EMC TEST REPORT For CE

Transcription

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2 EMC TEST REPORT For CE Test Report No. : CTK Date of Issue : Kind of Product : FnIO S-Series Basic Model/Type No. : NA-9211, ST-5725, ST-5726 Variant Model/Type No. : NA-9212 Applicant : CREVIS CO., LTD. Applicant Address : D-11F, Digital Empire BDG, 980-3, Youngtong-Dong, Youngtong-Gu, Suwon-City, Kyunggi-Do, Korea Manufacturer : CREVIS CO., LTD. Manufacturer Address : D-11F, Digital Empire BDG, 980-3, Youngtong-Dong, Youngtong-Gu, Suwon-City, Kyunggi-Do, Korea Contact Person : SUN HO, JIN / Research Engineer Telephone : Received Date : Test period : Start : End : Test Results : In Compliance Not in Compliance The test results presented in this report relate only to the object tested. Tested by Reviewed by Sang-Yun Kim Young-Kug Song EMC Test Engineer EMC Technical Manager Page 1 of 65

3 REPORT REVISION HISTORY Date Revision Page No Issued (CTK ) All This report shall not be reproduced except in full, without the written approval of CTK Co., Ltd. This document may be altered or revised by CTK Co., Ltd. personnel only, and shall be noted in the revision section of the document. Any alteration of this document not carried out by CTK Co., Ltd. will constitute fraud and shall nullify the document. Page 2 of 65

4 TABLE OF CONTENTS REPORT REVISION HISTORY General Product Description Model Differences Device Modifications EUT Configuration(s) Test Software EUT Operating Mode(s) Configuration Calibration Details of Equipment Used for Measurement Test Facility Laboratory Accreditations and Listings Measurement Uncertainty EMC Test Regulations/Standards Performance Criteria (PC) Results of Individual Test Conducted Voltage Emissions of Mains ports Conducted Voltage Emissions of Telecommunication Ports Radiated Electric Field Emissions (Below 1 GHz ) Radiated Electric Field Emissions (Above 1 GHz ) Harmonic Current Emissions Voltage Fluctuations and Flicker Electrostatic Discharge Radiated Electric Field Immunity Electrical Fast Transients/Bursts Surge Transients Conducted Disturbance Power Frequency Magnetic Field Immunity Voltage Dips and Short Interrupts APPENDIX A - Test Setup Photos and Configuration Conducted Voltage Emissions of Mains Ports Conducted Voltage Emissions of Telecommunication Ports Radiated Electric Field Emissions (Below 1 GHz ) Radiated Electric Field Emissions (Above 1 GHz ) Harmonic Current Emissions and Voltage Fluctuations and Flicker Electrostatic Discharge Radiated Electric Field Immunity Electrical Fast Transients/Bursts Surge Transients Conducted Disturbance Power Frequency Magnetic Field Immunity Voltage Dips, Short Interrupts and Voltage Variations APPENDIX B EUT Photographs Test Configuration Photographs NA NA ST ST Page 3 of 65

5 1.0 General Product Description No. ITEM APPLICATION 1 Kind of Product FnIO S-Series 2 Basic Model/Type No. NA-9211, ST-5725, ST Variant Model/Type No. NA-9212 NA (W) mm x 99.0 (L) mm x 70.0 (H) mm 4 Dimensions ( mm ) 5 Mobility NA (W) mm x 99.0 (L) mm x 70.0 (H) mm ST (W) mm x 99.0 (L) mm x 70.0 (H) mm ST (W) mm x 99.0 (L) mm x 70.0 (H) mm Table-top Floor-standing Built-in Portable 6 Maximum Clock Frequency 70 MHz 7 Electrical Ratings Input: Output: NA-9211 NA-9212 ST-5725 System : 24 Vdc, 1.5 A Field : 24 Vdc System : 24 Vdc, 1.5 A Field : 24 Vdc 5 Vdc, 0.18 A ST Vdc 0.1 A NA-9211 NA-9212 ST Vdc, 1.5 A 5 Vdc, 1.5 A 8 Test Voltage / Frequency ST Voltage: 24 Vdc Frequency: - Page 4 of 65

6 1.1 Model Differences Model NA-9211 NA-9212 Temp Controller Support Not supported Supported NA-9211 and NA-9212 are no technical difference from except 1.2 Device Modifications The following modifications were necessary for compliance: Not applicable Page 5 of 65

7 1.3 EUT Configuration(s) See Appendix A for individual test set-up configuration(s). The following peripheral devices and/or interface cables were connected during the measurement: Peripheral Devices Device Model No. Serial No. Manufacturer LCD Monitor GH19PS N794HVCPB1937M SAMSUNG ELECTRONICS Personal Computer Keyboard 6310U - BTC Technology Mouse M-M7URPN 1Z ELECOM FnIO S-Series ST CREVIS CO., LTD. FnIO S-Series ST CREVIS CO., LTD. Cable Description No. From To Type of Cable Device I/O Port Device I/O Port Length (m) Shielded or Unshielded 1 EUT(NA-9211) System Power DC Power Supply1 (Outside of Test site) DC Output 2.0 U N 2 Field Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 3 I/0 Personal Computer I/0 3.0 U N 4 EUT(ST-5726) System Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 5 Field Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 6 I/O EUT(ST-5725) I/0 3.0 U N 7 FnIO S-Series I/O FnIO S-Series I/O 0.1 U N 8 FnIO S-Series I/O FnIO S-Series I/O 0.1 U N 9 Aluminum Plate FG Line - GND S N 10 Personal Computer USB Keyboard S N 11 USB Mouse S N 12 D-SUB LCD Monitor D-SUB 2.0 S Y 13 AC Power AC Mains U N 14 LCD Monitor AC Power AC Mains U N Ferrite Core [Y/N] * Shielded or Unshielded : Unshielded=U, Shielded=S 1.4 Test Software Manual IO Test, RTD TC Test Display Test Patterns V1.5 Ping.exe Not applicable 1.5 EUT Operating Mode(s) Equipment under test was operated during the measurement under the following conditions: Practice operation Data Communication Page 6 of 65

8 1.6 Configuration AC Mains Keyboard 10 Mouse 11 Personal Computer 12 LCD Monitor DC Power Supply 2 (Outside of Test site) Outside of Test site EUT (NA-9211) ST ST EUT (ST-5725) EUT (ST-5726) ST ST Aluminum plate 9 DC Power Supply 1 (Outside of Test site) Outside of Test site Page 7 of 65

9 1.7 Calibration Details of Equipment Used for Measurement Test equipment and test accessories are calibrated on regular basis. The maximum time between calibrations is one year or what is recommended by the manufacturer, whichever is less. All test equipment calibrations are traceable to the Korea Research Institute of Standards and Science (KRISS), therefore, all test data recorded in this report is traceable to KRISS. 1.8 Test Facility The measurement facility is located at 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, , Korea. The sites are constructed in conformance with the requirements of ANSI C63.7, ANSI C63.4 and CISPR Publication Laboratory Accreditations and Listings Country Agency Scope of Accreditation Logo USA FCC 3 m & 10 m SAC and Conducted Test Site to perform FCC Part 15/18 measurements JAPAN VCCI 3 m & 10 m SAC and Conducted Test Site KOREA KCC EMI (3 m & 10 m SAC and Conducted Test Site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and Interruptions) C-986, T-1843, R-3627, G-387 No. 51, KR Measurement Uncertainty Compliance of the product is based on the measured value. However, the measurement uncertainty is included for information purposes. The measurement uncertainties given below are based on a standard uncertainty multiplied by a coverage factor of k=2, providing a level of confidence of approximately 95 %. Measurement Type Frequency Range Expanded Uncertainty Conducted Emission 150 khz to 30 MHz ± 2.42 db (C.L.: Approx. 95 %, k=2) Radiated Emission 30 MHz to 1000 MHz ± 3.62 db (C.L.: Approx. 95 %, k=2) Page 8 of 65

10 2.0 EMC Test Regulations/Standards The tests were performed according to following regulations: EMC Directive 2004/108/EC [Emission Test Regulations/Standards] Applied standard Title Applied Test Result EN :2007 +A1:2011 EN :2006 +A1:2009 +A2:2009 Conducted Voltage Emissions MET NOT MET Radiated Electric Field Emissions MET NOT MET Harmonic Current Emissions MET NOT MET EN :2008 Voltage Fluctuations and Flicker MET NOT MET [Immunity Test Regulations/Standards] Applied standard Title Applied Test Result EN :2005 EN :2009 Electrostatic Discharge MET NOT MET EN :2006 +A1:2008 +A2:2010 EN :2004 +A1:2010 Radiated Electric Field Immunity MET NOT MET Electrical Fast Transients/Bursts MET NOT MET EN :2006 Surge Transients MET NOT MET EN :2009 Conducted Disturbance MET NOT MET EN :2010 Power Frequency Magnetic Field Immunity MET NOT MET EN :2004 Voltage Dips and Short Interrupts MET NOT MET Page 9 of 65

11 2.1 Performance Criteria (PC) The performance criteria was based on the following guidelines: Performance criterion A: The apparatus shall continue to operate as intended during and after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. Performance criterion B: The apparatus shall continue to operate as intended during and after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. No change of actual operating state or stored data is allowed. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. Performance criterion C: Temporary loss of function is allowed, provided the function is self-recoverable, or can be restored by the operation of the controls. Page 10 of 65

12 3.0 Results of Individual Test 3.1 Conducted Voltage Emissions of Mains ports Test Date Not applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESCI7 Rohde & Schwarz LISN ENV216 Rohde & Schwarz LISN ENV216 Rohde & Schwarz EMI Test Receiver ESCI3 Rohde & Schwarz LISN ENV216 Rohde & Schwarz LISN ESH3-Z5 Rohde & Schwarz EMI Test Receiver ESHS30 Rohde & Schwarz / LISN ENV216 Rohde & Schwarz LISN 3825/2 EMCO Test Software ESCI7, ESCI3 : EMC32 Ver ESHS30 : ESxS-K1 ver Frequency Range of Measurement 150 khz to 30 MHz Instrument Setting IF Band Width: 9 khz Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Result The requirements are: MET NOT MET Frequency ( MHz ) Measured Data ( db µv) Margin ( db ) Remark The Result is calculated by using the following formula; * Result = Limit Margin (Result included the correction factor) * Correction factor = Cable Loss + Insertion loss of LISN Page 11 of 65

13 Test Data Page 12 of 65

14 3.2 Conducted Voltage Emissions of Telecommunication Ports Test Date Not applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESCI7 Rohde & Schwarz ISN ISN T8 TESEQ GMBH ISN ENY81-CA6 Rohde & Schwarz ISN ISN ST08 TESEQ GMBH LISN ENV216 Rohde & Schwarz LISN ENV216 Rohde & Schwarz Test Software EMC32 Ver Frequency Range of Measurement 150 khz to 30 MHz Instrument Setting IF Band Width: 9 khz Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Result The requirements are: MET NOT MET Tested Ports Frequency ( MHz ) Measured Data ( db µv) Margin ( db ) Remark The Result is calculated by using the following formula; * Result = Limit Margin (Result included the correction factor) * Correction factor = Cable Loss + Insertion loss of ISN Page 13 of 65

15 Test Data Page 14 of 65

16 3.3 Radiated Electric Field Emissions (Below 1 GHz ) Test Date Test Location 10 m SAC (test distance : 10 m) Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESCI7 Rohde & Schwarz Trilog Broadband Antenna VULB 9161 SE SCHWARZBECK dB Attenuator DNF Rohde & Schwarz Amplifier 310 Sonoma Instrument Co Test Software TOYO EMI software Ver Frequency Range of Measurement 30 MHz to 1 GHz Instrument Setting IF Band Width: 120 khz Climate Condition Temperature: (20 ± 1) Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 kpa Test Result The requirements are: MET NOT MET Frequency Measured Data Margin Remark ( MHz ) ( db µv/m) ( db ) Quasi-peak The Result is calculated by using the following formula; * Result = Reading + Correction factor * Correction factor = Antenna Factor + Cable Loss + 6 db attenuator Amp Gain Page 15 of 65

17 Test Data Page 16 of 65

18 3.4 Radiated Electric Field Emissions (Above 1 GHz ) Test Date Not Applicable Test Location 3 m SAC Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESU40 Rohde & Schwarz Double Ridged Guide Antenna 3115 ETS-Lindgren Preamplifier 8449B Agilent Technologies 3008A Test Software TOYO EMI software Ver Frequency Range of Measurement 1 GHz to 6 GHz Instrument Setting IF Band Width: 1 MHz Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Result The requirements are: MET NOT MET Frequency ( MHz ) Measured Data ( dbμv /m) Margin ( db ) Remark The Result is calculated by using the following formula; * Result = Reading + Correction factor * Correction factor = Antenna Factor + Cable Loss Amp Gain Test Data Page 17 of 65

19 3.5 Harmonic Current Emissions Test Date Not Applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Universal Power Analyzer PM6000 Voltech AC Power Source NSG Schaffner Test Software Voltech IEC Windows Software RC1 Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Classification of Equipment for Harmonic Current Emissions Class A Class B Class C Class D Test Results The requirements are: MET MET (Because the EUT power is less than 75 W, limits are not specified.) NOT MET NOT APPLICABLE Test Data Page 18 of 65

20 3.6 Voltage Fluctuations and Flicker Test Date Not Applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Universal Power Analyzer PM6000 Voltech AC Power Source NSG Schaffner Test Software Voltech IEC Windows Software RC1 Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Result The requirements are: MET NOT MET Test Data Page 19 of 65

21 3.7 Electrostatic Discharge Reference Standard EN :2009 Test Date Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied ESD Simulator ESS-2000 Noiseken 0199C ESD Gun TC-815R Noiseken ESS Climate Condition Temperature: (22 ± 1) Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 kpa Test Specifications Discharge Factor: 1 s Discharge Impedance: 330 Ω / 150 pf Kind of Discharge: Polarity: Air, Contact (direct and indirect) Positive and Negative Number of Discharges per location (each polarity): 10 for Air discharge Required Performance Criteria: B Discharge Voltage: Test Voltage Direct discharge Indirect discharge Contact Air HCP VCP ± 4 kv ± 2 kv ± 4 kv ± 4 kv - ± 4 kv ± 8 kv - - Notes: HCP: Horizontal coupling plane VCP: Vertical coupling plane Page 20 of 65

22 Location of Discharge: Air Contact Page 21 of 65

23 Test Results The requirements are: MET NOT MET Test Method No. Applied Point Discharge Method Performance Result Comments Indirect discharge - HCP Contact A - VCP discharge A - Direct discharge 1 Insulating surfaces Air discharge A - 2 Apertures Air discharge A - 3 Port apparatus Air discharge A - Remarks No any function degraded during the test. Page 22 of 65

24 3.8 Radiated Electric Field Immunity Reference Standard EN :2006 +A1:2008 +A2:2010 Test Date Test Location Fully anechoic chamber Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Power Meter E4418B Agilent MY Control Unit System Controller NA25MF1G2010 Noiseken A00148 N/A Power Sensor 8482A HP US BAND 1 Power Amplifier NA25MF1G2010 Noiseken A BAND 2 Power Amplifier NA25MF1G2010 Noiseken A P.S. UNIT Power Supply NA25MF1G2010 Noiseken A00148 N/A RF AMPLIFIER NA1GF3G50 Noiseken A Signal Generator SML03 Rohde & Schwarz ULTRA Broadband Antenna HL562 Rohde & Schwarz N/A Climate Condition Temperature: (22 ± 1) Relative Humidity: (56 ± 1) % Atmospheric Pressure: 99 kpa Test Specifications Antenna Polarization: Horizontal & Vertical unless indicated otherwise Antenna Distance: Field Strength: Frequency Range: Modulation: Dwell Time: Frequency step: 3 m 10 V/m 80 MHz to 1 GHz, 1.4 GHz to 2.0 GHz, 2.0 GHz to 2.7 GHz AM 80 %, 1 khz sine wave 3 s 1 % step # of Sides Radiated: 4 6 Required Performance Criteria: A Page 23 of 65

25 Test Results The requirements are: MET NOT MET [AM, 80 %, 1 khz sine wave, 80 MHz to 1 GHz, 10 V/m] Performance Result Side Exposed Horizontal Vertical Front A A Right A A Back A A Left A A Top Bottom [AM, 80 %, 1 khz sine wave, 1.4 MHz to 2 GHz, 10 V/m] Performance Result Side Exposed Horizontal Vertical Front A A Right A A Back A A Left A A Top Bottom Page 24 of 65

26 [AM, 80 %, 1 khz sine wave, 2 MHz to 2.7 GHz, 10 V/m] Performance Result Side Exposed Horizontal Vertical Front A A Right A A Back A A Left A A Top Bottom Note: Blank = Not performed Remarks No any function degraded during the test. Page 25 of 65

27 3.9 Electrical Fast Transients/Bursts Reference Standard EN :2004 +A1:2010 Test Date Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied FAST Transient Burst Simulator FNS-AX3 B50B Noiseken FNS10Y Fast Transient Noise Simulator FNS-AX II Noiseken 7079B Capacitive Coupling Clamp A Noiseken Climate Condition Temperature: (21 ± 1) Relative Humidity: (42 ± 1) % Atmospheric Pressure: 99 kpa Test Specifications Pulse Amplitude & Polarity: Input/Output a.c. power ports Input/Output d.c. power ports Signal ports ± 2.0 kv ± 2.0 kv ± 1.0 kv Burst Period: Repetition Rate: Duration of Test Voltage: 300 ms 5 khz 1 min Required Performance Criteria: B Page 26 of 65

28 Test Results The requirements are: MET NOT MET Input/Output a.c. power ports Coupling/Decoupling Network used Mode of Application Performance Result (+) Burst ( kv ) (-) Burst ( kv ) Input/Output d.c. power ports Coupling/Decoupling Network used Mode of Application Performance Result (+) Burst ( kv ) (-) Burst ( kv ) NA-9211 System power DC Input port A A ST-5726 System power DC Input port A A Signal ports Coupling Clamp used Mode of Application Performance Result (+) Burst ( kv ) (-) Burst ( kv ) NA-9211 I/O port A A ST-5725 I/O port A A ST-5726 I/O port A A Note: Blank = Not performed Remarks No any function degraded during the test. Page 27 of 65

29 3.10 Surge Transients Reference Standard EN :2006 Test Date Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Lightning Surge Simulator LSS-6030 Noiseken 0189E Lightning Surge Simulator LSS-15AX-C3A Noiseken LSS Telecom Lines Injection Unit LSS-INJ6401TEL Noiseken LSS N/A Interconnection Line Unit LSS-INJ6400SIG Noiseken LSS N/A Climate Condition Temperature: (22 ± 1) Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 kpa Test Specifications Input/Output a.c. power ports Surge Amplitude: Common Mode (0.5, 1.0, 2.0) kv Differential Mode (0.5, 1.0) kv Number of Surges: 5 surges per angle Angle: 0, 90, 180, 270 Polarity: Positive & Negative Required Performance Criteria: B Input/Output d.c. power ports Surge Amplitude: Common Mode 0.5 kv Number of Surges: Polarity: Repetition Rate: 5 surges Positive & Negative 1 surge per min Required Performance Criteria: B Page 28 of 65

30 Signal ports Surge Amplitude: Number of Surges: Polarity: Repetition Rate: Common Mode (0.5, 1.0) kv 5 Surges Positive & Negative 1 Surge per min Required Performance Criteria: B Test Results The requirements are: MET NOT MET Input/Output a.c. power ports Mode of Application Performance Result (+) Surge ( kv ) (-) Surge ( kv ) Input/Output d.c. power ports Mode of Application Performance Result (+) Surge ( kv ) (-) Surge ( kv ) NA-9211 System power DC Input port A A ST-5726 System power DC Input port A A Signal ports Mode of Application Performance Result (+) Surge ( kv ) (-) Surge ( kv ) ST-5725, ST-5726 I/O port A A Note: Blank = Not performed Remarks No any function degraded during the test. Page 29 of 65

31 3.11 Conducted Disturbance Reference Standard EN :2009 Test Date Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Power Meter E4419B HP GB RF Power Amplifier CBA Schaffner Power Sensor E9304A Agilent MY Signal Generator SML03 Rohde & Schwarz Attenuator 100-A-FFN-06 BIRD CDN NCDN-M2-32A Noiseken CDN NCDN-M3-32A Noiseken RF-Synthesizer/Amplifier NSG Schaffner Attenuator INA Schaffner CDN NCDN-M2-16A FCC CDN NCDN-M3-16A FCC CDN NCDN-T2 Noiseken CDN NCDN-T4 Noiseken CDN NCDN-T8 Noiseken CDN NCDN-C1-50-BNC Noiseken EM Clamp NEM-23 Noiseken EM Clamp NEM-23 Noiseken Climate Condition Temperature: (21 ± 1) Relative Humidity: (46 ± 1) % Atmospheric Pressure: 98 kpa Test Specifications Frequency range: Voltage Level: Modulation: Dwell Time: Frequency step: 150 khz to 80 MHz 10 V AM, 80 %, 1 khz sine wave 3 s 1 % step Required Performance Criteria: A Page 30 of 65

32 Test Results The requirements are: MET NOT MET Input/Output a.c. power ports Coupling Location (Line Stressed) Coupling Method Performance Result Input/Output d.c. power ports Coupling Location (Line Stressed) Coupling Method Performance Result NA-9211 System power DC Input port CDN (M2) A ST-5726 System power DC Input port CDN (M2) A Signal ports Coupling Location (Line Stressed) Coupling Method Performance Result NA-9211 I/0 port EM Clamp A ST-5725 I/0 port EM Clamp A ST-5726 I/0 port EM Clamp A Note: Blank = Not performed Remarks No any function degraded during the test. Page 31 of 65

33 3.12 Power Frequency Magnetic Field Immunity Reference Standard EN :2010 Test Date Not applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMC Test Instrument BEST PLUS SCHAFFNER SC2697A Induction Coil Package INA 702 SCHAFFNER SC N/A Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Specifications Field Strength: Frequency: 30 A/m 50 Hz, 60 Hz Required Performance Criteria: A Page 32 of 65

34 Test Results The requirements are: MET NOT MET Immersion method Coil orientation Performance Result X - axis Y - axis Z - axis Proximity method Coil orientation Performance Result X - axis Y - axis Z - axis Note: blank = Not performed Remarks Page 33 of 65

35 3.13 Voltage Dips and Short Interrupts Reference Standard EN :2004 Test Date Not applicable Test Location Shielded Room Test Equipment Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Power Quality Test System ProfLine 2103 SCHAFFNER 54350, EK Climate Condition Temperature: Relative Humidity: Atmospheric Pressure: Test Specifications Overshoot/undershoot of the actual voltage: Less than 5 % of U T Voltage rise time and fall time: 1 μs 5 μs Frequency of the test voltage: Within ± 2 % Number of Applications: 3 Interval: 10 s Required Performance Criteria: Test Specification Period 50 Hz 60 Hz Required Performance Criteria 0 % U T 1 B 40 % U T C 70 % U T C 0 % U T C Page 34 of 65

36 Test Results The requirements are: MET NOT MET Test Specification Period 50 Hz 60 Hz Result Comments 0 % U T 1 40 % U T % U T % U T Remarks Page 35 of 65

37 APPENDIX A - Test Setup Photos and Configuration Page 36 of 65

38 Conducted Voltage Emissions of Mains Ports Page 37 of 65

39 Conducted Voltage Emissions of Telecommunication Ports Page 38 of 65

40 Radiated Electric Field Emissions (Below 1 GHz ) Page 39 of 65

41 Radiated Electric Field Emissions (Above 1 GHz ) Page 40 of 65

42 Harmonic Current Emissions and Voltage Fluctuations and Flicker Page 41 of 65

43 Electrostatic Discharge Page 42 of 65

44 Radiated Electric Field Immunity Page 43 of 65

45 Electrical Fast Transients/Bursts Page 44 of 65

46 Surge Transients Page 45 of 65

47 Conducted Disturbance Page 46 of 65

48 Power Frequency Magnetic Field Immunity Page 47 of 65

49 Voltage Dips, Short Interrupts and Voltage Variations Page 48 of 65

50 APPENDIX B EUT Photographs Page 49 of 65

51 Test Configuration Photographs Page 50 of 65

52 NA-9211 Page 51 of 65

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54 Page 53 of 65

55 Page 54 of 65

56 NA-9212 Page 55 of 65

57 Page 56 of 65

58 Page 57 of 65

59 Page 58 of 65

60 ST-5725 Page 59 of 65

61 Page 60 of 65

62 Page 61 of 65

63 ST-5726 Page 62 of 65

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65 Page 64 of 65

66 Page 65 of 65