WinCal XE. Leonard Hayden Cascade Microtech, Inc.
|
|
|
- Bethany Ramsey
- 5 years ago
- Views:
Transcription
1 WinCal XE - The Microwave Tool Leonard Hayden Cascade Microtech, Inc.
2 Presentation Outline WinCal XE TM Software application for vector network analyzer probing and measurement Overview of WinCal XE features Calibration Validation Measurement Analysis Case studies Characterization of inductors Modeling of Gate-Oxide Capacitor Differential amplifier testing
3 Features Overview VNA Calibration System setup captured at device levell Probe location and orientation matter Standard orientation must be compatible as well E.g., ISS rotation
4 Features Overview VNA Calibration Library of Probes and Impedance Standard Substrates Internal tables of electrical behavior Visual user interface with images of standards
5 Features Overview VNA Calibration Library of calibration methods Solid core set usual SOL based including unknown thru (SOLR) Notable advances Multi-line TRL (NIST refcal) Enhanced LRRM (elrrm ) 16 term SVD cal Hybrid 4-port cals Pluggable - simplifies future extensions DUT DUT
6 Features Overview VNA Calibration Complete support of 2 nd Tier Calibration Cals calculate error boxes between ref planes Any subset of ports Send to VNA augments the first-tier cal with the 2 nd tier Useful in mixed interface E.g., Port 1 is probe tip, port 2 is coax connector Coax cal 1 st tier, SOL probe tip 2 nd tier te cal on port 1 2nd Tier on
7 Features Overview Cal Validation Do I have a good calibration? Simple validation strategy: Measure additional element not used dfor calibration Vector comparison: measurement vs. expected behavior All ports tested Supports: Open verification after LRRM Golden die compare with prior reference result Vector comparison is very sensitive Good cal can be better than known (LRRM vs Copen) Excellent for improving consistency
8 Features Overview: Measurement Multiple page document Up to 4 graphs per page polar, Smith, x-y Dynamically select active data items Library of data reduction methods to create traces Live new traces appear as new data comes in Templates with views, no data
9 Features Overview: Analysis Post processing of data Create new data items from old in scratch pad Library of primitives and functions Functions are provided but can also be easily created by user
10 Features Overview: Analysis Local Data Reduction and Viewing Example: Inductor Q XE converts S-parameters to Z-parameters, extracts imaginary part and divides by real View device data for sanity check Device or data analysis & exploration Test development & refinement Quick verification of cal or setup
11 Case Study: Inductor Measurement Measured on-wafer inductor as 2-port Measured open and shorted pads Calculated intrinsic inductor (de-embed pads) Calculated differential inductor Displayed differential inductance, resistance, and Q
12 Case Study: Gate Capacitor Modeling Custom toolbar with model values Comparison graphs including EVM Error Vector Magnitude PORT P= 1 Z= 50 Ohm RE S ID= Ri R= 4.18 Ohm CAP ID= C1 C= 271 ff RES ID= Rint R= 11.7 Ohm CAP ID= Cint C= 4.98e4 f F CAP ID= Cox C= 1.28e4 f F IND ID= L1 L= 8.9 ph Scratchpad to calculate the model behavior
13 Case Study: Differential Amplifier 1 st tier coaxial ref plane 2 nd tier differential probe-tip ref plane 2 nd tier single-ended probe-tip ref plane 1 st tier coaxial ref plane Port 1 Port 2 No possible Thru, so how do we calibrate to the probe tips? Answer: 1 st tier 2-port coaxial calibration 2 nd tier differential probe-tip 1-port cal (port 1) 2 nd tier single-ended 1-port cal (port 2)
14 WinCal XE is the Microwave Tool Visit for more information FREE DEMO VERSION Unlimited data viewing, manipulation and display FREE TRIAL VERSION Fully functional for 30 days Academic discount available Visit our booth for a demo
Comparison of Various RF Calibration Techniques in Production: Which is Right for You? Daniel Bock, Ph.D.
Comparison of Various RF Calibration Techniques in Production: Which is Right for You? Daniel Bock, Ph.D. Overview Introduction How does Calibration Work Types of Calibrations Comparison of Calibration
Wafer-Level Calibration & Verification up to 750 GHz. Choon Beng Sia, Ph.D. Mobile:
Wafer-Level Calibration & Verification up to 750 GHz Choon Beng Sia, Ph.D. Email: Choonbeng.sia@cmicro.com Mobile: +65 8186 7090 2016 Outline LRRM vs SOLT Calibration Verification Over-temperature RF calibration
Introduction to On-Wafer Characterization at Microwave Frequencies
Introduction to On-Wafer Characterization at Microwave Frequencies Chinh Doan Graduate Student University of California, Berkeley Introduction to On-Wafer Characterization at Microwave Frequencies Dr.
Managing Complex Impedance, Isolation & Calibration for KGD RF Test Abstract
Managing Complex Impedance, Isolation & Calibration for KGD RF Test Roger Hayward and Jeff Arasmith Cascade Microtech, Inc. Production Products Division 9100 SW Gemini Drive, Beaverton, OR 97008 503-601-1000,
Measurements with the LeCroy SPARQ and Cascade Microtech Probes Using WinCal XE Calibrations
Measurements with the LeCroy SPARQ and Cascade Microtech Probes Using WinCal XE Calibrations LeCroy Corporation and Cascade Microtech APPLICATION NOTE Introduction Measurements on two printed circuit boards
Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates
Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates J.E. Pence Cascade Microtech, 2430 NW 206th Avenue, Beaverton, OR 97006 Abstract The on-wafer
Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Network Analyzer Measurements In many RF and Microwave measurements the S-Parameters are typically
Measuring the Invasiveness of High-Impedance Probes
Measuring the Invasiveness of High-Impedance Probes Uwe Arz 1 Pavel Kabos 2 Dylan F. Williams 2 1 Physikalisch-Technische Bundesanstalt, Braunschweig, Germany 2 National Institute of Standards and Technology,
Microwave Metrology -ECE 684 Spring Lab Exercise T: TRL Calibration and Probe-Based Measurement
ab Exercise T: TR Calibration and Probe-Based Measurement In this project, you will measure the full phase and magnitude S parameters of several surface mounted components. You will then develop circuit
Challenges and Solutions for Removing Fixture Effects in Multi-port Measurements
DesignCon 2008 Challenges and Solutions for Removing Fixture Effects in Multi-port Measurements Robert Schaefer, Agilent Technologies schaefer-public@agilent.com Abstract As data rates continue to rise
Configuration of PNA-X, NVNA and X parameters
Configuration of PNA-X, NVNA and X parameters VNA 1. S-Parameter Measurements 2. Harmonic Measurements NVNA 3. X-Parameter Measurements Introducing the PNA-X 50 GHz 43.5 GHz 26.5 GHz 13.5 GHz PNA-X Agilent
product note Using Power Leveling to Control Test Port Output Power Product Note 8510XF XF Network Analyzer
This literature was published years prior to the establishment of Agilent Technologies as a company independent from Hewlett-Packard and describes products or services now available through Agilent. It
5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis
5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis Contents 5 Essential Hints to Improve Millimeter-wave Network Analysis Ensure Accurate, Repeatable Results Go to Hint 1 > Calibrate for Better
March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive
March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings
Archive 2017 BiTS Workshop- Image: Easyturn/iStock
Archive September 6-7, 2017 InterContinental Shanghai Pudong Hotel - Shanghai, China Archive 2017 BiTS Workshop- Image: Easyturn/iStock September 6-7, 2017 Archive COPYRIGHT NOTICE This multimedia file
There is a twenty db improvement in the reflection measurements when the port match errors are removed.
ABSTRACT Many improvements have occurred in microwave error correction techniques the past few years. The various error sources which degrade calibration accuracy is better understood. Standards have been
Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016
Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016 Content Introduction Photonics & Optoelectronics components Optical Measurements VNA (Vector Network
A PROBE TECHNOLOGY FOR 110+ GHZ INTEGRATED CIRCUITS WITH ALUMINUM PADS
A PROBE TECHNOLOGY FOR 11+ GHZ INTEGRATED CIRCUITS WITH ALUMINUM PADS Amr M. E. Safwat, Mike Andrews, Leonard Hayden, K. Reed Gleason and Eric Strid Cascade Microtech, Inc. 243 NW 26th Avenue, Beaverton,
Circuit Characterization with the Agilent 8714 VNA
Circuit Characterization with the Agilent 8714 VNA By: Larry Dunleavy Wireless and Microwave Instruments University of South Florida Objectives 1) To examine the concepts of reflection, phase shift, attenuation,
EE290C - Spring 2004 Advanced Topics in Circuit Design
EE290C - Spring 2004 Advanced Topics in Circuit Design Lecture #3 Measurements with VNA and TDR Ben Chia Tu-Th 4 5:30pm 531 Cory Agenda Relationships between time domain and frequency domain TDR Time Domain
Gain Lab. Image interference during downconversion. Images in Downconversion. Course ECE 684: Microwave Metrology. Lecture Gain and TRL labs
Gain Lab Department of Electrical and Computer Engineering University of Massachusetts, Amherst Course ECE 684: Microwave Metrology Lecture Gain and TRL labs In lab we will be constructing a downconverter.
FieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements
FieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements FieldFox Handheld Education Series Interference Testing Cable and Antenna Measurements Calibration Techniques
Suppression Techniques using X2Y as a Broadband EMI Filter IEEE International Symposium on EMC, Boston, MA
Suppression Techniques using X2Y as a Broadband EMI Filter Jim Muccioli Tony Anthony Dave Anthony Dale Sanders X2Y Attenuators, LLC Erie, PA 16506-2972 www.x2y.com Email: x2y@x2y.com Bart Bouma Yageo/Phycomp
Platform Migration 8510 to PNA. Graham Payne Application Engineer Agilent Technologies
Platform Migration 8510 to PNA Graham Payne Application Engineer Agilent Technologies We set the standard... 8410 8510 When we introduced the 8510, we changed the way S-parameter measurements were made!
Microwave Measurements for signal integrity applications
Microwave Measurements for signal integrity applications Prof. Andrea Ferrero,FIEEE Distinguished Microwave Lectures Dip. Elettronica- Politecnico di Torino Summary Signal Integrity and Microwave S-parameter:
NATIONAL UNIVERSITY of SINGAPORE
NATIONAL UNIVERSITY of SINGAPORE Faculty of Engineering Electrical & Computer Engineering Department EE3104 Introduction to RF and Microwave Systems & Circuits Experiment 1 Familiarization on VNA Calibration
Agilent Accurate Measurement of Packaged RF Devices. White Paper
Agilent Accurate Measurement of Packaged RF Devices White Paper Slide #1 Slide #2 Accurate Measurement of Packaged RF Devices How to Measure These Devices RF and MW Device Test Seminar 1995 smafilt.tif
Lightning D Vector Network Analyzers. Network Analysis Solutions for Design and Manufacturing. 40 MHz to 65 GHz
Lightning 37000D Vector Network Analyzers 40 MHz to 65 GHz Network Analysis Solutions for Design and Manufacturing Vector Network Analyzers that offer... The 37000D Lightning Vector Network Analyzers are
Aries Kapton CSP socket
Aries Kapton CSP socket Measurement and Model Results prepared by Gert Hohenwarter 5/19/04 1 Table of Contents Table of Contents... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 4 Setup... 4 MEASUREMENTS...
Millimeter Signal Measurements: Techniques, Solutions and Best Practices
New Network Analyzer platform Millimeter Signal Measurements: Techniques, Solutions and Best Practices Phase Noise measurements update 1 N522XA PNA Series Network Analyzer Introducing Highest Performance
Infinity Probe Mechanical Layout Rules
Infinity Probe Mechanical Layout Rules APPLICATION NOTE Introduction The explosive growth of smart phones has led to advancements in communications protocols, such as 4G and 5G. This leads to technological
Expanding Impedance Measurement to Nanoscale:
Expanding Impedance Measurement to Nanoscale: Coupling the Power of Scanning Probe Microscopy with Performance Network Analyzer (PNA) Hassan Tanbakuchi Senior Research Scientist Agilent Technologies Agilent
Considerations in High-Speed High Performance Die-Package-Board Co-Design. Jenny Jiang Altera Packaging Department October 2014
Considerations in High-Speed High Performance Die-Package-Board Co-Design Jenny Jiang Altera Packaging Department October 2014 Why Co-Design? Complex Multi-Layer BGA Package Horizontal and vertical design
Compact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES
Compact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES Frequency range: 9 khz - 6.5 or 8.5 GHz Measured parameters: S11, S12, S21, S22 Wide output power adjustment range: -50 dbm to +5 dbm
X-Parameters with Active and Hybrid Active Load Pull
X-Parameters with Active and Hybrid Active Load Pull Gary Simpson, CTO Maury Microwave EuMW 2012 www.maurymw.com 1 General Load Pull Overview 2 Outline 1. Introduction to Maury Microwave 2. Basics and
Probe. Selection Guide
Probe Selection Guide More than 50 different probing solutions for wafer, package, and board level characterization. Cascade Microtech offers a wide selection of engineering probes to meet the highly demanding
Vector Network Analyzer
Vector Network Analyzer VNA Basics VNA Roadshow Budapest 17/05/2016 Content Why Users Need VNAs VNA Terminology System Architecture Key Components Basic Measurements Calibration Methods Accuracy and Uncertainty
A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy
MAURY MICROWAVE CORPORATION March 2013 A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy Gary Simpson 1, David Ballo 2, Joel Dunsmore
Keysight Technologies Signal Integrity Tips and Techniques Using TDR, VNA and Modeling
Keysight Technologies Signal Integrity Tips and Techniques Using, VNA and Modeling Article Reprint This article first appeared in the March 216 edition of Microwave Journal. Reprinted with kind permission
Extraction of Broadband Error Boxes for Microprobes and Recessed Probe Launches for Measurement of Printed Circuit Board Structures
Extraction of Broadband Error Boxes for Microprobes and Recessed Probe Launches for Measurement of Printed Circuit Board Structures, Renato Rimolo-Donadio, Christian Schuster Institut für TU Hamburg-Harburg,
Waveguide Calibration with Copper Mountain Technologies VNA
Clarke & Severn Electronics Ph: +612 9482 1944 BUY NOW www.cseonline.com.au Introduction Waveguide components possess certain advantages over their counterpart devices with co-axial connectors: they can
Aries Center probe CSP socket Cycling test
Aries Center probe CSP socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 10/27/04 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 5 Setup...
A Simplified QFN Package Characterization Technique
Slide -1 A Simplified QFN Package Characterization Technique Dr. Eric Bogatin and Trevor Mitchell Bogatin Enterprises Dick Otte, President, Promex 8/1/10 Slide -2 Goal of this Project Develop a simple
MEASUREMENT OF LARGE SIGNAL DEVICE INPUT IMPEDANCE DURING LOAD PULL
Model M956D CORPORAION MEASUREMEN OF LARGE SIGNAL DEVICE INPU IMPEDANCE DURING LOAD PULL Abstract Knowledge of device input impedance as a function of power level and load matching is useful to fully understand
On Wafer Load Pull and Noise Measurements using Computer Controlled Microwave Tuners
970 Montee de Liesse, #308 Ville St-Laurent, Quebec, Canada, H4T 1W7 Tel: 514-335-6227 Fax: 514-335-6287 Email focusmw@compuserve.com Web Site: http://www.focus-microwaves.com Application Note No 14 On
Scattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Scattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Scattering parameters or S-parameters (aka Spars) are used by RF and microwave engineers
CALIBRATION TYPES & CONSIDERATIONS
CALIBRATION TYPES & CONSIDERATIONS 03/12/2018 Introduction One of the most frequently asked questions we receive at Copper Mountain Technologies sales and support departments goes something like this:
A Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs
A Technical Discussion of TDR Techniques, S-parameters, RF Sockets, and Probing Techniques for High Speed Serial Data Designs Presenter: Brian Shumaker DVT Solutions, LLC, 650-793-7083 b.shumaker@comcast.net
FABRICATING AND USING A PCB-BASED TRL PATTERN WITH A CMT VNA
FABRICATING AND USING A PCB-BASED TRL PATTERN WITH A CMT VNA 03/19/2018 Introduction Copper Mountain Technologies provides metrologically sound, lab grade USB VNAs which support advanced calibration techniques,
Calibration and Accuracy in Millimeter Systems. Keith Anderson
IMS2011 in Baltimore: A Perfect Match Calibration and Accuracy in Millimeter Systems Keith Anderson Agilent Technologies Copyright 2010 Agilent Technologies, Inc. Agenda Interfaces S-parameter calibration
PLANAR 814/1. Vector Network Analyzer
PLANAR 814/1 Vector Network Analyzer Frequency range: 100 khz 8 GHz Measured parameters: S11, S12, S21, S22 Wide output power range: -60 dbm to +10 dbm >150 db dynamic range (1 Hz IF bandwidth) Direct
Agilent On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech Probing System. Product Note E5070/71-3
Agilent On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech Probing ystem Product Note E5070/71-3 Introduction The use of differential circuit topologies
MPI Probe Selection Guide
MPI Probe Selection Guide With a critical understanding of the numerous measurement challenges associated with today s RF applications, MPI Corporation has developed TITAN RF Probes, a product series specifically
ON-WAFER CALIBRATION USING SPACE-CONSERVATIVE (SOLT) STANDARDS. M. Imparato, T. Weller and L. Dunleavy
ON-WAFER CALIBRATION USING SPACE-CONSERVATIVE (SOLT) STANDARDS M. Imparato, T. Weller and L. Dunleavy Electrical Engineering Department University of South Florida, Tampa, FL 33620 ABSTRACT In this paper
Simplifying the Art of Terahertz Measurements
Simplifying the Art of Terahertz Measurements Achieving metrology-level accuracy with a manual probe system With significant expansion of emerging THz applications, such as non-invasive spectroscopy, security
Coaxial TRL Calibration Kits for Network Analyzers up to 40 GHz
Focus Microwaves Inc. 277 Lakeshore Road Pointe-Claire, Quebec H9S-4L2, Canada Tel 514-630-6067 Fax 514-630-7466 Product Note No 2 Coaxial TRL Calibration Kits for Network Analyzers up to 40 GHz This note
Aries Kapton CSP socket Cycling test
Aries Kapton CSP socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 10/21/04 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 5 Setup...
1000BASE-T1 EMC Test Specification for Common Mode Chokes
IEEE 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Author & Company Dr. Bernd Körber, FTZ Zwickau Title 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Date
High Frequency Passive Components
EECS 142 Laboratory #1 High Frequency Passive Components Prof. A. M. Niknejad and Dr. Joel Dunsmore University of California Berkeley, CA 94720 August 1, 2008 1 SMT Component SMA Connector 1 Introduction
E/O and O/E Measurements with the 37300C Series VNA
APPLICATION NOTE E/O and O/E Measurements with the 37300C Series VNA Lightning VNA Introduction As fiber communication bandwidths increase, the need for devices capable of very high speed optical modulation
IVCAD VNA Base Load Pull with Active/Hybrid Tuning. Getting Started v3.5
IVCAD VNA Base Load Pull with Active/Hybrid Tuning Getting Started v3.5 1 Setting and Configuration Block Diagram... 3 1.1 VNA setup... 5 1.2 RF source setup... 6 1.3 Power meter setup... 7 1.4 Source
On-Wafer Noise Parameter Measurements using Cold-Noise Source and Automatic Receiver Calibration
Focus Microwaves Inc. 970 Montee de Liesse, Suite 308 Ville St.Laurent, Quebec, Canada, H4T-1W7 Tel: +1-514-335-67, Fax: +1-514-335-687 E-mail: info@focus-microwaves.com Website: http://www.focus-microwaves.com
Custom Interconnects Fuzz Button with Hardhat Test Socket/Interposer 1.00 mm pitch
Custom Interconnects Fuzz Button with Hardhat Test Socket/Interposer 1.00 mm pitch Measurement and Model Results prepared by Gert Hohenwarter 12/14/2015 1 Table of Contents TABLE OF CONTENTS...2 OBJECTIVE...
AV3672 Series Vector Network Analyzer
AV3672 Series Vector Network Analyzer AV3672A/B/C/D/E (10MHz 13.5 GHz/26.5 GHz/43.5 GHz/50 GHz/67 GHz) Product Overview: AV3672 series vector network analyzer include AV3672A (10MHz 13.5GHz), AV3672B (10MHz
DesignCon Differential PCB Structures using Measured TRL Calibration and Simulated Structure De-Embedding
DesignCon 2007 Differential PCB Structures using Measured TRL Calibration and Simulated Structure De-Embedding Heidi Barnes, Verigy, Inc. heidi.barnes@verigy.com Dr. Antonio Ciccomancini, CST of America,
ECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration
ECE 4265/6265 Laboratory Project 7 Network Analyzer Calibration Objectives The purpose of this lab is to introduce the concepts of calibration and error correction for microwave s-parameter measurements.
MEMS process on RF Probe Cards. Yock Hsu, James Wang, Alex Wei, Fred Chou, Adolph Cheng
MEMS process on RF Probe Cards Yock Hsu, James Wang,, Fred Chou, Adolph Cheng Overview Objectives Introduction Application Summary 2 Overview Objectives Introduction Application Summary 3 Objectives High
The Challenges of Differential Bus Design
The Challenges of Differential Bus Design February 20, 2002 presented by: Arthur Fraser TechKnowledge Page 1 Introduction Background Historically, differential interconnects were often twisted wire pairs
Preamplifier Options for Reducing Cable-Braid Loop Error
QuietPower columns, December 2018 Preamplifier Options for Reducing Cable-Braid Loop Error Istvan Novak, Samtec It has been known for quite some time [1] that when we measure low impedance with the Two-port
PLANAR S5048 and TR5048
PLANAR S5048 and TR5048 Vector Network Analyzers KEY FEATURES Frequency range: 20 khz 4.8 GHz COM/DCOM compatible for LabView Measured parameters: and automation programming S11, S12, S21, S22 (S5048)
Cobalt Series 20 GHz EXTEND YOUR REACH TM
Cobalt Series 20 GHz TM Frequency range: 100 khz - 20 GHz Wide output power range: -60 dbm to +10 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time per point: 10 µs per point, min typ.
Compact Series: S5048 & TR5048 Vector Network Analyzers KEY FEATURES
Compact Series: S5048 & TR5048 Vector Network Analyzers KEY FEATURES Frequency range: 20 khz - 4.8 GHz Measured parameters: S11, S12, S21, S22 (S5048) S11, S21 (TR5048) Wide output power adjustment range:
Vishram S. Pandit, Intel Corporation (916) ]
![Vishram S. Pandit, Intel Corporation (916) ]](/thumbs/72/66540527.jpg "Vishram S. Pandit, Intel Corporation (916) ]")
DesignCon 2008 Simulation and Characterization of GHz On-Chip Power Delivery Network (PDN) Vishram S. Pandit, Intel Corporation [vishram.s.pandit@intel.com, (916)356-2059] Woong Hwan Ryu, Intel Corporation
Compact VNA - TR1300/1
Compact VNA - TR1300/1 TM Extended Specifications Frequency range: 300 khz - 1.3 GHz Wide output power adjustment range: -55 dbm to +3 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time
Microprobing with the Agilent 86100A Infiniium DCA
Microprobing with the Agilent 86100A Infiniium DCA Application Note 1304-3 A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech
Agilent Technologies Gli analizzatori di reti della serie-x
Agilent Technologies Gli analizzatori di reti della serie-x Luigi Fratini 1 Introducing the PNA-X Performance Network Analyzer For Active Device Test 500 GHz & beyond! 325 GHz 110 GHz 67 GHz 50 GHz 43.5
Load Pull with X-Parameters A New Paradigm for Modeling and Design
Load Pull with X-Parameters A New Paradigm for Modeling and Design Gary Simpson, CTO Maury Microwave Anaheim, May 2010 For a more detailed version of this presentation, go to www.maurymw.com/presentation.htm
S-Parameter Measurements with the Bode 100
Page 1 of 10 with the Bode 100 Page 2 of 10 Table of Contents 1 S-Parameters...3 2 S-Parameter Measurement with the Bode 100...4 2.1 Device Setup...4 2.2 Calibration...5 2.3 Measurement...7 2.3.1 S11 and
Student Research & Creative Works
Scholars' Mine Masters Theses Student Research & Creative Works Summer 2010 Time-domain thru-reflect-line (TRL) calibration error assessment and its mitigation and modeling of multilayer printed circuit
Network Analysis Basics
Adolfo Del Solar Application Engineer adolfo_del-solar@agilent.com MD1010 Network B2B Agenda Overview What Measurements do we make? Network Analyzer Hardware Error Models and Calibration Example Measurements
Vector Network Analyzers. Paul Coverdale VE3ICV
Paul Coverdale VE3ICV What is a vector network analyzer? What is a vector? A vector is a quantity having magnitude and direction A vector can be described in rectangular (X,Y) or polar ( Z θ) notation
Microwave measurements for planar circuits and components: State of the art and future directions. Dr. Uwe Arz PTB
Microwave measurements for planar circuits and components: State of the art and future directions Dr. Uwe Arz PTB Outline Previous work at PTB The EMPIR Initiative EMPIR Project 14IND02 PlanarCal 2 Why
Application Note 5525
Using the Wafer Scale Packaged Detector in 2 to 6 GHz Applications Application Note 5525 Introduction The is a broadband directional coupler with integrated temperature compensated detector designed for
Validation & Analysis of Complex Serial Bus Link Models
Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling. Russ Kramer O.J. Danzy
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling Russ Kramer O.J. Danzy Simulation What is the Signal Integrity Challenge? Tx Rx Channel Asfiakhan Dreamstime.com - 3d People Communication
Compact VNA - TR7530. Extended Specifications EXTEND YOUR REACH TM
Compact VNA - TR7530 TM Extended Specifications Frequency range: 20 khz - 3 GHz Wide output power adjustment range: -50 dbm to +5 dbm Dynamic range: 123 db (10 Hz IF bandwidth) typ. Measurement time per
Agilent Network Analysis Applying the 8510 TRL Calibration for Non-Coaxial Measurements. Product Note A
Agilent Network Analysis Applying the 8510 TRL Calibration for Non-Coaxial Measurements Product Note 8510-8A Introduction This note describes how the Agilent 8510 network analyzer can be used to make error-corrected
MWA REVB LNA Measurements
1 MWA REVB LNA Measurements Hamdi Mani, Judd Bowman Abstract The MWA LNA (REVB) was measured on the Low Frequency Radio astronomy Lab using state of the art test equipment. S-parameters of the amplifier
AC-2 Calibration Substrate
AC-2 Calibration Substrate AC-2 calibration substrate is designed to provide accurate probe tip calibration of MPI TITAN RF probe family with ground-signal-ground (GSG) probe tips configuration and accommodates
CHQ SERIES. Surface Mount Chip Capacitors: Ultra High Frequency
26 High Frequency Measurement and Performance of High Multilayer Ceramic Capacitors Introduction Capacitors used in High Frequency applications are generally used in two particular circuit applications:
Department of Electrical and Computer Engineering ECE332. Lab 3: High Frequency Measurements
Department of Electrical and Computer Engineering ECE332 Version: 1.3.1 Revised: April 30, 2011 Contents 1 Pre-Lab Assignment 2 2 Introduction 2 2.1 Vector Network Analyzer.............................
Agilent PNA and PNA-L Series Microwave Network Analyzers. The standard in microwave network analysis
Agilent PNA and PNA-L Series Microwave Network Analyzers The standard in microwave network analysis PNA Family Sets the Standard for Microwave Network Analysis Choose the leader The PNA family builds on
Agilent Upgrade Guide for the 8510 Vector Network Analyzer Product Note
Agilent Upgrade Guide for the 8510 Vector Network Analyzer Product Note 85107B, 45 MHz to 50 GHz in coax 85106D with option 001, 45 MHz to 50 GHz in coax, above 50 GHz in waveguide 8510XF on-wafer configuration
Frequency-Domain Characterization of Power Distribution Networks
Frequency-Domain Characterization of Power Distribution Networks Istvan Novak Jason R. Miller ARTECH H O U S E BOSTON LONDON artechhouse.com Preface Acknowledgments xi xv CHAPTER 1 Introduction 1 1.1 Evolution
PNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE
PNA Family Microwave Network Analyzers (N522x/3x/4xB) CONFIGURATION GUIDE Table of Contents PNA Family Network Analyzer Configurations... 05 Test set and power configuration options...05 Hardware options...
Aries CSP microstrip socket Cycling test
Aries CSP microstrip socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 2/18/05 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 6 Setup...
Aries QFP microstrip socket
Aries QFP microstrip socket Measurement and Model Results prepared by Gert Hohenwarter 2/18/05 1 Table of Contents Table of Contents... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 4 Setup... 4
Amplifier Characterization in the millimeter wave range. Tera Hertz : New opportunities for industry 3-5 February 2015
Amplifier Characterization in the millimeter wave range Tera Hertz : New opportunities for industry 3-5 February 2015 Millimeter Wave Converter Family ZVA-Z500 ZVA-Z325 Y Band (WR02) ZVA-Z220 J Band (WR03)
E/O & O/E measurements using the Anritsu 37300C series VNA
E/O & O/E measurements using the Anritsu 37300C series VNA The following note describes the set-up and calibrations required to make E/O and O/E measurements using the Lightning VNA and a transfer standard.
Technologies Vector Reflectometers
Overview Reflectometers are used to measure the reflection, or S11 parameter, of a Device Under Test (DUT). This measurement only provides characterization of a single-ended device. For analysis of a twoport