TEST SUMMARY. Prüfbericht - Nr.: Test Report No.: HARMONIC CURRENT EMISSIONS ON AC MAINS RESULT: Pass

Transcription

1

2

3 Seite 2 von 35 Page 2 of 35 TEST SUMMARY HARMONIC CURRENT EMISSIONS ON AC MAINS RESULT: Pass VOLTAGE FLUCTUATIONS ON AC MAINS RESULT: Pass CONDUCTED DISTURBANCE AT THE MAINS PORTS RESULT: Pass CONDUCTED COMMON MODE (ASYMMETRIC MODE) DISTURBANCE AT TELECOMMUNICATION PORTS RESULT: N/A RADIATED DISTURBANCE RESULT: Pass POWER-FREQUENCY MAGNETIC FIELD RESULT: Pass RADIO-FREQUENCY ELECTROMAGNETIC FIELD SUSCEPTIBILITY (RS) RESULT: Pass RADIO-FREQUENCY COMMON MODE / CONDUCTED SUSCEPTIBILITY (CS) RESULT: Pass ELECTRICAL FAST TRANSIENTS (EFT) RESULT: Pass SURGES RESULT: Pass ELECTROSTATIC DISCHARGES (ESD) RESULT: Pass VOLTAGE DIPS AND INTERRUPTIONS RESULT: Pass

4 Seite 3 von 35 Page 3 of 35 Contents 1. GENERAL REMARKS COMPLEMENTARY MATERIALS TEST SITES TEST FACILITIES LIST OF TEST AND MEASUREMENT INSTRUMENTS GENERAL PRODUCT INFORMATION PRODUCT FUNCTION AND INTENDED USE RATINGS AND SYSTEM DETAILS INDEPENDENT OPERATION MODES NOISE GENERATING AND NOISE SUPPRESSING PARTS SUBMITTED DOCUMENTS TEST SET-UP AND OPERATION MODES PRINCIPLE OF CONFIGURATION SELECTION TEST OPERATION AND TEST SOFTWARE SPECIAL ACCESSORIES AND AUXILIARY EQUIPMENT COUNTERMEASURES TO ACHIEVE EMC COMPLIANCE TEST RESULTS OF EMISSION EMISSION IN THE FREQUENCY RANGE UP TO 30 MHZ Harmonic Current Emissions on AC Mains Voltage Fluctuations on AC Mains Conducted disturbance at the mains ports Conducted common mode (asymmetric mode) disturbance at telecommunication ports EMISSION IN THE FREQUENCY RANGE ABOVE 30 MHZ Radiated Disturbance TEST RESULTS OF IMMUNITY THE APPLICABILITY OF IMMUNITY TESTS CONTINUOUS DISTURBANCES Power-frequency Magnetic Field Radio-frequency Electromagnetic Field Susceptibility (RS) Radio-frequency Common Mode / Conducted Susceptibility (CS) TRANSIENT DISTURBANCES Electrical Fast Transients (EFT) Surges... 29

5 Seite 4 von 35 Page 4 of Electrostatic Discharges (ESD) POWER SUPPLY ALTERATIONS Voltage Dips and Interruptions LIST OF TABLES LIST OF PHOTOGRAPHS... 35

6 Seite 5 von 35 Page 5 of General Remarks When the basic standards have been applied in this test report, the latest amendments have always been included. 1.1 Complementary Materials All attachments are integral parts of this test report. This applies especially to the following appendix: Appendix 1: Test Result 2. Test Sites 2.1 Test Facilities 1) Keyway Testing Technology Co., Ltd. Baishun Industrial Zone, Zhangmutou Town, Dongguan, Guangdong , P.R. China. 2) STC (Dongguan) Company Limited No.68 Fumin South Road, Dalang, Dongguan, Guangdong , P.R.China The tests at these test sites have been conducted under the supervision of a TÜV Rheinland engineer.

7 Seite 6 von 35 Page 6 of List of Test and Measurement Instruments Table 1: List of Testing and Measurement Equipment Test Equipment Manufacturer Model Serial No. Cal Until Keyway Testing Technology Co., Ltd. Conducted emission EMI Test Receiver Rohde&Schwarz ESCI May. 9,2014 Artificial Mains Network Artificial Mains Network (AUX) Rohde&Schwarz ENV May. 9,2014 Rohde&Schwarz ENV May. 9,2014 RF Cable FUJIKURA 3D-2W 944 Cable May. 9,2014 Radiated electromagnetic disturbances EMI Test Receiver Rohde&Schwarz ESCI May. 9,2014 Triple-loop Antenna EVERFINE LLA May. 24,2014 Disturbance power EMI Test Receiver Rohde&Schwarz ESCI May. 9,2014 Absorbing Clamp Luthi MDS May. 12,2014 Clamp Attenuation HUBER+SUHNER CBL2-NB-9m May. 12,2014 Radiated emission test (below 1GHz) EMI Test Receiver Rohde&Schwarz ESCI May. 9,2014 Bilog Antenna ETS-LINDGREN 3142D May 20,2014 Spectrum Analyzer Agilent 8593E 3911A04271 May. 9,2014 3m Semi-anechoic Chamber ETS-LINDGREN 966 KW01 May. 9,2014 Signal Amplifier SONOMA May. 9,2014 RF Cable IMRO IMRO Cable 1# May. 9,2014 MULTI-DEVICE Controller ETS-LINDGREN N/A Antenna Holder ETS-LINDGREN 2070B N/A Radiated emission test (Above 1GHz) EMI Test Receiver Rohde&Schwarz ESCI May. 9,2014 Horn Antenna DAZE ZN May. 11,2014

8 Seite 7 von 35 Page 7 of 35 Test Equipment Manufacturer Model Serial No. Cal Until Spectrum Analyzer Agilent 8593E 3911A04271 May. 9,2014 3m Semi-anechoic Chamber ETS-LINDGREN 966 KW01 May. 9,2014 Signal Amplifier DAZE ZN3380C May. 9,2014 RF Cable IMRO IMRO Cable 1# May. 9,2014 MULTI-DEVICE Controller ETS-LINDGREN N/A Antenna Holder ETS-LINDGREN 2070B N/A Harmonic current emissions and voltage fluctuations/flicker 5kVA AC Power Source Harmonic/Flicker Test System California Instruments California Instruments Electrostatic discharge immunity 5001Ix+CTS May. 9,2014 PACS May. 9,2014 ESD Generator TESEQ NSG May. 10,2014 Electrical fast transient/burst immunity EFT Tester EMtest EFT500N5 V May. 9,2014 EFT Coupling Clamp Surge immunity EMtest HFK May. 9,2014 Surge Tester EMtest UCS500N7 V May. 24,2014 Injected currents susceptibility(cs) C/S Test System FRANKONIA CIT-10/75 126B1164 May. 9,2014 CDN Luthi L-801 M2/M May. 9,2014 Electromagnetic Injection Clamp Luthi EM May. 9,2014 Power frequency magnetic field immunity Magnetic Field Tester EVERFINE EMS K YG100376N May. 9,2014 Voltage dips and short interruptions immunity Dips Tester EVERFINE EMS K YG100319N May. 9,2014 STC (Dongguan) Company Limited Radio frequency electromagnetic field immunity (RS) Biconilog Antenna ETS 3142C Nov.28,2014

9 Seite 8 von 35 Page 8 of 35 Test Equipment Manufacturer Model Serial No. Cal Until Amplifier BONN BLWA0840- ELEKTRONIK 50/30D B Nov.28,2014 Amplifier BONN BLWA0840- ELEKTRONIK 50/100D A Nov.28,2014 Signal Generator Rohde & Schwarz SML Nov.28,2014 Signal Generator Rohde & Schwarz SMB100A K DF Nov.28,2014 Power Meter Rohde & Schwarz NRVD Nov.28,2014 : Not Used : Used

10 Seite 9 von 35 Page 9 of General Product Information The equipment under test PH3.75MM( ), PH4MM( ), PH4.615MM ( ), PH 4.8MM ( ), PH5MM ( )and PH6MM( ) are LED Displays. Since the EUTs are used to display text or graphics from personal computers or similar devices, it belongs to Information Technology Equipment (ITE). Since the EUTs satisfy the Class A of ITE limits but not the Class B of ITE limits, the EUTs belong to Class A ITE. The six models are electronically and electrically identical except that the gap between neighbouring pixels is different. And this kind of difference has no obvious impact on EMC characteristics of the EUTs. According to above information, all applicable test items have been performed on representative model PH3.75MM( ). For class A ITEs, following warning message has been included in the instruction for use: This is a class A product. In a domestic environment this product may cause radio interference in which case the user may be required to take adequate measures. 3.1 Product Function and Intended Use Refer to the Technical Documentation and user manual. 3.2 Ratings and System Details Type designation: Rating: Ports: Cable type: Protection Class: PH3.75MM( ), PH4MM( ), PH4.615MM ( ), PH 4.8MM ( ), PH5MM ( ), PH6MM( ) AC V, 50/60Hz, 300W AC mains, signal in(rj45) Unshielded I Refer to Technical Documentation for further information.

11 Seite 10 von 35 Page 10 of Independent Operation Modes The basic operation modes are: A. On-MAX the EUT under the control of software is operating with the highest brightness and the highest grey scale, and the EUT s all LED lamps are being ignited. Refer to user manual for further information. 3.4 Noise Generating and Noise Suppressing Parts Refer to Technical Documentation. 3.5 Submitted Documents Declaration of differences Construction drawing Circuit diagram PCB layouts List of key components Label User manual

12 Seite 11 von 35 Page 11 of Test Set-up and Operation Modes 4.1 Principle of Configuration Selection Emission: The equipment under test (EUT) was configured to measure its highest possible radiation level. The test modes were adapted accordingly in reference to the instructions for use. Immunity: The equipment under test (EUT) was configured to have its highest possible susceptibility against the tested phenomena. The test modes were adapted accordingly in reference to the instructions for use. 4.2 Test Operation and Test Software Refer to test set-up in chapter 5 and chapter Special Accessories and Auxiliary Equipment Accessory Model name Manufacturer S/N Cal. until PC DCNE1F DELL Monitor V193WV acer Mouse (USB) MS111-L DELL Keyboard (USB) KB212-B DELL Countermeasures to achieve EMC Compliance No additional countermeasures to the submitted test sample(s) were employed to achieve compliance.

13 Seite 12 von 35 Page 12 of Test Results of EMISSION 5.1 Emission in the Frequency Range up to 30 MHz Harmonic Current Emissions on AC Mains RESULT: Pass Test Specification Basic Standard(s) : EN :2006+A1+A2 Measurement Equipment requirement : IEC :2002+A1 Measured Harmonics : 1-40 Equipment Class : A Limits : Clause 7.1, Table 1 Test Set-up Date of testing : 23 Nov.2013 Input Voltage : AC230V, 50Hz Operational Mode : On-MAX Test observation period : 2.5min Temperature : 24.9 C Humidity : 56% Air pressure : kPA

14 Seite 13 von 35 Page 13 of 35 Photograph 1: Test Set-up for Harmonic Current Emissions Test Result For the measurement records, refer to the appendix 1

15 Seite 14 von 35 Page 14 of Voltage Fluctuations on AC Mains RESULT: Pass Test Specification Basic Standard(s) : EN :2008 Measurement Equipment requirement : IEC Limits : Clause 5 Test Set-up Date of testing : 23 Nov.2013 Input Voltage : AC230V, 50Hz Operational Mode : On-MAX Test observation period : 10 min Temperature : 24.9 C Humidity : 55% Air pressure : kPA

16 Seite 15 von 35 Page 15 of 35 Photograph 2: Test Set-up for Voltage Changes, Voltage Fluctuations and Flicker Table 2: Voltage Fluctuations and Flicker on AC Mains Parameters P lt P st d c [%] d max [%] d(t) [ms] Limits Reading N/A

17 Seite 16 von 35 Page 16 of Conducted disturbance at the mains ports RESULT: Pass Test Specification Basic Standard(s) : EN 55022:2010, Class A Ports : AC Mains Frequency range : 150kHz-30MHz Test site : Shielded Room Limits : Clause 5.1, Table 1 Test Set-up Date of testing : 23 Nov.2013 Input Voltage : AC230V, 50Hz Operational Mode : On-MAX Test configuration : Tabletop Temperature : 24.8 C Humidity : 55% Air pressure : 101kPA

18 Seite 17 von 35 Page 17 of 35 Photograph 3: Test Set-up for Conducted disturbance at the mains ports Test Result Measurement uncertainty: 2.6 db(k=2, σ=95%) If the result of the measurement with the Quasi Peak detector is below the Average limit, the measurement with Average Detector will be omitted. Disturbances other than those mentioned are small or not detectable. For the measurement records, refer to the appendix 1.

19 Seite 18 von 35 Page 18 of Conducted common mode (asymmetric mode) disturbance at telecommunication ports RESULT: N/A Test Specification Basic Standard(s) : EN 55022:2010, Class A Ports : Telecommunication ports(rj45) Frequency range : 150kHz-30MHz Test site : Shielded Room Limits : Clause 5.2, table 3 The EUT s signal in/out ports are only used for signal transmission from Personal computers to the EUT. Therefore, it does not fulfill the definition of telecommunication ports in EN 55022:2010 and this test item is not applicable for the EUT.

20 Seite 19 von 35 Page 19 of Emission in the Frequency Range above 30 MHz Radiated Disturbance RESULT: Pass Test Specification Basic Standard : EN 55022:2010, Class A Ports : Enclsoure Frequency range : 30MHz-1GHz* Test site : SAC Limits : Clause 6.1, Table 5 Test Set-up Date of testing : 23.Nov.2013 Input Voltage : AC230V, 50Hz Operational Mode : On-MAX Test configuration : Tabletop Temperature : 25.3 C Humidity : 58% Air pressure : kPA Note: *) the highest frequency of the internal sources of the EUT is less than 108 MHz, the measurement shall only be made up to 1 GHz

21 Seite 20 von 35 Page 20 of 35 Photograph 4: Test Set-up for Radiated Disturbance Test Result Measurement uncertainty: 3.6 db (k=2, σ=95%) Measurements are made at closer distance, down to 3 m. An inverse proportionality factor of 20dB per decade is used to normalize the limits to the specified distance for determining compliance. Disturbances other than those mentioned are small or not detectable. For the measurement records, refer to the appendix 1.

22 Seite 21 von 35 Page 21 of Test Results of IMMUNITY 6.1 The applicability of immunity tests According to EN 55024:2010, the EUT shall fulfill the requirement of: Power-frequency Magnetic Field Radio-frequency electromagnetic field Amplitude modulated Criterion A Criterion A Radio-frequency Common Mode / Conducted Susceptibility (CS) Criterion A Electrical Fast Transients (EFT) Criterion B Surges Criterion B* Electrostatic Discharge (ESD) Criterion B Voltage Dips and Interruptions Criterion C** Notes: *) Criterion B is applicable for input a.c. power ports, while criterion C is applicable for signal ports and telecommunication ports. **)Criterion C is applicable for 30% reduction in voltage dips and more than 95% reduction in voltage interruptions, while criterion B is applicable for more than 95% reduction in voltage dips.

23 Seite 22 von 35 Page 22 of Continuous Disturbances Power-frequency Magnetic Field RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Characteristics of the test generator : Output current range for continuous : 1 A to 100 A, divided by the coil factor mode operation Output current range for short duration : 300 A to 1000 A, divided by the coil factor mode operation Total distortion factor of the output : Less than 8% current Set time for short duration mode : 1 s to 3 s operation Frequency : 50Hz or 60Hz Magnetic field strength : 1 A/m Performance criterion : A The EUT does not contain devices susceptible to magnetic fields, such as CRT monitors, Hall elements, electrodynamic microphones, magnetic field sensors, etc. Therefore, this test is deemed to pass without further testing.

24 Seite 23 von 35 Page 23 of Radio-frequency Electromagnetic Field Susceptibility (RS) RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Test level : 3V/m Frequency range : 80MHz-1000MHz Modulation : 1kHz sine-wave, 80% AM Sweep mode : Automatic Sweep Step : 1% Dwell Time : 0.5Sec Performance criterion : A Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Ports : Enclosure Temperature : 24.5 C Humidity : 53% Air pressure : kPA

25 Seite 24 von 35 Page 24 of 35 Photograph 5: Test set-up for Radio-frequency electromagnetic field susceptibility Test Result Table 3: Immunity against Radio-frequency Electromagnetic Field Susceptibility (RS) field polarization horizontal vertical side of EUT strength result remarks left right front rear MHz, 3V/m (unmodulated, r.m.s) Passed see *) below *) Remark: No degradation was found

26 Seite 25 von 35 Page 25 of Radio-frequency Common Mode / Conducted Susceptibility (CS) RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Characteristics of the test generator : Output impedance 50 Ω Harmonics and distortion Any spurious spectral line at least 15 db below the carrier level Amplitude modulation 80 % ± 5 % in depth, 1 khz ± 10 % sine wave Coupling and decoupling devices : Coupling decoupling network Zce = 150 Ω Current clamp EM clamp Direct injection device 100 Ω impedence Frequency bandwidth : 150 khz to 80MHz Frequency step : 1% with 1 s dwell time Performance criterion : A Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Ports : Signal ports and input a.c. power ports Signal lines and control lines : 3V (rms) Input and output dc power ports : 3V (rms) Input and output ac power ports : 3V (rms) Temperature : 24.5 C Humidity : 53% Air pressure : kPA

27 Seite 26 von 35 Page 26 of 35 Photograph 6: Test Set-up for Radio-frequency Common Mode / Conducted Susceptibility (CS) Table 4: Immunity against Radio-frequency Common Mode / Conducted Susceptibility (CS) Coupling point Application Level (V(r.m.s)) Remark Power ports AC power port CDN-M3 3 Applied, *) 3 Applied, *) DC power port N/A 3 N/A 3 N/A Signal lines Signal in (RJ45) EM clamp 3 Applied, *) Current Clamp 3 N/A N/A Control lines Current Clamp 3 N/A EM clamp 3 N/A *) Remark: No degradation was found.

28 Seite 27 von 35 Page 27 of Transient Disturbances Electrical Fast Transients (EFT) RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Wave shape of the pulse in 50 Ω load : Rise time 5 ns ± 30 % Duration 50 ns ± 30 % Wave shape into 1 kω load : Rise time 5 ns ± 30 % Duration 50 ns with a tolerance of -15 ns to ns Burst duration : 15 ms ± 20 % at 5 khz Burst period : 300 ms ± 20 % Repetition frequency : 5 khz Polarity : Positive and negative Time of application : 2 minutes Performance criterion : B Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Signal lines and control lines : 0.5kV Input and output dc power ports : 0.5kV Input and output ac power ports : 1kV Temperature : 24.8 C Humidity : 55% Air pressure : kPA

29 Seite 28 von 35 Page 28 of 35 Photograph 7: Test Set-up for Electrical Fast Transients (EFT) Table 5: Immunity against Electrical Fast Transients (EFT) Coupling point Application Level (kv) Polarity Remark Power ports AC power port Coupling 1 + Applied, *) network 1 - Applied, *) DC power port Capacitive N/A Coupling clamp N/A Signal lines Signal in (RJ45) Capacitive Coupling clamp 0.5 +/- Applied, *) Control lines Coupling clamp N/A N/A *) Remark: No degradation was found

30 Seite 29 von 35 Page 29 of Surges RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Definitions of the waveform parameters : Front time 1.2 µs ± 30 %/ 10 µs ± 30 % Time to half value 50 µs ± 20 %/ 700 µs ± 20 % Relationship between peak open-circuit voltage and peak short-circuit current : Open-circuit peak voltage ± 10 % Short-circuit peak current ± 10 % 0.5 kv 1.0 kv 2.0 kv 4.0 kv Source impedance : Power line symmetrical Power line unsymmetrical Polarity : Positive and negative Number of surges / polarity /phase angle : 5 Phase angles : 0, 90, 180, 270 Repetition frequency : 60 s Performance criterion : B or C Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Temperature : 24.8 C Humidity : 55% Air pressure : kPA 0.25 ka 0.5 ka 1.0 ka 2.0 ka 2 Ω + 18 µf 12 Ω + 9 µf

31 Seite 30 von 35 Page 30 of 35 Photograph 8: Test Set-up for Surge Table 6: Surge Immunity Tests Coupling point Application Level (kv) Polarity Remark AC power port Line-to-earth 0.5, 1, 2 +/- Applied, *) Line-to-line 0.5, 1 +/- Applied, *) Signal port Signal in 0.5, 1 +/- Applied, *) (RJ45) DC power port Line-to-earth 0.5 +/- N/A Line-to-line 0.5 +/- N/A *) Remark: No degradation was found.

32 Seite 31 von 35 Page 31 of Electrostatic Discharges (ESD) RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Discharge impedance : 330 Ω / 150 pf Number of discharges : 10 Type of discharge : Direct discharge Air discharge, ±8kV Contact discharge, ±4kV Indirect discharge Contact discharge, ±4kV Polarity Discharge location Performance criterion Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Temperature : 24.8 C Humidity : 55% Air pressure : 101kPA : Positive and negative : See photo documentation of the test set-up All external locations accessible by hand Horizontal coupling plate (HCP) Vertical coupling plate (VCP) : B

33 Seite 32 von 35 Page 32 of 35 Photograph 9: Test Set-up for Electrostatic Discharge (ESD) Contact Discharge ±4kV Air Discharge ±8kV Test Result Table 7: Electrostatic Discharge Direct discharges Air discharges Air discharge Polarity Remark Discharge location voltage (kv) Refer to Photograph of ESD setup 8 +/- Applied, *) LED Screen, RJ45 port, slots 8 +/- Applied, *) Contact discharges Discharge location Contact discharge voltage Polarity Remark (kv) Refer to Photograph of ESD setup 4 +/- Applied, *) Screw, Metal Rod 4 +/- Applied, *) Indirect discharges Contact discharges Discharge location Contact discharge voltage (kv) Polarity Remark HCP 4 +/- Applied, *) VCP 4 +/- Applied, *) *) Remark: No degradation was found.

34 Seite 33 von 35 Page 33 of Power Supply Alterations Voltage Dips and Interruptions RESULT: Pass Test Specification Family standard : EN 55024:2010 Basic standard : IEC Test voltage generator characteristics for interruptions : Rise time Between 1 µs and 5 µs Fall time Between 1 µs and 5 µs Output impedance of the test voltage generator : <(0.4 + j 0.25 Ω) Phase angle : 0 Nominal mains voltage (Ut) : AC230V Rated frequency : 50/60Hz Test level : Test level in % Ut Duration (in periods) Number of interruptions : 3 Number of voltage dips : 3 Interval : >10s Performance criterion : C or B Test Setup Date of testing : 24.Nov.2013 Input voltage : AC230V, 50Hz Operation mode : On-MAX Temperature : 24.8 C Humidity : 55% Air pressure : kPA

35 Seite 34 von 35 Page 34 of 35 Photograph 10: Test Set-up for Voltage Dips and Interruptions Table 8: Voltage Dip and Interruptions Immunity Interruptions Test Duration Number of Result Level(%Ut) (in periods) interruptions Applied, *) Voltage Dips Test Duration Number of Result Level(%Ut) (in periods) Voltage Dips Applied, **) Applied, **) *) Remark: During the test, the EUT was shut down. And the EUT recovered automatically after the test. **) Remark: No degradation was found.

36 Seite 35 von 35 Page 35 of List of Tables Table 1: List of Testing and Measurement Equipment... 6 Table 2: Voltage Fluctuations and Flicker on AC Mains Table 3: Immunity against Radio-frequency Electromagnetic Field Susceptibility (RS) Table 4: Immunity against Radio-frequency Common Mode / Conducted Susceptibility (CS) Table 5: Immunity against Electrical Fast Transients (EFT) Table 6: Surge Immunity Tests Table 7: Electrostatic Discharge Table 8: Voltage Dip and Interruptions Immunity List of Photographs Photograph 1: Test Set-up for Harmonic Current Emissions Photograph 2: Test Set-up for Voltage Changes, Voltage Fluctuations and Flicker Photograph 3: Test Set-up for Conducted disturbance at the mains ports Photograph 4: Test Set-up for Radiated Disturbance Photograph 5: Test set-up for Radio-frequency electromagnetic field susceptibility Photograph 6: Test Set-up for Radio-frequency Common Mode / Conducted Susceptibility (CS) Photograph 7: Test Set-up for Electrical Fast Transients (EFT) Photograph 8: Test Set-up for Surge Photograph 9: Test Set-up for Electrostatic Discharge (ESD) Photograph 10: Test Set-up for Voltage Dips and Interruptions... 34

37 Appendix 1 Test Report No. Seite 1 von 6 Page 1 of 6

38 Appendix 1 Test Report No. Seite 2 von 6 Page 2 of 6

39 Appendix 1 Test Report No. Seite 3 von 6 Page 3 of 6

40 Appendix 1 Test Report No. Seite 4 von 6 Page 4 of 6

41 Appendix 1 Test Report No. Seite 5 von 6 Page 5 of 6

42 Appendix 1 Test Report No. Seite 6 von 6 Page 6 of 6