Analog Products. RadHard-by-Design. From Aeroflex Plainview HiRel Off-the-Shelf Products. Quad Operational Amps. Quad Comparators. Analog Multiplexers

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1 From Aeroflex Plainview irel Off-the-Shelf Products A passion for performance. Quad Operational Amps Quad Comparators Analog Multiplexers Converters D-to-A A-to-D Multiplexed A-to-D oltage evel Translators Radard-by-Design Analog Products March 01

2 Standard Products for irel Applications Click on Part Number for Detailed Data Sheet Description Single power supply operation: Radiation performance: 3.3 to CMOS EDRS Immune Total dose SE Immune Displacement Damage SM Pac k aeroflex.com/rhdseries age Analog Function Series Radard-by-Design D# Click on Drawing Number to iew SMD > 1 Mrad(Si) > 0 Me-cm/mg > 14 neutrons/cm Quad Op Amps RD900 Quad Operational Amplifier with rail-to-rail inputs and outputs for general purpose operational amplifier applications. 16 SOIC 96-41KXC RD901 Quad Operational Amplifier configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. 16 SOIC 96-4KXC RD90 igher-speed version of RD901 providing wider bandwidth and faster slew rate. 16 SOIC 96-43KXC RD903 Quad Differential output operational amplifier. Outputs are centered at DD/. 0 SOIC Pending RD904 Quad Instrumentation Amplifier. Gain 1, output centered at DD/. 16 SOIC Pending RD90 Differential output version of RD SOIC Pending RD9 Quad Comparator, igh Speed, for operation with dynamic signals on either or both inputs. Comparison is continuous as the circuit functions as a high gain open loop amplifier with a digital output. 16 SOIC KXC RD911 Quad Comparator with clocked comparator pairs to access & hold data until needed. 16 SOIC 96-40KXC RD91 Quad Comparator with open drain outputs. 16 SOIC KXC RD90 16:1 analog multiplexer. Channel selection is controlled by 4-bit binary addressing and an active low enable. 4 SOIC KXC RD91 16:1 buffered output voltage multiplexer. Channel selection is controlled by 4-bit binary addressing and an active low enable. Multiplexed voltages are buffered by a unity gain rail-to-rail amplifier. 4 SOIC KXC RD9 16:1 sample-and-hold multiplexer. Channel selection is controlled by a 4-bit binary address bus. Signal aquisition is controlled by internal low leakage sample-and-hold circuitry buffered by a unity gain rail-to-rail amplifier. 4 SOIC KXC RD98 8:1 analog multiplexer. Channel selection is controlled by 3-bit binary addressing and an active low enable. 16 SOIC KXC RD channels provided by four 16:1 multiplexers. Two address busses A(0-3) and B(0-3) and four enable lines afford flexible organization. 96 CQFP KXC RD channels. Triple 16:1, common address inputs A(0-3), separate enable and output. 96 CQFP KXC RD844 3 channels. Dual 16:1, separate address inputs A(0-3) and B(0-3), separate enable and output. 6 CQFP KXC RD930 Digital to Analog Converter, 11-bit, ladder output. 16 SOIC KXC RD931 Digital to Analog Converter, 11-bit, buffered output. 16 SOIC KXC RD bit Analog-to-Digital Converter 4 SOIC KXC RD90 Multiplexed 16:1 Multiplexed, 14-bit Analog-to-Digital Converter takes 16 analog sensor signals and using 4-bit binary addressing and an enable input, selects one of the 16 analog inputs and converts the signal to 14 digital output bits. The 14-bit digital output has a tri-state control allowing the connection of multiple RD90s. This provides very high level of telemetry integration interfacing many sensor voltage readings to the digital processor data bus. 48 CQFP KXC Octal Bidirectional oltage evel Shifter 4 SOIC KXC Quad Instrumentation Amps Quad Comparators Analog Multiplexers Digital-to-Analog Converters Analog-to-Digital Converters oltage evel Translators RD980 Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G

3 Standard Products Radard-by-Design RD900 Quad Operational Amplifier September, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Rail-to-Rail input and output range Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin,.411" x.93"w x.090"t - Weight grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD900 is a radiation hardened, single supply, quad operational amplifier in a 16-pin SOIC package. The RD900 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD900 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD900 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD900 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD900 Rev D Return to Selection Guide

4 CC +IN_A 4 3 A -IN_A +IN_B 7 OUT_B OUT_C 16 OUT_D 6 +IN_C 1 C -IN_C OUT_A B -IN_B IN_D 14 D -IN_D 1 13 EE FIGURE 1: BOCK DIAGRAM OUT_A 1 16 OUT_D -IN_A 1 -IN_D +IN_A IN_D CC 4 13 EE 1 +IN_C RD900 +IN_B -IN_B IN_C OUT_B 7 OUT_C N/C 8 9 N/C 16-Pin SOIC FIGURE : PACKAGE PIN-OUT Notes: 1. Package and lid are electrically isolated from signal pads.. It is recommended that N/C or no connect pins (pins 8 and 9) and lid be grounded. This eliminates or minimizes any ESD or static buildup. SCD900 Rev D 9//11 Aeroflex Plainview

5 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage CC - EE +6.0 CC +0.4 EE -0.4 ead Temperature (soldering, seconds) 300 C Thermal Resistance, Junction to Case, jc 7 C/W ESD Rating.0 K C 00 mw Input oltage NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to EE EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Input Offset oltage OS Input Offset Current Input Bias Current Conditions Min Typ Max Units - m IOS - pa IB -0 0 pa u/c Input Offset TempCo / IOST Common Mode Rejection Ratio CMRR 70 db Power Supply Rejection Ratio PSRR 70 db 4.9 Output oltage igh O ROUT = 3.6 Kohms to GND Output oltage ow O ROUT = 3.6 Kohms to CC Short Circuit Output Current / IO(SINK) OUT to CC IO(SOURCE) OUT to EE 0.1 ma ma Slew Rate SR R = 8K, Gain = 1. /us Open oop Gain / AO No oad 0 db UGBW R = K 4 ICCQ No oad Unity Gain Bandwidth / Quiescent Supply Current Channel Separation / en Phase Margin / m Mz. R = K, f = 1.0Kz Input-Referred oltage Noise / 6. db 90 F = kz 1 30 ma n/ z Deg Notes: 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not Tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. SCD900 Rev D 9//11 3 Aeroflex Plainview

6 RD900 QUAD OPERATIONA AMPIFIER APPICATION NOTES APPICATION NOTE 1: DUA POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 +. R1 R IN IN OUT +. R -. OUT -. R1 APPICATION NOTE : SINGE POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 R + R3 R1 + + IN IN R3 + BIAS BIAS OUT OUT R4 R R4 R1 Note: For OUT mid range of common mode voltage range, BIAS =./(1+R/R1), BIAS = +*R4/(R3+R4) SCD900 Rev D 9//11 4 Aeroflex Plainview

7 APPICATION NOTE 3: DIFFERENTIA INPUT AMPIFIER Differential Input Amplifier R4 R R OUT = R3 + R4 R1 R1 R R1 1 CC OUT R3 EE R4 Return to Selection Guide Note: Package and lid are electrically isolated from signal pads. FIGURE 3: PACKAGE OUTINE SCD900 Rev D 9//11 Aeroflex Plainview

8 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD900-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S 96-41KXC RD S 96-41KXA RD S 9641KXC RD S 9641KXA DA SMD Pending Package 16-pin SOIC Package DA SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD900 Rev D 9//11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

9 Standard Products Radard-by-Design RD901 Quad Operational Amplifier i-z Output Control September, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Rail-to-Rail input and output range Enable pin to Enable/Disable amplifiers in pairs. Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin,.411" x.93"w x.090"t - Weight grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD901 is a radiation hardened, single supply, quad operational amplifier with enable in a 16-pin SOIC package. The RD901 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD901 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD901 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD901 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD901 is configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. Several useful operational amplifier configurations are supported where more than one amplifier can feed an output with others disabled. SCD901 Rev D Return to Selection Guide

10 CC +IN_A 3 -IN_A 4 EN_AB 8 6 -IN_B 7 B OUT_B 1 +IN_C 11 -IN_C C EN_CD -IN_D OUT_A +IN_B +IN_D 1 A OUT_C D OUT_D 13 EE FIGURE 1: BOCK DIAGRAM OUT_A 1 16 OUT_D -IN_A 1 -IN_D +IN_A IN_D CC 4 13 EE +IN_B 1 +IN_C -IN_B IN_C OUT_B 7 OUT_C EN_AB 8 9 EN_CD RD Pin SOIC FIGURE : PACKAGE PIN-OUT Notes: 1. Package and lid are electrically isolated from signal pads.. EN_AB enables amplifiers A & B. EN_CD enables amplifiers C & D. SCD901 Rev D 9//11 Aeroflex Plainview

11 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage CC - EE +6.0 CC +0.4 EE -0.4 ead Temperature (soldering, seconds) 300 C Thermal Resistance, Junction to Case, jc 7 C/W ESD Rating.0 K C 00 mw Input oltage NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to EE EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Input Offset oltage OS Input Offset Current Input Bias Current Conditions Min Typ Max Units - m IOS - pa IB -0 0 pa u/c Input Offset TempCo / IOST Common Mode Rejection Ratio CMRR 70 db Power Supply Rejection Ratio PSRR 70 db 4.9 Output oltage igh O ROUT = 3.6 Kohms to GND Output oltage ow O ROUT = 3.6 Kohms to CC Short Circuit Output Current / IO(SINK) OUT to CC IO(SOURCE) OUT to EE 0.1 ma ma Slew Rate SR R = 8K, Gain = 1. /us Open oop Gain / AO No oad 0 db UGBW R = K 4 Unity Gain Bandwidth / SCD901 Rev D 9// Mz Aeroflex Plainview

12 EECTRICA PERFORMANCE CARACTERISTICS (continued) (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Max 70% CC - EE I igh (Enabled) O ow (Disabled) Input oltage - Enable (EN_AB, EN_CD) Input Current - Enable (EN_AB, EN_CD) Typ IEN All Amplifiers Enabled, No oad Quiescent Supply Current Units 30% CC - EE 0. ma 1 ua ICCQ All Amplifier Disabled Channel Separation / R = K, f = 1.0Kz Input-Referred oltage Noise / en Phase Margin / m db 90 F = kz 1 n/ z Deg 30 Notes: 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions Min Max Units Output Delay (Enabled) tonen 0 ns Output Delay (Disabled) toffen 0 ns CC ENABES (EN_AB or EN_CD) 0% GND tonen OUT (OUT_A&B or OUT_C&D) CC I Z I Z GND toffen FIGURE 3: RD901 SWITCING DIAGRAM SCD901 Rev D 9//11 4 Aeroflex Plainview

13 RD901 QUAD OPERATIONA AMPIFIER APPICATION NOTES APPICATION NOTE 1: DUA POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 EN R1 R +. IN IN EN OUT +. R -. OUT -. R1 APPICATION NOTE : SINGE POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 R + EN R1 R3 + + IN IN R3 + bias EN bias OUT OUT R4 R R4 R1 Note: For OUT mid range of common mode voltage range, BIAS =./(1+R/R1), BIAS = +*R4/(R3+R4) SCD901 Rev D 9//11 Aeroflex Plainview

14 APPICATION NOTE 3: DIFFERENTIA INPUT AMPIFIER APPICATION NOTE 4: MUTIPE AMPIFIERS Differential Input Amplifier Multiple Amplifiers - Selectable Output R4 R R OUT = R3 + R4 R1 R1 + R R1 1 A/B CC 1 OUT R3 EN1 OUT EE R4 EN C/D Note: Package and lid are electrically isolated from signal pads. FIGURE 4: PACKAGE OUTINE SCD901 Rev D 9//11 6 Aeroflex Plainview

15 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD901-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S 96-4KXC RD S 96-4KXA RD S 964KXC RD S 964KXA DA SMD Pending Package 16-pin SOIC Package DA SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD901 Rev D 9//11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 7

16 Standard Products Advanced Radard-by-Design RD90 Quad Operational Amplifier igh Speed with Enables December 0, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Unity Gain Bandwidth 3Mz Typical Rail-to-Rail input and output range Enable pin to Enable/Disable amplifiers in pairs. Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin,.411" x.93"w x.090"t - Weight grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD90 is a radiation hardened, single supply, high speed quad operational amplifier with enable in a 16-pin SOIC package. The RD90 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD90 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD90 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD90 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD90 is configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. Several useful operational amplifier configurations are supported where more than one amplifier can feed an output with others disabled. SCD90 Rev A Return to Selection Guide

17 CC +IN_A 3 -IN_A 4 EN_AB 8 6 -IN_B 7 B OUT_B 1 +IN_C 11 -IN_C C EN_CD -IN_D OUT_A +IN_B +IN_D 1 A OUT_C D OUT_D 13 EE FIGURE 1: BOCK DIAGRAM OUT_A 1 16 OUT_D -IN_A 1 -IN_D +IN_A IN_D CC 4 13 EE +IN_B 1 +IN_C -IN_B IN_C OUT_B 7 OUT_C EN_AB 8 9 EN_CD RD90 16-Pin SOIC FIGURE : PACKAGE PIN-OUT Notes: 1. Package and lid are electrically isolated from signal pads.. EN_AB enables amplifiers A & B. EN_CD enables amplifiers C & D. SCD90 Rev A Advanced 1/0/11 Aeroflex Plainview

18 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage CC - EE +6.0 CC +0.4 EE -0.4 ead Temperature (soldering, seconds) 300 C Thermal Resistance, Junction to Case, jc 7 C/W ESD Rating.0 K C 00 mw Input oltage NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to EE EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Input Offset oltage OS Input Offset Current Input Bias Current Conditions Min Typ Max Units - m IOS - pa IB -0 0 pa u/c Input Offset TempCo / IOST Common Mode Rejection Ratio CMRR 70 db Power Supply Rejection Ratio PSRR 70 db 4.9 Output oltage igh O ROUT = 70 ohms to GND Output oltage ow O ROUT = 70 ohms to CC Short Circuit Output Current / IO(SINK) OUT to CC IO(SOURCE) OUT to EE 0.1 ma -8 0 ma Slew Rate SR R = 8K, Gain = /us Open oop Gain / AO No oad 0 db UGBW R = K Unity Gain Bandwidth / SCD90 Rev A Advanced 1/0/ Mz Aeroflex Plainview

19 EECTRICA PERFORMANCE CARACTERISTICS (continued) (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Max 70% CC - EE I igh (Enabled) O ow (Disabled) Input oltage - Enable (EN_AB, EN_CD) Input Current - Enable (EN_AB, EN_CD) Typ IEN All Amplifiers Enabled, No oad Quiescent Supply Current Units 30% CC - EE 0. ma 1 ua ICCQ All Amplifier Disabled Channel Separation / R = K, f = 1.0Kz Input-Referred oltage Noise / en Phase Margin / m db 90 F = kz 46 n/ z Deg 30 Notes: 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions Min Max Units Output Delay (Enabled) tonen 0 ns Output Delay (Disabled) toffen 0 ns CC ENABES (EN_AB or EN_CD) 0% GND tonen OUT (OUT_A&B or OUT_C&D) CC I Z I Z GND toffen FIGURE 3: RD90 SWITCING DIAGRAM SCD90 Rev A Advanced 1/0/11 4 Aeroflex Plainview

20 RD90 QUAD OPERATIONA AMPIFIER APPICATION NOTES APPICATION NOTE 1: DUA POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 EN R1 R +. IN IN EN OUT +. R -. OUT -. R1 APPICATION NOTE : SINGE POWER SUPPY AMPIFIER Inverting Amplifier Non Inverting Amplifier R OUT = IN R1 R OUT = IN R1 R + EN R1 R3 + + IN IN R3 + bias EN bias OUT OUT R4 R R4 R1 Note: For OUT mid range of common mode voltage range, BIAS =./(1+R/R1), BIAS = +*R4/(R3+R4) SCD90 Rev A Advanced 1/0/11 Aeroflex Plainview

21 APPICATION NOTE 3: DIFFERENTIA INPUT AMPIFIER APPICATION NOTE 4: MUTIPE AMPIFIERS Differential Input Amplifier Multiple Amplifiers - Selectable Output R4 R R OUT = R3 + R4 R1 R1 + R R1 1 A/B CC 1 OUT R3 EN1 OUT EE R4 EN C/D Note: Package and lid are electrically isolated from signal pads. FIGURE 4: PACKAGE OUTINE SCD90 Rev A Advanced 1/0/11 6 Aeroflex Plainview

22 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD90-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S 96-43KXC RD90-01-S 96-43KXA RD S 9643KXC RD S 9643KXA DA SMD Pending Package 16-pin SOIC Package DA SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD90 Rev A Advanced 1/0/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 7

23 Standard Products Preview Radard-by-Design RD903 Quad Operational Amplifier Differential Amplifier with Enable July 13, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Differential Outputs Rail-to-Rail input and output range Enable pin to Enable/Disable amplifiers in pairs. Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 0-pin, 0.30"W x 0.0" x 0.1"t SOIC - Typical Weight 1.6 grams GENERA DESCRIPTION Aeroflex s RD903 is a radiation hardened, single supply, differential, quad operational amplifier with enable in a 0-pin SOIC package. The RD903 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD903 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD903 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD903 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD903 is configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. Several useful operational amplifier configurations are supported where more than one amplifier can feed an output with others disabled. SCD903 Rev A Return to Selection Guide

24 CC +IN_A 4 -IN_A 3 -IN_B +IN_C -IN_C -IN_D 1 -OUT_A OUT_B 1 0 -OUT_D +OUT_A 19 +OUT_D -IN_A IN_D +IN_A IN_D CC 16 EE RD OUT_C +IN_B 6 1 +IN_C 1 -OUT_C -IN_B IN_C +OUT_D +OUT_B OUT_C -OUT_B 9 1 -OUT_C EN_AB 11 EN_CD C OUT_A +OUT_B B 7 EN_CD +IN_D +OUT_A A EN_AB +IN_B D OUT_D EE 0-Pin SOIC FIGURE : PACKAGE PIN-OUT FIGURE 1: BOCK DIAGRAM Notes: 1. Package and lid are electrically isolated from signal pads.. EN_AB enables amplifiers A & B. EN_CD enables amplifiers C & D. Return to Selection Guide FIGURE 3: PACKAGE OUTINE SCD903 Rev A Preview 7/13/11 Aeroflex Plainview

25 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD903-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S Pending RD S Pending RD S Pending RD S Pending DSCC SMD Pending Package 0-pin SOIC Package DSCC SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD903 Rev A Preview 7/13/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 3

26 Standard Products Preview Radard-by-Design RD904 Quad Operational Amplifier Instrumentation Amplifier with Enables July 13, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm igh Speed Rail-to-Rail input and output range Enable pin to Enable/Disable amplifiers in pairs. Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin, 0.3"W x 0.4" x 0.1"t SOIC - Typical Weight 1. grams GENERA DESCRIPTION Aeroflex s RD904 is a radiation hardened, single supply, high speed, quad operational amplifier with enable in a 16-pin SOIC package. The RD904 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD904 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD904 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD904 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD904 is configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. Several useful operational amplifier configurations are supported where more than one amplifier can feed an output with others disabled. SCD904 Rev A Return to Selection Guide

27 CC +IN_A 3 -IN_A EN_AB +IN_B -IN_B +IN_C -IN_C -IN_D 1 A OUT_A 8 OUT_A 1 16 OUT_D -IN_A 1 -IN_D +IN_A IN_D CC 4 13 EE +IN_B 1 +IN_C -IN_B IN_C OUT_B 7 OUT_C EN_AB 8 9 EN_CD 6 7 B OUT_B 1 11 EN_CD +IN_D 4 C OUT_C D RD904 OUT_D 16-Pin SOIC 13 EE Notes: 1. Package and lid are electrically isolated from signal pads.. EN_AB enables amplifiers A & B. EN_CD enables amplifiers C & D. FIGURE : PACKAGE PIN-OUT FIGURE 1: BOCK DIAGRAM Note: Package and lid are electrically isolated from signal pads. FIGURE 3: PACKAGE OUTINE SCD904 Rev A Preview 7/13/11 Aeroflex Plainview

28 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD904-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S 96-44KXC RD S 96-44KXA RD S 9644KXC RD S 9644KXA DSCC SMD Pending Package 16-pin SOIC Package DSCC SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD904 Rev A Preview 7/13/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 3

29 Standard Products Preview Radard-by-Design RD90 Quad Operational Amplifier Instrumentation Differential Amplifier with Enable July 13, 011 FEATURES Single power supply operation (3.3 to.0) or dual power supply operation (±1.6 to ±.) Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Differential Outputs Rail-to-Rail input and output range Enable pin to Enable/Disable amplifiers in pairs. Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 0-pin, 0.30"W x 0.0" x 0.1"t SOIC - Typical Weight 1.6 grams GENERA DESCRIPTION Aeroflex s RD90 is a radiation hardened, single supply, differential, instrumentation, quad operational amplifier with enable in a 0-pin SOIC package. The RD90 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD90 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD90 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD90 amplifiers are capable of rail-to-rail input and outputs. Performance characteristics listed are for general purpose operational CMOS amplifier applications. The amplifiers will drive substantial resistive or capacitive loads and are unity gain stable under normal conditions. Resistive loads in the low kohm range can be handled without gain derating and capacitive loads of several nf can be tolerated. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD90 is configured with enable/disable control. Pairs of amplifiers are put in a power-down condition with their outputs in a high impedance state. Several useful operational amplifier configurations are supported where more than one amplifier can feed an output with others disabled. SCD90 Rev A Return to Selection Guide

30 CC +IN_A 4 -IN_A 3 -IN_B +IN_C -IN_C -IN_D 1 -OUT_A OUT_B 1 0 -OUT_D +OUT_A 19 +OUT_D -IN_A IN_D +IN_A IN_D CC 16 EE RD OUT_C +IN_B 6 1 +IN_C 1 -OUT_C -IN_B IN_C +OUT_D +OUT_B OUT_C -OUT_B 9 1 -OUT_C EN_AB 11 EN_CD C OUT_A +OUT_B B 7 EN_CD +IN_D +OUT_A A EN_AB +IN_B D OUT_D EE 0-Pin SOIC FIGURE : PACKAGE PIN-OUT FIGURE 1: BOCK DIAGRAM Notes: 1. Package and lid are electrically isolated from signal pads.. EN_AB enables amplifiers A & B. EN_CD enables amplifiers C & D. FIGURE 3: PACKAGE OUTINE SCD90 Rev A Preview 7/13/11 Aeroflex Plainview

31 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD90-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S Pending RD90-01-S Pending RD S Pending RD S Pending DSCC SMD Pending Package 0-pin SOIC Package DSCC SMD and Radiation Certification Pending EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD90 Rev A Preview 7/13/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 3

32 Preliminary Standard Products Radard-by-Design RD9 Quad Comparator igh Speed March, 01 FEATURES Single power supply operation at 3.3 or.0 Radiation performance - Total dose: - EDRS Immune - SE Immune - Neutron Displacement Damage >1Mrad(Si); Dose rate = rads(si)/s >0 Me-cm/mg >14 neutrons/cm Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin,.411" x.93"w x.090"t - Weight grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD9 is a radiation hardened, single supply, high speed, quad comparator in a 16-pin SOIC package. The RD9 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD9 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD9 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD9 quad comparator is intended for operation with dynamic signals on either or both inputs. Comparison is continuous, that is, the circuit functions as high gain open loop amplifiers with a digital output. For slow input signals with small input differences the comparators can be expected to respond to small noise signals at the inputs. Feedback hysteresis is the responsibility of the user to avoid chattering on system noise. The comparator will accept signals anywhere in the included power supply range. The circuit delay is specified for a half-volt single ended or differential input step of either polarity ending in an input polarity reversal of m. See Switching Diagrams. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected The devices will not latch with SEU events above 0 Mev-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD9 Rev C Return to Selection Guide

33 CC OUT_B 1 16 OUT_C +IN_A 4 6 A OUT_A 1 OUT_D N/C 3 14 N/C CC 4 13 GND -IN_A +IN_A 6 9 -IN_A +IN_B 1 +IN_D 11 -IN_D -IN_B 7 +IN_C +IN_B 8 9 -IN_C OUT_B 16 OUT_C 1 OUT_D 7 C 9 +IN_D 1 D -IN_D Pin SOIC 1 8 +IN_C -IN_C OUT_A B -IN_B 13 Notes: 1. Package and lid are electrically isolated from signal pads.. It is recommended that N/C or no connect pins (pins 3 and 14) and lid be grounded. This eliminates or minimizes any ESD or static buildup. RD9: QUAD COMPARATOR Comparator with ysteresis CC Threshold oltage R T = cc R1 + R R1 O R3 ysteresis Calculation R YS = O R + R3 T R RD9: APPICATION SCD9 Rev C Preliminary 3//1 Aeroflex Plainview

34 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage +CC +6.0 CC +0.4 GND -0.4 ead Temperature (soldering, seconds) 300 C ESD Rating.0 K C 0 mw Input oltage NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to GND EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units Input Offset oltage 1/ OS - m Input Offset Current / IOS -1 1 pa IB - pa /C Input Bias Current / Input Offset TempCo / IOST Common Mode Rejection Ratio 1/ CMRR 70 db Power Supply Rejection Ratio 1/ PSRR 70 db 4.9 Output oltage igh 1/ O IOUT = ma Output oltage ow 1/ O IOUT = ma Gain / A Quiescent Supply Current 1/ Notes: 0.1 /m ICCQ 7 ma 1/ Specification derated to reflect Total Dose exposure to 1 C. / Not tested. Shall be guaranteed by design, characterization or correlation to other test parameters. SCD9 Rev C Preliminary 3//1 3 Aeroflex Plainview

35 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Symbol Parameter Output Delay TOUT Conditions Min 1/ Max Units ns Note: 1/ The circuit delay is specified for a half-volt single ended or differential input step, of either polarity, ending in an input polarity reversal of m. -IN INPUT +IN O OUTPUT O TOUT RD9 SWITCING DIAGRAMS SCD9 Rev C Preliminary 3//1 4 Aeroflex Plainview

36 ORDERING INFORMATION Model DA SMD # Screening RD9-7 - Commercial Flow, + C testing only RD9-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD9-01-1S KXC RD9-01-S KXA RD S 96401KXC RD9-901-S 96401KXA DA SMD Pending Package 16-pin SOIC DA SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD9 Rev C Preliminary 3//1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused

37 Standard Products Preliminary Radard-by-Design RD911 Quad Comparator Clocked March, 01 FEATURES Single power supply operation at 3.3 or.0 Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Ultra low power Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin,.411" x.93"w x.090"t - Weight grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD911 is a radiation hardened, single supply, quad clocked comparator in a 16-pin SOIC package. The RD911 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD911 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD911 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD911 quad clocked comparator is intended for operation with dynamic signals on either or both inputs. Comparison is clocked, that is the circuit functions as a regenerative clocked latch with a digital output. For slow input signals with small input differences the comparators can be expected to respond to small noise signals at the inputs. Feedback hysteresis is the responsibility of the user to avoid chattering on system noise. The comparators will accept signals from (GND + 0.8) to CC. The max clocked frequency is 0Mz. The max clock-to-output delay is ns. CMOS device drives have a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected. The devices will not latch with SEU events above 0 Mev-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. The RD pin clocked comparator allow pairs of comparators to access and hold data until needed. SCD911 Rev C Return to Selection Guide

38 CC OUT_B 1 16 OUT_C +IN_A 6 OUT_A 1 OUT_D -IN_A CK_AB 3 14 CK_CD CK_AB +IN_B CC 4 -IN_A +IN_A 13 GND 1 +IN_D IN_D 911 -IN_B 7 +IN_C +IN_B 8 9 -IN_C -IN_B +IN_C -IN_C -IN_D A OUT_A B OUT_B 9 CK_CD +IN_D 4 16 C OUT_C D OUT_D Pin SOIC Notes: 1. Package and lid are electrically isolated from signal pads.. CK_AB clocks comparator A & B. CK_CD clocks comparator C & D. RD911: QUAD COCKED COMPARATOR Power Supply Alarm + R1 PS1 PSSENSE-1 R PS PSSENSE- R3 PSSENSE-3 PS3 R4 PSSENSE-4 PS4 CPU_CK R RD911: QUAD COCKED COMPARATOR SCD911 Rev C Preliminary 3//1 Aeroflex Plainview

39 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage +CC +6.0 CC +0.4 GND -0.4 ead Temperature (soldering, seconds) 300 C ESD Rating.0 K C 0 mw Input oltage NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to GND EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units Input Offset oltage 1/ OS - m Input Offset Current / IOS -1 1 pa IB - pa /C Input Bias Current / Input Offset TempCo / IOST Common Mode Rejection Ratio 1/ CMRR 70 db Power Supply Rejection Ratio 1/ PSRR 70 db 4.9 Output oltage igh 1/ O IOUT = ma Output oltage ow 1/ O IOUT = ma Input oltage - Clock (CK_AB, CK_CD) / I igh Input oltage - Clock (CK_AB, CK_CD) / O ow Input Current - Clock (CK_AB, CK_CD) / Quiescent Supply Current 1/ Notes: % CC 30% CC ICK 1 ICCQ A 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not Tested. Shall be guaranteed by design, characterization or correlation to other test parameters. SCD911 Rev C Preliminary 3//1 3 Aeroflex Plainview

40 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions Min Max Units Input Setup Time TS 1 ns Input old Time T ns Output Delay TD ns Clock Positive Pulse Width TWP Clock Frequency CK 0 ns Mz TWP CC 0% COCK GND TS T CC INPUT 0% GND CC 0% OUTPUT GND TD RD911 SWITCING DIAGRAMS SCD911 Rev C Preliminary 3//1 4 Aeroflex Plainview

41 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD911-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S 96-40KXC RD S 96-40KXA RD S 9640KXC RD S 9640KXA DA SMD Pending Package 16-pin SOIC DA SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD911 Rev C Preliminary 3//1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused

42 Preview Standard Products Radard-by-Design RD91 Quad Comparator Open Drain Outputs February 3, 01 FEATURES Single power supply operation at 3.3 or.0 Radiation performance - Total dose: - EDRS Immune - SE Immune - Neutron Displacement Damage >1Mrad(Si); Dose rate = rads(si)/s > 0 Me-cm/mg >14 neutrons/cm Short Circuit Tolerant Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16-pin, 0.3"W x 0.4" x 0.1"t SOIC - Typical Weight 1. grams GENERA DESCRIPTION Aeroflex s RD91 is a radiation hardened, single supply, quad comparator with open drain outputs in a 16-pin SOIC package. The RD91 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD91 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD91 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD91 quad comparator is intended for operation with dynamic signals on either or both inputs. Comparison is continuous, that is, the circuit functions as high gain open loop amplifiers with a digital output. For slow input signals with small input differences the comparators can be expected to respond to small noise signals at the inputs. Feedback hysteresis is the responsibility of the user to avoid chattering on system noise. The comparator will accept signals anywhere in the included power supply range. The circuit delay is specified for a half-volt single ended or differential input step of either polarity ending in an input polarity reversal of m. See Switching Diagrams. CMOS device drive has a negative temperature coefficient and the devices are therefore inherently tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are diode protected The devices will not latch with SEU events above 0 Mev-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD91 Rev A Return to Selection Guide

43 CC OUT_B 1 16 OUT_C +IN_A 4 6 A OUT_A 1 OUT_D N/C 3 14 N/C CC 4 13 GND -IN_A +IN_A IN_A +IN_B 1 +IN_D 11 -IN_D -IN_B 7 +IN_C +IN_B 8 9 -IN_C OUT_B 16 OUT_C 1 OUT_D 7 C 9 +IN_D 1 D -IN_D Pin SOIC 1 8 +IN_C -IN_C OUT_A B -IN_B 13 Notes: 1. Package and lid are electrically isolated from signal pads.. It is recommended that N/C or no connect pins (pins 3 and 14) and lid be grounded. This eliminates or minimizes any ESD or static buildup. RD91: QUAD COMPARATOR Comparator with ysteresis CC Threshold oltage R T = cc R1 + R R1 R4 O R3 ysteresis Calculation R YS = O R + R3 T R RD91: APPICATION SCD91 Rev A Preview /3/1 Aeroflex Plainview

44 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage +CC +6.0 CC +0.4 GND -0.4 ead Temperature (soldering, seconds) 300 C ESD Rating.0 K C 0 mw Input oltage NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter +CC Power Supply oltage CM Input Common Mode Range Typical Units 3.3 to.0 CC to GND EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units Input Offset oltage 1/ OS - m Input Offset Current / IOS -1 1 pa IB - pa /C Input Bias Current / Input Offset TempCo / IOST Common Mode Rejection Ratio 1/ CMRR 70 db Power Supply Rejection Ratio 1/ PSRR 70 db 4.9 Output oltage igh 1/ O IOUT = ma Output oltage ow 1/ O IOUT = ma Gain / A Quiescent Supply Current 1/ Notes: 0.1 /m ICCQ 7 1/ Specification derated to reflect Total Dose exposure to 1 C. / Not tested. Shall be guaranteed by design, characterization or correlation to other test parameters. SCD91 Rev A Preview /3/1 3 Aeroflex Plainview ma

45 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Symbol Parameter Output Delay TOUT Conditions Min 1/ Max Units ns Note: 1/ The circuit delay is specified for a half-volt single ended or differential input step, of either polarity, ending in an input polarity reversal of m. -IN INPUT +IN O OUTPUT O TOUT RD91 SWITCING DIAGRAMS SCD91 Rev A Preview /3/1 4 Aeroflex Plainview

46 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD91-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD91-01-S KXA RD S 96403KXC RD S 96403KXA DSCC SMD Pending Package 16-pin SOIC Package DSCC SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD91 Rev A Preview /3/1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused

47 Standard Products Preliminary Radard-by-Design RD90 Analog Multiplexer 16-Channel March 8, 011 FEATURES Single power supply operation at 3.3 to Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Full military temperature range Rail to Rail operation ow power consumption < 1.0mW One address bus (A0-3), and one enable line Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 4-pin, 0.3"W x 0.6" x 0.1"t SOIC - Typical Weight grams GENERA DESCRIPTION Aeroflex s RD90 is a radiation hardened, single supply, 16 Channel Multiplexer in a 4-pin SOIC package. The RD90 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD90 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD90 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD90 is a 16 to 1 CMOS multiplexer. Channel selection is controlled by 4 bit binary addressing and an active low enable. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD90 Rev B Return to Selection Guide

48 OUT 1 4 CC C1 3 C7 C14 3 C6 C C C1 0 C C3 18 C C11 90 C1 16 MUX C0 C 7 C C1 C C0 A3 1 EN A A0 GND 1 13 A1 OUT EN A3 A A1 A0 Notes: 1. Package and lid are electrically isolated from signal pads. RD90: 16 CANNE ANAOG MUX SCD90 Rev B Preliminary 3/8/11 Aeroflex Plainview

49 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C +6.0 Digital Input Overvoltage (EN, A) < CC +0.4 > GND -0.4 Analog Input Over oltage (C0-C1) < CC +0.4 > GND -0.4 Supply oltage (+CC) NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC +CC Parameter EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Parameter Supply Current (+CC) Symbol Conditions Units EN = 30% CC - A +ISBY EN = 70% CC - A + C - IA A = 30% CC +1 C C - +1 C C - +1 C C - +1 C C - +1 C C - +1 C C - +1 C C C C - 00 IA IEN A = 70% CC EN = 30% CC Enable Input Current (EN) IEN igh Input eakage Current (C0-C1) IINK ow Input eakage Current (C0-C1) IINK0 Output eakage Current (OUT) IOUTK SCD90 Rev B Preliminary 3/8/11 Max +ICC Address Input Current (A0-A3) Switch ON Resistance Min RDSON EN = 70%CC IN = +, EN =70% CC, Output and all unused MUX inputs under test = 0 IN = 0, EN =70% CC Output and all unused MUX inputs under test = + OUT = +, EN = 70% CC, All inputs grounded except channel being tested IN = 0, IN = +., IN = + EN = 30% CC IOUT = -1mA 3 Aeroflex Plainview

50 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions ta OUT igh to ow Transition Temp Min Max Units - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns A 00 ns Address to Output Delay ta OUT ow to igh Transition tonen (Enabled) Enable to Output Delay toffen (Disabled) TRUT TABE (C0 C1) A3 A A1 A0 EN "ON" CANNE 1/ X X X X NONE C0 C1 C C3 C4 C C6 C7 C8 C9 C C11 C1 C13 C14 C1 1/ Between (C0-C1) and OUT SCD90 Rev B Preliminary 3/8/11 4 Aeroflex Plainview

51 Address ines (A0 - A3) CC 0% GND CC 0% OUT GND t A CC Address ines (A0 - A3) 0% GND CC OUT 0% GND t A CC (Enable) EN 0% GND CC OUT 0% GND tonen toffen NOTE: f = Kz, Duty cycle = 0%. RD90 SWITCING DIAGRAMS SCD90 Rev B Preliminary 3/8/11 Aeroflex Plainview

52 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD90-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD90-01-S KXA RD S KXC RD S KXA DSCC SMD Pending Package 4-pin SOIC DSCC SMD and Radiation Certification Pending Return to Selection Guide Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD90 Rev B Preliminary 3/8/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

53 Standard Products Preliminary Radard-by-Design RD91 Analog oltage Multiplexer 16-Channel, Buffered March 8, 011 FEATURES Single power supply operation at 3.3 to Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Full military temperature range ow Power consumption when enabled CMOS analog switching allows rail to rail operation and low switch impedance Address bus (A0-3), and one enable line igh input impedance Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 4-pin, 0.3"W x 0.6" x 0.1"t SOIC - Typical Weight grams GENERA DESCRIPTION Aeroflex s RD91 is a radiation hardened, single supply, 16 channel buffered output multiplexer in a 4-pin SOIC package. The RD91 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD91 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD91 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD91 is a 16 to 1 CMOS buffered output voltage multiplexer. Channel selection is controlled by 4 bit binary addressing and an active low enable. Multiplexed voltages are buffered by a unity gain CMOS Rail-to-Rail amplifier. When the RD91 is disabled, the chip is put into a power-down state and the output is tri-stated. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD91 Rev B Return to Selection Guide

54 OUT 1 4 CC C1 3 C7 C14 3 C6 C C 0 C4 19 C3 C1 C11 6 C 7 18 C C C1 C C0 A3 1 EN A A0 GND 1 13 A1 91 EN C1 16 MUX C0 OUT A3 A A1 A0 Note: 1. Package and lid are electrically isolated from signal pads. RD91: 16 CANNE BUFFERED ANAOG MUX SCD91 Rev B Preliminary 3/8/11 Aeroflex Plainview

55 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C +6.0 Digital Input Overvoltage (EN, A) < CC +0.4 > GND -0.4 Analog Input Overvoltage (C0-C1) < CC +0.4 > GND -0.4 Supply oltage (+CC) NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC +CC Parameter EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Parameter Supply Current (+CC) Symbol Conditions 0. ma +ISBY EN = 70% CC 0 A + C - IA A = 30% CC +1 C C - +1 C C - +1 C C - +1 C -0 0 IN = +, EN =70% CC, + C Output and all unused MUX inputs under test = 0 +1 C C - +1 C -0 0 IEN A = 70% CC EN = 30% CC Enable Input Current (EN) IEN SCD91 Rev B Preliminary 3/8/11 Units EN = 30% CC IA Output eakage Current (OUT) Max +ICC Address Input Current (A0-A3) Input eakage Current (C0-C1) Min +IINK +IOUTK EN = 70% CC Tri-state, EN > 70% CC 3 Aeroflex Plainview

56 EECTRICA PERFORMANCE CARACTERISTICS (continued) (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Parameter Symbol Output ON oltage Conditions Min Max Units ON1 IN = olts, R = K ON IN = olts, R = 1K ON3 IN = 3.3 olts, R = K SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions Min Max Units 1 3 us TA 1 3 us TS /us 0.8. us 0 30 ns TA Address to Output Delay (ON, OFF) f = Kz, IN = olts, R = K Output Slew Rate TONEN Enable to Output Delay f = Kz, IN = olts, R = 1K TOFFEN TRUT TABE (C0 C1) A3 A A1 A0 EN "ON" CANNE 1/ X X X X NONE C0 C1 C C3 C4 C C6 C7 C8 C9 C C11 C1 C13 C14 C1 1/ Between (C0-C1) and OUT SCD91 Rev B Preliminary 3/8/11 4 Aeroflex Plainview

57 Address ines (A0 - A3) CC 0% GND 90% CC 0% OUT (OFF) % TA GND TS CC Address ines (A0 - A3) 0% GND 90% CC 0% OUT (ON) % GND TA TS CC (Enable) EN 0% GND CC OUT 0% GND tonen toffen RD91 SWITCING DIAGRAMS SCD91 Rev B Preliminary 3/8/11 Aeroflex Plainview

58 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD91-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD91-01-S KXA RD S 96430KXC RD S 96430KXA DSCC SMD Pending Package 4-pin SOIC DSCC SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD91 Rev B Preliminary 3/8/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

59 Standard Products Preliminary Radard-by-Design RD9 Analog Multiplexer 16-Channel, Sample-and-old March 8, 011 FEATURES Single power supply operation at 3.3 to Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Full military temperature range CMOS analog switching allows rail to rail operation Address bus (A0-3), and one sample-and-hold line Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 4-pin, 0.3"W x 0.6" x 0.1"t SOIC - Typical Weight grams GENERA DESCRIPTION Aeroflex s RD9 is a radiation hardened, single supply, 16 channel sample-and-hold multiplexer in a 4-pin SOIC package. The RD9 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD9 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD9 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD9 is a 16 to 1 CMOS sample-and-hold multiplexer. Channel selection is controlled by a 4 bit address bus. Signal aquisition is controlled by the sample-and-hold. ow internal leakage allows for droop rate as low as 0.1/sec All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD9 Rev B Return to Selection Guide

60 OUT 1 4 CC C1 3 C7 C14 3 C6 C C C1 0 C4 C C3 C 7 18 C C C1 C C0 A3 1 S/ A A0 GND 1 13 A1 9 S/ C1 16 MUX C0 OUT A3 A A1 A0 Notes: 1. Package and lid are electrically isolated from signal pads. RD9: 16 CANNE SAMPE-AND-OD ANAOG MUX SCD9 Rev B Preliminary 3/8/11 Aeroflex Plainview

61 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C +6.0 Digital Input Overvoltage (S, A) < CC +0.4 > GND -0.4 Analog Input Over oltage (C0-C1) < CC +0.4 > GND -0.4 Supply oltage (+CC) NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Typical Units Power Supply oltage 3.3 to.0 S, A ogic ow evel 30% CC S, A ogic igh evel 70% CC +CC Parameter EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC= + -- UNESS OTERWISE SPECIFIED) Parameter Symbol Supply Current (+CC) Conditions Min Max Units 0 ua + C - +1 C C - +1 C C - +1 C C - +1 C C - +1 C ICC IA(0-3) A = 30% CC Address Input Current (A0-A3) IA(0-3) IS A = 70% CC S = 30% CC Sample-and-old Input Current (S / ) IS Input eakage Current (C0-C1) Output ON oltage Input oad Capacitance SCD9 Rev B Preliminary 3/8/11 +IINK S = 70% CC IN = +, S = 70% CC ON1 IN = +, R = K ON IN = +, R = 1K ON3 IN = +3.3, R = K pf CIN 3 Aeroflex Plainview

62 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Symbol Parameter Conditions Min Max Units Address (low-to-high) to Output ta f = Kz, IN = +, R =k 1 us Address (high-to-low) to Output ta f = Kz, IN = +, R =k 1 us Droop Rate DR /s Data Setup Time tds 10 - ns Data old Time td 10 - ns TRUT TABE (C0 C1) A3 A A1 A0 "ON" CANNE 1/ C0 C1 C C3 C4 C C6 C7 C8 C9 C C11 C1 C13 C14 C1 1/ Between (C0-C1) and OUT SCD9 Rev B Preliminary 3/8/11 4 Aeroflex Plainview

63 RD9 SWITCING DIAGRAMS SCD9 Rev B Preliminary 3/8/11 Aeroflex Plainview

64 ORDERING INFORMATION Model DSCC SMD # Screening RD9-7 - Commercial Flow, + C testing only RD9-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD9-01-1S KXC RD9-01-S KXA RD S KXC RD9-901-S KXA DSCC SMD Pending Package 4-pin SOIC DSCC SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD9 Rev B Preliminary 3/8/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

65 Standard Products Preliminary Radard-by-Design RD98 Analog Multiplexer 8-Channel August 31, 011 FEATURES Single power supply operation at 3.3 to Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Full military temperature range Rail to Rail operation ow power consumption < 1.0mW One address bus (A0-), and one enable line Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 16-pin, 0.3"W x 0.4" x 0.1"t SOIC - Typical Weight 1. grams GENERA DESCRIPTION Aeroflex s RD98 is a radiation hardened, single supply, 8 Channel Multiplexer in a 16-pin SOIC package. The RD98 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD98 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD98 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD98 is an 8 to 1 CMOS multiplexer. Channel selection is controlled by 3 bit binary addressing and an active low enable. All inputs and outputs are diode protected. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD98 Rev A Return to Selection Guide

66 OUT 1 16 CC C7 1 N/C C C3 C 4 13 C C4 1 C C0 A1 7 EN GND 8 9 A0 A 98 C7 8 MUX C0 OUT EN A A1 A0 Notes: 1. Package and lid are electrically isolated from signal pads. RD98: 8 CANNE ANAOG MUX SCD98 Rev A Preliminary 8/31/11 Aeroflex Plainview

67 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C +6.0 Digital Input Overvoltage (EN, A) < CC +0.4 > GND -0.4 Analog Input Over oltage (C0-C7) < CC +0.4 > GND -0.4 Supply oltage (+CC) NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC +CC Parameter EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Parameter Symbol Supply Current (+CC) Conditions Units EN = 30% CC - A +ISBY EN = 70% CC - A + C - IA A = 30% CC +1 C C - +1 C C - +1 C C - +1 C C - +1 C C - +1 C C - +1 C C C C - 00 IA IEN A = 70% CC EN = 30% CC Enable Input Current (EN) IEN igh Input eakage Current (C0-C7) IINK ow Input eakage Current (C0-C7) IINK0 Output eakage Current (OUT) IOUTK RDSON SCD98 Rev A Preliminary 8/31/11 Max +ICC Address Input Current (A0-A) Switch ON Resistance Min EN = 70%CC IN = +, EN =70% CC, Output and all unused MUX inputs under test = 0 IN = 0, EN =70% CC Output and all unused MUX inputs under test = + OUT = +, EN = 70% CC, All inputs grounded except channel being tested IN = 0, IN = +., IN = + EN = 30% CC IOUT = -1mA 3 Aeroflex Plainview

68 SWITCING CARACTERISTICS (TC = - C TO +1 C, +CC = + -- UNESS OTERWISE SPECIFIED) Symbol Parameter ta Conditions OUT igh to ow Transition Temp Min Max Units - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns A 00 ns Address to Output Delay ta tonen OUT ow to igh Transition (Enabled) Enable to Output Delay toffen (Disabled) TRUT TABE (C0 C7) A A1 A0 EN "ON" CANNE 1/ X X X NONE C0 C1 C C3 C4 C C6 C7 1/ Between (C0-C7) and OUT SCD98 Rev A Preliminary 8/31/11 4 Aeroflex Plainview

69 Address ines (A0 - A) CC 0% GND CC 0% OUT GND t A CC Address ines (A0 - A) 0% GND CC OUT 0% GND t A CC (Enable) EN 0% GND CC OUT 0% GND tonen toffen NOTE: f = Kz, Duty cycle = 0%. RD98 SWITCING DIAGRAMS SCD98 Rev A Preliminary 8/31/11 Aeroflex Plainview

70 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD98-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD98-01-S KXA RD S KXC RD S KXA DA SMD Pending Package 16-pin SOIC DA SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD98 Rev A Preliminary 8/31/11 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

71 Return to Selection Guide Advanced Standard Products Radard-by-Design RD930 Digital-to-Analog Converter 11-Bit adder Output July 1, 011 FEATURES Radiation performance - Total dose: - EDRS Immune - SE Immune: - Neutron Displacement Damage: >1Mrad(Si), Dose rate = rads(si)/s >0 Me-cm/mg >14 neutrons/cm 11-Bit DAC Single power supply operation at +3.3 to + ow Power Full 4-quadrant multiplying DAC CMOS/TT inputs Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16 leads, 0.3"W x 0.4" x 0.1t SOIC - Typical Weight 1. grams CC PREF AOUT D:D00 GND NREF SCEMATIC SYMBO GENERA DESCRIPTION The Aeroflex 11-Bit DAC is a standard CMOS R/R Kelvin resistor network. The digital inputs, D(MSB) through D00(SB), are buffered to drive single-pole double-throw CMOS switches to apply either the PREF or NREF signals to the R legs of the resistor network. The output is unbuffered. PREF and NREF inputs can be any static or dynamic voltage within the power supply range. The nominal values or R and R are K and K respectively. The characteristic impedance of the resistor network is approximately K. The voltage-output configuration of the integrated circuit can be thought of as a digitally controlled voltage with a value of PREF-NREF and an output impedance of approximately K. The output will swing rail-to-rail if unloaded. The DAC can also be operated in the so-called "inverted" mode where any voltage between the power rails can be applied to the output and currents into a very low impedance (operational amplifier summing junction for example) can be obtained from the PREF and NREF ports. The sum of the currents is constant and the proportion at PREF and NREF is controlled by the digital input number. Applications include digital potentiometers, programmable voltage sources and a large variety of other circuits that can be found in many industry references. SCD930 Rev A

72 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C ead Temperature (soldering, seconds) 300 C Thermal Resistance, Junction to Case, jc C/W Supply oltage +CC +6.0 PREF relative to NREF +6.0 CC +0.4 GND -0.4 ESD Rating.0 K C 00 mw Digital Input oltage NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol +CC Parameter Power Supply oltage Typical Units 3.3 to.0 EECTRICA PERFORMANCE CARACTERISTICS (Tc = - C to +1 C, +cc = Unless otherwise specified) Parameter Symbol Conditions Min Typ Max Units Resolution N 11 Bits Relative Accuracy RA 0. % of FSR Gain Error AE 0.1 % of FSR Output eakage IO NA Output Settling Time TD 0 ns PREF Input Z ZP K NREF Input Z ZR K Input i oltage I Input o oltage I 0.8 II, II 0 pa Input eakage Note: 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not Tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. SCD930 Rev A Advanced 7/1/11 Aeroflex Plainview

73 ORDERING INFORMATION Model DSCC SMD # Screening RD Commercial Flow, + C testing only RD930-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD S KXA RD S KXC RD S KXA Package 16-pin SOIC Package DSCC SMD Pending DSCC SMD and Radiation Certification Pending PREF 1 16 AOUT NREF 1 CC GND 3 14 D00(SB) (MSB)D 4 13 D01 1 D0 930 D09 D D03 D07 7 D04 D D0 PACKAGE OUTINE PACKAGE PINOUT EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused SCD930 Rev A Advanced 7/1/11 3

74 Return to Selection Guide Advanced Standard Products Radard-by-Design RD931 Digital-to-Analog Converter 11-Bit Buffered Output December 13, 011 FEATURES Radiation performance - Total dose: - EDRS Immune - SE Immune: - Neutron Displacement Damage: >1Mrad(Si), Dose rate = rads(si)/s >0 Me-cm/mg >14 neutrons/cm 11-Bit DAC Buffered Output Single power supply operation at +3.3 to + ow Power Full 4-quadrant multiplying DAC CMOS/TT inputs Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 16 leads, 0.411" x 0.93"W x 0.090"t - Typical Weight 0.8 grams CC PREF Unity Gain Buffer D:D00 11-Bit D-to-A AOUT GND NREF SCEMATIC SYMBO Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION The Aeroflex 11-Bit DAC is a standard CMOS R/R Kelvin resistor network with a buffered output. The digital inputs, D(MSB) through D00(SB), are buffered to drive single-pole double-throw CMOS switches to apply either the PREF or NREF signals to the R legs of the resistor network. PREF and NREF inputs can be any static or dynamic voltage within the power supply range. The nominal values for R and R are K and K respectively. The characteristic impedance of the resistor network is approximately K. The voltage-output configuration of the integrated circuit can be thought of as a digitally controlled voltage with a value of PREF-NREF with a high output impedance. The output will swing rail-to-rail if unloaded. Applications include digital potentiometers, programmable voltage sources and a large variety of other circuits that can be found in many industry references. SCD931 Rev A

75 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C ead Temperature (soldering, seconds) 300 C Thermal Resistance, Junction to Case, jc C/W Supply oltage +CC +6.0 PREF relative to NREF +6.0 CC +0.4 GND -0.4 ESD Rating.0 K C 00 mw Digital Input oltage NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol +CC Parameter Power Supply oltage Typical Units 3.3 to.0 EECTRICA PERFORMANCE CARACTERISTICS (Tc = - C to +1 C, +cc = Unless otherwise specified) Parameter Max Units ICC ma Resolution N 11 Bits Relative Accuracy RA 0. % of FSR Gain Error AE 0.1 % of FSR Output eakage / IO N/A Output Settling Time TD us PREF Input Z / ZP K NREF Input Z / ZR K Input i oltage I Input o oltage I 0.8 Input eakage / II, II 0 pa Supply Current Symbol Conditions Min Typ Note: 1/ Specification derated to reflect Total Dose exposure to 1 + C. / Not Tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. SCD931 Rev A Advanced 1/13/11 Aeroflex Plainview

76 Model Number Package DA SMD # Screening RD Commercial Flow, + C testing only RD931-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD S KXA RD S KXC RD S KXA 16-Pin Ceramic SOIC In accordance with DA SMD (Pending) PREF 1 16 AOUT(Buffered) NREF 1 CC GND 3 14 D00(SB) (MSB)D 4 13 D01 1 D0 931 D09 D D03 D07 7 D04 D D0 PACKAGE OUTINE PACKAGE PINOUT EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused SCD931 Rev A Advanced 1/13/11 3

77 Standard Products Advanced Radard-by-Design RD Bit Analog to Digital Converter January, 01 FEATURES Single power supply operation 3.3 to.0 Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm 14-Bit Digital Output Successive Approximation A-to-D Tri-State digital outputs Power Down (Sleep) mode Single or continuous conversion 0 clock conversion period Digital output available until the completion of the next conversion Busy (Prime) and End-of-Conversion status outputs 000 Input/Output ESD protection Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 4-pin, 0.614" x 0.99"W x 0.10"t SOIC - Typical Weight grams Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD940 is a radiation hardened, single supply, 14-Bit Analog-to-Digital converter in a 4-pin SOIC package. The RD940 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD940 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD940 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD940 takes an analog signal and performs a 14-bit successive approximation analog-to-digital conversion in a nominal period of 0uS. The 14-Bit digital output has a tri-state control allowing the connection of multiple RD940s. This provides the ability to interface many voltage readings to the digital processor data bus. The full-scale range is determined by reference input voltages which will typically include any ~ 4 volt span anywhere in the power supply range (nominal supply). The input impedance of the reference/span terminals is a constant 4K ohms. Gain compression will occur near either power supply extremes but can be avoided if the references are more than 00m away from the respective supply terminals. The input span can be less than 4 volts at the expense of ultimate resolution SCD940 Rev A Return to Selection Guide

78 The analog input impedance is primary capacitance (0pF). The input voltage charges a track-and-hold hold capacitor through transmission gates. The input bandwidth is determined by the slew rate of the hold amplifier and is adequate to allow input sampling in three clock periods (3uS nominal). The ultimate bandwidth is determined by the aperture uncertainty associated with the closing of the sample gate (approximately ns). The converter bandwidth is then determined by the sampling Nyquist frequency rather than the input signal; change rate (dv/dt) and the SB weight in volts as would be the case if there were no sample and hold. Start-Convert (STCN_), Busy (BUSY_) and End-Of-Convert (EOC_) status and control line are provided. The converter will operate in either continuous or single conversion modes. To operate in continuous mode, STCN_ should be tied to BUSY_. The digital output register changes at the end of a conversion and is available while BUSY_ is igh. Digital input and output circuits operate from a voltage independent of the remainder of the chip such that I/O is compatible with digital systems from, less than 3.3 volts to volts. The converter divides the reference voltage into 16 segments with a linear weighted resistor network. The voltage on any segment is passed to a linear -bit DAC for interpolation. The architecture is inherently capable of monotonic operation. IN is ± SBs. DN is ±1/ SB. The sampled input voltage is compared to the output of the two stage DAC for a 14-bit successive approximation conversion. All inputs are protected to both power supply rails by semiconductor diodes. Inputs should be constrained to cc +0.4 and ee-0.4 to avoid forward biasing protection paths. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. Notes: - The STCN_ is a dynamic input and should not be tied to a static voltage. - The input signal should be low pass filtered to reduce high frequency noise FIGURE 1: BOCK DIAGRAM SCD940 Rev A Advanced 1//1 Aeroflex Plainview

79 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage CC - EE +6.0 CC +0.4 EE C Thermal Resistance, Junction to Case, jc 3. C/W ESD Rating.0 K TBD mw Input oltage ead Temperature (soldering, seconds) C NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol +CC Parameter Power Supply oltage Typical Units.0 EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units Supply Current Sleep ICCS 4 ma Supply Current Active ICCD ma igh Analog Reference oltage PREF 4 ow Analog Reference oltage NREF 1 GND Full-scale Input Range Operating Range 0 PREF NREF -0.1 PREF NREF +0.1 Input Capacitance 40 pf EOB 14 BITS Integral Non inearity IN 0. SB Differential Non inearity DN 0. SB Effective Number of Bits DC Offset TBD DC Gain 1 Reference Input Current SCD940 Rev A Advanced 1//1 TBD Input Range ma Aeroflex Plainview

80 EECTRICA PERFORMANCE CARACTERISTICS (continued) (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units fsampe(max) KSPS Conversion Time tcon 16 Clk Cycles Acquisition Time tacq 4 Clk Cycles Signal to Noise Ratio SNR TBD db Maximum Sampling Rate FIGURE : BASIC TIMING DIAGRAM SCD940 Rev A Advanced 1//1 4 Aeroflex Plainview

81 Pin # Signal Definition 1 AIN Analog Input NREF ow Analog Reference oltage 3 CC Supply oltage 4 STCN_ Start Conversion OE_ Output Enable 6 CK Clock Input 7 B00 Digital Output 00 8 B01 Digital Output 01 9 B0 Digital Output 0 B03 Digital Output B04 Digital Output 04 1 B0 Digital Output 0 13 B06 Digital Output B07 Digital Output 07 1 B08 Digital Output B09 Digital Output B Digital Output 18 B11 Digital Output B1 Digital Output 1 0 B13 Digital Output 13 1 EOC_ End of Convert BUSY_ Busy 3 EE Supply Return 4 PREF igh Analog Reference oltage FIGURE 3: PACKAGE PIN-OUT AND SIGNA DEFINITION SCD940 Rev A Advanced 1//1 Aeroflex Plainview

82 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD940-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD S KXA RD S KXC RD S KXA Package DA SMD Pending 4-pin SOIC Package DA SMD and Radiation Certification Pending Note: Package and lid are electrically isolated from signal pads. FIGURE 4: PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD940 Rev A Advanced 1//1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

83 Standard Products Advanced Radard-by-Design RD90 16-Channel Multiplexed 14-Bit Analog-to-Digital Converter March, 01 FEATURES Single power supply operation 3.3 to.0 Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm 16-Channel Input Multiplexer Successive Approximation A-to-D evel Shifting Digital I/O Receiver/Drivers allow interfaces to.0 or 3.3 volt logic Tri-State digital outputs Power Down (Sleep) mode Single or continuous conversion 0 clock conversion period Digital output available until the completion of the next conversion Multiplexer address is latched on first clock rising edge of a cycle Busy (Prime) and End-of-Conversion status outputs 000 Input/Output ESD protection Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic Ceramic - 48 leads, 0.70"Sq x 0.11"t quad flat pack - Weight - 6 grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD90 is a radiation hardened, single supply, 16-Channel Multiplexed Analog-to-Digital converter in a 48-pin Ceramic Quad Flat Package. The RD90 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD90 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD90 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD90 takes 16 analog sensor signals and using 4 address inputs and an enable input, selects one of the 16 analog inputs and performs a 14-bit successive approximation analog-to-digital conversion in a nominal period of 0uS. The 14-bit digital output has a tri-state control allowing the connection of multiple RD90s. This provides the ability to interface many sensor voltage readings to the digital processor data bus. The full-scale range is determined by reference input voltages which will typically include any ~ 4 volt span anywhere in the power supply range (nominal supply). The input impedance of the reference/span terminals is a constant 4K ohms. SCD90 Rev B Return to Selection Guide

84 Gain compression will occur near either power supply extremes but can be avoided if the references are more than 00m away from the respective supply terminals. The input span can be less than 4 volts at the expense of ultimate resolution The analog channels input impedance is primary capacitance (0pF). The input voltage charges a track-and-hold hold capacitor through transmission gates. The input bandwidth is determined by the slew rate of the hold amplifier and is adequate to allow input sampling in three clock periods (3uS nominal). The ultimate bandwidth is determined by the aperture uncertainty associated with the closing of the sample gate (approximately ns). The converter bandwidth is then determined by the sampling Nyquist frequency rather than the input signal; change rate (dv/dt) and the SB weight in volts as would be the case if there were no sample and hold. Start-Convert (STCN_), Busy (BUSY_) and End-Of-Convert (EOC_) status and control line are provided. The converter will operate in either continuous or single conversion modes. To operate in continuous mode, STCN_ should be tied to BUSY_. The digital output register changes at the end of a conversion and is available while BUSY_ is igh. Digital input and output circuits operate from a voltage independent of the remainder of the chip such that I/O is compatible with digital systems from, less than 3.3 volts, to volts. The converter divides the reference voltage into 16 segments with a linear weighted resistor network. The voltage on any segment is passed to a linear -bit DAC for interpolation. The architecture is inherently capable of monotonic operation. IN is ± SBs. DN is ±1/ SB. The sampled input voltage is compared to the output of the two stage DAC for a 14-bit successive approximation conversion. All inputs are protected to both power supply rails by semiconductor diodes. Inputs should be constrained to cc +0.4 and ee-0.4 to avoid forward biasing protection paths. The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. Notes: - The STCN_ is a dynamic input and should not be tied to a static voltage. - The input signals should be low pass filtered to reduce high frequency noise FIGURE 1: BOCK DIAGRAM SCD90 Rev B Advanced 3//1 Aeroflex Plainview

85 ABSOUTE MAXIMUM RATINGS Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Junction Temperature +10 C Supply oltage CC - EE +6.0 CC +0.4 EE C Thermal Resistance, Junction to Case, jc 3. C/W ESD Rating.0 K TBD mw Input oltage ead Temperature (soldering, seconds) C NOTICE: Stresses above those listed under Absolute Maximums Rating may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Typical Units.0 +ACC Analog Power Supply oltage +DCC Digital Power Supply oltage.0 DRP Digital Output igh Reference evel 3.3 to.0 DRN Digital Output ow Reference evel GND EECTRICA PERFORMANCE CARACTERISTICS (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units Digital Supply Current Sleep DICCS 1 ma Digital Supply Current Active DICCA 1 ma Analog Supply Current Sleep AICCS ma AICCA ma Digital IO Supply Current Sleep DIOICCS 1 ma Digital IO Supply Current Active DIOICCA ma igh Analog Reference oltage PREF ow Analog Reference oltage NREF Analog Supply Current Active 4 GND Full-scale Input Range Operating Range 1 0 PREF NREF -0.1 PREF NREF +0.1 Input Capacitance 40 pf Effective Number of Bits EOB 14 BITS Integral Non inearity IN SB Differential Non inearity DN 0. SB DC Offset TBD DC Gain TBD Channel Isolation TBD db Input Range 1 Reference Input Current SCD90 Rev B Advanced 3// ma Aeroflex Plainview

86 EECTRICA PERFORMANCE CARACTERISTICS (continued) (TC = - C TO +1 C, +CC = UNESS OTERWISE SPECIFIED) Parameter Symbol Conditions Min Typ Max Units fsampe(max) KSPS Conversion Time tcon 16 Clk Cycles Acquisition Time tacq 4 Clk Cycles Signal to Noise Ratio SNR TBD db ts TBD ns Maximum Sampling Rate Multiplexer Settling Time FIGURE : BASIC TIMING DIAGRAM SCD90 Rev B Advanced 3//1 4 Aeroflex Plainview

87 Pin # Signal Definition Pin # Signal Definition 1 AIN01 Analog Multiplexer Input 01 B11 Digital Output 11 AIN00 Analog Multiplexer Input 00 6 B1 Digital Output 1 3 NREF ow Analog Reference oltage 7 B13 Digital Output 13 4 ACC Analog Supply oltage 8 EOC_ End of Convert DCC Digital Supply oltage 9 BUSY_ Busy 6 AD03 Multiplexer Address DRN Digital Output ow Reference evel 7 AD0 Multiplexer Address 0 31 DRP Digital Output igh Reference evel 8 AD01 Multiplexer Address 01 3 DEE Digital Supply Return 9 AD00 Multiplexer Address AEE Analog Supply Return STCN_ Start Conversion 34 PREF igh Analog Reference oltage 11 EN Multiplexer Enable 3 AIN1 Analog Multiplexer Input 1 1 OE Output Enable 36 AIN14 Analog Multiplexer Input CK Clock Input 37 AIN13 Analog Multiplexer Input B00 Digital Output AIN1 Analog Multiplexer Input 1 1 B01 Digital Output AIN11 Analog Multiplexer Input B0 Digital Output 0 40 AIN Analog Multiplexer Input 17 B03 Digital Output AIN09 Analog Multiplexer Input B04 Digital Output 04 4 AIN08 Analog Multiplexer Input B0 Digital Output 0 43 AIN07 Analog Multiplexer Input 07 0 B06 Digital Output AIN06 Analog Multiplexer Input 06 1 B07 Digital Output 07 4 AIN0 Analog Multiplexer Input 0 B08 Digital Output AIN04 Analog Multiplexer Input 04 3 B09 Digital Output AIN03 Analog Multiplexer Input 03 4 B Digital Output 48 AIN0 Analog Multiplexer Input 0 FIGURE 3: PACKAGE PIN-OUT AND SIGNA DEFINITION SCD90 Rev B Advanced 3//1 Aeroflex Plainview

88 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD90-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC RD90-01-S KXA RD S KXC RD S KXA DA SMD Pending Package 48-lead CQFP DA SMD and Radiation Certification Pending Return to Selection Guide FIGURE 4: PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD90 Rev B Advanced 3//1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 6

89 Standard Products Preview Radard-by-Design RD980 Octal Bus Transceiver Bidirectional oltage evel Shifter January 3, 01 FEATURES Bidirectional oltage translator with two separate supply rails. Radiation performance - Total dose: >1Mrad(Si); Dose rate = rads(si)/s - EDRS Immune - SE Immune >0 Me-cm/mg - Neutron Displacement Damage >14 neutrons/cm Full military temperature range Designed for aerospace and high reliability space applications Packaging ermetic ceramic SOIC - 4-pin,.614" x.99"w x.10"t - Weight -.0 grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD980 is a radiation hardened, Octal evel Shifter in a 4-pin SOIC package. The RD980 design uses specific circuit topology and layout methods to mitigate total ionizing dose effects and single event latchup. These characteristics make the RD980 especially suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD980 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD980 Octal evel Shifter is a radiation hard replacement for the industry standard Bidirectional oltage Translators. It is capable of level shifting from the A-to-B or B-to-A input ports for nominal logic voltages on either port of.0 or 3.3 volts. The RD980 can level shift from.0 to 3.3 or 3.3 to.0, and also buffer from.0 to.0 or 3.3 to 3.3. Ports A and B can be inputs or outputs depending on the value of DIR_AB_. Control inputs are the standard tri-state enable (OE_ active low) and direction control DIR_AB_ where a IG logic steers data from A-to-B and active OW steers the data from B-to-A. The control inputs are powered from CCA and accept inputs at the A bus logic levels (either 3.3 or.0). All delay parameters are less than ns over full - C to +1 C military temperature range and logic levels. All bus and control inputs have Schmitt trigger buffers to implement low-to-high transition at approximately 60% of the corresponding logic supply and high-to-low transition at approximately 40% providing considerable noise immunity for slow input signals The devices will not latch with SEU events to above 0 Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD980 Rev A Return to Selection Guide

90 ORDERING INFORMATION Model DA SMD # Screening RD Commercial Flow, + C testing only RD980-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S Pending RD S Pending RD S Pending RD S Pending DA SMD Pending Package 4-pin SOIC Package DA SMD and Radiation Certification Pending Return to Selection Guide 980 Note: Package and lid are electrically isolated from signal pads. 4-Pin SOIC FIGURE 1: PACKAGE PIN-OUT FIGURE : PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD980 Rev A Preview 1/3/1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 3

91 Standard Products Preliminary Radard-by-Design RD Channel Analog Multiplexer February 8, 01 FEATURES 64 channels provided by four 16-channel multiplexers Single power supply operation at +3.3 to + Radiation performance - Total dose: >1Mrad(Si), Dose rate = rads(si)/s - EDRS Immune - SE Immune: >0 Me-cm/mg - Neutron Displacement Damage: >14 neutrons/cm Full military temperature range ow power consumption < 4.0mW CMOS analog switching allows rail to rail operation and low switch impedance Two address busses A(0-3) & B(0-3) and four enable lines afford flexible organization Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 96 leads, 1.30"Sq x 0.00"t quad flat pack - Weight - 1 grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD841 is a radiation hardened, single supply, 64-Channel Multiplexer MCM (multi-chip module). The RD841 design uses specific circuit topology and layout methods to mitigate total ionization dose effects and single event latchup. These characteristics make the RD841 especially suited for the harsh environment encountered in Deep Space missions. It is available in a 96 lead igh Temperature Co-Fired Ceramic (TCC) Quad Flatpack (CQFP). It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD841 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD841 consists of four, single supply, 16-Channel Multiplexers arranged as shown in the Block Diagram. The RD841 design is inherently radiation tolerant. The device will not latch with SEU events to above 0Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. A SECTION Thirty-two (3) channels addressable by bus A(0-3), in two 16-channel blocks, each block enabled separately. B SECTION Thirty-two (3) channels addressable by bus B(0-3), in two 16-channel blocks, each block enabled separately. SCD841 Rev B Return to Selection Guide

92 SCD841 Rev B Preliminary /8/1 Aeroflex Plainview A0 A1 A A3 EN (3-47) C 47 C 3 B0 B1 B B3 EN (0-1) C 1 C GND +CC OUTPUT3 (3-47) C 31 EN (48-63) C 63 C 48 EN (16-31) SECTION A OUTPUT1 (0-1) C RD CANNE ANAOG MUX BOCK DIAGRAM MUX 3 MUX 1 SECTION B MUX 4 MUX OUTPUT4 (48-63) OUTPUT (16-31)

93 ABSOUTE MAXIMUM RATINGS 1/ Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Supply oltage +CC (Pin 44) +3.0 to +6.0 Digital Input Overvoltage EN (Pins, 6, 91, 9), A (Pins 1, 3, 93, 9), B (Pins, 4, 94, 96) < CC +0.4 > GND -0.4 Analog Input Over oltage IN (C0-C63) < CC +0.4 > GND -0.4 Notes: 1/ All measurements are made with respect to ground. NOTICE: Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress rating only; functional operation beyond the Operation Conditions is not recommended and extended exposure beyond the Operation Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS 1/ Symbol Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC +CC Parameter DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Supply Current +CC Address Input Current A(0-3) Enable Input Current EN Symbol Conditions Min Max Units +ICC EN = 30% CC 0 40 A +ISBY EN = 70% CC 0 40 A IA(0-3)A A = 30% CC -0 0 IA(0-3)A A = 70% CC -0 0 IA(0-3)B B = 30% CC -0 0 IA(0-3)B B = 70% CC -0 0 IEN(0-1) EN(0-1) = 30% CC -0 0 IEN(0-1) EN(0-1) = 70% CC -0 0 IEN(16-31) EN(16-31) = 30% CC -0 0 IEN(16-31) EN(16-31) = 70% CC -0 0 IEN(3-47) EN(3-47) = 30% CC -0 0 IEN(3-47) EN(3-47) = 70% CC -0 0 IEN(48-63) EN(48-63) = 30% CC -0 0 IEN(48-63) EN(48-63) = 70% CC -0 0 SCD841 Rev B Preliminary /8/1 3 Aeroflex Plainview

94 DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (continued) (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol Conditions Min Max Units igh Input eakage Current (C0-C63) IINK IN = +, EN =70% CC, Output and all unused MUX inputs under test = ow Input eakage Current (C0-C63) IINK0 IN = 0, EN =70% CC, Output and all unused MUX inputs under test = Output eakage Current OUT (pins,6, 68 & 70) IOUTK OUT = +, EN = 70% CC, All inputs grounded except channel being tested. 3/, 4/ C C C - 00 Switch ON Resistance OUTPUTS (pins,6, 68 & 70) 6/ IN = 0, IN = +., IN = + EN = 30% CC IOUT = -1mA /, 3/, / RDS(ON) Notes: 1/ Measure inputs sequentially. Ground all unused inputs of the device under test. A is the applied input voltage to the address lines A(0-3). B is the applied input voltage to the address lines B(0-3). / IN is the applied input voltage to the input channels (C0-C63). 3/ EN is the applied input voltage to the enable lines EN (0-1), EN (16-31), EN (3-47) and EN (48-63). 4/ OUT is the applied input voltage to the output lines OUTPUT1(0-1), OUTPUT(16-31), OUTPUT3(3-47) and OUTPUT4(48-63). / Negative current is the current flowing out of each of the MUX pins. Positive current is the current flowing into each MUX pin. 6/ The RD841 cannot be operated with analog inputs below 0 volts. 7/ Not tested, guaranteed to the specified limits. SWITCING CARACTERISTICS (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol ta Conditions OUT igh to ow Transition Address to Output Delay ta Enable to Output Delay tonen toffen SCD841 Rev B Preliminary /8/1 OUT ow to igh Transition EN = 30% CC (Enabled) EN = 70% CC (Disabled) 4 Temp Min Max Units - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns A 00 ns Aeroflex Plainview

95 TRUT TABE (C0 C1) TRUT TABE (C16 C31) B3 B B1 B0 EN(0-1) "ON" CANNE 1/ B3 B B1 B0 EN(16-31) "ON" CANNE / X X X X NONE X X X X NONE C0 C16 C1 C17 C C18 C3 C19 C4 C0 C C1 C6 C C7 C3 C8 C4 C9 C C C6 C11 C7 C1 C8 C13 C9 C14 C30 C1 C31 1/ Between (C0-C1) and OUTPUT1(0-1) / Between (C16-C31) and OUTPUT (16-31) TRUT TABE (C3 C47) TRUT TABE (C48 C63) A3 A A1 A0 EN(3-47) "ON" CANNE 3/ A3 A A1 A0 EN(48-63) "ON" CANNE 4/ X X X X NONE X X X X NONE C3 C48 C33 C49 C34 C0 C3 C1 C36 C C37 C3 C38 C4 C39 C C40 C6 C41 C7 C4 C8 C43 C9 C44 C60 C4 C61 C46 C6 C47 C63 3/ Between (C3-C47) and OUTPUT3 (3-47) SCD841 Rev B Preliminary /8/1 4/ Between (C48-C63) and OUTPUT4 (48-63) Aeroflex Plainview

96 Address ines (A0 - A3) (B0 - B3) 4.0 0% MIN 0% MUX Output 0 t A Definition of t A 4.0 Address ines (A0 - A3) (B0 - B3) 0% MIN MUX Output 0% 0 t A Definition of t A 4.0 EN ines 0% 0.8 ~1 to 4.16 MUX Output 0% 0 tonen toffen Definition of tonen and toffen NOTE: f = Kz, Duty cycle = 0%. RD841 SWITCING DIAGRAMS SCD841 Rev B Preliminary /8/1 6 Aeroflex Plainview

97 PIN NUMBERS & FUNCTIONS RD eads Ceramic QUAD Flat Pack Pin # Function Pin # Function Pin # Function 1 A 33 C11 6 C49 B 34 C7 66 C48 3 A3 3 C1 67 NC 4 B3 36 C8 68 Output4 (48-63) EN (0-1) 37 C13 69 NC 6 EN (16-31) 38 C9 70 Output3 (3-47) 7 C0 39 C14 71 GND 8 C16 40 C30 7 GND 9 C1 41 C1 73 C47 C17 4 C31 74 C46 11 C 43 NC 7 C4 1 C CC 76 C44 13 C3 4 NC 77 C43 14 C19 46 NC 78 C4 1 C4 47 NC 79 C41 16 C0 48 NC 80 C40 17 C 49 NC 81 C39 18 C1 0 CASE GND 8 C38 19 C6 1 C63 83 C37 0 C C6 84 C36 1 C7 3 C61 8 C3 C3 4 C60 86 C34 3 GND C9 87 C33 4 GND 6 C8 88 C3 Output1 (0-1) 7 C7 89 GND 6 Output (16-31) 8 C6 90 GND 7 C8 9 C 91 EN (48-63) 8 C4 60 C4 9 EN (3-47) 9 C9 61 C3 93 A0 30 C 6 C 94 B0 31 C 63 C1 9 A1 3 C6 64 C0 96 B1 NOTE: It is recommended that all "NC" or "no connect" pins be grounded. This eliminates or minimizes any ESD or static buildup. SCD841 Rev B Preliminary /8/1 7 Aeroflex Plainview

98 ORDERING INFORMATION Model Number DA SMD # Screening Package RD Commercial Flow, + C testing only RD841-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC DA SMD Pending RD S 96111KXC QUAD Flat Pack DA SMD and Radiation Certification Pending 1.10 ±.00 (3 Spaces at.00) Tol Non-Cum 4 Sides Note: Outside ceramic tie bars not shown for clarity. Contact factory for details. Pin 1 Pin 1.00 MAX Pin 8 Pin 84 Pin 13 Return to Selection Guide.016 ± SQ MAX Pin 36 (.400) Pin 61 Pin 60 Pin ±.001 FAT PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused SCD841 Rev B Preliminary /8/1 8

99 Preliminary Standard Products Radard-by-Design RD Channel Analog Multiplexer February 8, 01 FEATURES 48 Channels provided by three 16-channel multiplexers Single power supply operation at +3.3 to + Radiation performance - Total dose: - EDRS Immune - SE Immune: - Neutron Displacement Damage: >1Mrad(Si), Dose rate = rads(si)/s >0 Me-cm/mg >14 neutrons/cm Full military temperature range ow power consumption < 3.0mW CMOS analog switching allows rail to rail operation and low switch impedance Address Bus A(0-3), and three enable lines afford flexible organization Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 96 eads, 1.30"Sq x 0.00"t quad flat pack - Weight - 1 grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD843 is a radiation hardened, single supply, 48-Channel Multiplexer MCM (multi-chip module). The RD843 design uses specific circuit topology and layout methods to mitigate total ionization dose effects and single event latchup. These characteristics make the RD843 especially suited for the harsh environment encountered in Deep Space missions. It is available in a 96 lead igh Temperature Co-Fired Ceramic (TCC) Quad Flatpack (CQFP). It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD843 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD843 consists of three, single supply, 16-Channel Multiplexers arranged as shown in the Block Diagram. The Address Bus and three Enable lines provide for 48 channels addressable by bus A(0-3), in three 16-channel blocks, each block enabled separately. Each block connects the addressed channel to one output. The RD843 design is inherently radiation tolerant. The device will not latch with SEU events to above 0Me-cm/mg. Total dose degradation is minimal to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 14 neutrons per cm range are readily tolerated. There is no sensitivity to low-dose rate (EDRS) effects. SEU effects are application dependant. SCD843 Rev A Return to Selection Guide

100 SCD843 Rev A Preliminary /8/1 Aeroflex Plainview A0 A1 A A3 EN (0-1) C 1 C 0 16 MUX 1 C 31 GND +CC 16 MUX C 47 EN (3-47) OUTPUT (16-31) C 3 RD CANNE ANAOG MUX BOCK DIAGRAM EN (16-31) OUTPUT1 (0-1) C MUX 3 OUTPUT3 (3-47)

101 ABSOUTE MAXIMUM RATINGS 1/ Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range - to +10 C Supply oltage +CC (Pin 44) +3.0 to +6.0 Digital Input Overvoltage EN (Pins, 91, 9), A (Pins 1, 3, 9, 96) < CC +0.4 > GND -0.4 Analog Input Over oltage IN (C0-C47) < CC +0.4 > GND -0.4 Notes: 1/ All measurements are made with respect to ground. NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may effect device reliability. RECOMMENDED OPERATING CONDITIONS 1/ Symbol +CC Parameter Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Supply Current +CC Address Input Current A(0-3) Enable Input Current EN Symbol Conditions Min Max Units +ICC EN = 30% CC 0 30 A +ISBY EN = 70% CC 0 30 A IA(0-3) A = 30% CC IA(0-3) A = 70% CC IEN(0-1) EN(0-1) = 30% CC -0 0 IEN(0-1) EN(0-1) = 70% CC -0 0 IEN(16-31) EN(16-31) = 30% CC -0 0 IEN(16-31) EN(16-31) = 70% CC -0 0 IEN(3-47) EN(3-47) = 30% CC -0 0 IEN(3-47) EN(3-47) = 70% CC -0 0 Aeroflex Plainview SCD843 Rev A Preliminary /8/1 3

102 DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (con t) (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol Conditions Min Max Units igh Input eakage Current (C0-C47) IINK IN = +, EN =70% CC, Output and all unused MUX inputs under test = ow Input eakage Current (C0-C47) IINK0 IN = 0, EN =70% CC, Output and all unused MUX inputs under test = Output eakage Current OUT (pins, 68 & 70) IOUTK OUT = +, EN = 70% CC, All inputs grounded except channel being tested. 3/, 4/ Switch ON Resistance OUTPUTS (pins, 68 & 70) 6/ RDS(ON) IN = 0, IN = +., IN = + EN = 30% CC IOUT = -1mA /, 3/, / - C - + C C - 00 Notes: 1/ Measure inputs sequentially. Ground all unused inputs of the device under test. A is the applied input voltage to the address lines A(0-3). / IN is the applied input voltage to the input channels C0-C47. 3/ EN is the applied input voltage to the enable lines EN (0-1), EN (16-31) and EN (3-47). 4/ OUT is the applied input voltage to the output lines OUTPUT1(0-1), OUTPUT(16-31) and OUTPUT3(3-47). / Negative current is the current flowing out of each of the MUX pins. Positive current is the current flowing into each MUX pin. 6/ The RD843 cannot be operated with analog inputs below 0 volts. 7/ Not tested, guaranteed to the specified limits. SWITCING CARACTERISTICS (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol ta Conditions OUT igh to ow Transition Address to Output Delay ta Enable to Output Delay tonen toffen OUT ow to igh Transition EN = 30% CC (Enabled) EN = 70% CC (Disabled) Min Max Units - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns A 00 ns Aeroflex Plainview SCD843 Rev A Preliminary /8/1 4

103 TRUT TABE (C0 C1) TRUT TABE (C16 C31) A3 A A1 A0 EN(0-1) "ON" CANNE 1/ A3 A A1 A0 EN(16-31) "ON" CANNE / X X X X NONE X X X X NONE C0 C16 C1 C17 C C18 C3 C19 C4 C0 C C1 C6 C C7 C3 C8 C4 C9 C C C6 C11 C7 C1 C8 C13 C9 C14 C30 C1 C31 1/ Between (C0-C1) and OUTPUT1 (0-1) / Between (C16-C31) and OUTPUT (16-31) TRUT TABE (C3 C47) A3 A A1 A0 EN(3-47) "ON" CANNE 3/ X X X X NONE C3 C33 C34 C3 C36 C37 C38 C39 C40 C41 C4 C43 C44 C4 C46 C47 3/ Between (C3-C47) and OUTPUT3 (3-47) Aeroflex Plainview SCD843 Rev A Preliminary /8/1

104 Address ines (A0 - A3) 4.0 0% MIN 0% MUX Output 0 t A Definition of t A 4.0 Address ines (A0 - A3) 0% MIN MUX Output 0% 0 t A Definition of t A 4.0 EN ines 0% 0.8 ~1 to 4.16 MUX Output 0% 0 tonen toffen Definition of tonen and toffen NOTE: f = Kz, Duty cycle = 0%. RD843 SWITCING DIAGRAMS Aeroflex Plainview SCD843 Rev A Preliminary /8/1 6

105 EAD NUMBERS & FUNCTIONS RD eads Ceramic QUAD Flat Pack Pin # Function Pin # Function Pin # Function 1 A 33 C11 6 C33 NC 34 NC 66 C3 3 A3 3 C1 67 NC 4 NC 36 NC 68 Output3 (3-47) EN(0-1) 37 C13 69 NC 6 NC 38 NC 70 Output (16-31) 7 C0 39 C14 71 GND 8 NC 40 NC 7 GND 9 C1 41 C1 73 C31 NC 4 NC 74 C30 11 C 43 NC 7 C9 1 NC 44 +CC 76 C8 13 C3 4 NC 77 C7 14 NC 46 NC 78 C6 1 C4 47 NC 79 C 16 NC 48 NC 80 C4 17 C 49 NC 81 C3 18 NC 0 CASE GND 8 C 19 C6 1 C47 83 C1 0 NC C46 84 C0 1 C7 3 C4 8 C19 NC 4 C44 86 C18 3 GND C43 87 C17 4 GND 6 C4 88 C16 Output1 (0-1) 7 C41 89 GND 6 NC 8 C40 90 GND 7 C8 9 C39 91 EN(3-47) 8 NC 60 C38 9 EN(16-31) 9 C9 61 C37 93 A0 30 NC 6 C36 94 NC 31 C 63 C3 9 A1 3 NC 64 C34 96 NC NOTE: It is recommended that all "NC or "no connect pin" be grounded. This eliminates or minimizes any ESD or static buildup. Aeroflex Plainview SCD843 Rev A Preliminary /8/1 7

106 ORDERING INFORMATION Model Number DA SMD # Screening Package RD Commercial Flow, + C testing only RD843-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC DA SMD Pending RD S 96101KXC DA SMD and Radiation Certification Pending 1.10 ±.00 (3 Spaces at.00) Tol Non-Cum 4 Sides Note: Outside ceramic tie bars not shown for clarity. Contact factory for details. Pin 1 Pin 1.00 MAX QUAD Flat Pack Pin 8 Pin 84 Pin ± SQ MAX Pin Pin 61 Pin 60 Pin ±.001 FAT PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused SCD843 Rev A Preliminary /8/1 8

107 Standard Products Preliminary Radard-by-Design RD844 Dual 16-Channel Analog Multiplexer February 8, 01 FEATURES 3 Channels provided by two independent 16-channel multiplexers Single power supply operation at +3.3 to + Radiation performance - Total dose: >1Mrad(Si), Dose rate = rads(si)/s - EDRS Immune - SE Immune: >0 Me-cm/mg - Neutron Displacement Damage: >14 neutrons/cm Full military temperature range ow power consumption <.0mW CMOS analog switching allows rail to rail operation and low switch impedance Separate address busses A(0-3) & B(0-3) and enable EN(0-1) & EN(16-31) Designed for aerospace and high reliability space applications Packaging ermetic ceramic - 6 leads, 0.800"Sq x 0.00"t quad flat pack - Weight - 6 grams max Aeroflex Plainview s Radiation ardness Assurance Plan is DA Certified to MI-PRF-3834, Appendix G. GENERA DESCRIPTION Aeroflex s RD844 is a radiation hardened, single supply, dual 16-Channel Multiplexer MCM (multi-chip module). The RD844 design uses specific circuit topology and layout methods to mitigate total ionization dose effects and single event latchup. These characteristics make the RD844 especially suited for the harsh environment encountered in Deep Space missions. It is available in a 96 lead igh Temperature Co-Fired Ceramic (TCC) Quad Flatpack (CQFP). It is guaranteed operational from - C to +1 C. Available screened in accordance with MI-PRF-3834 Class K, the RD844 is ideal for demanding military and space applications. ORGANIZATION AND APPICATION The RD844 consists of two independent 16-channel multiplexers arranged as shown in the block diagram. A Section Sixteen (16) channels addressable by bus A(0-3), enabled by EN(0-1) and outputted on Output1( 0-1). B Section Sixteen (16) channels addressable by bus B(0-3), enabled by EN(16-31) and outputted on Output(16-31). SCD844 Rev A Return to Selection Guide

108 SECTION A C 0 16 MUX 1 C 1 OUTPUT1 (0-1) EN (0-1) A0 A1 A A3 SECTION B C MUX C 31 OUTPUT (16-31) EN (16-31) B0 B1 B B3 +CC GND RD844: DUA 16-CANNE ANAOG MUX BOCK DIAGRAM SCD844 Rev A Preliminary /8/1 Aeroflex Plainview

109 ABSOUTE MAXIMUM RATINGS 1/ Parameter Range Units Case Operating Temperature Range - to +1 C Storage Temperature Range -6 to +10 C Supply oltage +CC (Pin 18) +3.0 to +6.0 Digital Input Overvoltage EN0-1 (Pin 13), EN16-31 (Pin 44), A (Pins 14, 1, 16, 17), B (Pins 40, 41, 4, 43) < CC +0.4 > GND -0.4 Analog Input Over oltage IN (C0-C31) < CC +0.4 > GND -0.4 Notes: 1/ All measurements are made with respect to ground. NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. RECOMMENDED OPERATING CONDITIONS 1/ Symbol Typical Units Power Supply oltage 3.3 to.0 EN, A ogic ow evel 30% CC EN, A ogic igh evel 70% CC +CC Parameter DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Supply Current +CC Address Input Current A(0-3), B(0-3) Enable Input Current EN Symbol Conditions Min Max Units +ICC EN = 30% CC 0 0 A +ISBY EN = 70% CC 0 0 A IA(0-3)A A = 30% CC -0 0 IA(0-3)A A = 70% CC -0 0 IA(0-3)B B = 30% CC -0 0 IA(0-3)B B = 70% CC -0 0 IEN(0-1) EN(0-1) = 30% CC -0 0 IEN(0-1) EN(0-1) = 70% CC -0 0 IEN(16-31) EN(16-31) = 30% CC -0 0 IEN(16-31) EN(16-31) = 70% CC -0 0 SCD844 Rev A Preliminary /8/1 3 Aeroflex Plainview

110 DC EECTRICA PERFORMANCE CARACTERISTICS 1/ (continued) (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol Conditions Min Max Units igh Input eakage Current (C0-C31) IINK IN = +, EN =70% CC, Output and all unused MUX inputs under test = ow Input eakage Current (C0-C31) IINK0 IN = 0, EN =70% CC, Output and all unused MUX inputs under test = Output eakage Current OUT (pins 1 & 4) IOUTK OUT = +, EN = 70% CC, All inputs grounded except channel being tested. 3/, 4/ C C C - 00 Switch ON Resistance OUTPUTS (pins 1 & 4) 6/ IN = 0, IN = +., IN = + EN = 30% CC IOUT = -1mA /, 3/, / RDS(ON) Notes: 1/ Measure inputs sequentially. Ground all unused inputs of the device under test. A is the applied input voltage to the address lines A(0-3). B is the applied input voltage to the address lines B(0-3). / IN is the applied input voltage to the input channels (C0-C31). 3/ EN 0-1 is the applied input voltage to the enable line EN (0-1). EN is the applied input voltage to the enable line EN (16-31) 4/ OUT is the applied input voltage to the output lines OUTPUT1 (0-1), OUTPUT (16-31) / Negative current is the current flowing out of each of the MUX pins. Positive current is the current flowing into each MUX pin. 6/ Not tested, guaranteed to the specified limits. SWITCING CARACTERISTICS (Tc = - C to +1 C, +CC = + - Unless otherwise specified) Parameter Symbol ta Conditions OUT igh to ow Transition Address to Output Delay ta Enable to Output Delay tonen toffen SCD844 Rev A Preliminary /8/1 OUT ow to igh Transition EN = 30% CC (Enabled) EN = 70% CC (Disabled) 4 Temp Min Max Units - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns - C 10 ns + C 10 ns +1 C 00 ns A 00 ns Aeroflex Plainview

111 TRUT TABE (C0 C1) A3 A A1 A0 EN (0-1) "ON" CANNE, 1/ (OUTPUT 1) X X X X NONE C0 C1 C C3 C4 C C6 C7 C8 C9 C C11 C1 C13 C14 C1 1/ Between (C0-C1) and OUTPUT1 (0-1) TRUT TABE (C16 C31) B3 B B1 B0 EN (16-31) "ON" CANNE, / (OUTPUT ) X X X X NONE C16 C17 C18 C19 C0 C1 C C3 C4 C C6 C7 C8 C9 C30 C31 / Between (C16-C31) and OUTPUT (16-31) SCD844 Rev A Preliminary /8/1 Aeroflex Plainview

112 Address ines (A0 - A3 / B0 - B3 ) 4.0 0% MIN 0% MUX Output 0 t A Definition of t A 4.0 Address ines (A0 - A3 / B0 - B3 ) 0% MIN MUX Output 0% 0 t A Definition of t A 4.0 EN ines 0% 0.8 ~1 to 4.16 MUX Output 0% 0 tonen toffen Definition of tonen and toffen NOTE: f = Kz, Duty cycle = 0%. RD844 SWITCING DIAGRAMS SCD844 Rev A Preliminary /8/1 6 Aeroflex Plainview

113 PIN NUMBERS & FUNCTIONS RD844 6 eads Ceramic QUAD Flat Pack Pin # Function Pin # Function 1 C0 9 C31 C1 30 C30 3 C 31 C9 4 C3 3 C8 C4 33 C7 6 C 34 C6 7 GND 3 GND 8 GND 36 GND 9 C6 37 C C7 38 C4 11 CASE GND 39 GND 1 OUTPUT1 (0-1) 40 B3 13 EN (0-1) 41 B 14 A0 4 B1 1 A1 43 B0 16 A 44 EN (16-31) 17 A3 4 OUTPUT (16-31) 18 +CC 46 GND 19 C1 47 C16 0 C14 48 C17 1 GND 49 GND GND 0 GND 3 C13 1 C18 4 C1 C19 C11 3 C0 6 C 4 C1 7 C9 C 8 C8 6 C3 Notes: 1. It is recommended that all "NC" or "no connect pin", be grounded. This eliminates or minimizes any ESD or static buildup.. Package lid is internally connected to circuit ground (Pins 7, 8, 11, 1,, 3, 36, 39, 46, 49, 0). SCD844 Rev A Preliminary /8/1 7 Aeroflex Plainview

114 ORDERING INFORMATION Model DA SMD # Screening Package RD Commercial Flow, + C testing only RD844-S - Military Temperature, - C to +1 C Screened in accordance with the individual Test Methods of MI-STD-883 for Space Applications RD S KXC DA SMD Pending RD S KXC DA SMD and Radiation Certification Pending 0.60 ±.00 (13 Spaces at.00) Tol Non-Cum 4 Sides QUAD Flat Pack Note: Outside ceramic tie bars not shown for clarity. Contact factory for details. Pin 1 Pin 7.00 MAX Pin 0 Pin 49 Pin 8 Return to Selection Guide.016 ± SQ ±.0 Pin 1 (.60) Pin 36 Pin 3 Pin.006 ±.00 FAT PACKAGE OUTINE EXPORT CONTRO: EXPORT WARNING: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR 16.1 for complete information.) PAINIEW, NEW YORK Toll Free: 800-TE-13 Fax: INTERNATIONA Tel: Fax: NORTEAST Tel: Fax: SE AND MID-ATANTIC Tel: Fax: WEST COAST Tel: Fax: CENTRA Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. SCD844 Rev A Preliminary /8/1 Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused 8

115 REISIONS TR DESCRIPTION DATE (YR-MO-DA) APPROED "Preliminary Draft 04/0/11" Return to Selection Guide RE SEET RE SEET RE STATUS RE OF SEETS SEET PMIC N/A PREPARED BY Steve. Duncan STANDARD MICROCIRCUIT DRAWING TIS DRAWING IS AAIABE FOR USE BY A DEPARTMENTS AND AGENCIES OF TE DEPARTMENT OF DEFENSE AMSC N/A DA AND AND MARITIME COUMBUS, OIO CECKED BY Greg Cecil APPROED BY Charles F. Saffle DRAWING APPROA DATE REISION EE MICROCIRCUIT, YBRID, QUAD OPERATIONA AMPIFIER, RADIATION ARDENED SIZE CAGE CODE A 6768 SEET DSCC FORM 33 APR OF EXXX-11

116 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1..3 and MI-PRF A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1. PIN. The PIN shall be as shown in the following example: 96 Federal stock class designator \ RA designator (see 1..1) K X X Device type (see 1..) Device class designator (see 1..3) Case outline (see 1..4) ead finish (see 1..) / \/ Drawing number 1..1 Radiation hardness assurance (RA) designator. RA marked devices shall meet the MI-PRF-3834 specified RA levels and shall be marked with the appropriate RA designator. A dash (-) indicates a non-ra device. 1.. Device type(s). The device type(s) identify the circuit function as follows: Device type 01 0 Generic number RD900 RD901 Circuit function Radiation ardened, Quad operational amplifier Radiation ardened, Quad operational amplifier, i-z output control 1..3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MI-PRF-3834 and require QM Certification as well as qualification (Class, K, and E) or QM isting (Class G and D). The product assurance levels are as follows: Device performance documentation Device class K ighest reliability class available. This level is intended for use in space applications. Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K,, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QM certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

117 1..4 Case outline(s). The case outline(s) are as designated in MI-STD-183 and as follows: Outline letter X Descriptive designator See figure 1 Terminals Package style 16 Flat package with formed leads 1.. ead finish. The lead finish shall be as specified in MI-PRF Absolute maximum ratings. 1/ Supply voltage (CC) range... Input voltage (IN) range... Junction temperature (TJ)... + C... Thermal resistance, Junction to Case (ӨJC)... Storage temperature range... ead temperature (soldering, seconds) dc to +6.0 dc CC +0.4, GND C 00 mw 7 C/W -6 C to +10 C +300 C 1.4 Recommended operating conditions. Supply voltage (CC) range... Input Common Mode (CM) range... Case operating temperature range (TC) dc to +.0 dc CC to GND - C to +1 C 1. Radiation features Maximum total dose available (dose rate = rads(si)/s):... Enhanced ow Dose Rate Sensitvity (EDRS)... Single Event atchup (SE)... Neutron irradiation... 1 Mrads(Si) Immuned > 0 Me-cm/mg / 14 > 1 x neutrons/cm 3/. APPICABE DOCUMENTS.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MI-PRF ybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MI-STD Test Method Standard Microcircuits. MI-STD Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. / This limit is guaranteed by design or process, but not production tested unless otherwise specified by the customer through the purchase order or contract. 3/ Guaranteed, but not tested. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 3

118 DEPARTMENT OF DEFENSE ANDBOOKS MI-DBK-3 - ist of Standard Microcircuit Drawings. MI-DBK Standard Microcircuit Drawings. (Copies of these documents are available online at or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA ). Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G,, and K shall be in accordance with MI-PRF Compliance with MI-PRF-3834 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MI-PRF-3834 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3. Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MI-PRF-3834 and herein Case outline(s). The case outline(s) shall be in accordance with 1..4 herein and figure Terminal connections. The terminal connections shall be as specified on figure ogic diagram(s). The logic diagram(s) shall be as specified on figure Switching diagram(s). The switching diagram(s) shall be as specified on figure Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3. Marking of device(s). Marking of device(s) shall be in accordance with MI-PRF The device shall be marked with the PIN listed in 1. herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MI-PRF-3834, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DA and and Maritime -A) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DA and and Maritime -A shall affirm that the manufacturer's product meets the performance requirements of MI-PRF-3834 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MI-PRF-3834 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 4

119 TABE I. Electrical performance characteristics. Test Conditions 1/ / - C TC +1 C CC = +.0 unless otherwise specified Symbol Group A Device subgroups types imits Unit Min Max Input offset voltage OS 1,,3 All - m Input offset current IOS 1,,3 All -1 1 pa Input bias current 3/ IB 1,,3 All - pa Input offset temperature 3/ coefficient IOST 1,,3 All µ/c Common Mode Rejection Ratio CMRR 4,,6 All 70 db Power supply rejection ratio PSRR 4,,6 All 70 db Output voltage high O IOUT = 3 ma 1,,3 All 4.9 Output voltage low O IOUT = 3 ma 1,,3 All Short circuit output current 3/ IO(SINK) OUT to CC 1,,3 All IO(SOURCE) OUT to GND Slew rate SR R = 8 kω 9,,11 All. /µs Open loop gain AO No oad 4,,6 All 90 db Unity gain bandwidth UGBW R = kω 4,,6 All Mz Quiescent supply current ICCQ All amplifiers enabled, no loads 1,,3 All. ma µa ma 4 All amplifiers disabled Enable input voltage high I I = enabled 1,,3 0.7 CC Enable input voltage low O O = disabled 1,,3 0.3 CC Enable input current IEN 1,,3 0 0 Channel separation 3/ CSEP R = kω, f = 1.0 kz 4,,6 All Output enable delay tonen See figure 4 9,, ns Output disable delay toffen 9,, ns 90 db 1/ These devices have been characterized at level of irradiation. Pre and post irradiation values meet the limits as specified in table I. When performing post irradiation electrical measurements for any RA level, TC = + C. / For radiation features see paragraph 1. herein. 3/ Not tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

120 Case X. Symbol Inches Min A A1 A A3 b c D e e1 E E1 E Max REF BSC.30 BSC REF Millimeters Min Max REF BSC 8.90 BSC REF NOTE: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule.. Package and lid are electrically isolated from signal pads. FIGURE 1. Case outline. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 6

121 Device types 01 0 Case outline Terminal number X Terminal symbol OUT_A -IN_A +IN_A CC +IN_B -IN_B OUT_B No Connection No Connection OUT_C -IN_C +IN_C GND +IN_D -IN_D OUT_D OUT_A -IN_A +IN_A CC +IN_B -IN_B OUT_B EN_AB EN_CD OUT_C -IN_C +IN_C GND +IN_D -IN_D OUT_D NOTE: EN_AB enables amplifiers A and B, EN_CD enables amplifiers C and D. FIGURE. Terminal connections. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 7

122 FIGURE 3. ogic diagram(s). STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 8

123 FIGURE 4. Switching diagrams. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 9

124 TABE II. Electrical test requirements. MI-PRF-3834 test requirements Subgroups (in accordance with MI-PRF-3834, group A test table) Interim electrical parameters 1,,3,4,,6,9,,11 Final electrical parameters 1*,3,4,,6,9,,11 Group A test requirements 1,,3,4,,6,9,,11 Group C end-point electrical parameters 1,,3,4,,6,9,,11 End-point electrical parameters for Radiation ardness Assurance (RA) devices 1 * PDA applies to subgroup ERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MI-PRF-3834 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4. Screening. Screening shall be in accordance with MI-PRF The following additional criteria shall apply: a. b. Burn-in test, method 1 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1 of MI-STD-883. () TA as specified in accordance with table I of method 1 of MI-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MI-PRF-3834 and as specified herein Group A inspection (CI). Group A inspection shall be in accordance with MI-PRF-3834 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8A, and 8B shall be omitted Group B inspection (PI). Group B inspection shall be in accordance with MI-PRF STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

125 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MI-PRF-3834 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 0 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 0 of MI-STD-883. () TA as specified in accordance with table I of method 0 of MI-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 0 of MI-STD Group D inspection (PI). Group D inspection shall be in accordance with MI-PRF Radiation ardness Assurance (RA) inspection. RA qualification is required for those devices with the RA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DSCC-Q) approved plan and with MIPRF-3834, Appendix G Total dose irradiation testing. Total dose irradiation testing shall be in accordance with MI-STD-883 method 19, condition A and as specified herein. Sample testing in accordance with table I shall be performed on a representative device type (similar device) at initial qualification and after any design or process changes which may affect the RA response. Sample size is a minimum of 8 devices (4 biased and 4 not biased). This sample testing is repeated for each new combination for wafers of active elements on the most complex device.. PACKAGING.1 Packaging requirements. The requirements for packaging shall be in accordance with MI-PRF NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6. Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MI-PRF Record of users. Military and industrial users shall inform DA and and Maritime when a system application requires configuration control and the applicable SMD to that system. DA and and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 96) should contact DA and and Maritime-A, telephone (614) Comments. Comments on this drawing should be directed to DA and and Maritime-A, Columbus, Ohio , or telephone (614) Sources of supply. Sources of supply are listed in MI-DBK-3 and QM The vendors listed in MI-DBK-3 and QM-3834 have submitted a certificate of compliance (see 3.7 herein) to DA and and Maritime-A and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 11

126 STANDARD MICROCIRCUIT DRAWING BUETIN DATE: Approved sources of supply for SMD are listed below for immediate acquisition information only and shall be added to MI-DBK-3 and QM-3834 during the next revisions. MI-DBK-3 and QM-3834 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DA and and Maritime -A. This information bulletin is superseded by the next dated revisions of MI-DBK-3 and QM DA and and Maritime maintains an online database of all current sources of supply at Standard microcircuit drawing PIN 1/ endor CAGE number endor similar PIN / 96-41KXA 9641KXA 96-41KXC 9641KXC RD S RD S RD S RD S 96-40KXA 964KXA 96-4KXC 964KXC RD S RD S RD S RD S 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the endor to determine its availability. / Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. endor CAGE number endor name and address Aeroflex Plainview Incorporated, (Aeroflex Microelectronics Solutions) 3 South Service Road Plainview, NY The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.

127 REISIONS TR DESCRIPTION DATE (YR-MO-DA) APPROED "Preliminary Draft 04/0/11" Return to Selection Guide RE SEET RE SEET RE STATUS RE OF SEETS SEET PMIC N/A PREPARED BY Steve. Duncan STANDARD MICROCIRCUIT DRAWING TIS DRAWING IS AAIABE FOR USE BY A DEPARTMENTS AND AGENCIES OF TE DEPARTMENT OF DEFENSE AMSC N/A DA AND AND MARITIME COUMBUS, OIO CECKED BY Greg Cecil APPROED BY Charles F. Saffle DRAWING APPROA DATE REISION EE MICROCIRCUIT, YBRID, QUAD COMPARATOR, RADIATION ARDENED SIZE CAGE CODE A 6768 SEET DSCC FORM 33 APR OF EXXX-11

128 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1..3 and MI-PRF A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1. PIN. The PIN shall be as shown in the following example: 96 Federal stock class designator \ RA designator (see 1..1) 4 01 K X X Device type (see 1..) Device class designator (see 1..3) Case outline (see 1..4) ead finish (see 1..) / \/ Drawing number 1..1 Radiation hardness assurance (RA) designator. RA marked devices shall meet the MI-PRF-3834 specified RA levels and shall be marked with the appropriate RA designator. A dash (-) indicates a non-ra device. 1.. Device type(s). The device type(s) identify the circuit function as follows: Device type 01 0 Generic number RD9 RD911 Circuit function Radiation ardened, Quad Comparator Radiation ardened, Quad Comparator, Clocked 1..3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MI-PRF-3834 and require QM Certification as well as qualification (Class, K, and E) or QM isting (Class G and D). The product assurance levels are as follows: Device performance documentation Device class K ighest reliability class available. This level is intended for use in space applications. Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K,, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QM certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET

129 1..4 Case outline(s). The case outline(s) are as designated in MI-STD-183 and as follows: Outline letter Descriptive designator X See figure 1 Terminals Package style 16 Flat package with formed leads 1.. ead finish. The lead finish shall be as specified in MI-PRF Absolute maximum ratings. 1/ Supply voltage (CC) range... Input voltage (IN) range... Junction temperature (TJ)... + C... Storage temperature range... ead temperature (soldering, seconds) dc to +6.0 dc CC +0.4, GND C 0 mw -6 C to +10 C +300 C 1.4 Recommended operating conditions. Supply voltage (CC) range... Input Common Mode (CM) range... Case operating temperature range (TC) dc to +.0 dc CC to GND - C to +1 C 1. Radiation features / 3/ Maximum total dose available (dose rate = rads(si)/s):... Enhanced ow Dose Rate Sensitvity (EDRS)... Single Event atchup (SE)... Neutron irradiation... 1 Mrads(Si) Immuned > 0 Me-cm /mg / 14 > 1 x neutrons/cm 3/. APPICABE DOCUMENTS.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MI-PRF ybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MI-STD Test Method Standard Microcircuits. MI-STD Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. / This limit is guaranteed by design or process, but not production tested unless otherwise specified by the customer through the purchase order or contract. 3/ Guaranteed, but not tested. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 3

130 DEPARTMENT OF DEFENSE ANDBOOKS MI-DBK-3 - ist of Standard Microcircuit Drawings. MI-DBK Standard Microcircuit Drawings. (Copies of these documents are available online at or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA ). Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G,, and K shall be in accordance with MI-PRF Compliance with MI-PRF-3834 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MI-PRF-3834 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3. Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MI-PRF-3834 and herein Case outline(s). The case outline(s) shall be in accordance with 1..4 herein and figure Terminal connections. The terminal connections shall be as specified on figure ogic diagram(s). The logic diagram(s) shall be as specified on figure Switching diagram(s). The switching diagram(s) shall be as specified on figure Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3. Marking of device(s). Marking of device(s) shall be in accordance with MI-PRF The device shall be marked with the PIN listed in 1. herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MI-PRF-3834, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DA and and Maritime -A) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DA and and Maritime -A shall affirm that the manufacturer's product meets the performance requirements of MI-PRF-3834 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MI-PRF-3834 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 4

131 TABE I. Electrical performance characteristics. Test Conditions 1/ / - C TC +1 C CC = +.0 unless otherwise specified Symbol Group A Device subgroups types imits Unit Min Max Input offset voltage OS 1,,3 All - m Input offset current IOS 1,,3 All -1 1 pa Input bias current 3/ IB 1,,3 All - pa Input offset temperature 3/ coefficient IOST 1,,3 All µ/c Common Mode Rejection Ratio CMRR 4,,6 All 70 db Power supply rejection ratio PSSR 4,,6 01,0 70 db Output voltage high O IOUT = 3 ma 1,,3 All 4.9 Output voltage low O IOUT = 3 ma 1,,3 All Gain 3/ A 4,,6 01 Quiescent supply current ICCQ 1,, ma 0 µa 0.1 /m Clock input voltage high I 1,,3 0.7 CC Clock input voltage low O 1,,3 0.3 CC Clock input current ICK 1,,3 0 1 Output delay tout 9,,11 01 ns Input setup time ts 9,, ns Input hold time t 9,,11 0 ns Output delay td 9,,11 0 ns Clock positive pulse width twp 9,,11 0 Clock frequency CK 9,, ns Mz 1/ These devices have been characterized at level of irradiation. Pre and post irradiation values meet the limits as specified in table I. When performing post irradiation electrical measurements for any RA level, TC = + C. / For radiation features see paragraph 1. herein. 3/ Not tested. Shall be guaranteed by design, characterization, or correlation to other test parameters. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET

132 Case X. Symbol Inches Min A A1 A A3 b c D e e1 E E1 E Max REF BSC.30 BSC REF Millimeters Min Max REF BSC 8.90 BSC REF NOTE: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule.. The package and lid are electrically isolated from signal pads. FIGURE 1. Case outline. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 6

133 Device types 01 0 Case outline Terminal number X Terminal symbol OUT_B OUT_A No Connection CC -IN_A +IN_A -IN_B +IN_B -IN_C +IN_C -IN_D +IN_D GND No Connection OUT_D OUT_C OUT_B OUT_A CK_AB CC -IN_A +IN_A -IN_B +IN_B -IN_C +IN_C -IN_D +IN_D GND CK_CD OUT_D OUT_C NOTE: CK_AB clocks comparator A and B, CK_CD clocks comparator C and D. FIGURE. Terminal connections. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 7

134 FIGURE 3. ogic diagram(s). STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 8

135 NOTE: For device type 01, the circuit delay is specified for a half-volt single ended or differential input step, of either polarity, ending in an input polarity reversal of m. FIGURE 4. Switching diagrams. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 9

136 TABE II. Electrical test requirements. MI-PRF-3834 test requirements Subgroups (in accordance with MI-PRF-3834, group A test table) Interim electrical parameters 1,,3,4,,6,9,,11 Final electrical parameters 1*,3,4,,6,9,,11 Group A test requirements 1,,3,4,,6,9,,11 Group C end-point electrical parameters 1,,3,4,,6,9,,11 End-point electrical parameters for Radiation ardness Assurance (RA) devices 1 * PDA applies to subgroup ERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MI-PRF-3834 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4. Screening. Screening shall be in accordance with MI-PRF The following additional criteria shall apply: a. b. Burn-in test, method 1 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1 of MI-STD-883. () TA as specified in accordance with table I of method 1 of MI-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MI-PRF-3834 and as specified herein Group A inspection (CI). Group A inspection shall be in accordance with MI-PRF-3834 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8A, and 8B shall be omitted Group B inspection (PI). Group B inspection shall be in accordance with MI-PRF STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET

137 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MI-PRF-3834 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 0 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 0 of MI-STD-883. () TA as specified in accordance with table I of method 0 of MI-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 0 of MI-STD Group D inspection (PI). Group D inspection shall be in accordance with MI-PRF Radiation ardness Assurance (RA) inspection. RA qualification is required for those devices with the RA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DA and and Maritime -Q) approved plan and with MI-PRF-3834, Appendix G Total dose irradiation testing. Total dose irradiation testing shall be in accordance with MI-STD-883 method 19, condition A and as specified herein. Sample testing in accordance with table I shall be performed on a representative device type (similar device) at initial qualification and after any design or process changes which may affect the RA response. Sample size is a minimum of 8 devices (4 biased and 4 not biased). This sample testing is repeated for each new combination for wafers of active elements on the most complex device.. PACKAGING.1 Packaging requirements. The requirements for packaging shall be in accordance with MI-PRF NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6. Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MI-PRF Record of users. Military and industrial users shall inform DA and and Maritime when a system application requires configuration control and the applicable SMD to that system. DA and and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 96) should contact DA and and Maritime-A, telephone (614) Comments. Comments on this drawing should be directed to DA and and Maritime-A, Columbus, Ohio , or telephone (614) Sources of supply. Sources of supply are listed in MI-DBK-3 and QM The vendors listed in MI-DBK-3 and QM-3834 have submitted a certificate of compliance (see 3.7 herein) to DA and and Maritime-A and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE 96-4 A REISION EE SEET 11

138 STANDARD MICROCIRCUIT DRAWING BUETIN DATE: Approved sources of supply for SMD 96-4 are listed below for immediate acquisition information only and shall be added to MI-DBK-3 and QM-3834 during the next revisions. MI-DBK-3 and QM-3834 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DA and and Maritime -A. This information bulletin is superseded by the next dated revisions of MI-DBK-3 and QM DA and and Maritime maintains an online database of all current sources of supply at Standard microcircuit drawing PIN 1/ endor CAGE number endor similar PIN / KXA 96401KXA KXC 96401KXC RD9-01-S RD9-901-S RD9-01-1S RD S 96-40KXA 9640KXA 96-40KXC 9640KXC RD S RD S RD S RD S 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the endor to determine its availability. / Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. endor CAGE number endor name and address Aeroflex Plainview Incorporated, (Aeroflex Microelectronics Solutions) 3 South Service Road Plainview, NY The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.

139 REISIONS TR DESCRIPTION DATE (YR-MO-DA) APPROED "Preliminary Draft " Return to Selection Guide RE SEET RE SEET RE STATUS RE OF SEETS SEET PMIC N/A PREPARED BY Steve Duncan STANDARD MICROCIRCUIT DRAWING TIS DRAWING IS AAIABE FOR USE BY A DEPARTMENTS AND AGENCIES OF TE DEPARTMENT OF DEFENSE AMSC N/A DRAWING APPROA DATE REISION EE MICROCIRCUIT, YBRID, INEAR, ANAOG MUTIPEXER, 16 CANNE, +3.3 TO + OT, RADIATION ARDENED SIZE A SEET DSCC FORM 33 APR 97 7 DA AND AND MARITIME COUMBUS, OIO CECKED BY Greg Cecil APPROED BY Charles F. Saffle 6 CAGE CODE OF EXXX-11 14

140 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1..3 and MI-PRF A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1. PIN. The PIN shall be as shown in the following example: 96 Federal stock class designator \ RA designator (see 1..1) Device type (see 1..) / K Device class designator (see 1..3) X Case outline (see 1..4) A ead finish (see 1..) \/ Drawing number 1..1 Radiation hardness assurance (RA) designator. RA marked devices shall meet the MI-PRF-3834 specified RA levels and shall be marked with the appropriate RA designator. A dash (-) indicates a non-ra device. 1.. Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 0 RD90 RD91 03 RD9 Circuit function Radiation hardened,16 channel, analog multiplexer Radiation hardened,16 channel, analog voltage multiplexer buffered Radiation hardened 16 channel, analog mutiplexer, sampleand-hold 1..3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MI-PRF-3834 and require QM Certification as well as qualification (Class, K, and E) or QM isting (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K ighest reliability class available. This level is intended for use in space applications. Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K,, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QM certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

141 1..4 Case outline(s). The case outline(s) are as designated in MI-STD-183 and as follows: Outline letter Descriptive designator Terminals Package style See figure 1 4 Ceramic quad flat pack X 1.. ead finish. The lead finish shall be as specified in MI-PRF Absolute maximum ratings. 1/ Supply voltage (CC)... Digital input overvoltage range: EN, A (device types 01 and 0)... Sഥ A (device type 03)... Analog input overvoltage range... Thermal resistance junction-to-case ( JC)... Storage temperature... ead temperature (soldering, seconds) dc ( CC +.4), ( GND -.4) ( CC +.4), ( GND -.4) ( CC +.4), ( GND -.4) C/W -6 C to +10 C +300 C 1.4 Recommended operating conditions. Supply voltage range (CC)... ogic low level voltage : EN,A (device types 01 and 0)... Sഥ,A (device type 03)... ogic high level voltage: EN,A (device types 01 and 0)... Sഥ,A (device type 03)... Case operating temperature range (TC) to + dc.3 CC.3 CC.7 CC.7 CC - C to +1 C 1. Radiation features. Maximum total dose available (dose rate = rads(si)/s):... Enhanced ow Dose Rate Sensitvity (EDRS)... Single Event atchup (SE)... Neutron irradiation... 1 Mrad(Si) Immuned > 0 Me-cm/mg / 14 > 1 x neutrons/cm 3/ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. / This limit is guaranteed by design or process, but not production tested unless otherwise specified by the customer through the purchase order or contract. 3/ Guaranteed, but not tested. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 3

142 . APPICABE DOCUMENTS.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MI-PRF ybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MI-STD Test Method Standard Microcircuits. MI-STD Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE ANDBOOKS MI-DBK-3 - ist of Standard Microcircuit Drawings. MI-DBK Standard Microcircuit Drawings. (Copies of these documents are available online at or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA ). Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G,, and K shall be in accordance with MI-PRF Compliance with MI-PRF-3834 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MI-PRF-3834 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3. Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MI-PRF-3834 and herein Case outline(s). The case outline(s) shall be in accordance with 1..4 herein and figure Terminal connections. The terminal connections shall be as specified on figure Truth table(s). The truth table(s) shall be as specified on figure Switching test waveform(s). The switching test waveform(s) shall be as specified on figure Block diagram. The block diagram(s) shall be as specified on figure. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3. Marking of device(s). Marking of device(s) shall be in accordance with MI-PRF The device shall be marked with the PIN listed in 1. herein. In addition, the manufacturer's vendor similar PIN may also be marked. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 4

143 3.6 Data. In addition to the general performance requirements of MI-PRF-3834, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DA and and Maritime -A) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DA and and Maritime -A shall affirm that the manufacturer's product meets the performance requirements of MI-PRF-3834 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MI-PRF-3834 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

144 TABE I. Electrical performance characteristics. Test Symbol Supply currents +ICC +ISBY Address input currents IA IA Enable input current IEN Group A subgroups Conditions 1/ / - C TC +1 C CC = + unless otherwise specified തതതത =.3 CC EN A =.7 CC EN =.3 CC 01 0 A 0 0. ma 03 0 A 01 0 A All - All All - All , IEN EN =.7 CC 1 01,0 Sample -and-old input current ISഥ 1 Sഥ =.3 CC Sഥ =.7 CC Input leakage current (C0 - C1) IINK 1 IN = +, EN =.7 CC, output and all unused MUX inputs under test = ,0 1 IN = +,Sഥ =.7 CC 03 IINK0 1 IN = +, EN =.7 CC, output and all unused MUX inputs under test = + Unit Max 1,,3 A =.3 CC imits Min 1,,3 തതതത =.7 CC EN Device types 01 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 6

145 TABE I. Electrical performance characteristics - Continued. Test Symbol Output leakge current IOUTK Conditions 1/ / - C TC +1 C CC = + unless otherwise specified Group A subgroups 1 IN = +, EN =.7 CC, All inputs grounded except channel being tested Device types Input load capacitance CIN Switch ON resistance RDSON IN = 0, +., +, EN =.3 CC, IOUT = -1 ma Address to output delay ta R = k, C = 0 pf, See figure 4 ta tonen toffen Output on voltage Max 01 1 IN = +, R = kω IN = +, R = 1 kω IN = +3.3, R = kω R = k, C = 0 pf, See figure 4 R = 1 k, C = 0 pf, See figure 4 R = 1 k, C = 0 pf, See figure 4 Unit Min Tri-state, EN >.7 CC ON1 ON ON3 imits 1,,3 0,03 1,, pf , ns 9,,11 0,03 1 µs 9,11 9,, ns ,03 9,11 9,, ,, µs ns µs ns Droop rate DR R = 1 k, C = 0 pf, See figure 4 9,,11 03 Data setup time tds R = 1 k, C = 0 pf, See figure 4 9,, ns Data hold time td R = 1 k, C = 0 pf, See figure 4 9,, ns Output slew rate ts 9,, /s 4 /µs See footnotes at top of next page. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 7

146 TABE I. Electrical performance characteristics - Continued. 1/ These devices have been characterized at level of irradiation. Pre and post irradiation values meet the limits as specified in table I. When performing post irradiation electrical measurements for any RA level, TC = + C. / For radiation features see paragraph 1. herein. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 8

147 Case outline X. FIGURE 1. Case outline(s). STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 9

148 Case outline X - Continued. Symbol A A1 Inches Millimeters Min Max Min Max REF A.017 A3.76 REF b c D e.00 BSC 1.7 BSC e E E E.34 REF 8.99 REF NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule.. The package and lid are electrically isolated from signal pads. FIGURE 1. Case outline - Continued. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

149 Device types Case outlines Terminal number and 0 03 X Terminal symbol Terminal symbol OUT C1 C14 C13 C1 C11 C C9 C8 A3 A GND A1 A0 തതതത EN C0 C1 C C3 C4 C C6 C7 CC OUT C1 C14 C13 C1 C11 C C9 C8 A3 A GND A1 A0 ഥ S/ C0 C1 C C3 C4 C C6 C7 CC FIGURE. Terminal connections. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 11

150 Truth table (C0-C1) A3 A A1 A0 EN 1/ "ON" Channel / X X X X None 1/ C0 C1 C C3 C4 C C6 C7 C8 C9 C C11 C1 C13 C14 C1 1/ For device types 01 and 0 only. / Between (C0-C1) and out. FIGURE 3. Truth table. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 1

151 FIGURE 4. Switching test waveform(s). STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 13

152 FIGURE 4. Switching test waveform(s) - Continued. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 14

153 FIGURE 4. Switching test waveform(s) - Continued. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 1

154 FIGURE. Block Diagram. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 16

155 FIGURE. Block diagram - Continued. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 17

156 TABE II. Electrical test requirements. MI-PRF-3834 test requirements Subgroups (in accordance with MI-PRF-3834, group A test table) Interim electrical parameters 1,9 Final electrical parameters 1*,,3,9,,11 Group A test requirements 1,,3,9,,11 Group C end-point electrical parameters 1,,3,9,,11 End-point electrical parameters for radiation hardness assurance (RA) devices 1 * PDA applies to subgroup ERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MI-PRF-3834 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4. Screening. Screening shall be in accordance with MI-PRF The following additional criteria shall apply: a. b. Burn-in test, method 1 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1 of MI-STD-883. () TA as specified in accordance with table I of method 1 of MI-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MI-PRF-3834 and as specified herein Group A inspection (CI). Group A inspection shall be in accordance with MI-PRF-3834 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4,, 6, 7, and 8 shall be omitted Group B inspection (PI). Group B inspection shall be in accordance with MI-PRF STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 18

157 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MI-PRF-3834 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 0 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 0 of MI-STD-883. () TA as specified in accordance with table I of method 0 of MI-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 0 of MI-STD Group D inspection (PI). Group D inspection shall be in accordance with MI-PRF Radiation ardness Assurance (RA) inspection. RA qualification is required for those devices with the RA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DA and and Maritime -Q) approved plan and with MI-PRF-3834, Appendix G Total dose irradiation testing. Total dose irradiation testing shall be in accordance with MI-STD-883 method 19, condition A and as specified herein. Sample testing in accordance with table I shall be performed on a representative device type (similar device) at initial qualification and after any design or process changes which may affect the RA response. Sample size is a minimum of 8 devices (4 biased and 4 not biased). This sample testing is repeated for each new combination for wafers of active elements on the most complex device.. PACKAGING.1 Packaging requirements. The requirements for packaging shall be in accordance with MI-PRF NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6. Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MI-PRF Record of users. Military and industrial users shall inform DA and and Maritime when a system application requires configuration control and the applicable SMD. DA and and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 96) should contact DA and and Maritime -A, telephone (614) Comments. Comments on this drawing should be directed to DA and and Maritime -A, Columbus, Ohio , or telephone (614) Sources of supply. Sources of supply are listed in MI-DBK-3 and QM The vendors listed in MI-DBK-3 and QM-3834 have submitted a certificate of compliance (see 3.7 herein) to DSCC-A and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 19

158 STANDARD MICROCIRCUIT DRAWING BUETIN DATE: Approved sources of supply for SMD are listed below for immediate acquisition information only and shall be added to MI-DBK-3 and QM-3834 during the next revisions. MI-DBK-3 and QM-3834 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DA and and Maritime -A. This information bulletin is superseded by the next dated revisions of MI-DBK-3 and QM DA and and Maritime maintains an online database of all current sources of supply at Standard microcircuit drawing PIN 1/ 1/ / endor CAGE endor similar PIN / KXA KXA KXC KXC RD90-01-S RD S RD S RD S KXA 96430KXA KXC 96430KXC RD91-01-S RD91-01-S RD S RD S KXA KXA KXC KXC RD9-01-S RD9-01-S RD9-01-1S RD9-01-1S The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the endor to determine its availability. Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. endor CAGE number endor name and address Aeroflex Plainview Incorporated, (Aeroflex Microelectronics Solutions) 3 South Service Road Plainview, NY The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.

159 REISIONS TR DESCRIPTION DATE (YR-MO-DA) APPROED "Preliminary Draft 1/0/011" Return to Selection Guide RE SEET RE SEET RE STATUS RE OF SEETS SEET PMIC N/A PREPARED BY STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO CECKED BY APPROED BY TIS DRAWING IS AAIABE FOR USE BY A DEPARTMENTS AND AGENCIES OF TE DEPARTMENT OF DEFENSE AMSC N/A DRAWING APPROA DATE REISION EE MICROCIRCUIT, YBRID, INEAR, 11-BIT, DIGITA TO ANAOG CONERTER, CMOS SIZE CAGE CODE A 6768 SEET DSCC FORM 33 APR OF EXXX-XX

160 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1..3 and MI-PRF A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1. PIN. The PIN shall be as shown in the following example: 96 Federal stock class designator \ RA designator (see 1..1) K X X Device type (see 1..) Device class designator (see 1..3) Case outline (see 1..4) ead finish (see 1..) / \/ Drawing number 1..1 Radiation hardness assurance (RA) designator. RA marked devices shall meet the MI-PRF-3834 specified RA levels and shall be marked with the appropriate RA designator. A dash (-) indicates a non-ra device. 1.. Device type(s). The device type(s) identify the circuit function as follows: Device type 01 0 Generic number RD930 RD931 Circuit function Digital-to-Analog converter,11-bit, adder output Digital-to-Analog converter,11-bit, Buffered output 1..3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MI-PRF-3834 and require QM Certification as well as qualification (Class, K, and E) or QM isting (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K ighest reliability class available. This level is intended for use in space applications. Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K,, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QM certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

161 1..4 Case outline(s). The case outline(s) are as designated in MI-STD-183 and as follows: Outline letter X Descriptive designator See figure 1 Terminals Package style 16 Flat package with formed leads 1.. ead finish. The lead finish shall be as specified in MI-PRF Absolute maximum ratings. 1/ Supply voltage (CC)... Input voltage (IN) range... PREF relative to NREF... Junction temperature (TJ)... Power at + C... Thermal resistance, junction-to-case (өjc)... Storage temperature range... ead temperature (soldering, seconds) dc CC +0.4, GND C 0 mw C/W -6 C to +10 C +300 C 1.4 Recommended operating conditions. Supply voltage range (CC)... Case operating temperature range (TC) dc to +.0 dc - C to +1 C 1. Radiation features. Maximum total dose available (dose rate = rads(si)/s):... Enhanced ow Dose Rate Sensitvity (EDRS)... Single Event atchup (SE)... Neutron Displacement Damage... 1 Mrads(Si) CMOS Immune > 0 Me-cm /mg / 14 > 1 x neutrons/cm /. APPICABE DOCUMENTS.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MI-PRF ybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MI-STD Test Method Standard Microcircuits. MI-STD Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE ANDBOOKS MI-DBK-3 - ist of Standard Microcircuit Drawings. MI-DBK Standard Microcircuit Drawings. (Copies of these documents are available online at or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA ) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. / This limit is guaranteed by design or process, but not production tested. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 3

162 . Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G,, and K shall be in accordance with MI-PRF Compliance with MI-PRF-3834 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MI-PRF-3834 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3. Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MI-PRF-3834 and herein Case outline(s). The case outline(s) shall be in accordance with 1..4 herein and figure Terminal connections. The terminal connections shall be as specified on figure Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3. Marking of device(s). Marking of device(s) shall be in accordance with MI-PRF The device shall be marked with the PIN listed in 1. herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MI-PRF-3834, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DA and and Maritime -A) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DA and and Maritime -A shall affirm that the manufacturer's product meets the performance requirements of MI-PRF-3834 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MI-PRF-3834 shall be provided with each lot of microcircuits delivered to this drawing. 4. ERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MI-PRF-3834 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 4

163 TABE I. Electrical performance characteristics. Test Symbol Conditions 1/ / - C TC +1 C CC = +.0 unless otherwise specified Group A subgroups Device type imits Min Unit Max Resolution N 1,,3 01,0 11 Relative accuracy RA 1,,3 01,0 0. % of FSR Gain error AE 1,,3 01,0 0.1 % of FSR Output leakage IO 1,,3 01,0 Output settling time TD 1,,3 01,0 0 ns PREF input Z ZP 1,,3 01,0 kω NREF input Z ZR 1,,3 01,0 kω Input high voltage I 1,,3 01,0 Input low voltage I 1,,3 01,0 0.8 Input leakge IIl, II 1,,3 01,0 0 pa 1/ / Bits These devices have been tested to the requirements of RA designator level "". Specification derated to reflect high dose rate (Method 19, condition A of MI-STD-883) to 0 Krad(Si) at + C. For radiation features see paragraph 1. herein. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

164 Case X. Inches Symbol Min A A1 A A3 b c D e e1 E E1 E Max REF BSC.30 BSC REF Millimeters Min Max REF BSC 8.90 BSC REF NOTE: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule.. The package and lid are electrically isolated from signal pads. FIGURE 1. Case outline. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 6

165 Device types 01 0 Case outline Terminal number X Terminal symbol PREF NREF GND D (MSB) D09 D08 D07 D06 D0 D04 D03 D0 D01 D00 (SB) CC AOUT PREF NREF GND D (MSB) D09 D08 D07 D06 D0 D04 D03 D0 D01 D00 (SB) CC AOUT (Buffered) FIGURE. Terminal connections. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 7

166 FIGURE 3. Radiation exposure circuit(s). STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 8

167 TABE II. Electrical test requirements. MI-PRF-3834 test requirements Subgroups (in accordance with MI-PRF-3834, group A test table) Interim electrical parameters 1,, 3 Final electrical parameters 1*,, 3 Group A test requirements 1,, 3 Group C end-point electrical parameters 1,, 3 End-point electrical parameters for Radiation ardness Assurance (RA) devices 1 * PDA applies to subgroup Screening. Screening shall be in accordance with MI-PRF The following additional criteria shall apply: a. b. Burn-in test, method 1 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1 of MI-STD-883. () TA as specified in accordance with table I of method 1 of MI-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MI-PRF-3834 and as specified herein Group A inspection (CI). Group A inspection shall be in accordance with MI-PRF-3834 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4,, 6, 7, 8A, 8B, 9,, and 11 shall be omitted Group B inspection (PI). Group B inspection shall be in accordance with MI-PRF STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 9

168 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MI-PRF-3834 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 0 of MI-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DA and and Maritime -A or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 0 of MI-STD-883. () TA as specified in accordance with table I of method 0 of MI-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 0 of MI-STD Group D inspection (PI). Group D inspection shall be in accordance with MI-PRF Radiation hardness assurance (RA). RA qualification is required only for those devices with the RA designator as specified herein. See table IIIA and table IIIB. Table IIIA. Radiation ardness Assurance Method Table. RA method employed Testing at X rated total dose Element evel ybrid Device evel No Yes Worst Case Analysis Performed No Includes Combines temperature temperature and effects radiation effects N/A N/A Combines End-of-life total dose and displacement effects N/A N/A End points after dose is achieved includes minimum maximum, and room temperatures Element ybrid device level evel No N/A Table IIIB. ybrid level and element level test table. Total Dose ow Dose igh Dose Rate Rate (DR) CMOS IC NOTES: X = G = (N) = N/A = N/A X ( 1 Mrad) EDRS G Radiation Test eavy Ion Proton SEU SE ow igh (upset) (latch-up) Energy Energy (N) G (N) (N) SEE (upset) Neutron Displacement Damage (DD) (N) G Radiation testing done (evel) Guaranteed by design or process. Not yet tested Not applicable for this SMD Radiation ardness Assurance (RA) inspection. RA qualification is required for those devices with the RA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DA and and Maritime -Q) approved plan and with MI-PRF-3834, Appendix G. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET

169 a. The hybrid device manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test plans used to implement component lot qualification during procurement. Test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. b. The hybrid device manufacturer shall designate a RA program manager to oversee component lot qualification, and to monitor design changes for continued compliance to RA requirements ybrid level qualification Qualification by similarity. A family is defined by the family model designator e.g. RD. All parts with this designator share a common design and use the same active element. Device type KXC was tested and all other devices on this SMD are qualified by similarity Total dose irradiation testing. A minimum of eight samples for one representative of this hybrid device is tested at initial qualification and after any design or process changes which may affect the RA response of the device type. Four biased and four unbiased are tested at igh Dose Rate (DR) in accordance with condition A of method 19 of MI-STD-883 to 0 krad(si) Component level qualification Total Ionizing Dose Irradiation. Testing every initial wafer lot of this hybrid device will be tested at DR in accordance with condition C (dose rate of -300 rad(si)/s) of method 19 of MI-STD ot Acceptance. Each lot of active elements shall be evaluated for acceptance in accordance with MI-PRF-3834 and herein Total Ionizing Dose. Every wafer lot of this hybrid device will be RAT (Radiation ot Acceptance Testing) tested at DR in accordance with condition C (dose rate of -300 rad(si)/s) of method 19 of MI-STD-883. A minimum of biased samples and unbiased samples will be tested /90% statistics are applied to the device parameter degradations which are compared against established limits for lot acceptance.. PACKAGING.1 Packaging requirements. The requirements for packaging shall be in accordance with MI-PRF NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6. Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MI-PRF Record of users. Military and industrial users shall inform DA and and Maritime when a system application requires configuration control and the applicable SMD to that system. DA and and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 96) should contact DA and and Maritime-A, telephone (614) Comments. Comments on this drawing should be directed to DA and and Maritime-A, Columbus, Ohio , or telephone (614) Sources of supply. Sources of supply are listed in MI-DBK-3 and QM The vendors listed in MI-DBK-3 and QM-3834 have submitted a certificate of compliance (see 3.7 herein) to DA and and Maritime-A and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DA AND AND MARITIME COUMBUS, OIO DSCC FORM 34 APR 97 SIZE A REISION EE SEET 11

170 STANDARD MICROCIRCUIT DRAWING BUETIN DATE: Approved sources of supply for SMD are listed below for immediate acquisition information only and shall be added to MI-DBK-3 and QM-3834 during the next revisions. MI-DBK-3 and QM-3834 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DA and and Maritime -A. This information bulletin is superseded by the next dated revisions of MI-DBK-3 and QM DA and and Maritime maintains an online database of all current sources of supply at Standard microcircuit drawing PIN 1/ endor CAGE number endor similar PIN / KXA KXA KXC KXC RD S RD S RD S RD S KXA KXA KXA KXC RD S RD S RD S RD S 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the endor to determine its availability. / Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. endor CAGE number endor name and address Aeroflex Plainview Incorporated, (Aeroflex Microelectronics Solutions) 3 South Service Road Plainview, NY The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.

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