Revision History of Report

Transcription

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2 Revision History of Report Rev. Revisions Effect page Reviewed by Date - Initial issue All J. S. Yoon March 7, 2014 A1 Administrative change P1 and P5 J. S. Yoon March 20, 2015 (Revision A1) This amendment test report Ref. No. SKT-ECE A1 was revised from the original test report Ref. No. SKT-ECE without tests by the applicant's requests. The variant model PSDV220571B was additionally listed on the page 5. The applicant declared that the variant model is electrically identical to the tested sample except for the type of the output connector. Report No.: SKT-ECE A1 Page 2 of 46

3 TABLE OF CONTENTS 1 Summary of test results Description of equipment under test (EUT) Test and measurement conditions Operating modes Description of support units (accessory equipment) Interconnection and I/O cables Test configuration (arrangement of EUT) Test date and environmental conditions Facilities and accreditations Facilities Accreditations List of test and measurement instruments Measurement uncertainty Technical requirements Emission limits General performance criteria description EMISSION TEST Conducted disturbance test at AC mains terminals Conducted disturbance test at load/control terminals Radiated disturbance test (9 khz to 30 MHz) Radiated disturbance test (30 MHz to 300 MHz) Harmonic current emission test Voltage fluctuations and flicker test IMMUNITY TEST Electrostatic discharge immunity test (ESD) Radiated, radio-frequency, electromagnetic field immunity test (RS) Electrical fast transient/burst immunity test (EFT/Burst) Surge immunity test Immunity to conducted disturbances, induced by radio-frequency fields (CS) Power frequency magnetic field immunity test Voltage dips and short interruptions immunity test Photographs of the test set-up Photographs of EUT...44 Report No.: SKT-ECE A1 Page 3 of 46

4 1 Summary of test results Please refer to the specific reference standards (identified by date of publication and/or edition number or version number) on the cover page (P1). The cited version applied, unless otherwise specified in this test report. EMISSION Standard Test Result Remarks EN Insertion loss (150 khz khz) Disturbance voltage at mains terminals PASS Meets the requirements Disturbance voltage at load/control terminals Radiated disturbances (9 khz to 30 MHz) PASS Meets the requirements Radiated disturbances (30 MHz to 300 MHz) PASS Meets the requirements EN Harmonic current emissions PASS Meets class C limits. EN Voltage fluctuations & flicker PASS Meets the requirements IMMUNITY [EN 61547] Standard Test Test parameters and severity levels Result EN Electrostatic discharge (ESD) ±4 kv Contact discharges PASS ±8 kv Air discharges PASS 3 V/m EN Radiated immunity (RS) 80 MHz to 1000 MHz PASS AM 80 %, 1 khz, sinusoidal ±1 kv: AC power ports PASS EN EFT/Burst ±0.5 kv: DC power ports N/A ±0.5 kv: signal/control lines N/A Surge immunity EN Self-ballasted lamps and semi-luminaires ±0.5 kv: (L-L), ±1.0 kv: (L-G) N/A Luminaires and independent auxiliaries ( 25 W) ±0.5 kv: (L-L), ±1.0 kv: (L-G) N/A Luminaires and independent auxiliaries (> 25 W) ±1.0 kv: (L-L), ±2.0 kv: (L-G) PASS EN Injected current (CS) 150 khz to 80 MHz AM 80 %, 1 khz, sinusoidal 3 V: AC power input and output ports PASS 3 V: DC power input and output ports N/A 3 V: signal/control lines N/A EN Power frequency magnetic field 3 A/m 50/60 Hz PASS EN Voltage dips and voltage short interruptions 30 % reduction, 10 periods PASS 100 % reduction, 0.5 periods PASS N/A N/A Report No.: SKT-ECE A1 Page 4 of 46

5 2 Description of equipment under test (EUT) Product: LED CONVERTER Model: PSDV220571A Serial number: None (prototype) Model differences: Model name Difference Tested (checked) PSDV220571A Original (basic model that was fully tested) ILW220N571N1 Listed by the applicant's request without tests; identical to the tested sample and added only for the marketing purpose PSDV220571B Listed by the applicant's request without tests; identical to the tested sample except for the type of output connector Note: 1) All the differences were compared with the basic model. Technical data: Rated voltage Rated frequency Rated power consumption Rated output voltage Rated output current Light regulation Voltage during the Test Frequency during the Test AC power input cord type AC 110 V to 240 V 50/60 Hz 26 W DC 34 V 0.57 A none AC 230 V 50 Hz 2 terminals without the earth ground I/O port Type Q'ty Remark AC input terminal block (2-wire) 1 DC output terminal block (2-wire) 1 (Note) Note: The applicant declared that the cable length of the DC output (load) terminals to be connected to the lamp(s) was fixed to 0.3 meter, and the tests were performed to the test sample that was provided by the applicant. Modification of EUT during the compliance testing: none Report No.: SKT-ECE A1 Page 5 of 46

6 3 Test and measurement conditions 3.1. Operating modes Operating modes of the sample: No. Description 1 Normal operating mode Operating modes used for the Test: No. Operating mode Normal operating mode 1 The test sample was operated as the applicant's instruction including the load conditions Description of support units (accessory equipment) The following support units or accessories were used to form a representative test configuration during the tests. # Equipment Manufacturer Model No. Serial No. 1 Digital LUX Meter INS DX Interconnection and I/O cables The following support units or accessories were used to form a representative test configuration during the tests. Start End Cable length shielded # Name I/O port Name I/O port (m) (Y/N) 1 EUT AC input AC Mains AC Mains 1.2 N 2 EUT DC output (load) LED Lamp N Note: 1) All the equipment/cables were placed in the worst-case configuration to maximize the emission during the test. 2) Grounding was established in accordance with the manufacturer s requirements and conditions for the intended use. Report No.: SKT-ECE A1 Page 6 of 46

7 3.4. Test configuration (arrangement of EUT) The drawing of the test configuration was shown below, and the photographs of the test setup were attached. AC Mains EUT LED Lamp Digital LUX Meter 3.5. Test date and environmental conditions Test suites Test date Ambient temperature (ºC) Relative humidity (%) Atmospheric pressure (kpa) (YYYY.MM.DD) EMISSION Insertion loss (150 khz khz) N/A Disturbance voltage at mains terminals Disturbance voltage at load/control terminal N/A Radiated disturbances (9 khz to 30 MHz) Radiated disturbances (30 MHz to 300 MHz) Harmonic current emissions Voltage fluctuations & flicker IMMUNITY Electrostatic discharge (ESD) Radiated immunity (RS) EFT / Burst immunity Surge immunity Injected currents (CS) Power frequency magnetic field Voltage dips and voltage interruptions Report No.: SKT-ECE A1 Page 7 of 46

8 4 Facilities and accreditations 4.1. Facilities All of the measurements described in this report were performed at SK Tech Co., Ltd Site I: 820-2, Wolmoon-ri, Wabu-up, Namyangju-si, Kyunggi-do, Korea Site II: 688-8, Wolmoon-ri, Wabu-up, Namyangju-si, Kyunggi-do, Korea The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR The sites comply with the Normalized Site Attenuation requirements given in ANSI C63.4, and site VSWR requirements specified in CISPR The measuring apparatus and ancillary equipment conform to CISPR 16-1 series Accreditations Our testing laboratory is accredited by the following accreditation bodies in accordance with ISO/IEC Korea Germany KOLAS No.191 DAkkS D-PL The laboratory has been also notified to FCC by RRA as a Conformity Assessment Body, and designated to perform compliance testing on equipment subject to Declaration of Conformity (DOC) and Certification under Parts 15 and 18 of the FCC Rules. Designation No. KR List of test and measurement instruments Description Model Manufacturer Serial No. Cal. due Use Conducted emission EMI test receiver 9010/30P Narda 132WX AMN (LISN) ESH3-Z5 Rohde & Schwarz / AMN (LISN) NNLK8129 Schwarzbeck ISN ISN T8 TESEQ ISN ISN ST08 TESEQ EMI test receiver ESHS10 Rohde & Schwarz / AMN (LISN) ESH2-Z5 Rohde & Schwarz / AMN (LISN) KNW-407 Kyoritsu ISN CAT Schwarzbeck ISN NTFM 8158 Schwarzbeck Radiated emission EMI test receiver ESPI7 Rohde & Schwarz EMI test receiver ESVS10 Rohde & Schwarz / Pre-amplifier (30 MHz - 1 GHz) 8447F HP 3113A Bilog broadband antenna VULB9168 Schwarzbeck Bilog broadband antenna VULB9168 Schwarzbeck EMI test receiver ESIB40 Rohde & Schwarz Pre-amplifier (30 MHz - 1 GHz) 8447D HP 2944A Pre-amplifier (1 GHz - 18 GHz) MLA-100M18-B02-38 TSJ Bilog broadband antenna JB1 Sunol Sciences A Horn antenna (1 GHz - 18 GHz) BBHA 9120D Schwarzbeck 9120D Horn antenna (1 GHz - 18 GHz) 3115 ETS-LINDGREN Radiated emission ( f < 30 MHz) EMI test receiver ESIB40 Rohde & Schwarz EMI test receiver ESHS10 Rohde & Schwarz / dimensional loop antenna HXYZ9170 Schwarzbeck HFCD Loop antenna HFH2-Z2 Rohde & Schwarz / Report No.: SKT-ECE A1 Page 8 of 46

9 Description Model Manufacturer Serial No. Cal. due Use Harmonic current / voltage flicker Reference impedance network IMP555 Voltech IG147/ Universal power analyzer PM 6000 Voltech Pacific power source 140AMXT/UPC12/M5283 Pacific Electrostatic discharge (ESD) ESD simulator ESS-2000AX Noise Ken ESS ESD simulator ESS-B3011 Noise Ken ESS Radiated immunity (RS) Signal generator SMY01 Rohde & Schwarz RF power meter NRVD Rohde & Schwarz Log periodic antenna HL046 Rohde & Schwarz N/A RF power amplifier (10 khz - 1 GHz) CMX10001 IFI N/A RF power amplifier (10 khz MHz) M5300 IFI N/A RF power amplifier (200 MHz - 1 GHz) SMCC100 IFI N/A MXG analog signal generator N5181A Agilent MY USB power sensor U2004A Agilent MY USB power sensor U2004A Agilent MY Horn antenna (1 GHz - 18 GHz) BBHA 9120D Schwarzbeck 9120D Horn antenna (1 GHz - 18 GHz) 3115 ETS-LINDGREN RF power amplifier (1 GHz - 3 GHz) SV120DC PRANA RF power amplifier (2 GHz - 6 GHz) 5192R OPHIR EFT / Burst Ultra compact simulator UCS 500 M6B EM TEST V Motor variac MV 2616 EM TEST V Capacitive coupling clamp HFK EM TEST EFT/B simulator 5555 TOKIN S Capacitive coupling clamp PN-5055 TOKIN Surge Ultra compact simulator UCS 500 M6B EM TEST V Motor variac MV 2616 EM TEST V I/O signal line coupler/decoupler CM-I/OCD KeyTek N/A Control center E103 KeyTek N/A Surge combination wave E501A KeyTek Telecom wave surge module E502B KeyTek Surge coupler/decoupler E551 KeyTek Coupler/decoupler for telecome line CM-TELCD KeyTek Injected currents (CS) Conducted immunity test system CIT-10/75 FRANKONIA 102C Attenuator (6 db, 75 W) ATT6/75 EM TEST CDN CDN M016(M2/M3) TESEQ CDN CDN S1/75 EM TEST CDN CDN S1/50 EM TEST CDN TSCDN-T4 TSJ CDN TSCDN-T2 TSJ EM clamp KT-30 Kyoritsu Conducted immunity test system CWS 500N1 EM TEST V Attenuator ATT6/75 EM TEST CDN CDN-M2/M3N EM TEST CDN CDN-T8-RJ45 EM TEST EM Clamp EM101 LuthiElektronik Power frequency magnetic field Ultra compact simulator UCS 500 M6B EM TEST V Motor variac MV 2616 EM TEST V Magnetic antenna MS100 EM TEST N/A Slidacs DSD1000 Digitek power E10116 N/A Voltage dips and interruptions Ultra compact simulator UCS 500 M6B EM TEST V Motor variac MV 2616 EM TEST V Control center E103 KeyTek N/A PQF swell/dip/interrupt EP61 KeyTek Report No.: SKT-ECE A1 Page 9 of 46

10 4.4. Measurement uncertainty EMI uncertainty The following measurement uncertainty levels have been estimated according to CISPR Measurement Frequency Uncertainty U cispr Conducted emissions 150 khz to 30 MHz ±3.14 db ±3.4 db Radiated emissions 30 MHz to 1000 MHz ±4.20 db ±6.3 db 1000 MHz to 6000 MHz ±5.06 db ±5.2 db This measurement uncertainty represents an expanded uncertainty expressed at approximately the 95 % confidence level using a coverage factor of k = 2. If the measurement value is lower or equal to the limit, the EUT is considered to pass the test. When the measured emission is positioned within the range of the measurement uncertainty from the emission limit, compliance or non-compliance with a disturbance limit is determined in the following manner. 1) If U lab is less than or equal to U cispr - compliance is deemed to occur if no measured disturbance exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance exceeds the disturbance limit. 2) If U lab is greater than U cispr - compliance is deemed to occur if no measured disturbance, increased by (U lab - U cispr ), exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance, increased by (U lab - U cispr ), exceeds the disturbance limit EMS uncertainty All parameters are within the tolerances required by the standards, reduced by the tolerances required on the calibration certificate, so this laboratory has confidence that the EMS Test equipment is in compliance with the standard with X % confidence level. Tolerance required by the standard Reduced by the uncertainty reported on the calibration certificate. (about X % confidence level) Basic standard Test item k confidence level EN Electrostatic discharge (ESD) 2 95 % EN Radiated immunity (RS) % 95 % EN EFT / Burst 2 95 % EN EN Surge (except following parameters) L1-L2 (open circuit, 1.2/50 μs, 2 Ω) positive 500 V L1-L2 (open circuit, 1.2/50 μs, 2 Ω) negative 1 kv and 2 kv L1-PE (open circuit, 1.2/50 μs, 2 Ω) positive 1 kv Conducted immunity (CS) % 80 % 85 % 85 % 90 % 95 % EN Voltage dips, interruptions and variations 2 95 % U ±2.64 db ±3.16 db ±1.34 db ±1.67 db Report No.: SKT-ECE A1 Page 10 of 46

11 5 Technical requirements 5.1. Emission limits Limits for disturbance voltage Limits for disturbance voltage at the mains terminals Frequency range Quasi-peak Limits (dbμv) a Average 9 khz to 50 khz khz to 150 khz 90 to 80 b khz to 0.5 MHz 66 to 56 b 56 to 46 b 0.5 MHz to 5.0 MHz 56 c 46 c 5 MHz to 30 MHz a At the transition frequency, the lower limit applies. b The limit decreases linearly with the logarithm of the frequency in the ranges of 50 khz o 150 khz and 150 khz to 0.5 MHz. c For electrodeless lamps and luminaires, the limit in the frequency range of 2.51 MHz to 3.0 MHz is 73 db(μv) quasi peak and 60 db(μv) average. NOTE In Japan, the limits in the frequency range 9 khz to 150 khz do not apply. Limits for disturbance voltage at the load terminals Frequency range Voltage limits (dbμv) a (MHz) Quasi-peak Average a 0.15 to to At the transition frequency, the lower limit applies. Limits for disturbance voltage at the control terminals Frequency range Voltage limits (dbμv) (MHz) Quasi-peak Average NOTE 1 NOTE to to to to The limits decrease linearly with the logarithm of the frequency in the range 0.15 MHz to 0.5 MHz. The voltage disturbance limits are derived for use with an impedance stabilization network (ISN) which presents a common mode (asymmetric mode) impedance of 150 Ω to the control terminal Limits for radiated disturbance Limits for radiated disturbance in the frequency range 9 khz to 30 MHz Frequency range Quasi-peak limits for loop diameter (dbμa) a (MHz) 2 m 3 m 4 m a b c NOTE 9 khz to 70 khz khz to 150 khz 88 to 58 b 81 to 51 b 75 to 45 b 150 khz to 3.0 MHz 58 to 22 b 51 to 15 b 45 to 9 b 3.0 MHz to 30 MHz to 16 c 9 to 12 c At the transition frequency, the lower limit applies. Decreases linearly with the logarithm of the frequency. For electrodeless lamps and luminaires, the limit in the frequency range of 2.2 MHz to 3.0 MHz is 58 db(μa) for 2m, 51 db(μa) for 3 m and 45 db(μa) for 4 m loop diameter. Increasing linearly with the logarithm of the frequency. In Japan, the limits in the frequency range 9 khz to 150 khz do not apply. Report No.: SKT-ECE A1 Page 11 of 46

12 Limits for radiated disturbance in the frequency range 30 MHz to 300 MHz at a measuring distance of 10 m Frequency range Quasi-peak limits (MHz) (dbμv/m) a 30 to to a At the transition frequency, the lower limit applies Limits for harmonics current a) Active input power >25 W For lighting equipment having an active input power greater than 25 W, the harmonic currents shall not exceed the relative limits for Class C equipment. Limits for Class C equipment Maximum permissible harmonic current Harmonic order expressed as a percentage of the input current at the fundamental frequency n % λ n 39 (odd harmonics only) * λ is the circuit power factor However, the limits for Class A equipment apply to incandescent lighting equipment that has built-in dimmers or consists of dimmers built in an enclosure. Limits for Class A equipment Limits for Class D equipment Harmonic order n Max. permissible harmonic current A Odd harmonics Harmonic order n Max. permissible harmonic current per watt ma/w Odd harmonics only 3 Max. permissible harmonic current A n /n 15 n /n /n Even harmonics n /n Report No.: SKT-ECE A1 Page 12 of 46

13 b) Active input power 25 W Discharge lighting equipment having an active input power smaller than or equal to 25 W shall comply with one of the following two sets of requirements: - the harmonic currents shall not exceed the power-related limits for Class D equipment, column 2, or: - the third harmonic current, expressed as a percentage of the fundamental current, shall not exceed 86 % and the fifth harmonic current shall not exceed 61 %. Also, the waveform of the input current shall be such that it reaches the 5 % current threshold before or at 60º, has its peak value before or at 65º and does not fall below the 5 % current threshold before 90º, referenced to any zero crossing of the fundamental supply voltage. The current threshold is 5 % of the highest absolute peak value that occurs in the measurement window, and the phase angle measurements are made on the cycle that includes this absolute peak value Limits for voltage fluctuations & flicker Test item Limit Remark P st 1.0 P st means short-term flicker indicator. P lt 0.65 P lt means long-term flicker indicator. T dt 500 ms T dt means maximum time that d(t) exceed 3 %. d c 3.3 % d c means relative steady-state voltage change. d max 4 % d max means maximum relative voltage change. Report No.: SKT-ECE A1 Page 13 of 46

14 5.2. General performance criteria description Required performance criteria according to EN Performance Description Criteria A During the test, no change of the Iuminous intensity shall be observed and the regulating control, if any, shall operate during the test as intended. B During the test, the Iuminous intensity may change to any value. After the test, the Iuminous intensity shall be restored to its initial value within 1 min. Regulating controls need not function during the test, but after the test, the mode of the control shall be the same as before the test provided that during the test no mode changing commands were given. During and after the test, any change of the luminous intensity is allowed and the lamp(s) may be extinguished. After the test, within 30 min, all functions shall return to normal, if necessary by temporary interruption of the mains supply and/or operating the regulating control. C Additional requirement for lighting equipment incorporating a starting device: After the test, the lighting equipment is switched off. After half an hour, it is switched on again. The lighting equipment shall start and operate as intended. Report No.: SKT-ECE A1 Page 14 of 46

15 6 EMISSION TEST 6.1. Conducted disturbance test at AC mains terminals Test set-up: Refer to the test configuration and photographs of the test setup. frequency range: 9 khz to 30 MHz frequency step size: 50 % of the IF bandwidth IF bandwidth: 200 Hz (frequncy range from 9 khz to 150 khz) 9 khz /10 khz (frequncy range from 150 khz to 30 MHz) measurement time: 1 second Operating mode: #1 Test results: PASS (The chart below shows the highest readings taken from the final data.) Frequency Reading Line CF CL Actual Limit Margin (MHz) (dbμv) (L/N) (db) (db) (dbμv) (dbμv) (db) Quasi-peak data N N N N N L N L N Average data N N N N N L N L N Note: 1) L/N: Line / Neutral 2) CF and CL: correction factor (LISN) and cable loss 3) Actual = Reading + CF + CL 4) Margin = Limit - Actual Report No.: SKT-ECE A1 Page 15 of 46

16 Line to PE Neutral to PE Report No.: SKT-ECE A1 Page 16 of 46

17 6.2. Conducted disturbance test at load/control terminals Test set-up: Refer to the test configuration and photographs of the test setup. frequency range: 150 khz to 30 MHz frequency step size: 50 % of the IF bandwidth IF bandwidth: 9 khz (10 khz) measurement time: 1 second Operating mode: Test results: N/A REMARK: The applicant declared that the cable length of the load terminals to be connected to the lamp(s) was fixed to 0.3 m, and the radiated disturbance limits were applied under these conditions by the applicant's request. (The chart below shows the highest readings taken from the final data.) Frequency Reading CF CL Actual Limit Margin (MHz) (dbμv) (db) (db) (dbμv) (dbμv) (db) Quasi-peak data Average data Note: 1) CF and CL: correction factor and cable loss 2) Actual = Reading + CF + CL 3) Margin = Limit - Actual Report No.: SKT-ECE A1 Page 17 of 46

18 6.3. Radiated disturbance test (9 khz to 30 MHz) Test set-up: Operating mode: #1 Test results: PASS Refer to the test configuration and photographs of the test setup. Loop diameter: 2 m frequency range: 9 khz to 30 MHz frequency step size: 50 % of the IF bandwidth IF bandwidth: 200 Hz (frequncy range from 9 khz to 150 khz) 9 khz /10 khz (frequncy range from 150 khz to 30 MHz) measurement time: 10 ms (1 second if the final QP value was measured) (The chart below shows the highest readings taken from the final data. The other emission levels were very low against the limit.) Axis Frequency Actual Limit Margin (X/Y/Z) (MHz) (dbμa) (dbμa) (db) X X X X X Y Y Y Y Y Z Z Z Z Z Note: 1) Margin = Limit - Actual Report No.: SKT-ECE A1 Page 18 of 46

19 Axis X Axis Y Report No.: SKT-ECE A1 Page 19 of 46

20 Axis Z Report No.: SKT-ECE A1 Page 20 of 46

21 6.4. Radiated disturbance test (30 MHz to 300 MHz) Test set-up: Operating mode: #1 Test results: PASS Refer to the test configuration and photographs of the test setup. Test site: OATS SAC Antenna distance: 10 m 3 m Rx antenna height: 1 m to 4 m frequency range: 30 MHz to 300 MHz IF bandwidth: 120 khz (The chart below shows the highest readings taken from the final data. The other emission levels were very low against the limit.) Frequency Pol. Height Reading AMP AF CL Actual Limit Margin (MHz) (V/H) (m) (dbμv) (db) (db/m) (db) (dbμv/m) (dbμv/m) (db) No radiated emissions found Note: 1) V/H: Vertical / Horizontal polarization 2) AMP, AF and CL: pre-amplifier gain, antenna factor and cable loss 3) Actual = Reading -AMP + AF + CL 4) Margin = Limit Actual 5) Preliminary scans were performed at 3 m anechoic chamber at the frequency from 30 MHz to 300 MHz in both vertical and horizontal polarizations in all possible mode of operation. There was no significant emission. Report No.: SKT-ECE A1 Page 21 of 46

22 6.5. Harmonic current emission test Test set-up: Refer to the test configuration and photographs of the test setup. frequency range: DC to 2 khz Equipment class Class A B C D Operating mode: #1 Test results: PASS REMARK: The measured power was used to establish the limits because the measured value was outside of the tolerance band around the specified value (26 W). Report No.: SKT-ECE A1 Page 22 of 46

23 Fluctuating Harmonic Test - Worst Case Table Report No.: SKT-ECE A1 Page 23 of 46

24 6.6. Voltage fluctuations and flicker test Test set-up: Operating mode: #1 Test results: PASS Refer to the test configuration and photographs of the test setup. frequency range: DC to 2 khz Report No.: SKT-ECE A1 Page 24 of 46

25 7 IMMUNITY TEST 7.1. Electrostatic discharge immunity test (ESD) Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Discharge impedance: 330 Ω / 150 pf Discharge voltage: Contact discharge: 4 kv (direct / indirect) Air discharge: 2 kv; 4 kv & 8 kv (direct) Polarity: positive and negative Number of discharge: minimum 10 times for each voltage and polarity Discharge mode: single discharge; 1 second minimum Performance criteria: B Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS Contact discharges Test point Test level Result ±2 kv ±4 kv ±6 kv ±8 kv Criterion Observation Pass Fail HCP (0.8 m 1.6 m) A B Note 1) 2) VCP (0.5 m 0.5 m) A B Note 1) 2) Air discharges Test point Test level Result ±2 kv ±4 kv ±8 kv ±15 kv Criterion Observation Pass Fail Enclosure (front) A B Note 1) 2) Enclosure (rear) A B Note 1) 2) Enclosure (left) A B Note 1) 2) Enclosure (right) A B Note 1) 2) Enclosure (top) A B Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 25 of 46

26 Photographs for discharge points of EUT Air discharges: Contact discharges: Report No.: SKT-ECE A1 Page 26 of 46

27 7.2. Radiated, radio-frequency, electromagnetic field immunity test (RS) Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Test field strength: 3 V/m Frequency range: 80 MHz to 1000 MHz Modulation: 80 % AM with 1 khz sinusoidal signal Frequency step: 1 % of preceding frequency value Dwell time: 3 s Polarity of TX antenna: horizontal and vertical TX antenna distance: 3 m Performance criteria: A Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS AM (80 %) Frequency Test level Polarity Position Result (MHz) 1 V/m 3 V/m 10 V/m Observation Pass Fail V & H Front Note 1) 2) V & H Rear Note 1) 2) V & H Left Note 1) 2) V & H Right Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 27 of 46

28 7.3. Electrical fast transient/burst immunity test (EFT/Burst) Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Test peak voltage: AC power ports: 1 kv DC power ports: 0.5 kv Signal/control lines: 0.5 kv Polarity positive and negative Repetition frequency: 5 khz Impulse wave shape 5/50 ns Burst duration / period: 15 ms / 300 ms Test duration: Not less than 1 min. Performance criteria: B Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS AC power ports Test port Test level Result ±0.5 kv ±1 kv ±2 kv ±4 kv Criterion Observation Pass Fail L1-L2 A B Note 1) 2) DC power ports Test port Test level Result ±0.25 kv ±0.5 kv ±1 kv ±2 kv Criterion Observation Pass Fail N/A A B Note 1) 2) Signal / control lines Test port Test level Result ±0.25 kv ±0.5 kv ±1 kv ±2 kv Criterion Observation Pass Fail N/A A B Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 28 of 46

29 7.4. Surge immunity test Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Test peak voltage: Self-ballasted lamps and semi-luminaires: (line to line) 0.5 kv (line to ground) 0.5 kv & 1 kv Luminaires and independent auxiliaries for input power 25 W (line to line) 0.5 kv (line to ground) 0.5 kv & 1 kv for input power > 25 W (line to line) 0.5 kv & 1 kv (line to ground) 0.5 kv; 1 kv & 2 kv Polarity positive and negative Wave shape 1.2/50 μs (8/20 μs) Source impedance: 2 Ω (between power supply networks) 12 Ω (between power supply network and ground) Number of application: minimum 5 pulses for each voltage and polarity Phase (AC power port) 90º and 270º (min. 5 pulses for each phase) Pulse repetaition rate: 1 time/min. (maximum) Performance criteria: C Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS AC power ports Test port Test level Result ±0.5 kv ±1 kv ±2 kv ±4 kv Criterion Observation Pass Fail L1-L2 A B Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 29 of 46

30 7.5. Immunity to conducted disturbances, induced by radio-frequency fields (CS) Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Test voltage (emf): 3 V Frequency range: 0.15 MHz to 80 MHz Modulation: 80 % AM with 1 khz sinusoidal signal Frequency step: 1 % of preceding frequency value Dwell time: 3 s Performance criteria: A Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS AM (80 %) Frequency Test level Test port Injection Result (MHz) 1 V 3 V 10 V method Observation Pass Fail AC Mains CDN (M2) Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 30 of 46

31 7.6. Power frequency magnetic field immunity test Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Test feild strength: 3 A/m Power frequency: 50 Hz / 60 Hz Inductive coil: 1 m 1 m 1 turn Observation time: more than 1 minute Performance criteria: A Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS Frequency Test level Direction Result (Hz) 1 A/m 3 A/m 10 A/m 30 A/m Observation Pass Fail 50 X Note 1) 2) 50 Y Note 1) 2) 50 Z Note 1) 2) 60 X Note 1) 2) 60 Y Note 1) 2) 60 Z Note 1) 2) Note: 1) There was no change compared with initial operation during and after the tests. Report No.: SKT-ECE A1 Page 31 of 46

32 7.7. Voltage dips and short interruptions immunity test Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN Number of reductions: 3 dips/interruptions for each test level and duration Interval between events: minimum 10 seconds Voltage changes: occur at 0 degree crossover point of the voltage wave Performance criteria: C (for voltage dips; 30 % reduction, 10 periods) B (for voltage short interruptions; 100 % reduction, 0.5 periods) Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status; observation of the luminous intensity, functional test. Test results: PASS Voltage Duration Result (% reduction) (period) Criterion Observation Pass Fail A B C Note 1) 2) 3) A B C Note 1) 2) 3) Note: 1) There was no change compared with initial operation during and after the tests. 2) The function stopped during the tests, but can be recoverable by itself operation after the tests. 3) The function stopped during the tests, but can be recoverable manually after the tests. Report No.: SKT-ECE A1 Page 32 of 46

33 8 Photographs of the test set-up Conducted emission test at AC mains port Report No.: SKT-ECE A1 Page 33 of 46

34 Radiated disturbance test (9 khz to 30 MHz) Report No.: SKT-ECE A1 Page 34 of 46

35 Radiated disturbance test (30 MHz to 300 MHz) Report No.: SKT-ECE A1 Page 35 of 46

36 Harmonic current emission and Voltage fluctuations & flicker test Report No.: SKT-ECE A1 Page 36 of 46

37 Electrostatic discharge immunity test (ESD) Report No.: SKT-ECE A1 Page 37 of 46

38 Radiated, radio-frequency, electromagnetic field immunity test (RS) Report No.: SKT-ECE A1 Page 38 of 46

39 Electrical fast transient/burst immunity test (EFT/Burst) Report No.: SKT-ECE A1 Page 39 of 46

40 Surge immunity test Report No.: SKT-ECE A1 Page 40 of 46

41 Immunity to conducted disturbances, induced by radio-frequency fields (CS) Report No.: SKT-ECE A1 Page 41 of 46

42 Immunity to power frequency magnetic field Report No.: SKT-ECE A1 Page 42 of 46

43 Voltage dips, short interruptions and voltage variations immunity test Report No.: SKT-ECE A1 Page 43 of 46

44 9 Photographs of EUT External view Report No.: SKT-ECE A1 Page 44 of 46

45 Cover opened Report No.: SKT-ECE A1 Page 45 of 46

46 Main board Report No.: SKT-ECE A1 Page 46 of 46