why combining Large-Signal and Small-Signal Measurements Block Diagram
More informationIVCAD VNA Base Load Pull with Active/Hybrid Tuning. Getting Started v3.5
IVCAD VNA Base Load Pull with Active/Hybrid Tuning Getting Started v3.5 1 Setting and Configuration Block Diagram... 3 1.1 VNA setup... 5 1.2 RF source setup... 6 1.3 Power meter setup... 7 1.4 Source
More informationHigh Speed Characterization Report
QTH-030-01-L-D-A Mates with QSH-030-01-L-D-A Description: High Speed Ground Plane Header Board-to-Board, 0.5mm (.0197 ) Pitch, 5mm (.1969 ) Stack Height Samtec, Inc. 2005 All Rights Reserved Table of Contents
More informationMarch 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive
March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings
More informationHigh Speed Characterization Report
PCIEC-XXX-XXXX-EC-EM-P Mated with: PCIE-XXX-02-X-D-TH Description: 1.00 mm PCI Express Internal Cable Assembly, 30 AWG Twinax Ribbon Cable Samtec, Inc. 2005 All Rights Reserved Table of Contents Cable
More informationReflection measurement methods for characterization of dielectric properties
Reflection measurement methods for characterization of dielectric properties M. Zimmermanns, B. Will, and I. Rolfes, Member, IEEE Index Terms Reflection measurements, dielectric materials, free space,
More informationHigh Speed Digital Design & Verification Seminar. Measurement fundamentals
High Speed Digital Design & Verification Seminar Measurement fundamentals Agenda Sources of Jitter, how to measure and why Importance of Noise Select the right probes! Capture the eye diagram Why measure
More informationThe 2-Port Shunt-Through Measurement and the Inherent Ground Loop
The Measurement and the Inherent Ground Loop The 2-port shunt-through measurement is the gold standard for measuring milliohm impedances while supporting measurement at very high frequencies (GHz). These
More informationKeysight Technologies PXI Vector Network Analyzer Series
Ihr Spezialist für Mess- und Prüfgeräte Keysight Technologies PXI Vector Network Analyzer Series Drive down the size of test datatec Ferdinand-Lassalle-Str. 52 72770 Reutlingen Tel. 07121 / 51 50 50 Fax
More informationMeasuring Hot TDR and Eye Diagrams with an Vector Network Analyzer?
Measuring Hot TDR and Eye Diagrams with an Vector Network Analyzer? Gustaaf Sutorius Application Engineer Agilent Technologies gustaaf_sutorius@agilent.com Page 1 #TDR fit in Typical Digital Development
More informationAgilent Technologies High-Definition Multimedia
Agilent Technologies High-Definition Multimedia Interface (HDMI) Cable Assembly Compliance Test Test Solution Overview Using the Agilent E5071C ENA Option TDR Last Update 013/08/1 (TH) Purpose This slide
More information1000BASE-T1 EMC Test Specification for Common Mode Chokes
IEEE 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Author & Company Dr. Bernd Körber, FTZ Zwickau Title 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Date
More informationAdvancements in Noise Measurement
Advancements in Noise Measurement by Ken Wong, Senior Member IEEE R&D Principal Engineer Component Test Division Agilent Technologies, Inc. Page 1 EuMw Objectives 007 Aerospace Agilent Workshop and Defense
More informationKeysight Technologies Applying Error Correction to Vector Network Analyzer Measurements. Application Note
Keysight Technologies Applying Error Correction to Vector Network Analyzer Measurements Application Note Introduction Only perfect test equipment would not need correction. Imperfections exist in even
More informationEXTEND YOUR REACH GHz 60-90GHz GHz
EXTEND YOUR REACH 50-75 GHz 60-90GHz 75-110 GHz Extend Your Reach Farran Technology and Copper Mountain Technologies, globally recognized innovators, with a combined 50 years experience in RF test and
More informationA Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs
A Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs Presenter: Brian Shumaker DVT Solutions, LLC, 650-793-7083 b.shumaker@comcast.net
More informationNetwork Analysis Seminar. Cables measurement
Network Analysis Seminar Cables measurement Agenda 1. Device Under Test: Cables & Connectors 2. Instrument for cables testing: Network Analyzer 3. Measurement: Frequency Domain 4. Measurement: Time Domain
More informationComparison of IC Conducted Emission Measurement Methods
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 52, NO. 3, JUNE 2003 839 Comparison of IC Conducted Emission Measurement Methods Franco Fiori, Member, IEEE, and Francesco Musolino, Member, IEEE
More informationMPI Probe Selection Guide
MPI Probe Selection Guide With a critical understanding of the numerous measurement challenges associated with today s RF applications, MPI Corporation has developed TITAN RF Probes, a product series specifically
More information9 khz to 4.5/6.5/8.5 GHz 100 khz to 4.5/6.5/8.5 GHz (with bias tees) 300 khz to 14/20 GHz (with bias tees)
Agilent E5071C ENA Network Analyzer 9 khz to 4.5/6.5/8.5 GHz 100 khz to 4.5/6.5/8.5 GHz () 300 khz to 14/20 GHz () The industry standard in RF network analysis ENA New Standards in Speed, Accuracy and
More informationReflectometer Series:
Reflectometer Series: R54, R60 & R140 Vector Network Analyzers Clarke & Severn Electronics Ph +612 9482 1944 Email sales@clarke.com.au BUY NOW - www.cseonline.com.au KEY FEATURES Patent: US 9,291,657 No
More informationAries Center probe CSP socket Cycling test
Aries Center probe CSP socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 10/27/04 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 5 Setup...
More informationAries CSP microstrip socket Cycling test
Aries CSP microstrip socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 2/18/05 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 6 Setup...
More information