SUPPLEMENTARY INFORMATION

Size: px
Start display at page:

Download "SUPPLEMENTARY INFORMATION"

Transcription

1 Figure S. Experimental set-up

2 Figure S2. Dependence of ESR frequencies (GHz) on a magnetic field (G) applied in different directions with respect to NV axis ( θ 2π). The angle with respect to NV axis (in degrees) is indicated along resonant surface. h rêr Figure S3. The radial cross-section of the magnetic tip. 2

3 9 Magnetic Field (Arb. Units) B Bz Br Lorentzian Fit Radial Distance (μm) Figure S4 Simulated magnetic field of the tip having the following parameters: apex curvature radius 5nm, height 7μm, and radius of the base 2.5μm. The apex of the tip is 5nm above the plane of interest. The magnetization direction is along the tip axis. The field can be well fitted by a Lorentzian. A B y HμmL y HμmL x HμmL.5.5 x HμmL Figure S5. Shapes of isofrequency resonance lines for the S z => S z =+>transition as the magnetic cantilever is scanned above the NV center: (A) both NV axis and the cantilever magnetization are perpendicular to the surface of scan and (B) θ B =π/, θ NV =π/4, and ϕ=π/2. Each contour represents a resonant line corresponding to a particular microwave frequency. 3

4 One-dimensional imaging and magnetometry experiments. In a first set of experiments an inhomogeneous external magnetic field (gradient field) created by a thin metal wire causes a spatially dependent shift of the Zeeman levels of the NV marker that varies according to their location relative to the wire. A single diamond nanocrystal containing two NV defects was selected as test object for demonstrating the resolving power of our approach. Note that the two NV defects were irresolvable by confocal microscopy owing to their close spacing, but the presence of two emitters was confirmed by photon correlation measurements. Local Magnetic Field (G) Fluorescence Intensity I=25 ma NV2 NV MW frequency (MHz) Line Position (GHz) Current (A) Current (ma) NV 8G NV2 NV 37.5 o NV2 5. o Magnetic field (G) NV 2nm 7nm 5 nm NV2 8G μm I=6mA 66nm 54nm Distance from the wire (μm) Figure S6. One-dimensional imaging demonstration using a magnetic field gradient generated by a wire. The main graph shows the magnetic field experienced by two closely spaced NV defects in the nanocrystal for different currents flowing through wire. Inset at left upper corner shows a typical ESR spectrum of nanocrystal containing two NV defects. Lower inset shows resonant frequencies of NV defects used to calculate the main graph. Right graph shows. a simulated magnetic field profile of the wire, along with the relative radial positions of the two NV defects. The inset in Figure S6 shows the optically detected ESR spectrum of this diamond nanocrystal. Four lines mark the electron spin resonance transitions of the two centres. The amplitude and orientation of the magnetic field experienced by each NV defect was calculated as described above for different values of wire current. As expected for 4

5 immobilized nanocyrstals, the angle Θ for the quantization axes of the two NV centres (NV and NV2) with respect to external field was not dependent on current, and we have obtained Θ =37.5 and Θ 2 =5. for NV and NV2, respectively. The calculated values of the local magnetic fields experienced by NV and NV2 differed by 6% for all currents: B /B 2 =.6. This difference is related to the different distance of NV and NV2 from the wire and the inhomogeneous magnetic field generated by the wire. Since the geometry of wire was known (measured independently by atomic force microscopy) the radial distribution of the magnetic field can be accurately simulated. Knowing the magnitudes of the magnetic field at a given current (B =32G and B 2 =33G at I=6mA) it was possible to determine the distances of the two NVs from the wire edge: d =54nm and d 2 =66nm, respectively. The precision of determining the distances is defined by the accuracy of finding the resonance frequencies. The latter is given by the width of the ESR resonance 5MHz FWHM for the two defects (note that apart from magnetic field fluctuations, the driving microwave field also contributes to the finite linewidth of ESR transition). Based on this width we calculate a limiting resolution of 2nm as a crude estimate under the present experimental conditions (field gradient of.25 G/nm for the present structure at 6mA of current). 5

6 Broadening of resonance lines related to cantilever vibrations. All the imaging experiments presented in this letter were performed using either a magnetic AFM cantilever or a diamond nanocrystal attached to the AFM cantilever. In both cases we have used 3 2 tapping mode (AC mode) to scan the Intensity (A.U) 2 3 surface. In this mode the cantilever is driven to oscillate at its resonant frequency and the deflection feedback is set to keep the amplitude at a desired MW frequency (MHz) Figure S7. Broadening of ODMR lines related to vibrations of magnetic cantilever. value. Usually the amplitude of vibration of the cantilever is on the order of few tens of angstroms. When the probe is brought in close proximity to a region of high magnetic field gradients, this vibration causes the NV centre in the nanocrystal to experience an oscillating magnetic field. This causes the ODMR resonant lines to become broader. It is evident from the Figure S7 that sharp ODMR lines become broad on entering the high magnetic field gradient region and eventually change into a square shape in regions of very high magnetic field gradient. Although decoherence of NV spin is for the limiting cause of ESR line broadening, in the present experiment the vibrating cantilever dominates the linewidth at regions of high gradients, which in turn limits the apparent resolution. However, since this vibrational broadening is coherent, advanced echo based techniques synchronised with the vibration could be implemented to achieve the higher resolutions projected in the main manuscript. 6

Supplementary Discussion 1: NV center level diagram

Supplementary Discussion 1: NV center level diagram Supplementary Discussion 1: NV center level diagram Figure S1. Energy level diagram of nitrogen-vacancy centers in diamond. Nitrogen-vacancy (NV) centers in diamond are fluorescent defects consisting of

More information

Nd:YSO resonator array Transmission spectrum (a. u.) Supplementary Figure 1. An array of nano-beam resonators fabricated in Nd:YSO.

Nd:YSO resonator array Transmission spectrum (a. u.) Supplementary Figure 1. An array of nano-beam resonators fabricated in Nd:YSO. a Nd:YSO resonator array µm Transmission spectrum (a. u.) b 4 F3/2-4I9/2 25 2 5 5 875 88 λ(nm) 885 Supplementary Figure. An array of nano-beam resonators fabricated in Nd:YSO. (a) Scanning electron microscope

More information

Understanding the Magnetic Resonance Spectrum of Nitrogen Vacancy Centers in an Ensemble of Randomly-Oriented Nanodiamonds, Supporting Information

Understanding the Magnetic Resonance Spectrum of Nitrogen Vacancy Centers in an Ensemble of Randomly-Oriented Nanodiamonds, Supporting Information Understanding the Magnetic Resonance Spectrum of Nitrogen Vacancy Centers in an Ensemble of Randomly-Oriented Nanodiamonds, Supporting Information Keunhong Jeong *1,2, Anna J. Parker *1,2, Ralph H. Page

More information

Diamond X-ray Rocking Curve and Topograph Measurements at CHESS

Diamond X-ray Rocking Curve and Topograph Measurements at CHESS Diamond X-ray Rocking Curve and Topograph Measurements at CHESS G. Yang 1, R.T. Jones 2, F. Klein 3 1 Department of Physics and Astronomy, University of Glasgow, Glasgow, UK G12 8QQ. 2 University of Connecticut

More information

Basic methods in imaging of micro and nano structures with atomic force microscopy (AFM)

Basic methods in imaging of micro and nano structures with atomic force microscopy (AFM) Basic methods in imaging of micro and nano P2538000 AFM Theory The basic principle of AFM is very simple. The AFM detects the force interaction between a sample and a very tiny tip (

More information

Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch

Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch Imaging Carbon Nanotubes Magdalena Preciado López, David Zahora, Monica Plisch I. Introduction In this lab you will image your carbon nanotube sample from last week with an atomic force microscope. You

More information

Figure for the aim4np Report

Figure for the aim4np Report Figure for the aim4np Report This file contains the figures to which reference is made in the text submitted to SESAM. There is one page per figure. At the beginning of the document, there is the front-page

More information

Microscopic Structures

Microscopic Structures Microscopic Structures Image Analysis Metal, 3D Image (Red-Green) The microscopic methods range from dark field / bright field microscopy through polarisation- and inverse microscopy to techniques like

More information

- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy

- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy - Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy Yongho Seo Near-field Photonics Group Leader Wonho Jhe Director School of Physics and Center for Near-field

More information

Investigate in magnetic micro and nano structures by Magnetic Force Microscopy (MFM)

Investigate in magnetic micro and nano structures by Magnetic Force Microscopy (MFM) Investigate in magnetic micro and nano 5.3.85- Related Topics Magnetic Forces, Magnetic Force Microscopy (MFM), phase contrast imaging, vibration amplitude, resonance shift, force Principle Caution! -

More information

2. Pulsed Acoustic Microscopy and Picosecond Ultrasonics

2. Pulsed Acoustic Microscopy and Picosecond Ultrasonics 1st International Symposium on Laser Ultrasonics: Science, Technology and Applications July 16-18 2008, Montreal, Canada Picosecond Ultrasonic Microscopy of Semiconductor Nanostructures Thomas J GRIMSLEY

More information

Manufacturing Metrology Team

Manufacturing Metrology Team The Team has a range of state-of-the-art equipment for the measurement of surface texture and form. We are happy to discuss potential measurement issues and collaborative research Manufacturing Metrology

More information

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry 1 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry 2 Back to our solutions: The main problem: How to get nm

More information

IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM

IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM Laboratorio MDM - INFM Via C.Olivetti 2, I-20041 Agrate Brianza (MI) M D M Materiali e Dispositivi per la Microelettronica IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL

More information

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G APPLICATION NOTE M06 attosnom I: Topography and Force Images Scanning near-field optical microscopy is the outstanding technique to simultaneously measure the topography and the optical contrast of a sample.

More information

Single-photon excitation of morphology dependent resonance

Single-photon excitation of morphology dependent resonance Single-photon excitation of morphology dependent resonance 3.1 Introduction The examination of morphology dependent resonance (MDR) has been of considerable importance to many fields in optical science.

More information

Long-distance propagation of short-wavelength spin waves. Liu et al.

Long-distance propagation of short-wavelength spin waves. Liu et al. Long-distance propagation of short-wavelength spin waves Liu et al. Supplementary Note 1. Characterization of the YIG thin film Supplementary fig. 1 shows the characterization of the 20-nm-thick YIG film

More information

Spectral phase shaping for high resolution CARS spectroscopy around 3000 cm 1

Spectral phase shaping for high resolution CARS spectroscopy around 3000 cm 1 Spectral phase shaping for high resolution CARS spectroscopy around 3 cm A.C.W. van Rhijn, S. Postma, J.P. Korterik, J.L. Herek, and H.L. Offerhaus Mesa + Research Institute for Nanotechnology, University

More information

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation 238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura

More information

INDIAN INSTITUTE OF TECHNOLOGY BOMBAY

INDIAN INSTITUTE OF TECHNOLOGY BOMBAY IIT Bombay requests quotations for a high frequency conducting-atomic Force Microscope (c-afm) instrument to be set up as a Central Facility for a wide range of experimental requirements. The instrument

More information

Radio-frequency scanning tunneling microscopy

Radio-frequency scanning tunneling microscopy doi: 10.1038/nature06238 SUPPLEMENARY INFORMAION Radio-frequency scanning tunneling microscopy U. Kemiktarak 1,. Ndukum 2, K.C. Schwab 2, K.L. Ekinci 3 1 Department of Physics, Boston University, Boston,

More information

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+)

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) The Anasys Instruments afm+ system incorporates an Atomic Force Microscope which can scan the sample in the contact mode and generate

More information

Fine structure of the inner electric field in semiconductor laser diodes studied by EFM.

Fine structure of the inner electric field in semiconductor laser diodes studied by EFM. Fine structure of the inner electric field in semiconductor laser diodes studied by EFM. Phys. Low-Dim. Struct. 3/4, 9 (2001). A.Ankudinov 1, V.Marushchak 1, A.Titkov 1, V.Evtikhiev 1, E.Kotelnikov 1,

More information

Akiyama-Probe (A-Probe) guide

Akiyama-Probe (A-Probe) guide Akiyama-Probe (A-Probe) guide This guide presents: what is Akiyama-Probe, how it works, and what you can do Dynamic mode AFM Version: 2.0 Introduction NANOSENSORS Akiyama-Probe (A-Probe) is a self-sensing

More information

Kevin Kai Chang. B.S. in Chemistry. Master of Science in Chemistry. at the. September 2011

Kevin Kai Chang. B.S. in Chemistry. Master of Science in Chemistry. at the. September 2011 Custom Built Atomic Force Microscope for Nitrogen-Vacancy Diamond Magnetometry by Kevin Kai Chang B.S. in Chemistry University of Illinois at Urbana Champaign (2009) MASSACHUSETTS INSTITUTE OF TECHNOLOGY

More information

A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect Ting Xie 1, a), Michael Dreyer 2, David Bowen 3, Dan Hinkel 3, R. E. Butera

More information

Supplementary Materials for

Supplementary Materials for advances.sciencemag.org/cgi/content/full/4/2/e1700324/dc1 Supplementary Materials for Photocarrier generation from interlayer charge-transfer transitions in WS2-graphene heterostructures Long Yuan, Ting-Fung

More information

Electric polarization properties of single bacteria measured with electrostatic force microscopy

Electric polarization properties of single bacteria measured with electrostatic force microscopy Electric polarization properties of single bacteria measured with electrostatic force microscopy Theoretical and practical studies of Dielectric constant of single bacteria and smaller elements Daniel

More information

3D Optical Motion Analysis of Micro Systems. Heinrich Steger, Polytec GmbH, Waldbronn

3D Optical Motion Analysis of Micro Systems. Heinrich Steger, Polytec GmbH, Waldbronn 3D Optical Motion Analysis of Micro Systems Heinrich Steger, Polytec GmbH, Waldbronn SEMICON Europe 2012 Outline Needs and Challenges of measuring Micro Structure and MEMS Tools and Applications for optical

More information

Indentation Cantilevers

Indentation Cantilevers curve is recorded utilizing the DC displacement of the cantilever versus the extension of the scanner. Many indentations may be made using various forces, rates, etc. Upon exiting indentation mode, TappingMode

More information

Lab 12 Microwave Optics.

Lab 12 Microwave Optics. b Lab 12 Microwave Optics. CAUTION: The output power of the microwave transmitter is well below standard safety levels. Nevertheless, do not look directly into the microwave horn at close range when the

More information

Measurements of Mode Converted ICRF Waves with Phase Contrast Imaging in Alcator C-Mod

Measurements of Mode Converted ICRF Waves with Phase Contrast Imaging in Alcator C-Mod Measurements of Mode Converted ICRF Waves with Phase Contrast Imaging in Alcator C-Mod N. Tsujii, M. Porkolab, E.M. Edlund, L. Lin, Y. Lin, J.C. Wright, S.J. Wukitch MIT Plasma Science and Fusion Center

More information

Electron Spin Resonance v2.0

Electron Spin Resonance v2.0 Electron Spin Resonance v2.0 Background. This experiment measures the dimensionless g-factor (g s ) of an unpaired electron using the technique of Electron Spin Resonance, also known as Electron Paramagnetic

More information

R. J. Jones Optical Sciences OPTI 511L Fall 2017

R. J. Jones Optical Sciences OPTI 511L Fall 2017 R. J. Jones Optical Sciences OPTI 511L Fall 2017 Semiconductor Lasers (2 weeks) Semiconductor (diode) lasers are by far the most widely used lasers today. Their small size and properties of the light output

More information

Advanced Nanoscale Metrology with AFM

Advanced Nanoscale Metrology with AFM Advanced Nanoscale Metrology with AFM Sang-il Park Corp. SPM: the Key to the Nano World Initiated by the invention of STM in 1982. By G. Binnig, H. Rohrer, Ch. Gerber at IBM Zürich. Expanded by the invention

More information

Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries

Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries 2002 Photonics Circle of Excellence Award PLC Ltd, England, a premier provider of Raman microspectral

More information

Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy

Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy C. Durkan a) and I. V. Shvets Department of Physics, Trinity College Dublin, Ireland Received 31 May 1995;

More information

Optimal Preamp for Tuning Fork signal detection Scanning Force Microscopy. Kristen Fellows and C.L. Jahncke St. Lawrence University

Optimal Preamp for Tuning Fork signal detection Scanning Force Microscopy. Kristen Fellows and C.L. Jahncke St. Lawrence University Optimal Preamp for Tuning Fork signal detection Scanning Force Microscopy Kristen Fellows and C.L. Jahncke St. Lawrence University H. D. Hallen North Carolina State University Abstract In scanning probe

More information

Akiyama-Probe (A-Probe) guide

Akiyama-Probe (A-Probe) guide Akiyama-Probe (A-Probe) guide This guide presents: what is Akiyama-Probe, how it works, and its performance. Akiyama-Probe is a patented technology. Version: 2009-03-23 Introduction NANOSENSORS Akiyama-Probe

More information

Prepare Sample 3.1. Place Sample in Stage. Replace Probe (optional) Align Laser 3.2. Probe Approach 3.3. Optimize Feedback 3.4. Scan Sample 3.

Prepare Sample 3.1. Place Sample in Stage. Replace Probe (optional) Align Laser 3.2. Probe Approach 3.3. Optimize Feedback 3.4. Scan Sample 3. CHAPTER 3 Measuring AFM Images Learning to operate an AFM well enough to get an image usually takes a few hours of instruction and practice. It takes 5 to 10 minutes to measure an image if the sample is

More information

ATOMIC FORCE MICROSCOPY

ATOMIC FORCE MICROSCOPY B47 Physikalisches Praktikum für Fortgeschrittene Supervision: Prof. Dr. Sabine Maier sabine.maier@physik.uni-erlangen.de ATOMIC FORCE MICROSCOPY Version: E1.4 first edit: 15/09/2015 last edit: 05/10/2018

More information

DESIGN OF COMPACT PULSED 4 MIRROR LASER WIRE SYSTEM FOR QUICK MEASUREMENT OF ELECTRON BEAM PROFILE

DESIGN OF COMPACT PULSED 4 MIRROR LASER WIRE SYSTEM FOR QUICK MEASUREMENT OF ELECTRON BEAM PROFILE 1 DESIGN OF COMPACT PULSED 4 MIRROR LASER WIRE SYSTEM FOR QUICK MEASUREMENT OF ELECTRON BEAM PROFILE PRESENTED BY- ARPIT RAWANKAR THE GRADUATE UNIVERSITY FOR ADVANCED STUDIES, HAYAMA 2 INDEX 1. Concept

More information

Fiber Lasers for EUV Lithography

Fiber Lasers for EUV Lithography Fiber Lasers for EUV Lithography A. Galvanauskas, Kai Chung Hou*, Cheng Zhu CUOS, EECS Department, University of Michigan P. Amaya Arbor Photonics, Inc. * Currently with Cymer, Inc 2009 International Workshop

More information

SENSOR+TEST Conference SENSOR 2009 Proceedings II

SENSOR+TEST Conference SENSOR 2009 Proceedings II B8.4 Optical 3D Measurement of Micro Structures Ettemeyer, Andreas; Marxer, Michael; Keferstein, Claus NTB Interstaatliche Hochschule für Technik Buchs Werdenbergstr. 4, 8471 Buchs, Switzerland Introduction

More information

On spatial resolution

On spatial resolution On spatial resolution Introduction How is spatial resolution defined? There are two main approaches in defining local spatial resolution. One method follows distinction criteria of pointlike objects (i.e.

More information

Part 2: Second order systems: cantilever response

Part 2: Second order systems: cantilever response - cantilever response slide 1 Part 2: Second order systems: cantilever response Goals: Understand the behavior and how to characterize second order measurement systems Learn how to operate: function generator,

More information

R. J. Jones College of Optical Sciences OPTI 511L Fall 2017

R. J. Jones College of Optical Sciences OPTI 511L Fall 2017 R. J. Jones College of Optical Sciences OPTI 511L Fall 2017 Active Modelocking of a Helium-Neon Laser The generation of short optical pulses is important for a wide variety of applications, from time-resolved

More information

Lecture 6 Fiber Optical Communication Lecture 6, Slide 1

Lecture 6 Fiber Optical Communication Lecture 6, Slide 1 Lecture 6 Optical transmitters Photon processes in light matter interaction Lasers Lasing conditions The rate equations CW operation Modulation response Noise Light emitting diodes (LED) Power Modulation

More information

Supplementary Information:

Supplementary Information: Supplementary Information: This document contains supplementary text discussing the methods used, figures providing information on the QD sample and level structure (Fig. S), key components of the experimental

More information

Supporting Information

Supporting Information Copyright WILEY-VCH Verlag GmbH & Co. KGaA, 69469 Weinheim, Germany, 2012. Supporting Information for Adv. Mater., DOI: 10.1002/adma.201203033 Solid Immersion Facilitates Fluorescence Microscopy with Nanometer

More information

Luminous Equivalent of Radiation

Luminous Equivalent of Radiation Intensity vs λ Luminous Equivalent of Radiation When the spectral power (p(λ) for GaP-ZnO diode has a peak at 0.69µm) is combined with the eye-sensitivity curve a peak response at 0.65µm is obtained with

More information

A New Profile Measurement Method for Thin Film Surface

A New Profile Measurement Method for Thin Film Surface Send Orders for Reprints to reprints@benthamscience.ae 480 The Open Automation and Control Systems Journal, 2014, 6, 480-487 A New Profile Measurement Method for Thin Film Surface Open Access ShuJie Liu

More information

Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy

Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy Qiyuan Song (M2) and Aoi Nakamura (B4) Abstracts: We theoretically and experimentally

More information

Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin

Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin film is characterized by using an optical profiler (Bruker ContourGT InMotion). Inset: 3D optical

More information

Notes on the VPPEM electron optics

Notes on the VPPEM electron optics Notes on the VPPEM electron optics Raymond Browning 2/9/2015 We are interested in creating some rules of thumb for designing the VPPEM instrument in terms of the interaction between the field of view at

More information

Optical Microscope. Active anti-vibration table. Mechanical Head. Computer and Software. Acoustic/Electrical Shield Enclosure

Optical Microscope. Active anti-vibration table. Mechanical Head. Computer and Software. Acoustic/Electrical Shield Enclosure Optical Microscope On-axis optical view with max. X magnification Motorized zoom and focus Max Field of view: mm x mm (depends on zoom) Resolution : um Working Distance : mm Magnification : max. X Zoom

More information

Phase Noise Modeling of Opto-Mechanical Oscillators

Phase Noise Modeling of Opto-Mechanical Oscillators Phase Noise Modeling of Opto-Mechanical Oscillators Siddharth Tallur, Suresh Sridaran, Sunil A. Bhave OxideMEMS Lab, School of Electrical and Computer Engineering Cornell University Ithaca, New York 14853

More information

Mechanical detection of magnetic resonance using nanowire cantilevers: opportunities and challenges

Mechanical detection of magnetic resonance using nanowire cantilevers: opportunities and challenges Mechanical detection of magnetic resonance using nanowire cantilevers: opportunities and challenges John Nichol and Raffi Budakian Deparment of Physics, University of Illinois at Urbana Champaign Eric

More information

Interaction of magnetic-dipolar modes with microwave-cavity. electromagnetic fields

Interaction of magnetic-dipolar modes with microwave-cavity. electromagnetic fields Interaction of magnetic-dipolar modes with microwave-cavity electromagnetic fields E.O. Kamenetskii 1 *, A.K. Saha 2, and I. Awai 3 1 Department of Electrical and Computer Engineering, Ben Gurion University

More information

Lecture 20: Optical Tools for MEMS Imaging

Lecture 20: Optical Tools for MEMS Imaging MECH 466 Microelectromechanical Systems University of Victoria Dept. of Mechanical Engineering Lecture 20: Optical Tools for MEMS Imaging 1 Overview Optical Microscopes Video Microscopes Scanning Electron

More information

Confocal Imaging Through Scattering Media with a Volume Holographic Filter

Confocal Imaging Through Scattering Media with a Volume Holographic Filter Confocal Imaging Through Scattering Media with a Volume Holographic Filter Michal Balberg +, George Barbastathis*, Sergio Fantini % and David J. Brady University of Illinois at Urbana-Champaign, Urbana,

More information

Comparison of resolution specifications for micro- and nanometer measurement techniques

Comparison of resolution specifications for micro- and nanometer measurement techniques P4.5 Comparison of resolution specifications for micro- and nanometer measurement techniques Weckenmann/Albert, Tan/Özgür, Shaw/Laura, Zschiegner/Nils Chair Quality Management and Manufacturing Metrology

More information

UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY

UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY References: http://virlab.virginia.edu/vl/home.htm (University of Virginia virtual lab. Click on the AFM link) An atomic force

More information

A Narrow-Band Tunable Diode Laser System with Grating Feedback

A Narrow-Band Tunable Diode Laser System with Grating Feedback A Narrow-Band Tunable Diode Laser System with Grating Feedback S.P. Spirydovich Draft Abstract The description of diode laser was presented. The tuning laser system was built and aligned. The free run

More information

Fluorescence Imaging of Single Spins in Nitrogen-Vacancy centers using a Confocal Microscope. Advanced Lab Course University of Basel

Fluorescence Imaging of Single Spins in Nitrogen-Vacancy centers using a Confocal Microscope. Advanced Lab Course University of Basel Fluorescence Imaging of Single Spins in Nitrogen-Vacancy centers using a Confocal Microscope Advanced Lab Course University of Basel October 6, 2015 Contents 1 Introduction 2 2 The Confocal Microscope

More information

UTA EE5380 PhD Diagnosis Exam (Fall 2011) Principles of Photonics and Optical Engineering

UTA EE5380 PhD Diagnosis Exam (Fall 2011) Principles of Photonics and Optical Engineering EE 5380 Fall 2011 PhD Diagnosis Exam ID: UTA EE5380 PhD Diagnosis Exam (Fall 2011) Principles of Photonics and Optical Engineering Instructions: Verify that your exam contains 7 pages (including the cover

More information

Supplementary Figures

Supplementary Figures Supplementary Figures Supplementary Figure 1. Purcell and beta factor without the diamond host for three wavelengths within the NV spectrum. Purcell factor for a dipole oriented along the a) x-axis, b)

More information

USING LASER DIODE INSTABILITIES FOR CHIP- SCALE STABLE FREQUENCY REFERENCES

USING LASER DIODE INSTABILITIES FOR CHIP- SCALE STABLE FREQUENCY REFERENCES USING LASER DIODE INSTABILITIES FOR CHIP- SCALE STABLE FREQUENCY REFERENCES T. B. Simpson, F. Doft Titan/Jaycor, 3394 Carmel Mountain Road, San Diego, CA 92121, USA W. M. Golding Code 8151, Naval Research

More information

<NOTICE> <PREAMB> BILLING CODE 3510-DS-P DEPARTMENT OF COMMERCE. International Trade Administration. University of Colorado Boulder, et al.

<NOTICE> <PREAMB> BILLING CODE 3510-DS-P DEPARTMENT OF COMMERCE. International Trade Administration. University of Colorado Boulder, et al. This document is scheduled to be published in the Federal Register on 01/28/2013 and available online at http://federalregister.gov/a/2013-01700, and on FDsys.gov 1 BILLING CODE 3510-DS-P

More information

Spin Wave Propagation in Non-Uniform Magnetic Fields

Spin Wave Propagation in Non-Uniform Magnetic Fields Spin Wave Propagation in Non-Uniform Magnetic Fields First Semester Report Fall Semester 2006 by James Derek Tucker Michael Kabatek Prepared to partially fulfill the requirements for EE401 Department of

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION Optically reconfigurable metasurfaces and photonic devices based on phase change materials S1: Schematic diagram of the experimental setup. A Ti-Sapphire femtosecond laser (Coherent Chameleon Vision S)

More information

WAVE MOTION. Challenging MCQ questions by The Physics Cafe. Compiled and selected by The Physics Cafe

WAVE MOTION. Challenging MCQ questions by The Physics Cafe. Compiled and selected by The Physics Cafe WVE MOTION hallenging MQ questions by The Physics afe ompiled and selected by The Physics afe 1 progressive wave in a stretched string has a speed of 2 m s -1 and a frequency of 100 Hz. What is the phase

More information

Nanomechanical Mapping of a High Curvature Polymer Brush Grafted

Nanomechanical Mapping of a High Curvature Polymer Brush Grafted Supplementary Information Nanomechanical Mapping of a High Curvature Polymer Brush Grafted from a Rigid Nanoparticle Gunnar Dunér 1, Esben Thormann 1, Andra Dėdinaitė 1,2, Per M. Claesson 1,2, Krzysztof

More information

Experiment 19. Microwave Optics 1

Experiment 19. Microwave Optics 1 Experiment 19 Microwave Optics 1 1. Introduction Optical phenomena may be studied at microwave frequencies. Using a three centimeter microwave wavelength transforms the scale of the experiment. Microns

More information

Supporting Information: Plasmonic and Silicon Photonic Waveguides

Supporting Information: Plasmonic and Silicon Photonic Waveguides Supporting Information: Efficient Coupling between Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides Ryan M. Briggs, *, Jonathan Grandidier, Stanley P. Burgos, Eyal Feigenbaum, and Harry A. Atwater,

More information

Narrowing spectral width of green LED by GMR structure to expand color mixing field

Narrowing spectral width of green LED by GMR structure to expand color mixing field Narrowing spectral width of green LED by GMR structure to expand color mixing field S. H. Tu 1, Y. C. Lee 2, C. L. Hsu 1, W. P. Lin 1, M. L. Wu 1, T. S. Yang 1, J. Y. Chang 1 1. Department of Optical and

More information

Upper limit on turbulent electron temperature fluctuations on Alcator C-Mod APS DPP Meeting Albuquerque 2003

Upper limit on turbulent electron temperature fluctuations on Alcator C-Mod APS DPP Meeting Albuquerque 2003 Upper limit on turbulent electron temperature fluctuations on Alcator C-Mod APS DPP Meeting Albuquerque 2003 Christopher Watts, Y. In (U. Idaho), A.E. Hubbard (MIT PSFC) R. Gandy (U. Southern Mississippi),

More information

Surface Finish Measurement Methods and Instrumentation

Surface Finish Measurement Methods and Instrumentation 125 years of innovation Surface Finish Measurement Methods and Instrumentation Contents Visual Inspection Surface Finish Comparison Plates Contact Gauges Inductive / Variable Reluctance (INTRA) Piezo Electric

More information

New High Density Recording Technology: Energy Assisted Recording Media

New High Density Recording Technology: Energy Assisted Recording Media New High Density Recording Technology: Energy Assisted Recording Yuki Inaba Hitoshi Nakata Daisuke Inoue A B S T R A C T Energy assisted recording, is a next-generation high-density recording technology.

More information

Microwave Optics. Department of Physics & Astronomy Texas Christian University, Fort Worth, TX. January 16, 2014

Microwave Optics. Department of Physics & Astronomy Texas Christian University, Fort Worth, TX. January 16, 2014 Microwave Optics Department of Physics & Astronomy Texas Christian University, Fort Worth, TX January 16, 2014 1 Introduction Optical phenomena may be studied at microwave frequencies. Visible light has

More information

Keysight Technologies Scanning Microwave Microscope Mode. Application Note

Keysight Technologies Scanning Microwave Microscope Mode. Application Note Keysight Technologies Scanning Microwave Microscope Mode Application Note Introduction Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and

More information

Specifying and Measuring Nanometer Surface Properties. Alson E. Hatheway

Specifying and Measuring Nanometer Surface Properties. Alson E. Hatheway Specifying and Measuring Nanometer Surface Properties a seminar prepared for the American Society of Mechanical Engineers 93663a.p65(1 Alson E. Hatheway Alson E. Hatheway Inc. 787 West Woodbury Road Unit

More information

Instructions for the Experiment

Instructions for the Experiment Instructions for the Experiment Excitonic States in Atomically Thin Semiconductors 1. Introduction Alongside with electrical measurements, optical measurements are an indispensable tool for the study of

More information

A White Paper on Danley Sound Labs Tapped Horn and Synergy Horn Technologies

A White Paper on Danley Sound Labs Tapped Horn and Synergy Horn Technologies Tapped Horn (patent pending) Horns have been used for decades in sound reinforcement to increase the loading on the loudspeaker driver. This is done to increase the power transfer from the driver to the

More information

Supplementary Materials for

Supplementary Materials for advances.sciencemag.org/cgi/content/full/2/7/e1629/dc1 Supplementary Materials for Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films Xuewen Wang, Xuexia He, Hongfei Zhu,

More information

NSOM (SNOM) Overview

NSOM (SNOM) Overview NSOM (SNOM) Overview The limits of far field imaging In the early 1870s, Ernst Abbe formulated a rigorous criterion for being able to resolve two objects in a light microscope: d > ë / (2sinè) where d

More information

Spatial detection of ferromagnetic wires using GMR sensor and. based on shape induced anisotropy

Spatial detection of ferromagnetic wires using GMR sensor and. based on shape induced anisotropy Spatial detection of ferromagnetic wires using GMR sensor and based on shape induced anisotropy Behrooz REZAEEALAM Electrical Engineering Department, Lorestan University, P. O. Box: 465, Khorramabad, Lorestan,

More information

taccor Optional features Overview Turn-key GHz femtosecond laser

taccor Optional features Overview Turn-key GHz femtosecond laser taccor Turn-key GHz femtosecond laser Self-locking and maintaining Stable and robust True hands off turn-key system Wavelength tunable Integrated pump laser Overview The taccor is a unique turn-key femtosecond

More information

Three-dimensional imaging with optical tweezers

Three-dimensional imaging with optical tweezers Three-dimensional imaging with optical tweezers M. E. J. Friese, A. G. Truscott, H. Rubinsztein-Dunlop, and N. R. Heckenberg We demonstrate a three-dimensional scanning probe microscope in which the extremely

More information

High-speed 1-frame ms scanning confocal microscope with a microlens and Nipkow disks

High-speed 1-frame ms scanning confocal microscope with a microlens and Nipkow disks High-speed 1-framems scanning confocal microscope with a microlens and Nipkow disks Takeo Tanaami, Shinya Otsuki, Nobuhiro Tomosada, Yasuhito Kosugi, Mizuho Shimizu, and Hideyuki Ishida We have developed

More information

Diode Lasers. 12 Orders of Coherence Control. Tailoring the coherence length of diode lasers

Diode Lasers. 12 Orders of Coherence Control. Tailoring the coherence length of diode lasers Diode Lasers Appl-1010 August 03, 2010 12 Orders of Coherence Control Tailoring the coherence length of diode lasers Anselm Deninger, Ph.D., and Thomas Renner, Ph.D. TOPTICA Photonics AG The control of

More information

Mode analysis of Oxide-Confined VCSELs using near-far field approaches

Mode analysis of Oxide-Confined VCSELs using near-far field approaches Annual report 998, Dept. of Optoelectronics, University of Ulm Mode analysis of Oxide-Confined VCSELs using near-far field approaches Safwat William Zaki Mahmoud We analyze the transverse mode structure

More information

Chapter Ray and Wave Optics

Chapter Ray and Wave Optics 109 Chapter Ray and Wave Optics 1. An astronomical telescope has a large aperture to [2002] reduce spherical aberration have high resolution increase span of observation have low dispersion. 2. If two

More information

An EPR Primer 2. Basic EPR Theory 2.1. Introduction to Spectroscopy 2.1.1

An EPR Primer 2. Basic EPR Theory 2.1. Introduction to Spectroscopy 2.1.1 An EPR Primer 2 This chapter is an introduction to the basic theory and practice of EPR spectroscopy. It gives you sufficient background to understand the following chapters. In addition, we strongly encourage

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION Induction of coherent magnetization switching in a few atomic layers of FeCo using voltage pulses Yoichi Shiota 1, Takayuki Nozaki 1, 2,, Frédéric Bonell 1, Shinichi Murakami 1,2, Teruya Shinjo 1, and

More information

High-Resolution Bubble Printing of Quantum Dots

High-Resolution Bubble Printing of Quantum Dots SUPPORTING INFORMATION High-Resolution Bubble Printing of Quantum Dots Bharath Bangalore Rajeeva 1, Linhan Lin 1, Evan P. Perillo 2, Xiaolei Peng 1, William W. Yu 3, Andrew K. Dunn 2, Yuebing Zheng 1,*

More information

Confocal Microscopy and Related Techniques

Confocal Microscopy and Related Techniques Confocal Microscopy and Related Techniques Chau-Hwang Lee Associate Research Fellow Research Center for Applied Sciences, Academia Sinica 128 Sec. 2, Academia Rd., Nankang, Taipei 11529, Taiwan E-mail:

More information

Ion Heating Arising from the Damping of Short Wavelength Fluctuations at the Edge of a Helicon Plasma Source

Ion Heating Arising from the Damping of Short Wavelength Fluctuations at the Edge of a Helicon Plasma Source Ion Heating Arising from the Damping of Short Wavelength Fluctuations at the Edge of a Helicon Plasma Source Division of Plasma Physics American Physical Society October 2012 Providence, RI Earl Scime,

More information

Electromagnetic Radiation

Electromagnetic Radiation Electromagnetic Radiation EMR Light: Interference and Optics I. Light as a Wave - wave basics review - electromagnetic radiation II. Diffraction and Interference - diffraction, Huygen s principle - superposition,

More information

Park NX-Hivac: Phase-lock Loop for Frequency Modulation Non-Contact AFM

Park NX-Hivac: Phase-lock Loop for Frequency Modulation Non-Contact AFM Park Atomic Force Microscopy Application note #21 www.parkafm.com Hosung Seo, Dan Goo and Gordon Jung, Park Systems Corporation Romain Stomp and James Wei Zurich Instruments Park NX-Hivac: Phase-lock Loop

More information