PH880 Topics in Physics

Save this PDF as:
 WORD  PNG  TXT  JPG

Size: px
Start display at page:

Download "PH880 Topics in Physics"

Transcription

1 PH880 Topics in Physics Modern Optical Imaging (Fall 2010)

2 Overview of week 12 Monday: FRET Wednesday: NSOM

3 Förster resonance energy transfer (FRET) Fluorescence emission i FRET Donor Acceptor wikipedia

4 FRET: spectroscopic ruler Determines distances between biomolecules labeled with an appropriate donor and acceptor fluorochrome when they are within 10 nanometers of each other. (* normal diffraction limited it d fluorescence microscope resolution is insufficient i to determine whether an interaction between biomolecules actually takes place.) Teakjip Ha group

5 508 VOL.5 NO.6 JUNE 2008 NATURE METHODS

6 Overview of week 12 Monday: FRET Wednesday: NSOM

7 Things Natural The Scale of Things Nanometers and More 10-2 m 1 cm 10 mm Things Manmade Head of a pin 1-2 mm The Challenge Ant ~ m mm Dust mite 200 mm 10-4 m 0.1 mm 100 mm 1,000,000 nanometers = 1 millimeter (mm) e Microwave MicroElectroMechanic al (MEMS) devices mm wide Human hair ~ mm wide Red blood cells (~7-8 mm) ~10 nm diameter Fly ash ~ mm ATP synthase Microworld Nan noworld 10-5 m 10-6 m 10-7 m 10-8 m Infrared Visible Ultraviolet 0.01 mm 10 mm mm 100 nm Pollen grain Red blood cells 1,000 nanometers = Zone plate x-ray lens 1 micrometer Outer ring spacing ~35 nm (mm) 0.01 mm 10 nm Self-assembled, Nature-inspired structure Many 10s of nm Nanotube electrode O O S O O O O O O O O O O O S O S O S Fabricate and combine nanoscale building blocks to make useful devices, e.g., a photosynthetic reaction center with integral semiconductor storage. O S P O O O O S O O S O S DNA ~2-1/2 nm diameter Atoms of silicon spacing nm 10-9 m m Soft x-r ray 1 nanometer (nm) 0.1 nm Quantum corral of 48 iron atoms on copper surface positioned one at a time with an STM tip Corral diameter 14 nm Carbon buckyball ~1 nm Carbon nanotube diameter ~1.3 nm diameter Office of Basic Energy Science Office of Science, U.S. DOE Version , pmd

8 Scanning probe microscopes Scanning Tunneling Microscope STM Atomic Force Microscope AFM Nearfield Scanning Optical Microscope NSOM

9 Scanning Tunneling Microscope: STM Binnig and Rohrer won Nobel Prize in 1986 for the development of STM S. Woedtke, Ph.D. thesis, Inst.f.Exp.u.Ang.Phys. der CAU Kiel, When STM tip is close to the specimen (~ 1nm), a tunneling current, I T is established I T is exponentially proportional to the distance A feedback loop maintaining I T can change z position topographical p information

10 STM images "quantum corral" Atom Carbon Monoxide Man Iron on Copper Iron on Copper Carbon Monoxide on Platinum Don Eigler, IBM Lutz & Eigler, IBM Lutz & Eigler, IBM

11 Atomic Force Microscope AFM STM is a precursor of AFM Feedback Loop V Laser PZT Mirror Photodiode ~ deflection Tip ThermoMicroscopes Explorer AFM Substrate AFM relies on contact rather than current nonconductive materials can be imaged

12 AFM images the compaction of DNA in yeast caused by a protein ti called AbF2 nuclear pore complex LR Brewer, et al, Biophysical journal, 2003 D Stoffler et al, Current opinion in cell biology, 1999

13 AFM + Fluorescence imaging techniques A. Gaiduk et al, Chem. Phys. Chem. 6, no. 5, pp , 2005

14 Near field

15 sub wavelength aperture (a) ( nm) ~10 nm Image can be reconstructed point by point spatial resolution is limited by a (rather than λ)

16 the propagation of waves :the loss of spatialinformationinformation Hartschuh et al., Angewandte Chemie,2008

17 History of NSOM 1. Theoretically proposed in 1928, EH Synge, Philos. Mag. 6, 356 (1928) 2. Demonstration at microwave frequencies with a resolution of λ/60. EA Ash ad G. Nicholls, Nature (London) 237, 510 (1972) 3. At visible wavelengths ( optical stethoscopy ) was demonstrated. D. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984) 4. Betzig et al used fiber probes to image a variety of samples with a number of different contrast mechanisms. Betzig, E. & Trautman, JK Science 257

18

19

20

21 NSOM tip fabrication chemical etching (meniscus or tube etching) Micro fabrication Fast Large cone angle Fast, convenient process mass production. (Low cost, reproducible) Toxic (HF) vapor Difficult to control surface quality Smooth surface Low cone angle (low throughput) Fragile Complex fabrication process

22 NSOM tip: metal coating

23 NSOM tip: illumination Waveguide tip (Takashi et al.1999) SiO2 cantilevered tip (Mitsuoka et al. 2000) Fiber tip by Nanonics Inc.

24 NSOM tip: intensity distribution Probe to Probe configuration (Ohtsu et al. 2000) Minh et al Lu et al. 2001

25 NSOM tip: geometry and light throughput Ultramicroscopy 57 (1995)

26 Common NSOM illumination

27 Other focusing concepts using near field optics Hartschuh et al., Angewandte Chemie,2008 a) Far field focusing using a lens. The angular frequency range of propagating p gwaves kx,max, and thus the focus diameter, is limited by the aperture angle of the lens kx,max=nsin(q)2p/l, with n being the refractive index and l the wavelength of light. b) Aperture type scanning near field optical microscope (aperture SNOM). c) Tip enhanced near field optical microscopy (TENOM). d) Tip on aperture (TOA) approach, which combines the advantages of (b) and (c).

28 Oscillatory Feedback Methods Oscillating ~ 1 nm at resonance freq (~ 30 khz) Increases SNR for feedback methods Q factor ~ 500 (the oscillator's resonance frequency divided by its resonance width) 1. Shear force detection utilizes lateral oscillation shear forces generated between the tip andspecimen (parallel to the surface) to control the tipspecimen gap during imaging 2. Tapping mode detection relies on atomic forces occurring during oscillation of the tip perpendicular to the specimen surface (as in AFM) to generate the feedback signal for tip control.

29 Reading List BetzigE, Lewis A, Harootunian A, Isaacson M, & Kratschmer E (1986) Near Field ildscanning Optical Microscopy (NSOM): Development and Biophysical Applications. Biophys J 49(1):

Lecture 20: Optical Tools for MEMS Imaging

Lecture 20: Optical Tools for MEMS Imaging MECH 466 Microelectromechanical Systems University of Victoria Dept. of Mechanical Engineering Lecture 20: Optical Tools for MEMS Imaging 1 Overview Optical Microscopes Video Microscopes Scanning Electron

More information

Near-field Optical Microscopy

Near-field Optical Microscopy Near-field Optical Microscopy R. Fernandez, X. Wang, N. Li, K. Parker, and A. La Rosa Physics Department Portland State University Portland, Oregon Near-Field SPIE Optics Microscopy East 2005 Group PSU

More information

Diffraction, Fourier Optics and Imaging

Diffraction, Fourier Optics and Imaging 1 Diffraction, Fourier Optics and Imaging 1.1 INTRODUCTION When wave fields pass through obstacles, their behavior cannot be simply described in terms of rays. For example, when a plane wave passes through

More information

Advanced Nanoscale Metrology with AFM

Advanced Nanoscale Metrology with AFM Advanced Nanoscale Metrology with AFM Sang-il Park Corp. SPM: the Key to the Nano World Initiated by the invention of STM in 1982. By G. Binnig, H. Rohrer, Ch. Gerber at IBM Zürich. Expanded by the invention

More information

Evaluation of Transducers with Near-field Scanning of Their Sl~rfaces

Evaluation of Transducers with Near-field Scanning of Their Sl~rfaces Evaluation of Transducers with Near-field Scanning of Their Sl~rfaces Jian-yu Ln and James F. Greenleaf Biodynamics Research Unit. Department of Physiology and Biophysics, Mayo Clinic and Foundation. Rochester,

More information

Atomic Force Microscopy (Bruker MultiMode Nanoscope IIIA)

Atomic Force Microscopy (Bruker MultiMode Nanoscope IIIA) Atomic Force Microscopy (Bruker MultiMode Nanoscope IIIA) This operating procedure intends to provide guidance for general measurements with the AFM. For more advanced measurements or measurements with

More information

Near-field optics: from subwavelength illumination to nanometric shadowing

Near-field optics: from subwavelength illumination to nanometric shadowing FOCUS ON OPTICAL IMAGING Near-field optics: from subwavelength illumination to nanometric shadowing Aaron Lewis, Hesham Taha, Alina Strinkovski, Alexandra Manevitch, Artium Khatchatouriants, Rima Dekhter

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy The wavelike properties of electrons allows them to tunnel beyond the regions of a solid into a region of space forbidden for them to exist in. In this region they can be

More information

A Project Report Submitted to the Faculty of the Graduate School of the University of Minnesota By

A Project Report Submitted to the Faculty of the Graduate School of the University of Minnesota By Observation and Manipulation of Gold Clusters with Scanning Tunneling Microscopy A Project Report Submitted to the Faculty of the Graduate School of the University of Minnesota By Dogukan Deniz In Partial

More information

k λ NA Resolution of optical systems depends on the wavelength visible light λ = 500 nm Extreme ultra-violet and soft x-ray light λ = 1-50 nm

k λ NA Resolution of optical systems depends on the wavelength visible light λ = 500 nm Extreme ultra-violet and soft x-ray light λ = 1-50 nm Resolution of optical systems depends on the wavelength visible light λ = 500 nm Spatial Resolution = k λ NA EUV and SXR microscopy can potentially resolve full-field images with 10-100x smaller features

More information

Three-dimensional imaging with optical tweezers

Three-dimensional imaging with optical tweezers Three-dimensional imaging with optical tweezers M. E. J. Friese, A. G. Truscott, H. Rubinsztein-Dunlop, and N. R. Heckenberg We demonstrate a three-dimensional scanning probe microscope in which the extremely

More information

photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited by

photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited by Supporting online material Materials and Methods Single-walled carbon nanotube (SWNT) devices are fabricated using standard photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited

More information

Unit-25 Scanning Tunneling Microscope (STM)

Unit-25 Scanning Tunneling Microscope (STM) Unit-5 Scanning Tunneling Microscope (STM) Objective: Imaging formation of scanning tunneling microscope (STM) is due to tunneling effect of quantum physics, which is in nano scale. This experiment shows

More information

An opening a = λ would put the first minima at θ = 90

An opening a = λ would put the first minima at θ = 90 Microscopy Outline Resolution & definitions Fluorescence microscopy Some other optical microscopy techniques Electron microscopes X-ray microscopy Scanning tunneling microscopes 2 Microscopy history First

More information

Moving from micro- to nanoworld in optical domain scanning probe microscopy

Moving from micro- to nanoworld in optical domain scanning probe microscopy BULLETIN OF THE POLISH ACADEMY OF SCIENCES TECHNICAL SCIENCES Vol. 54, No. 1, 2006 Moving from micro- to nanoworld in optical domain scanning probe microscopy J. RADOJEWSKI Faculty of Microsystem Electronics

More information

Alejandro Mendez, Ph.D. President & CEO Mendezized Metals Corporation

Alejandro Mendez, Ph.D. President & CEO Mendezized Metals Corporation ATOMIC FORCE MICROSCOPY (AFM) PHOTO CONDUCTIVE ANALYSIS AND CALCULATION FOR REGULAR AND MENDEZIZED COMMERCIAL 24 KARATS GOLD BARS CONDUCTED IN FIVE DIFFERENT TRIPLICATE SERIES. Date: June 23, 2016 Conducted

More information

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation 238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura

More information

Corrugated SNOM probe with enhanced energy throughput

Corrugated SNOM probe with enhanced energy throughput OPTO-ELECTRONICS REVIEW 16(4), 451 457 DOI: 10.2478/s11772-008-0048-6 Corrugated SNOM probe with enhanced energy throughput T.J. ANTOSIEWICZ * and T. SZOPLIK Faculty of Physics, University of Warsaw, 7

More information

No part of this material may be reproduced without explicit written permission.

No part of this material may be reproduced without explicit written permission. This material is provided for educational use only. The information in these slides including all data, images and related materials are the property of : Robert M. Glaeser Department of Molecular & Cell

More information

:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm.

:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm. PAGE 30 & 2008 2007 PRODUCT CATALOG Confocal Microscopy - CFM fundamentals :... Over the years, confocal microscopy has become the method of choice for obtaining clear, three-dimensional optical images

More information

The microscope is useful in making observations and collecting data in scientific experiments. Microscopy involves three basic concepts:

The microscope is useful in making observations and collecting data in scientific experiments. Microscopy involves three basic concepts: AP BIOLOGY Chapter 6 NAME DATE Block MICROSCOPE LAB PART I: COMPOUND MICROSCOPE OBJECTIVES: After completing this exercise you should be able to: Demonstrate proper care and use of a compound microscope.

More information

MICROSCOPE LAB. Resolving Power How well specimen detail is preserved during the magnifying process.

MICROSCOPE LAB. Resolving Power How well specimen detail is preserved during the magnifying process. AP BIOLOGY Cells ACTIVITY #2 MICROSCOPE LAB OBJECTIVES 1. Demonstrate proper care and use of a compound microscope. 2. Identify the parts of the microscope and describe the function of each part. 3. Compare

More information

Author(s) Issue Date Text Version author. DOI / /18/9/095501

Author(s) Issue Date Text Version author.  DOI / /18/9/095501 Title Author(s) Citation Refinement of Conditions of Point-Contact Current Imaging Atomic Force Microscopy for Molecular-Scale Conduction Measurements Yajima, Takashi; Tanaka, Hirofumi; Matsumoto, Takuya;

More information

Real-Time Detection for Scattering Scanning Near- Field Optical Microscopy

Real-Time Detection for Scattering Scanning Near- Field Optical Microscopy University of Colorado, Boulder CU Scholar Undergraduate Honors Theses Honors Program Spring 2013 Real-Time Detection for Scattering Scanning Near- Field Optical Microscopy Justin Alan Gerber University

More information

VISUAL PHYSICS ONLINE DEPTH STUDY: ELECTRON MICROSCOPES

VISUAL PHYSICS ONLINE DEPTH STUDY: ELECTRON MICROSCOPES VISUAL PHYSICS ONLINE DEPTH STUDY: ELECTRON MICROSCOPES Shortly after the experimental confirmation of the wave properties of the electron, it was suggested that the electron could be used to examine objects

More information

Physics 1230 Light and Color

Physics 1230 Light and Color Physics 1230 Light and Color http://www.colorado.edu/physics/phys1230/ phys1230_sm15/ Dr. Ka'e Hinko kathleen.hinko@colorado.edu Office: JILA A502 Ques'ons (5 min) Finish Module 7 Agenda, Day 18: Ac'vity

More information

with valuable information only accessible with optical contrast. One should look at it as a complementary tool with some room for improvement.

with valuable information only accessible with optical contrast. One should look at it as a complementary tool with some room for improvement. Introduction Optical microscopy has come a long way from Zacharias Jansen s first microscope at the end of the 16th century to today s highly developed microscopes. A number of different contrast mechanisms

More information

IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM

IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM Laboratorio MDM - INFM Via C.Olivetti 2, I-20041 Agrate Brianza (MI) M D M Materiali e Dispositivi per la Microelettronica IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL

More information

CHARACTERISTICS AND APPLICATIONS OF A SCANNING NANO-SLIT OPTICAL SENSOR. Anoop George. A Dissertation Submitted to the Faculty of the

CHARACTERISTICS AND APPLICATIONS OF A SCANNING NANO-SLIT OPTICAL SENSOR. Anoop George. A Dissertation Submitted to the Faculty of the 1 CHARACTERISTICS AND APPLICATIONS OF A SCANNING NANO-SLIT OPTICAL SENSOR By Anoop George A Dissertation Submitted to the Faculty of the COLLEGE OF OPTICAL SCIENCES In Partial Fulfillment of the Requirements

More information

1.6 Beam Wander vs. Image Jitter

1.6 Beam Wander vs. Image Jitter 8 Chapter 1 1.6 Beam Wander vs. Image Jitter It is common at this point to look at beam wander and image jitter and ask what differentiates them. Consider a cooperative optical communication system that

More information

Theory and Applications of Frequency Domain Laser Ultrasonics

Theory and Applications of Frequency Domain Laser Ultrasonics 1st International Symposium on Laser Ultrasonics: Science, Technology and Applications July 16-18 2008, Montreal, Canada Theory and Applications of Frequency Domain Laser Ultrasonics Todd W. MURRAY 1,

More information

High Sensitivity Sensor Based on Porous Silicon Waveguide

High Sensitivity Sensor Based on Porous Silicon Waveguide Mater. Res. Soc. Symp. Proc. Vol. 934 2006 Materials Research Society 0934-I10-04 High Sensitivity Sensor Based on Porous Silicon Waveguide Guoguang Rong 1, Jarkko J. Saarinen 2, John E. Sipe 2, and Sharon

More information

Basics of Light Microscopy and Metallography

Basics of Light Microscopy and Metallography ENGR45: Introduction to Materials Spring 2012 Laboratory 8 Basics of Light Microscopy and Metallography In this exercise you will: gain familiarity with the proper use of a research-grade light microscope

More information

Examination Optoelectronic Communication Technology. April 11, Name: Student ID number: OCT1 1: OCT 2: OCT 3: OCT 4: Total: Grade:

Examination Optoelectronic Communication Technology. April 11, Name: Student ID number: OCT1 1: OCT 2: OCT 3: OCT 4: Total: Grade: Examination Optoelectronic Communication Technology April, 26 Name: Student ID number: OCT : OCT 2: OCT 3: OCT 4: Total: Grade: Declaration of Consent I hereby agree to have my exam results published on

More information

The Lightwave Model 142 CW Visible Ring Laser, Beam Splitter, Model ATM- 80A1 Acousto-Optic Modulator, and Fiber Optic Cable Coupler Optics Project

The Lightwave Model 142 CW Visible Ring Laser, Beam Splitter, Model ATM- 80A1 Acousto-Optic Modulator, and Fiber Optic Cable Coupler Optics Project The Lightwave Model 142 CW Visible Ring Laser, Beam Splitter, Model ATM- 80A1 Acousto-Optic Modulator, and Fiber Optic Cable Coupler Optics Project Stephen W. Jordan Seth Merritt Optics Project PH 464

More information

Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch

Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch I. Introduction In this lab you will image your carbon nanotube sample from last week with an atomic force microscope. You

More information

Surface Finish Measurement Methods and Instrumentation

Surface Finish Measurement Methods and Instrumentation 125 years of innovation Surface Finish Measurement Methods and Instrumentation Contents Visual Inspection Surface Finish Comparison Plates Contact Gauges Inductive / Variable Reluctance (INTRA) Piezo Electric

More information

Ph 77 ADVANCED PHYSICS LABORATORY ATOMIC AND OPTICAL PHYSICS

Ph 77 ADVANCED PHYSICS LABORATORY ATOMIC AND OPTICAL PHYSICS Ph 77 ADVANCED PHYSICS LABORATORY ATOMIC AND OPTICAL PHYSICS Diode Laser Characteristics I. BACKGROUND Beginning in the mid 1960 s, before the development of semiconductor diode lasers, physicists mostly

More information

Optical Microscope. Active anti-vibration table. Mechanical Head. Computer and Software. Acoustic/Electrical Shield Enclosure

Optical Microscope. Active anti-vibration table. Mechanical Head. Computer and Software. Acoustic/Electrical Shield Enclosure Optical Microscope On-axis optical view with max. X magnification Motorized zoom and focus Max Field of view: mm x mm (depends on zoom) Resolution : um Working Distance : mm Magnification : max. X Zoom

More information

Precision-tracking of individual particles By Fluorescence Photo activation Localization Microscopy(FPALM) Presented by Aung K.

Precision-tracking of individual particles By Fluorescence Photo activation Localization Microscopy(FPALM) Presented by Aung K. Precision-tracking of individual particles By Fluorescence Photo activation Localization Microscopy(FPALM) Presented by Aung K. Soe This FPALM research was done by Assistant Professor Sam Hess, physics

More information

Lithography. 3 rd. lecture: introduction. Prof. Yosi Shacham-Diamand. Fall 2004

Lithography. 3 rd. lecture: introduction. Prof. Yosi Shacham-Diamand. Fall 2004 Lithography 3 rd lecture: introduction Prof. Yosi Shacham-Diamand Fall 2004 1 List of content Fundamental principles Characteristics parameters Exposure systems 2 Fundamental principles Aerial Image Exposure

More information

Chapter 36: diffraction

Chapter 36: diffraction Chapter 36: diffraction Fresnel and Fraunhofer diffraction Diffraction from a single slit Intensity in the single slit pattern Multiple slits The Diffraction grating X-ray diffraction Circular apertures

More information

Georgia Tech IEN EBL Facility NNIN Highlights 2014 External User Projects

Georgia Tech IEN EBL Facility NNIN Highlights 2014 External User Projects Georgia Tech IEN EBL Facility NNIN Highlights 2014 External User Projects Silicon based Photonic Crystal Devices Silicon based photonic crystal devices are ultra-small photonic devices that can confine

More information

Burton's Microbiology for the Health Sciences

Burton's Microbiology for the Health Sciences Burton's Microbiology for the Health Sciences Chapter 2. Viewing the Microbial World Chapter 2 Outline Introduction Using the metric system to express the sizes of microbes Microscopes Simple microscopes

More information

2017 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES

2017 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES 2017 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES 1000 millimeters (mm) = 1 meter (m) 1000 micrometers (µm or mcm) = 1 millimeter (mm) 1000 nanometers (nm) = 1 micrometer (mcm) Size

More information

Chapter 17: Wave Optics. What is Light? The Models of Light 1/11/13

Chapter 17: Wave Optics. What is Light? The Models of Light 1/11/13 Chapter 17: Wave Optics Key Terms Wave model Ray model Diffraction Refraction Fringe spacing Diffraction grating Thin-film interference What is Light? Light is the chameleon of the physical world. Under

More information

2018 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES

2018 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES 2018 MICROSCOPE REVIEW by Karen L. Lancour RELATIVE SIZE OF MICROBES 1000 millimeters (mm) = 1 meter (m) 1000 micrometers (µm or mcm) = 1 millimeter (mm) 1000 nanometers (nm) = 1 micrometer (mcm) Size

More information

EE119 Introduction to Optical Engineering Fall 2009 Final Exam. Name:

EE119 Introduction to Optical Engineering Fall 2009 Final Exam. Name: EE119 Introduction to Optical Engineering Fall 2009 Final Exam Name: SID: CLOSED BOOK. THREE 8 1/2 X 11 SHEETS OF NOTES, AND SCIENTIFIC POCKET CALCULATOR PERMITTED. TIME ALLOTTED: 180 MINUTES Fundamental

More information

Introduction to Optoelectronic Devices

Introduction to Optoelectronic Devices Introduction to Optoelectronic Devices Dr. Jing Bai Assistant Professor Department of Electrical and Computer Engineering University of Minnesota Duluth October 30th, 2012 1 Outline What is the optoelectronics?

More information

IBM Research - Zurich Research Laboratory

IBM Research - Zurich Research Laboratory October 28, 2010 IBM Research - Zurich Research Laboratory Walter Riess Science & Technology Department IBM Research - Zurich wri@zurich.ibm.com Outline IBM Research IBM Research Zurich Science & Technology

More information

Enhanced resolution in subsurface near-field optical microscopy

Enhanced resolution in subsurface near-field optical microscopy Enhanced resolution in subsurface near-field optical microscopy Roman Krutokhvostov, 1 Alexander A. Govyadinov, 1 Johannes M. Stiegler, 1 Florian Huth, 1,2 Andrey Chuvilin, 1,3 P. Scott Carney, 1,4 and

More information

Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision

Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision Hitachi Review Vol. 65 (2016), No. 7 243 Featured Articles Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision VS1000 Series Coherence Scanning Interferometer

More information

Water-Window Microscope Based on Nitrogen Plasma Capillary Discharge Source

Water-Window Microscope Based on Nitrogen Plasma Capillary Discharge Source 2015 International Workshop on EUV and Soft X-Ray Sources Water-Window Microscope Based on Nitrogen Plasma Capillary Discharge Source T. Parkman 1, M. F. Nawaz 2, M. Nevrkla 2, M. Vrbova 1, A. Jancarek

More information

Computer Generated Holograms for Optical Testing

Computer Generated Holograms for Optical Testing Computer Generated Holograms for Optical Testing Dr. Jim Burge Associate Professor Optical Sciences and Astronomy University of Arizona jburge@optics.arizona.edu 520-621-8182 Computer Generated Holograms

More information

Innovative Technology for Innovative Science Hands-on in a Nanoscience Classroom

Innovative Technology for Innovative Science Hands-on in a Nanoscience Classroom Innovative Technology for Innovative Science Hands-on in a Nanoscience Classroom Presented by Jennifer F. Wall, Ph.D. Imaging Possibilities Optical 2 mm Electron 500 microns Atomic Force 10 microns Scanning

More information

Confocal Imaging Through Scattering Media with a Volume Holographic Filter

Confocal Imaging Through Scattering Media with a Volume Holographic Filter Confocal Imaging Through Scattering Media with a Volume Holographic Filter Michal Balberg +, George Barbastathis*, Sergio Fantini % and David J. Brady University of Illinois at Urbana-Champaign, Urbana,

More information

Section 2: Lithography. Jaeger Chapter 2 Litho Reader. EE143 Ali Javey Slide 5-1

Section 2: Lithography. Jaeger Chapter 2 Litho Reader. EE143 Ali Javey Slide 5-1 Section 2: Lithography Jaeger Chapter 2 Litho Reader EE143 Ali Javey Slide 5-1 The lithographic process EE143 Ali Javey Slide 5-2 Photolithographic Process (a) (b) (c) (d) (e) (f) (g) Substrate covered

More information

Biology Lab #1: Using Microscopes to Observe and Measure Cells

Biology Lab #1: Using Microscopes to Observe and Measure Cells Biology Lab #1: Using Microscopes to Observe and Measure Cells Make sure you have signed and submitted the CDNIS Safety Contract before you start this experiment! PURPOSE: to review the use of the microscope

More information

PHY 431 Homework Set #5 Due Nov. 20 at the start of class

PHY 431 Homework Set #5 Due Nov. 20 at the start of class PHY 431 Homework Set #5 Due Nov. 0 at the start of class 1) Newton s rings (10%) The radius of curvature of the convex surface of a plano-convex lens is 30 cm. The lens is placed with its convex side down

More information

Design and Implementation of a Near-field Scanning Optical Module for Inverted Microscopes

Design and Implementation of a Near-field Scanning Optical Module for Inverted Microscopes University of Wisconsin Milwaukee UWM Digital Commons Theses and Dissertations December 2014 Design and Implementation of a Near-field Scanning Optical Module for Inverted Microscopes Taher Ababneh University

More information

Powerful Single-Frequency Laser System based on a Cu-laser pumped Dye Laser

Powerful Single-Frequency Laser System based on a Cu-laser pumped Dye Laser Powerful Single-Frequency Laser System based on a Cu-laser pumped Dye Laser V.I.Baraulya, S.M.Kobtsev, S.V.Kukarin, V.B.Sorokin Novosibirsk State University Pirogova 2, Novosibirsk, 630090, Russia ABSTRACT

More information

Proposal. Design of a Scanning Tunneling Microscope

Proposal. Design of a Scanning Tunneling Microscope Proposal Design of a Scanning Tunneling Microscope Submitted to The Engineering Honors Committee 119 Hitchcock Hall College of Engineering The Ohio State University Columbus, Ohio 43210 Abstract This proposal

More information

Optical design of a high resolution vision lens

Optical design of a high resolution vision lens Optical design of a high resolution vision lens Paul Claassen, optical designer, paul.claassen@sioux.eu Marnix Tas, optical specialist, marnix.tas@sioux.eu Prof L.Beckmann, l.beckmann@hccnet.nl Summary:

More information

Test procedures Page: 1 of 5

Test procedures Page: 1 of 5 Test procedures Page: 1 of 5 1 Scope This part of document establishes uniform requirements for measuring the numerical aperture of optical fibre, thereby assisting in the inspection of fibres and cables

More information

High-speed wavefront control using MEMS micromirrors T. G. Bifano and J. B. Stewart, Boston University [ ] Introduction

High-speed wavefront control using MEMS micromirrors T. G. Bifano and J. B. Stewart, Boston University [ ] Introduction High-speed wavefront control using MEMS micromirrors T. G. Bifano and J. B. Stewart, Boston University [5895-27] Introduction Various deformable mirrors for high-speed wavefront control have been demonstrated

More information

Characterization of Silicon-based Ultrasonic Nozzles

Characterization of Silicon-based Ultrasonic Nozzles Tamkang Journal of Science and Engineering, Vol. 7, No. 2, pp. 123 127 (24) 123 Characterization of licon-based Ultrasonic Nozzles Y. L. Song 1,2 *, S. C. Tsai 1,3, Y. F. Chou 4, W. J. Chen 1, T. K. Tseng

More information

28 The diagram shows an experiment which has been set up to demonstrate two-source interference, using microwaves of wavelength λ.

28 The diagram shows an experiment which has been set up to demonstrate two-source interference, using microwaves of wavelength λ. PhysicsndMathsTutor.com 28 The diagram shows an experiment which has been set up to demonstrate two-source interference, using microwaves of wavelength λ. 9702/1/M/J/02 X microwave transmitter S 1 S 2

More information

Investigating the Electronic Behavior of Nano-materials From Charge Transport Properties to System Response

Investigating the Electronic Behavior of Nano-materials From Charge Transport Properties to System Response Investigating the Electronic Behavior of Nano-materials From Charge Transport Properties to System Response Amit Verma Assistant Professor Department of Electrical Engineering & Computer Science Texas

More information

Measuring incidence angle for throughthe-objective

Measuring incidence angle for throughthe-objective Measuring incidence angle for throughthe-objective total internal reflection fluorescence microscopy Thomas P. Burghardt Journal of Biomedical Optics 17(12), 126007 (December 2012) Measuring incidence

More information

Microscopy: Fundamental Principles and Practical Approaches

Microscopy: Fundamental Principles and Practical Approaches Microscopy: Fundamental Principles and Practical Approaches Simon Atkinson Online Resource: http://micro.magnet.fsu.edu/primer/index.html Book: Murphy, D.B. Fundamentals of Light Microscopy and Electronic

More information

Indentation Cantilevers

Indentation Cantilevers curve is recorded utilizing the DC displacement of the cantilever versus the extension of the scanner. Many indentations may be made using various forces, rates, etc. Upon exiting indentation mode, TappingMode

More information

Advanced Optical Microscopy

Advanced Optical Microscopy Nanosystems I - Seminar TU München 8th December 2008 1 Introduction to Classical Optical Microscopy Denitions in Optical Microscopy Contrast and Contrast Enhancement 1 Introduction to Classical Optical

More information

Laser Beam Analysis Using Image Processing

Laser Beam Analysis Using Image Processing Journal of Computer Science 2 (): 09-3, 2006 ISSN 549-3636 Science Publications, 2006 Laser Beam Analysis Using Image Processing Yas A. Alsultanny Computer Science Department, Amman Arab University for

More information

The diffraction of light

The diffraction of light 7 The diffraction of light 7.1 Introduction As introduced in Chapter 6, the reciprocal lattice is the basis upon which the geometry of X-ray and electron diffraction patterns can be most easily understood

More information

Radial Polarization Converter With LC Driver USER MANUAL

Radial Polarization Converter With LC Driver USER MANUAL ARCoptix Radial Polarization Converter With LC Driver USER MANUAL Arcoptix S.A Ch. Trois-portes 18 2000 Neuchâtel Switzerland Mail: info@arcoptix.com Tel: ++41 32 731 04 66 Principle of the radial polarization

More information

Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes

Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes e-journal of Surface Science and Nanotechnology 26 January 2013 e-j. Surf. Sci. Nanotech. Vol. 11 (2013) 13-17 Regular Paper Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction

More information

Scale. A Microscope s job in life. The Light Microscope. The Compound Microscope 9/24/12. Compound Microscope Anatomy

Scale. A Microscope s job in life. The Light Microscope. The Compound Microscope 9/24/12. Compound Microscope Anatomy The Study of Microbial Structure: Microscopy and Specimen Preparation Scale A Microscope s job in life 1.Magnify 2. Resolve ability to separate or distinguish between two points 3. Contrast How much or

More information

Prospects of Optical Recording in Tera Era. Han-Ping D. Shieh

Prospects of Optical Recording in Tera Era. Han-Ping D. Shieh Prospects of Optical Recording in Tera Era Han-Ping D. Shieh Inst. of Electro-Optical Engineering Nat l Chiao Tung University Hsinchu, Taiwan 30010 e-mail: hpshieh@cc.nctu.edu.tw Disk Storage Roadmap $/MB

More information

Horizontal single and multiple slot waveguides: optical transmission at λ = 1550 nm

Horizontal single and multiple slot waveguides: optical transmission at λ = 1550 nm Horizontal single and multiple slot waveguides: optical transmission at λ = 1550 nm Rong Sun 1 *, Po Dong 2 *, Ning-ning Feng 1, Ching-yin Hong 1, Jurgen Michel 1, Michal Lipson 2, Lionel Kimerling 1 1Department

More information

Microscopy. CS/CME/BioE/Biophys/BMI 279 Nov. 2, 2017 Ron Dror

Microscopy. CS/CME/BioE/Biophys/BMI 279 Nov. 2, 2017 Ron Dror Microscopy CS/CME/BioE/Biophys/BMI 279 Nov. 2, 2017 Ron Dror 1 Outline Microscopy: the basics Fluorescence microscopy Resolution limits The diffraction limit Beating the diffraction limit 2 Microscopy:

More information

Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit as a Scanning Probe

Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit as a Scanning Probe IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 49, NO. 3, MARCH 2001 491 Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit as a Scanning Probe Tatsuo Nozokido, Member, IEEE,

More information

Infrared antennas coupled to lithographic Fresnel zone plate lenses

Infrared antennas coupled to lithographic Fresnel zone plate lenses Infrared antennas coupled to lithographic Fresnel zone plate lenses Francisco Javier González, Javier Alda, Bojan Ilic, and Glenn D. Boreman Several designs for Fresnel zone plate lenses FZPLs to be used

More information

Section 1: Sound. Sound and Light Section 1

Section 1: Sound. Sound and Light Section 1 Sound and Light Section 1 Section 1: Sound Preview Key Ideas Bellringer Properties of Sound Sound Intensity and Decibel Level Musical Instruments Hearing and the Ear The Ear Ultrasound and Sonar Sound

More information

Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse

Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse Cover Page Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse laser Authors: Futoshi MATSUI*(1,2), Masaaki ASHIHARA(1), Mitsuyasu MATSUO (1), Sakae KAWATO(2),

More information

Final Exam, 150 points PMB 185: Techniques in Light Microscopy

Final Exam, 150 points PMB 185: Techniques in Light Microscopy Final Exam, 150 points Name PMB 185: Techniques in Light Microscopy Point value is in parentheses at the end of each question. Note: GFP = green fluorescent protein ; CFP = cyan fluorescent protein ; YFP

More information

6 Experiment II: Law of Reflection

6 Experiment II: Law of Reflection Lab 6: Microwaves 3 Suggested Reading Refer to the relevant chapters, 1 Introduction Refer to Appendix D for photos of the apparatus This lab allows you to test the laws of reflection, refraction and diffraction

More information

Module - 2 Lecture - 13 Lithography I

Module - 2 Lecture - 13 Lithography I Nano Structured Materials-Synthesis, Properties, Self Assembly and Applications Prof. Ashok. K.Ganguli Department of Chemistry Indian Institute of Technology, Delhi Module - 2 Lecture - 13 Lithography

More information

Si Nano-Photonics Innovate Next Generation Network Systems and LSI Technologies

Si Nano-Photonics Innovate Next Generation Network Systems and LSI Technologies Si Nano-Photonics Innovate Next Generation Network Systems and LSI Technologies NISHI Kenichi, URINO Yutaka, OHASHI Keishi Abstract Si nanophotonics controls light by employing a nano-scale structural

More information

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+)

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) The Anasys Instruments afm+ system incorporates an Atomic Force Microscope which can scan the sample in the contact mode and generate

More information

Advances in Laser Micro-machining for Wafer Probing and Trimming

Advances in Laser Micro-machining for Wafer Probing and Trimming Advances in Laser Micro-machining for Wafer Probing and Trimming M.R.H. Knowles, A.I.Bell, G. Rutterford & A. Webb Oxford Lasers June 10, 2002 Oxford Lasers June 2002 1 Introduction to Laser Micro-machining

More information

Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers

Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers ContourGT with AcuityXR TM capability White light interferometry is firmly established

More information

Vanishing Core Fiber Spot Size Converter Interconnect (Polarizing or Polarization Maintaining)

Vanishing Core Fiber Spot Size Converter Interconnect (Polarizing or Polarization Maintaining) Vanishing Core Fiber Spot Size Converter Interconnect (Polarizing or Polarization Maintaining) The Go!Foton Interconnect (Go!Foton FSSC) is an in-fiber, spot size converting interconnect for convenient

More information

XYZ Stage. Surface Profile Image. Generator. Servo System. Driving Signal. Scanning Data. Contact Signal. Probe. Workpiece.

XYZ Stage. Surface Profile Image. Generator. Servo System. Driving Signal. Scanning Data. Contact Signal. Probe. Workpiece. Jpn. J. Appl. Phys. Vol. 40 (2001) pp. 3646 3651 Part 1, No. 5B, May 2001 c 2001 The Japan Society of Applied Physics Estimation of Resolution and Contact Force of a Longitudinally Vibrating Touch Probe

More information

ARCoptix. Radial Polarization Converter. Arcoptix S.A Ch. Trois-portes Neuchâtel Switzerland Mail: Tel:

ARCoptix. Radial Polarization Converter. Arcoptix S.A Ch. Trois-portes Neuchâtel Switzerland Mail: Tel: ARCoptix Radial Polarization Converter Arcoptix S.A Ch. Trois-portes 18 2000 Neuchâtel Switzerland Mail: info@arcoptix.com Tel: ++41 32 731 04 66 Radially and azimuthally polarized beams generated by Liquid

More information

Chapter 23 Study Questions Name: Class:

Chapter 23 Study Questions Name: Class: Chapter 23 Study Questions Name: Class: Multiple Choice Identify the letter of the choice that best completes the statement or answers the question. 1. When you look at yourself in a plane mirror, you

More information

Microbiology: Observing Bacteria Laboratory -1. Name Date

Microbiology: Observing Bacteria Laboratory -1. Name Date Microbiology: Observing Bacteria Laboratory -1 Name Date Prelab: Part 1 Introduction to the microscope- please read through this handout and label the picture on the next page before starting the lab Care

More information

AP B Webreview ch 24 diffraction and interference

AP B Webreview ch 24 diffraction and interference Name: Class: _ Date: _ AP B Webreview ch 24 diffraction and interference Multiple Choice Identify the choice that best completes the statement or answers the question.. In order to produce a sustained

More information

Micro- and Nano- Fabrication and Replication Techniques

Micro- and Nano- Fabrication and Replication Techniques Micro- and Nano- Fabrication and Replication Techniques Why do we have to write thing small and replicate fast? Plenty of Room at the Bottom Richard P. Feynman, December 1959 How do we write it? We have

More information

Advanced 3D Optical Profiler using Grasshopper3 USB3 Vision camera

Advanced 3D Optical Profiler using Grasshopper3 USB3 Vision camera Advanced 3D Optical Profiler using Grasshopper3 USB3 Vision camera Figure 1. The Zeta-20 uses the Grasshopper3 and produces true color 3D optical images with multi mode optics technology 3D optical profiling

More information

The light microscope

The light microscope What is a microscope? The microscope is an essential tool in modern biology. It allows us to view structural details of organs, tissue, and cells not visible to the naked eye. The microscope should always

More information