Serial ATA International Organization

Transcription

1 Serial ATA International Organization Version 1.0 May 29, 2008 Serial ATA Interoperability Program Revision 1.3 Tektronix MOI for Rx/Tx Tests (DSA/CSA8200 based sampling instrument with IConnect SW) This material is provided for reference only. The Serial ATA International Organization Does not endorse the vendors equipment outlined in this document. This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall SATA-IO or any member of SATA-IO be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages 1 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

2 TABLE OF CONTENTS TABLE OF CONTENTS...2 MODIFICATION RECORD...3 ACKNOWLEDGMENTS...5 INTRODUCTION...6 INITIAL MEASUREMENT SETUP... 7 TEST TX-01 - PAIR DIFFERENTIAL IMPEDANCE... 8 TEST TX-02 - SINGLE-ENDED IMPEDANCE (OBSOLETE) TEST TX-03 - GEN2 (3GB/S) DIFFERENTIAL MODE RETURN LOSS TEST TX-04 - GEN2 (3GB/S) COMMON MODE RETURN LOSS TEST TX-05 - GEN2 (3GB/S) IMPEDANCE BALANCE TEST TX-06 - GEN-1 (1.5GB/S) DIFFERENTIAL MODE RETURN LOSS PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6)...25 TEST RX-01 - PAIR DIFFERENTIAL IMPEDANCE TEST RX-02 - SINGLE-ENDED IMPEDANCE (OBSOLETE) TEST RX-03 GEN2 (3GB/S) DIFFERENTIAL MODE RETURN LOSS TEST RX-04 GEN2 (3GB/S) COMMON MODE RETURN LOSS TEST RX-05 GEN2 (3GB/S) IMPEDANCE BALANCE TEST RX-06 GEN1 (1.5GB/S) DIFFERENTIAL MODE RETURN LOSS APPENDIX A RESOURCE REQUIREMENTS...42 APPENDIX B TDR ALIGNMENT AND ACQUISITION SETUP...44 Introduction...44 Match samplers to the ends of the cables...44 Match the TDR pulses to the ends of the cables...45 APPENDIX C - TDNA MEASUREMENT SYSTEM ACCURACY...47 APPENDIX D - MEASUREMENTS OF THE ACTIVE SATA TRANSMITTER...49 MEASUREMENT SETUP VALIDATION RESULTS CONCLUSION APPENDIX E VERIFICATION OF THE MATED TEST FIXTURE AND SETUP Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

3 MODIFICATION RECORD January 16, 2006 (Version 1.0) INITIAL RELEASE, TO LOGO TF MOI GROUP Andy Baldman: Initial Template Release February 2, 2006 (Tektronix Version.9 - beta) INITIAL RELEASE Kees Propstra, John Calvin, Mike Martin: Phy and TSG MOI Contributions Eugene Mayevskiy: Tx/Rx Phy MOI Contributions February 8, 2006 (Tektronix Version.91 - beta) Kees Propstra, John Calvin, Mike Martin: Phy and TSG MOI Contributions Eugene Mayevskiy: Tx/Rx Phy MOI Contributions February 11, 2006 (Tektronix Version.92 RC) Eugene Mayevskiy: SI01-SI09 Phy MOI Contributions John Calvin: OOB1-OOB7 MOI Contributions. February 24, 2006 (Tektronix Version.93 RC) Kees Propstra: updated Phy02, TSG01-12 Updated AppendixA Updated Appendix C: long term freq stability, rise fall and amplitude imbalance, differential skew msmt March 1, 2006 (Tektronix Version.94 RC) Mike Martin: updated OOB test documentation. Minor formatting changes throughout document. March 31, 2006 (Tektronix Version.95 RC) Mike Martin: incorporated reviewer s feedback April 12, 2006 (Tektronix Version.96 RC) Eugene Mayevskiy: incorporated reviewer s feedback (group 2, 4, 6, appendix E) Kees Propstra: incorporated reviewers feedback (group 1, 3, 5, appendix A) May 17, 2006 (Tektronix Version.97 RC) Eugene Mayevskiy, Mike Martin, Kees Propstra, John Calvin Incorporated changes to track the IW 1.0 unified test specification as well as reviewers comments. Added Appendix F for Equivalent Time/ TDNA accuracy parameters Added Appendix G for Real Time accuracy parameters. May 25, 2006 (Tektronix Version.98 RC-2) John Calvin Incorporated reviewer feedback and broke document into two separate document which separate the RT centric measurements from the ET based ones Eugene Mayevskiy changed the document according to the suggestions from the reviewer James Ou, Allion who suggested to change resource requirements and check for the consistency. May 30, 2006 (Tektronix Version.98 RC-3) John Calvin Review Draft circulated to IW working group. May 31, 2006 (Tektronix Version.98 RC-4) Eurgene Mayevskiy, re-factored review comments into document, removed change-bars. Prepared document for general distribution. June 5 th, 2006 (Tektronix Version 1.0 RC) John Calvin, Included notes on Z-Line Peeling and how and why it should be applied to the Rx/Tx measurements outlined in this document. Rolled version number to 1.0 RC, based on roll call vote of IW group on voting to approve this document. September 7, 2006 (Tektronix Version 1.01 RC) Eugene Mayevskiy included the changes for Tx tests requested by PHY group. Those include the preference of TX03 tests with respect to TX01, requirements regarding TDR step amplitude, and recommendation regarding the state of an active transmitter. September 18, 2006 (Tektronix Version 1.071) John Calvin, Eugene Mayevskiy included the changes to properly reflect SATA PHY ECN21 changes to the base specification. 3 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

4 Added Rx/TX-06 for a Gen-1 Return loss measurement. September 20, 2006 (Tektronix Version 1.080) John Calvin, Reviewed with IW group and prepared for 1.08 release. (Added references to worst case port, removed Genxm.. October 31, 2006 (Tektronix Version 1.090) John Calvin, Eugene Mayevskiy: Formal review before combined IW and PHY working groups. Final resolution of 3dB vs- 6dB TDR attenuation topic. October 31, 2006 (Tektronix Version 1.091) John Calvin, Eugene Mayevskiy: Editorials and minor content changes from review session. November 09, 2006 (Tektronix Version 1.0RC) John Calvin final editorials, and roll to version 1.0RC January 18, 2007 (Tektronix Version 1.00RC2) Introduced Appendix-E to include a lab-load/fixturing validation section. Moved the 135pSec filtering from the instrument to I- Connect, while leaving a residual 40pSec noise reduction filter in the sampling instrument. January 18, 2008 (Tektronix UTD 1.3 Version.90) Eugene Mayevskiy edits according to SATA UTD 1.3 February 7, 2008 (Tektronix UTD 1.3 Version.91) Eugene Mayevskiy 2 nd round of edits based on reviews comments from January 31, 2008 review session. March 17, 2008 (Tektronix UTD 1.3 Version.92) Eugene Mayevskiy 3 rd round of edits based on reviews comments from March 7, 2008 review session. May 22, 2008 (Tektronix UTD 1.3 Version.93RC) John Calvin, Logo Committee disposition on making this a 1.3 document, and vote to approve. Minor revision to figure 4.2 to remove a residual reference to the 2nS measurement standoff on Impedance measurements. May 29, 2008 (Tektronix UTD 1.3 Version 1.0RC) John Calvin, Rolled version number with no other changes to 1.0RC. September 26, 2008 (R13 Version 1.0) remove the RC designation for public posting. John Calvin 4 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

5 ACKNOWLEDGMENTS The SATA-IO would like to acknowledge the efforts of the following individuals in the development of this test suite. University of New Hampshire InterOperability Laboratory (UNH-IOL) Creation of MOI template Andy Baldman Dave Woolf Tektronix, Inc. Creation of this document John Calvin Mike Martin Kees Propstra Eugene Mayevskiy 5 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

6 INTRODUCTION The tests contained in this document are organized in order to simplify the identification of information related to a test, and to facilitate in the actual testing process. Tests are separated into groups, primarily in order to reduce setup time in the lab environment, however the different groups typically also tend to focus on specific aspects of device functionality. The test definitions themselves are intended to provide a high-level description of the motivation, resources, procedures, and methodologies specific to each test. Formally, each test description contains the following sections: Purpose This document outlines precise and specific procedures required to conduct SATA IW 1.1 tests. This document covers the following tests which are all Tektronix CSA8200 based. PHY TRANSMIT CHANNEL REQUIREMENTS (TX: 1-6) PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6) Notes: Peeling Algorithm developed by Prof. Tripathi at Oregon State University which unlayers the various reflections in the TDR waveform and therefore shows the true values at each point without the distortions caused by the reflections. Rx/Tx measurements for both Devices and Hosts will benefit from the accuracy introduced by observing Peeling on the raw TDR response. For this reason this methodology will be applied to all Impedance related measurements in this MOI. 6 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

7 Initial Measurement Setup Before connecting the measurement cables and adaptors perform instrument s warm-up and compensation according the user manual. Connect four high quality (rated up to 18GHz) SMA cables to the four channels of 80E04 modules and perform deskew procedure for acquisition channels and TDR steps according to procedure described in Appendix B. Note that TX measurements require the attenuators connected between the TDR heads of Ch3 and Ch4, and SMA cables. Connect appropriate SATA adaptor to the SMA channels The pair should match within 2ps. Connect the PUT according to the Figure 1.1. Ch1 and Ch2 are connected to the RX, while Ch3 and Ch4 are connected to the TX pair. Set 4000 acquisition points in the Horizontal menu of the oscilloscope and 300 averages in Acquisition menu. Ch1 Ch2 Ch3 Ch4 SATA Product Under Test Figure 1.1. SATA product under test measurement setup. The drive under test (PUT) has to be powered up. The dashed line shows reference plane for the measurements. 7 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

8 Test TX-01 - Pair Differential Impedance Purpose: To verify that the Pair Differential Impedance of the PUT s transmitter is within the conformance limits 1. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Pair Differential Impedance (Gen1i) [3] Ibid, TDR Differential Impedance (Gen1i) [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the Pair Differential Impedance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s, this test is not required. Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern (MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (- 13.2dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. The TDR signal amplitude should be less than 139mV peak-to-peak single-ended, and this can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak (single ended) TDR signal amplitude (delivered to PUT). In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in odd mode (source steps are of opposite polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module, and filter this waveform to 40ps (10-90%) rise time. 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the fixtures with the PUT and acquire TDRdd. 4. Filter open reference and TDRdd waveforms to 135ps (10-90%) rise time. 5. Use Z-line tool of IConnect to compute impedance profile. Set Zo equal to 100 Ohm and press the Compute Button. The resulting waveform will be displayed in the time domain viewer window. 1 The amplitude of external excitation applied shall not exceed -13.2dBm 50 ohms (139mVpp) single ended on each differential port of the transmitter. This number is derived from the maximum reflected signal that can be present at a transmitter. 8 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

9 6. Enable IConnect s cursors by right-clicking the computed Z-waveforms and selecting Cursor Readout option. Using the cursors measure the impedance value at a point 2 ns past the bottom of the last major capacitive excursion (i.e. dip) that is known to be inside the ASIC device (Figure 2.1). 7. Record the results. Figure 2.1 Pair differential impedance measurements for transmitter (TX01). The impedance value measured by the blue cursor is 87 Ohm. Observable Results: Verify that both the minimum [TX-01a] and maximum [TX-01b] results for the pair differential impedance measured between 85 ohms and 115 ohms (for products running at 1.5Gb/s). The impedance measured at the time value of 2nSec past the bottom of the last major capacitive excursion (i.e. dip) that is known to be inside the ASIC device constitutes an informative result. See figure 2.1. NOTE: The verification of this result may not be required. If a product which supports 1.5Gb/s product passes TX-06, then it is not required that this test be verified. This result must be verified for a 1.5Gb/s product if it fails TX-06. Possible Problems: 9 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

10 1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher Threshold number for Z-line computations. 2. First incident step needs to be windowed out in the instrument s window; otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 4. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz, or to another value. Incorrect window Correct window Figure 2.2 Correct acquisition window settings used in IConnect software to compute impedance profile and S-parameters. Left figure shows incorrect acquisition window; the first incident step is not windowed out, and the window itself is longer than required. The figure on the right shows the correct settings; first incident step is windowed out, and all reflections are settled to a steady DC level. 10 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

11 Test TX-02 - Single-Ended Impedance (Obsolete) Purpose: To verify that the Single-Ended Impedance of the PUT s transmitter is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Single-Ended Impedance (Gen1i) [3] Ibid, TDR Single-Ended Impedance (Gen1i) [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the Single-Ended Impedance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. The TDR signal amplitude should be less than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition external signal source and TDR steps before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The deskew procedure is to be performed in even mode: both sources are positive. The step signals should arrive at the SMA interface at the same time. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Filter the TDR waveforms to 40ps (10-90%) rise time. The instrument s settings can be saved to a file. 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the open references for each TDR channel using IConnect Acquisition tool. 3. Connect the PUT and acquire TDR waveforms for each channel using IConnect Acquisition tool. 4. Filter open reference and TDR waveforms to 135ps (10-90%) rise time. 5. Use Z-line tool of IConnect to compute impedance profile for each line of the PUT. Set Zo equal to 50 Ohm and press on Compute button of IConnect. The resulting impedance waveforms will be displayed in the time domain viewer. 6. Using cursors measure the minimum impedance value for each line (Figure 2.3). 7. Record the results. 11 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

12 Figure 2.3. Single-ended impedance measurements using Z-line tool of IConnect (TX-02). Minimum impedance for positive line is 49 Ohm, while for negative line the value is 42.4 Ohm. Observable Results: Z s-etx measured to be at least 40 ohms (for products running at 1.5Gb/s) Both the minimum [TX-02a] and the maximum [TX-02b] results shall be captured Possible Problems: 1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher Threshold number for Z-line computations. 2. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 4. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz. 12 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

13 Test TX-03 - Gen2 (3Gb/s) Differential Mode Return Loss Purpose: To verify that the Differential Mode Return Loss of the PUT s transmitter is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Differential Mode Return Loss (Gen2i) [3] Ibid, Return Loss and Impedance Balance [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the Differential Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the SATA connector, so the board and the SATA connector are INCLUDED with the product measurement. This test requirement is only applicable to products running at 3Gb/s. Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern (MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (- 13.2dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. The TDR single-ended signal amplitude should be less than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in odd mode (source steps are of opposite polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module. The instrument s setup from TX-01 test can be reused (the waveforms were filtered to 40ps (10-90%) rise time). 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the PUT and acquire TDRdd waveform. 13 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

14 4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the transmitter. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. Figure 2.4. Differential return loss measurements for TX-03. Cursor 1 reads -7.42dB at 2.37GHz, and cursor 2 reads -6.72dB at 3.97GHz. Observable Results: The TX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for Gen2i products running at 3Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit Tx-03a MHz 14 db Tx-03b MHz 8dB Tx-03c MHz 6 db Tx-03d MHz 6 db Tx-03e MHz 3 db (N/A for Gen1m) Tx-03f MHz 1 db (N/A for Gen1m orgen2m) 14 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

15 Possible Problems: 1. Inclusion of the first incident step in the measurement will results in erroneous S-parameters. The window needs to be adjusted according the Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz or another value. 15 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

16 Test TX-04 - Gen2 (3Gb/s) Common Mode Return Loss Purpose: To verify that the Common Mode Return Loss of the PUT s transmitter is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Common Mode Return Loss (Gen2i) [3] Ibid, Return Loss and Impedance Balance [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the Common Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the SATA connector, so the board and the SATA connector are INCLUDED with the product measurement. This test requirement is only applicable to products running at 3Gb/s. Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern (MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (- 13.2dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver is connected to one sampling module. The TDR single ended signal amplitude should be less than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in even mode (source steps are of the same polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math function of the oscilloscope to the summation of signal sources and filter the response to 40ps (10-90%) rise time. 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the open references for each TDR channel using IConnect Acquisition tool. 3. Connect the PUT and acquire TDR waveform in even mode using IConnect Acquisition tool. 4. Use S-parameter tool of IConnect to compute common mode S-parameters of the PUT (Scc11). The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. 16 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

17 Figure 2.5. Common mode return loss measurements for TX-04. Cursor 1 reads 3.4dB at 1.18GHzMHz, and cursor 2 reads -1.49dB at 3.08GHz. 17 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

18 Observable Results: The TX Common Mode Return Loss shall be above the minimum limits specified in reference [1] for Gen2i products running at 3Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit TX-04a MHz 8 db TX-04b MHz 5dB TX-04c MHz 2 db TX-04d MHz 1 db TX-04e MHz 1 db TX-04f MHz 1 db Possible Problems: 1. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz. 18 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

19 Test TX-05 - Gen2 (3Gb/s) Impedance Balance Purpose: To verify that the Impedance Balance of the PUT s transmitter is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Impedance Balance (Gen2i) [3] Ibid, Return Loss and Impedance Balance [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the TX Impedance Balance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 3Gb/s.Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern (MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (-13.2dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver is connected to one sampling module The TDR single ended signal amplitude should be less than 139mV peak-to-peak. This can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition external signal source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The deskew has to be performed in even mode: both sources are positive, and the step signals should arrive at the PUT and the same time. The instrument s setup can be saved to a file. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math 1 function to the sum of the acquired TDR channels, and acquire open reference waveform at the SMA interface. Set math 2 function the difference of the acquired TDR channels and filter the response to 40ps (10-90%) rise time. 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Load the open reference for even mode (math 1 function) using IConnect Acquisition tool. 3. Connect the fixtures and the PUT then acquire math 2 waveform (difference of the acquired TDR signals) using IConnect Acquisition tool. 4. Use S-parameter tool of IConnect to compute differential-to-common conversion (Sdc11) of the PUT. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Impedance balance measurements are shown in Figure Record the results. 19 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

20 Figure 2.6. Impedance balance loss measurements for TX-05. Cursor 1 reads 20.4dB at 798MHz, and cursor 2 reads -21.2dB at 4.28GHz. Observable Results: The TX Impedance Balance shall be above the minimum limits specified in reference [1] for Gen2i products. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit TX-05a MHz 30dB TX-05b MHz 20dB TX-05c MHz 10dB TX-05d MHz 10dB TX-05e MHz 4dB TX-05f MHz 4dB (N/A for test Gen2m) Possible Problems: 1. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 20 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

21 3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz. 21 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

22 Test TX-06 - Gen-1 (1.5Gb/s) Differential Mode Return Loss Purpose: To verify that the Differential Mode Return Loss of the PUT s transmitter is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 21 Transmitter Specifications [2] Ibid, TX Differential Mode Return Loss (Gen2i) [3] Ibid, Return Loss and Impedance Balance [4] SATA unified test document, [5] SATA ECN_21/22 TX Differential Mode Return Loss (Gen1i) Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This specification includes conformance limits for the Differential Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the SATA connector, so the board and the SATA connector are INCLUDED with the product measurement. This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s, this test is not required. Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern (MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (- 13.2dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. The TDR single-ended signal amplitude should be less than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the PUT does not support disconnect operation, the measurement setup described in appendix D can be used. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in odd mode (source steps are of the opposite polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module. The instrument s setup from TX-01 test can be reused (the rise time is filtered to 40ps (10-90%) rise time). 4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the PUT and acquire TDRdd waveform. 22 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

23 4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the transmitter. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. Observable Results: Figure 2.7 Differential return loss measurements for TX-06. RL DD11,TX measured per the values in table below (for products running at 1.5Gb/s) Test Name Frequency Range Lower Rloss Limit TX-06a MHz 14 db TX-06b MHz 8dB TX-06c MHz 6 db TX-06d MHz 6 db TX-06e MHz 3 db (N/A for test Gen1m) TX-06f MHz 1 db (N/A for test Gen1m or Gen2m) 23 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

24 Possible Problems: 1. Inclusion of the first incident step in the measurement will results in erroneous S-parameters. The window needs to be adjusted according the Figure When the transmitter does not support disconnect operation the test setup described in the Appendix D can be used. 3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz. 24 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

25 PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6) Overview: This group of tests verifies the Phy Receiver Requirements, as defined in Section 2.15 of the SATA Interoperability Unified Test Document, v1.1 (which references the SATA Standard, v2.5). 25 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

26 Test RX-01 - Pair Differential Impedance Purpose: To verify that the Pair Differential Impedance of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. See Appendix C for measurement accuracy specifications. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Pair Differential Impedance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s, this test is not required. Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in odd mode (source steps are of opposite polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module, and filter this waveform to 40ps (10-90%) rise time. 4. Power up the product under test (PUT) and complete a full OOB sequence. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the PUT and acquire TDRdd. 4. Filter open reference and TDRdd waveforms to 135ps (10-90%) rise time. 5. Use Z-line tool of IConnect to compute impedance profile. Set Zo equal to 100 Ohm and press on Compute. The resulting waveform will be displayed in the time domain viewer. 6. Enable IConnect s cursors by right-clicking the computed Z-waveforms and selecting Cursor Readout option. Using the cursors measure the impedance value at a point 2 ns past the bottom of the last major capacitive excursion (i.e. dip) that is known to be inside the ASIC device (Figure 4.1). 7. Record the results. 26 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

27 Figure 4.1 Pair differential impedance measurements for receiver (RX-01). Min impedance is 80.9 Ohm at 1.14ns. Observable Results: Verify that both the minimum [RX-01a] and maximum [RX-01b] results for the pair differential impedance measured between 85 ohms and 115 ohms (for products running at 1.5Gb/s). NOTE: The verification of this result may not be required. If a product which supports 1.5Gb/s product passes RX-06, then it is not required that this test be verified. This result must be verified for a 1.5Gb/s product if it fails RX-06 Possible Problems: 1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher Threshold number for Z-line computations. 2. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

28 Test RX-02 - Single-Ended Impedance (Obsolete) Purpose: To verify that the Single-Ended Impedance of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. See Appendix C for measurement accuracy specifications. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Single-Ended Impedance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s, this test is not required. Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in even mode (source steps are of the same polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Filter the TDR waveforms to 40ps (10-90%) rise time. The instrument s setup can be saved to a file. 4. Power up the product under test (PUT) and complete a full OOB sequence. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the open references for each TDR channel using IConnect Acquisition tool. 3. Connect the PUT and acquire TDR waveforms for each channel using IConnect Acquisition tool. 4. Filter open reference and TDR waveforms to 135ps (10-90%) rise time. 5. Use Z-line tool of IConnect to compute impedance profile for each line of the PUT. Set Zo equal to 50 Ohm and press on Compute. The resulting waveform will be displayed in the time domain viewer. 6. Using cursors measure the minimum impedance value for each line (Figure 4.2). 7. Record the results. 28 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

29 Figure 4.2. Single-ended impedance measurements using Z-line tool of IConnect (RX-02). Minimum impedance for positive line is 49 Ohm, while for the negative line the value is 42 Ohm. Observable Results: The RX Single-Ended Impedance shall be at least 40 Ohms for 1.5Gb/s devices (for products running at 1.5Gb/s) Both the minimum [RX-02a] and the maximum [RX-02b] results shall be captured Possible Problems: 1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher Threshold number for Z-line computations. 2. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

30 Test RX-03 Gen2 (3Gb/s) Differential Mode Return Loss Purpose: To verify that the Differential Mode Return Loss of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Differential Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 3Gb/s. Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in odd mode (source steps are of opposite polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module. The instrument s setup from RX-01 test can be reused (the response is filtered to 40ps (10-90%) rise time. 4. Power up the product under test (PUT) and complete a full OOB sequence. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the PUT and acquire TDRdd. 4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the receiver. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. 30 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

31 Figure 4.3. Differential return loss measurements for RX-03. Cursor 1 reads -9.1dB at 2.34GHz, and cursor 2 reads -8.97dB and 4.1GHz. Observable Results: The RX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for products running at 3Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit RX-03a MHz 18 db RX-03b MHz 14dB RX-03c MHz 10 db RX-03d MHz 8 db RX-03e MHz 3 db RX-03f MHz 1 db 31 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

32 Possible Problems: 1. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

33 Test RX-04 Gen2 (3Gb/s) Common Mode Return Loss Purpose: To verify that the Common Mode Return Loss of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Common Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the SATA connector, so the board and the SATA connector are INCLUDED with the product measurement. This test requirement is only applicable to products running at 3Gb/s. Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver is connected to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in even mode (source steps are of the same polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to the summation of signal sources and filter response to 40ps (10-90%) rise time. 4. Power up the product under test (PUT) and complete a full OOB sequence. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the open references for each TDR channel using IConnect Acquisition tool. 3. Connect the PUT and acquire TDR waveform in even mode using IConnect Acquisition tool. 4. Use S-parameter tool of IConnect to compute common mode S-parameters of the PUT (Scc11). The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. 33 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

34 Figure 4.4. Common mode return loss measurements for RX-04. Cursor 1 reads 4.45dB at 1.01GHz, and cursor 2 reads -5.49dB at 3.07GHz. Observable Results: The RX Common Mode Return Loss shall be above the minimum limits specified in reference [1] for products running at 3Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit RX-04a MHz 5dB RX-04b MHz 5dB RX-04c MHz 2dB RX-04d MHz 1dB RX-04e MHz 1dB RX-04f MHz 1dB Possible Problems: 34 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

35 1. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

36 Test RX-05 Gen2 (3Gb/s) Impedance Balance Purpose: To verify that the Impedance Balance of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Impedance Balance. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. This test requirement is only applicable to products running at 3Gb/s.Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver is connected to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition external signal source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The deskew is to be performed in even mode: both sources are positive, and the step signals should arrive at the PUT and the same time. The instrument s setup needs to be saved to a file. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math 1 function to the sum of the acquired TDR channels, and acquire open reference waveform at the SMA interface. Set math 2 function the difference of the acquired TDR channels and filter the response to 40ps (10-90%) rise time. 4. Power up the product under test (PUT) and complete a full OOB sequence.. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Load the open reference for even mode (math 1 function) using IConnect Acquisition tool. 3. Connect the fixtures and the PUT then acquire math 2 waveform (difference of the acquired TDR signals) using IConnect Acquisition tool. 4. Use S-parameter tool of IConnect to compute differential-to-common conversion (Sdc11) of the PUT. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Impedance balance measurements are shown in Figure Record the results. 36 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

37 Figure 4.5. Impedance balance loss measurements for RX-05. Cursor 1 reads 19.4dB at 4.07GHz, and cursor 2 reads -21.2dB at 2.61GHz. Observable Results: The RX Impedance Balance shall be above the minimum limits specified in reference [1] for products running at 3Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit (Gen2i) RX-05a MHz 30 db RX-05b MHz 30 db RX-05c MHz 20 db RX-05d MHz 10 db RX-05e MHz 4 db RX-05f MHz 4 db (N/A for test Gen2m) 37 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

38 Possible Problems: 1. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

39 Test RX-06 Gen1 (1.5Gb/s) Differential Mode Return Loss Purpose: To verify that the Differential Mode Return Loss of the PUT s receiver is within the conformance limits. References: [1] SATA Standard, 7.2.1, Table 23 Receiver Specifications [2] Ibid, [3] Ibid, [4] SATA unified test document, Resource Requirements: See Appendix A. Last Template Modification: April (Version 1.0) Discussion: Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification includes conformance limits for the RX Differential Mode Return Loss. Reference [2] provides the definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test. Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the SATA connector, so the board and the SATA connector are INCLUDED with the product measurement. This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s, this test is not required. Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1. of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed 300mVpp (-6.48dBm 50 ohms) single ended. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The sources deskew has to be performed in even mode (source steps are of the same polarity). The step signals should arrive at the PUT at the same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane. 3. Set 4000 acquisition points and 1ns/div in Horizontal menu and 300 averages in the Acquisition menu of DSA8200. Set math to a difference for TDR signals for each module. The instrument s setup from RX-01 test can be reused (the response is filtered to 40ps (10-90%) rise time). 4. Power up the product under test (PUT) and complete a full OOB sequence. Test Procedure: 1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined through the worst case port identification MOI. 2. Acquire the differential open reference using IConnect Acquisition tool. 3. Connect the PUT and acquire TDRdd. 4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the receiver. The resulting waveform will be displayed in the frequency domain viewer. 5. Using cursors measure the maximum values for each frequency range given in reference [1]. Differential return loss measurements are shown in Figure Record the results. 39 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

40 Figure 4.6. (requires a true Gen-1 screen shot) Differential return loss measurements for RX-03. Cursor 1 reads -9.1dB at 2.34GHz, and cursor 2 reads -8.97dB and 4.1GHz. Observable Results: The RX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for products running at 1.5Gb/s. For convenience, the values are reproduced below. Test Name Frequency Range Lower Rloss Limit RX-06a MHz 18 db RX-06b MHz 14dB RX-06c MHz 10 db RX-06d MHz 8 db RX-06e MHz 3 db RX-06f MHz 1 db 40 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

41 Possible Problems: 2. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

42 Appendix A Resource Requirements The resource requirements include two separate sets of equipment. The equipment required for TX and RX tests is shown in section A.2, and the equipment required for OOB tests is shown in section A.3. A.1 Equipment for PHY and TSG tests 1. Real-time Digital Oscilloscope TDS6154C, TDS612C, or TDS6804B (gen1 only!) 2. Test Fixture Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP Or equivalent 3. Cables or equivalent 4. SATA host system for Drive initialization Any system capable of controlling Gen1 and Gen2 devices, and capable of running Ulink DriveMaster or Intel BISTFIS utility to set BIST pattern transmission in device. 5. Software BISTFIS Utility or Ulink DriveMaster Tektronix TDSJIT3v2 Tektronix TDSRT-Eye (RTeye version or later, SST version or later) A.2 Equipment for TX and RX tests 1. Equivalent-time Sampling Oscilloscope DSA/CSA8200 with 2 ea 80E04 sampling head 2. Test Fixture Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP (< 36dB of NEXT required in fixtures in addition to satisfying the required Serial ATA lab load requirements) Or equivalent 4. Cables and other accessories 4 ea. Matched SMA cables or equivalent 2 ea 6dB SMA attenuators required for Tx tests, 6dB matched power splitters can be used as well. 5. Software 1. IConnect software (80SICON), Tektronix, Inc. or equivalent 2. SATA host system for Drive initialization Any system capable of controlling Gen1 and Gen2 devices, and capable of running Ulink DriveMaster or Intel BISTFIS utility or equivalent system to ensure device has properly negotiated a full Com-Init / Reset cycle (required before any testing can be conducted on an active device ). A.3 Equipment for OOB tests 1. Real-time Digital Oscilloscope TDS6154C, TDS612C, or TDS6804B (gen1 only!) 2. Signal Generator 42 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

43 3. Test Fixture AWG710B, AWG710, AWG610, or AWG615 Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP Or equivalent 4. Cables or equivalent 5. SATA host system for Drive initialization Any system capable of controlling Gen1 and Gen2 devices, and capable of running Ulink DriveMaster or Intel BISTFIS utility to set BIST pattern transmission in device. 6. Software BISTFIS Utility or Ulink DriveMaster Tektronix TDSJIT3v2 Tektronix TDSRT-Eye (RTeye version or later, SST version or later) 43 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

44 Appendix B TDR Alignment and Acquisition Setup Introduction This deskew procedure utilizes an independent acquisition source and assumes availability of two TDR sampling modules (80E04, 80E08, or 80E10). It can also be used with one TDR (80E04, 80E08, or 80E10), and one dual sampling module (80E03 or 80E09). It aligns both samplers and TDR steps allowing measuring mixed mode S- parameters. The procedure starts with the alignment of the samplers and concludes with alignment of the acquisition channels. Match samplers to the ends of the cables The purpose of this step is to set the samplers on each channel so that an input into the open end of each cable arrives at the sample gate at precisely the same time. This step compensates for cable and sampler differences. First stage is alignment of the channels 1-3 using the channel 4 as an independent TDR source, and then aligning acquisition of the channel 4 with respect to already aligned channel 3 using channel one as another independent source. 2 The deskew procedure is to be performed in rho mode. 1. Connect SMA cables to the sampling modules of the oscilloscope. For the best results, it is desired that the SMA cables used in the measurements have approximately the same quality and length (matched within 20ps). 2. Connect channel 1 and channel 4 with SMA barrel, activate TDR step on channel 4 and acquisition on channel 1 (see Figure 2). Figure 2 C1 is connected to C4 with SMA barrel. The TDR step is generated on C4 and acquired using C1. 3. Adjust the horizontal position and scale to get the rising edge on screen with good resolution (20ps/div). Record length should have the maximum number of 4000 points. 4. Save channel one (C1) waveform as a reference trace. Channel 2 and 3 will be aligned with respect to it. 5. Connect channel two (C2) to the channel four (C4) using SMA barrel, and display C2 on the screen. 6. Turn on the delay measurement to measure the time difference between the rising edge on the reference trace and the rising edge of C2 as shown in Figure 3. 2 When only one TDR and one sampling modules are available another TDR channel can be used as an independent TDR source. 44 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

45 Figure 3 Delay measurements between the reference (R1) acquired from the channel one and the channel two (C2). It has to be the minimum for the best deskew value. 7. Adjust the channel deskew value in the Vertical menu of the Setups dialog until a delay value within 1ps is achieved as show 8. Repeat steps 5-7 for the C3. 9. Now, when the acquisition of C1 through C3 is aligned, the same approach can be used to align C4. For this purpose generate a new reference by using the step of C1 and acquiring it on C3. C3 has to be connected to C1 with the SMA barrel. 10. Repeat steps 5-7 for the C4 using acquired reference from C3. Now, all four acquisition channels have been deskewed within 1ps. Match the TDR pulses to the ends of the cables The purpose of this step is to adjust the TDR pulses so they arrive at the ends of the cables at precisely the same time. The deskew has to be performed separately for odd and even TDR steps when 80E04 modules are used 3. This section describes only odd mode TDR step deskew. The deskew procedure has to be performed in rho mode. 1. Disconnect the SMA barrel and turn on TDR pulses of the appropriate polarity for each channel (C1 and C2). Use the differential TDR preset selection to activate odd mode. 2. Adjust the horizontal position and scale so that the pulses as they arrive at the ends of the cables are visible on screen with good resolution. (Use Average mode and vectored display, a set time scale to 20ps/div). 3. Turn on the delay measurement to measure the time difference between the two pulse edges. 4. Adjust the Step Deskew in TDR menu to minimize the time difference between the C1 and C2 pulses. You might want to activate Fine button to reduce the increment of deskew as shown in Figure 4. 3 Odd mode (differential) is generated when TDR steps set to opposite polarity, and even mode (common) is generated when both steps are of the same polarity. 45 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

46 Figure 4 Differential TDR step deskew. The channels C1 and C2 are aligned within ~300fs. 5. Repeat steps 1-4 for C3 and C4, and save the instrument setup. 6. Repeat steps 1-5 in even mode if desired. The instrument should now be set up to accurately make differential or common mode TDR measurements. Correct Acquisition Window Settings for S-parameter Calculations with IConnect The acquisition of S-parameters with TDR/T instrument requires that the PUT s reflections settle to their steady DC level. The approximate rule of thumb for the acquisition window width is four or five times time delay of the PUT. This is shown in the Figure B.2.1. Figure B.2.1. Correct acquisition window settings used in IConnect software to compute S-parameters. First incident step is windowed out, and all reflections settled to a steady DC level. 46 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

47 Appendix C - TDNA Measurement System Accuracy Table C.1 summarizes characteristics of the TDNA system used for RX/TX and SI test. The system is based on a standard 80E04 module that allows to perform both return and insertion loss measurements from time domain data. Table C.1 TDR System Characteristics with a standard 80E04 module Characteristics Input Impedance TDR Step Amplitude TDR System Reflected Rise Time (10% to 90%) TDR System Incident Rise Time (10% to 90%) TDR Step Maximum Repetition Rate DC Vertical Range Accuracy within 2 C of Compensated Temperature RMS Noise (typical/maximum) Bandwidth Dynamic Range Value 50 ±0.5Ω 250 mv 35 ps 28 ps (typical) 200 khz ±[ 2 mv (Offset) (Vertical Value- Offset)] 600 μv/ 1.2 mv 20GHz 50-60dB 47 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

48 48 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

49 Appendix D - Measurements of the Active SATA Transmitter Measurement setup The BIST-L method of the host transmitter testing requires a transmitter to transmit a specific pattern. This pattern can be initiated using a host controller which can be a hard drive emulator or AWG. The problem with this approach is that many hosts do support disconnect operation; this means that as soon as the drive is disconnected from the host, the host s transmitter stops transmitting the data. Thus TX testing of such hosts requires a constant connection with the host controller. This can be accomplished by using power splitters and connecting both, the TDR instrument and the host controller, to the measured host in the same measurement setup. The diagram of such measurement is shown in Figure D.1. The measurement setup consists of a set of matched length SMA cables connected between the host under test and power splitters that are attached to the sampling module using SMA male-to-male adaptors. To control the host longer SMA sables are connected between the other ports of the splitter and the receiver ports of the host controller. Note that the power splitters can be also connected directly to the sampling heads before the SMA cables, however, in this the longer cables to the BIST initiator might be required in order to set the time window propely. The transmitter port of the host controller is connected to the receiver of the host thus providing the initiation of the required pattern. If the regular 6dB matched power splitter is used, the resulting differential TDR voltage amplitude will be ~125mV, which is sufficient to make measurements and not to loose much of the dynamic range at the same time. SATA BIST Initiator Tx Rx Ch1 Ch2 t 2 t 0 Rx Tx t 1 SATA Host Under Test Figure D1. Measurement setup that can be used to perform TDR measurement of the actively transmitting host (HUT). 49 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

50 Note: BIST initiator may be required to operate outside of its nominal operating conditions due to typical losses associated with 3dB power splitters and interconnect cable length. It is important to select the right cable length to provide sufficient TDR acquisition window. The general principal of the acquisition window setup is illustrated in the Figure D2. The cable length between the host under test and the host controller (t 0 and t 2 ) should provide enough time for the host response to settle to a steady DC level and for the host controller not to show up the TDR acquisition window. This is effectively an accurate and direct time domain gating of the host under test response, which represents a unique TDR instrument capability because Inverse Fast Fourier Transformation (IFFT) response from the frequency domain instrument will include the effects of the host controller. TDR Measurement Window t 0 t 1 t 2 time Figure D2. Time domain measurement window: t 0 time at 6dB splitter, t 1 -reference plane for SATA measurements, t 2 - time position of the host controller. Validation Results Figure D3 shows the original time domain impedance profile for the SATA host acquired when BIST initiated MFTP pattern was applied. Two measurements were performed: one with the splitter and one without. The obtained TDR impedance profile shows that termination impedance of the reduced TDR amplitude has higher value which is an indicator of the dependency of the transmitter s impedance on the applied TDR step voltage. A possible reason of this difference is that the original TDR voltage was too high putting the transmitter into a nonlinear region of operation. 50 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

51 Figure D3. The original time domain impedance profile for the SATA host acquired when BIST initiated MFTP pattern was applied. The transmitter s termination impedance has different values. 51 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

52 Figure D4. Impedance profile of the same HUD measured from TDR with different step signal amplitudes. The difference between 6dB and 14dB impedance is small indicating that an accurate measurement of the active transmitter has to be done with an amplitude that allows the transmitter operate in the linear region. 52 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

53 Figure D5. Differential return loss obtained with TDNA of different amplitudes of the step voltages. The comparison of the results for 0dB and 6dB attenuation levels shows the effect of the termination impedance change at low frequencies, whereas 14dB attenuation shows that the data repeats a general trend but have an excessive noise due to very small TDR step amplitude (~20mV). Conclusion The presented results demonstrate that TDR measurements can be successfully performed on actively transmitting host that can be controlled from the host controller at the same time. Special care should be taken when selecting the right TDR signal levels: the signal should be small enough to keep the transmitter operating in a linear region, and large enough to provide a sufficient dynamic range for S-parameter acquisition. The attenuation level of 6dB seems to provide a reasonable solution for the active SATA transmitter measurements. 53 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0

54 Appendix E Verification of the mated Test Fixture and setup Purpose: To provide a methodology for the quick verification of the calibration and test fixtures prior performing Rx/Tx test measurements References: [1] SATA Standard, 7.2.2,5 Lab Load Details Resource Requirements: See Appendix A. Last Template Modification: April 10, 2006 (Version 1.0) Discussion: Reference [1] specifies the lab load requirements for SATA Test fixture. Assuming the fixture meets these requirements, the following method described in this appendix is used to quickly check the performance of the test fixtures used for Rx/Tx tests. The measurement is performed the same way as it is done for Rx/Tx tests for Gen II PUTs with the PUT replaced by the same test fixture with the opposite gender having its SMA connectors terminated with 50 Ohm terminations. The Crescent Heart test fixture is used in the measurements. Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each pair of the transmitter and receiver is connected to one sampling module. 2. Each sampling module of the oscilloscope needs to be deskewed for acquisition external signal source before connecting the fixtures. There is no need to deskew between the modules since the measurements are done for the pairs within the modules. The deskew is to be performed in odd and even modes. The step signals should arrive at the PUT and the same time. 3. It is recommended to save the test setups to the instrument after each, even and odd deskew operations. Test Procedure: 1. Apply the same procedure that was used for Rx/Tx01-05 tests. Figure E.1 Crescent Heart fixtures configured for the verification tests. Measurement Results: 54 Tektronix SATA-IO Rev 1.3 Rx/Tx MOI v1.0