EN 55022: 2010+AC:2011 Clause 6.1 Pass. Harmonic Current EN :2006+A1:2009+A2:2009 Class A N/A

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2 Reference No.: WT N-S-E Page 2 of 33 1 Test Summary Test Item Mains Terminal Disturbance Voltage, 150KHz to 30MHz Radiation Emission, 30MHz to 1000MHz EMISSION Test Standard Class / Severity Result EN 55022: 2010+AC:2011 Clause 5.1. Pass EN 55022: 2010+AC:2011 Clause 6.1 Pass Harmonic Current EN :2006+A1:2009+A2:2009 Class A N/A Voltage Fluction and Flicker EN :2008 Clause 5 Pass IMMUNITY (EN : 2010) Test Item Test Method Class / Severity 4 kv Contact Electrostatic Discharge(ESD) IEC : kv Air Radiated Immunity (80MHz to 3V/m, 80%, 1kHz, IEC :2010 1GHz) Amp. Mod. (Line to Line) 1.0Kv Electrical Fast Transients (EFT) IEC :2011 (Line to Earth) 2kV 1kV D.M. Surge IEC :2005 2kV C.M. Injected Currents, 0.15MHz to 3Vr.m.s.(emf), 80%, IEC : MHz 1kHz Amp. Mod. Voltage Dips IEC :2004 Voltage interruptions Performance Criteria B A B B A Result Pass Pass Pass Pass Pass 0 % UT* for 0.5per B Pass 70 % UT* for 25per C Pass IEC : % UT* for 250per C Pass Remark: Pass Test item meets the requirement Fail Test item does not meet the requirement N/A Test case does not apply to the test object A.M Amplitude Modulation Differential Mode Common Mode * U T is the nominal supply voltage

3 Reference No.: WT N-S-E Page 3 of 33 2 Contents Page COVER PAGE 1 1 TEST SUMMARY CONTENTS GENERAL INFORMATION GENERAL DESCRIPTION OF E.U.T DETAILS OF E.U.T DESCRIPTION OF SUPPORT UNITS STANDARDS APPLICABLE FOR TESTING TEST FACILITY SUBCONTRACTED ABNORMALITIES FROM STANDARD CONDITIONS EQUIPMENT USED DURING TEST MEASUREMENT UNCERTAINTY EMISSION TEST RESULTS MAINS TERMINALS DISTURBANCE VOLTAGE, 150KHZ TO 30MHZ E.U.T. Operation Block Diagram of Test Setup Measurement Data Mains Terminals Disturbance Voltage Test Data RADIATION EMISSION DATA FOR 30MHZ TO 1000MHZ E.U.T. Operation Block Diagram of Test Setup Measurement Data Radiated Emission test datas,30mhz to 1000MHz HARMONICS CURRENT VOLTAGE FLUCTUATION AND FLICKER E.U.T. Operation Block Diagram of Setup Voltage Fluctuation and Flicker Test Data IMMUNITY TEST RESULTS PERFORMANCE CRITERIA ELECTROSTATIC DISCHARGE(ESD) E.U.T. Operation Block Diagram of Setup Direct Discharge Test Results Indirect Discharge Test Results ELECTRICAL FAST TRANSIENTS(EFT) E.U.T. Operation Block Diagram of Setup Test Results SURGE E.U.T. Operation Block Diagram of Setup Test Results INJECTED CURRENTS IMMUNITY, 0.15MHZ TO 80MHZ E.U.T. Operation Block Diagram of Setup Test Results... 22

4 Reference No.: WT N-S-E Page 4 of VOLTAGE DIPS AND INTERRUPTIONS E.U.T. Operation Block Diagram of Setup Test Results RADIO-FREQUENCY ELECTROMAGNETIC FIELDS, 80MHZ TO 1GHZ E.U.T. Operation Block Diagram of Setup Test Results PHOTOGRAPHS TEST SETUP PHOTOGRAPH MAINS TERMINAL DISTURBANCE VOLTAGE TEST SETUP PHOTOGRAPH RADIATED EMISSION TEST SETUP PHOTOGRAPH VOLTAGE FLUCTUATION AND FLICKER TEST SETUP PHOTOGRAPH ESD IMMUNITY TEST SETUP PHOTOGRAPH EFT&SURGE&VOLTAGE DIPS IMMUNITY TEST SETUP PHOTOGRAPH INJECTED CURRENTS IMMUNITY TEST SETUP PHOTOGRAPH RADIO-FREQUENCY ELECTROMAGNETIC FIELDS TEST SETUP PHOTOGRAPHS CONSTRUCTIONAL DETAILS EUT EXTERNAL VIEW EUT INTERNAL VIEW LABEL VIEW... 33

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6 Reference No.: WT N-S-E Page 6 of Test Facility The test facility has a test site registered with the following organizations: IC Registration No.: 7760A Waltek Services(Shenzhen) Co., Ltd. has been registered and fully described in a report filed with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our files. Registration 7760A, July 12, FCC Registration No.: Waltek Services (Shenzhen) Co., Ltd. has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration , May 26, Subcontracted Whether parts of tests for the product have been subcontracted to other labs: Yes No If Yes, list the related test items and lab information: Test items: Lab information: 3.7 Abnormalities from Standard Conditions None.

7 Reference No.: WT N-S-E Page 7 of 33 4 Equipment Used during Test Conducted Emission Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 Test Receiver ROHDE&SCHWA RZ ESCI Two-Line V-Network ROHDE&SCHWA RZ ENV m Semi-anechoic Chamber for Radiation Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 EMC Analyzer Agilent E7405A MY Trilog Broadband SCHWARZBECK VULB Antenna 3 Broad-band Horn SCHWARZBECK BBHA 9120 D 667 Antenna 4 Broadband Preamplifier SCHWARZBECK BBV m Coaxial Cable with SCHWARZBECK AK 9515 H - N- plug 6 10m 50 Ohm Coaxial SCHWARZBECK AK Cable with N-plug 7 Positioning Controller C&C LAB CC-C-IF - 8 Color Monitor SUNSPO SP-14C - Harmonic/ Flicker Item Equipment Manufacturer Model No. Serial No. Calibration Status Digital Power Em Test AG ADP500 V Analyzer Power Source Em Test AG ACS500 V Electrostatic Discharge Item Equipment Manufacturer Model No. Serial No. Calibration Status Electrostatic Discharge Em Test DITO V Simulator Conducted Immunity Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 RF Generator TESEQ HSG CDN M-Type TESEQ CDN M EM-Clamp TESEQ KEMZ Attenuator 6dB TESEQ ATN

8 Reference No.: WT N-S-E Page 8 of 33 Surge, EFT, Voltage dips and Interruption Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 All Modules SCHAFFNER Generator 2 Capacitive Coupling SCHAFFNER CDN Clamp 3 Signal and Data Line SCHAFFNER CDN Coupling Network 4 AC Power Supply TONGYUN DTDGC-4 - General used equipment Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 Exposure Level Tester Narda Safety TEST ELT400 M-0155 Solutions/2304/03 2 Magnetic Field Probe Narda Safety TEST - M cm 2 Radio-frequency electromagnetic fields Item Equipment Manufacturer Model No. Serial No. Calibration Status 1 Generator ROHDE&SCHWA SMB100A- - RZ B106 2 RF- amplifier B0NN Elektronik BLWA - 3 SMB 100A - Power meter ROHDE&SCHWA RZ 4 Broad-band Horn SCHWARZBECK - Antenna STLP 9128D 4.1 Measurement Uncertainty Test Item Frequency Range Uncertainty Note Conduction disturbance 150kHz~30MHz 3.64dB (1) Radiation 30MHz~1000MHz 5.03dB (1) (1)This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2.

9 Reference No.: WT N-S-E Page 9 of 33 5 Emission Test Results 5.1 Mains Terminals Disturbance Voltage, 150kHz to 30MHz Test Requirement... : EN Test Method... : EN Test Result... : Pass Frequency Range... : 150kHz to 30MHz Class/Severity... : Class B/ Table 2 of EN E.U.T. Operation Operating Environment: Temperature... : 23.6 C Humidity... : 33.4%RH Atmospheric Pressure... : 101.2Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Test Setup The Mains Terminals Disturbance Voltage tests were performed in accordance with the EN Measurement Data The maximised peak emissions from the EUT was scanned and measured for both the Live and Neutral Lines. Quasi-peak & average measurements were performed if peak emissions were within 6dB of the average limit line.

10 Reference No.: WT N-S-E Page 10 of Mains Terminals Disturbance Voltage Test Data Live Line:

11 Reference No.: WT N-S-E Page 11 of 33 Neutral Line:

12 Reference No.: WT N-S-E Page 12 of Radiation Emission Data For 30MHz to 1000MHz Test Requirement... : EN Test Method... : EN Test Result... : Pass Frequency Range... : 30MHz to 1000MHz Class/Severity... : Class B/ Table 6 of EN E.U.T. Operation Operating Environment: Temperature... : 22.9 C Humidity... : 31.8%RH Atmospheric Pressure... : 101.2Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Test Setup The radiated emission tests were performed in the 3m Semi- Anechoic Chamber test site, using the setup accordance with the EN 55022:2010+AC: Measurement Data According to the data in section 5.2.4, the EUT complied with the EN55022 standards.

13 Reference No.: WT N-S-E Page 13 of Radiated Emission test datas,30mhz to 1000MHz Antenna polarization: Vertical Antenna polarization:horizontal

14 Reference No.: WT N-S-E Page 14 of Harmonics Current Test Requirement... : EN Test Method... : EN Test Result... : N/A Class/Severity... : Class A Remark... : There is no need for Harmonics test to be performed on this product (rated power is less than 75W) in accordance with EN (2009). For further details, please refer to Clause 7, Note 1 of EN which states:- For the following categories of equipment limits are not specified in this edition of the standard. Note 1: Equipment with a rated power of 75W or less, other than lighting equipment.

15 Reference No.: WT N-S-E Page 15 of Voltage Fluctuation and Flicker Test Requirement... : EN Test Method... : EN Test Result... : Pass E.U.T. Operation Operating Environment: Temperature... : 24.1 C Humidity... : 32.5%RH Atmospheric Pressure... : 101.6Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Voltage Fluctuation and Flicker test was performed in accordance with the EN

16 Reference No.: WT N-S-E Page 16 of Voltage Fluctuation and Flicker Test Data Report title: Flick Test Company Name: Waltek Date of test: 10:06 17.Oct, 2012 Tester: Star Yu Standard used: EN/IEC Flicker Short time (Pst): 10 min Observation time: 10 min (1 Flicker measurement) Flickermeter: 230V / 50Hz Flicker Impedance: Zref (IEC 60725) E. U. T.: 350DPA Test Result PASS Maximum Flicker results EUT values Limit Result Pst PASS Plt PASS dc [%] PASS dmax [%] PASS dt [s] PASS

17 Reference No.: WT N-S-E Page 17 of 33 6 Immunity Test Results 6.1 Performance Criteria Performance criterion A: The apparatus shall continue to operate as intended during the test. No degradation of performance or loss of function is allowed below a performance level (or permissible loss of performance) specified by the manufacturer, when the apparatus is used as intended. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and from what the user may reasonably expect from the apparatus if used as intended. Performance criterion B: The apparatus shall continue to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level (or permissible loss of performance) specified by the manufacturer, when the apparatus is used as intended. During the test, degradation of performance is allowed, however, no change of actual operating state or stored data is allowed. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and from what the user may reasonably expect from the apparatus if used as intended. Performance criterion C: Temporary loss of function is allowed, provided the function is self-recoverable or can be restored by the operation of the controls, or by any operation specified in the instructions for use. For further details, please refer to EN Electrostatic Discharge(ESD) Test Requirement... : EN Test Method... : IEC Test Result... : Pass Discharge Impedance... : 330 / 150pF Discharge Voltage... : Air Discharge: ±8kV Contact Discharge: ±4kV HCP & VCP: ±4kV Polarity... : Positive & Negative Number of Discharge... : Minimum 50 times at each test point(25 of each polarity) Discharge Mode... : Single Discharge Discharge Period... : 1 second minimum E.U.T. Operation Operating Environment: Temperature... : 22.5 C Humidity... : 32.3%RH Atmospheric Pressure... : 102.1Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously.

18 Reference No.: WT N-S-E Page 18 of Block Diagram of Setup The ESD test was performed in accordance with the IEC

19 Reference No.: WT N-S-E Page 19 of Direct Discharge Test Results Observations : Test points : 1. All Exposed Surface & Seams; 2. All metallic part Applied Voltage (kv) Direct Discharge Performance Criterion Test Results Test Point Contact Discharge Air Discharge ±8 B 1 N/A Pass* ±4 B 2 Pass* N/A Remark: * During the test no deviation was detected to the selected operation mode(s) Indirect Discharge Test Results Observations : Test points : 1. All sides. Applied Voltage (kv) Indirect Discharge Performance Criterion Test Results Test Point Horizontal Coupling Vertical Coupling ±4 B 2 Pass* Pass* Remark: * During the test no deviation was detected to the selected operation mode(s)

20 Reference No.: WT N-S-E Page 20 of Electrical Fast Transients(EFT) Test Requirement... : EN Test Method... : IEC Test Result... : Pass Test Level... : 1.0kV on AC Mains Polarity... : Positive & Negative Repetition Frequency... : 5kHz Burst Duration... : 300ms Test Duration... : 2 minutes per level & polarity E.U.T. Operation Operating Environment: Temperature... : 24.1 C Humidity... : 32.7%RH Atmospheric Pressure... : 102.2Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Electrical Fast Transients Immunity test was performed in accordance with the IEC Test Results Remark: Test Port Test Level(kV) Performance Criterion Result AC Mains 1.0 B Pass* * During the test no deviation was detected to the selected operation mode(s)

21 Reference No.: WT N-S-E Page 21 of Surge Test Requirement... : EN Test Method... : IEC Test Result... : Pass Test level... : 1kV Live to Neutral, Apply 2kV Live to PE and Neutral to PE, Not apply Interval... : 60s between each surge No. of surges... : 5 positive at 90, 5 negative at E.U.T. Operation Operating Environment: Temperature... : 24.2 C Humidity... : 32.8%RH Atmospheric Pressure... : 102.5Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Surge Immunity test was performed in accordance with the IEC Test Results Test Port Applied Voltage (kv) Performance criterion Result Between Phase And Phase: 1 B N/A Between Live And Neutral: 1 B Pass* Between Live And Earth: 2 B N/A Between Neutral And Earth: 2 B N/A Remark: * During the test no deviation was detected to the selected operation mode(s)

22 Reference No.: WT N-S-E Page 22 of Injected Currents Immunity, 0.15MHz to 80MHz Test Requirement... : EN Test Method... : IEC Test Result... : Pass Frequency Range... : 0.15MHz to 80MHz Test level... : 3V r.m.s. (unmodulated emf into 150 ) Modulation... : 80%, 1kHz Amplitude Modulation E.U.T. Operation Operating Environment: Temperature... : 23.5 C Humidity... : 32.6%RH Atmospheric Pressure... : 103.1Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Injected Currents Immunity test was performed in accordance with the IEC Test Results Frequency Line Test Level Modulation Step Size Dwell Time Performance Criterion Result 0.15MHz to 230MHz Remark: AC Mains 3Vr.m.s. 80%, 1kHz Amp. Mod. 1% 1s A Pass* * During the test no deviation was detected to the selected operation mode(s)

23 Reference No.: WT N-S-E Page 23 of Voltage Dips and Interruptions Test Requirement... EN Test Method... IEC Test Result... Test Level(Voltage reduction) No. of Dips / Interruptions E.U.T. Operation Operating Environment: Temperature... Humidity... Barometric Pressure... EUT Operation: Input Voltage... Operating Mode... Pass 0% & 70% & 0 % of U T (Supply Voltage) 1 per Level at 20ms intervals 24.2 C 33.4%RH 102.9Kbar 230V AC/50Hz Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Voltage Dips and Interruptions Immunity test was performed in accordance with the IEC

24 Reference No.: WT N-S-E Page 24 of Test Results Test Level in%u T Performance criterion Voltage Dips 50Hz 60Hz Duration Result Duration Result 0 B 0.5 Pass* 0.5 N/A 70 C 25 Pass* 30 N/A Test Level in%u T Performance criterion Interruptions 50Hz 60Hz Duration Result Duration Result 0 C 250 Pass* 12 N/A Remark: * During the test no deviation was detected to the selected operation mode(s)

25 Reference No.: WT N-S-E Page 25 of Radio-frequency electromagnetic fields, 80MHz to 1GHz Test Requirement... : EN Test Method... : IEC Test Result... : Pass Frequency Range... : 80MHz to 1GHz Test level... : 3V/m Modulation... : 80%, 1kHz Amplitude Modulation. Face of EUT... : Front, Back, Left, Right Antenna polarisation... : Horizontal& Vertical E.U.T. Operation Operating Environment: Temperature... : 23.2 C Humidity... : 33.7% RH Barometric Pressure... : 102.8Kbar EUT Operation: Input Voltage... : 230V AC/50Hz Operating Mode... : Printing continuously mode and caculating mode were performed simultaneously Block Diagram of Setup The Radio-frequency electromagnetic fields Immunity test was performed in accordance with the IEC

26 Reference No.: WT N-S-E Page 26 of Test Results Frequency 80 to 1000MHz 80 to 1000MHz Face of EUT Front, Back, Left, Right Front, Back, Left, Right Antenna polarisation Test Level Step Size Dwell Time Performance Criterion Result Horizontal 3V/m 1% 1s A Pass* Vertical 3V/m 1% 1s A Pass* Remark: * During the test no deviation was detected to the selected operation mode(s)

27 Reference No.: WT N-S-E Page 27 of 33 7 Photographs Test Setup 7.1 Photograph Mains Terminal Disturbance Voltage Test Setup 7.2 Photograph Radiated Emission Test Setup

28 Reference No.: WT N-S-E Page 28 of Photograph Voltage Fluctuation and Flicker Test Setup 7.4 Photograph ESD Immunity Test Setup

29 Reference No.: WT N-S-E Page 29 of Photograph EFT&Surge&Voltage Dips Immunity Test Setup 7.6 Photograph Injected Currents Immunity Test Setup

30 Reference No.: WT N-S-E Page 30 of Photograph Radio-frequency electromagnetic fields Test Setup

31 Reference No.: WT N-S-E Page 31 of 33 8 Photographs Constructional Details 8.1 EUT External View

32 Reference No.: WT N-S-E Page 32 of EUT Internal View

33 Reference No.: WT N-S-E Page 33 of Label View End of Report------